ISO/IEC 10373-3:2018

Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices

This document defines test methods for characteristics of integrated circuit cards with contacts and related interface devices according to the definition given in ISO/IEC 7816-3. Each test method is cross‑referenced to one or more base standards, which can be ISO/IEC 7810 that defines the information storage technologies employed in identification card applications. NOTE Criteria for acceptability do not form part of this document but can be found in the International Standards mentioned above. This document defines test methods which are specific to integrated circuit technology with contacts. ISO/IEC 10373-1 defines test methods which are common to one or more card technologies and other parts of the ISO/IEC 10373 series define other technology‑specific tests. Test methods defined in this document are intended to be performed separately and independently. A given card is not required to pass through all the tests sequentially. The test methods defined in this document are based on ISO/IEC 7816-3. Conformance of cards and IFDs determined using the test methods defined in this document does not preclude failures in the field. Reliability testing is outside the scope of this document. This document does not define any test to establish the complete functioning of integrated circuit cards. The test methods require only that the minimum functionality be verified. The minimum functionality is defined as follows. — Any integrated circuit present in the card continues to show an Answer to Reset response which conforms to the base standard. — Any contacts associated with any integrated circuit present in the card continue to show electrical resistance which conforms to the base standard.

Cartes d'identification — Méthodes d'essai — Partie 3: Cartes à circuit(s) intégré(s) à contacts et dispositifs d'interface assimilés

General Information

• Status: Published
• Publication Date: 15-Aug-2018
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 4 - Generic interfaces and protocols for security devices
• Current Stage: 9093 - International Standard confirmed
• Completion Date: 29-Aug-2024

Relations

• Revises: ISO/IEC 10373-3:2010 - Identification cards — Test methods — Part 3: Integrated circuit cards with contacts and related interface devices
• Effective Date: 22-Jul-2017

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-3
Third edition
2018-09
Identification cards — Test
methods —
Part 3:
Integrated circuit cards with contacts
and related interface devices
Cartes d'identification — Méthodes d'essai —
Partie 3: Cartes à circuit(s) intégré(s) à contacts et dispositifs
d'interface assimilés
Reference number
©
ISO/IEC 2018
© ISO/IEC 2018
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Fax: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2018 – All rights reserved

Contents Page
Foreword .vi
1 Scope .1
2 Normative references .1
3 Terms and definitions .1
4 General items applicable to the test methods . 2
4.1 Test environment . 2
4.2 Pre-conditioning . 2
4.3 Selection of test methods . 2
4.4 Default tolerance . 3
4.5 Total measurement uncertainty . 3
4.6 Conventions for electrical measurements . 3
4.7 Apparatus . 3
4.7.1 Apparatus for testing the integrated circuit cards with contacts (card-test-
apparatus) . 3
4.7.2 Apparatus for testing the interface device (IFD-test-apparatus). 6
4.7.3 Test Scenario .10
4.8 Relationship of test methods versus base standard requirements .10
5 Test methods for electrical characteristics of cards with contacts .12
5.1 VCC contact .12
5.1.1 General.12
5.1.2 Apparatus .12
5.1.3 Procedure .12
5.1.4 Test report .13
5.2 I/O contact .13
5.2.1 General.13
5.2.2 Apparatus .13
5.2.3 Procedure .13
5.2.4 Test report .14
5.3 CLK contact .14
5.3.1 General.14
5.3.2 Apparatus .14
5.3.3 Procedure .15
5.3.4 Test report .15
5.4 RST contact .15
5.4.1 General.15
5.4.2 Apparatus .16
5.4.3 Procedure .16
5.4.4 Test report .16
5.5 SPU (C6) contact .16
6 Test methods for logical operations of cards with contacts .17
6.1 Answer to reset .17
6.1.1 Cold reset and answer-to-reset (ATR).17
6.1.2 Warm reset.17
6.2 T=0 Protocol .18
6.2.1 General.18
6.2.2 I/O transmission timing for T=0 protocol .18
6.2.3 I/O character repetition for T=0 protocol .19
6.2.4 I/O reception timing and error signalling for T=0 protocol .19
6.3 T=1 Protocol .20
6.3.1 General.20
6.3.2 I/O transmission timing for T=1 protocol .20
6.3.3 I/O reception timing for T=1 protocol .21
© ISO/IEC 2018 – All rights reserved iii

