IEC 62026-3:2014
(Main)Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 3: DeviceNet
Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 3: DeviceNet
IEC 62026-3:2014 specifies an interface system between single or multiple controllers, and control circuit devices or switching elements. The interface system uses two conductor pairs within one cable - one of these pairs provides a differential communication medium and the other pair provides power to the devices. This part establishes requirements for the interoperability of components with such interfaces. This third edition of IEC 62026-3 cancels and replaces the second edition published in 2008. This third edition constitutes a technical revision. The main changes with respect to the previous edition are the followings:
- specification of group 4 messages (5.1.2);
- clarifications on messaging protocol (5.2);
- addition of I/O multicast poll messages (5.5.2 and 5.5.8);
- clarifications on slave behaviour (5.5.4 and 5.5.9);
- clarifications on physical layer (transceiver) in 5.7;
- miscellaneous corrections/clarifications on cable (8.2);
- clarifications on EMC testing (9.2.10) and logical testing (9.3). The contents of the corrigendum of March 2015 and corrigendum of October 2019 have been included in this copy.
Appareillage à basse tension - Interface appareil de commande-appareil (CDI) - Partie 3: DeviceNet
L'IEC 62026-3:2014 spécifie un système d'interfaces entre un ou plusieurs appareils de commande d'une part, et des appareils ou éléments de commutation pour circuits de commande, d'autre part. Le système d'interfaces utilise deux paires conductrices, réunies dans un câble - l'une des paires fournit un support de communication différentiel et l'autre alimente les appareils. Cette partie définit des exigences permettant l'interopérabilité des composants incluant de telles interfaces. Cette troisième édition de l'IEC 62026-3 annule et remplace la deuxième édition parue en 2008. Cette troisième édition constitue une révision technique. Les principales modifications effectuées par rapport à l'édition antérieure sont les suivantes:
- spécification des messages du groupe 4 (5.1.2);
- clarification du protocole de messagerie (5.2);
- ajout de messages d'E/S interrogation multidestinataire (5.5.2 et 5.5.8);
- clarifications du comportement esclave (5.5.4 et 5.5.9);
- clarifications de la couche physique (transcepteur) en 5.7;
- corrections/clarifications diverses relatives au câble (8.2);
- clarification des essais de compatibilité électromagnétique (CEM) en 9.2.10 et des essais logiques (9.3). Le contenu du corrigendum de mars 2015 et d'octobre 2019 a été pris en considération dans cet exemplaire.
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IEC 62026-3 ®
Edition 3.0 2014-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Low-voltage switchgear and controlgear – Controller-device interfaces (CDIs) –
Part 3: DeviceNet
Appareillage à basse tension – Interfaces appareil de commande-appareil (CDI) –
Partie 3: DeviceNet
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IEC 62026-3 ®
Edition 3.0 2014-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Low-voltage switchgear and controlgear – Controller-device interfaces (CDIs) –
Part 3: DeviceNet
Appareillage à basse tension – Interfaces appareil de commande-appareil (CDI) –
Partie 3: DeviceNet
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XF
CODE PRIX
ICS 29.130.20 ISBN 978-2-8322-1792-4
– 2 – IEC 62026-3:2014 IEC 2014
CONTENTS
FOREWORD . 8
INTRODUCTION . 10
1 Scope . 11
2 Normative references. 11
3 Terms, definitions, symbols and abbreviated terms . 12
3.1 Terms and definitions . 12
3.2 Symbols and abbreviated terms . 18
4 Classification . 18
4.1 General . 18
4.2 DeviceNet communication model . 19
4.3 DeviceNet, CAN and CIP™ . 20
5 Characteristics . 21
5.1 DeviceNet connections . 21
5.1.1 General . 21
5.1.2 DeviceNet’s use of the CAN identifier field . 21
5.1.3 Connection establishment . 22
5.2 DeviceNet messaging protocol . 23
5.2.1 Explicit messaging . 23
5.2.2 Input/output messaging . 34
5.2.3 Fragmentation/reassembly . 35
5.2.4 Offline connection set . 39
5.2.5 Device heartbeat . 49
5.2.6 Device shutdown message . 50
5.2.7 Duplicate MAC ID detection protocol . 52
5.2.8 Quick connect . 53
5.3 DeviceNet communication object classes . 53
5.3.1 General . 53
5.3.2 Identity object class definition (class ID code: 0x01) . 53
5.3.3 Message router object class definition (class ID code: 0x02) . 54
5.3.4 DeviceNet object class definition (class ID code: 0x03) . 54
5.3.5 Connection object class definition (class ID code: 0x05) . 54
5.3.6 Acknowledge handler object class definition (class ID code: 0x2B) . 55
5.4 Link access state machine . 55
5.4.1 General . 55
