Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection

IEC 61000-3-3:2013 is available as IEC 61000-3-3:2013 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61000-3-3:2013 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. It is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. IEC 61000-3-3 has the status of a product family standard within the IEC 61000 series. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision which takes account of the changes made in IEC 61000-4-15:2010.

Compatibilté électromagnétique (CEM) - Partie 3-3: Limites - Limitation des variations de tension, des fluctuations de tension et du papillotement dans les réseaux publics d'alimentation basse tension, pour les matériels ayant un courant assigné ≤16 A par phase et non soumis à un raccordement conditionnel

IEC 61000-3-3:2013 est disponible sous forme de IEC 61000-3-3:2013 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.
IEC 61000-3-3:2013 traite des limitations des fluctuations de tension et du papillotement (flicker) appliquées sur le réseau de distribution public basse tension. Elle spécifie les limites des variations de tension pouvant être produites par un équipement essayé dans des conditions spécifiées et formule des recommandations pour les méthodes d'évaluation. Elle s'applique aux matériels électriques et électroniques ayant un courant appelé inférieur ou égal à 16 A par phase et destinés à être raccordés à des réseaux publics de distribution basse tension présentant une tension nominale phase-neutre comprise entre 220 V et 250 V à 50 Hz et non soumis à un raccordement conditionnel. La CEI 61000-3-3 a le statut d'une norme de famille de produit au sein de la série CEI 61000. Cette troisième édition annule et remplace la seconde édition parue en 2008. Cette édition constitue une révision technique qui prend en compte les changements effectués dans la CEI 61000-4-15:2010.

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Published
Publication Date
13-May-2013
Current Stage
PPUB - Publication issued
Start Date
14-May-2013
Completion Date
14-May-2013
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IEC 61000-3-3:2013 - Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection
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IEC 61000-3-3
Edition 3.0 2013-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electromagnetic compatibility (EMC) –

Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and flicker

in public low-voltage supply systems, for equipment with rated current ≤ 16 A
per phase and not subject to conditional connection
Compatibilité électromagnétique (CEM) –
Partie 3-3: Limites – Limitation des variations de tension, des fluctuations de
tension et du papillotement dans les réseaux publics d'alimentation basse
tension, pour les matériels ayant un courant assigné ≤ 16 A par phase et non
soumis à un raccordement conditionnel
IEC 61000-3-3:2013
---------------------- Page: 1 ----------------------
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---------------------- Page: 2 ----------------------
IEC 61000-3-3
Edition 3.0 2013-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electromagnetic compatibility (EMC) –

Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and flicker

in public low-voltage supply systems, for equipment with rated current ≤ 16 A
per phase and not subject to conditional connection
Compatibilité électromagnétique (CEM) –
Partie 3-3: Limites – Limitation des variations de tension, des fluctuations de
tension et du papillotement dans les réseaux publics d'alimentation basse
tension, pour les matériels ayant un courant assigné ≤ 16 A par phase et non
soumis à un raccordement conditionnel
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX V
ICS 33.100.10 ISBN 978-2-83220-781-9

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 3 ----------------------
– 2 – 61000-3-3 © IEC:2013
CONTENTS

FOREWORD ........................................................................................................................... 4

INTRODUCTION ..................................................................................................................... 6

1 Scope ............................................................................................................................... 7

2 Normative references ....................................................................................................... 7

3 Terms and definitions ....................................................................................................... 8

4 Assessment of voltage changes, voltage fluctuations and flicker .................................... 10

4.1 Assessment of a relative voltage change, d(t) ........................................................ 10

4.2 Assessment of the short-term flicker value, P ..................................................... 10

4.2.1 General ..................................................................................................... 10

4.2.2 Flickermeter .............................................................................................. 11

4.2.3 Simulation method ..................................................................................... 11

4.2.4 Analytical method ...................................................................................... 11

4.2.5 Use of P = 1 curve .................................................................................. 12

4.3 Assessment of long-term flicker value, P ............................................................. 12

5 Limits ............................................................................................................................. 12

6 Test conditions ............................................................................................................... 13

6.1 General ................................................................................................................. 13

6.2 Measurement uncertainty ...................................................................................... 14

6.3 Test supply voltage ............................................................................................... 14

6.4 Reference impedance ............................................................................................ 14

6.5 Observation period ................................................................................................ 14

6.6 General test conditions .......................................................................................... 15

