IEC 61215-1-4:2021

Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-4: Special requirements for testing of thin-film Cu(In,GA)(S,Se)2 based photovoltaic (PV) modules

IEC 61215-1-4:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film Cu(In,Ga)(S,Se)2 based terrestrial flat plate modules. As such it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This second edition cancels and replaces the first edition of IEC 61215-1-4, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. A cyclic (dynamic) mechanical load test (MQT 20) added.
b. A test for detection of potential-induced degradation (MQT 21) added.
c. A bending test (MQT 22) for flexible modules added.
This standard is to be read in conjunction with IEC 61215-1:2021 and IEC 61215-2:2021.

Modules photovoltaïques (PV) pour applications terrestres - Qualification de la conception et homologation - Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV) au Cu(In,Ga)(S,Se)2 à couches minces

L'IEC 61215-1-4:2021 établit les exigences pour la qualification de la conception des modules photovoltaïques (PV) pour applications terrestres adaptés à une utilisation de longue durée dans les climats à l'air libre. La durée de vie utile des modules ainsi qualifiés dépend de leur conception, de leur environnement et de leurs conditions de fonctionnement. Les résultats d’essai ne sont pas considérés comme une prévision quantitative de la durée de vie des modules. Le présent document est destiné à s'appliquer à tous les modules à plaque plane au Cu(In,Ga)(S,Se)2 à couches minces pour applications terrestres. À ce titre, il spécifie des exigences d'essai particulières à cette technologie en complément des exigences d'essai données dans l'IEC 61215-1:2021 et l'IEC 61215-2:2021. Cette deuxième édition annule et remplace la première édition de l'IEC 61215-1-4, parue en 2016. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a. Ajout d'un essai de charge mécanique (dynamique) cyclique (MQT 20).
b. Ajout d'un essai de dégradation induite par le potentiel (MQT 21).
c. Ajout d'un essai de flexion (MQT 22) dédié aux modules souples.
La présente norme doit être utilisée conjointement avec l'IEC 61215-1:2021 et l'IEC 61215‑2:2021.

General Information

• Status: Published
• Publication Date: 27-Mar-2022
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 82 - Solar photovoltaic energy systems
• Drafting Committee: WG 2 - TC 82/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 23-Feb-2021
• Completion Date: 05-Mar-2021

Relations

• Amended By: IEC 61215-1-4:2021/AMD1:2022 - Amendment 1 - Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se)2 based photovoltaic (PV) modules
• Effective Date: 05-Sep-2023
• Revises: IEC 61215-1-4:2016 - Terrestrial photovoltaic (PV) modules - Design qualification and type approval - Part 1-4: Special requirements for testing of thin-film Cu(In,GA)(S,Se)₂ based photovoltaic (PV) modules
• Effective Date: 05-Sep-2023

Overview

IEC 61215-1-4:2021 specifies special requirements for the design qualification and type approval of thin-film Cu(In,Ga)(S,Se)2 (CIGS) based terrestrial photovoltaic (PV) modules. It supplements the general IEC 61215 series (Part 1 and Part 2) by defining technology-specific test modifications and additions for flat‑plate CIGS modules intended for long‑term open‑air operation. The second edition (2021) updates the first edition (2016) and adds new mechanical, electrical and flexibility tests to address field‑observed failure modes.

Key topics and technical requirements

• Scope: qualification for CIGS thin‑film terrestrial modules; not for high‑concentration PV. Tests are intended to assess module capability for prolonged outdoor exposure; test outcomes are not direct lifetime predictions.
• Technology‑specific test additions and modifications that supplement IEC 61215-1:2021 and IEC 61215-2:2021, including:
  • MQT 20 - Cyclic (dynamic) mechanical load test: evaluates module durability under repeated mechanical loading.
  • MQT 21 - Potential‑Induced Degradation (PID) detection test: identifies susceptibility to voltage‑related degradation.
  • MQT 22 - Bending test: assesses flexible and semi‑flexible CIGS module mechanical integrity.
• Other referenced module tests included in the test flow:
  • Visual inspection, maximum power and STC/NMOT measurements
  • Thermal cycling, humidity‑freeze, damp heat and UV preconditioning
  • Hot‑spot endurance, wet leakage and insulation testing
  • Static mechanical load, hail impact and robustness of terminations
  • Bypass diode and stabilization procedures
• Test reporting, pass criteria and documentation requirements to support type approval and manufacturing traceability.

Practical applications and users

Who uses IEC 61215-1-4:2021:

• PV module manufacturers (CIGS): for design qualification, product development and certification.
• Independent test laboratories and certification bodies: to perform MQT test sequences and issue type approval reports.
• System designers, EPCs and asset owners: to inform procurement specifications, warranty assessment and reliability expectations.
• R&D and quality managers: to reproduce field failure modes (PID, mechanical fatigue, flexibility issues) and improve module robustness.

Benefits and use cases:

• Validates CIGS module resistance to electrical, climatic and mechanical stresses found in outdoor installations.
• Detects specific failure mechanisms (PID, dynamic mechanical fatigue, bending failures) before market deployment.
• Supports compliance with international PV module qualification frameworks and buyer/vendor specifications.

Related standards

• IEC 61215-1:2021 and IEC 61215-2:2021 (core design qualification and module test procedures)
• IEC 62506 (accelerated test methods guidance)
• IEC TS 63126 (high‑temperature test considerations)
• IEC 62941 (manufacturing quality systems) and references to IEC 60721‑2‑1 (climatic classification)

Keywords: IEC 61215-1-4, CIGS, thin-film PV modules, design qualification, type approval, MQT tests, PID testing, cyclic mechanical load, bending test, photovoltaic module testing.

Standards Content (Sample)

IEC 61215-1-4 ®
Edition 2.0 2021-02
REDLINE VERSION
INTERNATIONAL
STANDARD
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Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se) based
photovoltaic (PV) modules
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IEC 61215-1-4 ®
Edition 2.0 2021-02
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –

Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se) based
photovoltaic (PV) modules
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-9489-5

– 2 – IEC 61215-1-4:2021 RLV © IEC 2021
CONTENTS
FOREWORD . 4
1 Scope and object . 6
2 Normative references . 7
3 Terms and definitions . 7
4 Test samples . 7
5 Marking and documentation . 7
6 Testing . 7
7 Pass criteria . 7
8 Major visual defects . 7
9 Report . 7
10 Modifications . 7
11 Test flow and procedures . 8
11.1 Visual inspection (MQT 01) . 8
11.2 Maximum power determination (MQT 02) . 8
11.3 Insulation test (MQT 03) . 8
11.4 Measurement of temperature coefficients (MQT 04) . 8
11.5 Measurement of nominal module operating temperature (NMOT) (MQT 05)
Placeholder section, formerly NMOT . 8
11.6 Performance at STC (MQT 06.1) and NMOT (MQT 06.2) . 8
11.7 Performance at low irradiance (MQT 07) . 8
11.8 Outdoor exposure test (MQT 08) . 8
11.9 Hot-spot endurance test (MQT 09) . 8
11.9.1 Purpose . 8
11.9.2 Hot-spot effect . 8
11.9.3 Classification of cell interconnection . 9
11.9.4 Apparatus . 9
11.9.5 Procedure . 9
11.9.6 Final measurements . 9
11.9.7 Requirements . 9
11.10 UV preconditioning test (MQT 10) . 9
11.11 Thermal cycling test (MQT 11) . 9
11.12 Humidity-freeze test (MQT 12) . 9
11.13 Damp heat test (MQT 13) . 11
11.13.1 Procedure . 11
11.14 Robustness of terminations test (MQT 14) . 12
11.15 Wet leakage current test (MQT 15) . 12
11.16 Static mechanical load test (MQT 16) . 12
11.17 Hail test (MQT 17) . 12
11.18 Bypass diode testing (MQT 18) . 12
11.19 Stabilization (MQT 19) . 12
11.19.1 Criterion definition for stabilization . 12
11.19.2 Light induced stabilization procedures . 12
11.19.3 Other stabilization procedures . 12
11.19.4 Initial stabilization (MQT 19.1) . 12
11.19.5 Final stabilization (MQT 19.2) . 13

11.20 Cyclic (dynamic) mechanical load test (MQT 20) . 13
11.21 Potential induced degradation test (MQT 21) . 13
11.22 Bending test (MQT 22) . 14

Figure 1 – Current flow using MQT 11 Method B . 10
Figure 2 – Current flow using MQT 12 Method B . 11
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage . 14
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage . 14

– 4 – IEC 61215-1-4:2021 RLV © IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
FOREWORD
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This redline version of the official IEC Standard allows the user to identify the changes made to
the previous edition IEC 61215-1-4:2016. A vertical bar appears in the margin wherever a change
has been made. Additions are in green text, deletions are in strikethrough red text.

