IEC 62153-4-10:2009
(Main)Metallic communication cable test methods - Part 4-10: Electromagnetic compatibility (EMC) - Shielded screening attenuation test method for measuring the screening effectiveness of feed-throughs and electromagnetic gaskets double coaxial method
Metallic communication cable test methods - Part 4-10: Electromagnetic compatibility (EMC) - Shielded screening attenuation test method for measuring the screening effectiveness of feed-throughs and electromagnetic gaskets double coaxial method
IEC 62153-4-10:2009(E) details a coaxial method suitable for determining the transfer impedance and/or screening attenuation of feed-throughs and electromagnetic gaskets. A wide dynamic and frequency range can be applied to test even super screened feed throughs and gaskets with normal instrumentation from low frequencies up to the limit of defined transversal waves in the coaxial circuits at approximately 4 GHz.
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IEC 62153-4-10
®
Edition 1.0 2009-05
INTERNATIONAL
STANDARD
Metallic communication cable test methods –
Part 4-10: Electromagnetic compatibility (EMC) – Shielded screening attenuation
test method for measuring the screening effectiveness of feed-throughs and
electromagnetic gaskets double coaxial method
IEC 62153-4-10:2009(E)
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IEC 62153-4-10
®
Edition 1.0 2009-05
INTERNATIONAL
STANDARD
Metallic communication cable test methods –
Part 4-10: Electromagnetic compatibility (EMC) – Shielded screening attenuation
test method for measuring the screening effectiveness of feed-throughs and
electromagnetic gaskets double coaxial method
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
S
ICS 33.100; 33.120.10 ISBN 978-2-88910-637-0
® Registered trademark of the International Electrotechnical Commission
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– 2 – 62153-4-10 © IEC:2009(E)
CONTENTS
FOREWORD.3
1 Scope.5
2 Normative references .5
3 Terms and definitions .5
4 Principle of the test method .8
5 Procedure .10
5.1 Equipment.10
5.2 Dynamic range .11
5.3 Sample preparation .11
6 Measurement .11
6.1 General .11
6.2 Screening attenuation .11
6.3 Transfer impedance.11
7 Expression of results .11
7.1 Transfer impedance.11
7.2 Screening attenuation .12
7.3 Requirements.12
Annex A (informative) Background for the measurement of the shielding effectiveness
of feed-throughs and electromagnetic gaskets .13
Bibliography.22
Figure 1 – A two-port .6
Figure 2 – Equivalent circuit of the test set-up and definition of Z .7
T
Figure 3 – Cross-section of a typical feed-through configuration .9
Figure 4 – Cross-section of the test fixture with a connector .9
Figure 5 – Cross-section of the test fixture with an electromagnetic gasket.10
Figure A.1 – Cross-section of a typical feed-through configuration.13
Figure A.2 – Cross-section of the test fixture with a connector .14
Figure A.3 – Equivalent circuit of the test setup with the shunt admittance y of the
feed-through .14
Figure A.4 – TDR step response at input-port of test fixture .16
Figure A.5 – View of the test fixture connected to a network analyzer .17
Figure A.6 – Top view of the test fixture.17
Figure A.7 – Detailed view of the contact area .17
Figure A.8 – Detailed view of the captivation for the conductive O-ring test .18
Figure A.9 – Isolation of the network analyzer.19
Figure A.10 – Isolation of the test fixture when characterizing an ideal short (metal
plate) .19
Figure A.11 – Measured operational screening transmission when characterizing a
typical conductive O-ring .20
Figure A.12 – Transfer impedance Z of a typical conductive O-ring .20
T
Figure A.13 – Screening attenuation a of a typical conductive O-ring.21
s
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62153-4-10 © IEC:2009(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
METALLIC COMMUNICATION CABLE TEST METHODS –
Part 4-10: Electromagnetic compatibility (EMC) –
Shielded screening attenuation test method for measuring
the screening effectiveness of feed-throughs and
electromagnetic gaskets double coaxial method
FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62153-4-10 has been prepared by IEC technical committee 46:
Cables, wires, waveguides, R.F. connectors, R.F. and microwave passive components and
accessories.
The text of this standard is based on the following documents:
FDIS Report on voting
46/319/FDIS 46/322/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
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– 4 – 62153-4-10 © IEC:2009(E)
A list of all parts of the IEC 62153 series, under the general title: Metallic communication
cable test methods, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date Metallic communication cable test methods indicated on the IEC
web site under "http://webstore.iec.ch" in the data related to the specific publication. At this
date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
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62153-4-10 © IEC:2009(E) – 5 –
METALLIC COMMUNICATION CABLE TEST METHODS –
Part 4-10: Electromagnetic compatibility (EMC) –
Shielded screening attenuation test method for measuring
the screening effectiveness of feed-throughs and
electromagnetic gaskets double coaxial method
1 Scope
This part of 62153-4-10 details a coaxial method suitable for determining the transfer
impedance and/or screening attenuation of feed-throughs and electromagnetic gaskets.
The shielded screening attenuation test set-up according to IEC 62153-4-4 (triaxial method)
has been modified to take into account the particularities of feed-throughs and gaskets.