Annex A (normative) Application of limits and type test conditions for specific

equipment ............................................................................................................................. 19

Annex B (normative) Test conditions and procedures for measuring d voltage
max

changes caused by manual switching ................................................................................... 27

Annex C (informative) Determination of steady state voltage and voltage change

characteristics, as defined in IEC 61000-4-15:2010 .............................................................. 28

Annex D (informative) Input relative voltage fluctuation ∆V/V for P = 1,0 at output

[IEC/TR 61000-3-7:2008] ...................................................................................................... 33

Bibliography .......................................................................................................................... 34

Figure 1 – Reference network for single-phase and three-phase supplies derived from

a three-phase, four-wire supply ............................................................................................. 16

Figure 2 – Curve for P = 1 for rectangular equidistant voltage changes .............................. 17

Figure 3 – Shape factors F for double-step and ramp-voltage characteristics ........................ 17

Figure 4 – Shape factors F for rectangular and triangular voltage characteristics .................. 18

Figure 5 – Shape factor F for motor-start voltage characteristics having various front

times..................................................................................................................................... 18

Figure C.1 – Evaluation of U (t) .......................................................................................... 32

Table 1 – Assessment method .............................................................................................. 11

Table A.1 – Test conditions for hotplates .............................................................................. 19

Table A.2 – Electrode parameters ......................................................................................... 24

Table A.3 – Frequency factor R related to repetition rate "r" .................................................. 25

---------------------- Page: 4 ----------------------
61000-3-3 © IEC:2013 – 3 –
Table C.1 – Test specification for d – d – t (from Table 12 of
c max d(t) > 3,3 %

IEC 61000-4-15: 2010).......................................................................................................... 31

Table C.2 – Test specification for d – d – t (from Table 13 of
c max d(t) > 3,3 %

IEC 61000-4-15: 2010).......................................................................................................... 31

Table D.1 – Input relative voltage fluctuation ∆V/V for P = 1,0 at output ............................. 33

---------------------- Page: 5 ----------------------
– 4 – 61000-3-3 © IEC:2013
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and
flicker in public low-voltage supply systems, for equipment with rated
current ≤ 16 A per phase and not subject to conditional connection
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 61000-3-3 has been prepared by subcommittee 77A: EMC – Low

frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.

This standard forms part 3-3 of IEC 61000 series of standards. It has the status of a product

family standard.

This third edition cancels and replaces the second edition published in 2008. This edition

constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous

edition:
a) This edition takes account of the changes made in IEC 61000-4-15:2010.
---------------------- Page: 6 ----------------------
61000-3-3 © IEC:2013 – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
77A/809/FDIS 77A/816/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

A list of all parts in the IEC 61000 series, published under the general title Electromagnetic

compatibility (EMC), can be found on the IEC website.

The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
---------------------- Page: 7 ----------------------
– 6 – 61000-3-3 © IEC:2013
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits

Immunity limits (in so far as they do not fall under the responsibility of product

committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 9: Miscellaneous

Each part is further subdivided into sections which are to be published either as International

Standards or as Technical Reports.

These standards and reports will be published in chronological order and numbered

accordingly.
---------------------- Page: 8 ----------------------
61000-3-3 © IEC:2013 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and
flicker in public low-voltage supply systems, for equipment with rated
current ≤ 16 A per phase and not subject to conditional connection
1 Scope

This part of IEC 61000 is concerned with the limitation of voltage fluctuations and flicker

impressed on the public low-voltage system.

It specifies limits of voltage changes which may be produced by an equipment tested under

specified conditions and gives guidance on methods of assessment.

This part of IEC 61000 is applicable to electrical and electronic equipment having an input

current equal to or less than 16 A per phase, intended to be connected to public low-voltage

distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to

conditional connection.

Equipment which does not comply with the limits of this part of IEC 61000 when tested with

the reference impedance Z of 6.4, and which therefore cannot be declared compliant with

ref

this part, may be retested or evaluated to show conformity with IEC 61000-3-11. Part 3-11 is

applicable to equipment with rated input current ≤ 75 A per phase and subject to conditional

connection.

The tests according to this part are type tests. Particular test conditions are given in Annex A

and the test circuit is shown in Figure 1.