International Standard IEC 61215-1-4 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
This second edition cancels and replaces the first edition of IEC 61215-1-4, issued in 2016, and
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) A cyclic (dynamic) mechanical load test (MQT 20) added.
b) A test for detection of potential-induced degradation (MQT 21) added.
c) A bending test (MQT 22) for flexible modules added.
Informative Annex A of 61215-1:2021 explains the background and reasoning behind some of
the more substantial changes that were made in the IEC 61215 series in progressing from
edition 1 to edition 2.
The text of this standard is based on the following documents:
FDIS Report on voting
82/1827/FDIS 82/1852/RVD
Full information on the voting for the approval of this International Standard can be found in the
report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
This standard is to be read in conjunction with IEC 61215-1:2021 and IEC 61215-2:2021.
A list of all parts in the IEC 61215 series, published under the general title Terrestrial
photovoltaic (PV) modules – Design qualification and type approval, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

– 6 – IEC 61215-1-4:2021 RLV © IEC 2021
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
1 Scope and object
This part of IEC 61215 lays down IEC requirements for the design qualification and type
approval of terrestrial photovoltaic modules suitable for long-term operation in general open-air
climates, as defined in IEC 60721-2-1.
This document lays down requirements for the design qualification of terrestrial photovoltaic
modules suitable for long-term operation in open-air climates. The useful service life of modules
so qualified will depend on their design, their environment and the conditions under which they
are operated. Test results are not construed as a quantitative prediction of module lifetime.
th
In climates where 98 percentile operating temperatures exceed 70 °C, users are
recommended to consider testing to higher temperature test conditions as described in IEC TS
63126. Users desiring qualification of PV products with lesser lifetime expectations are
recommended to consider testing designed for PV in consumer electronics, as described in
IEC 63163 (under development). Users wishing to gain confidence that the characteristics
tested in IEC 61215 appear consistently in a manufactured product may wish to utilize
IEC 62941 regarding quality systems in PV manufacturing.
This document is intended to apply to all thin-film Cu(In,Ga)(S,Se) based terrestrial flat plate
modules. As such it addresses special requirements for testing of this technology
supplementing IEC 61215-1:20162021 and IEC 61215-2:20162021 requirements for testing.
This document does not apply to modules used with concentrated sunlight although it may be
utilized for low concentrator modules (1 to 3 suns). For low concentration modules, all tests are
performed using the irradiance, current, voltage and power levels expected at the design
concentration.
The object of this test sequence is to determine the electrical and thermal characteristics of the
module and to show, as far as possible within reasonable constraints of cost and time, that the
module is capable of withstanding prolonged exposure in climates described in the scope. The
actual lifetime expectancy of modules so qualified will depend on their design, their environment
and the conditions under which they are operated.
The object of this test sequence is to determine the electrical characteristics of the module and
to show, as far as possible within reasonable constraints of cost and time, that the module is
capable of withstanding prolonged exposure outdoors. Accelerated test conditions are
empirically based on those necessary to reproduce selected observed field failures and are
applied equally across module types. Acceleration factors may vary with product design and
thus not all degradation mechanisms may manifest. Further general information on accelerated
test methods including definitions of terms may be found in IEC 62506.
Some long-term degradation mechanisms can only reasonably be detected via component
testing, due to long times required to produce the failure and necessity of stress conditions that
are expensive to produce over large areas. Component tests that have reached a sufficient
level of maturity to set pass/fail criteria with high confidence are incorporated into the IEC 61215
series via addition to Table 1 in IEC 61215-1. In contrast, the tests procedures described in this
series, in IEC 61215-2, are performed on modules.

This document defines PV technology dependent modifications to the testing procedures and
requirements per IEC 61215-1:20162021 and IEC 61215-2:20162021.
2 Normative references
The normative references of IEC 61215-1:20162021 and IEC 61215-2:20162021 are applicable
without modifications.
3 Terms and definitions
This clause of IEC 61215-1:20162021 is applicable without modifications.
4 Test samples
This clause of IEC 61215-1:20162021 is applicable without modifications.
5 Marking and documentation
This clause of IEC 61215-1:20162021 is applicable without modifications.
6 Testing
This clause of IEC 61215-1:20162021 is applicable with the following modifications:
Special care has to be taken for stabilizing the power output of the module using MQT 19
procedure with specific requirements stated in 11.19 below.
7 Pass criteria
This clause of IEC 61215-1:20162021 is applicable with the following modifications.
The maximum allowable value of reproducibility is set to r = 2,0 %.
The maximum allowable value of measurement uncertainty is set to m = 4,0 % for modules
containing single-junction cells, and m = 5,0 % for modules containing multi-junction cells.
8 Major visual defects
This clause of IEC 61215-1:20162021 is applicable without modifications.
9 Report
This clause of IEC 61215-1:20162021 is applicable without modifications.
10 Modifications
This clause of IEC 61215-1:20162021 is applicable without modifications.

– 8 – IEC 61215-1-4:2021 RLV © IEC 2021
11 Test flow and procedures
The test flow from IEC 61215-1:20162021 is applicable.
11.1 Visual inspection (MQT 01)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.2 Maximum power determination (MQT 02)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.3 Insulation test (MQT 03)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.4 Measurement of temperature coefficients (MQT 04)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.5 Measurement of nominal module operating temperature (NMOT) (MQT 05)
Placeholder section, formerly NMOT
This test of IEC 61215-2:2016 is applicable without modifications.
This subclause of IEC 61215-2:2021 does not require technology-specific modifications.
11.6 Performance at STC (MQT 06.1) and NMOT (MQT 06.2)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.7 Performance at low irradiance (MQT 07)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.8 Outdoor exposure test (MQT 08)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.9 Hot-spot endurance test (MQT 09)
This test of IEC 61215-2:20162021 is applicable with the following modifications:
Cu(In,Ga)(S,Se) thin-film modules may exhibit performance changes with extended time in
storage without light exposure (the “dark soak” effect). In order to minimize the influence of this
dark soak effect, limit the time delay between the outdoor exposure or stabilization and the hot
spot procedure to within 2 to 3 days. During the first hour after the hot-spot procedure is
complete, no additional heating or light beyond room ambient shall be applied. If the time delay
is to exceed 1 h, the modules are to be stored in the dark at ≤ 25 °C.
11.9.1 Purpose
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.
11.9.2 Hot-spot effect
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.

11.9.3 Classification of cell interconnection
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.
11.9.4 Apparatus
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.
11.9.5 Procedure
MQT 09.2 of IEC 61215-2:20162021 shall be performed for any monolithically integrated (MLI)
module design.
If the module is constructed by interconnection of cell-like substructures, MQT 09.1 of
IEC 61215-2:20162021 may be applicable.
11.9.6 Final measurements
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.
11.9.7 Requirements
This subclause of IEC 61215-2:20162021, test MQT 09, is applicable without modifications.
11.10 UV preconditioning test (MQT 10)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.11 Thermal cycling test (MQT 11)
This test of IEC 61215-2:20162021 is applicable with the following modifications:
The technology specific current which needs to be applied according to MQT 11 of IEC 61215-
2:2016 shall be equal to 0,1 × STC peak power current.
MQT 11 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 11 as defined in IEC 61215-2:2021, with the technology specific
current equal to 0,1 × STC peak power current. If 0,1 × STC peak power current is less than
100 mA, then 100 mA may be applied instead.
Method B) Perform MQT 11 as defined in IEC 61215-2:2021 with the following modifications:
During the thermal cycling test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until the module temperature is below
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT11 of IEC 61215-2
shall be a forward bias current of 0,1 × STC peak power current to 0,3 × STC peak power
current. If 0,1 × STC peak power current is less than 100 mA, then 100 mA may be applied
instead.
The current flow applied during Method B is shown superimposed on the temperature cycle in
Figure 1.
– 10 – IEC 61215-1-4:2021 RLV © IEC 2021

