Road vehicles -- Local Interconnect Network (LIN)

ISO 17987-7:2016 specifies the conformance test for the electrical physical layer (EPL) of the LIN communications system. It is part of this document to define a test that considers ISO 9646 and ISO 17987‑4. The purpose of ISO 17987-7:2016 is to provide a standardized way to verify whether a LIN bus driver is compliant to ISO 17987?4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different sources in a system environment. ISO 17987-7:2016 provides all the necessary technical information to ensure that test results are consistent even on different test systems, provided that the particular test suite and the test system are compliant to the content of this document.

Véhicules routiers -- Réseau Internet local (LIN)

General Information

Status
Published
Publication Date
13-Dec-2016
Current Stage
6060 - International Standard published
Start Date
26-Oct-2016
Completion Date
14-Dec-2016
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INTERNATIONAL ISO
STANDARD 17987-7
First edition
2016-12-01
Road vehicles — Local Interconnect
Network (LIN) —
Part 7:
Electrical Physical Layer (EPL)
conformance test specification
Véhicules routiers — Réseau Internet local (LIN) —
Partie 7: Spécification d’essai de conformité de la couche électrique
physique (EPL)
Reference number
ISO 17987-7:2016(E)
ISO 2016
---------------------- Page: 1 ----------------------
ISO 17987-7:2016(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2016, Published in Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form

or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior

written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of

the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2016 – All rights reserved
---------------------- Page: 2 ----------------------
ISO 17987-7:2016(E)
Contents Page

Foreword ..........................................................................................................................................................................................................................................v

Introduction ................................................................................................................................................................................................................................vi

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms, definitions, symbols and abbreviated terms ....................................................................................................... 1

3.1 Terms and definitions ....................................................................................................................................................................... 1

3.2 Symbols ......................................................................................................................................................................................................... 1

3.3 Abbreviated terms ............................................................................................................................................................................... 4

4 Conventions ............................................................................................................................................................................................................... 5

5 EPL 12 V LIN devices with RX and TX access ........................................................................................................................... 5

5.1 Test specification overview .......................................................................................................................................................... 5

5.1.1 Test case organization ................................................................................................................................................. 5

5.1.2 Measurement and signal generation requirements .......................................................................... 6

5.2 Operational conditions — Calibration ................................................................................................................................ 7

5.2.1 Electrical input/output, LIN protocol ............................................................................................................ 7

5.2.2 [EPL–CT 1] Operating voltage range .............................................................................................................. 7

5.2.3 Threshold voltages ......................................................................................................................................................... 8

5.2.4 [EPL–CT 5] Variation of V .................. ..........................................................................................

SUP_NON_OP 12

5.2.5 I under several conditions ............................................................................................................................13

BUS

5.2.6 Slope control .....................................................................................................................................................................16

5.2.7 Propagation delay ........................................................................................................................................................19

5.2.8 Supply voltage offset..................................................................................................................................................21

5.2.9 Failure ....................................................................................................................................................................................28

5.2.10 [EPL–CT 22] Verifying internal capacitance and dynamic interference —

IUT as slave ........................................................................................................................................................................30

5.3 Operation mode termination ...................................................................................................................................................32

5.3.1 General...................................................................................................................................................................................32

5.3.2 [EPL–CT 23] Measuring internal resistor — IUT as slave .........................................................33

5.3.3 [EPL–CT 24] Measuring internal resistor — IUT as master ....................................................34

5.4 Static test cases ....................................................................................................................................................................................34

6 EPL 12 V LIN devices without RX and TX access ...............................................................................................................38

6.1 Test specification overview .......................................................................................................................................................38

6.2 Communication scheme ...............................................................................................................................................................38

6.2.1 General...................................................................................................................................................................................38

6.2.2 IUT as slave ........................................................................................................................................................................38

6.2.3 IUT as master ...................................................................................................................................................................39

6.2.4 IUT class C device .........................................................................................................................................................40

6.3 Test case organization ...................................................................................................................................................................42

6.4 Measurement and signal generation — Requirements ....................................................................................43

6.4.1 Data generation ...................................................................... ........................................................................................43

6.4.2 Various requirements ...............................................................................................................................................45

6.5 Operational conditions — Calibration .............................................................................................................................45

6.5.1 Electrical input/output, LIN protocol .........................................................................................................45

6.5.2 [EPL–CT 25] Operating voltage range ........................................................................................................45

6.5.3 Threshold voltages ......................................................................................................................................................47

6.5.4 [EPL–CT 29] Variation of V ∈ [–0,3 V to 7,0 V], [18 V to 40 V] ...................51

SUP_NON_OP

6.5.5 I under several conditions ............................................................................................................................52

BUS

6.5.6 Slope control .....................................................................................................................................................................55

6.5.7 [EPL–CT 35] Propagation delay .......................................................................................................................59

6.5.8 Supply voltage offset..................................................................................................................................................65

6.5.9 Failure ....................................................................................................................................................................................74

© ISO 2016 – All rights reserved iii
---------------------- Page: 3 ----------------------
ISO 17987-7:2016(E)
6.5.10 [EPL–CT 48] Verifying internal capacitance and dynamic interference —

IUT as slave ........................................................................................................................................................................76

6.6 Operation mode termination ...................................................................................................................................................78

