Road Vehicles — Electrical disturbance by conduction and coupling — Part 4: Electrical transient conduction along shielded high voltage supply lines only

This document specifies test methods and procedures to ensure the compatibility to conducted electrical transients along shielded high voltage supply lines of equipment installed on passenger cars and commercial vehicles fitted with electrical systems with voltages higher than 60 V d.c. and lower than 1 500 V d.c. and a power supply isolated from the vehicle body. It describes bench tests for both, injection and measurement of transients. It is applicable to all types of electrical independent driven, road vehicles (e.g. battery electrical vehicle (BEV) or hybrid electrical vehicle (HEV), plugin hybrid electric vehicle (PHEV)).

Véhicules routiers — Perturbations électriques par conduction et par couplage — Partie 4: Conduction transitoire électrique seulement le long des lignes à haute tension blindées

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Status
Published
Publication Date
05-May-2020
Current Stage
6060 - International Standard published
Start Date
03-Apr-2020
Completion Date
06-May-2020
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ISO/TS 7637-4:2020 - Road Vehicles -- Electrical disturbance by conduction and coupling
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TECHNICAL ISO/TS
SPECIFICATION 7637-4
First edition
2020-05
Road Vehicles — Electrical
disturbance by conduction and
coupling —
Part 4:
Electrical transient conduction along
shielded high voltage supply lines only
Vehicules routiers — Perturbations electriques par conduction et par
couplage —
Partie 4: Conduction transitoire electrique seulement le long des
lignes à haute tension blindées
Reference number
ISO/TS 7637-4:2020(E)
ISO 2020
---------------------- Page: 1 ----------------------
ISO/TS 7637-4:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

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Published in Switzerland
ii © ISO 2020 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/TS 7637-4:2020(E)
Contents Page

Foreword ........................................................................................................................................................................................................................................iv

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms and definitions ..................................................................................................................................................................................... 1

4 Test methods ............................................................................................................................................................................................................. 1

4.1 General ........................................................................................................................................................................................................... 1

4.2 Standard test conditions ................................................................................................................................................................. 2

4.3 Ground plane ............................................................................................................................................................................................ 2

4.4 General test setup conditions ..................................................................................................................................................... 2

4.5 Voltage transient emissions test along high voltage supply lines ............................................................... 3

4.5.1 General - Test methodology.................................................................................................................................... 3

4.5.2 Test set-up for emission test .................................................................................................................................. 3

4.5.3 Test procedure for emission test........................................................................................................................ 4

4.6 Transient immunity test along high voltage supply lines .................................................................................. 5

4.6.1 General - Test methodology.................................................................................................................................... 5

4.6.2 Immunity test for pulsed sinusoidal disturbances (pulse A) .................................................... 5

4.6.3 Immunity test for pulsed sinusoidal disturbances (pulse B) .................................................... 9

5 Test instrument description and specifications ...............................................................................................................12

5.1 High voltage artificial network (HV-AN) ........................................................................................................................12

5.2 HV power supply ................................................................................................................................................................................15

5.3 Measurement instrumentation ..............................................................................................................................................15

5.4 Load for high voltage battery or power supply .......................................................................................................16

Annex A (normative) Example of test severity levels associated with functional

performance status classification ...................................................................................................................................................17

Annex B (normative) Transient voltage waveform evaluation ..............................................................................................19

Annex C (informative) Test pulse generators and verification ...............................................................................................22

Bibliography .............................................................................................................................................................................................................................24

© ISO 2020 – All rights reserved iii
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ISO/TS 7637-4:2020(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www .iso .org/ patents).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso .org/

iso/ foreword .html.

This document was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 32,

Electrical and electronic components and general system aspects.
A list of all parts in the ISO 7637 series can be found on the ISO website.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
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TECHNICAL SPECIFICATION ISO/TS 7637-4:2020(E)
Road Vehicles — Electrical disturbance by conduction and
coupling —
Part 4:
Electrical transient conduction along shielded high voltage
supply lines only
1 Scope

This document specifies test methods and procedures to ensure the compatibility to conducted

electrical transients along shielded high voltage supply lines of equipment installed on passenger cars

and commercial vehicles fitted with electrical systems with voltages higher than 60 V d.c. and lower

than 1 500 V d.c. and a power supply isolated from the vehicle body. It describes bench tests for both,

injection and measurement of transients. It is applicable to all types of electrical independent driven,

road vehicles (e.g. battery electrical vehicle (BEV) or hybrid electrical vehicle (HEV), plugin hybrid

electric vehicle (PHEV)).
2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments) applies.

