ISO/IEC 18047-6:2025
(Main)Information technology — Radio frequency identification device conformance test methods — Part 6: Test methods for air interface communications at 860 MHz to 930 MHz
Information technology — Radio frequency identification device conformance test methods — Part 6: Test methods for air interface communications at 860 MHz to 930 MHz
This document specifies test methods for determining the conformance of radio frequency identification (RFID) devices (tags and interrogators) for item management with the specifications given in ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-64. However, this document does not apply to the testing of conformance with regulatory or similar requirements. The test methods require only that the mandatory functions, and any optional functions which are implemented, are verified. This can, in appropriate circumstances, be supplemented by further, application-specific functionality criteria that are not available in the general case. The interrogator and tag conformance parameters in this document are the following: — type-specific conformance parameters including nominal values and tolerances; — parameters that apply directly affecting system functionality and inter-operability. Parameters that are already included in regulatory test requirements are not included in this document. Unless otherwise specified, the tests in this document are intended to be applied exclusively to RFID tags and interrogators defined in ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-64.
Technologies de l'information — Méthodes d'essai de conformité du dispositif d'identification de radiofréquence — Partie 6: Méthodes d'essai pour des communications d'une interface d'air à 860 MHz et jusqu'à 930 MHz
General Information
Relations
Standards Content (Sample)
International
Standard
ISO/IEC 18047-6
Third edition
Information technology — Radio
2025-11
frequency identification device
conformance test methods —
Part 6:
Test methods for air interface
communications at 860 MHz to 930
MHz
Technologies de l'information — Méthodes d'essai de conformité
du dispositif d'identification de radiofréquence —
Partie 6: Méthodes d'essai pour des communications d'une
interface d'air à 860 MHz et jusqu'à 930 MHz
Reference number
© ISO/IEC 2025
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
© ISO/IEC 2025 – All rights reserved
ii
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms, definitions, symbols and abbreviated terms . 2
3.1 Terms and definitions .2
3.2 Symbols .2
3.3 Abbreviated terms .3
4 Default conditions applicable to the test methods . 3
4.1 Test environment .3
4.2 Pre-conditioning .3
4.2.1 General .3
4.2.2 Default tolerance .3
4.2.3 Noise floor at test location .3
4.2.4 Total measurement uncertainty .4
5 Setup of test equipment . 4
5.1 Setup of test equipment for interrogator tests .4
5.1.1 General .4
5.1.2 Sense antenna .4
5.1.3 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and
ISO/IEC 18000-64 interrogator .4
5.2 Setup of test equipment for tag tests .5
5.2.1 General .5
5.2.2 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and
ISO/IEC 18000-64 tags .6
6 Conformance tests for ISO/IEC 18000-61 . 7
6.1 Functional tests of interrogator .7
6.1.1 Interrogator modulation test .7
6.1.2 Interrogator demodulation and turn-around time .8
6.2 Functional tests of tag.9
6.2.1 Tag demodulation and turn-around time .9
6.2.2 Tag backscatter .10
6.2.3 Tag response time .11
6.2.4 Tag bit rate . 12
6.2.5 Tag state storage time . 13
7 Conformance tests for ISO/IEC 18000-62 .13
7.1 Functional tests of interrogator . 13
7.1.1 Interrogator modulation test . 13
7.1.2 Interrogator demodulation and turn-around time .14
7.2 Functional tests of tag. 15
7.2.1 Tag demodulation and turn-around time . 15
7.2.2 Tag backscatter .16
7.2.3 Tag response time .17
7.2.4 Tag bit rate .18
7.2.5 Tag state storage time .19
8 Conformance tests for ISO/IEC 18000-64 .20
8.1 Functional tests of interrogator . 20
8.1.1 Interrogator modulation test . 20
8.1.2 Interrogator demodulation and data decoding . . 20
8.2 Functional tests of tag. 22
8.2.1 General . 22
8.2.2 Data encoding. 23
© ISO/IEC 2025 – All rights reserved
iii
8.2.3 Link bits .24
8.2.4 Tag timing parameters . 25
8.2.5 Tag bit rate .27
8.2.6 Tag multi-page timing .27
8.2.7 Tag LBT . 28
Annex A (normative) Test measurement site .29
Annex B (normative) Command coding for conformance tests for the different types of ISO/
IEC 18000-6 .40
Annex C (normative) Technical performance of the generic electronic test instruments . 41
Annex D (normative) Tag emulator .42
Annex E (informative) Measurement examples .44
Bibliography .46
© ISO/IEC 2025 – All rights reserved
iv
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical activity.