Figure 1 – Current flow using MQT 11 Method B
11.12 Humidity-freeze test (MQT 12)
This test of IEC 61215-2:20162021 is applicable without with the following modifications:
MQT 12 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 12 as defined in IEC 61215-2:2021.
Method B) Perform MQT 12 as defined in IEC 61215-2:2021 with the following modifications:
During the humidity freeze test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until module temperature has reached
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT12 of IEC 61215-2
in Method B shall be a forward bias current of 0,1 × STC peak power current to 0,3 × STC peak
power current, with a minimum of 100 mA.
The current flow applied during Method B is shown superimposed on the humidity-freeze cycle
in Figure 2.
Figure 2 – Current flow using MQT 12 Method B
11.13 Damp heat test (MQT 13)
This test of IEC 61215-2:20162021 is applicable with the following modifications:
MQT 13 of IEC 61215-2:20162021 can be conducted according to the following methods:
Method A) Perform MQT 13 as defined in IEC 61215-2:20162021.
Method B) Perform MQT 13 as defined in IEC 61215-2:20162021 with applied forward bias:
11.13.1 Procedure
a) Attach a suitable temperature sensor (see apparatus requirements of MQT 11) to the front
or back surface of the module(s) near the middle. If more than one module of the same type
are tested simultaneously, it will suffice to monitor the temperature of one representative
sample.
b) Connect the temperature-monitoring equipment to the temperature sensor(s). Connect each
module individually to the appropriate voltage supply by connecting the positive terminal of
the module to the positive terminal of the power supply and the second terminal accordingly.
During the damp-heat set the applied voltage to V ± 5 % at STC taken from the data-
mpp
sheet and limit the current of the power supply to less than 25 % of I at STC.
sc
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) Set chamber temperature to achieve a module temperature of 85 °C ± 2 °C.
e) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
– 12 – IEC 61215-1-4:2021 RLV © IEC 2021
11.14 Robustness of terminations test (MQT 14)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.15 Wet leakage current test (MQT 15)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.16 Static mechanical load test (MQT 16)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.17 Hail test (MQT 17)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.18 Bypass diode testing (MQT 18)
This test of IEC 61215-2:20162021 is applicable without modifications.
11.19 Stabilization (MQT 19)
This test of IEC 61215-2:20162021 is applicable with the following modifications:
11.19.1 Criterion definition for stabilization
For the definition of stabilization as per MQT 19 of IEC 61215-2:20162021, x = 0,02 shall be
used.
Any kind of storage shall be done at temperature below 25 °C to avoid thermally activated
processes affecting MQT 06.1 of IEC 61215-2:20162021 measurement.
11.19.2 Light induced stabilization procedures
This test of IEC 61215-2:20162021 is applicable without modifications.
11.19.3 Other stabilization procedures
This test of IEC 61215-2:20162021 is applicable without modifications.
11.19.4 Initial stabilization (MQT 19.1)
Initial stabilization is performed on all modules.
To fulfil MQT 19 requirements using light exposure, a minimum of two intervals each of at least
10 kWh/m are required. After this preconditioning all of the test modules shall be measured for
STC power (MQT 06.1 of IEC 61215-2:20162021).
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method following
the validation procedure from MQT 19 of IEC 61215-2:20162021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum and
maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.

Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-
2:20162021.
11.19.5 Final stabilization (MQT 19.2)
Final stabilization is performed on all modules after the test sequences to prove fulfilment of
Gate No. 2 requirement of IEC 61215-1:20162021.
To fulfil MQT 19 requirements a minimum of two intervals of at least 10 kWh/m each are
required.
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method following
MQT 19 of IEC 61215-2:20162021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum and
maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.
For modules that have been subjected to potential induced degradation (PID) stress (MQT 21),
the maximum exposure limit after reaching stabilization shall not be exceeded. The light soak
shall terminate no more than 20 kWh/m after the stabilization criterion is met.
Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-
2:20162021.
11.20 Cyclic (dynamic) mechanical load test (MQT 20)
This test of IEC 61215-2:2021 is applicable without modifications.
11.21 Potential induced degradation test (MQT 21)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 21 of IEC 61215-2:2021 can be conducted according to either Method A or Method B
below.
Method A) Perform MQT 21 as defined in IEC 61215-2:2021.
Method B) Perform MQT 21 as defined in IEC 61215-2:2021 with applied forward bias by adding
the following steps to 4.21.4 “Procedure” in 61215-2:2021:
a) Prior to the test, connect each module individually to the appropriate voltage supply. Proper
lead connection is illustrated in Figure 3 and Figure 4.
In the positive system voltage configuration, the power supply for application of forward bias
current is isolated by an isolation transformer and one DC terminal of the forward biasing
power supply is connected to the system voltage terminal of the power supply for application
of the system voltage bias (see Figure 3).
In the negative system voltage configuration, system voltage is applied to the normally
grounded module frame, grounding, or mounting points and the power source for forward

– 14 – IEC 61215-1-4:2021 RLV © IEC 2021
bias application has one DC terminal tied to ground (see Figure 4). The grounding points
for the module shall be electrically isolated from the environmental chamber to prevent
overloading of the power supply applying system voltage. A safety interlock that turns off
the power supplies for the application of system voltage bias to the module frames is a
requirement for safety for this configuration.
b) During the test set the applied voltage to V ± 5 % at STC taken from the data-sheet and
mpp
limit the current of the power supply to less than 25 % of I at STC.
sc
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
Schematic shows isolated power supply for application of forward bias (V ) and system voltage (V ) applied to
fwd sys
the active cell circuit.
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage

Schematic for application of system voltage (V ) bias on test module on normally grounded parts. The system
sys
voltage applied to the active cell circuit is negative as shown and forward bias current is applied through the cell
circuit.
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage
11.22 Bending test (MQT 22)
This test of IEC 61215-2:2021 is applicable to flexible modules without modifications.

___________
IEC 61215-1-4 ®
Edition 2.0 2021-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se) based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la
conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV)
au Cu(In,Ga)(S,Se) à couches minces
– 2 – IEC 61215-1-4:2021 © IEC 2021
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 Test samples . 7
5 Marking and documentation . 7
6 Testing . 7
7 Pass criteria . 7
8 Major visual defects . 7
9 Report . 7
10 Modifications . 7
11 Test flow and procedures . 7
11.1 Visual inspection (MQT 01) . 7
11.2 Maximum power determination (MQT 02) . 7
11.3 Insulation test (MQT 03) . 8
11.4 Measurement of temperature coefficients (MQT 04) . 8
11.5 Placeholder section, formerly NMOT . 8
11.6 Performance at STC (MQT 06.1) . 8
11.7 Performance at low irradiance (MQT 07) . 8
11.8 Outdoor exposure test (MQT 08) . 8
11.9 Hot-spot endurance test (MQT 09) . 8
11.9.1 Purpose . 8
11.9.2 Hot-spot effect . 8
11.9.3 Classification of cell interconnection . 8
11.9.4 Apparatus . 8
11.9.5 Procedure . 8
11.9.6 Final measurements . 9
11.9.7 Requirements . 9
11.10 UV preconditioning test (MQT 10) . 9
11.11 Thermal cycling test (MQT 11) . 9
11.12 Humidity-freeze test (MQT 12) . 10
11.13 Damp heat test (MQT 13) . 11
11.13.1 Procedure . 11
11.14 Robustness of terminations (MQT 14) . 12
11.15 Wet leakage current test (MQT 15) . 12
11.16 Static mechanical load test (MQT 16) . 12
11.17 Hail test (MQT 17) . 12
11.18 Bypass diode testing (MQT 18) . 12
11.19 Stabilization (MQT 19) . 12
11.19.1 Criterion definition for stabilization . 12
11.19.2 Light induced stabilization procedures . 12
11.19.3 Other stabilization procedures . 12
11.19.4 Initial stabilization (MQT 19.1) . 12
11.19.5 Final stabilization (MQT 19.2) . 13
11.20 Cyclic (dynamic) mechanical load test (MQT 20) . 13

11.21 Potential induced degradation test (MQT 21) . 13
11.22 Bending test (MQT 22) . 14

Figure 1 – Current flow using MQT 11 Method B . 10
Figure 2 – Current flow using MQT 12 Method B . 11
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage . 14
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage . 14

– 4 – IEC 61215-1-4:2021 © IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All u
...

