ISO 20794-7:2020
(Main)Road vehicles — Clock extension peripheral interface (CXPI) — Part 7: Data link and physical layer conformance test plan
Road vehicles — Clock extension peripheral interface (CXPI) — Part 7: Data link and physical layer conformance test plan
This document specifies the conformance test plans for the CXPI data link layer and the CXPI physical layer. It also specifies the conformance test plan for error detection. Additionally, this document describes the concept of conformance test plan operation.
Véhicules routiers — Interface périphérique d’extension d'horloge (CXPI) — Partie 7: Plan de test de conformité des couches de liaison de données et physique
General Information
Standards Content (Sample)
INTERNATIONAL ISO
STANDARD 20794-7
First edition
2020-10
Road vehicles — Clock extension
peripheral interface (CXPI) —
Part 7:
Data link and physical layer
conformance test plan
Véhicules routiers — Interface périphérique d’extension d'horloge
(CXPI) —
Partie 7: Plan de test de conformité des couches de liaison de données
et physique
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
Contents Page
Foreword .vi
Introduction .vii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Symbols and abbreviated terms . 1
4.1 Symbols . 1
4.2 Abbreviated terms . 2
5 Conventions . 3
6 General test specification considerations . 3
6.1 General . 3
6.2 Test conditions . 4
6.3 IUT requirements. 4
6.4 CTC definition . 4
6.5 Test system set-up . 5
6.6 Configuration of test system and IUT . 6
6.6.1 General. 6
6.6.2 IUT-specific set-up parameters . 7
6.6.3 Default configurations . 8
6.6.4 L_ErrDet1 configurations . 8
6.6.5 L_ErrDet2 configurations . 8
6.6.6 L_Arbit configurations . . 8
6.6.7 L_Unknown configurations . 8
6.7 SUT initialisation . 8
6.8 Additional test system set-up capabilities . 9
6.8.1 CXPI network data generator . 9
6.8.2 TXD data generator .11
6.8.3 TX data generator .13
PWM
6.8.4 RX data generator .14
PWM
6.8.5 Other requirements .16
7 Data link layer conformance test plan .16
7.1 General .16
7.2 CTP – Timing parameters .16
7.2.1 2.CTC_1.1 – IBS length .16
7.2.2 2.CTC_1.2 – IFS length .17
7.2.3 2.CTC_1.3 – Frame reception starting condition 1 without the error bit .18
7.2.4 2.CTC_1.4 – Frame reception starting condition 1 with the error bit .18
7.2.5 2.CTC_1.5 – Frame reception starting condition 2 without the error bit .19
7.2.6 2.CTC_1.6 – Frame reception starting condition 2 with the error bit .20
7.2.7 2.CTC_1.7 – Frame reception starting condition 3 .20
7.2.8 2.CTC_1.8 – Maximum length of the frame .21
7.3 CTP – Frame transmission/reception .22
7.3.1 2.CTC_2.1 – Response to L_PID field.22
7.3.2 2.CTC_2.2 – L_PID field transmission .23
7.3.3 2.CTC_2.3 – L_PTYPE field transmission .23
7.3.4 2.CTC_2.4 – L_PTYPE field response function .24
7.3.5 2.CTC_2.5 – L_FI_DLC ≠ 1111 and frame data verification 1.25
7.3.6 2.CTC_2.6 – L_FI_DLC ≠ 1111 and frame data verification 2 if DLC is
1101 or 1110 (Ftype = NormalCom) .26
2 2
7.3.7 2.CTC_2.7 – L_FI_DLC = 1111 /L_FI_DLCext ≥ 0 and frame data verification .27
7.3.8 2.CTC_2.8 – Given CRC of frame with L_FI_DLC ≠ 1111 .28
7.3.9 2.CTC_2.9 – Given CRC of frame with L_FI_DLC = 1111 /L_FI_DLCext ≥ 0 .29
7.3.10 2.CTC_2.10 – Frame transmission completion .30
7.3.11 2.CTC_2.11 – Frame reception completion .30
7.4 CTP – Network access .31
7.4.1 2.CTC_3.1 – Arbitration function 1 (arbitration by using carrier sense) .31
7.4.2 2.CTC_3.2 – Arbitration function 2 (IUT loses arbitration and transitions