5.4.2 State transition diagram and event matrix . 55
5.4.3 Duplicate MAC ID detection . 58
5.5 Predefined master/slave connection set . 58
5.5.1 General . 58
5.5.2 Predefined master/slave connection set messages . 59
5.5.3 DeviceNet object class specific services for the master/slave connection
set . 61
5.5.4 Slave connection object characteristics . 68
5.5.5 Master connection object characteristics . 73
5.5.6 Bit-strobe command/response messages . 73
5.5.7 Poll command/response messages . 74
5.5.8 Multicast poll command/response messages . 75
5.5.9 Change of state/cyclic connections . 75
5.5.10 Group 2 only devices . 77
5.6 CIP Safety™ on DeviceNet . 78
5.6.1 General . 78
5.6.2 Use of CAN identifiers for CIP Safety on DeviceNet . 78
5.7 Physical layer . 78
5.7.1 General . 78
5.7.2 Transceiver . 80
5.7.3 Grounding . 81
5.7.4 Isolation . 81
5.7.5 Transmission medium . 83
5.7.6 Topology . 83
5.7.7 Link power . 84
6 Product information . 85
7 Normal service, mounting and transport conditions . 85
7.1 Normal service conditions . 85
7.1.1 General . 85
7.1.2 Ambient air temperature . 85
7.1.3 Altitude . 86
7.1.4 Climatic conditions . 86
7.2 Conditions during transport and storage . 86
7.3 Mounting . 86
8 Constructional and performance requirements . 86
8.1 Indicators and configuration switches . 86
8.2 DeviceNet cable . 87
8.2.1 Overview . 87
8.2.2 Cable profile template . 87
8.2.3 Thick cable profile . 88
8.2.4 Thin cable profile . 92
8.2.5 Flat cable profile . 95
8.3 Terminating resistors . 98
8.4 Connectors . 98
8.4.1 General specifications . 98
8.4.2 Connector profile template . 98
8.4.3 Open connector profile . 99
8.4.4 Sealed mini connector profile . 102
8.4.5 Sealed micro connector profile . 103
8.4.6 Flat trunk connector profile . 104
8.5 Device taps and power taps . 107
8.5.1 Device taps . 107
8.5.2 Power taps. 108
8.6 Link powered devices . 109
8.7 Miswiring protection . 109
8.8 Power supplies . 109
8.9 Electromagnetic compatibility (EMC) . 110
8.9.1 General . 110
8.9.2 Immunity . 110
8.9.3 Emissions . 111
8.10 Additional functional safety requirements related to EMC . 112
9 Tests . 112
– 4 – IEC 62026-3:2014 IEC 2014
9.1 General . 112
9.2 Electrical and EMC testing . 112
9.2.1 Test of the DeviceNet power supply . 112
9.2.2 Device peak current consumption . 113
9.2.3 Power ON behaviour . 113
9.2.4 Reverse connection of V+ and V− . 114
9.2.5 Disconnection of V− . 115
9.2.6 Differential input impedance test . 115
9.2.7 Transmit levels . 115
9.2.8 Acknowledge delay . 116
9.2.9 CDI tests . 117
9.2.10 Electromagnetic compatibility testing . 118
9.3 Logical testing . 120
9.3.1 General . 120
9.3.2 Duplicate MAC ID check test . 120
9.3.3 UCMM . 121
9.3.4 Allocation of predefined master/slave connection set – Explicit
messaging connection . 122
9.3.5 Allocation of predefined master/slave connection set – I/O messaging
connection . 122
9.3.6 Logical testing of safety products . 123
Bibliography . 124
Figure 1 – Typical DeviceNet controller-device interfaces . 19
Figure 2 – DeviceNet protocol architecture compared with the OSI reference model . 20
Figure 3 – DeviceNet’s use of the CAN identifier field . 21
Figure 4 – Explicit message CAN data field use . 23
Figure 5 – Explicit message data field format. 23
Figure 6 – Explicit message header format . 24
Figure 7 – Service field format . 24
Figure 8 – Open explicit messaging connection request format . 26
Figure 9 – Open explicit messaging connection response format . 28
Figure 10 – Close connection request format . 30
Figure 11 – Close connection response format . 30
Figure 12 – Non-fragmented explicit request message format, values 0 – 3 . 32
Figure 13 – Non-fragmented explicit request message format, value 4 . 33
Figure 14 – Non-fragmented success response message format . 33
Figure 15 – Error response message . 34
Figure 16 – Data field of an I/O message . 34
Figure 17 – Format of DeviceNet fragmentation protocol . 35
Figure 18 – I/O message fragment format . 36
Figure 19 – Explicit message fragment format . 36
Figure 20 – Acknowledgement message format . 38
Figure 21 – Establishing the offline ownership . 40
Figure 22 – Multicast nature of the offline ownership . 41
Figure 23 – Offline ownership request message. 42
Figure 24 – Offline ownership response message protocol . 42
Figure 25 – Communication faulted request message – Multicast protocol. 43
Figure 26 – Communication faulted request message – Point-to-point protocol . 44
Figure 27 – Identify communication faulted request message – Multicast protocol . 45
Figure 28 – Communication faulted identify response message . 46
Figure 29 – Identify communication faulted request message – Point-to-point protocol . 46
Figure 30 – Who communication faulted request message . 47
Figure 31 – Who response message . 48