IEC 61215-1-4 ®
Edition 2.0 2021-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se) based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la
conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV)
au Cu(In,Ga)(S,Se) à couches minces
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IEC 61215-1-4 ®
Edition 2.0 2021-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –

Part 1-4: Special requirements for testing of thin-film Cu(In,Ga)(S,Se) based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la

conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV)

au Cu(In,Ga)(S,Se) à couches minces
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-9393-5

– 2 – IEC 61215-1-4:2021 © IEC 2021
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 Test samples . 7
5 Marking and documentation . 7
6 Testing . 7
7 Pass criteria . 7
8 Major visual defects . 7
9 Report . 7
10 Modifications . 7
11 Test flow and procedures . 7
11.1 Visual inspection (MQT 01) . 7
11.2 Maximum power determination (MQT 02) . 7
11.3 Insulation test (MQT 03) . 8
11.4 Measurement of temperature coefficients (MQT 04) . 8
11.5 Placeholder section, formerly NMOT . 8
11.6 Performance at STC (MQT 06.1) . 8
11.7 Performance at low irradiance (MQT 07) . 8
11.8 Outdoor exposure test (MQT 08) . 8
11.9 Hot-spot endurance test (MQT 09) . 8
11.9.1 Purpose . 8
11.9.2 Hot-spot effect . 8
11.9.3 Classification of cell interconnection . 8
11.9.4 Apparatus . 8
11.9.5 Procedure . 8
11.9.6 Final measurements . 9
11.9.7 Requirements . 9
11.10 UV preconditioning test (MQT 10) . 9
11.11 Thermal cycling test (MQT 11) . 9
11.12 Humidity-freeze test (MQT 12) . 10
11.13 Damp heat test (MQT 13) . 11
11.13.1 Procedure . 11
11.14 Robustness of terminations (MQT 14) . 12
11.15 Wet leakage current test (MQT 15) . 12
11.16 Static mechanical load test (MQT 16) . 12
11.17 Hail test (MQT 17) . 12
11.18 Bypass diode testing (MQT 18) . 12
11.19 Stabilization (MQT 19) . 12
11.19.1 Criterion definition for stabilization . 12
11.19.2 Light induced stabilization procedures . 12
11.19.3 Other stabilization procedures . 12
11.19.4 Initial stabilization (MQT 19.1) . 12
11.19.5 Final stabilization (MQT 19.2) . 13
11.20 Cyclic (dynamic) mechanical load test (MQT 20) . 13

11.21 Potential induced degradation test (MQT 21) . 13
11.22 Bending test (MQT 22) . 14

Figure 1 – Current flow using MQT 11 Method B . 10
Figure 2 – Current flow using MQT 12 Method B . 11
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage . 14
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage . 14

– 4 – IEC 61215-1-4:2021 © IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61215-1-4 has been prepared by IEC technical committee 82:
Solar photovoltaic energy systems.
This second edition cancels and replaces the first edition of IEC 61215-1-4, issued in 2016,
and constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) A cyclic (dynamic) mechanical load test (MQT 20) added.
b) A test for detection of potential-induced degradation (MQT 21) added.
c) A bending test (MQT 22) for flexible modules added.

Informative Annex A of 61215-1:2021 explains the background and reasoning behind some of
the more substantial changes that were made in the IEC 61215 series in progressing from
edition 1 to edition 2.
The text of this standard is based on the following documents:
FDIS Report on voting
82/1827/FDIS 82/1852/RVD
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
This standard is to be read in conjunction with IEC 61215-1:2021 and IEC 61215-2:2021.
A list of all parts in the IEC 61215 series, published under the general title Terrestrial
photovoltaic (PV) modules – Design qualification and type approval, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

– 6 – IEC 61215-1-4:2021 © IEC 2021
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
1 Scope
This document lays down requirements for the design qualification of terrestrial photovoltaic
modules suitable for long-term operation in open-air climates. The useful service life of
modules so qualified will depend on their design, their environment and the conditions under
which they are operated. Test results are not construed as a quantitative prediction of module
lifetime.
th
In climates where 98 percentile operating temperatures exceed 70 °C, users are
recommended to consider testing to higher temperature test conditions as described in
IEC TS 63126. Users desiring qualification of PV products with lesser lifetime expectations
are recommended to consider testing designed for PV in consumer electronics, as described
in IEC 63163 (under development). Users wishing to gain confidence that the characteristics
tested in IEC 61215 appear consistently in a manufactured product may wish to utilize
IEC 62941 regarding quality systems in PV manufacturing.
This document is intended to apply to all thin-film Cu(In,Ga)(S,Se) based terrestrial flat plate
modules. As such it addresses special requirements for testing of this technology
supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing.
This document does not apply to modules used with concentrated sunlight although it may be
utilized for low concentrator modules (1 to 3 suns). For low concentration modules, all tests
are performed using the irradiance, current, voltage and power levels expected at the design
concentration.
The object of this test sequence is to determine the electrical characteristics of the module
and to show, as far as possible within reasonable constraints of cost and time, that the
module is capable of withstanding prolonged exposure outdoors. Accelerated test conditions
are empirically based on those necessary to reproduce selected observed field failures and
are applied equally across module types. Acceleration factors may vary with product design
and thus not all degradation mechanisms may manifest. Further general information on
accelerated test methods including definitions of terms may be found in IEC 62506.
Some long-term degradation mechanisms can only reasonably be detected via component
testing, due to long times required to produce the failure and necessity of stress conditions
that are expensive to produce over large areas. Component tests that have reached a
sufficient level of maturity to set pass/fail criteria with high confidence are incorporated into
the IEC 61215 series via addition to Table 1 in IEC 61215-1. In contrast, the tests procedures
described in this series, in IEC 61215-2, are performed on modules.
This document defines PV technology dependent modifications to the testing procedures and
requirements per IEC 61215-1:2021 and IEC 61215-2:2021.
2 Normative references
The normative references of IEC 61215-1:2021 and IEC 61215-2:2021 are applicable without
modifications.
3 Terms and definitions
This clause of IEC 61215-1:2021 is applicable without modifications.
4 Test samples
This clause of IEC 61215-1:2021 is applicable without modifications.
5 Marking and documentation
This clause of IEC 61215-1:2021 is applicable without modifications.
6 Testing
This clause of IEC 61215-1:2021 is applicable with the following modifications:
Special care has to be taken for stabilizing the power output of the module using MQT 19
procedure with specific requirements stated in 11.19 below.
7 Pass criteria
This clause of IEC 61215-1:2021 is applicable with the following modifications.
The maximum allowable value of reproducibility is set to r = 2,0 %.
The maximum allowable value of measurement uncertainty is set to m = 4,0 % for modules
containing single-junction cells, and m = 5,0 % for modules containing multi-junction cells.
8 Major visual defects
This clause of IEC 61215-1:2021 is applicable without modifications.
9 Report
This clause of IEC 61215-1:2021 is applicable without modifications.
10 Modifications
This clause of IEC 61215-1:2021 is applicable without modifications.
11 Test flow and procedures
The test flow from IEC 61215-1:2021 is applicable.
11.1 Visual inspection (MQT 01)
This test of IEC 61215-2:2021 is applicable without modifications.
11.2 Maximum power determination (MQT 02)
This test of IEC 61215-2:2021 is applicable without modifications.

– 8 – IEC 61215-1-4:2021 © IEC 2021
11.3 Insulation test (MQT 03)
This test of IEC 61215-2:2021 is applicable without modifications.
11.4 Measurement of temperature coefficients (MQT 04)
This test of IEC 61215-2:2021 is applicable without modifications.
11.5 Placeholder section, formerly NMOT
This subclause of IEC 61215-2:2021 does not require technology-specific modifications.
11.6 Performance at STC (MQT 06.1)
This test of IEC 61215-2:2021 is applicable without modifications.
11.7 Performance at low irradiance (MQT 07)
This test of IEC 61215-2:2021 is applicable without modifications.
11.8 Outdoor exposure test (MQT 08)
This test of IEC 61215-2:2021 is applicable without modifications.
11.9 Hot-spot endurance test (MQT 09)
This test of IEC 61215-2:2021 is applicable with the following modifications:
Cu(In,Ga)(S,Se) thin-film modules may exhibit performance changes with extended time in
storage without light exposure (the “dark soak” effect). In order to minimize the influence of
this dark soak effect, limit the time delay between the outdoor exposure or stabilization and
the hot spot procedure to within 2 to 3 days. During the first hour after the hot-spot procedure
is complete, no additional heating or light beyond room ambient shall be applied. If the time
delay is to exceed 1 h, the modules are to be stored in the dark at ≤ 25 °C.
11.9.1 Purpose
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.2 Hot-spot effect
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.3 Classification of cell interconnection
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.4 Apparatus
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.5 Procedure
MQT 09.2 of IEC 61215-2:2021 shall be performed for any monolithically integrated (MLI)
module design.
If the module is constructed by interconnection of cell-like substructures, MQT 09.1 of
IEC 61215-2:2021 may be applicable.

