ISO/IEC 10373-7:2001
(Main)Identification cards — Test methods — Part 7: Vicinity cards
Identification cards — Test methods — Part 7: Vicinity cards
Cartes d'identification — Méthodes d'essai — Partie 7: Cartes de voisinage
General Information
Relations
Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 10373-7
First edition
2001-05-15
Identification cards — Test methods —
Part 7:
Vicinity cards
Cartes d'identification — Méthodes d'essai —
Partie 7: Cartes de voisinage
Reference number
ISO/IEC 10373-7:2001(E)
©
ISO/IEC 2001
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ISO/IEC 10373-7:2001(E)
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ii © ISO/IEC 2001 – All rights reserved
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ISO/IEC 10373-7:2001(E)
Contents Page
Foreword.v
1 Scope .1
2 Normative references .1
3 Terms and definitions, abbreviations and symbols.2
3.1 Terms and definitions .2
3.2 Abbreviations and symbols.2
4 Default items applicable to the test methods .2
4.1 Test environment.2
4.2 Pre-conditioning .2
4.3 Default tolerance.3
4.4 Spurious Inductance .3
4.5 Total measurement uncertainty .3
5 Static electricity test.3
5.1 Apparatus .3
5.2 Procedure .4
5.3 Test report .4
6 Test apparatus and test circuits.5
6.1 Calibration coil.5
6.1.1 Size of the Calibration coil card .5
6.1.2 Thickness and material of the Calibration coil card .5
6.1.3 Coil characteristics.5
6.2 Test VCD assembly.6
6.2.1 Test VCD antenna .6
6.2.2 Sense coils .6
6.2.3 Assembly of test VCD .7
6.3 Reference VICCs.7
6.3.1 Reference VICC for VCD power.7
6.3.2 Reference VICC for load modulation test.7
6.3.3 Dimensions of the Reference VICCs.8
6.3.4 Thickness of the Reference VICC board .8
6.3.5 Coil characteristics.8
6.4 Digital sampling oscilloscope .8
7 Functional test - VICC .8
7.1 Purpose.8
7.2 Test procedure.8
7.3 Test report .9
8 Functional test - VCD .9
8.1 VCD field strength and Power transfer.9
8.1.1 Purpose.9
8.1.2 Test procedure.9
8.1.3 Test report .10
8.2 Modulation index and waveform.10
8.2.1 Purpose.10
8.2.2 Test procedure.10
8.2.3 Test report .10
8.3 Load modulation reception (informative only) .10
Annex A (normative) Test VCD Antenna.11
A.1 Test VCD Antenna layout including impedance matching network.11
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ISO/IEC 10373-7:2001(E)
A.2 Impedance matching network .13
Annex B (informative) Test VCD Antenna tuning.14
Annex C (normative) Sense coil .16
C.1 Sense coil layout.16
C.2 Sense coil assembly.17
Annex D (normative) Reference VICC for VCD power test .18
Annex E (informative) Reference VICC for load modulation test .19
Annex F (informative) Program for evaluation of the spectrum.20
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ISO/IEC 10373-7:2001(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission)
form the specialized system for worldwide standardization. National bodies that are members of ISO or IEC
participate in the development of International Standards through technical committees established by the
respective organization to deal with particular fields of technical activity. ISO and IEC technical committees
collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in
liaison with ISO and IEC, also take part in the work.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 3.
In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
Draft International Standards adopted by the joint technical committee are circulated to national bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this part of ISO/IEC 10373 may be the subject of
patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
International Standard ISO/IEC 10373-7 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information
technology, Subcommittee SC 17, Identification cards and related devices.
ISO/IEC 10373 consists of the following parts, under the general title Identification cards — Test methods:
— Part 1: General characteristics tests
— Part 2: Cards with magnetic stripes
— Part 3: Integrated circuit(s) cards with contacts and related interface devices
— Part 4: Close-coupled cards
— Part 5: Optical memory cards
— Part 6: Proximity cards
— Part 7: Vicinity cards
Annexes A, C and D form a normative part of this part of ISO/IEC 10373. Annexes B, E and F are for information
only.
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INTERNATIONAL STANDARD ISO/IEC 10373-7:2001(E)
Identification cards — Test methods —
Part 7:
Vicinity cards
1 Scope
This International Standard defines test methods for characteristics of identification cards according to the definition
given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which may be
ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies
employed in identification cards applications.
NOTE Criteria for acceptability do not form part of this International Standard but will be found in the International
Standards mentioned above.
NOTE Test methods described in this International Standard are intended to be performed separately. A given card is not
required to pass through all the tests sequentially.
This part of ISO/IEC 10373 deals with test methods, which are specific to contactless integrated circuit(s) cards
technology (vicinity cards). ISO/IEC 10373-1, General characteristics, deals with test methods which are common
to one or more ICC technologies and other parts deal with other technology-specific tests.