ISO 7637-1, Road vehicles — Electrical disturbances from conduction and coupling — Part 1: Definitions

and general considerations
3 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO 7637-1 apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
4 Test methods
4.1 General

Various types of transients appear on the high voltage supply lines generated by the switching of various

devices. Pulse A represents ringing caused by switching operations of high voltage semiconductors.

Pulse B represents sinusoidal waves generated by harmonics from the grid and revolutions from, for

example, electric propulsion motors.

Methods for measuring the transient emission on shielded high-voltage supply lines and test methods for

the immunity of devices against transients are given in this document. These tests, called "bench tests",

are performed in a laboratory.

The bench-test methods provide comparable and reproducible results between laboratories. They also

give a test basis for the development of devices and systems and may be used during the production phase.

© ISO 2020 – All rights reserved 1
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ISO/TS 7637-4:2020(E)

A bench-test method for the evaluation of the immunity of a device against supply-line transients may

be performed by a test pulse generator. This might not cover all types of transients which can occur in a

vehicle. Therefore, all described test pulses are typical pulses.

In special cases, it may be necessary to apply additional test pulses. However, some test pulses may

be omitted, if a device, depending on its function or its connection, is not influenced by comparable

transients in the vehicle. It is part of the vehicle manufacturer's responsibility to define the test pulses

required for a specific device.
There are two types of disturbances:
— Pulsed sinusoidal disturbances (Waveform A);
— Low frequency sinusoidal disturbances (Waveform B).

Pulsed sinusoidal disturbances on high voltage supply lines are caused by overshoots on square

wave signals, e.g. produced by interaction of switching IGBTs in high voltage systems with parasitic

capacities and inductivities of electrical engine systems, DC-DC-converters and any other kind of high

voltage switching/commutation system. Pulsed sinusoidal disturbances on high voltage supply lines

can be both common mode [line-to-ground (HV+ or/and HV- to ground)] and differential mode [line-to-

line (HV+ to HV-)].

Test pulse A is used for testing high frequency oscillations, e.g. fast switching.

Test pulse B is used to test equipment against transient voltages.

The device under test (DUT) shall be operated under typical conditions which cause the maximum

disturbance and sensitivity during the measurement. This is the worst-case mode for every test and

frequency step. Conditions shall be agreed between the vehicle manufacturer and the supplier and shall

be documented in the test plan.
4.2 Standard test conditions

Standard test conditions according to ISO 7637-1 shall be used for test temperature and supply voltage

(low voltage).

The high supply voltage U can vary in a range from 60 V d.c. up to 1 500 V d.c. The used high voltage and

its allowed tolerances of battery/generator in operation shall be agreed between vehicle manufacturer

and supplier and shall be documented in the test plan.
4.3 Ground plane

The ground plane shall be made of 0,5 mm thick (minimum) copper, brass or galvanized steel.

Unless otherwise specified in the test plan, the minimum width of the ground plane shall be 1 000 mm,

or underneath the entire setup width (excluding power supply and transient pulse generator) plus

200 mm, whichever is larger.

Unless otherwise specified in the test plan, the minimum length of the ground plane shall be 2 000 mm,

or underneath the entire setup length (excluding power supply and transient pulse generator) plus

200 mm, whichever is larger.
4.4 General test setup conditions

The DUT is arranged and connected according to its requirements. The DUT should be connected to the

original operating devices (loads, sensors, etc.) and the test setup described in 4.5.2, 4.6.2.1 and 4.6.3.1

shall be used, unless otherwise agreed between the vehicle manufacturer and the supplier.

If the actual DUT operating signal sources are not available, they may be simulated.

2 © ISO 2020 – All rights reserved
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ISO/TS 7637-4:2020(E)

Unless otherwise specified in the test plan, all loads, sensors, grounds (lines, metallic cases) are

connected to the ground plane.

To minimize extraneous capacitive coupling to the DUT, it is advisable that the minimum distance

between the DUT and all other conductive structures, such as walls of a shielded enclosure (with the

exception of the ground plane underneath the test setup), should be more than 0,5 m.

4.5 Voltage transient emissions test along high voltage supply lines
4.5.1 General - Test methodology

A DUT which is considered as a potential source of conducted disturbances shall be tested according to

the procedure described in this clause.