into receiving state).32
7.5 CTP – Error detection .33
7.5.1 2.CTC_4.1 – Byte error .33
7.5.2 2.CTC_4.2 – CRC error .35
7.5.3 2.CTC_4.3 – Parity error of the L_PID field without the error bit .36
7.5.4 2.CTC_4.4 – Parity error of the L_PID field with the error bit .37
7.5.5 2.CTC_4.5 – Parity error of the L_PTYPE field without the error bit .37
7.5.6 2.CTC_4.6 – Parity error of the L_PTYPE field with the error bit .38
7.5.7 2.CTC_4.7 – Data length code error with L_FI_DLC ≠ 1111 .39
7.5.8 2.CTC_4.8 – Data length error with L_FI_DLC = 1111 /L_FI_DLCext ≥ 0 .40
7.5.9 2.CTC_4.9 – Data length code error L_FI_DLC ≠ 1111 and if DLC is 1101
2 2
or 1110 (Ftype = DiagNodeCfg) .41
7.5.10 2.CTC_4.10 – Data length code error L_FI_DLC = 1111 /L_FI_DLCext ≤ 12
(Ftype = DiagNodeCfg) .42
7.5.11 2.CTC_4.11 – Framing error in receiving node .43
7.5.12 2.CTC_4.12 – Framing error in transmitting node .44
7.5.13 2.CTC_4.13 – Ignore error (no support of L_FI_DLC = 1111 ) .44
8 Physical layer conformance test plan (PMA – PS separate type) .45
8.1 CTP – Operational conditions and calibration .45
8.1.1 Initial configuration.45
8.1.2 1.CTC_1.1 – Clock transmission 1 .46
8.1.3 1.CTC_1.2 – Clock transmission 2 .47
8.1.4 1.CTC_1.3 – Clock transmission 3 .49
8.1.5 1.CTC_1.4 – Detection of clock existence .51
8.1.6 1.CTC_1.5 – Arbitration function (stop transmission by arbitration) .52
8.1.7 1.CTC_1.6 – Operating voltage range .54
8.1.8 1.CTC_1.7 – Bit synchronisation .55
8.2 CTP – Wake-up pulse .57
8.2.1 General.57
8.2.2 1.CTC_2.1 – Wake-up pulse reception 1, IUT as master node .57
8.2.3 1.CTC_2.2 – Wake-up pulse reception 2, IUT as slave node .59
8.2.4 1.CTC_2.3 – Wake-up pulse transmission .61
8.3 CTP – Voltage and duty cycle thresholds .63
8.3.1 General.63
8.3.2 Voltage threshold test set-up .63
8.3.3 1.CTC_3.1 – Voltage threshold test 1 .63
8.3.4 1.CTC_3.2 – Voltage threshold (V up) test 2 .64
Dom_TS
8.3.5 1.CTC_3.2 – Voltage threshold test 2 .66
8.3.6 1.CTC_3.3 – Duty cycle threshold test 1 .67
8.3.7 1.CTC_3.4 – Duty cycle threshold test 2 .68
8.4 CTP – Network state current characteristics .69
8.4.1 1.CTC_4.1 – Drive current test .69
8.4.2 1.CTC_4.2 – Input leakage test .71
8.4.3 1.CTC_4.3 – Reverse leakage current test .72
8.5 CTP – Physical signal slope control .73
8.5.1 1.CTC_5.1 – Duty cycle measurement 1 .73
8.5.2 1.CTC_5.2 – Duty cycle measurement 2 .75
8.5.3 1.CTC_5.3 – Duty cycle measurement 3 .77
8.5.4 1.CTC_5.4 – Propagation delay of the receiver test .78
8.5.5 1.CTC_5.5 – Propagation delay of the transmitter test .80
8.5.6 1.CTC_5.6 – Propagation delay of the transmitter test 2 .82
8.5.7 1.CTC_5.7 – Loop back time test .84
8.6 CTP – GND/V shift test .85
BAT
iv © ISO 2020 – All rights reserved
8.6.1 GND/V shift test set-up .85
BAT
8.6.2 1.CTC_6.1 – GND shift test .86
8.6.3 1.CTC_6.2 – V shift test .87
BAT
8.7 CTP – Loss of power supply .88
8.7.1 Loss of battery and Loss of GND test set-up . .88
8.7.2 1.CTC_7.1 – Loss of battery test (V ) .89
BAT
8.7.3 1.CTC_7.2 – Loss of GND test .90
8.8 CTP – Internal static capacity .91
8.8.1 Internal static capacity test set-up .91
8.8.2 1.CTC_8.1 Internal static capacity .92
8.9 CTP – Internal resistance measurement during operation .94
8.9.1 Internal resistor measurement test set-up .94
8.9.2 1.CTC_9.1– Internal resistor measurement 1 .95
8.9.3 1.CTC_9.2– Internal resistor measurement 2 .96
9 Physical layer conformance test plan (PS –PMA non-separate type) .97
9.1 CTP – Operational conditions and calibration .97