11.9.6 Final measurements
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.7 Requirements
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.10 UV preconditioning test (MQT 10)
This test of IEC 61215-2:2021 is applicable without modifications.
11.11 Thermal cycling test (MQT 11)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 11 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 11 as defined in IEC 61215-2:2021, with the technology specific
current equal to 0,1 × STC peak power current. If 0,1 × STC peak power current is less than
100 mA, then 100 mA may be applied instead.
Method B) Perform MQT 11 as defined in IEC 61215-2:2021 with the following modifications:
During the thermal cycling test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until the module temperature is below
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT11 of
IEC 61215-2 shall be a forward bias current of 0,1 × STC peak power current to 0,3 × STC
peak power current. If 0,1 × STC peak power current is less than 100 mA, then 100 mA may
be applied instead.
The current flow applied during Method B is shown superimposed on the temperature cycle in
Figure 1.
– 10 – IEC 61215-1-4:2021 © IEC 2021

Figure 1 – Current flow using MQT 11 Method B
11.12 Humidity-freeze test (MQT 12)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 12 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 12 as defined in IEC 61215-2:2021.
Method B) Perform MQT 12 as defined in IEC 61215-2:2021 with the following modifications:
During the humidity freeze test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until module temperature has reached
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT12 of
IEC 61215-2 in Method B shall be a forward bias current of 0,1 × STC peak power current to
0,3 × STC peak power current, with a minimum of 100 mA.
The current flow applied during Method B is shown superimposed on the humidity-freeze
cycle in Figure 2.
Figure 2 – Current flow using MQT 12 Method B
11.13 Damp heat test (MQT 13)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 13 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 13 as defined in IEC 61215-2:2021.
Method B) Perform MQT 13 as defined in IEC 61215-2:2021 with applied forward bias:
11.13.1 Procedure
a) Attach a suitable temperature sensor (see apparatus requirements of MQT 11) to the front
or back surface of the module(s) near the middle. If more than one module of the same
type are tested simultaneously, it will suffice to monitor the temperature of one
representative sample.
b) Connect the temperature-monitoring equipment to the temperature sensor(s). Connect
each module individually to the appropriate voltage supply by connecting the positive
terminal of the module to the positive terminal of the power supply and the second
terminal accordingly. During the damp-heat set the applied voltage to V ± 5 % at STC
mpp
taken from the data-sheet and limit the current of the power supply to less than 25 % of I
sc
at STC.
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) Set chamber temperature to achieve a module temperature of 85 °C ± 2 °C.
e) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
– 12 – IEC 61215-1-4:2021 © IEC 2021
11.14 Robustness of terminations (MQT 14)
This test of IEC 61215-2:2021 is applicable without modifications.
11.15 Wet leakage current test (MQT 15)
This test of IEC 61215-2:2021 is applicable without modifications.
11.16 Static mechanical load test (MQT 16)
This test of IEC 61215-2:2021 is applicable without modifications.
11.17 Hail test (MQT 17)
This test of IEC 61215-2:2021 is applicable without modifications.
11.18 Bypass diode testing (MQT 18)
This test of IEC 61215-2:2021 is applicable without modifications.
11.19 Stabilization (MQT 19)
This test of IEC 61215-2:2021 is applicable with the following modifications:
11.19.1 Criterion definition for stabilization
For the definition of stabilization as per MQT 19 of IEC 61215-2:2021, x = 0,02 shall be used.
Any kind of storage shall be done at temperature below 25 °C to avoid thermally activated
processes affecting MQT 06.1 of IEC 61215-2:2021 measurement.
11.19.2 Light induced stabilization procedures
This test of IEC 61215-2:2021 is applicable without modifications.
11.19.3 Other stabilization procedures
This test of IEC 61215-2:2021 is applicable without modifications.
11.19.4 Initial stabilization (MQT 19.1)
Initial stabilization is performed on all modules.
To fulfil MQT 19 requirements using light exposure, a minimum of two intervals each of at
are required. After this preconditioning all of the test modules shall be
least 10 kWh/m
measured for STC power (MQT 06.1 of IEC 61215-2:2021).
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method
following the validation procedure from MQT 19 of IEC 61215-2:2021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum
and maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.
Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-2:2021.
11.19.5 Final stabilization (MQT 19.2)
Final stabilization is performed on all modules after the test sequences to prove fulfilment of
Gate No. 2 requirement of IEC 61215-1:2021.
To fulfil MQT 19 requirements a minimum of two intervals of at least 10 kWh/m each are
required.
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method
following MQT 19 of IEC 61215-2:2021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum
and maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.
For modules that have been subjected to potential induced degradation (PID) stress (MQT 21),
the maximum exposure limit after reaching stabilization shall not be exceeded. The light soak
shall terminate no more than 20 kWh/m after the stabilization criterion is met.
Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-2:2021.
11.20 Cyclic (dynamic) mechanical load test (MQT 20)
This test of IEC 61215-2:2021 is applicable without modifications.
11.21 Potential induced degradation test (MQT 21)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 21 of IEC 61215-2:2021 can be conducted according to either Method A or Method B
below.
Method A) Perform MQT 21 as defined in IEC 61215-2:2021.
Method B) Perform MQT 21 as defined in IEC 61215-2:2021 with applied forward bias by
adding the following steps to 4.21.4 “Procedure” in 61215-2:2021:
a) Prior to the test, connect each module individually to the appropriate voltage supply.
Proper lead connection is illustrated in Figure 3 and Figure 4.
In the positive system voltage configuration, the power supply for application of forward
bias current is isolated by an isolation transformer and one DC terminal of the forward
biasing power supply is connected to the system voltage terminal of the power supply for
application of the system voltage bias (see Figure 3).
In the negative system voltage configuration, system voltage is applied to the normally
grounded module frame, grounding, or mounting points and the power source for forward
bias application has one DC terminal tied to ground (see Figure 4). The grounding points
for the module shall be electrically isolated from the environmental chamber to prevent
overloading of the power supply applying system voltage. A safety interlock that turns off
the power supplies for the application of system voltage bias to the module frames is a
requirement for safety for this configuration.

– 14 – IEC 61215-1-4:2021 © IEC 2021
b) During the test set the applied voltage to V ± 5 % at STC taken from the data-sheet
mpp
and limit the current of the power supply to less than 25 % of I at STC.
sc
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
Schematic shows isolated power supply for application of forward bias (V ) and system voltage (V ) applied to
fwd sys
the active cell circuit.
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage

Schematic for application of system voltage (V ) bias on test module on normally grounded parts. The system
sys
voltage applied to the active cell circuit is negative as shown and forward bias current is applied through the cell
circuit.
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage
11.22 Bending test (MQT 22)
This test of IEC 61215-2:2021 is applicable to flexible modules without modifications.

___________
– 16 – IEC 61215-1-4:2021 © IEC 2021
SOMMAIRE
AVANT-PROPOS . 18
1 Domaine d'application . 20
2 Références normatives . 21
3 Termes et définitions . 21
4 Échantillons d'essai . 21
5 Marquage et documentation . 21
6 Essais . 21
7 Critères d'acceptation . 21
8 Défauts visuels majeurs . 21
9 Rapport . 21
10 Modifications . 22
11 Série et procédures d'essais . 22
11.1 Examen visuel (MQT 01) . 22
11.2 Détermination de la puissance maximale (MQT 02). 22
11.3 Essai diélectrique (MQT 03) . 22
11.4 Mesurage des coefficients de température (MQT 04) . 22
11.5 Section de l'espace réservé, précédemment NMOT . 22
11.6 Performances dans les STC (MQT 06.1) . 22
11.7 Performances sous faible éclairement (MQT 07) . 22
11.8 Essai d'exposition en site naturel (MQT 08) . 22
11.9 Essai de tenue à l'échauffement localisé (MQT 09) . 22
11.9.1 Objet . 22
11.9.2 Effet de l'échauffement localisé . 23
11.9.3 Classification des interconnexions de cellules . 23
11.9.4 Appareillage . 23
11.9.5 Procédure . 23
11.9.6 Mesurages finaux . 23
11.9.7 Exigences . 23
11.10 Essai de préconditionnement aux UV (MQT 10) . 23
11.11 Essai de cycle thermique (MQT 11) . 23
11.12 Essai humidité-gel (MQT 12) . 24
11.13 Essai de chaleur humide (MQT 13) . 25
11.13.1 Procédure . 25
11.14 Essai de robustesse des sorties (MQT 14) . 26
11.15 Essai de courant de fuite en milieu humide (MQT 15) . 26
11.16 Essai de charge mécanique statique (MQT 16) . 26
11.17 Essai à la grêle (MQT 17) . 26
11.18 Essai de la diode de dérivation(MQT 18). 26
11.19 Stabilisation (MQT 19) . 26
11.19.1 Définition de critères pour la stabilisation . 26
11.19.2 Procédures de stabilisation induite par la lumière . 26
11.19.3 Autres procédures de stabilisation . 26
11.19.4 Stabilisation initiale (MQT 19.1) . 26
11.19.5 Stabilisation finale (MQT 19.2). 27
11.20 Essai de charge mécanique cyclique (dynamique) (MQT 20) . 27