A wide dynamic and frequency range can be applied to test even super screened
feed-throughs and gaskets with normal instrumentation from low frequencies up to the limit of
defined transversal waves in the coaxial circuits at approximately 4 GHz.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC/TR 62152:2004, Background of terms and definitions of cascaded two-ports
IEC 62153-4-4, Metallic communication cable test methods – Part 4-4: Electromagnetic
compatibility (EMC) – Shielded screening attenuation, test method for measuring of the
screening attenuation as up to and above 3 GHz
IEC 62153-4-7, Metallic communication cable test methods – Part 4-7: Electromagnetic
compatibility (EMC) – Test method for measuring the transfer impedance and the screening -
or the coupling attenuation – Tube in tube method
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
operational (Betriebs) transfer function in the forward direction H or the operational
B21
(Betriebs) scattering parameter S
21
quotient of the reflected square root of power wave fed into the reference impedance of the
output of the two-port and the unreflected square root of the power wave consumed at the
input of the two-port
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EXAMPLE
Z Z
A B
I I
1 2
Two-port
Z Z
U 1 2 U
E 1 2 E
1 2
V V
i1 i2
V V
r1 r2
IEC 1207/04
Key
E , E network analyzer at input, output respectively V , V incident square root of complex power waves
1 2 i1 i2
(see note) at input and output, respectively
Z Z reference impedance at input and output V , V reflected square root of complex power waves
A, B r1 r2
respectively (see note) at input and output, respectively
I , I current at input and output, respectively Z , Z impedance at input and output, respectively
1 2 1 2
U , U voltage at input and output, respectively
1 2
Figure 1 – A two-port
∗
NOTE Complex power is the product U ⋅ I . Apparent power is the product U ⋅ I , which is used in electrical
∗
power technique, where the angle between the voltage and current is of interest. I Is the complex conjugate of
the current I .
S or H is the operational (Betriebs) transfer function in the forward direction and they are defined as follows:
21 B21
V 2U Z
r2 2 A
S = = = H
21 B21
V E Z
i1 V =0 1 B
i2
See Annex C of IEC/TR 62152.
3.2
transfer impedance
equivalent circuit of the measurement of a feed-through or gasket, shunt impedance Z
T
between the primary and secondary circuit
EXAMPLE
The transfer impedance of an electrically short screen is defined as the quotient of the open circuit voltage U
2
induced to the secondary circuit by the current I fed into the primary circuit or vice versa. See Figure 2.
1
Z of an electrically short screen is expressed in Ω or decibels in relation to 1 Ω.
T
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62153-4-10 © IEC:2009(E) – 7 –
I
1
Z , l Z U Z , l
o T 2 o
IEC 576/09
Figure 2 – Equivalent circuit of the test set-up and definition of Z
T
U
2
Z = (1)
T
I
1
⎛ ⎞
Z
T
⎜ ⎟
Z = +20 ×log (2)
T 10
⎜ ⎟
1Ω
⎝ ⎠
3.3
operational (Betriebs) attenuation
the quotient of the unreflected square root of power wave fed into the reference impedance of
the input of the two-port and the square root of the power wave consumed by the load of the
two-port expressed in dB and radians
NOTE See IEC/TR 62152.
3.4
screening attenuation
a
s
logarithmic ratio of the incident (unreflected) square root of power wave fed into the nominal
impedance of the primary circuit of the test set-up and the periodic maximum values of the
square root of power wave V coupled into the secondary circuit of the test set-up when
r2 , max
its characteristic impedance Z is normalized to 150 Ω
o
EXAMPLE
⎛ ⎞
V
150Ω
r2, max
⎜ ⎟
a = −20 ×log Env + 20 × log =
s 10 10
⎜ ⎟
V
Z
i1
⎝ ⎠ o
1 150Ω (3)
= 20 × log + 20 × log =
10 10
Env()S
Z
21,max
o
150Ω
Min. Env() 20 log
= A + ×
B21 10
Z
o
where
a is the screening attenuation expressed in dB;
s
Env ( A ) is the operational attenuation recorded as the envelope curve of the measured values in dB (See 7.1);
B21
Min.Env ( A ) is the operational attenuation recorded as the minimum envelope curve of the measured values in
B21
dB (See 7.1);
150 Ω is the standardized impedance of the secondary (“outer” or disturbed) circuit.
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The screening attenuation, expressed in dB of an electrically short device is here:
50Ω
a ≈ 20 ×log (4)
s 10
Z
T
where
a is the screening attenuation expressed in Ω;
s
150 Ω is the standardized impedance of the secondary (“outer” or disturbed) circuit.
NOTE Equation (4) may be deduced from Equations (3) and (5) as follows, assuming an electrically short device:
Z ×150Ω
o
a = 20 ×log . If we assume that 150 Ω ≈ 3 × Z , then
s 10 o
2 × Z
T
150Ω 50Ω
a = 20 ×log and approximate 2 3 ≈ 3 then a ≈ 20 ×log and Equation (4) is valid.
s 10 s 10
Z
2 3 × Z
T
T
In the measurement, both primary and secondary circuits are low impedance. This leads to a 6 dB lower A than
B21
in e.g. the tube in tube measurement of connectors; see IEC 62153-4-7.
3.5
device under test
DUT
connector’s body or screen, intended to be mounted to a shielding or screening wall (or box),
or an electromagnetic gasket
4 Principle of the test method
Figure 3 shows a typical feed-through construction where a c
...
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