Fixed capacitors for use in electronic equipment - Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors

IEC 60384-19:2015 is applicable to fixed surface mount capacitors for direct current, with metallized electrodes and polyethylene-terephthalate dielectric for use in electronic equipment. These capacitors have metallized connecting pads or soldering strips and are intended to be mounted directly onto substrates for hybrid circuits or onto printed boards. These capacitors may have "self-healing properties" depending on conditions of use. They are primarily intended for applications where the a.c. component is small with respect to the rated voltage. Capacitors for electromagnetic interference suppression are not included, but are covered by IEC 60384 14. This edition includes the following significant technical changes with respect to the previous edition:
a) Revised all parts of the document based on the IEC Directives Part 2:2011 (sixth edition) to the extent practicable, and harmonization between other similar kind of documents.
b) Revised tables and Clause 4 so as to prevent duplications and contradictions.

Condensateurs fixes utilisés dans les équipements électroniques - Partie 19: Spécification intermédiaire: Condensateurs fixes pour montage en surface pour courant continu à diélectrique en film de polyéthylène téréphtalate métallisé

L'IEC 60384-19:2015 s'applique aux condensateurs fixes pour courant continu à électrodes métallisées et à diélectrique en polyéthylène téréphtalate destinés aux équipements électroniques. Ces condensateurs sont équipés de contacts de connexion métallisés ou de bandes de brasure et sont destinés à être montés directement sur des substrats pour circuits hybrides ou sur des cartes imprimées. Ces condensateurs peuvent avoir des propriétés "autocicatrisantes" en fonction des conditions d'utilisation. Ils sont principalement destinés à des applications dans lesquelles la composante alternative est petite par rapport à la tension assignée. Les condensateurs d'antiparasitage ne sont pas inclus, mais ils sont couverts par l'IEC 60384-14. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) Révision de toutes les parties du document en se basant sur les Directives IEC, Partie 2 (sixième édition, 2011), dans la mesure du possible, et sur l'harmonisation d'autres types de documents.
b) Révision des tableaux et de l'Article 4 pour éviter les duplications et les contradictions.

General Information

Status
Published
Publication Date
14-Apr-2015
Current Stage
DELPUB - Deleted Publication
Start Date
18-Jul-2022
Completion Date
30-Apr-2021
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Standard
IEC 60384-19:2015 - Fixed capacitors for use in electronic equipment - Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric surface mount d.c. capacitors
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IEC 60384-19 ®
Edition 3.0 2015-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –
Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate
film dielectric surface mount d.c. capacitors

Condensateurs fixes utilisés dans les équipements électroniques –
Partie 19: Spécification intermédiaire: Condensateurs fixes pour montage en
surface pour courant continu à diélectrique en film de polyéthylène téréphtalate
métallisé
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IEC 60384-19 ®
Edition 3.0 2015-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Fixed capacitors for use in electronic equipment –

Part 19: Sectional specification: Fixed metallized polyethylene-terephthalate

film dielectric surface mount d.c. capacitors

Condensateurs fixes utilisés dans les équipements électroniques –

Partie 19: Spécification intermédiaire: Condensateurs fixes pour montage en

surface pour courant continu à diélectrique en film de polyéthylène téréphtalate

métallisé
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.060.30 ISBN 978-2-8322-2596-7