Figure 32 – Change MAC ID communication faulted request message . 48
Figure 33 – Device heartbeat message. 49
Figure 34 – Device shutdown message . 51
Figure 35 – Duplicate MAC ID check CAN identifier field . 52
Figure 36 – Duplicate MAC ID check message data field format . 52
Figure 37 – Link access state transition diagram . 56
Figure 38 – Allocation choice byte contents . 61
Figure 39 – Allocate_master/slave_connection_set request message . 62
Figure 40 – Success response to allocate_master/slave_connection_set request . 63
Figure 41 – Parent explicit messaging connection logic . 65
Figure 42 – Release choice byte contents . 66
Figure 43 – Release_master/slave_connection set request message . 66
Figure 44 – Success response to release_master/slave_connection_set request . 67
Figure 45 – Predefined master/slave I/O connection state transition diagram . 69
Figure 46 – Predefined master/slave explicit messaging connection state transition
diagram . 71
Figure 47 – Physical layer block diagram . 79
Figure 48 – Device containing a non-isolated physical layer . 82
Figure 49 – Device containing an isolated physical layer . 83
Figure 50 – DeviceNet medium topology . 84
Figure 51 – Thick cable: physical configuration . 91
Figure 52 – Thick cable: current available on the DeviceNet power bus . 91
Figure 53 – Thin cable: physical configuration . 94
Figure 54 – Thin cable: current available on the DeviceNet power bus . 94
Figure 55 – Flat cable: physical configuration . 97
Figure 56 – Flat cable: current available on the DeviceNet power bus . 97
Figure 57 – Open connector pinout . 101
Figure 58 – Open connector geometry . 101
Figure 59 – Mini connector pinout . 103
Figure 60 – Micro connector pinout . 104
Figure 61 – Flat trunk connector layout – Part 1 . 106
Figure 62 – Flat trunk connector layout – Part 2 . 107
Figure 63 – Power supply rise time test circuit . 112
Figure 64 – Current consumption test circuit . 113
Figure 65 – Power ON test circuit . 114
– 6 – IEC 62026-3:2014 IEC 2014
Figure 66 – Test circuit for reversal of V+ and V− and also V− interruption . 114
Figure 67 – Differential impedance test circuit . 115
Figure 68 – Transmit level test setup . 116
Figure 69 – Transmit levels . 116
Figure 70 – Timing test setup . 117
Figure 71 – Timing . 117
Figure 72 – CDI test configuration . 118
Figure 73 – Test circuit for logical tests . 120
Table 1 – Message body format values . 27
Table 2 – Group select values . 27
Table 3 – Source message ID in open explicit messaging connection request . 28
Table 4 – Destination message ID in open explicit messaging connection response . 29
Table 5 – UCMM error conditions/codes . 31
Table 6 – Fragment type bit values . 35
Table 7 – Ack status bit values . 38
Table 8 – Offline connection set . 40
Table 9 – Addresses reporting based upon mask . 44
Table 10 – Device shutdown message shutdown code ranges . 51
Table 11 – Device shutdown message “Open” shutdown codes . 52
Table 12 – Link access state event matrix (1 of 2) . 56
Table 13 – Predefined master/slave connection set identifier fields . 60
Table 14 – Allocate_master/slave_connection_set request service data field
parameters . 61
Table 15 – Allocate_master/slave_connection set response parameters . 62
Table 16 – Release_master/slave_connection_set request service data field
parameters . 66
Table 17 – DeviceNet object specific additional error codes . 68
Table 18 – Connection instance IDs for predefined master/slave connections . 69
Table 19 – Predefined master/slave I/O connection state event matrix (1 of 2) . 70
Table 20 – Predefined master/slave explicit messaging connection state event matrix . 72
Table 21 – Predefined master/slave I/O connection object attribute access . 73
Table 22 – General physical layer characteristics . 79
Table 23 – Transmitter characteristics . 80
Table 24 – Receiver characteristics . 81
Table 25 – Load limits . 85
Table 26 – Cable profile: data pair specifications . 87
Table 27 – Cable profile: DC power pair specifications . 87
Table 28 – Cable profile: general specifications . 88
Table 29 – Cable profile: topology . 88
Table 30 – Thick cable: data pair specifications . 89
Table 31 – Thick cable: DC power pair specifications . 89
Table 32 – Thick cable: general specifications . 90
Table 33 – Thick cable: topology . 90
Table 34 – Thick cable: maximum current available (A) based on network length . 91
Table 35 – Thin cable: data pair specifications . 92
Table 36 – Thin cable: DC power pair specifications . 93
Table 37 – Thin cable: general specifications . 93
Table 38 – Thin cable: topology . 93
Table 39 – Thin cable: maximum current available (A) based on network length . 94
Table 40 – Flat cable: data pair specifications . 95
Table 41 – Flat cable: DC power pair specifications . 96