6.6.1 General...................................................................................................................................................................................78

6.6.2 [EPL–CT 49] Measuring internal resistor — IUT as slave .........................................................79

6.6.3 [EPL–CT 50] Measuring internal resistor — IUT as master ....................................................79

6.7 Static test cases ....................................................................................................................................................................................79

7 EPL 24 V LIN devices with RX and TX access ........................................................................................................................82

7.1 Test specification overview .......................................................................................................................................................83

7.1.1 Test case organization ..............................................................................................................................................83

7.1.2 Measurement and signal generation — Requirements ...............................................................83

7.2 Operational conditions — Calibration .............................................................................................................................84

7.2.1 Electrical input/output, LIN protocol .........................................................................................................84

7.2.2 [EPL–CT 51] Operating voltage range ........................................................................................................84

7.2.3 Threshold voltages ......................................................................................................................................................86

7.2.4 [EPL–CT 55] Variation of V ........................................................................................................

SUP_NON_OP 90

7.2.5 I under several conditions ............................................................................................................................91

BUS

7.2.6 Slope control .....................................................................................................................................................................94

7.2.7 Propagation delay ........................................................................................................................................................97

7.2.8 Supply voltage offset..................................................................................................................................................98

7.2.9 Failure .................................................................................................................................................................................112

7.2.10 [EPL–CT 80] Verifying internal capacitance and dynamic interference —

IUT as slave .....................................................................................................................................................................114

7.3 Operation mode termination ................................................................................................................................................116

7.3.1 General................................................................................................................................................................................116

7.3.2 [EPL–CT 81] Measuring internal resistor — IUT as slave ......................................................117

7.3.3 [EPL–CT 82] Measuring internal resistor — IUT as master .................................................117

7.4 Static test cases .................................................................................................................................................................................118

8 EPL 24 V LIN devices without RX and TX access ...........................................................................................................121

8.1 Test specification overview ....................................................................................................................................................121

8.2 Communication scheme ............................................................................................................................................................121

8.2.1 Overview ...........................................................................................................................................................................121

8.2.2 IUT as slave .....................................................................................................................................................................122

8.2.3 IUT as master ................................................................................................................................................................122

8.2.4 IUT Class C device .....................................................................................................................................................123

8.3 Test case organization ................................................................................................................................................................125

8.4 Measurement and signal generation — Requirements .................................................................................126

8.4.1 Data generation ...................................................................... .....................................................................................126

8.4.2 Various requirements ............................................................................................................................................128

8.5 Operational conditions — Calibration ..........................................................................................................................128

8.5.1 Electrical input/output, LIN protocol ......................................................................................................128

8.5.2 [EPL–CT 83] Operating voltage range .....................................................................................................128

8.5.3 Threshold voltages ...................................................................................................................................................130

8.5.4 [EPL–CT 87] Variation of V ∈ [–0,3 V to 7,0 V], [18 V to 58 V] ................135

SUP_NON_OP

8.5.5 I under several conditions .........................................................................................................................137

BUS

8.5.6 Slope control ..................................................................................................................................................................141

8.5.7 [EPL–CT 93] Propagation delay ....................................................................................................................146

8.5.8 Supply voltage offset...............................................................................................................................................151

8.5.9 Failure .................................................................................................................................................................................164

8.5.10 [EPL–CT 106] Verifying internal capacitance and dynamic interference —

IUT as slave .....................................................................................................................................................................166

8.6 Operation mode termination ................................................................................................................................................167

8.6.1 General................................................................................................................................................................................167

8.6.2 [EPL–CT 107] Measuring internal resistor — IUT as slave ..................................................168

8.6.3 [EPL–CT 108] Measuring internal resistor — IUT as master .............................................168

8.7 Static test cases .................................................................................................................................................................................169

Bibliography .........................................................................................................................................................................................................................172

iv © ISO 2016 – All rights reserved
---------------------- Page: 4 ----------------------
ISO 17987-7:2016(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www.iso.org/patents).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation on the meaning of ISO specific terms and expressions related to conformity assessment,

as well as information about ISO’s adherence to the World Trade Organization (WTO) principles in the

Technical Barriers to Trade (TBT) see the following URL: www.iso.org/iso/foreword.html.

The committee responsible for this document is ISO/TC 22, Road vehicles, Subcommittee SC 31, Electrical

and electronic equipment.
A list of all parts in the ISO 17987 series can be found on the ISO website.
© ISO 2016 – All rights reserved v
---------------------- Page: 5 ----------------------
ISO 17987-7:2016(E)
Introduction

The LIN protocol as proposed is an automotive focused low-speed universal asynchronous receiver

transmitter (UART)-based network. Some of the key characteristics of the Local Interconnect Network

(LIN) protocol are signal-based communication, schedule table-based frame transfer, master/slave

communication with error detection, node configuration and diagnostic service transportation.

The LIN protocol is for low-cost automotive control applications, for example, door module and air

condition systems. It serves as a communication infrastructure for low-speed control applications in

vehicles by providing

— signal-based communication to exchange information between applications in different nodes,

— bitrate support from 1 kbit/s to 20 kbit/s,
— deterministic schedule table-based frame communication,

— network management that wakes up and puts the LIN cluster into sleep mode in a controlled manner,

— status management that provides error handling and error signalling,

— transport layer that allows large amount of data to be transported (such as diagnostic services),

— specification of how to handle diagnostic services,
— electrical physical layer specifications,
— node description language describing properties of slave nodes,
— network description file describing behaviour of communication, and
— application programmer’s interface.