ISO and IEC technical committees collaborate in fields of mutual interest. Other international organizations,
governmental and non-governmental, in liaison with ISO and IEC, also take part in the work.
The procedures used to develop this document and those intended for its further maintenance are described
in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the different types
of document should be noted. This document was drafted in accordance with the editorial rules of the ISO/
IEC Directives, Part 2 (see www.iso.org/directives or www.iec.ch/members_experts/refdocs).
ISO and IEC draw attention to the possibility that the implementation of this document may involve the
use of (a) patent(s). ISO and IEC take no position concerning the evidence, validity or applicability of any
claimed patent rights in respect thereof. As of the date of publication of this document, ISO and IEC had not
received notice of (a) patent(s) which may be required to implement this document. However, implementers
are cautioned that this may not represent the latest information, which may be obtained from the patent
database available at www.iso.org/patents and https://patents.iec.ch. ISO and IEC shall not be held
responsible for identifying any or all such patent rights.
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and expressions
related to conformity assessment, as well as information about ISO's adherence to the World Trade
Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www.iso.org/iso/foreword.html.
In the IEC, see www.iec.ch/understanding-standards.
This document was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 31, Automatic identification and data capture techniques.
This third edition cancels and replaces the second edition (ISO/IEC 18047-6:2017), which has been
technically revised.
The main changes are as follows:
— tests related to ISO/IEC 18000-63 have been removed from this document since these tests are described
in ISO/IEC 18047-63;
— the frequency range has been changed from 860 MHz to 960 MHz to 860 MHz to 930 MHz, as all applicable
global radio regulations are within this frequency range.
A list of all parts in the ISO/IEC 18047 series can be found on the ISO and IEC websites.
Any feedback or questions on this document should be directed to the user’s national standards
body. A complete listing of these bodies can be found at www.iso.org/members.html and
www.iec.ch/national-committees.
© ISO/IEC 2025 – All rights reserved
v
Introduction
The ISO/IEC 18000 series defines the air interfaces for radio frequency identification (RFID) devices
used in item management applications. ISO/IEC 18000-61, ISO/IEC 18000-62, ISO/IEC 18000-63 and
ISO/IEC 18000-64 define the air interface for RFID devices operating at frequencies from 860 MHz to
930 MHz.
The ISO/IEC 18047 series provides test methods for conformance to the various parts of the
ISO/IEC 18000 series.
Each part of the ISO/IEC 18047 series contains all measurements required to be made on a product in order
to establish whether it conforms to the corresponding part of the ISO/IEC 18000 series.
NOTE Test methods for interrogator and tag performance are covered by the ISO/IEC 18046 series.
Clause 6 describes all necessary conformance tests for ISO/IEC 18000-61.
Clause 7 describes all necessary conformance tests for ISO/IEC 18000-62.
Clause 8 describes all necessary conformance tests for ISO/IEC 18000-64.
© ISO/IEC 2025 – All rights reserved
vi
International Standard ISO/IEC 18047-6:2025(en)
Information technology — Radio frequency identification
device conformance test methods —
Part 6:
Test methods for air interface communications at 860 MHz
to 930 MHz
1 Scope
This document specifies test methods for determining the conformance of radio frequency identification
(RFID) devices (tags and interrogators) for item management with the specifications given in
ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-64. However, this document does not apply to the
testing of conformance with regulatory or similar requirements.
The test methods require only that the mandatory functions, and any optional functions which are
implemented, are verified. This can, in appropriate circumstances, be supplemented by further, application-
specific functionality criteria that are not available in the general case.
The interrogator and tag conformance parameters in this document are the following:
— type-specific conformance parameters including nominal values and tolerances;
— parameters that apply directly affecting system functionality and inter-operability.
Parameters that are already included in regulatory test requirements are not included in this document.
Unless otherwise specified, the tests in this document are intended to be applied exclusively to RFID tags
and interrogators defined in ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-64.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments) applies.
