ISO 3274:1996
(Main)Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments
Describes profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness. Specifies the properties of the instrument which influence profile evaluation. Replaces the first edition of ISO 3274:1975 and ISO 1880:1979.
Spécification géométrique des produits (GPS) — État de surface: Méthode du profil — Caractéristiques nominales des appareils à contact (palpeur)
La présente Norme internationale définit les différents profils et la structure générale des appareils à contact (palpeur) utilisés pour mesurer la rugosité et l'ondulation de surface, permettant ainsi d'appliquer les Normes internationales existantes à l'évaluation pratique des profils. Elle prescrit les caractéristiques des appareils qui influencent l'évaluation du profil et fournit un cadre de spécifications des appareils à contact (palpeur) (profilomètres et enregistreurs de profil). NOTES1 Une fiche technique présentant les caractéristiques des appareils à contact (palpeur), à remplir par le fabricant, est en cours de préparation. Elle fera l'objet d'une Norme internationale ultérieure sur les procédures d'étalonnage.2 Les relations entre la longueur d'onde de coupure d'ondulation λf, le rayon de pointe et le rapport des longueurs de coupure d'ondulation sont à l'étude et feront l'objet d'un amendement à la présente Norme internationale.
Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda - Imenske značilnosti kontaktnih instrumentov
General Information
Relations
Buy Standard
Standards Content (Sample)
INTERNATIONAL IS0
STANDARD 3274
Second edition
1996-12-01
Geometrical Product Specifications
(GPS) - Surface texture: Profile method -
Nominal characteristics of contact (stylus)
instruments
Spbcification gbom&-ique des produits (GPS) - &at de surface: Mbthode
du profil- Caractkristiques nom&ales des appareils ;i contact (palpeur)
Reference number
IS0 32749 996(E)
---------------------- Page: 1 ----------------------
IS0 3274:1996(E)
Page
Contents
.............................................................. . . . ......
1 Scope
..................................... . . . ......
2 Normative references
....................................................... . . * ......
3 Definitions
. . . .
4 Nominal values for instrument characteristics
Annexes
9
A Instruments conforming to IS0 3274: 1975 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B Background for the improvements introduced in this
IO
International Standard . . . . . . . . . . . . . . . . . . . . . . . . . . .-. s . . . . . . . . . . . . . . .-.
12
C Relation to the GPS matrix model . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I3
D Bibliography . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
0 IS0 1996
All rights reserved. No part of this publication may be reproduced or utilized in any form or
by any means, electronical or mechanical, including photocopyrng and microfiim, without
permissron in writrng from the publisher.
International Organization for Standardization
Case postale 56 l CH-1211 Geneve 20 l Switzerland
Printed in Switzerland
II
---------------------- Page: 2 ----------------------
IS0 3274:1996(E)
@ IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide
federation of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take part in the work. IS0
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 3274 was prepared jointly by Technical Com-
mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee
SC I, Geometrical parameters - Instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits, and lSO/TC 10, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
This second edition of IS0 3274 cancels and replaces the first edition
(IS0 3274:1975) as well as IS0 1880:1979, which have been technically
revised.
In particular it takes into account the nominal characteristics of contact
(stylus) instruments and their technical development. Modern instruments
use phase-correct filters according to IS0 11562.
Annexes A, B, C and D of this International Standard are for information
only.
. . .
III
---------------------- Page: 3 ----------------------
IS0 3274:1996(E) 0 IS0
Introduction
This International Standard is a Geometrical Product Specification (GPS)
standard and is to be regarded as a General GPS standard (see
lSO/TR 14638). It influences chain link 5 of the chain of standards for
roughness profile, waviness profile and primary profile.
For more detailed information of the relation of this standard to other
standards and the GPS matrix model, see annex C.
Filters for profile meters according to IS0 3274: ‘1975 were realized as a
series connection of two analog RC filters. This led to consrderable phase
shifts in the transition of the profile and therefore to asymmetrical profile
distortions. The influence of this distortion on the parameters Ra and Rz
are normally negligible if the sampling lengths (cut-of? wavelength)
according to IS0 4288:1985 are used. Therefore, analog instruments
according to IS0 3274:1975 or instruments using 2RC filters may be used
for assessment of /?a and Rz (see annex A). However, for other
parameters the distortion is relevant.
---------------------- Page: 4 ----------------------
INTERNATIONAL STANDARD 0 IS0 IS0 3274:1996(E)
Geometrical Product Specifications (GPS) - Surface texture:
Profile method - Nominal characteristics of contact (stylus)
instruments
1 Scope
This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring
surface roughness and waviness, enabling existing International Standards to be applied to practical profile
evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics
of the specification of contact (stylus) instruments (profile meter and profile recorder).
NOTES
1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under
preparation and will be introduced in a future standard on calibration procedures.
2 The relationships between the waviness cut-off If, tip radius and waviness cut-off ratio are under consideration and will be
added to this International Standard as an amendment.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this
International Standard. At the time of publication, the editions indicated were valid. All standards are subject to
revision, and parties to agreements based on this International Standard are encouraged to investigate the
possibility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain
registers of currently valid International Standards.
IS0 4287: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions
and surface texture parameters.
IS0 4288: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and
proc ’edures for the assessment of surface texture.
ISO’ 5436: 1985, Calibration specimens - Stylus instruments - Types, calibration and use of specimens.