ISO 17987 (all parts) is based on the open systems interconnection (OSI) basic reference model as

specified in ISO/IEC 7498–1 which structures communication systems into seven layers.

The OSI model structures data communication into seven layers called (top down) application layer

(layer 7), presentation layer, session layer, transport layer, network layer, data link layer and physical layer

(layer 1). A subset of these layers is used in ISO 17987 (all parts).

ISO 17987 (all parts) distinguishes between the services provided by a layer to the layer above it and

the protocol used by the layer to send a message between the peer entities of that layer. The reason for

this distinction is to make the services, especially the application layer services and the transport layer

services, reusable also for other types of networks than LIN. In this way, the protocol is hidden from the

service user and it is possible to change the protocol if special system requirements demand it.

ISO 17987 (all parts) provides all documents and references required to support the implementation of

the requirements related to the following:

— ISO 17987–1: This part provides an overview of the ISO 17987 (all parts) and structure along

with the use case definitions and a common set of resources (definitions, references) for use by all

subsequent parts.

— ISO 17987–2: This part specifies the requirements related to the transport protocol and the network

layer requirements to transport the PDU of a message between LIN nodes.

— ISO 17987–3: This part specifies the requirements for implementations of the LIN protocol on the

logical level of abstraction. Hardware related properties are hidden in the defined constraints.

— ISO 17987–4: This part specifies the requirements for implementations of active hardware

components which are necessary to interconnect the protocol implementation.
vi © ISO 2016 – All rights reserved
---------------------- Page: 6 ----------------------
ISO 17987-7:2016(E)

— ISO/TR 17987–5: This part specifies the LIN application programmers interface (API) and the

node configuration and identification services. The node configuration and identification services

are specified in the API and define how a slave node is configured and how a slave node uses the

identification service.

— ISO 17987–6: This part specifies tests to check the conformance of the LIN protocol implementation

according to ISO 17987–2 and ISO 17987–3. This comprises tests for the data link layer, the network

layer and the transport layer.

— ISO 17987–7: This part specifies tests to check the conformance of the LIN electrical physical layer

implementation (logical level of abstraction) according to ISO 17987–4.
© ISO 2016 – All rights reserved vii
---------------------- Page: 7 ----------------------
INTERNATIONAL STANDARD ISO 17987-7:2016(E)
Road vehicles — Local Interconnect Network (LIN) —
Part 7:
Electrical Physical Layer (EPL) conformance test
specification
1 Scope

This document specifies the conformance test for the electrical physical layer (EPL) of the LIN

communications system. It is part of this document to define a test that considers ISO 9646 and

ISO 17987–4.

The purpose of this document is to provide a standardized way to verify whether a LIN bus driver is

compliant to ISO 17987–4. The primary motivation is to ensure a level of interoperability of LIN bus

drivers from different sources in a system environment.

This document provides all the necessary technical information to ensure that test results are

consistent even on different test systems, provided that the particular test suite and the test system are

compliant to the content of this document.
2 Normative references

The following documents are referred to in text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments) applies.

ISO 17987–4:2016, Road vehicles — Local Interconnect Network (LIN) — Part 4: Electrical Physical Layer

(EPL) specification 12V/24V
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions

For the purposes of this document, the terms and definitions in ISO 17987–4 and ISO 17987–6 apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp

NOTE This also includes the device classification of ISO 17987–6:2016, 5.6 into class A/B/C for the different

ECU and transceiver types.
3.2 Symbols
% Percentage
µs Microsecond
C1/2 capacitance
© ISO 2016 – All rights reserved 1
---------------------- Page: 8 ----------------------
ISO 17987-7:2016(E)
C capacitance in the communication line
COMMON
C` line capacitance
LINE
C total bus capacitance
BUS
C capacitance of master node
MASTER
C reference capacitance
REF
C RXD capacitance (LIN receiver, RXD capacitive load condition)
RXD
C capacitance of slave node
SLAVE
∈ mathematical symbol: replacement for “is an element of”
2 2 2 2
d V/dt second derivative of Voltage (Volt per second )
di/dt instantaneous rate of current change (amps per second)
D1/2 diode
D serial internal diode at transceiver IC
ser_int
D serial master diode
ser_master
F test system bit rate
I current into the ECU bus line
BUS
I current limitation for driver dominant state driver on V = V into ECU bus line
BUS_LIM BUS BAT_max
I current at ECU bus line when V is disconnected
BUS_NO_BAT BAT
I current at ECU bus line when V is disconnected
BUS_NO_GND GND_ECU
I current at ECU bus line when driver off (passive) at dominant LIN-bus-level
BUS_PAS_dom
(12 V LIN devices: V = 0 V and V = 12 V; 24 V LIN devices: V = 0 V and
BUS BAT BUS
V = 24 V)
BAT
I current at ECU bus line when driver off (passive) at recessive LIN-bus-level
BUS_PAS_rec
(12 V LIN devices: 8 V < V < 18 V; 8 V < V < 18 V; V ≥ V ;
BAT BUS BUS BAT
24 V LIN devices: 16 V < V < 36 V; 16 V < V < 36 V; V ≥ V )
BAT BUS BUS BAT
GND GND of ECU
Device
kΩ kilo ohm
kbit/s kilo bit per second
LEN total length of bus line
BUS
LIN LIN network
Bus
ms millisecond
nF nano farad
pF pico farad
pF/m pico farad per meter (line capacitance)
2 © ISO 2016 – All rights reserved
---------------------- Page: 9 ----------------------
ISO 17987-7:2016(E)
R1/2 resistor
R resistor in the communication line
COMMON
R total bus-resistor including all slave and master resistors
BUS
R = R ||R ||R ||to||R
BUS Master Slave1 Slave2 Sl
...