9.1.1 1.CTC_10.1 – Clock transmission .97
9.1.2 1.CTC_10.2 – Detection of clock existence .99
9.1.3 1.CTC_10.3 – Arbitration function (stop transmission by arbitration) .100
9.1.4 1.CTC_10.4 – Operating voltage range .101
9.2 CTP – Wake-up pulse .102
9.2.1 General.102
9.2.2 1.CTC_11.1 – Wake-up pulse reception, IUT as master node .102
9.2.3 1.CTC_11.2 – Wake-up by clock detection .103
9.2.4 1.CTC_11.3 – Wake-up pulse transmission.104
9.3 CTP – Voltage and duty cycle thresholds .105
9.3.1 General.105
9.3.2 1.CTC_12.1 – Voltage threshold test 1 .105
9.3.3 1.CTC_12.2 – Voltage threshold test 2 .107
9.3.4 1.CTC_12.3 – Duty cycle threshold test 1 .108
9.3.5 1.CTC_12.4 – Duty cycle threshold test 2 .111
9.4 CTP – Network state current characteristics .112
9.4.1 1.CTC_13.1 – Drive current test .112
9.4.2 1.CTC_13.2 – Input leakage test .114
9.4.3 1.CTC_13.3 – Reverse leakage current test .115
9.5 CTP – Physical signal slope control .116
9.5.1 1.CTC_14.1 – Duty cycle measurement 1 .116
9.5.2 1.CTC_14.2 – Duty cycle measurement 2 .118
9.6 CTP – GND/V shift test .120
BAT
9.6.1 GND/V shift test set-up .120
BAT
9.6.2 1.CTC_15.1 – GND shift test.121
9.6.3 1.CTC_15.2 – V shift test .122
BAT
9.7 CTP – Loss of power supply .123
9.7.1 General.123
9.7.2 Loss of battery (V ) and GND test set-up .123
BAT
9.7.3 1.CTC_16.1 – Loss of battery test (V ) .124
BAT
9.7.4 1.CTC_16.2 – Loss of GND test .125
9.8 CTP – Internal static capacity .126
9.8.1 Internal static capacity test set-up .126
9.8.2 1.CTC_17.1 Internal static capacity .127
9.9 CTP – Internal resistance measurement during operation .129
9.9.1 Internal resistor measurement test set-up .129
9.9.2 1.CTC_18.1– Internal resistor measurement 1 .130
9.9.3 1.CTC_18.2– Internal resistor measurement 2 .131
Bibliography .133
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www .iso .org/ iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 31,
Data communication.
A list of all parts in the ISO 20794 series can be found on the ISO website.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
vi © ISO 2020 – All rights reserved
Introduction
ISO 20794 (all parts) specifies the application (partly), application layer, transport layer, network
layer, data link layer, and physical layer requirements of an in-vehicle network called clock extension
peripheral interface (CXPI).
CXPI is an automotive low-speed single wire network. It is an enabler for reducing vehicle weight and
fuel consumption by reducing wire counts to simple devices like switches and sensors.
CXPI serves as and is designed for automotive control applications, for example door control group,
light switch and HVAC (Heating Ventilation and Air Condition) systems.
The CXPI services, protocols and their key characteristics are specified in different parts according to
the OSI layers.
— Application and application layer:
— application measurement and control data communication to exchange information between
applications in different nodes based on message communication;
— wake-up and sleep functionality;
— two kinds of communication methods can be selected at system design by each node:
i) the event-triggered method, which supports application measurement- and control-based
(event-driven) slave node communication; and
ii) the polling method, which supports slave node communication based on a periodic master
schedule;
— performs error detection and reports the result to the application;
— application error management.