IS0 1 1562:1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Metrological
characteristics of phase correct filters.
---------------------- Page: 5 ----------------------
0 IS0
IS0 3274:1996(E)
Surface texture: Profile method - Motif parameters.
IS0 I 2085: 1996, Geometrical Product Specifications (GPS) -
Surface texture: Profile method; Surfaces having
IS0 13565-l : 1996, Geometrical Product Specifications (GPS) -
Part 7: Filtering and overall measuring conditions.
stratified functional properties -
- Surface texture: Profile method; Surfaces having
IS0 13565-2: 1996, Geometrical Product Specifications (GPS)
Part 2: Height characterization using the linear material ratio curve.
stratified functional properties -
1) Geometrical Product Specifications (G PS) - Surface texture: Profile method; Surfaces having
IS0 13565-3:- ,
stratified functional properties - Part 3: Height characterization using the material probability curve.
3 Definitions
For the purposes of this International Standard, the following definttions apply.
3.1 Profiles
3.1.1 traced profile: Locus of the centre of a stylus tip which features an ideal geometrical form (conical with
spherical tip) and nominal dimensions with nominal tracing force, as it traverses the surface within the intersect/on
plane.
This is the profile from which all other profiles defined in this lnternational Standard are derived.
NOTE -
3.1.2 reference profile: Trace on which the probe is moved within the intersection plane along the guide.
profile is th e practical re alization of a theoreti profile. Its nornIna devlatlons
NOTE- The shape of the reference cai exact
depend on the deviations of the guide a s well as on external and internal distur bances.
3.1.3 total profile: Digital form of the traced profile relative to the reference profile, with the vertical and
horizontal coordinates assigned to each other.
NOTE - The total profile is characterized by the vertical and horizontal digital steps.
3.1.4 primary profile: Total profile after application of the short wavelength filter, As.
NOTES
1 The primary profile represents the basis for digital profile processing by means of a profile filter and calculation of the profile
parameters according to IS0 4287. It is characterized by the vertical and honzontal digital steps which may be different from
those of the total profile.
2 The best fit least squares form of the type indicated in the specification is not part of the primary profile and should be
excluded before filters are applied. For a circle, the radius should also be included in the least squares optimization and not
held fixed to the nominal value.
3 The nominal form is removed before the primary profile is obtained.
3.1.5 residual profile: Primary profile obtained by tracing an ideally smooth and flat surface (optical flat).
NOTE - The residual profile is composed of the deviations of the guide, external and internal disturbances, as well as
’ deviations in profile transmission. The determination of the causes of the deviations is not normally possible without special
equipment and a suitable environment.
3.2 stylus instrument: Measuring instrument which explores surfaces with a stylus and acquires deviations in
the form of a surface profile, calculates parameters and can record the profile (see figure 1).
NOTE - The diagram as shown represents only the essential operators required in a theoretically exact measuring system.
The specific inter-relationship of operators may be subject to design considerations. Therefore figure 1 should not be
considered as the only form of theoretically exact configuration.
1) To be published.
2
---------------------- Page: 6 ----------------------
IS0 3274:1996(E)
t
2
c
-
t
z
c
2
\----
t
2.
c
-
E
.-
I
.-
ki
.-
‘aL
E
E Q1
i!
a ;z
tu
c
b
.
t
aJ
-
.-
I
\c
0
I
ii
2 - ii% -
,
E i?s
.-
t t--u
k
>
- Schematic representation of a stylus instrument
Figure 1
---------------------- Page: 7 ----------------------
@ IS0
IS0 3274:1996(E)
3.2.1 displacement sensitive, digitally storing stylus instrument: Stylus instrument whose profile presentation
contains deviations including long-wave components and set-up deviations.
NOTE - The profile is digitally stored and, if filtered, is phase-correct filtered. Parameters are digitally calculated and the
profile is recorded by means of a graphics system excluding deformation.
3.3 Stylus instrument components
measurement loop: Closed chain which comprises all mechanical components connecting workpiece and
3.3.1
workholding fixture, measuring stand, drive unit, probe (pick-up). (See
the stylus tip, e.g. positioning means,
figure 2.)
The measuring loop is subjected to external and internal disturbances and transmits them to the reference profile.
NOTE -
The influence of these disturbances depends on the individual measuring set-up, the measuring environment and the skill of
the user. The disturbances influence the residual value to a great extent.
3.3.2 reference guide: Component which generates the intersection plane and guides the probe in it on a
theoretically exact geometrical trace (reference profile), generally in a straight line.
NOTE - The guide is an essential part of the drive unit; it can be partially included in the probe. For the use of
skids, see annex A.
3.3.3 drive unit: Component which moves the probe along the reference guide and transmits the horizontal
position of the stylus tip in the form of a horizontal profile coordinate.
NOTE - Drive units are characterized by the longest selectable tracing length.
Measurement loop
/-- Drive unit
\
-Base
Example of measurement loop of a stylus instrument
Figure 2 -
4
---------------------- Page: 8 ----------------------
0 IS0 IS0 3274:1996(E)
3.3.4 probe (pick-up): Component which contains the tracing element with the stylus tip and the transducer.
3.3.5 tracing element: Element which transmits the stylus tip displacement to the transducer.
3.3.6 stylus tip: Element which consists of a nominally right, circular cone of defined cone angle and of a
nominally spherical tip of defined radius.
lt is a very important element in profile acquisition when employing stylus instruments.
