IEC 61000-4-6:2023

Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-6:2023 is available as IEC 61000-4-6:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61000-4-6: 2023 relates to the conducted immunity requirements of electrical and electronic equipment to electromagnetic disturbances coming from intended radio-frequency (RF) transmitters in the frequency range 150 kHz up to 80 MHz.
NOTE 1 Product committees might decide to use the methods described in this document also for frequencies up to 230 MHz (see Annex B) although the methods and test instrumentation are intended to be used in the frequency range up to 80 MHz.
Equipment not having at least one conducting wire or cable (such as mains supply, signal line or earth connection) which can couple the equipment to the disturbing RF fields is excluded from the scope of this document.
NOTE 2 Test methods are specified in this part of IEC 61000 to assess the effect that conducted disturbing signals, induced by electromagnetic radiation, have on the equipment concerned. The simulation and measurement of these conducted disturbances are not adequately exact for the quantitative determination of effects. The test methods specified are structured for the primary objective of establishing adequate repeatability of results at various facilities for quantitative analysis of effects.
The object of this document is to establish a common reference for evaluating the functional immunity of electrical and electronic equipment when subjected to conducted disturbances induced by RF fields. The test method in this document describes a consistent method to assess the immunity of an equipment or system against a specified phenomenon.
NOTE 3 As described in IEC Guide 107, this document is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and if applied, they are responsible for determining the appropriate test levels and performance criteria.
This fifth edition cancels and replaces the fourth edition published in 2013. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) selection of injection devices revised;
b) need of AE impedance check for clamp injection removed and Annex H deleted;
c) saturation check revised;
d) new Annex H on testing with multiple signals;
e) level-setting only with feedback loop.

Compatibilité électromagnétique (CEM) - Partie 4-6: Techniques d'essai et de mesure - Immunité aux perturbations conduites, induites par les champs aux fréquences radioélectriques

IEC 61000-4-6: 2023 traite des exigences relatives à l'immunité en conduction des matériels électriques et électroniques aux perturbations électromagnétiques provoquées par des émetteurs radioélectriques (RF) dans la plage de fréquences de 150 kHz à 80 MHz.
NOTE 1 Les comités de produits peuvent également choisir d'utiliser les méthodes décrites dans le présent document pour les fréquences inférieures ou égales à 230 MHz (voir Annexe B) même si ces méthodes et les appareils d'essai sont destinés à être utilisés dans la plage de fréquences inférieures ou égales à 80 MHz.
Les matériels qui ne comportent pas au moins un câble conducteur (cordon d'alimentation, ligne de transmission ou connexion de mise à la terre, par exemple) capable de coupler les matériels aux champs perturbateurs aux fréquences radioélectriques ne relèvent pas du domaine d'application du présent document.
NOTE 2 Les méthodes d'essai sont spécifiées dans la présente partie de l'IEC 61000 afin d'évaluer l'incidence des signaux perturbateurs conduits, induits par les rayonnements électromagnétiques, sur le matériel concerné. La simulation et le mesurage de ces perturbations conduites ne sont pas parfaitement exacts pour la détermination quantitative des effets. Les méthodes d'essai spécifiées sont structurées dans l'objectif principal d'établir une reproductibilité appropriée des résultats dans différentes installations à des fins d'analyse quantitative des effets.
L'objet du présent document est d'établir une référence commune dans le but d'évaluer l'immunité fonctionnelle des matériels électriques et électroniques, lorsqu'ils sont soumis aux perturbations conduites induites par les champs aux fréquences radioélectriques. La méthode d'essai du présent document décrit une méthode cohérente dans le but d'évaluer l'immunité d'un matériel ou d'un système vis-à-vis d'un phénomène spécifié.
NOTE 3 Comme cela est décrit dans le Guide 107 de l'IEC, le présent document est une publication fondamentale en CEM destinée à être utilisée par les comités de produits de l'IEC. Comme cela est également indiqué dans le Guide 107, il incombe aux comités de produits de l'IEC de déterminer s'il convient d'appliquer ou non la présente norme d'essai d'immunité. Si tel est le cas, ils ont la responsabilité de déterminer les niveaux d'essai et les critères de performance appropriés.
Elle constitue la Partie 4-6 de l'IEC 61000. Il a le statut d'une publication fondamentale en CEM conformément au Guide 107 de l'IEC.
Cette cinquième édition annule et remplace la quatrième édition parue en 2013. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) le choix des dispositifs d'injection a été révisé;
b) la nécessité de vérifier l'impédance de l'AE pour l'injection par pince a été supprimée, et l'Annexe H a été supprimée;
c) la procédure de contrôle de la saturation a été révisée;
d) une nouvelle Annexe H a été ajoutée pour les essais avec plusieurs signaux;
e) le réglage du niveau s'applique avec une boucle de rétroaction uniquement.