DRAFT INTERNATIONAL STANDARD
ISO/DIS 17987-7.2
ISO/TC 22/SC 31 Secretariat: DIN
Voting begins on: Voting terminates on:
2015-12-10 2016-03-10
Road vehicles — Local Interconnect Network (LIN) —
Part 7:
Electrical Physical Layer (EPL) conformance test
specification
Véhicules routiers — Réseau Internet local (LIN) —

Partie 7: Spécification d’essai de conformité de la couche électrique physique (EPL)

ICS: 43.040.15
THIS DOCUMENT IS A DRAFT CIRCULATED
FOR COMMENT AND APPROVAL. IT IS
THEREFORE SUBJECT TO CHANGE AND MAY
NOT BE REFERRED TO AS AN INTERNATIONAL
STANDARD UNTIL PUBLISHED AS SUCH.
IN ADDITION TO THEIR EVALUATION AS
BEING ACCEPTABLE FOR INDUSTRIAL,
TECHNOLOGICAL, COMMERCIAL AND
USER PURPOSES, DRAFT INTERNATIONAL
STANDARDS MAY ON OCCASION HAVE TO
BE CONSIDERED IN THE LIGHT OF THEIR
POTENTIAL TO BECOME STANDARDS TO
WHICH REFERENCE MAY BE MADE IN
Reference number
NATIONAL REGULATIONS.
ISO/DIS 17987-7.2:2015(E)
RECIPIENTS OF THIS DRAFT ARE INVITED
TO SUBMIT, WITH THEIR COMMENTS,
NOTIFICATION OF ANY RELEVANT PATENT
RIGHTS OF WHICH THEY ARE AWARE AND TO
PROVIDE SUPPORTING DOCUMENTATION. ISO 2015
---------------------- Page: 1 ----------------------
ISO/DIS 17987-7.2:2015(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2015, Published in Switzerland

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form

or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior

written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of

the requester.
ISO copyright office
Ch. de Blandonnet 8 • CP 401
CH-1214 Vernier, Geneva, Switzerland
Tel. +41 22 749 01 11
Fax +41 22 749 09 47
copyright@iso.org
www.iso.org
ii © ISO 2015 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/DIS 17987-7
Contents Page

Foreword ............................................................................................................................................................ iv

Introduction ......................................................................................................................................................... v

1 Scope ...................................................................................................................................................... 1

2 Normative references ............................................................................................................................ 1

3 Terms, definitions, symbols and abbreviated terms ......................................................................... 1

3.1 Terms and definitions ........................................................................................................................... 1

3.2 Symbols .................................................................................................................................................. 2

3.3 Abbreviated terms ................................................................................................................................. 5

4 Conventions ........................................................................................................................................... 6

5 Document overview ............................................................................................................................... 7

6 LIN devices with RX and TX access .................................................................................................... 8

6.1 Test specification overview .................................................................................................................. 8

6.2 Operational conditions – Calibration .................................................................................................. 9

6.3 Static test cases .................................................................................................................................. 32

7 LIN devices without RX and TX access ............................................................................................. 36

7.1 Test specification overview ................................................................................................................ 36

7.2 Communication scheme ..................................................................................................................... 36

7.3 Test case organisation ........................................................................................................................ 40

7.4 Measurement and signal generation – Requirements ..................................................................... 40

7.5 Operational conditions – Calibration ................................................................................................ 43

7.6 Operation mode termination .............................................................................................................. 86

7.7 Static test cases .................................................................................................................................. 88

8 EPL 24V LIN devices with RX and TX access ................................................................................... 92

8.1 Test specification overview ................................................................................................................ 92

8.2 Operational conditions – Calibration ................................................................................................ 93

8.3 Static test cases ................................................................................................................................ 120

9 EPL 24 V LIN devices without RX and TX access .......................................................................... 124

9.1 Test specification overview .............................................................................................................. 124

9.2 Communication scheme ................................................................................................................... 124

9.3 Test case organisation ...................................................................................................................... 128

9.4 Measurement and signal generation – Requirements ................................................................... 128

9.5 Operational conditions – Calibration .............................................................................................. 131

9.6 Static test cases ................................................................................................................................ 178

Bibliography .................................................................................................................................................... 182

Bibliography .................................................................................................................................................... 183

© ISO 2013 – All rights reserved iii
---------------------- Page: 3 ----------------------
ISO/DIS 17987-7
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies

(ISO member bodies). The work of preparing International Standards is normally carried out through ISO

technical committees. Each member body interested in a subject for which a technical committee has been

established has the right to be represented on that committee. International organizations, governmental and

non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the

International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.