– 2 – IEC 60384-19:2015  IEC 2015
CONTENTS
FOREWORD . 5
1 General . 7
1.1 Scope . 7
1.2 Object . 7
1.3 Normative references . 7
1.4 Information to be given in a detail specification . 8
1.4.1 General . 8
1.4.2 Outline drawing and dimensions . 8
1.4.3 Mounting . 8
1.4.4 Ratings and characteristics . 8
1.4.5 Marking . 9
1.5 Terms and definitions . 9
1.6 Marking . 9
1.6.1 General . 9
1.6.2 Information for marking . 9
1.6.3 Marking of capacitors . 9
1.6.4 Marking on packaging . 10
2 Preferred ratings and characteristics . 10
2.1 Preferred characteristics . 10
2.1.1 Preferred climatic categories . 10
2.2 Preferred values of ratings . 10
2.2.1 Nominal capacitance (C ) . 10
N
2.2.2 Tolerance on nominal capacitance . 10
2.2.3 Rated voltage (U ) . 10
R
2.2.4 Category voltage (U ) . 11
C
2.2.5 Rated temperature . 11
3 Quality assessment procedures . 11
3.1 Primary stage of manufacture . 11
3.2 Structurally similar components . 11
3.3 Certified test records of released lots . 11
3.4 Qualification approval procedures . 11
3.4.1 General . 11
3.4.2 Qualification approval on the basis of the fixed sample size procedure . 11
3.5 Quality conformance inspection . 19
3.5.1 Formation of inspection lots . 19
3.5.2 Test schedule . 20
3.5.3 Delayed delivery . 20
3.5.4 Assessment levels . 20
4 Test and measurement procedures . 21
4.1 Mounting . 21
4.2 Visual examination and check of dimensions . 21
4.2.1 General . 21
4.2.2 Visual examination and check of dimensions . 21
4.2.3 Requirements . 21
4.3 Electrical tests . 21
4.3.1 Voltage proof . 21

4.3.2 Capacitance . 22
4.3.3 Tangent of loss angle (tan δ) . 22
4.3.4 Insulation resistance . 23
4.4 Shear test . 24
4.5 Substrate bending test . 25
4.5.1 General . 25
4.5.2 Initial inspections . 25
4.5.3 Final inspections and requirements . 25
4.6 Resistance to soldering heat . 25
4.6.1 General . 25
4.6.2 Initial inspections . 25
4.6.3 Test conditions . 25
4.6.4 Recovery . 25
4.6.5 Final inspections and requirements . 25
4.7 Solderability . 25
4.7.1 General . 25
4.7.2 Test conditions . 26
4.7.3 Final inspections and requirements . 26
4.8 Rapid change of temperature . 26
4.8.1 General . 26
4.8.2 Initial inspections . 26
4.8.3 Test conditions . 26
4.8.4 Final inspections and requirements . 26
4.9 Climatic sequence. 26
4.9.1 General . 26
4.9.2 Initial inspections . 26
4.9.3 Dry heat . 26
4.9.4 Damp heat, cyclic, test Db, first cycle . 27
4.9.5 Cold. 27
4.9.6 Damp heat, cyclic, test Db, remaining cycles . 27
4.9.7 Recovery . 27
4.9.8 Final inspections and requirements . 27
4.10 Damp heat, steady state . 27
4.10.1 General . 27
4.10.2 Initial inspections . 27
4.10.3 Test conditions . 27
4.10.4 Recovery . 27
4.10.5 Final inspections and requirements . 27
4.11 Endurance . 28
4.11.1 General . 28
4.11.2 Initial inspections . 28
4.11.3 Test conditions . 28
4.11.4 Final inspections and requirements . 28
4.12 Charge and discharge . 28
4.12.1 General . 28
4.12.2 Initial inspections . 28
4.12.3 Test conditions . 28
4.12.4 Recovery . 29
4.12.5 Final inspections and requirements . 29

– 4 – IEC 60384-19:2015  IEC 2015
4.13 Component solvent resistance (if applicable) . 29
4.14 Solvent resistance of marking (if applicable) . 29
Bibliography . 30

Table 1 – Percentage limit of the rated voltage at a.c. voltage frequency . 11
Table 2 – Test and sampling plan for qualification approval Assessment level EZ . 13
Table 3 – Test schedule for qualification approval . 14
Table 4 – Lot-by-lot inspection . 20
Table 5 – Periodic inspection . 21
Table 6 – Test voltages . 22
Table 7 – Applicable tan δ values . 23
Table 8 – Requirements regarding insulation resistance . 24
Table 9 – Correction factor dependent on temperature. 24
Table 10 – Test conditions . 28

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 19: Sectional specification:
Fixed metallized polyethylene-terephthalate film
dielectric surface mount d.c. capacitors

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
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Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60384-19 has been prepared by IEC technical committee 40:
Capacitors and resistors for electronic equipment.
This third edition cancels and replaces the second edition published in 2006 and constitutes a
technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) Revised all parts of the document based on the IEC Directives Part 2:2011 (sixth edition)
to the extent practicable, and harmonization between other similar kind of documents.
b) Revised tables and Clause 4 so as to prevent duplications and contradictions.