— Transport layer and network layer:
— transforms a message into a single packet;
— adds protocol control information for diagnostic and node configuration into each packet;
— adds packet identifier for diagnostic and node configuration into each packet;
— performs error detection and reports the result to higher OSI layers.
— Data link layer and physical layer:
— provides long and short data frames;
— adds a frame identifier into the frame;
— adds frame information into the frame;
— adds a cyclic redundancy check into the frame;
— performs byte-wise arbitration and reports the arbitration result to higher OSI layers;
— performs frame type detection in reception function;
— performs error detection and reports the result to higher OSI layers;
— performs Carrier Sense Multiple Access (CSMA);
— performs Collision Resolution (CR);
— generates a clock, which is transmitted with each bit to synchronise the connected nodes on the
CXPI network;
— supports bit rates up to 20 kbit/s.
To achieve this, it is based on the Open Systems Interconnection (OSI) Basic Reference Model specified
[1] [2]
in ISO/IEC 7498-1 and ISO/IEC 10731 , which structures communication systems into seven layers.
Figure 1 illustrates an overview of communication frameworks beyond the scope of this document
including related standards:
[7]
— vehicle normal communication framework, which is composed of ISO 20794-2, and ISO 20794-5 ;
[3] [4]
— vehicle diagnostic communication framework, which is composed of ISO 14229-1 , ISO 14229-2 ,
[5]
and ISO 14229-8 ;
[9]
— presentation layer standards, e.g. vehicle manufacturer specific or ISO 22901-1 ODX ;
[6]
— lower OSI layers framework, which is composed of ISO 20794-3 , ISO 20794-4, ISO 20794-5,
[8]
ISO 20794-6 and this document.
[5]
ISO 20794 (all parts) and ISO 14229-8 are based on the conventions specified in the OSI Service
[2]
Conventions (ISO/IEC 10731 ) as they apply for all layers and the diagnostic services.
Figure 1 — ISO 20794 documents reference according to OSI model
viii © ISO 2020 – All rights reserved
INTERNATIONAL STANDARD ISO 20794-7:2020(E)
Road vehicles — Clock extension peripheral interface
(CXPI) —
Part 7:
Data link and physical layer conformance test plan
1 Scope
This document specifies the conformance test plans for the CXPI data link layer and the CXPI physical
layer. It also specifies the conformance test plan for error detection.
Additionally, this document describes the concept of conformance test plan operation.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO/IEC 7498-1:1994, Information processing systems — Open systems interconnection — Basic
reference model
ISO 20794-2:2020, Road vehicles — Clock extension peripheral interface (CXPI) — Part 2: Application layer
ISO 20794-4:2020, Road vehicles — Clock extension peripheral interface (CXPI) — Part 4: Data link layer
and physical layer
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 20794-2, ISO 20794-4 and
ISO/IEC 7498-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
4 Symbols and abbreviated terms
4.1 Symbols
--- empty cell/undefined
C total bus capacitance
BUS
C capacity of pulse generator/data generator
PG
C capacity of slave node
SLAVE
kbit/s kilobit per second
R master node resistor
MASTER
R slave node resistor
SLAVE
t bit time
bit
t difference of the dominant time between logical value 1 and logical value 0
rx_dif_cont
t time that the receiving clock master detects the width of dominant level as the wake-up pulse
rx_wakeup_clk
t time that the receiving node detects each width of dominant level in the wake-up pulse
rx_wakeup
from first dominant pulse
t limitation time of acceptance second dominant pulse in the wake-up pulse from first
rx_wakeup_space
dominant pulse
t time that the transceiver node transmits the dominant voltage of the wake-up pulse
tx_wakeup
t interval time between two of dominant level of transmitting wake-up pulse
tx_wakeup_space
t dominant time of logical value 0
tx_0_lo
t dominant time of logical value 0 (TH = 30 % of V )
tx_0_lo_dom tx_dom SUP
t dominant time of logical value 0 (TH = 70 % of V )