NOTE -
3.3.7 transducer: Device which converts the vertical coordinates of the traced profile referred to the reference
profile into the signal form used in the instrument.
NOTE - The transducer does not cause an intentional profile modification.
3.3.8 amplifier: Device which effects signal transformation in the instrument without causing any intentional
profile modification.
converter (ADC): Device which converts the signal form existing in the instrument into
3.3.9 analog-to-digital
digital values.
horizontal coordinates,
NOTE Together with the corresponding these values form the total profile. The ADC does not
cause intentional profile modification.
any
3.3.10 data input: Data interface that the instrument may have which allows input of one or more types of profile
from an external computer.
3.3.11 data output: Data inte rface that the instrument may have which allows output of one or more
types of
profile to an external c omputer.
3.3.12 profile filtering and evaluation: Operations carried out on the primary, roughness and waviness profiles
by means of parameters and characteristic functions according to IS0 4287, IS0 11562, IS0 12085, IS0 13565-1,
IS0 13565-2 and IS0 13565-3.
NOTE - The nominal value of the sampling length is equal to the wavelength cut-off k.
3.3.13 profile recorder: Recorder that the instrument may have which allows output of one or more types of
profile and/or parameter value.
3.4 Metrological characteristics of the instrument
3.4.1 static measuring force: Force exerted by the stylus tip when in its mean position as it rests on the surface.
static measuring Change of measuring which occurs when the stylus tip is
3.42 change of force
displaced.
NOTE - Normally this change is proportional to the displacement.
3.4.3 dynamic measuring force: Force resulting from the acceleration of the stylus tip when continuously tracing
the surface.
These dynamic measuring forces are superimposed on the static measuring force.
NOTE -
3.4.4 hysteresis: Difference between the indicated stylus tip displacements for the same actual stylus tip
displacement when the stylus tip moves inward and outward.
5
---------------------- Page: 9 ----------------------
@ IS0
IS0 3274:1996(E)
3.4.5 transmission function for sine waves: Function which, for a given tracing speed, depends both on the
wavelength and on the amplitude of the profile to be measured.
NOTES
1 In order to denote th e transmission behaviour, the smallest sine wavelength (groove interval) which can still be transmitted
may be stated for different traverse spee ds and a given amplitude.
within given limits of rmissible error
Pe
2 The transmission func tion of the p robe is dependent on the probe configuration used and will change for a given instrument
if the p Irobe configur ,ation is changed.
3.4.6 measuring range of probe: Vertical range over which the stylus tip and the transducer can acquire
displacements within certain limits of permissible error and conv
...
SLOVENSKI STANDARD
SIST ISO 3274:2001
01-julij-2001
6SHFLILNDFLMDJHRPHWULMVNLKYHOLþLQL]GHOND7HNVWXUDSRYUãLQH SURILOQDPHWRGD
,PHQVNH]QDþLOQRVWLNRQWDNWQLKLQVWUXPHQWRY
Geometrical Product Specifications (GPS) -- Surface texture: Profile method -- Nominal
characteristics of contact (stylus) instruments
Spécification géométrique des produits (GPS) -- État de surface: Méthode du profil --
Caractéristiques nominales des appareils à contact (palpeur)
Ta slovenski standard je istoveten z: ISO 3274:1996
ICS:
17.040.30 Merila Measuring instruments
SIST ISO 3274:2001 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
---------------------- Page: 1 ----------------------
INTERNATIONAL IS0
STANDARD 3274
Second edition
1996-12-01
Geometrical Product Specifications
(GPS) - Surface texture: Profile method -
Nominal characteristics of contact (stylus)
instruments
Spbcification gbom&-ique des produits (GPS) - &at de surface: Mbthode
du profil- Caractkristiques nom&ales des appareils ;i contact (palpeur)
Reference number
IS0 32749 996(E)
---------------------- Page: 2 ----------------------
IS0 3274:1996(E)
Page
Contents
.............................................................. . . . ......
1 Scope
..................................... . . . ......
2 Normative references
....................................................... . . * ......
3 Definitions
. . . .
4 Nominal values for instrument characteristics
Annexes
9
A Instruments conforming to IS0 3274: 1975 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
B Background for the improvements introduced in this
IO
International Standard . . . . . . . . . . . . . . . . . . . . . . . . . . .-. s . . . . . . . . . . . . . . .-.
12
C Relation to the GPS matrix model . . . . . . . . . . . . . . . , . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
I3
D Bibliography . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
0 IS0 1996
All rights reserved. No part of this publication may be reproduced or utilized in any form or
by any means, electronical or mechanical, including photocopyrng and microfiim, without
permissron in writrng from the publisher.
International Organization for Standardization
Case postale 56 l CH-1211 Geneve 20 l Switzerland
Printed in Switzerland
II
---------------------- Page: 3 ----------------------
IS0 3274:1996(E)
@ IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide
federation of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take part in the work. IS0
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 3274 was prepared jointly by Technical Com-
mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee
SC I, Geometrical parameters - Instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits, and lSO/TC 10, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
This second edition of IS0 3274 cancels and replaces the first edition
(IS0 3274:1975) as well as IS0 1880:1979, which have been technically
revised.
In particular it takes into account the nominal characteristics of contact
(stylus) instruments and their technical development. Modern instruments
use phase-correct filters according to IS0 11562.
Annexes A, B, C and D of this International Standard are for information
only.
. . .