Unless otherwise specified, the tests in this part of ISO/IEC 10373 shall be applied exclusively to Vicinity cards
defined in ISO/IEC 15693-1 and ISO/IEC 15693-2.
2 Normative references
The following normative documents contain provisions which, through reference in this text, constitute provisions of
this part of ISO 10373. For dated references, subsequent amendments to, or revisions of, any of these publications
do not apply. However, parties to agreements based on this part of ISO 10373 are encouraged to investigate the
possibility of applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of ISO and IEC maintain
registers of currently valid International Standards.
ISO/IEC 7810, Identification cards – Physical characteristics.
ISO/IEC 15693-1:2000, Identification cards — Contactless integrated circuit(s) cards — Vicinity cards — Part 1:
Physical characteristics.
ISO/IEC 15693-2:2000, Identification cards — Contactless integrated circuit(s) cards — Vicinity cards — Part 2: Air
interface and initialization.
ISO/IEC 15693-3:2001, Identification cards — Contactless integrated circuit(s) cards — Vicinity cards — Part 3:
Anti-collision and transmission protocol.
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) — Part 4: Testing and measurement techniques —
Section 2: Electrostatic discharge immunity test.
BIPM, IEC, IFCC, ISO, IUPAC, IUPAP, OIML, 1993, Guide to the Expression of Uncertainty in Measurement (Gum).
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ISO/IEC 10373-7:2001(E)
3 Terms and definitions, abbreviations and symbols
For the purposes of this part of ISO 10373, the following terms and definitions and abbreviations apply.
3.1 Terms and definitions
3.1.1
base standard
standard which the test method is used to verify conformance to
3.1.2
testably functional
surviving the action of some potentially destructive influence to the extent that any integrated circuit(s) present in
1)
the card continues to show a response as defined in ISO/IEC 15693-3 which conforms to the base standard
NOTE If other technologies exist on the same card they shall be testably functional in accordance with their respective
standard.
3.1.3
test method
method for testing characteristics of identification cards for the purpose of confirming their compliance with
International Standards
3.2 Abbreviations and symbols
DUT Device under test
ESD Electrostatic Discharge
fc Frequency of the operating field
fs1, fs2 Frequencies of the subcarriers
H Maximum fieldstrength of the VCD antenna field
max
H Minimum fieldstrength of the VCD antenna field
min
VCD Vicinity Coupling Device
VICC Vicinity Card
4 Default items applicable to the test methods
4.1 Test environment
Unless otherwise specified, testing shall take place in an environment of temperature 23 °C� 3 °C(73 °F� 5 °F)
and of relative humidity 40 % to 60 %.
4.2 Pre-conditioning
Where pre-conditioning is required by the test method, the identification cards to be tested shall be conditioned to
the test environment for a period of 24 h before testing.
1) This International Standard does not define any test to establish the complete functioning of integrated circuit(s) cards. The
test methods require only that the minimum functionality (testably functional) be verified. This may, in appropriate
circumstances, be supplemented by further, application specific functionality criteria which are not available in the general case.
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ISO/IEC 10373-7:2001(E)
4.3 Default tolerance
Unless otherwise specified, a default tolerance of� 5 % shall be applied to the quantity values given to specify the
characteristics of the test equipment (e.g. linear dimensions) and the test method procedures (e.g. test equipment
adjustments).
4.4 Spurious Inductance
Resistors and capacitors should have negligible inductance.
4.5 Total measurement uncertainty
The total measurement uncertainty for each quantity determined by these test methods shall be stated in the test
report.
Basic information is given in Gum, 1993.
5 Static electricity test
The purpose of this test is to check the behavior of the card IC in relation to electrostatic discharge (ESD) exposure
of the test sample. The card under test is exposed to a simulated electrostatic discharge (ESD, human body model)
and its basic operation checked following the exposure.
Discharge tip
ESD gun
VICC
0,5mm thick insulating support
Horizontal coupling conductive
plane on wooden table, 0,8m
high, standing on ground
reference plane
Figure 1 — ESD test circuit
5.1 Apparatus
Refer to IEC 61000-4-2:1995.
a) Main specifications of the ESD generator
� energy storage capacitance: 150 pF � 10 %
� discharge resistance: 330 Ohm � 10 %
� charging resistance: between 50 MOhm and 100 MOhm
� rise time: 0,7 to 1 ns
b) Selected specifications from the optional items
� type of equipment: table top equipment
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ISO/IEC 10373-7:2001(E)
� discharge method: direct and contact discharge to the equipment under test
� discharge electrodes of the ESD generator: Round tip probe of 8 mm diameter (to avoid damaging surface
of card).
5.2 Procedure
Connect the ground pin of the apparatus to the conductive plate upon which the card is placed.