11.21 Essai de dégradation induite par le potentiel (MQT 21) . 27
11.22 Essai de flexion (MQT 22) . 29

Figure 1 – Circulation de courant utilisant la méthode B de MQT 11 . 24
Figure 2 – Circulation de courant utilisant la méthode B de MQT 12 . 25
Figure 3 – Connexions électriques pour la méthode B de l’essai MQT 21, tension de
réseau positive . 28
Figure 4 – Connexions électriques pour la méthode B de l’essai MQT 21, tension de
réseau négative . 29

– 18 – IEC 61215-1-4:2021 © IEC 2021
COMMISSION ÉLECTROTECHNIQUE INTERNATIONALE
___________
MODULES PHOTOVOLTAÏQUES (PV) POUR APPLICATIONS
TERRESTRES – QUALIFICATION DE LA CONCEPTION ET
HOMOLOGATION –
Partie 1-4: Exigences particulières d'essai
des modules photovoltaïques (PV)
au Cu(In,Ga)(S,Se) à couches minces
AVANT-PROPOS
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3) Les Publications de l’IEC se présentent sous la forme de recommandations internationales et sont agréé
...

IEC 61215-1-4 ®
Edition 2.1 2022-03
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,GA)(S,Se)2 based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la
conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV) au
Cu(In,GA)(S,Se)2 à couches minces

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IEC 61215-1-4 ®
Edition 2.1 2022-03
CONSOLIDATED VERSION
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,GA)(S,Se) based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la
conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV) au
Cu(In,GA)(S,Se) à couches minces
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-4912-3

IEC 61215-1-4 ®
Edition 2.1 2022-03
CONSOLIDATED VERSION
REDLINE VERSION
VERSION REDLINE
colour
inside
Terrestrial photovoltaic (PV) modules – Design qualification and type approval –
Part 1-4: Special requirements for testing of thin-film Cu(In,GA)(S,Se)2 based
photovoltaic (PV) modules
Modules photovoltaïques (PV) pour applications terrestres – Qualification de la
conception et homologation –
Partie 1-4: Exigences particulières d'essai des modules photovoltaïques (PV) au
Cu(In,GA)(S,Se)2 à couches minces

– 2 – IEC 61215-1-4:2021+AMD1:2022 CSV
© IEC 2022
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 Test samples . 7
5 Marking and documentation . 7
5.1 Name plate . 7
5.2 Documentation . 7
6 Testing . 8
7 Pass criteria . 8
8 Major visual defects . 8
9 Report . 8
10 Modifications . 8
11 Test flow and procedures . 8
11.1 Visual inspection (MQT 01) . 9
11.2 Maximum power determination (MQT 02) . 9
11.3 Insulation test (MQT 03) . 9
11.4 Measurement of temperature coefficients (MQT 04) . 9
11.5 Placeholder section, formerly NMOT . 9
11.6 Performance at STC (MQT 06.1) . 9
11.7 Performance at low irradiance (MQT 07) . 9
11.8 Outdoor exposure test (MQT 08) . 9
11.9 Hot-spot endurance test (MQT 09) . 9
11.9.1 Purpose . 10
11.9.2 Hot-spot effect . 10
11.9.3 Classification of cell interconnection . 10
11.9.4 Apparatus . 10
11.9.5 Procedure . 10
11.9.6 Final measurements . 10
11.9.7 Requirements . 10
11.10 UV preconditioning test (MQT 10) . 10
11.11 Thermal cycling test (MQT 11) . 10
11.12 Humidity-freeze test (MQT 12) . 11
11.13 Damp heat test (MQT 13) . 12
11.13.1 Procedure . 12
11.14 Robustness of terminations (MQT 14) . 13
11.15 Wet leakage current test (MQT 15) . 13
11.16 Static mechanical load test (MQT 16) . 13
11.17 Hail test (MQT 17) . 13
11.18 Bypass diode testing (MQT 18) . 13
11.19 Stabilization (MQT 19) . 13
11.19.1 Criterion definition for stabilization . 13
11.19.2 Light induced stabilization procedures . 13
11.19.3 Other stabilization procedures . 13
11.19.4 Initial stabilization (MQT 19.1) . 14

© IEC 2022
11.19.5 Final stabilization (MQT 19.2) . 14
11.20 Cyclic (dynamic) mechanical load test (MQT 20) . 14
11.21 Potential induced degradation test (MQT 21) . 14
11.22 Bending test (MQT 22) . 16

– 4 – IEC 61215-1-4:2021+AMD1:2022 CSV
© IEC 2022
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
FOREWORD
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This consolidated version of the official IEC Standard and its amendment has been
prepared for user convenience.
IEC 61215-1-4 edition 2.1 contains the second edition (2021-02) [documents
82/1827/FDIS and 82/1852/RVD] and its amendment 1 (2022-03) [documents
82/1998/FDIS and 82/2022/RVD].
In this Redline version, a vertical line in the margin shows where the technical content
is modified by amendment 1. Additions are in green text, deletions are in strikethrough
red text. A separate Final version with all changes accepted is available in this
publication.
International Standard IEC 61215-1-4 has been prepared by IEC technical committee 82:
Solar photovoltaic energy systems.

© IEC 2022
This second edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) A cyclic (dynamic) mechanical load test (MQT 20) added.
b) A test for detection of potential-induced degradation (MQT 21) added.
c) A bending test (MQT 22) for flexible modules added.
Informative Annex A of 61215-1:2021 explains the background and reasoning behind some of
the more substantial changes that were made in the IEC 61215 series in progressing from
edition 1 to edition 2.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
This standard is to be read in conjunction with IEC 61215-1:2021 and IEC 61215-2:2021.
A list of all parts in the IEC 61215 series, published under the general title Terrestrial
photovoltaic (PV) modules – Design qualification and type approval, can be found on the IEC
website.
The committee has decided that the contents of the base publication and its amendment will
remain unchanged until the stability date indicated on the IEC web site under webstore.iec.ch
in the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it
contains colours which are considered to be useful for the correct understanding of its
contents. Users should therefore print this document using a colour printer.

– 6 – IEC 61215-1-4:2021+AMD1:2022 CSV
© IEC 2022
TERRESTRIAL PHOTOVOLTAIC (PV) MODULES –
DESIGN QUALIFICATION AND TYPE APPROVAL –