NOTE 1 The limits in this standard relate to the voltage changes experienced by consumers connected at the

interface between the public supply low-voltage network and the equipment user’s installation. Consequently, if the

actual impedance of the supply at the supply terminals of equipment connected within the equipment user’s

installation exceeds the test impedance, it is possible that supply disturbance exceeding the limits could occur.

NOTE 2 The limits in this standard are based mainly on the subjective severity of flicker imposed on the light from

230 V 60 W coiled-coil filament lamps by fluctuations of the supply voltage. For systems with nominal voltage less

than 220 V line to neutral and/or frequency of 60 Hz, the limits and reference circuit values are under

consideration.
2 Normative references

The following documents, in whole or in part, are normatively referenced in this document and

are indispensable for its application. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any
amendments) applies.

IEC/TR 60725, Consideration of reference impedances and public supply impedances for use

in determining disturbance characteristics of electrical equipment having a rated current

≤ 75 A per phase
IEC 60974-1, Arc welding equipment – Part 1: Welding power sources

IEC 61000-3-2, Electromagnetic compatibility (EMC) – Part 3-2: Limits – Limits for harmonic

current emissions (equipment input current ≤ 16 A per phase)
---------------------- Page: 9 ----------------------
– 8 – 61000-3-3 © IEC:2013

IEC 61000-3-11, Electromagnetic compatibility (EMC) – Part 3-11: Limits – Limitation of

voltage changes, voltage fluctuations and flicker in public low-voltage supply systems –

Equipment with rated current ≤ 75 A and subject to conditional connection

IEC 61000-4-15:2010, Electromagnetic compatibility (EMC) – Part 4-15: Testing and

measurement techniques – Flickermeter – Functional and design specifications
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1
flicker

impression of unsteadiness of visual sensation induced by a light stimulus whose luminance

or spectral distribution fluctuates with time
[SOURCE: IEC 60050-161:1990, 161-08-13]
3.2
voltage change characteristic
d(t)

time function of the relative r.m.s. voltage change evaluated as a single value for each

successive half period between zero-crossings of the source voltage, except during time

intervals in which the voltage is in a steady-state condition for at least 1 s

Note 1 to entry: For detailed information about the evaluation of a voltage change characteristic and the definition

of a steady state condition see Annex C and IEC 61000-4-15:2010.
3.3
maximum steady state voltage change during an observation period

Note 1 to entry: For detailed information about the calculation of d see Annex C and IEC 61000-4-15:2010.

3.4
max
maximum absolute voltage change during an observation period

Note 1 to entry: For detailed information about the calculation of d see Annex C and IEC 61000-4-15:2010.

max
3.5
max

maximum time duration during the observation period that the voltage deviation d(t) exceeds

the limit for d

Note 1 to entry: During a voltage change characteristic the time duration T is accumulated until a new steady

max
state condition is established.

Note 2 to entry: The T limit evaluation in this standard is generally intended to evaluate the inrush current

max

pattern of the equipment under test. Thus, as soon as a new steady state condition is established, the T

max

evaluation is ended. When a new voltage change occurs that exceeds the limit for d , a new T evaluation is

c max

started. The maximum duration that d(t) exceeds the limit for d for any of the individual T evaluations during the

c max

observation period, is used for the comparison against the T limit, and is reported for the test.

max
3.6
nominal test voltage

nominal test voltage used to calculate percentages for the various directly measured

parameters
---------------------- Page: 10 ----------------------
61000-3-3 © IEC:2013 – 9 –

Note 1 to entry: If no steady state condition is achieved during the observation period, U is used for the

calculation of d and T .
max max

Note 2 to entry: U is not necessarily equal to the nominal voltage of the public supply.

3.7
short-term flicker severity

Note 1 to entry: If not specified differently, the P evaluation time is 10 minutes. For the purpose of power quality

surveys and studies, other time intervals may be used, and have to be defined in the index. For example a 1

minute interval should be written as P
st,1min.
3.8
long-term flicker severity
st,i
i =1
P =
where P (i = 1, 2, 3, ...) are consecutive readings of the short-term severity P
st
st,i

Note 1 to entry: Unless otherwise specified, P is calculated over discrete T periods. Each time a T period

lt long long
has expired, a new P calculation is started.
3.9
flickermeter
instrument designed to measure any quantity representative of flicker

Note 1 to entry: Measurements are normally P and P and may also include the directly measured parameters

st lt
specified in 3.2 to 3.5.
[SOURCE: IEC 60050-161:1990, 161-08-14]
3.10
flicker impression time

value with a time dimension which describes the flicker impression of a voltage change

characteristic
3.11
shape factor

value derived from the type of voltage fluctuation, such as a step, double step, or ramp

pattern

Note 1 to entry: The shape factor is mainly needed when the analytical method is used to calculate P .