III
---------------------- Page: 4 ----------------------
IS0 3274:1996(E) 0 IS0
Introduction
This International Standard is a Geometrical Product Specification (GPS)
standard and is to be regarded as a General GPS standard (see
lSO/TR 14638). It influences chain link 5 of the chain of standards for
roughness profile, waviness profile and primary profile.
For more detailed information of the relation of this standard to other
standards and the GPS matrix model, see annex C.
Filters for profile meters according to IS0 3274: ‘1975 were realized as a
series connection of two analog RC filters. This led to consrderable phase
shifts in the transition of the profile and therefore to asymmetrical profile
distortions. The influence of this distortion on the parameters Ra and Rz
are normally negligible if the sampling lengths (cut-of? wavelength)
according to IS0 4288:1985 are used. Therefore, analog instruments
according to IS0 3274:1975 or instruments using 2RC filters may be used
for assessment of /?a and Rz (see annex A). However, for other
parameters the distortion is relevant.
---------------------- Page: 5 ----------------------
INTERNATIONAL STANDARD 0 IS0 IS0 3274:1996(E)
Geometrical Product Specifications (GPS) - Surface texture:
Profile method - Nominal characteristics of contact (stylus)
instruments
1 Scope
This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring
surface roughness and waviness, enabling existing International Standards to be applied to practical profile
evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics
of the specification of contact (stylus) instruments (profile meter and profile recorder).
NOTES
1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under
preparation and will be introduced in a future standard on calibration procedures.
2 The relationships between the waviness cut-off If, tip radius and waviness cut-off ratio are under consideration and will be
added to this International Standard as an amendment.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this
International Standard. At the time of publication, the editions indicated were valid. All standards are subject to
revision, and parties to agreements based on this International Standard are encouraged to investigate the
possibility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain
registers of currently valid International Standards.
IS0 4287: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Terms, definitions
and surface texture parameters.
IS0 4288: 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and
proc ’edures for the assessment of surface texture.
ISO’ 5436: 1985, Calibration specimens - Stylus instruments - Types, calibration and use of specimens.
IS0 1 1562:1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Metrological
characteristics of phase correct filters.
---------------------- Page: 6 ----------------------
0 IS0
IS0 3274:1996(E)
Surface texture: Profile method - Motif parameters.
IS0 I 2085: 1996, Geometrical Product Specifications (GPS) -
Surface texture: Profile method; Surfaces having
IS0 13565-l : 1996, Geometrical Product Specifications (GPS) -
Part 7: Filtering and overall measuring conditions.
stratified functional properties -
- Surface texture: Profile method; Surfaces having
IS0 13565-2: 1996, Geometrical Product Specifications (GPS)
Part 2: Height characterization using the linear material ratio curve.
stratified functional properties -
1) Geometrical Product Specifications (G PS) - Surface texture: Profile method; Surfaces having
IS0 13565-3:- ,
stratified functional properties - Part 3: Height characterization using the material probability curve.
3 Definitions
For the purposes of this International Standard, the following definttions apply.
3.1 Profiles
3.1.1 traced profile: Locus of the centre of a stylus tip which features an ideal geometrical form (conical with
spherical tip) and nominal dimensions with nominal tracing force, as it traverses the surface within the intersect/on
plane.
This is the profile from which all other profiles defined in this lnternational Standard are derived.
NOTE -
3.1.2 reference profile: Trace on which the probe is moved within the intersection plane along the guide.
profile is th e practical re alization of a theoreti profile. Its nornIna devlatlons
NOTE- The shape of the reference cai exact
depend on the deviations of the guide a s well as on external and internal distur bances.
3.1.3 total profile: Digital form of the traced profile relative to the reference profile, with the vertical and
horizontal coordinates assigned to each other.
NOTE - The total profile is characterized by the vertical and horizontal digital steps.
3.1.4 primary profile: Total profile after application of the short wavelength filter, As.
NOTES
1 The primary profile represents the basis for digital profile processing by means of a profile filter and calculation of the profile
parameters according to IS0 4287. It is characterized by the vertical and honzontal digital steps which may be different from
those of the total profile.
2 The best fit least squares form of the type indicated in the specification is not part of the primary profile and should be
excluded before filters are applied. For a circle, the radius should also be included in the least squares optimization and not
held fixed to the nominal value.
3 The nominal form is removed before the primary profile is obtained.
3.1.5 residual profile: Primary profile obtained by tracing an ideally smooth and flat surface (optical flat).
NOTE - The residual profile is composed of the deviations of the guide, external and internal disturbances, as well as
’ deviations in profile transmission. The determination of the causes of the deviations is not normally possible without special
equipment and a suitable environment.
3.2 stylus instrument: Measuring instrument which explores surfaces with a stylus and acquires deviations in
the form of a surface profile, calculates parameters and can record the profile (see figure 1).
NOTE - The diagram as shown represents only the essential operators required in a theoretically exact measuring system.
The specific inter-relationship of operators may be subject to design considerations. Therefore figure 1 should not be
considered as the only form of theoretically exact configuration.
1) To be published.
2
---------------------- Page: 7 ----------------------
IS0 3274:1996(E)
t
2
c
-
t
z
c
2
\----
t
2.
c
-
E
.-
I
.-
ki
.-
‘aL
E
E Q1
i!
a ;z
tu
c
b
.
t
aJ
-
.-
I
\c
0
I
ii
2 - ii% -
,
E i?s
.-
t t--u
k
>
- Schematic representation of a stylus instrument
Figure 1
---------------------- Page: 8 ----------------------
@ IS0
IS0 3274:1996(E)
3.2.1 displacement sensitive, digitally storing stylus instrument: Stylus instrument whose profile presentation
contains deviations including long-wave components and set-up deviations.
