ISO/IEC 10373-6:2011

Identification cards — Test methods — Part 6: Proximity cards

ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. ISO/IEC 10373-6:2011 defines test methods which are specific to proximity cards and objects, and proximity coupling devices defined in ISO/IEC 14443-1:2008, ISO/IEC 14443-2:2010, ISO/IEC 14443-3:2011 and ISO/IEC 14443-4:2008. ISO/IEC 10373-1 defines test methods which are common to one or more integrated circuit card technologies and other parts deal with other technology-specific tests.

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité

General Information

• Status: Withdrawn
• Publication Date: 06-Jan-2011
• Withdrawal Date: 06-Jan-2011
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 18-Jul-2016

Relations

• Revised: ISO/IEC 10373-6:2016 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 22-Mar-2014
• Amended By: ISO/IEC 10373-6:2011/Amd 3:2012 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Exchange of additional parameters, block numbering, unmatched AFI and TR2
• Effective Date: 10-Jul-2021
• Amended By: ISO/IEC 10373-6:2011/Amd 1:2012 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Additional PICC classes
• Effective Date: 04-Dec-2021
• Amended By: ISO/IEC 10373-6:2011/FDAmd 5 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of 3fc/4, fc, 3fc/2 and 2fc from PCD to PICC
• Effective Date: 09-May-2020
• Amended By: ISO/IEC 10373-6:2011/Amd 4:2012 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Bit rates of fc/8, fc/4 and fc/2 and frame size from 512 to 4096 bytes
• Effective Date: 09-May-2020
• Amended By: ISO/IEC 10373-6:2011/Amd 2:2012 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Test methods for electromagnetic disturbance
• Effective Date: 28-Aug-2021
• Amended By: ISO/IEC 10373-6:2011/FDAmd 6 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 6: Alternating between PICC and PCD functionalities, and PICC supporting both types
• Effective Date: 07-Aug-2021
• Revises: ISO/IEC 10373-6:2001 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 26-Sep-2008
• Revises: ISO/IEC 10373-6:2001/Amd 4:2006 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 4: Additional test methods for PCD RF interface and PICC alternating field exposure
• Effective Date: 26-Sep-2008
• Revises: ISO/IEC 10373-6:2001/Amd 3:2006 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 3: Protocol test methods for proximity coupling devices
• Effective Date: 26-Sep-2008
• Revises: ISO/IEC 10373-6:2001/Amd 5:2007 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 5: Bit rates of fc/64, fc/32 and fc/16
• Effective Date: 26-Sep-2008
• Revises: ISO/IEC 10373-6:2001/Amd 2:2003 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods
• Effective Date: 26-Sep-2008
• Revises: ISO/IEC 10373-6:2001/Amd 1:2007 - Identification cards — Test methods — Part 6: Proximity cards — Amendment 1: Protocol test methods for proximity cards
• Effective Date: 26-Sep-2008

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-6
Second edition
2011-01-15


Identification cards — Test methods —
Part 6:
Proximity cards
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité




Reference number
ISO/IEC 10373-6:2011(E)
©
ISO/IEC 2011

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ISO/IEC 10373-6:2011(E)
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ii © ISO/IEC 2011 – All rights reserved