6.3.4 Character Waiting Time (CWT) behaviour .22
6.3.5 Card-reaction to IFD exceeding CWT .22
6.3.6 Block Guard time (BGT) .23
6.3.7 Block sequencing by the card .24
6.3.8 Reaction of the card to protocol errors .26
6.3.9 Recovery of a transmission error by the card .26
6.3.10 Resynchronization .27
6.3.11 IFSD negotiation .28
6.3.12 Abortion by the IFD .29
7 Test methods for physical and electrical characteristics of the IFD .29
7.1 Activation of contacts .29
7.1.1 General.29
7.1.2 Apparatus .29
7.1.3 Procedure .30
7.1.4 Test report .30
7.2 VCC contact .30
7.2.1 General.30
7.2.2 Apparatus .30
7.2.3 Procedure .30
7.2.4 Test report .31
7.3 I/O contact .32
7.3.1 General.32
7.3.2 Apparatus .
...

INTERNATIONAL ISO/IEC
STANDARD 10373-3
Third edition
2018-09
Identification cards — Test
methods —
Part 3:
Integrated circuit cards with contacts
and related interface devices
Cartes d'identification — Méthodes d'essai —
Partie 3: Cartes à circuit(s) intégré(s) à contacts et dispositifs
d'interface assimilés
Reference number
©
ISO/IEC 2018
© ISO/IEC 2018
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Fax: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO/IEC 2018 – All rights reserved

Contents Page
Foreword .vi
1 Scope .1
2 Normative references .1
3 Terms and definitions .1
4 General items applicable to the test methods . 2
4.1 Test environment . 2
4.2 Pre-conditioning . 2
4.3 Selection of test methods . 2
4.4 Default tolerance . 3
4.5 Total measurement uncertainty . 3
4.6 Conventions for electrical measurements . 3
4.7 Apparatus . 3
4.7.1 Apparatus for testing the integrated circuit cards with contacts (card-test-
apparatus) . 3
4.7.2 Apparatus for testing the interface device (IFD-test-apparatus). 6
4.7.3 Test Scenario .10
4.8 Relationship of test methods versus base standard requirements .10
5 Test methods for electrical characteristics of cards with contacts .12
5.1 VCC contact .12
5.1.1 General.12
5.1.2 Apparatus .12
5.1.3 Procedure .12
5.1.4 Test report .13
5.2 I/O contact .13
5.2.1 General.13
5.2.2 Apparatus .13
5.2.3 Procedure .13
5.2.4 Test report .14
5.3 CLK contact .14
5.3.1 General.14
5.3.2 Apparatus .14
5.3.3 Procedure .15
5.3.4 Test report .15
5.4 RST contact .15
5.4.1 General.15
5.4.2 Apparatus .16
5.4.3 Procedure .16
5.4.4 Test report .16
5.5 SPU (C6) contact .16
6 Test methods for logical operations of cards with contacts .17
6.1 Answer to reset .17
6.1.1 Cold reset and answer-to-reset (ATR).17
6.1.2 Warm reset.17
6.2 T=0 Protocol .18
6.2.1 General.18
6.2.2 I/O transmission timing for T=0 protocol .18
6.2.3 I/O character repetition for T=0 protocol .19
6.2.4 I/O reception timing and error signalling for T=0 protocol .19
6.3 T=1 Protocol .20
6.3.1 General.20
6.3.2 I/O transmission timing for T=1 protocol .20
6.3.3 I/O reception timing for T=1 protocol .21
© ISO/IEC 2018 – All rights reserved iii

6.3.4 Character Waiting Time (CWT) behaviour .22
6.3.5 Card-reaction to IFD exceeding CWT .22
6.3.6 Block Guard time (BGT) .23
6.3.7 Block sequencing by the card .24
6.3.8 Reaction of the card to protocol errors .26
6.3.9 Recovery of a transmission error by the card .26
6.3.10 Resynchronization .27
6.3.11 IFSD negotiation .28
6.3.12 Abortion by the IFD .29
7 Test methods for physical and electrical characteristics of the IFD .29
7.1 Activation of contacts .29
7.1.1 General.29
7.1.2 Apparatus .29
7.1.3 Procedure .30
7.1.4 Test report .30
7.2 VCC contact .30
7.2.1 General.30
7.2.2 Apparatus .30
7.2.3 Procedure .30
7.2.4 Test report .31
7.3 I/O contact .32
7.3.1 General.32
7.3.2 Apparatus .
...