tx_0_lo_rec tx_rec SUP
t at the time of logical value 0 outputs, time from the LO level detection of the CXPI network
tx_0_pd
until falling the voltage TH = 30 % of V
tx_dom SUP
t dominant time of logical value 1
tx_1_lo
t dominant time of logical value 1 (TH = 30 % of V )
tx_1_lo_dom tx_dom SUP
t dominant time of logical value 1 (TH = 70 % of V )
tx_1_lo_rec tx_rec SUP
TH dominant threshold voltage of the driver node
tx_dom
TH recessive threshold voltage of the driver node
tx_rec
V voltage of CXPI network
BUS
V centre recessive threshold voltage of the received node
BUS_CNT
V hysteresis voltage between the recessive threshold voltage and the dominant threshold
HYS
voltage of the received node
V measured value of the dominant threshold voltage of the received node
th_dom
V measured value of the recessive threshold voltage of the received node
th_rec
V maximum recessive level of logical value 1
rec_master
4.2 Abbreviated terms
AC alternating current
CRC cyclic redundancy check
DLC data length code
2 © ISO 2020 – All rights reserved
DLL data link layer
ECU electronic control unit
FI frame information
HI high
IBS inter byte space
ID identifier
IFS inter frame space
LO low
N/A not applicable
NM network management
OSI open systems interconnection
PID protected identifier
PHY physical layer
PMA physical media attachment
PMD physical media dependent
PS physical signalling
PWM pulse width modulation
RX PMA receiver interface signal
PWM
SUT system under test
TH threshold
TX PMA transmits interface signal
PWM
TYPE frame type
5 Conventions
[2] [1]
This document is based on OSI service conventions as specified in ISO/IEC 10731 and ISO/IEC 9646-1
for conformance test system set-up.
6 General test specification considerations
6.1 General
This document covers the conformance test cases (CTC) to verify the requirements described in
ISO 20794-4:2020 data link layer and physical layer document.
6.2 Test conditions
Tests can be performed at room temperature, if the temperature is in the range of 15° C to 35° C. Also,
the tests shall be performed under room EMI (electro-magnetic interference) conditions.
6.3 IUT requirements
The occurrence of the error specified in ISO 20794-2:2020, 9.6.8 shall be notified to the other nodes.
IUT shall be initialised in the test case respectively.
6.4 CTC definition
The definition of each test case specifies, whether the IUT is a master or slave node. Each CTC is defined
in the structure as defined in Table 1.
Table 1 — CTC definition example
Item Content
CTC # – Title [OSI layer #].CTC_[number_name]
E.g. 2.CTC_2.6 – L_FI_DLC ≠ 1111 and frame data verification 2 if DLC is 1101 or 1110
2 2 2
Purpose This CTC verifies that the DLC field for the frame of L_FI_DLC ≠ 1111 complies with the CXPI
specification.
Reference ISO 20794-4:2020:
— REQ 2.10 DLL – L_FI_DLC (data length code);
— REQ 2.30 DLL – Function models – DLL – Transmission logic;
— REQ 2.31 DLL – Function models – DLL – Reception logic.
Prerequisite The test system set-up shall be in accordance with Figure 2.
Set-up — The IUT shall be configured as a master node or a slave node.
— The IUT shall be configured to L_ErrDet1 (see 6.6.4) and in addition support
TST_FRM_01_REQ_PID, TST_FRM_11_RESP_12, TST_FRM_05_REQ_PID_ERRBIT, and
TST_FRM_18_RESP_ERRBIT_0-12.
— The bit rate shall be set to the default value (see 6.6.2).
— The SUT shall be initialised to default (see 6.7).
Step 1. The LT shall transmit TST_FRM_01_REQ_PID and TST_FRM_11_RESP_12 changing the
DLC value as specified in Table 22.
2. The IUT does not detect any error and reports the result to higher OSI layers.
3. The LT shall transmit TST_FRM_05_REQ_PID_ERRBIT (refer to remark 1).
4. The IUT transmits TST_FRM_05_REQ_PID_ERRBIT (refer to remark 2) and
TST_FRM_18_RESP_ERRBIT_0-12.
5. The LT shall observe TST_FRM_18_RESP_ERRBIT_0-12 with the result of detect error bit
on the CXPI network.
Iteration Steps are executed for each test case specified in Table 22;
REPEAT step 1 to step 5, 2 times;
The LT shall set L_FI_DLC as specified in Table 22;
REPEAT END.