Part 1-4: Special requirements for testing of thin-film
Cu(In,Ga)(S,Se) based photovoltaic (PV) modules
1 Scope
This document lays down requirements for the design qualification of terrestrial photovoltaic
modules suitable for long-term operation in open-air climates. The useful service life of
modules so qualified will depend on their design, their environment and the conditions under
which they are operated. Test results are not construed as a quantitative prediction of module
lifetime.
th
In climates where 98 percentile operating temperatures exceed 70 °C, users are
recommended to consider testing to higher temperature test conditions as described in
IEC TS 63126. Users desiring qualification of PV products with lesser lifetime expectations
are recommended to consider testing designed for PV in consumer electronics, as described
in IEC 63163 (under development). Users wishing to gain confidence that the characteristics
tested in IEC 61215 appear consistently in a manufactured product may wish to utilize
IEC 62941 regarding quality systems in PV manufacturing.
This document is intended to apply to all thin-film Cu(In,Ga)(S,Se) based terrestrial flat plate
modules. As such it addresses special requirements for testing of this technology
supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing.
This document does not apply to modules used with concentrated sunlight although it may be
utilized for low concentrator modules (1 to 3 suns). For low concentration modules, all tests
are performed using the irradiance, current, voltage and power levels expected at the design
concentration.
The object of this test sequence is to determine the electrical characteristics of the module
and to show, as far as possible within reasonable constraints of cost and time, that the
module is capable of withstanding prolonged exposure outdoors. Accelerated test conditions
are empirically based on those necessary to reproduce selected observed field failures and
are applied equally across module types. Acceleration factors may vary with product design
and thus not all degradation mechanisms may manifest. Further general information on
accelerated test methods including definitions of terms may be found in IEC 62506.
Some long-term degradation mechanisms can only reasonably be detected via component
testing, due to long times required to produce the failure and necessity of stress conditions
that are expensive to produce over large areas. Component tests that have reached a
sufficient level of maturity to set pass/fail criteria with high confidence are incorporated into
the IEC 61215 series via addition to Table 1 in IEC 61215-1. In contrast, the tests procedures
described in this series, in IEC 61215-2, are performed on modules.
This document defines PV technology dependent modifications to the testing procedures and
requirements per IEC 61215-1:2021 and IEC 61215-2:2021.
2 Normative references
The normative references of IEC 61215-1:2021 and IEC 61215-2:2021 are applicable without
modifications.
© IEC 2022
3 Terms and definitions
This clause of IEC 61215-1:2021 is applicable without with the following modifications.
Add the following new terms:
3.13
reduced mechanical load module
module where the test load in MQT 16 is less than 2 400 Pa
Note 1 to entry: 2 400 Pa was required in earlier versions of the IEC 61215 series for all technologies (e.g.
IEC 61215-2:2021).
3.14
restricted access area
area accessible only to electrically skilled persons and electrically instructed persons with the
proper authorization
EXAMPLE Utility-scale PV installations which are protected against public access by fences, location, etc., and
where only persons skilled, trained or instructed in electrical safety have access.
[SOURCE: IEC 60050-195:1998, 195-04-04, modified – The example has been added]
4 Test samples
This clause of IEC 61215-1:2021 is applicable without modifications.
5 Marking and documentation
This clause of IEC 61215-1:2021 is applicable without with the following modifications.
5.1 Name plate
Each module shall include the following clear and indelible markings:
Add the following new items:
l) For modules with reduced mechanical load: the range of positive and negative design
loads [Pa] the module manufacturer’s recommended mounting configurations will allow,
preceded by the phrase, "reduced mechanical design load" and followed by the phrases
"Not for roof mount. For ground mounted installations with restricted access only. May
only be used in systems designed by a licensed professional engineer."
EXAMPLE:
Reduced mechanical design load: ± 800 Pa.
Not for roof mount. For ground mounted installations with restricted access only. May only be used in systems
designed by a licensed professional engineer.
m) For modules with reduced mechanical load: Type or model number designation shall
contain a unique identification that it is used for reduced mechanical load.
EXAMPLE:
Regular mechanical load module type designation: M300W.
Reduced mechanical load module type designation: M300W-X.
Where -X can be e.g. a combination of letters or numbers.
5.2 Documentation
5.2.2 Information to be given in the documentation
Add the following new item:
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© IEC 2022
r) For modules with reduced mechanical load, the documentation shall contain the following:
"When PV modules are intended to be installed in an engineered scenario by qualified
personnel such as in a ground mounted utility scale application with restricted access,
they may be designed for lower loads. The test load may be lower than 2 400 Pa but
greater than 1 200 Pa (or any load in between) with a safety factor of 1,5; corresponding
to design loads of 1 600 Pa and 800 Pa (or any load in between), respectively, for the
down (positive) pressures and uplift (negative) pressures. These modules may be used in
array locations where the module mounting and structure in combination are designed to
meet a specific design load by the installer. Alternatively, modules having a higher
minimum test load compatible to the required site-specific loads may be used. The
reduced load modules cannot be used on a rooftop."
NOTE Many large PV installations of today are designed, engineered, and installed by qualified experts in the
electrical, mechanical and structural fields per the prevailing local codes. Designers utilize allowances in building
codes to target certain locations in the array to handle higher loading than other areas. The manufacturer mounting
configurations, stated design loads and test safety factors are utilized in the overall system design approach.
6 Testing
This clause of IEC 61215-1:2021 is applicable with the following modifications:
Special care has to be taken for stabilizing the power output of the module using MQT 19
procedure with specific requirements stated in 11.19 below.
7 Pass criteria
This clause of IEC 61215-1:2021 is applicable with the following modifications.
The maximum allowable value of reproducibility is set to r = 2,0 %.
The maximum allowable value of measurement uncertainty is set to m = 4,0 % for modules
containing single-junction cells, and m = 5,0 % for modules containing multi-junction cells.
8 Major visual defects
This clause of IEC 61215-1:2021 is applicable without modifications.
9 Report
This clause of IEC 61215-1:2021 is applicable without modifications.
10 Modifications
This clause of IEC 61215-1:2021 is applicable without modifications.
11 Test flow and procedures
The test flow from IEC 61215-1:2021 is applicable with the following modifications.

© IEC 2022
Table 3 – Summary of test levels
Replace:
Test Section in Title Test conditions
IEC 61215-2
Ed.2
MQT 16 4.16 Static mechanical load Three cycles of uniform load specified by the
test manufacturer, applied for 1 h to front and back surfaces in
turn. Minimum test load: 2 400 Pa

by:
Test Subclause in Title Test conditions
IEC 61215-2
Ed.2
MQT 16 4.16 Static mechanical load Three cycles of uniform load specified by the
test manufacturer, applied for 1 h to front and back surfaces in
turn. Minimum test load: ≥ 1 200 Pa as defined by the
manufacturer (for modules with "reduced design load"
marking); 2 400 Pa (for modules without additional
marking)
11.1 Visual inspection (MQT 01)
This test of IEC 61215-2:2021 is applicable without modifications.
11.2 Maximum power determination (MQT 02)
This test of IEC 61215-2:2021 is applicable without modifications.
11.3 Insulation test (MQT 03)
This test of IEC 61215-2:2021 is applicable without modifications.
11.4 Measurement of temperature coefficients (MQT 04)
This test of IEC 61215-2:2021 is applicable without modifications.
11.5 Placeholder section, formerly NMOT
This subclause of IEC 61215-2:2021 does not require technology-specific modifications.
11.6 Performance at STC (MQT 06.1)
This test of IEC 61215-2:2021 is applicable without modifications.
11.7 Performance at low irradiance (MQT 07)
This test of IEC 61215-2:2021 is applicable without modifications.
11.8 Outdoor exposure test (MQT 08)
This test of IEC 61215-2:2021 is applicable without modifications.
11.9 Hot-spot endurance test (MQT 09)
This test of IEC 61215-2:2021 is applicable with the following modifications:

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© IEC 2022
Cu(In,Ga)(S,Se) thin-film modules may exhibit performance changes with extended time in
storage without light exposure (the “dark soak” effect). In order to minimize the influence of
this dark soak effect, limit the time delay between the outdoor exposure or stabilization and
the hot spot procedure to within 2 to 3 days. During the first hour after the hot-spot procedure
is complete, no additional heating or light beyond room ambient shall be applied. If the time
delay is to exceed 1 h, the modules are to be stored in the dark at ≤ 25 °C.
11.9.1 Purpose
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.2 Hot-spot effect
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.3 Classification of cell interconnection
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.4 Apparatus
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.5 Procedure
MQT 09.2 of IEC 61215-2:2021 shall be performed for any monolithically integrated (MLI)
module design.
If the module is constructed by interconnection of cell-like substructures, MQT 09.1 of
IEC 61215-2:2021 may be applicable.
11.9.6 Final measurements
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.9.7 Requirements
This subclause of IEC 61215-2:2021, test MQT 09, is applicable without modifications.
11.10 UV preconditioning test (MQT 10)
This test of IEC 61215-2:2021 is applicable without modifications.
11.11 Thermal cycling test (MQT 11)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 11 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 11 as defined in IEC 61215-2:2021, with the technology specific
current equal to 0,1 × STC peak power current. If 0,1 × STC peak power current is less than
100 mA, then 100 mA may be applied instead.
Method B) Perform MQT 11 as defined in IEC 61215-2:2021 with the following modifications:
During the thermal cycling test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until the module temperature is below

