IEC TS 63342:2022

C-Si photovoltaic (PV) modules - Light and elevated temperature induced degradation (LETID) test - Detection

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

General Information

• Status: Published
• Publication Date: 19-Jul-2022
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 82 - Solar photovoltaic energy systems
• Drafting Committee: WG 2 - TC 82/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 17-Aug-2022
• Completion Date: 20-Jul-2022

Standards Content (Sample)

IEC TS 63342
®

Edition 1.0 2022-07
TECHNICAL
SPECIFICATION
colour
inside
C-Si photovoltaic (PV) modules – Light and elevated temperature induced
degradation (LETID) test – Detection
IEC TS 63342:2022-07(en)

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IEC TS 63342
®

Edition 1.0 2022-07
TECHNICAL
SPECIFICATION
colour
inside
C-Si photovoltaic (PV) modules – Light and elevated temperature induced
degradation (LETID) test – Detection
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-3977-3
 Warning! Make sure that you obtained this publication from an authorized distributor.
® Registered trademark of the International Electrotechnical Commission

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– 2 – IEC TS 63342:2022  IEC 2022
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 6
3.1 Terms and definitions . 6
3.2 Abbreviated terms . 6
4 Samples . 6
5 Apparatus . 6
6 Testing . 6
6.1 General . 6
6.2 Visual inspection . 7
6.3 Electroluminescence images . 7
6.4 Performance at STC . 7
6.5 B-O LID preconditioning via current injection (CID) .
...