3.12
interface point
interface between a public supply network and a user’s installation
3.13
conditional connection

connection of equipment requiring the user’s supply at the interface point to have an

impedance lower than the reference impedance Z in order that the equipment emissions

ref
comply with the limits in this part

Note 1 to entry: Meeting the voltage change limits may not be the only condition for connection; emission limits

for other phenomena such as harmonics, may also have to be satisfied.
---------------------- Page: 11 ----------------------
– 10 – 61000-3-3 © IEC:2013
4 Assessment of voltage changes, voltage fluctuations and flicker
4.1 Assessment of a relative voltage change, d(t)

The basis for flicker evaluation is the voltage change characteristic at the terminals of the

(t) of any two successive values of the
equipment under test, that is the difference ∆ U
phase-to-neutral voltages U (t ) and U (t ):
hp 1 hp 2
∆ U (t) = U (t ) – U (t ) (1)
hp hp 1 hp 2

NOTE 1 See Annex C for relevant definitions that are taken from IEC 61000-4-15:2010.

The r.m.s. values U (t ), U (t ) of the voltage shall be measured or calculated. When

hp 1 hp 2

deducing r.m.s. values from oscillographic waveforms, account should be taken of any

waveform distortion that may be present.

The voltage change at the EUT terminals, ∆U, is due to the change of the voltage drop across

the complex reference impedance Z, caused by the complex fundamental input current

change, ∆I, of the equipment under test. ∆I and ∆I are the active and reactive parts

p q
respectively of the current change, ∆I.
∆I = ∆I – j∆I = I(t ) – I(t ) (2)
p q
1 2
NOTE 2 I is positive for lagging currents and negative for leading currents.

NOTE 3 If the harmonic distortion of the currents I(t ) and I(t ) is less than 10 %, the total r.m.s. value can be

1 2

applied instead of the r.m.s. values of their fundamental currents, taking account of the phase angles of the

fundamental currents.

NOTE 4 For single-phase and symmetrical three-phase equipment the voltage change can be, provided X is

positive (inductive), approximated to:
∆U = ∆I R + ∆I X (3)
hp p q

where ∆I and ∆I are the active and reactive parts respectively of the current change ∆I and R and X are the

p q
elements of the complex reference impedance Z (see Figure 1).
The relative voltage change is given by:
d = ∆U /U (4)
hp n

The d evaluation ends as soon as a new steady state condition is established, or at the

max,i

end of the observation period. The polarity of change(s) may be indicated as follows: if the

maximum voltage deviation is observed during a reduction in voltage with respect to the

previous d the resulting d value is positive; if the maximum voltage deviation is

end,i max,i
the resulting d
observed during a voltage increase with respect to the previous d
end,i max,i
value is negative.
4.2 Assessment of the short-term flicker value, P
4.2.1 General

Table 1 shows alternative methods for evaluating P , due to voltage fluctuations of different

types; in all cases direct measurement (with a flickermeter) is acceptable:
---------------------- Page: 12 ----------------------
61000-3-3 © IEC:2013 – 11 –
Table 1 – Assessment method
Types of voltage fluctuations Method for evaluating P
All voltage fluctuations (on-line evaluation) Flickermeter
All voltage fluctuations where U(t) is known Simulation
Voltage change characteristics according to Figures 3 Analytical
to 5 with an occurrence rate less than 1 per second
Rectangular voltage change at equal intervals Use of the P = 1 curve of Figure 2
4.2.2 Flickermeter

All types of voltage fluctuations may be assessed by direct measurement using a flickermeter

which complies with the specification given in IEC 61000-4-15:2010, and is connected as

described in this standard. This is the reference method for application of the limits.

4.2.3 Simulation method

In the case where the relative voltage change characteristic d(t) is known, P can be

evaluated using a computer simulation.
4.2.4 Analytical method
4.2.4.1 General

For voltage change characteristics of the types shown in Figures 3, 4 and 5, the P value can

be evaluated by an analytical method using Equations (5) and (6).

NOTE 1 The value of P obtained using this method is expected to be within ± 10 % of the result which woul

...

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