NOTE - The profile is digitally stored and, if filtered, is phase-correct filtered. Parameters are digitally calculated and the
profile is recorded by means of a graphics system excluding deformation.
3.3 Stylus instrument components
measurement loop: Closed chain which comprises all mechanical components connecting workpiece and
3.3.1
workholding fixture, measuring stand, drive unit, probe (pick-up). (See
the stylus tip, e.g. positioning means,
figure 2.)
The measuring loop is subjected to external and internal disturbances and transmits them to the reference profile.
NOTE -
The influence of these disturbances depends on the individual measuring set-up, the measuring environment and the skill of
the user. The disturbances influence the residual value to a great extent.
3.3.2 reference guide: Component which generates the intersection plane and guides the probe in it on a
theoretically exact geometrical trace (reference profile), generally in a straight line.
NOTE - The guide is an essential part of the drive unit; it can be partially included in the probe. For the use of
skids, see annex A.
3.3.3 drive unit: Component which moves the probe along the reference guide and transmits the horizontal
position of the stylus tip in the form of a horizontal profile coordinate.
NOTE - Drive units are characterized by the longest selectable tracing length.
Measurement loop
/-- Drive unit
\
-Base
Example of measurement loop of a stylus instrument
Figure 2 -
4
---------------------- Page: 9 ----------------------
0 IS0 IS0 3274:1996(E)
3.3.4 probe (pick-up): Component which contains the tracing element with the stylus tip and the transducer.
3.3.5 tracing element: Element which transmits the stylus tip displacement to the transducer.
3.3.6 stylus tip: Element which consists of a nominally right, circular cone of defined cone angle and of a
nominally spherical tip of defined radius.
lt is a very important element in profile acquisition when employing stylus instruments.
NOTE -
3.3.7 transducer: Device which converts the vertical coordinates of the traced profile referred to the reference
profile into the signal form used in the instrument.
NOTE - The transducer does not cause an intentional profile modification.
3.3.8 amplifier: Device which effects signal transformation in the instrument without causing any intentional
profile modification.
converter (ADC): Device which converts the signal form existing in the instrument into
3.3.9 analog-to-digital
digital values.
horizontal coordinates,
NOTE Together with the corresponding these values form the total profile. The ADC does not
cause intentional profile modification.
any
3.3.10 data input: Data interface that the instrument may have which allows input of one or more types of profile
from an external computer.
3.3.11 data output: Data inte rface that the instrument may have which allows output of one or more
types of
profile to an external c omputer.
3.3.12 profile filtering and evaluation: Operations carried out on the primary, roughness and waviness profiles
by means of parameters and characteristic functions according to IS0 4287, IS0 11562, IS0 12085, IS0 13565-1,
IS0 13565-2 and IS0 13565-3.
NOTE - The nominal value of the sampling length is equal to the wavelength cut-off k.
3.3.13 profile recorder: Recorder that the instrument may have which allows output of one or more types of
profile and/or parameter value.
3.4 Metrological characteristics of the instrument
3.4.1 static measuring force: Force exerted by the stylus tip when in its mean position as it rests on the surface.
static measuring Change of measuring which occurs when the stylus tip is
3.42 change of force
displaced.
NOTE - Normally this change is proportional to the displacement.
3.4.3 dynamic measuring force: Force resulting from the acceleration of the stylus tip when continuously tracing
the surface.
These dynamic measuring forces are superimposed on the static measuring force.
NOTE -
3.4.4 hysteresis: Difference between the indicated stylus tip displacements for the same actual stylus tip
displacement when the stylus tip moves inward and outward.
5
---------------------- Page: 10 ----------------------
@ IS0
IS0 3274:1996(E)
3.4.5 transmission function for sine waves: Function which, for a given tracing speed, depends both on the
wavelength and on the amplitude of the profile to be measured.
NOTES
...
NORME IS0
3274
INTERNATIONALE
Deuxieme edition
1996-l 2-01
Spkification gbombtrique des produits
(GPS) - &at de surface: Mbthode
du profil - Caractbristiques nominales
des appareils & contact (palpeur)
Geometrical Product Specifica Cons (G PS) - Surface texture.
Profile method - Nominal characteristics of contact (stylus) instruments
Numbo de ritf&-ence
IS0 3274: 1996(F)
---------------------- Page: 1 ----------------------
IS0 3274: 1996(F)
Page
Sommaire
1 Domaine d ’application . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . “. 1
2 References normatives . 1
3 Definitions . 2
4 Valeurs nominales des caracteristiques des appareils . . . . . . . . . . . . . . . . 7
Annexes
A Appareils conformes a I ’ISO 3274:1975 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
B Origines des ameliorations introduites dans la presente
Norme internationale . . . . . . . . . . . . . . . .~.~. ”. IO
12
C Relation avec la matrice GPS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ““.
13
D Bibliographie . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
0 IS0 1996
Droits de reproduction reserves. Sauf prescription differente, aucune partie de cette publi-
cation ne peut etre reproduite ni utilisee sous quelque forme que ce sort et par aucun pro-
cede, electronique ou mecanique, y compris la photocopie et les mrcrofilms, sans I ’accord
ecrit de I ’editeur.