Transients shall be measured between HV+ and HV- (line-to-line) and between HV+ respectively HV-

and ground (line-to-ground).

Care shall be taken to ensure that the surrounding electromagnetic environment does not interfere

with the measurement set-up.
4.5.2 Test set-up for emission test

Voltage transients from the DUT, are measured using a high voltage artificial network (HV-AN) (see 5.1)

to standardize the impedance loading on the DUT. The DUT is connected via the artificial network to

the high voltage power supply (see 5.2) as given in Figure 1.
+200

The length of the high voltage supply line shall be (500 ) mm, if not otherwise specified in the test

plan. The used cable length shall be documented in the test report.

Ground connection of DUT shall be connected to ground plane. The default length is (200 ±50) mm, if

not otherwise specified in the test plan. If the DUT has a metallic case, this case shall be bonded to the

ground plane. The DC resistance of the ground connection shall not exceed 2,5 mΩ.

The DUT shall be placed on the ground plane as in the vehicle application. If no other requirements are

specified the DUT and all wiring connections between artificial network and DUT shall be placed on a

non-conductive, low relative permittivity (dielectric-constant) material (ε ≤ 1,4), at (50 ± 5) mm above

the ground plane.

Supply voltage U and the disturbance voltage shall be measured close to the DUT terminals using a

voltage probe and oscilloscope or waveform acquisition equipment at the power supply terminals (see

Figure 1).
© ISO 2020 – All rights reserved 3
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ISO/TS 7637-4:2020(E)
Key
1 high voltage power supply (optional: shielded and / or filtered)
2 load for high voltage battery (if necessary, see 5.4)
3 high voltage artificial network (HV-AN)
4 DUT
5 ground plane
6 high voltage supply line
7 ground connection
8 50 Ω termination
9 oscilloscope or waveform acquisition equipment
10 high voltage differential probe

Figure 1 — Transient emission test set-up to measure voltage ripple along high voltage

supply lines

Figure 1 shows the test setup for the measurement between HV+ and HV-. For measurement between

HV+ and ground or HV- and ground the other terminal of the voltage probe shall be connected to ground.

4.5.3 Test procedure for emission test

The various operating modes and the conditions of the DUT shall be considered for the measurements

and specified in the test plan.

The measured transients shall be evaluated according to Annex B. The results shall be documented in

the test report.

The voltage amplitude and transient parameters (rise time, fall time, transient duration) shall be

recorded and documented in the test report.
4 © ISO 2020 – All rights reserved
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ISO/TS 7637-4:2020(E)
4.6 Transient immunity test along high voltage supply lines
4.6.1 General - Test methodology
4.6 provides the test setup and procedure for testing transient immunity.

If not otherwise specified, all transient tests shall be performed between HV+ and HV- (line-to-line) and

between HV+ respectively HV- and ground (line-to-ground).
4.6.2 Immunity test for pulsed sinusoidal disturbances (pulse A)

4.6.2.1 Test set-up for immunity test for pulsed sinusoidal disturbances (pulse A)

Figure 2 shows the test setup for coupling between HV+ and HV-.

Figure 3 shows an example of test set-up for coupling between HV+ and ground. The lower terminal

of generator shall be connected to ground. The upper terminal shall be connected to HV+ via the HV-

AN (as shown in Figure 3) or respectively to HV-. The corresponding voltage probe terminal shall be

connected to HV+ respectively to HV-; the other voltage probe terminal shall be connected to ground.

+200

The length of the high voltage supply line shall be (500 ) mm, if not otherwise specified in the test

plan. The used cable length shall be documented in the test report.

Ground connection of DUT shall be connected to ground plane. The default length is (200 ±50) mm, if

not otherwise specified in the test plan. If the DUT has a metallic case, this case shall be bonded to the

ground plane. The DC resistance of the ground connection shall not exceed 2,5 mΩ.

The DUT shall be placed on the ground plane as in the vehicle application. If no other requirements are

specified the DUT and all wiring connections between artificial network and DUT shall be placed on a

non-conductive, low relative permittivity (dielectric-constant) material (ε ≤ 1,4), at (50 ± 5) mm above

the ground plane.
For sine wave generator description/characteristics see C.2.
© ISO 2020 – All rights reserved 5
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ISO/TS 7637-4:2020(E)
Key
1 high voltage power supply (optional: shielded and /
...

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