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ISO/IEC 10373-6:2011(E)
Contents
Foreword .vi
1 Scope.1
2 Normative references.1
3 Terms, definitions, symbols and abbreviated terms .2
3.1 Terms and definitions .2
3.2 Symbols and abbreviated terms.3
4 Default items applicable to the test methods.5
4.1 Test environment.5
4.2 Pre-conditioning.5
4.3 Default tolerance .6
4.4 Spurious Inductance.6
4.5 Total measurement uncertainty.6
5 Apparatus and circuits for test of ISO/IEC 14443-1 and ISO/IEC 14443-2 parameters.6
5.1 Minimum requirements for measurement instruments.6
5.1.1 Oscilloscope .6
5.2 Calibration coil.6
5.2.1 Size of the calibration coil card .6
5.2.2 Thickness and material of the calibration coil card.7
5.2.3 Coil characteristics .7
5.3 Test PCD assembly .7
5.3.1 Test PCD antenna.8
5.3.2 Sense coils.8
5.3.3 Assembly of Test PCD .8
5.4 Reference PICC.9
5.4.1 Dimensions of the Reference PICC .9
5.4.2 Reference PICC construction.10
5.4.3 Reference PICC resonance frequency tuning .11
6 Test of ISO/IEC 14443-1 parameters.12
6.1 PCD tests.12
6.1.1 Alternating magnetic field .12
6.2 PICC tests.12
6.2.1 Alternating magnetic field .12
6.2.2 Static electricity test.13
7 Test of ISO/IEC 14443-2 parameters.14
7.1 PCD tests.14
7.1.1 PCD field strength .14
7.1.2 PCD field strength supporting operation with "Class 1" PICCs.15
7.1.3 Power transfer PCD to PICC.16
7.1.4 Modulation index and waveform.16
7.1.5 Load modulation reception .17
7.2 PICC tests.18
7.2.1 PICC transmission.18
7.2.2 PICC reception.19
7.2.3 PICC resonance frequency (informative).21
7.2.4 "Class 1" PICC maximum loading effect.21
8 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters.22
8.1 PCD tests.22
8.2 PICC tests.22
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ISO/IEC 10373-6:2011(E)
Annex A (normative) Test PCD Antenna. 23
A.1 Test PCD Antenna layout including impedance matching network. 23
A.2 Impedance matching network . 27
A.2.1 Impedance matching network for a bit rate of fc/128. 27
A.2.2 Impedance matching network for bit rates of fc/64, fc/32 and fc/16. 28
Annex B (informative) Test PCD Antenna tuning. 29
Annex C (normative) Sense coil . 31
C.1 Sense coil layout. 31
C.2 Sense coil assembly. 32
Annex D (normative) Reference PICC antenna layout . 33
Annex E (normative) Modulation index and waveform analysis tool . 34
E.1 Overview. 34
E.2 Sampling. 34
E.3 Filtering. 35
E.4 Envelope generation . 36
E.5 Envelope smoothing . 36
E.6 Modulation index determination . 36
E.7 Timing determination . 36
E.8 Overshoot and undershoot determination. 37
E.9 Program of the modulation index and waveform analysis tool (informative) . 37
E.9.1 structures.h . 38
E.9.2 fftrm.h. 39
E.9.3 fftrm.c. 40
E.9.4 hilbert.h. 44
E.9.5 hilbert.c . 45
E.9.6 functs.c . 52
Annex F (informative) Program for the evaluation of the spectrum . 80
Annex G (normative) Additional PICC test methods . 85
G.1 PICC-test-apparatus and accessories . 85
G.1.1 Emulating the I/O protocol. 85
G.1.2 Generating the I/O character timing in reception mode . 85
G.1.3 Measuring and monitoring the RF I/O protocol. 85
G.1.4 Protocol Analysis. 85
G.1.5 RFU fields . 85
G.2 Relationship of test methods versus base standard requirement . 86
G.3 Test method for initialization of the PICC Type A .87
G.3.1 Introduction. 87
G.3.2 Scenario G.1: Polling. 87
G.3.3 Testing of the PICC Type A state transitions. 88
G.3.4 Scenario G.13: Handling of Type A anticollision. 109
G.3.5 Handling of RATS . 110
G.3.6 Handling of PPS request. 110
G.3.7 Scenario G.20: Handling of FSD. 111
G.4 Test method for initialization of the PICC Type B . 112
G.4.1 Introduction. 112
G.4.2 Scenario G.21: Polling. 112
G.4.3 Scenario G.22: PICC Reception. 113
G.4.4 Testing of the PICC Type B state transitions. 114
G.4.5 Scenario G.28: Handling of Type B anticollision. 124
G.4.6 Handling of ATTRIB. 126
G.4.7 Scenario G.31: Handling of Maximum Frame Size. 127
G.5 Test methods for logical operation of the PICC Type A or Type B . 127
G.5.1 Introduction. 127
G.5.2 PICC reaction to ISO/IEC 14443-4 Scenarios . 128
G.5.3 Handling of PICC error detection. 138
G.5.4 PICC reaction on CID. 140
G.5.5 PICC reaction on NAD . 142
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ISO/IEC 10373-6:2011(E)
G.6 Reported results.143
Annex H (normative) Additional PCD test methods.147
H.1 PCD-test-apparatus and accessories.147
H.1.1 Test method .147
H.1.2 PCD-test-apparatus structure .147
H.1.3 PCD-test-apparatus interface.148
H.1.4 Emulating the I/O protocol .148
H.1.5 Generating the I/O character timing in transmission mode.148
H.1.6 Measuring and monitoring the RF I/O protocol.149
H.1.7 Protocol Analysis .149
H.1.8 Protocol activation procedure .149
H.1.9 Scenario.149
H.1.10 UT, LT and PCD behavior .150
H.1.11 Relationship of test methods versus base standard requirement.151
H.2 Type A specific test methods.151
H.2.1 Frame delay time PICC to PCD .151
H.2.2 Request Guard Time .152
H.2.3 Handling of bit collision during ATQA .153
H.2.4 Handling of anticollision loop .153
H.2.5 Handling of RATS and ATS .157
H.2.6 Handling of PPS response .160
H.2.7 Frame size selection mechanism .161
H.2.8 Handling of Start-up Frame Guard Time.163
H.2.9 Handling of the CID during activation by the PCD.164
H.3 Type B specific test methods.165
H.3.1 I/O transmission timing.165
H.3.2 Frame size selection mechanism .166
H.3.3 Handling of the CID during activation by the PCD.167
H.4 Test method for logical operations of the PCD.169
H.4.1 Handling of the polling loop.169
H.4.2 Reaction of the PCD to request for waiting time extension.170
H.4.3 Error detection and recovery .173
H.4.4 Handling of NAD during chaining.182
H.5 Continuous monitoring of packets sent by the PCD .183
H.5.1 RFU fields.183
H.5.2 RFU values .183
H.5.3 R-block.183
H.5.4 S-block.183
H.5.5 PCB.183
H.5.6 Type A initialization frames.183
H.5.7 Apparatus.183
H.5.8 Procedure.183
H.5.9 Test report.184
H.6 Reported results.184
Annex I (normative) High bit rate selection test methods for PCD .188
I.1 Apparatus.188
I.2 Procedure.188
I.2.1 Procedure for Type A.188
I.2.2 Procedure for Type B.193
Bibliography.199