Apply the discharge successively in normal polarity to each of the 20 test zones shown in figure 2. Then repeat the
same procedure with reversed polarity. Allow a cool-down period between successive pulses of at least 10 s.
WARNING — If the card includes contacts, the contacts shall be face up and the zone which includes
contacts shall not be exposed to this discharge.
Check that the card remains testably functional (see clause 3) at the end of the test.
12 3 4 5
67 8 9 10
11 12 13 14 15
16 17 18 19 20
Figure 2 — Test zones on card for ESD test
5.3 Test report
The test report shall state whether or not the card remains testably functional.
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ISO/IEC 10373-7:2001(E)
6 Test apparatus and test circuits
This clause defines the test apparatus and test circuits for verifying the operation of a VICC or a VCD according to
ISO/IEC 15693-2. The test apparatus includes:
� Calibration coil (see 6.1)
� Test VCD assembly (see 6.2)
� Reference VICC (see 6.3)
� Digital sampling oscilloscope (see 6.4).
These are described in the following clauses.
6.1 Calibration coil
This clause defines the size, thickness and characteristics of the calibration coil.
6.1.1 Size of the Calibration coil card
The Calibration coil card consists of an area, which has the height and width defined in ISO/IEC 7810 for ID-1 type
containing a single turn coil concentric with the card outline.
ISO/IEC 7810 ID-1 outline
connections
Coil 72x42 mm
1turn
Figure 3 — Calibration coil
6.1.2 Thickness and material of the Calibration coil card
The thickness of the calibration coil card shall be 0,76 mm� 10 %. It shall be constructed of a suitable insulating
material.
6.1.3 Coil characteristics
The coil on the Calibration coil card shall have one turn. The outer size of the coil shall be 72 mm (� 2%) � 42 mm
(� 2%) withcorner radius 5mm.
2
NOTE The area over which the field is integrated is approximately 3000 mm .
The coil is made as a printed coil on PCB plated with 35µm copper. Track width shall be 500µm � 20 %. The size
of the connection pads shall be 1,5 mm � 1,5 mm.
NOTE At 13,56 MHz the approximate inductance is 200 nH and the approximate resistance is 0,25 Ohm.
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ISO/IEC 10373-7:2001(E)
A high impedance oscilloscope probe (e.g. > 1MOhm, < 14pF) shall be used to measure the (open circuit) voltage
in the coil. The resonance frequency of the whole set (calibration coil, connecting leads and probe) shall be above
60 MHz.
NOTE A parasitic capacitance of the probe assembly of less than 35 pF normally ensures a resonant frequency for the
whole set of greater than 60 MHz.
The open circuit calibration factor for this coil is 0,32 Volts (rms) per A/m (rms) [Equivalent to 900 mV (peak-to-
peak) per A/m (rms)].
6.2 Test VCD assembly
The test VCD assembly for load modulation consists of a 150 mm diameter VCD antenna and two parallel sense
coils: sense coil a and sense coil b. The test set-up is shown in figure 4. The sense coils are connected such that
the signal from one coil is in opposite phase to the other. The 50 Ohm potentiometer P1 serves to fine adjust the
balance point when the sense coils are not loaded by a VICC or any magnetically coupled circuit. The capacitive
load of the probe including its parasitic capacitance shall be less than 14pF.
NOTE The capacitance of the connections and oscilloscope probe should be kept to a minimum for reproducibility.
+
sense coil b +
220 Ohm
- -
P1
identical length
twisted pairs of less
50 Ohm
than 150 mm
220 Ohm
VCD
probe
antenna
+ +
sense coil a
- -
to
oscilloscope
Figure 4 — Test set-up (principle)
NOTE The length of 150 mm of the twisted pairs takes the wider spacing of the sense coils in comparison to the set-up in
ISO/IEC 10373-6 into account.
6.2.1 Test VCD antenna
The Test VCD antenna shall have a diameter of 150 mm and its construction shall conform to the drawings in
Annex A. The tuning of the antenna may be accomplished with the procedure given in Annex B.
6.2.2 Sense coils
Thesizeof thesensecoils is 100� 70 mm. The sense coil construction shall conform to the drawings in Annex C.
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ISO/IEC 10373-7:2001(E)
6.2.3 Assembly of test VCD
The sense coils and Test VCD antenna are assembled parallel and with the sense and antenna coils coaxial and
such that the distance between the active conductors is 100 mm as in figure 5. The distance between the coil in the
DUT and the calibration coil shall be equal with respect to the coil of the test VCD antenna.
100 mm 100 mm
active
conductors
DUT
3mm air
calibration coil
spacing
sense coil b
VCD
sense coil a
antenna
NOTE The distance of 100 mm reflects larger read distance and 3 mm air spacing avoids parasitic effects such as
detuning by closer spacing or ambiguous results due to noise and other environmental effects.
