Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy

IEC TS 62607-6-6:2021(E) establishes a standardized method to determine the structural key control characteristic
• strain uniformity
for single-layer graphene by
• Raman spectroscopy.
The width of the 2D-peak in the Raman spectrum is analysed to calculate the strain uniformity parameter which is a figure of merit to quantify the influence of nano-scale strain variations on the electronic properties of the layer. The classification will help manufacturers to classify their material quality to provide an upper limit of the electronic performance of the characterized graphene, to decide whether or not the graphene material quality is potentially suitable for various applications.

General Information

Status
Published
Publication Date
13-Oct-2021
Current Stage
PPUB - Publication issued
Start Date
03-Nov-2021
Completion Date
14-Oct-2021
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IEC TS 62607-6-6:2021 - Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Strain uniformity: Raman spectroscopy
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IEC TS 62607-6-6
®

Edition 1.0 2021-10
TECHNICAL
SPECIFICATION

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Nanomanufacturing – Key control characteristics –
Part 6-6: Graphene – Strain uniformity: Raman spectroscopy
IEC TS 62607-6-6:2021-10(en)

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IEC TS 62607-6-6

®


Edition 1.0 2021-10




TECHNICAL



SPECIFICATION








colour

inside










Nanomanufacturing – Key control characteristics –

Part 6-6: Graphene – Strain uniformity: Raman spectroscopy


























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ICS 07.120 ISBN 978-2-8322-1033-5




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– 2 – IEC TS 62607-6-6:2021 © IEC 2021
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
3.1 General terms . 8
3.2 Key control characteristics . 8
3.3 Measurement related terms . 9
4 General introduction . 9
4.1 Measurement principle . 9
4.2 Sample preparation method . 10
4.3 Test equipment . 11
4.4 Calibration standards .
...

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