– 6 – IEC 60384-19:2015  IEC 2015
The text of this standard is based on the following documents:
FDIS Report on voting
40/2342/FDIS 40/2373/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The list of all parts of the IEC 60384 series, under the (new) general title Fixed capacitors for
use in electronic equipment, can be found on the IEC web site.
The committee has decided that the contents of this publication will remain unchanged until
the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data
related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –

Part 19: Sectional specification:
Fixed metallized polyethylene-terephthalate film
dielectric surface mount d.c. capacitors

1 General
1.1 Scope
This part of IEC 60384 is applicable to fixed surface mount capacitors for direct current, with
metallized electrodes and polyethylene-terephthalate dielectric for use in electronic
equipment. These capacitors have metallized connecting pads or soldering strips and are
intended to be mounted directly onto substrates for hybrid circuits or onto printed boards.
These capacitors may have "self-healing properties" depending on conditions of use. They are
primarily intended for applications where the a.c. component is small with respect to the rated
voltage.
Capacitors for electromagnetic interference suppression are not included, but are covered by
IEC 60384-14.
1.2 Object
The object of this standard is to prescribe preferred ratings and characteristics and to select
from IEC 60384-1:2008, the appropriate quality assessment procedures, tests and measuring
methods and to give general performance requirements for this type of capacitor. Test
severities and requirements prescribed in detail specifications referring to this sectional
specification shall be of equal or higher performance level, because lower performance levels
are not permitted.
1.3 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60062, Marking codes for resistors and capacitors
IEC 60063, Preferred number series for resistors and capacitors
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60384-1:2008, Fixed capacitors for use in electronic equipment – Part 1: Generic
specification
IEC 61193-2:2007, Quality assessment systems – Part 2: Selection and use of sampling
plans for inspection of electronic components and packages
ISO 3, Preferred numbers – Series of preferred numbers

– 8 – IEC 60384-19:2015  IEC 2015
1.4 Information to be given in a detail specification
1.4.1 General
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional
or blank detail specification. When more severe requirements are included, they shall be
listed in 1.9 of the detail specification and indicated in the test schedules, for example by an
asterisk.
The information given in 1.4.2 may, for convenience, be presented in tabular form.
The following information shall be given in each detail specification and the values quoted
shall preferably be selected from those given in the appropriate clause of this sectional
specification.
1.4.2 Outline drawing and dimensions
There shall be an illustration of the capacitor as an aid to easy recognition and for comparison
of the capacitor with others. Dimensions and their associated tolerances, which affect inter-
changeability and mounting, shall be given in the detail specification. All dimensions shall
preferably be stated in millimetres, however, when the original dimensions are given in
inches, the converted metric dimensions in millimetres shall be added.
The numerical values of the body shall be given as follows:
– width, length and height.
The numerical values of the terminals shall be given as follows:
– width, length and spacing.
When necessary, for example when a number of items (sizes and capacitance/voltage ranges)
is covered by a detail specification, the dimensions and their associated tolerances shall be
placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such
dimensional information as will adequately describe the capacitor.
1.4.3 Mounting
The detail specification shall give guidance on methods of mounting for normal use. Mounting
for test and measurement purposes (when required) shall be in accordance with 4.1.
1.4.4 Ratings and characteristics
1.4.4.1 General
The ratings and characteristics shall be in accordance with the relevant clauses of this
standard, together with the following.
1.4.4.2 Nominal capacitance range
See 2.2.1.
When products approved to the detail specification have different nominal capacitance
ranges, the following statement should be added: “The nominal capacitance range available in
each voltage range is given on the IEC online service, www.iecq.org/certificates."

