ISO 17987-7:2025

Road vehicles — Local Interconnect Network (LIN) — Part 7: Electrical physical layer (EPL) conformance test specification

This document specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. The purpose of this document is to provide a standardised way to verify whether a LIN bus driver conforms to ISO 17987-4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different sources in a system environment. This document provides all the necessary technical information to ensure that test results are consistent even on different test systems, provided that the particular test suite and the test system are conformant to the content of this document.

Véhicules routiers — Réseau Internet local (LIN) — Partie 7: Spécification d'essai de conformité de la couche électrique physique (EPL)

General Information

• Status: Published
• Publication Date: 27-May-2025
• ICS: 43.040.15 - Car informatics. On board computer systems
• Technical Committee: ISO/TC 22/SC 31 - Data communication
• Drafting Committee: ISO/TC 22/SC 31 - Data communication
• Current Stage: 6060 - International Standard published
• Start Date: 28-May-2025
• Due Date: 30-May-2025
• Completion Date: 28-May-2025

Relations

• Revises: ISO 17987-7:2016 - Road vehicles — Local Interconnect Network (LIN) — Part 7: Electrical Physical Layer (EPL) conformance test specification
• Effective Date: 06-Jun-2022

Standards Content (Sample)

International
Standard
ISO 17987-7
Second edition
Road vehicles — Local Interconnect
2025-05
Network (LIN) —
Part 7:
Electrical physical layer (EPL)
conformance test specification
Véhicules routiers — Réseau Internet local (LIN) —
Partie 7: Spécification d'essai de conformité de la couche
électrique physique (EPL)
Reference number
© ISO 2025
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii
Contents Page
Foreword .vi
Introduction .vii
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions .1
3.2 Symbols .2
3.3 Abbreviated terms .4
4 General . 5
4.1 Auto addressing procedures .5
4.2 Conventions .5
5 EPL 12 V LIN class A and class B devices with RX and TX access . 6
5.1 Test specification overview .6
5.1.1 Test case organization .6
5.1.2 Measurement and signal generation requirements .6
5.2 Operational conditions — Calibration .7
5.2.1 Electrical input/output, LIN protocol .7
5.2.2 [EPL–CT 1] Operating voltage range .7
5.2.3 Threshold voltages .9
5.2.4 [EPL–CT 5] Variation of V .14
SUP_NON_OP
5.2.5 I under several conditions . 15
BUS
5.2.6 Slope control .18
5.2.7 Propagation delay . . . 22
5.2.8 Supply voltage offset . 23
5.2.9 Failure . 28
5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference — IUT as
responder . 29
5.3 Operation mode termination .31
5.3.1 General .31
5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as responder .32
5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as commander . 33
5.4 Static test cases . 33
6 EPL 12 V LIN class C devices with RX and TX access .37
6.1 Test specification overview .37
6.2 Communication scheme .37
6.2.1 General .37
6.2.2 IUT as responder .37
6.2.3 IUT as commander . 38
6.2.4 IUT class C device . 38
6.3 Test case organization .41
6.4 Measurement and signal generation — Requirements .41
6.4.1 Data generation .41
6.4.2 Various requirements .43
6.5 Operational conditions — Calibration . 44
6.5.1 Electrical input/output, LIN protocol . 44
6.5.2 [EPL–CT 25] Operating voltage range . 44
6.5.3 Threshold voltages . 46
6.5.4 [EPL–CT 29] Variation of V ∈ [–0,3 V to 7,0 V], [18 V to 40 V] . 50
SUP_NON_OP
6.5.5 I under several conditions .51
BUS
6.5.6 Slope control . 55
6.5.7 Propagation delay . . .59
6.5.8 Supply voltage offset . 65
6.5.9 Failure .74

iii
6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference — IUT as
responder .76
6.6 Operation mode termination . 78
6.6.1 General . 78
6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as responder . 79
6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as commander . 79
6.7 Static test cases . 79
7 EPL 24 V LIN class A and class B devices with RX and TX access .83
7.1 Test specification overview . 83
7.1.1 Test case organization . 83
7.1.2 Measurement and signal generation — Requirements . 84
7.2 Operational conditions — Calibration . 84
7.2.1 Electrical input/output, LIN protocol . 84
7.2.2 [EPL–CT 51] Operating voltage range . 85
7.2.3 Threshold voltages . 86
7.2.4 [EPL–CT 55] Variation of V .91
SUP_NON_OP
7.2.5 I under several conditions . 92
BUS
7.2.6 Slope control . 95
7.2.7 Propagation delay . . . 98
7.2.8 Supply voltage offset . 99
7.2.9 Failure .
...