© IEC 2022
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT11 of
IEC 61215-2 shall be a forward bias current of 0,1 × STC peak power current to 0,3 × STC
peak power current. If 0,1 × STC peak power current is less than 100 mA, then 100 mA may
be applied instead.
The current flow applied during Method B is shown superimposed on the temperature cycle in
Figure 1.
Figure 1 – Current flow using MQT 11 Method B
11.12 Humidity-freeze test (MQT 12)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 12 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 12 as defined in IEC 61215-2:2021.
Method B) Perform MQT 12 as defined in IEC 61215-2:2021 with the following modifications:
During the humidity freeze test, set the continuous current flow during the heat up cycle to the
technology specified current noted below at temperature from 0 °C to 85 °C. Maintain current
flow during high temperature dwell and cool down cycle until module temperature has reached
0 °C. As necessary, adjust the chamber temperature to maintain module temperature below
85 °C.
The technology specific current which needs to be applied according to MQT12 of
IEC 61215-2 in Method B shall be a forward bias current of 0,1 × STC peak power current to
0,3 × STC peak power current, with a minimum of 100 mA.
The current flow applied during Method B is shown superimposed on the humidity-freeze
cycle in Figure 2.
– 12 – IEC 61215-1-4:2021+AMD1:2022 CSV
© IEC 2022
Figure 2 – Current flow using MQT 12 Method B
11.13 Damp heat test (MQT 13)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 13 of IEC 61215-2:2021 can be conducted according to the following methods:
Method A) Perform MQT 13 as defined in IEC 61215-2:2021.
Method B) Perform MQT 13 as defined in IEC 61215-2:2021 with applied forward bias:
11.13.1 Procedure
a) Attach a suitable temperature sensor (see apparatus requirements of MQT 11) to the front
or back surface of the module(s) near the middle. If more than one module of the same
type are tested simultaneously, it will suffice to monitor the temperature of one
representative sample.
b) Connect the temperature-monitoring equipment to the temperature sensor(s). Connect
each module individually to the appropriate voltage supply by connecting the positive
terminal of the module to the positive terminal of the power supply and the second
terminal accordingly. During the damp-heat set the applied voltage to V ± 5 % at STC
mpp
taken from the data-sheet and limit the current of the power supply to less than 25 % of I
sc
at STC.
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) Set chamber temperature to achieve a module temperature of 85 °C ± 2 °C.
e) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
© IEC 2022
11.14 Robustness of terminations (MQT 14)
This test of IEC 61215-2:2021 is applicable without modifications.
11.15 Wet leakage current test (MQT 15)
This test of IEC 61215-2:2021 is applicable without modifications.
11.16 Static mechanical load test (MQT 16)
This test of IEC 61215-2:2021 is applicable without with the following modifications to
Clause 4.
4 Test procedures
4.16 Static mechanical load test (MQT 16)
4.16.1 Purpose
Replace:
The minimum required design load per this standard is 1 600 Pa, resulting in a minimum test
load of 2 400 Pa.
by:
The minimum required design load per this document depends on the nameplate marking. For
modules without special notification on the nameplate, the minimum design load is 1 600 Pa,
resulting in a minimum test load of 2 400 Pa. For modules with the “reduced design load”
notification on the nameplate and in the documentation, the minimum design load is 800 Pa,
which results in a minimum test load of 1 200 Pa.
11.17 Hail test (MQT 17)
This test of IEC 61215-2:2021 is applicable without modifications.
11.18 Bypass diode testing (MQT 18)
This test of IEC 61215-2:2021 is applicable without modifications.
11.19 Stabilization (MQT 19)
This test of IEC 61215-2:2021 is applicable with the following modifications:
11.19.1 Criterion definition for stabilization
For the definition of stabilization as per MQT 19 of IEC 61215-2:2021, x = 0,02 shall be used.
Any kind of storage shall be done at temperature below 25 °C to avoid thermally activated
processes affecting MQT 06.1 of IEC 61215-2:2021 measurement.
11.19.2 Light induced stabilization procedures
This test of IEC 61215-2:2021 is applicable without modifications.
11.19.3 Other stabilization procedures
This test of IEC 61215-2:2021 is applicable without modifications.

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© IEC 2022
11.19.4 Initial stabilization (MQT 19.1)
Initial stabilization is performed on all modules.
To fulfil MQT 19 requirements using light exposure, a minimum of two intervals each of at
least 10 kWh/m are required. After this preconditioning all of the test modules shall be
measured for STC power (MQT 06.1 of IEC 61215-2:2021).
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method
following the validation procedure from MQT 19 of IEC 61215-2:2021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum
and maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.
Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-2:2021.
11.19.5 Final stabilization (MQT 19.2)
Final stabilization is performed on all modules after the test sequences to prove fulfilment of
Gate No. 2 requirement of IEC 61215-1:2021.
To fulfil MQT 19 requirements a minimum of two intervals of at least 10 kWh/m each are
required.
If stabilization is performed outdoors in general no module temperature limits apply. The
outdoor stabilization shall be proven at least with one module using the indoor method
following MQT 19 of IEC 61215-2:2021.
The minimum and maximum module temperatures observed during outdoor light exposure
stabilization verification while the irradiance level is above 500 W/m shall be the minimum
and maximum allowable module temperatures for all modules. If the module temperature falls
outside of these limits the new module temperature range has to be re-verified.
For modules that have been subjected to potential induced degradation (PID) stress (MQT 21),
the maximum exposure limit after reaching stabilization shall not be exceeded. The light soak
shall terminate no more than 20 kWh/m after the stabilization criterion is met.
Output power determination shall be performed after a minimum cooling time of 30 min and
maximum 60 min.
A validated alternative procedure can be used in accordance to MQT 19 of IEC 61215-2:2021.
11.20 Cyclic (dynamic) mechanical load test (MQT 20)
This test of IEC 61215-2:2021 is applicable without modifications.
11.21 Potential induced degradation test (MQT 21)
This test of IEC 61215-2:2021 is applicable with the following modifications:
MQT 21 of IEC 61215-2:2021 can be conducted according to either Method A or Method B
below.
© IEC 2022
Method A) Perform MQT 21 as defined in IEC 61215-2:2021.
Method B) Perform MQT 21 as defined in IEC 61215-2:2021 with applied forward bias by
adding the following steps to 4.21.4 “Procedure” in 61215-2:2021:
a) Prior to the test, connect each module individually to the appropriate voltage supply.
Proper lead connection is illustrated in Figure 3 and Figure 4.
In the positive system voltage configuration, the power supply for application of forward
bias current is isolated by an isolation transformer and one DC terminal of the forward
biasing power supply is connected to the system voltage terminal of the power supply for
application of the system voltage bias (see Figure 3).
In the negative system voltage configuration, system voltage is applied to the normally
grounded module frame, grounding, or mounting points and the power source for forward
bias application has one DC terminal tied to ground (see Figure 4). The grounding points
for the module shall be electrically isolated from the environmental chamber to prevent
overloading of the power supply applying system voltage. A safety interlock that turns off
the power supplies for the application of system voltage bias to the module frames is a
requirement for safety for this configuration.
b) During the test set the applied voltage to V ± 5 % at STC taken from the data-sheet
mpp
and limit the current of the power supply to less than 25 % of I at STC.
sc
c) Throughout the test monitor the module’s applied voltage and current. Report I-V trend. If
current limit is reached, applied voltage can drop below V ± 5 % at STC.
mpp
d) During cooling phase to ambient temperature (25 °C or less), the specified applied voltage
shall be maintained and shall be switched off when the module temperature reaches
25 °C ± 5 °C.
Schematic shows isolated power supply for application of forward bias (V ) and system voltage (V ) applied to
fwd sys
the active cell circuit.
Figure 3 – Electrical connections for MQT 21 Method B, positive system voltage

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© IEC 2022
Schematic for application of system voltage (V ) bias on test module on normally grounded parts. The system
sys
voltage applied to the active cell circuit is negative as shown and forward bias current is applied through the cell
circuit.
Figure 4 – Electrical connections for MQT 21 Method B, negative system voltage
11.22 Bending test (MQT 22)
This test of IEC 61215-2:2021 is applicable to flexible modules without modifications.

___________
– 18 – IEC 61215-1-4:2021+AMD1:2022 CSV
© IEC 2022
SOMMAIRE
AVANT-PROPOS . 20
1 Domaine d'application . 22
2 Références normatives . 23
3 Termes et définitions . 23
4 Échantillons d'essai . 23
5 Marquage et documentation . 23
5.1 Plaque signalétique . 23
5.2  Documentation . 24
6 Essais . 24
7 Critères d'acceptation . 24
8 Défauts visuels majeurs . 25
9 Rapport . 25
10 Modifications . 25
11 Série et procédures d'essais . 25
11.1 Examen visuel (MQT 01) . 25
11.2 Détermination de la puissance maximale (MQT 02). 25
11.3 Essai diélectrique (MQT 03) . 25
11.4 Mesurage des coefficients de température (MQT 04) . 25
11.5 Section de l'espace réservé, précédemment NMOT .
...