1.4.4.3 Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify
adequately the component for design and application purposes.
1.4.4.4 Soldering
The detail specification shall prescribe the test methods, severities and requirements
applicable for the solderability and the resistance to soldering heat tests.
1.4.5 Marking
The detail specification shall specify the content of the marking on the capacitor and on the
packaging. Deviations from 1.6 shall be specifically stated.
1.5 Terms and definitions
For the purposes of this document, and in addition to the applicable terms and definitions
given in IEC 60384-1:2008, the following definitions apply.
1.5.1
performance grade 1 capacitors
capacitors for long-life applications with stringent requirements for the electrical
parameters
1.5.2
performance grade 2 capacitors
capacitors for general applications where the stringent requirements for
grade 1 capacitors are not necessary
1.6 Marking
1.6.1 General
See IEC 60384-1:2008, 2.4, with the following details.
1.6.2 Information for marking
The information given in the marking is normally selected from the following list. The relative
importance of each item is indicated by its position in the list:
a) nominal capacitance (in clear or code according to IEC 60062);
b) rated voltage (d.c. voltage may be indicated by the symbol      or    );
c) tolerance on nominal capacitance;
d) category voltage;
e) year and month (or week) of manufacture;
f) manufacturer's name or trade mark;
g) climatic category;
h) manufacturer's type designation;
i) reference to the detail specification.
1.6.3 Marking on capacitors
Marking on capacitors is made when necessary.
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.

– 10 – IEC 60384-19:2015  IEC 2015
1.6.4 Marking on packaging
The packaging containing the capacitor(s) shall be clearly marked with all the information
listed in 1.6.2 as necessary.
2 Preferred ratings and characteristics
2.1 Preferred characteristics
The values given in detail specifications shall preferably be selected from the following.
2.1.1 Preferred climatic categories
The surface mount capacitors covered by this standard are classified into climatic categories
according to the general rules given in IEC 60068-1:2013, Annex A.
The lower and upper category temperature and the duration of the damp heat, steady state
test shall be chosen from the following:
Lower category temperature: –55 °C, –40 °C and –25 °C.
Upper category temperature: +85 °C, +100 °C and +125 °C.
Duration of the damp heat, steady state test: 4, 10, 21 and 56 days.
With continuous operation at 125 °C in excess of the endurance test time, accelerated ageing
has to be considered (see detail specification).
The severities for the cold and dry heat tests are the lower and upper category temperatures
respectively.
2.2 Preferred values of ratings
2.2.1 Nominal capacitance (C )
N
Preferred values of nominal capacitance shall be taken from the E6 series of IEC 60063:
n
, n = integer).
1,0 − 1,5 − 2,2 − 3,3 − 4,7 and 6,8 and their decimal multiples (× 10
If other values are required they shall preferably be chosen from the E12 series.
2.2.2 Tolerance on nominal capacitance
The preferred tolerances on the nominal capacitance are ±5 %, ±10 % and ±20 %.
2.2.3 Rated voltage (U )
R
The preferred values of rated voltage taken from R 10 series of ISO 3 are:
n
1,0 − 1,6 − 2,5 − 4,0 − 5,0 − 6,3 and their decimal multiples (× 10 , n: integer).
The sum of the d.c. voltage and the peak a.c. voltage applied to the capacitor should not
exceed the rated voltage.
The value of the peak a.c. voltage should not exceed the percentages of the rated voltage at
the frequencies stated in Table 1, unless otherwise specified in the detail specification.

Table 1 – Percentage limit of the rated voltage at a.c. voltage frequency
AC voltage frequency Percentage limit of the rated voltage
%
Hz
50 20
100 15
1 000 3
10 000 1
2.2.4 Category voltage (U )
C
The category voltage is:
– for upper category temperature 100 °C: 0,8 U ;
R
– for upper category temperature 125 °C: 0,5 U .
R
2.2.5 Rated temperature
The standard value of rated temperature is 85 °C.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the winding of the capacitor element or the equivalent
operation.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar
processes and materials, though they may be of different case sizes and capacitance and
voltage values.
3.3 Certified test records of released lots
The information required in IEC 60384-1:2008, Q.9 shall be made available when prescribed
in the detail specification and when requested by a purchaser. After the endurance test the
required parameters are the capacitance change, tan δ and the insulation resistance.
3.4 Qualification approval procedures
3.4.1 General
The procedures for qualification approval testing are given in IEC 60384-1:2008, Q.5.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and
periodic tests is given in 3.5. The procedure using a fixed sample size schedule is given in
3.4.2 below.
3.4.2 Qualification approval on the basis of the fixed sample size procedure
3.4.2.1 Sampling
The fixed sample size procedure is described in IEC 60384-1:2008, Q.5.3, list item b). The
sample shall be representative of the range of capacitors for which approval is sought. The
sample may be the whole or part of the range given in the detail specification.