International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.

The main task of technical committees is to prepare International Standards. Draft International Standards

adopted by the technical committees are circulated to the member bodies for voting. Publication as an

International Standard requires approval by at least 75 % of the member bodies casting a vote.

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. ISO shall not be held responsible for identifying any or all such patent rights.

ISO 17987-7 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3,

Electrical and electronic equipment.

ISO 17987 consists of the following parts, under the general title Road vehicles — Local interconnect network

(LIN):
 Part 1: General information and use case definition
 Part 2: Transport protocol and network layer services
 Part 3: Protocol specification
 Part 4: Electrical Physical Layer (EPL) specification 12 V / 24 V
 Part 5: Application Programmers Interface (API)
 Part 6: Protocol conformance test specification
 Part 7: Electrical Physical Layer (EPL) conformance test specification
iv © ISO 2013 – All rights reserved
---------------------- Page: 4 ----------------------
ISO/DIS 17987-7
Introduction

This document set specifies the use cases, the communication protocol and physical layer requirements of an

in-vehicle communication network called "Local Interconnect Network (LIN)".

The Local interconnect network (LIN) protocol as proposed is an automotive focused low speed UART-based

network (Universal Asynchronous Receiver Transmitter). Some of the key characteristics of the LIN protocol

are signal based communication, schedule table based frame transfer, master/slave communication with error

detection, node configuration and diagnostic service transportation.

The LIN protocol is for low cost automotive control applications, for example door module and air condition

systems. It serves as a communication infrastructure for low-speed control applications in vehicles by

providing:

 Signal based communication to exchange information between applications in different nodes;

 Bitrate support from 1 kbps to 20 kbps;
 Deterministic schedule table based frame communication;

 Network management that wakes up and puts the LIN cluster into sleep mode in a controlled manner;

 Status management that provides error handling and error signalling;

 Transport layer that allows large amount of data to be transported (such as diagnostic services);

 Specification of how to handle diagnostic services;
 Electrical physical layer specifications;
 Node description language describing properties of slave nodes;
 Network description file describing behaviour of communication;
 Application programmer's interface;

To achieve this, it is based on the Open Systems Interconnection (OSI) Basic Reference Model specified in

ISO/IEC 7498-1 and ISO/IEC 10731, which structures communication systems into seven layers. When

mapped on this model, the protocol and physical layer requirements specified by ISO 17987 are structured

according to Table°1.
© ISO 2013 – All rights reserved v
---------------------- Page: 5 ----------------------
ISO/DIS 17987-7
Table°1°—°LIN specifications applicable to the OSI layers
Vehicle manufacturer enhanced
Applicability OSI seven layer LIN
diagnostics
Application (layer 7) ISO 17987-1, ISO 17987-5 ISO°14229-1, ISO°14229-7
Presentation (layer 6) ISO 17987-5 vehicle manufacturer specific
Session (layer 5) ISO 17987-3 ISO°14229-2
Seven layer according
to ISO°7498-1 and Transport (layer 4)
ISO 17987-2
ISO/IEC 10731
Network (layer 3)
Data link (layer 2) ISO 17987-3, ISO 17987-6
Physical (layer 1) ISO 17987-4, ISO 17987-7

ISO 17987 Parts 2, 3, 4, 6 and 7 being the common standards for the OSI layers 1 through 3 for LIN and the

vehicle manufacturer enhanced diagnostics.

The vehicle manufacturer enhanced diagnostics column shows application layer services covered by

ISO 14229-7 which have been defined in compliance with diagnostic services established in ISO 14229-1, but

are not limited to use only with them. ISO 14229-7 is also compatible with most diagnostic services defined in

national standards or vehicle manufacturer's specifications. The presentation layer is defined vehicle

manufacturer specific. The session layer services are covered by ISO 14229-2. The transport protocol and

network layer services are specified in ISO 17987-2.
vi © ISO 2013 – All rights reserved
---------------------- Page: 6 ----------------------
DRAFT INTERNATIONAL STANDARD ISO/DIS 17987-7
Road vehicles — Local interconnect network (LIN) — Part 7:
Electrical Physical Layer (EPL) conformance test specification
1 Scope

This part of ISO 17987 specifies the conformance test for the electrical physical layer of the LIN

communications system.

It is part of this document to define a test that considers ISO 9646 and ISO 17987-4.

The purpose of this document is to provide a standardized way to verify whether a LIN bus driver is compliant

to ISO 17987-4. The primary motivation is to ensure a level of interoperability of LIN bus drivers from different

sources in a system environment.

This document shall provide all necessary technical information to ensure that test results will be identical

even on different test systems, provided that the particular test suite and the test system are compliant to the

content of this document.
2 Normative references

The following referenced documents are indispensable for the application of this document. For dated

references, only the edition cited applies. For undated references, the latest edition of the referenced

document (including any amendments) applies.