Figure 5 — Test VCD assembly
6.3 Reference VICCs
Reference VICCs are defined
� to test H and H produced by a VCD (under conditions of loading by a VICC)
min max
� to test the ability of a VCD to power a VICC
� to detect the minimum load modulation signal from the VICC.
6.3.1 Reference VICC for VCD power
The schematic for the power test is shown in Annex D. Power dissipation can be set by the resistor R1 or R2
respectively in order to measure H and H as defined in 8.1.2. The resonant frequency can be adjusted with
max min
C2.
6.3.2 Reference VICC for load modulation test
A suggested schematic for the load modulation test is shown in Annex E. The load modulation can be chosen to be
resistive or reactive.
This Reference VICC is calibrated by using the Test VCD assembly as follows:
The Reference VICC is placed in the position of the DUT. The load modulation signal amplitude is measured as
described in 7.2. This amplitude should correspond to the minimum amplitude at all values of field strength required
by the base standard.
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ISO/IEC 10373-7:2001(E)
6.3.3 Dimensions of the Reference VICCs
The Reference VICCs consist of an area containing the coils which has the height and width defined in ISO/IEC
7810 for ID-1 type. An area external to this, containing the circuitry which emulates the required VICC functions, is
appended in a way as to allow insertion into the test set-ups described below and so as to cause no interference to
the tests. The dimensions shall be as in figure 6.
outline ISO/IEC 7810
Coil
Circuitry
ID-1 type
172 mm
Figure 6 — Reference VICC dimensions
6.3.4 Thickness of the Reference VICC board
The thickness of the Reference VICC active area shall be 0,76 mm � 10 %.
6.3.5 Coil characteristics
The coil in the active area of the Reference VICC shall have 4 turns and shall be concentric with the area outline.
The outer size of the coils shall be 77 mm�2% � 47 mm� 2%.
The coil is printed on PCB plated with 35µm copper.
Track width and spacing shall be 500µm � 20 %.
NOTE At 13,56 MHz the nominal inductance is 3,5µH and the nominal resistance is 1 Ohm.
6.4 Digital sampling oscilloscope
The digital sampling oscilloscope shall be capable of sampling at a rate of at least 100 million samples per second
with a resolution of at least 8 bits at optimum scaling. The oscilloscope should have the capability to output the
sampled data as a text file to facilitate mathematical and other operations such as windowing on the sampled data
using external software programmes (Annex F).
7 Functional test - VICC
7.1 Purpose
The purpose of this test is to determine the amplitude of the VICC load modulation signal within the operating field
range [H , H ] as specified in 6.2 of the base standard and the functionality of the VICC with the modulation
min max
under emitted fields as defined in figure 1 and figure 2 of ISO/IEC 15693-2, 7.1, of the base standard.
7.2 Test procedure
Step 1: The load modulation test circuit of figure 4 and the Test VCD assembly of figure 5 are used.
The RF power delivered by the signal generator to the test VCD antenna shall be adjusted to the required field
strength and modulation waveforms as measured by the calibration coil without any VICC. The output of the load
modulation test circuit of figure 4 is connected to a digital sampling oscilloscope. The 50 Ohm potentiometer P1
shall be trimmed to minimise the residual carrier. This signal shall be at least 40 dB lower than the signal obtained
by shorting one sense coil.
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ISO/IEC 10373-7:2001(E)
Step 2: The VICC under test shall be placed in the DUT position, concentric with sense coil a. The RF drive into the
test VCD antenna shall be re-adjusted to the required field strength.
NOTE Care should be taken to apply a proper synchronization method for low amplitude load modulation.
Exactly two subcarrier cycles of the sampled modulation waveform shall be Fourier transformed. A discrete Fourier
transformation with a scaling such that a pure sinusoidal signal results in its peak magnitude shall be used. To
minimize transient effects, a subcarrier cycle immediately following a non-modulating period must be avoided. In
case of two subcarrier frequencies this procedure shall be repeated for the second subcarrier frequency.
The resulting amplitudes of the two upper sidebands at fc + fs1 and fc + fs2 and the two lower sidebands at fc� fs1
and fc � fs2 respectively shall be above the value defined in 8.1 of the base standard.
An appropriate command sequence as defined in ISO/IEC 15693-3 shall be sent by the Reference VCD to obtain a
signal or load modulation response from the VICC.
7.3 Test report
The test report shall give the measured amplitudes of the upper sidebands at fc + fs1 and fc + fs2 and the lower
sidebands at fc� fs1 and fc� fs2 and the applied fields and modulations.
8 Functional test - VCD
8.1 VCD field strength and Power transfer
8.1.1 Purpose
This test measures the field strength produced by a VCD with its specified antenna in its operating volume as
defined in accordance with the base standard. The test procedure of 8.1.2 is also used to determine that the VCD
with its specified antenna generates a field not higher t
...
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