Organisation internationale de normalisation
Case postale 56 l CH-1211 Geneve 20 l Suisse
Imprime en Suisse
ii
---------------------- Page: 2 ----------------------
0 IS0
IS0 3274:1996(F)
Avant-propos
L ’ISO (Organisation internationale de normalisation) est une federation
mondiale d ’organismes nationaux de normalisation (comites membres de
I ’ISO). L ’elaboration des Normes internationales est en general confiee aux
comites techniques de I ’ISO. Chaque comite membre interesse par une
etude a le droit de faire partie du comite technique tree a cet effet. Les
organisations internationales, gouvernementales et non gouvernemen-
tales, en liaison avec I ’ISO participent egalement aux travaux. L ’ISO colla-
bore etroitement avec la Commission electrotechnique internationale (CEI)
en ce qui concerne la normalisation electrotechnique.
Les projets de Normes internationales adopt& par les comites techniques
sont soumis aux comites membres pour vote. Leur publication comme
Normes internationales requiert I ’approbation de 75 % au moins des co-
mites membres votants.
La Norme internationale IS0 3274 a ete elaboree conjointement par les
comites techniques lSO/TC 57, M&rologie et propri&s des surfaces,
sous-comite SC 1, Parametres gGom&riques - Instruments et pro&-
dures pour la mesure de la rugosit6 et de I ’ondulation des surfaces,
l ’lSO/TC 3, Ajustements et l ’lSO/TC IO, Dessins techniques, dgfinition de
produits et documentation y relative, sous-comite SC 5, Cotation et
tolkancemen t.
Cette deuxieme edition de I ’ISO 3274 annule et remplace la premiere
edition (IS0 3274:1975) ainsi que I ’ISO 1880:1979, dont elle constitue une
revision technique.
En particulier, elle tient compte des caracteristiques nominales des
appareils a contact (palpeur) et de leurs progres techniques. Les appareils
modernes utilisent des filtres a phase correcte, conformement a
I ’ISO 11562.
Les annexes A, B, C et D de la presente Norme internationale sont
donnees uniquement a titre d ’information.
. . .
III
---------------------- Page: 3 ----------------------
IS0 3274:1996(F) @ IS0
Introduction
La presente Norme internationale qui traite de la specification geometrique
des produits (GPS) est consideree comme une norme GPS generale (voir
l’lSO/TR 14638). Elle influence le maillon 5 des cha ’ines de normes
relatives au profil de rugosite, au profil d ’ondulation et au profil primaire.
Pour de plus amples informations sur la relation de la presente Norme
internationale avec les autres normes et la matrice GPS, voir l’annexe C
Les filtres pour profilometres conformement a I ’ISO 3274:1975 etaient
constitues de deux filtres analogiques RC en serie. Cela conduisait a des
dephasages importants dans la transmission du profil et done a des
distorsions asymetriques du profil. L ’influence de ces distorsions sur les
parametres Ra et Rz est en general negligeable lorsqu ’on utilise des
longueurs de base (longueur d ’onde de coupure) conformes a
I ’ISO 4288:1985. C ’est pourquoi les appareils analogiques conformes a
I ’ISO 3274:1975 ou les appareils utilisant des filtres 2RC peuvent etre
utilises pour I ’evaluation de Ra et Rz (voir annexe A). Cependant, pour les
autres parametres, la distorsion est significative.
iv
---------------------- Page: 4 ----------------------
NORME INTERNATIONALE o Iso IS0 3274:1996(F)
Spbcification gbombtrique des produits (GPS) - hat de
- Caractkristiques nominales des
surface: Mbthode du profil
.
appareils 5 contact (palpeur)
1 Domaine d ’application
La presente Norme internationale definit les differents profils et la structure g&-&r-ale des appareils a contact
(palpeur) utilises pour mesurer la rugosite et I ’ondulation de surface, permettant ainsi d ’appliquer les Normes
internationales existantes a I ’evaluation pratique des profils. Elle prescrit les caracteristiques des appareils qui
influencent I ’evaluation du profil et fournit un cadre de specifications des appareils a contact (palpeur)
(profilometres et enregistreurs de profil).
NOTES
Une fiche technique presentant les caracteristiques des appareils a contact (palpeur), a remplir par le fabricant, est en tours
1
de preparation. Elle fera I ’objet d ’une Norme internationale ulterieure sur les procedures d ’etalonnage.
2 Les relations entre la longueur d ’onde de coupure d ’ondulation Af, le rayon de pointe et le rapport des longueurs de coupure
d ’ondulation sont a I ’etude et feront I ’objet d ’un amendement a la presente Norme internationale.
2 Rbfbrences normatives
Les normes suivantes contiennent des dispositions qui, par suite de la reference qui en est faite, constituent des
dispositions valables pour la presente Norme internationale. Au moment de la publication, les editions indiquees
etaient en vigueur. Toute norme est sujette a revision et les parties prenantes des accords fond& sur la presente
Norme internationale sont invitees a rechercher la possibilite d ’appliquer les editions les plus recentes des normes
indiquees ci-apt-es. Les membres de la CEI et de I ’ISO possedent le registre des Normes internationales en vigueur
a un moment donne.
IS0 4287: 1996, Specification geometrique des produits (GPS) - &at de surface: Methode du profil - Termes,
definitions et parametres d ’etat de surface.
