ISO/IEC 10373-6:2001/Amd 2:2003

Identification cards — Test methods — Part 6: Proximity cards — Amendment 2: Improved RF test methods

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 2: .

General Information

• Status: Withdrawn
• Publication Date: 09-Oct-2003
• Withdrawal Date: 09-Oct-2003
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 07-Jan-2011

Relations

• Amends: ISO/IEC 10373-6:2001 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 06-Jun-2022
• Revised: ISO/IEC 10373-6:2011 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 26-Sep-2008
• Child: ISO/IEC 10373-6:2001 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 15-Apr-2008

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-6
First edition
2001-05-31
AMENDMENT 2
2003-10-01
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 2: Improved RF test methods
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité
AMENDEMENT 2: Méthodes d'essai RF améliorées




Reference number
ISO/IEC 10373-6:2001/Amd.2:2003(E)
©
ISO/IEC 2003

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ISO/IEC 10373-6:2001/Amd.2:2003(E)
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ii © ISO/IEC 2003 — All rights reserved

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ISO/IEC 10373-6:2001/Amd.2:2003(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 2 to ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.

© ISO/IEC 2003 — All rights reserved iii

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ISO/IEC 10373-6:2001/Amd.2:2003(E)

Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 2: Improved RF test methods

Page 2, 3.2
Add the following abbreviations and symbols:
fcm Frequency of the operating field during the PICC load modulation test
H Field strength of the PCD antenna field
m Modulation index as defined in 3.3 of ISO/IEC 14443-2
t1, t2 Pulse segments as defined in Figure 2 of ISO/IEC 14443-2
tr, tf Rise and fall times as defined in Figure 4 of ISO/IEC 14443-2
Page 5, 6.1.3
nd
Replace the 2 note with the following:
"NOTE At 13,56 MHz the approximate inductance is 250 nH and the approximate resistance is 0,4 Ω."
Page 6, 6.1.3
Add a note after the last note:
“NOTE The high impedance oscilloscope probe ground connection should be as short as possible, less than 20 mm
or coaxial connection.”
Page 6, 6.2
th
In the 4 sentence, replace the value “50 Ω” for P1 with the value “10 Ω”.
Page 6, Figure 4
Replace the figure with the following:
© ISO/IEC 2003 — All rights reserved 1

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ISO/IEC 10373-6:2001/Amd.2:2003(E)
sense coil b + +
240 Ω
- -
± 1%
P1
identical length twisted
pairs or coaxial cables
10 Ω
of less than 100 mm
240
Ω
PCD
± 1%
probe
antenna
+ +
sense coil a
- -
to
oscilloscope

NOTE 1 In order to avoid any unintended misalignment in case of an unsymmetrical set-up the tuning range of the
potentiometer P1 is only 10 Ω. If the set-up cannot be compensated by the 10 Ω potentiometer P1 the overall symmetry of
the set-up should be checked.
NOTE 2 The high impedance oscilloscope probe ground connection should be as short as possible, less than 20 mm
or coaxial connection.
Figure 4 — Test set-up (principle)
Page 7, 6.2.3
Add the following sentence after the first sentence:
“The dimensional tolerance shall be better than ± 0,5 mm.”
Pages 8 and 9, Clause 7
Replace 7.1, 7.2 and 7.3 with the following:
7.1 PICC load modulation amplitude
7.1.1 Purpose
The purpose of this test is to determine the amplitude of the PICC load modulation signal within the operating
field range [H , H ] as specified in the base standard. Also the functionality of the PICC for Type A and
min max
Type B within their corresponding modulation ranges as defined in the base standard shall be determined.
7.1.2 Test procedure
Step 1: The load modulation test circuit of Figure 4 and the Test PCD assembly of Figure 5 are used.
2 © ISO/IEC 2003 — All rights reserved

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ISO/IEC 10373-6:2001/Amd.2:2003(E)
Adjust the RF power delivered by the signal generator to the test PCD antenna to the required field strength
as measured by the calibration coil. Connect the output of the load modulation test circuit of Figure 4 to a
digital sampling oscilloscope. The 10 Ω potentiometer P1 shall be trimmed to minimise the residual carrier.
This signal shall be at least 40 dB lower than the signal obtained by shorting one sense coil.
Step 2: The PICC under test shall be placed in the DUT position, concentric with sense coil a. The RF drive
into the test PCD antenna shall be re-adjusted to the required field strength.
Display a segment of at least two cycles of the waveform of the subcarrier load modulation on the digital
sampling oscilloscope and store the sampled data in a file for analysis by a computer software programme
(see Annex F).
NOTE 1 Care should be taken to apply a proper synchronization method for low amplitude load modulation.
Fourier transform exactly two subcarrier cycles of the sampled modulation waveform using suitable computer
software. Use a discrete Fourier transformation with a scaling such that a pure sinusoidal signal results in its
peak magnitude. In order to minimize transient effects, avoid to analyse a subcarrier cycle immediately
following a non-modulating period or a phase shift of the subcarrier.
The resulting peak amplitudes of the upper and lower sidebands at f + f and f - f shall be above the value
c s c s
defined in the base standard.
A REQA or a REQB command sequence as defined in ISO/IEC 14443-3 shall be sent by the Test PCD to
obtain a signal or load modulation response from the PICC.
The frequency fcm of the carrier delivered by the signal generator to the test PCD antenna shall be such that
two subcarrier cycles correspond exactly to an integer number of samples. The frequency which fulfils this
requirement (with common oscilloscope sampling rates) and which is the closest to the nominal carrier
frequency fc defined in ISO/IEC 14443-2 is fcm = 13,559322 MHz.
The discrete Fourier transformation shall be done at the exact sidebands frequencies generated by the PICC
under test, i.e. fcm (1 – f /f ) and fcm (1 + f /f ). If the programme given in Annex F is used it shall be modified
s c s c
to rep
...