Geometrical product specifications (GPS) -- Surface texture: Profile method -- Flowchart for PSm, RSm, WSm and Pc, Rc, Wc

This document provides an unambiguous calculation of parameters PSm, RSm, WSm and Pc, Rc, Wc, as defined in ISO 4287, by means of a flowchart.

Spécification géométrique des produits (GPS) - Etat de surface : Méthode du profil - Organigramme pour PSm, RSm, WSm et Pc, Rc, Wc

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Published
Publication Date
20-Aug-2020
Current Stage
5060 - Close of voting Proof returned by Secretariat
Start Date
03-Jul-2020
Completion Date
03-Jul-2020
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TECHNICAL ISO/TR
REPORT 23276
First edition
2020-08
Geometrical product specifications
(GPS) — Surface texture: Profile
method — Flowchart for PSm, RSm,
WSm and Pc, Rc, Wc
Reference number
ISO/TR 23276:2020(E)
ISO 2020
---------------------- Page: 1 ----------------------
ISO/TR 23276:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting

on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address

below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/TR 23276:2020(E)
Contents Page

Foreword ........................................................................................................................................................................................................................................iv

Introduction ..................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms and definitions ..................................................................................................................................................................................... 1

3.1 General terms ........................................................................................................................................................................................... 1

3.2 Surface profile parameters ........................................................................................................................................................... 3

4 Flowchart for parameters PSm, RSm, WSm and Pc, Rc, Wc ........................................................................................... 6

4.1 General ........................................................................................................................................................................................................... 6

4.2 Part one — Calculation of peaks and valleys within the evaluation length ........................................ 7

4.3 Part two — Peak height discrimination and valley depth discrimination .......................................... 8

4.4 Part three — Merging of remaining peaks and valleys ........................................................................................ 9

4.5 Part four — Calculation of roughness parameters XSm and Xc ................................................................10

Bibliography .............................................................................................................................................................................................................................11

© ISO 2020 – All rights reserved iii
---------------------- Page: 3 ----------------------
ISO/TR 23276:2020(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www .iso .org/ patents).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/

iso/ foreword .html.

This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product

specifications and verification.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
---------------------- Page: 4 ----------------------
ISO/TR 23276:2020(E)
Introduction

Feature characterization of rough surfaces is of growing interest in terms of a function-oriented

description of technical surfaces. A well-known set of feature parameters is the mean width and mean

height of profile elements defined in ISO 4287. Unfortunately, the definition given in ISO 4287 is

insufficient for an unambiguous implementation in a high-level programming language. Due to the lack

of a flowchart, results given by different software packages are not comparable. The main intention of

this document is to provide an unambiguous algorithm for feature parameters PSm , RSm , WSm and

Pc , Rc , Wc according to ISO 4287.
[5]

The flowchart defined in this document was developed by Seewig and Scott and represents an

[4]

extension of crossing the line segmentation proposed by Scott . The flowchart is based on new

knowledge gathered over the past 10 years.
© ISO 2020 – All rights reserved v
---------------------- Page: 5 ----------------------
TECHNICAL REPORT ISO/TR 23276:2020(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Flowchart for PSm, RSm, WSm
and Pc, Rc, Wc
1 Scope

This document provides an unambiguous calculation of parameters PSm, RSm, WSm and Pc, Rc, Wc, as

defined in ISO 4287, by means of a flowchart.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1 General terms
3.1.1
profile

set of ordered pairs xz, which describe the intersection of a surface with a specified plane

Note 1 to entry: For every point x on the X-axis, there is exactly one ordinate z. The relation between x and z is

given by a formula zf= ()x .

Note 2 to entry: Usually profiles have value pairs xz, above and below the X-axis.

Note 3 to entry: In surface metrology three profiles are defined. The primary profile, the roughness profile and

the waviness profile. Each profile corresponds to a specific lateral scale.
3.1.2
evaluation length

length in the direction of the X-axis used for assessing the profile under evaluation

[SOURCE: ISO 4287:1997, 3.1.10, modified — symbol changed from ln and notes to entry removed.]

3.1.3
profile peak

outwardly directed (from material to surrounding medium) portion of the assessed profile connecting

two adjacent intersection points of the profile and the X-axis
3.1.4
profile peak height
normal distance between the X-axis and the highest ordinate of the profile peak
© ISO 2020 – All rights reserved 1
---------------------- Page: 6 ----------------------
ISO/TR 23276:2020(E)
3.1.5
profile valley

inwardly directed (from surrounding medium to material) portion of the assessed profile connecting

two adjacent intersection points of the assessed profile and the X-axis
3.1.6
profile valley depth
normal distance between the X-axis and the lowest ordinate of the profile valley
3.1.7
profile element

profile peak/valley and the adjacent profile valley/peak within the evaluation length

Note 1 to entry: Profile elements are calculated from the beginning to the end of the evaluation length and

vice versa.
3.1.8
profile element height
sum of the profile peak height and the profile valley depth of a profile element
3.1.9
profile element spacing
distance on the X-axis between the beginning of two adjacent profile elements

Note 1 to entry: The positive or negative portion of the assessed profile at the beginning or end of the evaluation

length is considered as an imperfect profile element and is used for the determination of the profile element

spacing.
3.1.10
profile peak height discrimination

minimum height of profile peaks of the assessed profile which is taken into account

Note 1 to entry: The minimum height of profile peaks is 10 % of Pp for primary profile parameters, 10 % of Rp for

roughness profile parameters and 10 % of Wp for waviness
...