General Information

• Status: Published
• Publication Date: 05-Jun-2023
• ICS: 33.100.20 - Immunity
• Technical Committee: SC 77B - High frequency phenomena
• Drafting Committee: WG 10 - TC 77/SC 77B/WG 10
• Current Stage: PPUB - Publication issued
• Start Date: 30-Jun-2023
• Completion Date: 06-Jun-2023

Relations

• Revises: IEC 61000-4-6:2013 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023
• Revises: IEC 61000-4-6:2013/COR1:2015 - Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Secretariat Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

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IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –

Part 4-6: Testing and measurement techniques – Immunity to conducted

disturbances, induced by radio-frequency fields

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7076-9

– 2 – IEC 61000-4-6:2023 © IEC 2023
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 General . 11
5 Test levels . 13
6 Test equipment and level adjustment procedure . 15
6.1 Test generator . 15
6.2 Coupling and decoupling devices . 16
6.2.1 General . 16
6.2.2 Coupling/decoupling networks (CDNs) . 18
6.2.3 Clamp injection devices . 20
6.2.4 Direct injection devices . 22
6.2.5 Decoupling networks . 22
6.3 Verification of the common-mode impedance at the EUT port of coupling and
decoupling devices . 22
6.3.1 General . 22
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 23
6.4 Setting of the test generator . 25
6.4.1 General . 25
6.4.2 Setting of the output level at the EUT port of the coupling device . 25
7 Test setup and injection methods . 27
7.1 Test setup . 27
7.2 EUT comprising a single unit. 28
7.3 EUT comprising several units . 30
7.4 Rules for selecting injection methods and test points . 31
7.4.1 General . 31
7.4.2 Injection method . 31
7.4.3 Ports to be tested . 32
7.5 CDN injection application . 32
7.6 Clamp injection application . 34
7.7 Direct injection application . 36
8 Test procedure . 36
9 Evaluation of the test results . 37
10 Test report . 38
Annex A (normative) EM and decoupling clamps . 39
A.1 EM clamps . 39
A.1.1 General . 39
A.1.2 Specification of EM clamps . 39
A.2 EM clamp characterization . 41
A.2.1 Specification of the clamp test jig . 41
A.2.2 Clamp characterization . 42
A.3 Decoupling clamp characterization . 47
A.3.1 General . 47
A.3.2 Specification of decoupling clamps . 47

A.3.3 Impedance . 47
A.3.4 Decoupling factor. 48
Annex B (informative) Selection criteria for the frequency range of application . 50
Annex C (informative) Guidelines for selecting test levels . 52
Annex D (informative) Information on coupling and decoupling networks . 53
D.1 Basic features of the coupling and decoupling networks . 53
D.2 Examples of coupling and decoupling networks . 53
Annex E (informative) Information for the test generator specification . 58
Annex F (informative) Test setup for large EUTs . 59
F.1 General . 59
F.2 Test setup for large EUTs . 59
Annex G (informative) Measurement uncertainty of the voltage test level . 62
G.1 General . 62
G.2 General symbols . 62
G.3 Uncertainty budgets for test methods . 62
G.3.1 Definition of the measurand . 62
G.3.2 MU contributors of the measurand . 63
G.3.3 Input quantities and calculation examples for expanded uncertainty . 64
G.4 Expression of the calculated measurement uncertainty and its application . 71
Annex H (informative) Testing with multiple signals . 73
H.1 General . 73
H.2 Intermodulation . 73
H.3 Power requirements . 74
H.4 Level-setting requirements . 75
H.5 Linearity check and harmonics checks of the test generator . 75
H.6 EUT performance criteria with multiple signals . 75
Annex I (informative) Port-to-port injection . 76
I.1 General . 76
I.2 Test setup for injection on identical ports . 76
I.2.1 Selection of ports . 76
I.2.2 Procedure for port-to-port injection . 76
Annex J (informative) Amplifier compression and non-linearity . 78
J.1 Objective of limiting amplifier distortion . 78
J.2 Possible problems caused by harmonics and saturation . 78
J.3 Limiting the harmonic content in the disturbance signal. 78
J.4 Effect of linearity characteristic on the immunity test . 79
J.4.1 General . 79
J.4.2 Evaluation of the amplifier linearity characteristic . 79
Bibliography . 83

Figure 1 – Diagram showing EM fields near the EUT due to common-mode currents on
its cables . 12
Figure 2 – Schematic setup for immunity test to RF conducted disturbances . 13
Figure 3 – Example of unmodulated and modulated RF signal . 14
Figure 4 – Test generator setup . 16
Figure 5 – Principle of coupling and decoupling – Symbols used for the indicated setup
principles . 17

– 4 – IEC 61000-4-6:2023 © IEC 2023
Figure 6 – Principle of coupling and decoupling – Principle of direct injection to
screened cables . 17
Figure 7 – Principle of coupling and decoupling – Principle of coupling to unscreened

cables according to the CDN method . 18
Figu
...