ISO 17987-1, Road vehicles – Local interconnect network (LIN) – Part 1: General information and use case

definition

ISO 17987-2, Road vehicles – Local interconnect network (LIN) – Part 2: Transport protocol and network layer

services

ISO 17987-3, Road vehicles – Local interconnect network (LIN) – Part 3: Protocol specification

ISO 17987-4, Road vehicles – Local interconnect network (LIN) – Part 4: Electrical Physical Layer (EPL)

specification 12V/24V

ISO 17987-5, Road vehicles – Local interconnect network (LIN) – Part 5: Application Programmers Interface

(API)

ISO 17987-6, Road vehicles – Local interconnect network (LIN) – Part 6: Protocol conformance test

specification
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions

For the purposes of this document, the terms and definition defined in ISO 17987-4 apply.

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ISO/DIS 17987-7
3.2 Symbols
% percentage
µs microsecond
C1/2 capacitance
C capacitance in the communication line
COMMON
C` line capacitance
LINE
C total bus capacitance
BUS
C capacitance of master node
MASTER
C reference capacitance
REF
C RXD capacitance (LIN receiver, RXD capacitive load condition)
RXD
C capacitance of slave node
SLAVE
∈ mathematical symbol: replacement for “is an element of”
d²V/dt² second derivative of Voltage (Volt² per second²)
di/dt instantaneous rate of current change (amps per second)
D1/2 diode
D serial internal diode at Transceiver IC
ser_int
D serial master diode
ser_master

F master bit rate tolerances of resonator relative to nominal bitrate in class A systems

TOL_RES_MSTR_A

F master bit rate tolerances of resonator relative to nominal bitrate in class B systems

TOL_RES_MSTR_B

F slave bit rate tolerances of resonator relative to nominal bitrate in class A systems

TOL_RES_SLV_A

F slave bit rate tolerances of resonator relative to nominal bitrate in class B systems

TOL_RES_SLV_B

F slave node bit rate tolerance relative to master node bit rate after synchronization in

TOL_SYNCH_A
class A systems

F slave node bit rate tolerance relative to master node bit rate after synchronization in

TOL_SYNCH_B
class B systems

F slave node bit rate tolerance relative to nominal bit rate before synchronization in class A

TOL_UNSYNCH_A
systems

F slave node bit rate tolerance relative to nominal bit rate before synchronization in class B

TOL_UNSYNCH_B
systems
I current into the ECU bus line
BUS
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ISO/DIS 17987-7
I current limitation for driver dominant state driver on V = V into ECU bus line
BUS_LIM BUS BAT_max
I current at ECU bus line when V is disconnected
BUS_NO_BAT BAT
I current at ECU bus line when V is disconnected
BUS_NO_GND GND_ECU
I current at ECU bus line when driver off (passive) at dominant LIN-bus-level
BUS_PAS_dom
(V = 0 V and V = 12 V)
BUS BAT
I current at ECU bus line when driver off (passive) at recessive LIN-bus-level
BUS_PAS_rec
(8 V < V < 18 V; 8 V < V < 18 V; V ≥ V
BAT BUS BUS BAT
GND GND of ECU
Device
kΩ kilo ohm
kBit/s kilo bit per second
LEN total length of bus line
BUS
LIN LIN network
Bus
ms millisecond
nF nano farad
pF pico farad
pF/m pico farad per meter (line capacitance)
R1/2 resistor
R resistor in the communication line
COMMON
R total bus-resistor including all slave and master resistors
BUS
R = R || R || R || ... || R
BUS Master Slave1 Slave2 SlaveN
R reference resistor
REF
R master resistor
master
R pull-up resistor
pull_up
R slave resistor
slave
t byte field synchronization time
BFS
t basic bit times
BIT
t earliest bit sample time
EBS
t propagation delay of receiver
rx_pd

t symmetry of receiver propagation delay rsising edgepropagation delay of receiver

rx_sym
t latest bit sample time
LBS
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ISO/DIS 17987-7

t propagation delay time of receiving node 1 at falling (recessive to dominant ) LIN bus

rx_pdf(1)
edge

t propagation delay time of receiving node 2 at falling (recessive to dominant ) LIN bus

rx_pdf(2)
edge

t propagation delay time of receiving node 1 at rising (dominant to recessive) LIN bus

rx_pdr(1)
edge

t propagation delay time of receiving node 2 at rising (dominant to recessive) LIN bus

rx_pdr(2)
edge
t sample window repetition time
TH maximum dominant threshold of receiving node (Volt)
Dom(max)
TH minimum dominant threshold of receiving node (Volt)
Dom(min)
TH maximum recessive threshold of receiving node (Volt)
Rec(max)
TH minimum recessive threshold of receiving node (Volt)
Rec(min)
V voltage
V voltage at the anode of the diode
ANODE
V voltage across the ECU supply connectors
BAT
V voltage across the vehicle battery connectors
BATTERY
V battery shift
BS1/2
V voltage on the LIN bus
BUS
V center point of receiver threshold
BUS_CNT
V receiver dominant voltage
BUS_dom
V receiver recessive voltage
BUS_rec
V voltage at the cathode of the diode
CATHODE
V positive power supply voltage (e.g. 5 V)
CC1/2
V voltage at diode between anode and cathode
D1/2
V dominant voltage
Dom
V ground shift
GND1/2
V battery ground voltage
GND_BATTERY

V voltage on the local ECU ground connector with respect to vehicle battery ground