TECHNICAL ISO/TR
REPORT 23276
First edition
Geometrical product specifications
(GPS) — Surface texture: Profile
method — Flowchart for PSm, RSm,
WSm and Pc, Rc, Wc
PROOF/ÉPREUVE
Reference number
ISO/TR 23276:2020(E)
ISO 2020
---------------------- Page: 1 ----------------------
ISO/TR 23276:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting

on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address

below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii PROOF/ÉPREUVE © ISO 2020 – All rights reserved
---------------------- Page: 2 ----------------------
ISO/TR 23276:2020(E)
Contents Page

Foreword ........................................................................................................................................................................................................................................iv

Introduction ..................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms and definitions ..................................................................................................................................................................................... 1

3.1 General terms ........................................................................................................................................................................................... 1

3.2 Surface profile parameters ........................................................................................................................................................... 3

4 Flowchart for parameters PSm, RSm, WSm and Pc, Rc, Wc ........................................................................................... 6

4.1 General ........................................................................................................................................................................................................... 6

4.2 Part one — Calculation of peaks and valleys within the evaluation length ........................................ 7

4.3 Part two — Peak height discrimination and valley depth discrimination .......................................... 8

4.4 Part three — Merging of remaining peaks and valleys ........................................................................................ 9

4.5 Part four — Calculation of roughness parameters XSm and Xc ................................................................10

Bibliography .............................................................................................................................................................................................................................11

© ISO 2020 – All rights reserved PROOF/ÉPREUVE iii
---------------------- Page: 3 ----------------------
ISO/TR 23276:2020(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www .iso .org/ patents).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/

iso/ foreword .html.

This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product

specifications and verification.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
iv PROOF/ÉPREUVE © ISO 2020 – All rights reserved
---------------------- Page: 4 ----------------------
ISO/TR 23276:2020(E)
Introduction

Feature characterization of rough surfaces is of growing interest in terms of a function-oriented

description of technical surfaces. A well-known set of feature parameters is the mean width and mean

height of profile elements defined in ISO 4287. Unfortunately, the definition given in ISO 4287 is

insufficient for an unambiguous implementation in a high-level programming language. Due to the lack

of a flowchart, results given by different software packages are not comparable. The main intention of

this document is to provide an unambiguous algorithm for feature parameters PSm , RSm , WSm and

Pc , Rc , Wc according to ISO 4287.
[5]

The flowchart defined in this document was developed by Seewig and Scott and represents an

[4]

extension of crossing the line segmentation proposed by Scott . The flowchart is based on new

knowledge gathered over the past 10 years.
© ISO 2020 – All rights reserved PROOF/ÉPREUVE v
---------------------- Page: 5 ----------------------
TECHNICAL REPORT ISO/TR 23276:2020(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Flowchart for PSm, RSm, WSm
and Pc, Rc, Wc
1 Scope

This document provides an unambiguous calculation of parameters PSm, RSm, WSm and Pc, Rc, Wc, as

defined in ISO 4287, by means of a flowchart.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1 General terms
3.1.1
profile

set of ordered pairs xz, which describe the intersection of a surface with a specified plane

Note 1 to entry: For every point x on the X-axis, there is exactly one ordinate z. The relation between x and z is

given by a formula zf= ()x .

Note 2 to entry: Usually profiles have value pairs xz, above and below the X-axis.

Note 3 to entry: In surface metrology three profiles are defined. The primary profile, the roughness profile and

the waviness profile. Each profile corresponds to a specific lateral scale.
3.1.2
evaluation length

length in the direction of the X-axis used for assessing the profile under evaluation

[SOURCE: ISO 4287:1997, 3.1.10, modified — symbol changed from ln and notes to entry removed.]

3.1.3
profile peak

outwardly directed (from material to surrounding medium) portion of the assessed profile connecting

two adjacent intersection points of the profile and the X-axis
3.1.4
profile peak height
normal distance between the X-axis and the highest ordinate of the profile peak
© ISO 2020 – All rights reserved PROOF/ÉPREUVE 1
---------------------- Page: 6 ----------------------
ISO/TR 23276:2020(E)
3.1.5
profile valley

inwardly directed (from surrounding medium to material) portion of the assessed profile connecting

two adjacent intersection points of the assessed profile and the X-axis
3.1.6
profile valley depth
normal distance between the X-axis and the lowest ordinate of the profile valley
3.1.7
profile element

profile peak/valley and the adjacent profile valley/peak within the evaluation length

Note 1 to entry: Profile elements are calculated from the beginning to the end of the evaluation length and

vice versa.
3.1.8
profile element height
sum of the profile peak height and the profile valley depth of a profile element
3.1.9
profile element spacing
distance on the X-axis between the beginning of two adjacent profile elements

Note 1 to entry: The positive or negative portion of the assessed profile at the beginning or end of the evaluation

length is considered as an imperfect profile element and is used for the determination of the profile element

spacing.
3.1.10
profile peak height discrimination

minimum height of profile peaks of the assessed profile which is taken into account

Note 1 to entry: The minimum height of profile peaks is 10 % of Pp for primary profile parameters, 10 % of Rp for

roughness profile parameters and 10 % of Wp for waviness profile parameters.
3.1.11
...

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