– 12 – IEC 60384-19:2015  IEC 2015
The sample shall consist of four specimens having the maximum and minimum rated voltages,
and for these voltages the maximum and minimum capacitances. When there are more than
four rated voltages an intermediate voltage shall also be tested. Thus, for the approval of a
range, testing is required of either four or six values (capacitance/voltage combinations).
When the range consists of less than four values, the number of specimens to be tested shall
be that required for four values.
Spare specimens are permitted as follows:
Two (for six values) or three (for four values) per value, which may be used as replacements
for specimens, which are non-conforming because of incidents not attributable to the
manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so the
numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the
number of specimens required for Group 0 shall be increased by the same number as that
required for the additional groups.
Table 2 gives the number of samples to be tested for each group with the permissible number
of non-conforming items for qualification approval tests.
3.4.2.2 Tests
The complete series of tests specified in Table 2 and Table 3 are required for the approval of
capacitors covered by one detail specification. The tests of each group shall be carried out in
the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other
groups.
Non-conforming specimens found during the tests of Group 0 shall not be used for the other
groups.
Approval is granted when the number of non-conforming items is zero.
Table 2 and Table 3 together form the fixed sample size test schedule for the qualification
approval on the basis of the fixed sample size procedure.
Table 2 gives the number of the samples and permissible non-conforming items for each test
and test group.
Table 3 gives a summary of the test conditions and performance requirements, and choices of
the test conditions and performance requirements in the detail specification.
The test conditions and performance requirements for the qualification approval on the basis
of the fixed sample size should be identical to those for quality conformance inspections given
in the detail specification.
Table 2 – Test and sampling plan for qualification approval
Assessment level EZ
Group Test Subclause Number of Permissible
No. of this specimens number of non-
standard conforming
items
a
n c
0 Visual examination 4.2
Dimensions 4.2
Capacitance 4.3.2 144 0
Tangent of loss angle 4.3.3
Voltage proof 4.3.1
Insulation resistance 4.3.4
Spare specimens 12
1A Resistance to soldering heat 4.6 12 0
b
Component solvent resistance 4.13

1B Solderability 4.7 12 0
b
Solvent resistance of the marking 4.14
2 Substrate bending test (formerly bond 4.5 12 0
strength of the end face plating)

Mounting 4.1
Visual examination 4.2
c
Capacitance 4.3.2 108 0
3 Tangent of loss angle 4.3.3
Insulation resistance 4.3.4
Shear test 4.4
3.1 Rapid change of temperature 4.8 24 0
Climatic sequence 4.9
3.2 Damp heat, steady state 4.10 24 0
3.3 Endurance 4.11 36 0
3.4 Charge and discharge 4.12 24 0
a
Capacitance / voltage combinations, see 3.4.2.
b
If required by the detail specification.
c
Specimens found defective after mounting shall not be taken into account when calculating the
permissible non-conforming items for the following tests. They shall be replaced by spare parts.

– 14 – IEC 60384-19:2015  IEC 2015
Table 3 – Test schedule for qualification approval (1 of 6)
a
Subclause number D Conditions of test and Number of Performance
a a
and test , inspection items measurements specimens (n) requirements
or
and number of
permissible
ND
non-
b
conforming
items (c)
Group 0 ND See Table 2
4.2.1 Visual examination As in 4.2.2 As in 4.2.3
4.2 Dimensions (detail)  See detail specification
4.3.2 Capacitance As in 4.3.2.2 Within specified tolerance
4.3.3 Tangent of loss As in 4.3.3.2 As in 4.3.3.3
angle
4.3.1 Voltage proof As in 4.3.1.2 and 4.3.1.3 As in 4.3.1.4
4.3.4 Insulation As in 4.3.4.2 As in 4.3.4.3
resistance
Group 1A D See Table 2
4.6 Resistance to As in 4.6.3
soldering heat
4.6.2 Initial inspections  As in 4.6.2
Capacitance
4.6.4 Recovery As in 4.6.4
4.6.5 Final inspections
Visual examination As in 4.6. 5 As in 4.6.5