GND_ECU
connector (V )
GND_BATTERY
V receiver hysteresis voltage
HYS
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ISO/DIS 17987-7
V voltage at IUT supply pins
IUT
V voltage at remote power supply no.1/no.2
PS1/2
V recessive voltage
Rec
SerDiode
voltage drop at the serial diodes
V battery shift
Shift_BAT
V difference between battery shift and GND shift
Shift_Difference
V GND shift
Shift_GND
V voltage at transceiver supply pins
SUP
V voltage at ECU supply pins
SUP_Device
V voltage which the device is not destroyed; no guarantee of correct operation
SUP_NON_OP
V receiver threshold voltage of the recessive to dominant LIN bus edge
th_dom
V receiver threshold voltage of the dominant to recessive LIN bus edge
th_rec
ΔF/F deviation from nominal bit rate
Nom
τ time constant
Ω ohm
3.3 Abbreviated terms
AC alternate current
API application programmers interface
ASIC application specific integrated circuit
BFS byte field synchronization
DC direct current
EBS earliest bit sample
EMC electromagnetic compatibility
EMI electromagnetic interference
EPL electrical physical layer
ESD electrostatic discharge
GND ground
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ISO/DIS 17987-7
IUT implementation under test
LBS latest bit sample
Max maximum
Min minimum
no. number
OSI open systems interconnection
PDU protocol data unit
RC RC time constant τ (τ = C * R )
BUS BUS
RX RX pin of the transceiver
RXD receive data
SBC system basis chip
SR sample window repetition
TRX transceiver
TX TX pin of the transceiver
TXD transmit data
Typ typical
UART universal asynchronous receiver transmitter
4 Conventions

ISO 17987 and ISO 14229-7 [5] are based on the conventions specified in the OSI Service Conventions

(ISO/IEC°10731) [2] as they apply for physical layer, protocol, network & transport protocol and diagnostic

services.
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ISO/DIS 17987-7
5 Document overview
Figure°1 illustrates the document reference according to OSI model.
ISO 17987-1
LIN - General
information and
use case definition
Enhanced Diagnostics
LIN
ISO 17987-5
ISO 14229-1 UDS
LIN – Application
ISO 14229-7
Specification and subset
OSI Layer 7
Programmers
UDSonLIN
requirements
Application
Interface (API)
ISO 17987-5
Vehicle
LIN – Application
manufacturer
OSI Layer 6
Programmers
specific
Presentation
Interface (API)
ISO 17987-3
ISO 14229-2 UDS ISO 14229-2 UDS
1 : 1 Session layer LIN – Protocol
Session layer
OSI Layer 5
specification
services services
Session
Standardized Service Primitive Interface
Local interconnect network (LIN)
OSI Layer 4
Transport
ISO 17987-2
LIN –
Transport protocol and network layer services
OSI Layer 3
Network
ISO 17987-6
ISO 17987-3
LIN – Protocol
LIN – Protocol
OSI Layer 2
conformance test
specification
Data Link
specification
ISO 17987-4 ISO 17987-7
LIN – Electrical LIN – Electrical
Physical Layer (EPL) Physical Layer (EPL)
OSI Layer 1
specification conformance test
Physical
12V/24V specification
Figure°1°— LIN document reference according to OSI model
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ISO/DIS 17987-7
6 LIN devices with RX and TX access
6.1 Test specification overview
6.1.1 Test case organisation

The intention of each test case is described at first, with a short textual explanation. Before tests are executed

the test system shall be set to its initial state as described in 6.2.

The test procedure and the expected results are described in the form of a chart for each test case. The table

below is a typical test description.
Table 2 defines the test case organisation.
Table 2 — Test case organisation

IUT node as Test for master, slave or both Corresponding test number TC x, TC y, where x, y are the test

case number
Initial State Parameters:
Number of nodes number of node in the test implementation
Bus loads in order to simulate a LIN network
Operational conditions:
IUT mode Operation mode for the IUT (e.g. normal mode, low power mode, ..).
TX signal State of TX pin at the beginning of the test.
RX signal Logical output voltages of the Rx pin corresponding to
recessive/dominant level at the LIN pin are taken from the data
sheet of the IUT.
V , V , V V , V , V Value in Volt
BAT SUP IUT, CC PS1/2 BUS
Failure In order to set failure at
GND Shift Value in Volt
Test steps Describe the test stages.

Response Describe the result expected in order to decide if the test passed or failed.

Reference Corresponding number in ISO 17987-4.

NOTE IUT can be a master or slave ECU or an individual transceiver chip. The RX, TX and V signals shall be

SUP

accessible for proper test execution. It is recommended to test with RX/TX access, if not possible testing according the

specification without RX/TX access (see 7) is accepted. Depending on the type of IUT the supply voltage is V for ECU

BAT
or V for a chip – called V in this description.
SUP IUT
6.1.2 Measurement and signal generation – Requirements
Table 3 defines the measurement and signal generation – Requirements.
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ISO/DIS 17987-7
Table 3 — Measurement and signal generation - Requirements
Signal Generation:
Rise / Fall Time < 20 ns (Square Wave)
< 40 ns (Triangle)
Frequency 20 ppm
Jitter < 25 ns
Signal Measurement: Dynamic Signals: Oscilloscope 100 MHz Rise Time ≤ 3,5ns
Static Signals: DC Voltage 0,5 %
DC Current 0,6 %
Resistance 0,5 %
Power Supply Resolution 10 mV / 1 mA
(V , V , V , V ,
BAT SUP IUT CC
Accuracy 0,2 % of value
V V )
PS1/2, BUS
6.2 Operational conditions – Calibration
6.2.1 Electrical input/output, LIN protocol