IEC 61000-4-6 ®
Edition 5.0 2023-06
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or
your local IEC member National Committee for further information.

IEC Secretariat Tel.: [phone]
3, rue de Varembé [e-mail]
CH-1211 Geneva 20 www.iec.ch
Switzerland
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

IEC publications search - webstore.iec.ch/advsearchform IEC Products & Services Portal - products.iec.ch
The advanced search enables to find IEC publications by a Discover our powerful search engine and read freely all the
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committee, …). It also gives information on projects, replaced access to up to date content tailored to your needs.
and withdrawn publications.
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IEC Just Published - webstore.iec.ch/justpublished
The world's leading online dictionary on electrotechnology,
Stay up to date on all new IEC publications. Just Published
containing more than 22 300 terminological entries in English
details all new publications released. Available online and once
and French, with equivalent terms in 19 additional languages.
a month by email.
Also known as the International Electrotechnical Vocabulary

(IEV) online.
IEC Customer Service Centre - webstore.iec.ch/csc

If you wish to give us your feedback on this publication or need
further assistance, please contact the Customer Service
Centre: [e-mail].
IEC 61000-4-6 ®
Edition 5.0 2023-06
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7130-8

– 2 – IEC 61000-4-6:2023 RLV © IEC 2023
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 10
3 Terms and definitions . 10
4 General . 12
5 Test levels . 15
6 Test equipment and level adjustment procedure . 17
6.1 Test generator . 17
6.2 Coupling and decoupling devices . 19
6.2.1 General . 19
6.2.2 Coupling/decoupling networks (CDNs) . 24
6.2.3 Clamp injection devices . 26
6.2.4 Direct injection devices . 30
6.2.5 Decoupling networks . 30
6.3 Verification of the common-mode impedance at the EUT port of coupling and
decoupling devices . 30
6.3.1 General . 30
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 31
6.4 Setting of the test generator . 34
6.4.1 General . 34
6.4.2 Setting of the output level at the EUT port of the coupling device . 35
7 Test setup and injection methods . 38
7.1 Test setup . 38
7.2 EUT comprising a single unit. 39
7.3 EUT comprising several units . 42
7.4 Rules for selecting injection methods and test points . 44
7.4.1 General . 44
7.4.2 Injection method . 44
7.4.3 Ports to be tested . 46
7.5 CDN injection application . 47
7.6 Clamp injection application when the common mode impedance
requirements can be met.
7.7 Clamp injection application when the common mode impedance
requirements cannot be met .
7.6 Clamp injection application . 52
7.7 Direct injection application . 53
8 Test procedure . 54
9 Evaluation of the test results . 55
10 Test report . 56
Annex A (normative) EM and decoupling clamps . 57
A.1 EM clamps . 57
A.1.1 General . 57
A.1.2 Typical Specification of EM clamps . 57
A.2 EM clamp characterization . 60
A.2.1 Specification of the clamp test jig . 60

A.2.2 Clamp characterization . 61
A.3 Decoupling clamp characterization . 66
A.3.1 General . 66
A.3.2 Specification of decoupling clamps . 66
A.3.3 Impedance . 66
A.3.4 Decoupling factor. 67
Annex B (informative) Selection criteria for the frequency range of application . 69
Annex C (informative) Guidelines for selecting test levels . 71
Annex D (informative) Information on coupling and decoupling networks . 72
D.1 Basic features of the coupling and decoupling networks . 72
D.2 Examples of coupling and decoupling networks . 72
Annex E (informative) Information for the test generator specification . 77
Annex F (informative) Test setup for large EUTs . 78
F.1 General . 78
F.2 Test setup for large EUTs . 78
Annex G (informative) Measurement uncertainty of the voltage test level . 81
G.1 General . 81
G.2 General symbols . 81
G.3 Uncertainty budgets for test methods . 81
G.3.1 Definition of the measurand . 81
G.3.2 MU contributors of the measurand . 82
G.3.3 Input quantities and calculation examples for expanded uncertainty . 83
G.4 Expression of the calculated measurement uncertainty and its application . 91
G.5 Bibliography .
Annex H (informative) Measurement of AE impedance .
Annex H (informative) Testing with multiple signals. 96
H.1 General . 96
H.2 Intermodulation . 96
H.3 Power requirements . 97
H.4 Level-setting requirements . 98
H.5 Linearity check and harmonics checks of the test generator . 98
H.6 EUT performance criteria with multiple signals . 98
Annex I (informative) Port-to-port injection . 99
I.1 General . 99
I.2 Test setup for injection on identical ports . 99
I.2.1 Selection of ports . 99
I.2.2 Procedure for port-to-port injection . 99
Annex J (informative) Amplifier compression and non-linearity . 101
J.1 Objective of limiting amplifier distortion . 101
J.2 Possible problems caused by harmonics and saturation . 101
J.3 Limiting the harmonic content in the disturbance signal. 101
J.4 Effect of linearity characteristic on the immunity test . 102
J.4.1 General . 102
J.4.2 Evaluation of the amplifier linearity characteristic . 102
Bibliography . 106