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ISO/IEC 10373-6:2011(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
ISO/IEC 10373-6 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 17, Cards and personal identification.
This second edition cancels and replaces the first edition (ISO/IEC 10373-6:2001), which has been
technically revised. It also includes the Amendments ISO/IEC 10373-6:2001/Amd.1:2007,
ISO/IEC 10373-6:2001/Amd.2:2003, ISO/IEC 10373-6:2001/Amd.3:2006, ISO/IEC 10373-6:2001/Amd.4:2006
and ISO/IEC 10373-6:2001/Amd.5:2007.
ISO/IEC 10373 consists of the following parts, under the general title Identification cards — Test methods:
⎯ Part 1: General characteristics
⎯ Part 2: Cards with magnetic stripes
⎯ Part 3: Integrated circuit cards with contacts and related interface devices
⎯ Part 5: Optical memory cards
⎯ Part 6: Proximity cards
⎯ Part 7: Vicinity cards
⎯ Part 8: USB-ICC
⎯ Part 9: Optical memory cards — Holographic recording method
vi © ISO/IEC 2011 – All rights reserved

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INTERNATIONAL STANDARD ISO/IEC 10373-6:2011(E)

Identification cards — Test methods —
Part 6:
Proximity cards
1 Scope
ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition given
in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, which can be
ISO/IEC 7810 or one or more of the supplementary standards that define the information storage technologies
employed in identification card applications.
NOTE 1 Criteria for acceptability do not form part of ISO/IEC 10373, but will be found in the International Standards
mentioned above.
NOTE 2 Test methods defined in this part of ISO/IEC 10373 are intended to be performed separately. A given proximity
card or object, or proximity coupling device, is not required to pass through all the tests sequentially.
This part of ISO/IEC 10373 defines test methods which are specific to proximity cards and objects, and
proximity coupling devices, defined in ISO/IEC 14443-1:2008, ISO/IEC 14443-2:2010, ISO/IEC 14443-3:—
and ISO/IEC 14443-4:2008. ISO/IEC 10373-1 defines test methods which are common to one or more
integrated circuit card technologies and other parts deal with other technology-specific tests.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
ISO/IEC 7810:2003, Identification cards — Physical characteristics
ISO/IEC 14443-1:2008, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 1: Physical characteristics
ISO/IEC 14443-2:2010, Identification cards — Contactless integrated circuit cards — Proximity cards — Part 2:
Radio frequency power and signal interface
1)
ISO/IEC 14443-3:— , Identification cards — Contactless integrated circuit cards — Proximity cards — Part 3:
Initialization and anticollision
ISO/IEC 14443-4:2008, Identification cards — Contactless integrated circuit cards — Proximity cards —
Part 4: Transmission protocol
IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) — Part 4-2: Testing and measurement techniques —
Electrostatic discharge immunity test

1) To be published.
© ISO/IEC 2011 – All rights reserved 1

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ISO/IEC 10373-6:2011(E)
3 Terms, definitions, symbols and abbreviated terms
For the purposes of this document, the terms
...