IEC TS 61169-1-51:2020

Radio frequency connectors - Part 1-51: Technical specification of electrical tests - Uncertainty specification of frequency domain test for return loss

IEC TS 61169-1-51:2020 relates to radio frequency connectors for RF transmission lines for use in telecommunications, electronics and similar equipment. It provides the technical report for the uncertainty specifications for return loss measurements, which apply to individual connector types, by vector network analysers (VNAs). It is intended to establish concepts and procedures considering:
– testing and measuring procedures concerning frequency domain electrical properties;
– uncertainty specifications of VNAs measurements for return loss of RF connectors.
The test methods and procedures of this document are intended for acceptance and type approval testing.

General Information

• Status: Published
• Publication Date: 19-Oct-2020
• ICS: 33.120.30 - RF connectors
• Technical Committee: SC 46F - RF and microwave passive components
• Drafting Committee: WG 1 - TC 46/SC 46F/WG 1
• Current Stage: PPUB - Publication issued
• Start Date: 20-Oct-2020
• Completion Date: 12-Nov-2020

Overview - IEC TS 61169-1-51:2020 (Return Loss Uncertainty)

IEC TS 61169-1-51:2020 is a Technical Specification from the IEC that focuses on uncertainty specifications for frequency-domain return loss tests of radio frequency (RF) connectors. Intended for acceptance and type-approval testing, the document addresses measurement concepts, procedures and quantitative uncertainty guidance for return loss measurements performed with vector network analysers (VNAs). It complements the generic RF connector test methods in IEC 61169-1 by providing a structured approach to express and evaluate VNA measurement uncertainty for connector return loss.

Key Topics and Requirements

• Scope and purpose: Uncertainty specification for return loss of RF connectors used in telecommunications and electronics, applied to individual connector types and styles.
• Measurement representations: Clarifies common return-loss related metrics: reflection coefficient (Γ), return loss (–20 log |Γ|), and VSWR.
• VNA measurement model: Defines the VNA residual error terms used in uncertainty analysis - δ (directivity), μ (source match) and τ (reflection tracking) - and shows how these affect measured Γ.
• Calibration uncertainty: Emphasises that VNA uncertainty depends on the calibration method and standards used; recommends estimating residual error terms from calibration certificates or manufacturer data.
• Terminating load specification: Stresses the importance of using matched loads (calibrated terminations) and accounting for their contribution to total uncertainty.
• Total test uncertainty: Requires that the combined measurement uncertainty of the VNA and test setup be smaller than the connector’s specified measurement or design values for meaningful classification.
• Report characteristics: Recommends reporting return loss as a function of frequency together with measurement conditions and uncertainty limits.
• Annex A: Provides informative guidance for estimating VNA uncertainty from commercial device data and calibration certificates.

Practical Applications and Who Uses This Standard

• Test and calibration laboratories performing acceptance and type-approval testing of RF connectors.
• Connector manufacturers specifying product performance and validating design margins for return loss.
• Telecommunications and RF systems engineers assessing connector compatibility and link-budget impacts.
• Certification bodies and compliance assessors requiring traceable uncertainty statements in test reports.
• Use cases include laboratory test procedures, quality control for connector production, and formal type-approval documentation where quantified measurement uncertainty is required.

Related Standards

• IEC 61169-1:2013 - Generic specification and measuring methods for RF connectors
• ISO/IEC 17025:2017 - Competence of testing and calibration laboratories
• ISO/IEC Guide 98-1 - Introduction to the expression of measurement uncertainty
• IEC 60027, IEC 60050, IEC 60617 - Units, vocabulary and graphical symbols (referenced for notation and reporting)

Keywords: IEC TS 61169-1-51:2020, radio frequency connectors, return loss, VNA measurement uncertainty, vector network analyser, RF connectors testing, calibration uncertainty, acceptance testing.

Standards Content (Sample)

IEC TS 61169-1-51 ®
Edition 1.0 2020-10
TECHNICAL
SPECIFICATION
colour
inside
Radio frequency connectors –
Part 1-51: Technical specification of electrical tests – Uncertainty specification
of frequency domain test for return loss

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IEC TS 61169-1-51 ®
Edition 1.0 2020-10
TECHNICAL
SPECIFICATION
colour
inside
Radio frequency connectors –
Part 1-51: Technical specification of electrical tests – Uncertainty specification

of frequency domain test for return loss

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.120.30 ISBN 978-2-8322-8928-0

– 2 – IEC TS 61169-1-51:2020 © IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 7
4 Units, symbols and dimensions . 7
4.1 Units and symbols. 7
5 Report characteristics . 7
6 Return loss in frequency domain tests . 7
6.1 Parameters . 7
6.2 General considerations . 7
6.3 Test equipment . 8
6.3.1 General requirement . 8
6.3.2 VNA calibration uncertainty. 8
6.3.3 Terminating load specification . 9
6.3.4 Other test conditions . 10
6.3.5 Total test uncertainty . 10
Annex A (informative) Estimation of VNA uncertainty specifications from commercial
standard devices . 11
A.1 Estimation from calibration certificate . 11
A.2 Estimation from data/specification sheet . 11
Bibliography . 13

Figure 1 – Graphical symbols . 8
Figure 2 – Graphical principle . 8
Figure 3 – VNA measurement model . 8

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
RADIO FREQUENCY CONNECTORS –
Part 1-51: Technical specification of electrical tests –
Uncertainty specification of frequency domain test for return loss

FOREWORD
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Technical Specifications are subject to review within three years of publication to decide
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IEC TS 61169-1-51, which is a Technical Specification, has been prepared by subcommittee
46F: RF and microwave passive components, of IEC technical committee 46: Cables, wires,
waveguides, RF connectors, RF and microwave passive components and accessories.

– 4 – IEC TS 61169-1-51:2020 © IEC 2020
The text of this Technical Specification is based on the following documents:
Draft TS Report on voting
46F/488/DTS 46F/495/RVDTS
Full information on the voting for the approval of this Technical Specification can be found in
the report on voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 61169 series, published under the general title Radio frequency
connectors, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
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INTRODUCTION
This document relates to technical requirements for electrical tests for radio frequency
connectors. In IEC 61169-1:2013, a frequency domain test method ha
...