Table 42 – Flat cable: general specifications . 96
Table 43 – Flat cable: topology . 96
Table 44 – Flat cable: maximum current available (A) based on network length . 97
Table 45 – Connector profile template . 99
Table 46 – Open connector . 100
Table 47 – Sealed mini connector . 102
Table 48 – Sealed micro connector (1 of 2) . 103
Table 49 – Flat trunk connector . 105
Table 50 – Internal pass-through conductor specifications . 108
Table 51 – Internal drop conductor specifications . 108
Table 52 – Internal pass-through conductor specifications . 108
Table 53 – Internal power drop conductor specifications . 109
Table 54 – Voltage regulator specifications . 109
Table 55 – DeviceNet power supply specifications . 110
Table 56 – Immunity performance criteria . 111
– 8 – IEC 62026-3:2014 IEC 2014
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
LOW-VOLTAGE SWITCHGEAR AND CONTROLGEAR –
CONTROLLER-DEVICE INTERFACES (CDIs) –
Part 3: DeviceNet
FOREWORD
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6) All users should ensure that they have the latest edition of this publication.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62026-3 has been prepared by subcommittee 121A: Low-voltage
switchgear and controlgear, of IEC technical committee 121: Switchgear and controlgear and
their assemblies for low voltage.
This third edition of IEC 62026-3 cancels and replaces the second edition published in 2008.
This third edition constitutes a technical revision.
The main changes with respect to the previous edition are the followings:
– specification of group 4 messages (5.1.2);
– clarifications on messaging protocol (5.2);
– addition of I/O multicast poll messages (5.5.2 and 5.5.8);
– clarifications on slave behaviour (5.5.4 and 5.5.9);
– clarifications on physical layer (transceiver) in 5.7;
– miscellaneous corrections/clarifications on cable (8.2);
– clarifications on EMC testing (9.2.10) and logical testing (9.3).
The text of this standard is based on the following documents:
FDIS Report on voting
17B/1814/FDIS 121A/18/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 62026, under the general title Low-voltage switchgear and
controlgear – Controller-device interfaces (CDIs), can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
The contents of the corrigenda of March 2015 and October 2019 have been included in this copy.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
– 10 – IEC 62026-3:2014 IEC 2014
INTRODUCTION
DeviceNet™ is intended for use in, but is not limited to, industrial automation applications.
These applications may include devices such as limit switches, proximity sensors, electro-
pneumatic valves, relays, motor starters, operator interface panels, analogue inputs, analogue
outputs and controllers.
_____________
DeviceNet™ is a trade name of ODVA, Inc. This information is given for the convenience of users of this
International Standard and does not constitute an endorsement by IEC of the trademark holder or any of its
products. Compliance to this standard does not require use of the trade name DeviceNet™. Use of the trade
name DeviceNet™ requires permission of ODVA, Inc.
LOW-VOLTAGE SWITCHGEAR AND CONTROLGEAR –
CONTROLLER-DEVICE INTERFACES (CDIs) –
Part 3: DeviceNet
1 Scope
This part of IEC 62026 specifies an interface system between single or multiple controllers,
and control circuit devices or switching elements. The interface system uses two conductor
pairs within one cable – one of these pairs provides a differential communication medium and
the other pair provides power to the devices. This part establishes requirements for the
interoperability of components with such interfaces.
This part of IEC 62026 specifies the following particular requirements for DeviceNet:
− requirements for interfaces between controllers and switching elements;
− normal service conditions for devices;
− constructional and performance requirements;
− tests to verify conformance to requirements.
These particular requirements apply in addition to the general requirements of IEC 62026-1.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60529:1989, Degrees of protection provided by enclosures (IP Code)
IEC 60529:1989/AMD 1:1999
IEC 60529:1989/AMD 2:2013
IEC 60947-5-2:2007, Low-voltage switchgear and controlgear – Part 5-2: Control circuit
devices and switching elements – Proximity switches
IEC 60947-5-2:2007/AMD 1:2012
IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
IEC 61000-4-3:2006/AMD 1:2007
IEC 61000-4-3:2006/AMD 2:2010
IEC 61000-4-4:2012, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
measurement techniques – Electrical fast transient/burst immunity test
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
...
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