Expected After step 1: The IUT receives TST_FRM_11_RESP_12 as 12 data bytes regardless of
response L_FI_DLC value.
After step 4: The IUT transmits TST_FRM_18_RESP_ERRBIT_0-12 with the error bit = FALSE.
4 © ISO 2020 – All rights reserved
Table 1 (continued)
Item Content
After step 5: The LT shall receive TST_FRM_18_RESP_ERRBIT_0-12 with the error bit =
FALSE.
Remark 1. If the IUT transmits the TST_FRM_18_RESP_ERRBIT_0-12 then the LT is expected to
transmit this TST_FRM_05_REQ_PID_ERRBIT message.
2. Step 4 can be skipped if step 3 is required.
6.5 Test system set-up
The test system set-up follows the ISO/IEC 9646-1 and consists of a test system and a system under
test (SUT) connected via the physical medium. The test system implements an UT and a LT. The UT
uses the test control protocol (see Figure 2, key 2) to control the LT. The LT supports the functionality
required to test the OSI layers (see Figure 2, key 4) of the IUT. The test system uses the IUT-specific set-
up parameters (see Figure 2, key 1) for testing the communication with the IUT.
The control and measurement functionality is provided by direct access to the service interface (see
Figure 2, key 3) and the associated parameters of the OSI layers as specified in the ISO 20794 series. The
conformance test controller manipulates the service interface parameters of the OSI layers to fulfil the
purpose of each conformance test case (CTC). The test system ensures the precision of the bit time and
bit synchronisation of the master node as specified in ISO 20794-4:2020, 9.3.7. If the IUT is a master node
then the LT functions as a slave node. If the IUT is a slave node then the LT functions as a master node.
Key
1 set-up parameters (CXPI node's electronic data sheet)
2 test control protocol
3 abstract service primitives (ASPs) based on enhanced testability services (ETS) and points of control and
observation (PCO)
4 upper tester application test stub
Figure 2 — Test system set-up
6.6 Configuration of test system and IUT
6.6.1 General
The test system requires set-up parameters (see Figure 2 key 1), which specify data link layer and
physical layer properties of the IUT. The IUT-specific data sheet (see Figure 2, key 1) includes set-up
parameters, which the test system requires to perform the CTCs.
Table 2 specifies the configuration of test system and the IUT in the CTCs. In each CTC description,
configuration is specified in the 'configuration' column.
6 © ISO 2020 – All rights reserved
Table 2 — Configuration of test system and IUT
Configuration item Configuration of test system and IUT
Default L_ErrDet1 L_ErrDet2 L_Arbit L_Unknown
Request identifier by test system N/A N/A N/A Higher priority N/A
L_PID Any valid Any valid Any invalid Any valid Any invalid
IBS Less than 9-bit length and more than 1-bit length
TST_FRM_05_REQ_PID_ERRBIT N/A Use Use N/A N/A
Table 3 specifies test message names, which are used by the IUT and the test system in the CTCs. In
each CTC description, the message setting is specified in the 'description' column. The configuration
described is a suitable configuration for each CTC. If there is no reference to Table 3, the settings are
specified in the CTC.
If the IUT is not able to support the given FrameId, it is possible to replace the given FrameId with the
FrameId that the IUT can handle.
All frames used are selected so that they should be valid for the IUT. If the specification does not specify
the direction (transmission or reception) of frame transfer, the IUT shall have both transmission and
reception ability in principle.
Table 3 — Configuration of test frame used by IUT and test system
Name Definition
TST_FRM_00_REQ_PTYPE Test frame 00 of master node including a PtypeId value (00 ) of L_ReqId.
16 16
TST_FRM_01_REQ_PID Test frame 01 of master or slave node including an L_PID value (01 to
16 16
7F ,) of L_ReqId.
TST_FRM_03_REQ_PID_UNKNOWN Test frame 03 of master or slave node including an unknown L_PID
value of L_ReqId (not defined for reception/transmission by IUT).
TST_FRM_05_REQ_PID_ERRBIT Test frame 05 of master or slave node including an error bit L_PID value
(01 to 7F ,) of L_ReqId.
16 16
The value of this PID can use supplier-specific ReqId (3F ).
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.