IEC 62884-2:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 2 : Méthode de mesure de la gigue de phase

L'IEC 62884-2:2017 spécifie les méthodes de mesure et d'évaluation du mesurage de la gigue de phase des oscillateurs piézoélectriques, diélectriques et électrostatiques, y compris les oscillateurs à résonateur diélectrique (DRO - dielectric resonator oscillators) et les oscillateurs utilisant un résonateur à ondes acoustiques de volume à couches fines (FBAR - film bulk acoustic resonator) (appelés ici « oscillateur ») et donne des recommandations relatives à la gigue de phase permettant de mesurer avec exactitude la gigue efficace.
Dans la méthode de mesure, un matériel ou système de mesure du bruit de phase est utilisé.
NOTE Les oscillateurs à résonateur diélectrique (DRO - dielectric resonator oscillator) et les oscillateurs utilisant un FBAR sont à l'étude.

General Information

• Status: Published
• Publication Date: 29-Aug-2017
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 7 - TC 49/WG 7
• Current Stage: PPUB - Publication issued
• Start Date: 29-Sep-2017
• Completion Date: 30-Aug-2017

Standards Content (Sample)

IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 2: Phase jitter measurement method

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
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IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –
Part 2: Phase jitter measurement method

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.140 ISBN 978-2-8322-4762-4

– 2 – IEC 62884-2:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Test and measurement procedures . 8
4.1 General . 8
4.2 Test methods of phase jitter . 8
4.2.1 General . 8
4.2.2 Measurement in the time domain . 8
4.2.3 Measurement in the data domain . 9
4.2.4 Measurement in the frequency domain . 9
4.3 Input and output impedances of the measurement system . 13
4.4 Measurement equipment . 13
4.4.1 General . 13
4.4.2 Jitter floor . 13
4.4.3 Output wave form . 13
4.4.4 Output voltage . 14
4.5 Test fixture. 14
4.6 Cable, tools and instruments, and so on . 14
5 Measurement and the measurement environment . 14
5.1 Set-up before taking measurements . 14
5.2 Points to be considered and noted at the time of measurement . 14
5.3 Treatment after the measurement . 14
6 Measurement . 15
6.1 Reference temperature . 15
6.2 Measurement of temperature characteristics . 15
6.3 Measurement under vibration . 15
6.4 Measurement at the time of impact . 15
6.5 Measurement in accelerated ageing . 15
7 Other points to be noted . 15
8 Miscellaneous . 15
Annex A (normative)  Calculation method for the amount of phase jitter . 16
A.1 General . 16
A.2 Explanation . 16
A.3 Relations between phase noise and phase jitter . 16
A.4 Commentary on theoretical positioning of phase jitter . 18
A.5 Description . 18
A.5.1 General . 18
A.5.2 RMS jitter . 19
A.5.3 Peak-to-peak jitter . 19
A.5.4 Random jitter . 20
A.5.5 Deterministic jitter . 20
A.5.6 Period (periodic) jitter . 20
A.5.7 Data-dependent jitter . 20
A.5.8 Total jitter . 21

A.6 Points to be considered for measurement . 21
A.6.1 Measurement equipment . 21
A.6.2 Factors of measurement errors . 22
Bibliography . 24

Figure 1 – Phase jitter measurement with sampling oscilloscope . 9
Figure 2 – Block diagram of a jitter and wander analyser according to ITU-T O.172 . 11
Figure 3 – Equivalent block diagram . 13
Figure A.1 – Concept diagram of SSB phase noise . 18
Figure A.2 – Voltage versus time . 19
Figure A.3 – Explanatory diagram of the amount of jitter applied to RMS jitter . 21
Figure A.4 – Explanatory diagrams of random jitter, deterministic jitter, and total jitter . 22

Table 1 – Fourier frequency range for phase noise test . 10
Table 2 – Standard bit rates for various applications . 12

– 4 – IEC 62884-2:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –

Part 2: Phase jitter measurement method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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International Standard IEC 62884-2 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this International Standard is based on the following documents:
CDV Report on voting
49/1212/CDV 49/1243/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
...

IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic
oscillators –
Part 2: Phase jitter measurement method

Techniques de mesure des oscillateurs piézoélectriques, diélectriques
et électrostatiques –
Partie 2: Méthode de mesure de la gigue de phase

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC
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IEC 62884-2 ®
Edition 1.0 2017-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic

oscillators –
Part 2: Phase jitter measurement method

Techniques de mesure des oscillateurs piézoélectriques, diélectriques

et électrostatiques –
Partie 2: Méthode de mesure de la gigue de phase

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-7553-5

– 2 – IEC 62884-2:2017 © IEC 2017
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Test and measurement procedures . 8
4.1 General . 8
4.2 Test methods of phase jitter . 8
4.2.1 General . 8
4.2.2 Measurement in the time domain . 8
4.2.3 Measurement in the data domain . 9
4.2.4 Measurement in the frequency domain . 9
4.3 Input and output impedances of the measurement system . 13
4.4 Measurement equipment . 13
4.4.1 General . 13
4.4.2 Jitter floor . 13
4.4.3 Output wave form . 13
4.4.4 Output voltage . 14
4.5 Test fixture. 14
4.6 Cable, tools and instruments, and so on . 14
5 Measurement and the measurement environment . 14
5.1 Set-up before taking measurements . 14
5.2 Points to be considered and noted at the time of measurement . 14
5.3 Treatment after the measurement . 14
6 Measurement . 15
6.1 Reference temperature . 15
6.2 Measurement of temperature characteristics . 15
6.3 Measurement under vibration . 15
6.4 Measurement at the time of impact . 15
6.5 Measurement in accelerated ageing . 15
7 Other points to be noted . 15
8 Miscellaneous . 15
Annex A (normative)  Calculation method for the amount of phase jitter . 16
A.1 General . 16
A.2 Explanation . 16
A.3 Relations between phase noise and phase jitter . 16
A.4 Commentary on theoretical positioning of phase jitter . 18
A.5 Description . 18
A.5.1 General . 18
A.5.2 RMS jitter . 19
A.5.3 Peak-to-peak jitter . 19
A.5.4 Random jitter . 20
A.5.5 Deterministic jitter . 20
A.5.6 Period (periodic) jitter . 20
A.5.7 Data-dependent jitter . 20
A.5.8 Total jitter . 21

A.6 Points to be considered for measurement . 21
A.6.1 Measurement equipment . 21
A.6.2 Factors of measurement errors . 22
Bibliography . 24

Figure 1 – Phase jitter measurement with sampling oscilloscope . 9
Figure 2 – Block diagram of a jitter and wander analyser according to ITU-T O.172 . 11
Figure 3 – Equivalent block diagram . 13
Figure A.1 – Concept diagram of SSB phase noise . 18
Figure A.2 – Voltage versus time . 19
Figure A.3 – Explanatory diagram of the amount of jitter applied to RMS jitter . 21
Figure A.4 – Explanatory diagrams of random jitter, deterministic jitter, and total jitter . 22

Table 1 – Fourier frequency range for phase noise test . 10
Table 2 – Standard bit rates for various applications . 12

– 4 – IEC 62884-2:2017 © IEC 2017
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC,
DIELECTRIC AND ELECTROSTATIC OSCILLATORS –

Part 2: Phase jitter measurement method

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each
...