I SO 4288: 1996, Specification geome trique des produits (G PS) - rfta t de surface: Methode du profil - Regles et
procedures pour &valuation de I ’etat de surface.
IS0 5436: 1985, khan tillons d ’etalonnage - Instruments a palpeur - Type, etalonnage et emploi des khan tillons.
IS0 1 1562:1996, Specification geometrique des produits (GPS) - &at de surface: Methode du profil -
Caracteristiques metrologiques des filtres a phase correcte.
IS0 12085:1996, Specification geometrique des produits (GPS) - &at de surface: Methode du profil -
Parametres lies aux motifs.
1
---------------------- Page: 5 ----------------------
@ IS0
IS0 3274:1996(F)
kat de surface: Methode du profil; surfaces
IS0 13565-l :I 996, Specification geometrique des produits (GPS) -
ayant des proprietes fonctionnelles differentes suivant les niveaux - Partie 7: Filtrage et conditions g&&ales de
mesurage.
kat de surface: Methode du profil; surfaces
IS0 13565-Z: 1996, Specification geometrique des produits (GPS) -
Partie 2: Caracterisation des hauteurs par la
ayant des proprietes fonctionnelles differentes suivant les niveaux -
courbe de taux de longueur portante.
kat de surface: Methode du profil; surfaces
IS0 13565-3:- 1) Specification geometrique des produits (GPS) -
,
Partie 3: Caracterisation des hauteurs par la
ayant des proprietes fonctionnelles differentes suivant les niveaux -
courbe de probabilite de mat&e.
3 Dbfinitions
Pour les besoins de la presente Norme internationale, les definitions suivantes s ’appliquent.
3.1 Profils
3.1.1 profil track Lieu geometrique du centre d ’un palpeur, avant une forme geometrique ideale (conique avec
une extremite spherique) et des dimensions et une force d ’appui nominaies, lorsque ce paipeur parcourt la surface
suivant le plan d ’intersection.
NOTE - C ’est a partir de ce profil que sont definis tous les autres profils trait& dans la presente Norme internatronaie
le long de la reference de guidage dans le plan
3.12 profil de rkfbrence: Chemin parcouru par le capteur,
d/intersection.
NOTE - La forme du profil de reference est la realisation pratique du profil theorique exact. Ses ecart dependent des defauts
de la reference de guidage ainsi que des perturbations internes et externes.
Representation numerique du profil trace rapportee au profil de reference, avec les
3.1.3 profil total:
coordonnees horizontales et verticales correspondantes.
NOTE - be profil total est caracterise par des pas de numerisation horizontal et vertical.
3.1.4 profil primaire: Profil issu du profil total apres application du filtre de longueur d ’onde courte, ils
NOTES
1 Le profil primaire est la base du traitement numerique du profil au moyen d ’un filtre de profil et du calcul des parametres
conformement a I ’ISO 4287. II est caracterise par des pas de numerisation horizontal et vertical qui peuvent etre differents de
ceux du profil total.
2 La forme des moindres carres optimisee, du type indique dans la specification, ne fait pas partie du profil primaire, et il
convient qu ’elle soit retiree avant l’application des filtres. Pour un cercle, il convient que le rayon fasse partie de l’optimisation
des moindres car&, au lieu d ’etre maintenu a sa valeur nominale.
3 La forme nominale est eliminee avant que le profil primaire soit obtenu
3.1.5 profil rbsiduel: Profil primaire obtenu en parcourant une surface idealement lisse et plane (verre plan)
NOTE - Le profil residue1 est compose des &arts de la reference de guidage, des perturbations internes et externes et des
&arts dans la transmission du profil. La determination des causes de ces &arts n ’est pas normalement possible sans un
equipement special et un environnement approprie.
1) A publier.
2
---------------------- Page: 6 ----------------------
tS0 3274:1996(F)
aJ
.-
c
L
0
c
CD-
(LI
.-
c
L
0
,"
+G&
aJ-
\O
L
t
U
c
aJ W
:
rncs
t
0
I
qi=
L
(um
+ u .o G
ru;rgz
k+
& ‘D aJ a
6
o”EEz
J
.-
rc
0
t
k
5
I
2
-- aJ
2
0 aJ
di
-A
fu E u
U
6;L:
.-
t
ti
) '
E aJ >
2
I
:c-
0 aJ s
.-
L
$z
E--J
ii 02
aJm
0;;1 .-
+ u .-
cc
ruli;F E fu u
t&e aJ a
E tx
m
8-z<
cl-l
k
El
Figure 1 -
Reprbentation schbmatique d ’un appareil 6 palpeur
3
---------------------- Page: 7 ----------------------
0 IS0
IS0 3274: 1996(-F)
3.2 appareil 5 palpeur: Appareil de mesure qui explore la surface avec un palpeur, enregistre les &arts du profil
de la surface, calcule des paramgtres et peut enregistrer le profil (voir figure 1).
NOTE - La figure 1 represente seulement les operateurs essentiels necessaires dans un systeme de mesure theoriquement
exact. Les interrelations entre les operateurs peuvent faire I ’objet de considerations liees 2 la conception. II convient done de
ne pas considerer cette figure comme le seul type de configuration theoriquement exacte.
32.1 appareil & palpeur avec mesure de dbplacements et enregistrement numbrique: Appareil a palpeur dont
le profil qui en est issu contient des &arts incluant les composantes de longueur d ’onde longue et celles dues au
dkgauchissage.