Figure 1 – Diagram showing EM fields near the EUT due to common-mode currents on

its cables . 13

– 4 – IEC 61000-4-6:2023 RLV © IEC 2023
Figure 2 – Schematic setup for immunity test to RF conducted disturbances . 15
Figure 2 – Open circuit waveforms at the EUT port of a coupling device for test level 1 .
Figure 3 – Example of unmodulated and modulated RF signal . 17
Figure 4 – Test generator setup . 18
Figure 5 – Principle of coupling and decoupling – Symbols use
...

IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-6: Testing and measurement techniques – Immunity to conducted
disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –
Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations
conduites, induites par les champs aux fréquences radioélectriques

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigendum or an amendment might have been published.

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containing more than 22 300 terminological entries in English
details all new publications released. Available online and once
and French, with equivalent terms in 19 additional languages.
a month by email.
Also known as the International Electrotechnical Vocabulary

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IEC 61000-4-6 ®
Edition 5.0 2023-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM

Electromagnetic compatibility (EMC) –

Part 4-6: Testing and measurement techniques – Immunity to conducted

disturbances, induced by radio-frequency fields

Compatibilité électromagnétique (CEM) –

Partie 4-6: Techniques d'essai et de mesure – Immunité aux perturbations

conduites, induites par les champs aux fréquences radioélectriques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.20 ISBN 978-2-8322-7592-4

– 2 – IEC 61000-4-6:2023 © IEC 2023
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 General . 11
5 Test levels . 13
6 Test equipment and level adjustment procedure . 15
6.1 Test generator . 15
6.2 Coupling and decoupling devices . 16
6.2.1 General . 16
6.2.2 Coupling/decoupling networks (CDNs) . 18
6.2.3 Clamp injection devices . 20
6.2.4 Direct injection devices . 22
6.2.5 Decoupling networks . 22
6.3 Verification of the common-mode impedance at the EUT port of coupling and
decoupling devices . 22
6.3.1 General . 22
6.3.2 Insertion loss of the 150 Ω to 50 Ω adapters . 23
6.4 Setting of the test generator . 25
6.4.1 General . 25
6.4.2 Setting of the output level at the EUT port of the coupling device . 25
7 Test setup and injection methods . 27
7.1 Test setup . 27
7.2 EUT comprising a single unit. 28
7.3 EUT comprising several units . 30
7.4 Rules for selecting injection methods and test points . 31
7.4.1 General . 31
7.4.2 Injection method . 31
7.4.3 Ports to be tested . 32
7.5 CDN injection application . 32
7.6 Clamp injection application . 34
7.7 Direct injection application . 36
8 Test procedure . 36
9 Evaluation of the test results . 37
10 Test report . 38
Annex A (normative) EM and decoupling clamps . 39
A.1 EM clamps . 39
A.1.1 General . 39
A.1.2 Specification of EM clamps . 39
A.2 EM clamp characterization . 41
A.2.1 Specification of the clamp test jig . 41
A.2.2 Clamp characterization . 42
A.3 Decoupling clamp characterization . 47
A.3.1 General . 47
A.3.2 Specification of decoupling clamps . 47

A.3.3 Impedance . 47
A.3.4 Decoupling factor. 48
Annex B (informative) Selection criteria for the frequency range of application . 50
Annex C (informative) Guidelines for selecting test levels . 52
Annex D (informative) Information on coupling and decoupling networks . 53
D.1 Basic features of the coupling and decoupling networks . 53
D.2 Examples of coupling and decoupling networks . 53
Annex E (informative) Information for the test generator specification . 58
Annex F (informative) Test setup for large EUTs . 59
F.1 General . 59
F.2 Test setup for large EUTs . 59
Annex G (informative) Measurement uncertainty of the voltage test level . 62
G.1 General . 62
G.2 General symbols . 62
G.3 Uncertainty budgets for test methods . 62
G.3.1 Definition of the measurand . 62
G.3.2 MU contributors of the measurand . 63
G.3.3 Input quantities and calculation examples for expanded uncertainty . 64
G.4 Expression of the calculated measurement uncertainty and its application . 71
Annex H (informative) Testing with multiple signals . 73
H.1 General . 73
H.2 Intermodulation . 73
H.3 Power requirements . 74
H.4 Level-setting requirements . 75
H.5 Linearity check and harmonics checks of the test generator .
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