Capacitance
│∆C/C│ ≤3 % of the value
measured in 4.6.2
4.13 Component solvent As in 4.13 As in 4.13
c,e
resistance
Method 2
Table 3 – Test schedule for qualification approval (2 of 6)
a
Subclause number D Conditions of test and Number of Performance
a a
and test , inspection items measurements specimens (n) requirements
or
and number of
permissible non-
ND
conforming
b
items (c)
Group 1B
D See Table 2
4.7 Solderability As in 4.7.2
4.7.3 Final inspections As in 4.7.3 As in 4.7.3
Visual examination
4.14 Solvent resistance of As in 4.14 Legible marking
c, e
the marking
Method 1 As in 4.14
Group 2 D See Table 2
4.5 Substrate bending See IEC 60384-1:2008,
test 4.35
4.5.2 Initial inspections  As in 4.5.2
Capacitance
4.5.3 Final inspections As in 4.2.2 No visible damage
Visual examination
Capacitance As in 4.3.2.2 │∆C/C│ ≤10 % of the value
measured in 4.5.2
Group 3 D See Table 2
d
4.1 Mounting Substrate material: .
4.2.2 Final inspections As in 4.2.2 See detail specification
Visual examination
Capacitance As in 4.3.2.2
│∆C/C│ ≤2 % of the value
measured in 4.3.2
Tangent of loss angle As in 4.3.3.2 See detail specification

Insulation resistance As in 4.3.4.2 See detail specification

– 16 – IEC 60384-19:2015  IEC 2015
Table 3 – Test schedule for qualification approval (3 of 6)
a
Subclause number  D Conditions of test and Number of Performance
a a
and test , inspection items measurements specimens (n) requirements
or
and number of
permissible non-
ND
conforming
b
items (c)
Group 3.1 D See Table 2
4.4 Shear test As in 4.4
4.8 Rapid change of
temperature As in 4.8.3
= Lower category
TA
temperature
T = Upper category
B
temperature
4.8.2 Initial inspections
Capacitance As in 4.8.2
Tangent of loss angle
4.8.4 Final inspections As in 4.2.2 No visible damage
Visual examination
Capacitance As in 4.3.2.2 See detail specification
Tangent of loss angle As in 4.3.3.2 See detail specification
4.9 Climatic sequence
4.9.2 Initial inspections
Capacitance As in 4.9.2
Tangent of loss angle
4.9.3 Dry heat As in 4.9.3
Temperature: upper
category temperature
Duration: 16 h
4.9.4 Damp heat, cyclic, As in 4.9.4
Test Db, first cycle
4.9.5 Cold As in 4.9.5
Temperature: lower category
temperature
Duration: 2 h
4.9.6 Damp heat, cyclic, As in 4.9.6
Test Db, remaining
cycles
4.9.7 Recovery As in 4.9.7
Table 3 – Test schedule for qualification approval (4 of 6)
Subclause number  D Conditions of Number of Performance
a a a
and test , inspection items test and specimens (n) requirements
or
measurements and number of
permissible
ND
non-
b
conforming
items (c)
4.9.8 Final inspections
Visual examination As in 4.2.2 No visible damage
Legible marking
Capacitance As in 4.3.2.2
│∆C/C│ ≤3 % of the value
measured in 4.9.2
Tangent of loss angle:
at 10 kHz for C ≤ 1 µF As in 4.3.3.4 Increase of tan δ:

N
≤0,005 for Grade 1
≤0,008 for Grade 2
compared to values
measured in 4.9.2
As in 4.3.3.2
at 1 kHz for C > 1 µF ≤0,003 for Grade 1

N
≤0,005 for Grade 2
compared to values
measured in 4.9.2
Insulation resistance As in 4.3.4.2
≥50 % of values
in 4.3.4.3
Group 3.2 D See Table 2
4.10 Damp heat, As in 4.10.3
steady state
4.10.2 Initial inspections
Capacitance As
...

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