NOTE - Le profil est enregistre numeriquement et, s ’il est filtre, il I ’est par un filtre 3 phase correcte. Les parametres sont
calcules numeriquement et le profil est enregistre par un systeme graphique excluant toute deformation.
3.3 Composants d ’un appareil 5 palpeur
3.3.1 chaine de mesure: Cha ’ine ferm6e qui comprend tous les Mments mitcaniques reliant la piece a mesurer
et la pointe du palpeur, par exemple moyens de positionnement, fixation de la pi&e, dispositif de mesure, uniti!
d ’avance, capteur (pick-up). (Voir figure 2.)
La chalne de mesure est soumise 2 des perturbations internes et externes et les transmet au profil de reference.
NOTE -
L ’influence de ces perturbations depend du montage de mesure, de I ’environnement et de I ’habilete de I ’operateur. Ces
perturbations influencent fortement le profil residuel.
3.32 rbfbrence de guidage: Composant de I ’appareil qui geni?re le plan d ’intersection et guide le capteur dans ce
plan selon une trajectoire thkoriquement exacte (profil de rbference), qui est g&Gralement une ligne droite.
NOTE - Cette reference est un element essentiel de I ’unite d ’avance; elle peut etre partiellement incluse dans le capteur
Pour I ’utilisation de patins, voir l’annexe A.
Colonne
Chabedemesure
,,- Unit6 d'avance
\
Base
Figure 2 - Exemple de chaine de mesure d ’un appareil 5 palpeur
---------------------- Page: 8 ----------------------
IS0 3274:1996(F)
3.3.3 unit6 d ’avance: Composant de I ’appareil qui dkplace le capteur le long de la rbfkrence de guidage, ce
dernier transmettant la position horizontale de la pointe du palpeur sous forme de coordonnee horizontale du profil.
NOTE - Les unites d ’avance sont caracterisees par leur plus longue course selectionnable.
3.3.4 capteur (pick-up): Composant de I ’appareil qui contient I ’element de palpage, avec la pointe du palpeur, et
le transducteur.
3.3.5 Mment de palpage: Element qui transmet le deplacement de la pointe du palpeur au transducteur.
3.3.6 pointe du palpeur: clement constitue d ’un c6ne nominalement circulaire ayant un angle defini et d ’une
extremit6 nominalement sphbrique avec un rayon defini.
NOTE - C ’est un element intervenant dans I ’acquisition du profil avec des appareils a palpeur
3.3.7 transducteur: Dispositif qui convertit les coordonnees verticales du profil trace par rapport au profil de
reference en un signal utilise dans I ’appareil.
NOTE - Le transducteur ne provoque pas de modification intentionnelle du profil
3.3.8 amplificateur: Dispositif qui effectue une transformation du signal dans l’appareil sans provoquer de
modification intentionnelle du profil.
3.3.9 convertisseur analogique-numbrique (ADC): Dispositif qui convertit le signal de l’appareil en valeurs
numeriques.
NOTE - Lorsque celles-ci sont associees aux coordonnees horizontales correspondantes, elles constituent le profil total
Le convertisseur analogique-numerique ne provoque pas de modification intentionnelle du profil.
3.3.10 entrbe de donnkes: Interface que I ’appareil peut avoir et qui permet I ’entree d ’un ou de plusieurs types de
profils depuis un ordinateur exterieur.
3.3.11 sortie de donnbes: Interface que I ’appareil peut avoir et qui permet la sortie d ’un ou de plusieurs types de
profils vers un ordinateur exterieur.
3.3.12 filtrage et bvaluation du profil: Operations realisees sur des profils primaire, de rugosite et d ’ondulation
au moyen de parametres et de fonctions caracteristiques, conformement a I ’ISO 4287, I ’ISO 11562, I ’ISO 12085,
I ’ISO 13565-1, I ’ISO 13565-2 et I ’ISO 13565-3.
NOTE - La valeur nominale de la longueur de base est egale a la longueur d ’onde de coupure AC
3.3.13 enregistreur de profil: Enregistreur que I ’appareil peut avoir et qui permet la sortie d ’un ou de plusieurs
types de profils et/au des valeurs des parametres.
3.4 Caractkristiques mktrologiques de I’appareil
3.4.1 force de mesure statique: Force exercee par la pointe du palpeur lorsqu ’elle repose sur la surface dans sa
position moyenne.
3.4.2 variation de la force de mesure statique: Variation de la force de mesure lors du dkplacement de la pointe
du palpeur.
NOTE -
Normalement, cette variation est proportionnelle au deplacement.
3.4.3
force de mesure dynamique: Force rksultant de I ’ac&l&ation de la pointe du palpeur quand elle parcourt la
surface.
NOTE - Les forces dynamiques se superposent a la force de mesure statique
5
---------------------- Page: 9 ----------------------
@ IS0
IS0 3274:1996(F)
3.4.4 hysteresis: Difference entre les deplacements indiques de la pointe du palpeur, pour le meme deplacement
reel, respectivement vers I ’interieur et I ’exterieur de la mat&e.
3.4.5 fonction de transmission pour un signal sinuso ’idal: Fonction qui, pour une vitesse de palpage donnee,
depend a la fois de la longueur d ’onde et de I ’amplitude du profil a mesurer.
NOTES
1 Afin de caracteriser cette transmission, il convient que la plus petite longueur d ’onde sin
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.