The initial configuration for each test case is defined here. Any requirements for individual tests are specified

with the test case.
Table 4 defines the initial state of electrical input/output.
Table 4 — Initial state of electrical input/output
Initial State Parameters
Number of nodes 1
Bus loads -
Operational conditions -
IUT mode set to normal / active mode
TX signal recessive
V , V , V V , V , V specified for each test
BAT SUP IUT, CC PS1/2 BUS
Failure no failure
GND shift 0 V
6.2.2 [EPL-CT 1] Operating voltage range

This test shall ensure the correct operation in the valid supply voltage ranges, by correct reception of

dominant bits. The IUT is therefore supplied with an increasing/decreasing voltage ramp.

Figure 2 shows the test configuration of the test system 'Operating voltage range with RX and TX access'.

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ISO/DIS 17987-7
Remote-Controlled
Power Supply
V : [V / V ]
IUT SUP BAT
Implementation
Under Test
RX Pulse Generator
LIN
GND
Measurement
Figure 2 — Test system: Operating voltage range with RX and TX access
Table 5 defines the test system 'Operating voltage range with RX and TX access'.
Table 5 — Test system: Operating voltage range with RX and TX access
IUT node as Master and slave ECU [EPL-CT 1].1, [EPL-CT 1].2
Transceiver
Initial State Operational conditions -
V : [V / V ] Table 6
IUT SUP BAT

Test Steps A voltage ramp is set on the V / V as defined on Table 6. The LIN signal is driven with a 10 kHz

SUP BAT

rectangular signal with a duty cycle of 50 % and a voltage swing of 18 V. The IUT shall be in operational

/ active mode

Response The RX pin of the IUT has to show the 10 kHz signal. A maximum deviation of 10 % (time, voltage) is

allowed (see Figure 3).
Reference
ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 9, Param 10).
Figure 3 shows the RX response of the test system 'Operating voltage range'.
trigger point
delta t = +/- 5 µs (t = 50 µs)
BIT
2 * t = 100 µs (20 kBaud)
BIT
Figure 3 — RX response of test system: Operating voltage range
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ISO/DIS 17987-7
Table 6 defines the test cases for 'Operating voltage ramp'.
Table 6 — Test cases: Operating voltage ramp
EPL-CT-TC V range: [V range / V range] Signal ramp
IUT SUP BAT
[EPL-CT 1].1 [7,0 V…18 V] / [8,0 V…18 V] 0,1 V/s
[EPL-CT 1].2 [18 V…7,0 V] / [18 V…8,0 V] 0,1 V/s
6.2.3 Threshold voltages
6.2.3.1 General

This group of tests checks whether the receiver threshold voltages of the IUT are implemented correctly within

the entire specified operating supply voltage range. The LIN bus voltage is driven with a voltage ramp

checking the entire dominant and recessive signal area with respect to the applied supply voltage. In 6.2.3.2

and 6.2.3.3 the signal has to stay continuously on recessive or dominant level depending on the test case. In

6.2.3.4 the RX output transition is detected. Figure 4 shows the triangle signal on the LIN bus.

period T=1/f
amplitude
(signal range)
frequency f=20 Hz
symmetry: 50%
Figure 4 — Triangle signal on the LIN bus
6.2.3.2 [EPL-CT 2] IUT as receiver: V @ V (down)
SUP BUS_dom

Figure 5 shows the test configuration of the test system 'IUT as receiver V @ V (down)'.

SUP BUS_dom
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ISO/DIS 17987-7
Remote Controlled
Power Supply
V : [V ]
IUT SUP
Implementation
Under Test
Pulse Generator
LIN
GND
Measurement
Figure 5 — Test system: IUT as receiver V @ V (down)
SUP BUS_dom
Table 7 defines the test system 'IUT as receiver V @ V (down)'.
SUP BUS_dom
Table 7 — Test system: IUT as receiver V @ V (down)
SUP BUS_dom
IUT node as Transceiver [EPL-CT 2].1, [EPL-CT 2].2, [EPL-CT 2].3
Initial State Operational conditions -
V : [V ] Table 8
IUT SUP

Test Steps A triangle signal with f=20 Hz and symmetry of 50 % is set on the LIN Bus (see Figure 4).

Response The IUT shall generate a dominant or recessive value on RX as defined on Table 8 during the falling

slope of the triangle signal.

Reference ISO 17987-4 (see Table 7 'Electrical DC parameters' Param 17, Param 18 and signal specification, see

6.3.3 Figure 5).

Table 8 defines the test cases for the falling slope of the triangle signal on the LIN bus.

Table 8 — Test cases: Falling slope of the triangle signal on the LIN bus
EPL-CT-TC V : [V ] Signal range Expected RX signal
IUT SUP
[18 V…4,2 V] recessive
[EPL-CT 2].1
7 V
[2,8 V…-1,05 V] dominant
[18 V…7,8 V] recessive
[EPL-CT 2].2
13 V
[5,2 V…-2,1 V] dominant
[20,7 V…10,8 V] recessive
[EPL-CT 2].3 18 V
[7,2 V…-2,7 V] dominant
...

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