ISO/IEC 18000-61:2012, Information technology — Radio frequency identification for item management —
Part 61: Parameters for air interface communications at 860 MHz to 960 MHz Type A
ISO/IEC 18000-62:2012, Information technology — Radio frequency identification for item management —
Part 62: Parameters for air interface communications at 860 MHz to 960 MHz Type B
ISO/IEC 18000-64, Information technology — Radio frequency identification for item management — Part 64:
Parameters for air interface communications at 860 MHz to 960 MHz Type D
ISO/IEC 19762, Information technology — Automatic identification and data capture (AIDC) techniques —
Vocabulary
© ISO/IEC 2025 – All rights reserved
3 Terms, definitions, symbols and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO/IEC 19762 apply.
ISO and IEC maintain terminology databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at https:// www .electropedia .org/
3.2 Symbols
For the purposes of this document, the symbols given in ISO/IEC 19762 and the following apply.
Δ change in radar cross-section
RCS
λ test frequency wavelength
D modulation depth of data coding pulse
d largest dimension of the DUT/dipole after substitution
d largest dimension of the test antenna
d distance between the interrogator antenna and sense antenna
s
d interrogator antenna to tag distance
T,IA
d measurement antenna to tag distance
T,MA
d distance between the interrogator antenna and tag emulator
TE
G gain of interrogator antenna
IA
G gain of measurement antenna
MA
I isolation of a circulator
CIR
M modulation index for ISO/IEC 18000-62
i
n spacing factor
spacing
P average power measured at the entrance of the transmit antenna
e
P delivered power at the carrier frequency
I
P measured power at the carrier frequency
M
R tag return link bit rate
rlb
T pulse fall time for ISO/IEC 18000-61
apf
T pulse rise time for ISO/IEC 18000-61
apr
T fall time for ISO/IEC 18000-62
f
T rise time for ISO/IEC 18000-62
r
T tag return link bit time
rlb
© ISO/IEC 2025 – All rights reserved
T tag response time for ISO/IEC 18000-61
rs
3.3 Abbreviated terms
For the purposes of this document, the abbreviated terms given in ISO/IEC 19762 and the following apply.
BER bit error rate
CRC cyclic redundancy check
CW continuous wave
DUT device under test
RF radio frequency
RCS radar cross section
TTO tag talks only
4 Default conditions applicable to the test methods
4.1 Test environment
Unless otherwise specified, testing shall take place in an environment of temperature (23 ± 3) °C and of
relative (non-condensing) humidity from 40 % to 60 %.
4.2 Pre-conditioning
4.2.1 General
The interrogators and tags to be tested shall be conditioned to the test environment for a period of 24 h
before testing.
For this document, each interrogator and each tag shall support at least one of the types A or B or D.
4.2.2 Default tolerance
Unless otherwise specified, a default tolerance of ±5 % shall be applied to the quantity values given to
specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures
(e.g. test equipment adjustments).
4.2.3 Noise floor at test location
Noise floor at test location shall be measured for at least 1 min with the spectrum analyser using the same
conditions as for the measurement of the DUT.
The maximum of the measured noise amplitude measured in a 10 kHz bandwidth shall be −60 dB from
0,5 GHz to 2 GHz and −90 dBm around the frequency of the main signal of the tag backscatter signal.
Special attention has to be given to spurious emissions, e.g., insufficiently shielded computer monitors. The
electromagnetic test conditions of the measurements shall be checked by performing the measurements
with and without a tag in the field.
© ISO/IEC 2025 – All rights reserved
4.2.4 Total measurement uncertainty
The total measurement uncertainty for each quantity determined by these test methods shall be stated in
the test report.
NOTE Basic information is given in ISO/IEC Guide 98-3.
5 Setup of test equipment
5.1 Setup of test equipment for interrogator tests
5.1.1 General
The DUT shall be an interrogator including an antenna.
All conformance measurements and setups shall be done in an anechoic chamber as defined in Annex A.
All measurements shall be done at one of the test frequencies in Table 1.
Table 1 — Test frequencies
Test carrier frequency Comment
866 MHz Recommended for tests under European regulations
915 MHz Recommended for tests under Japan, Korean, Australian or US regulations
922 MHz Recommended for test under China regulations
NOTE With the test frequencies specified in Table 1, all frequencies of the entire band from 860 MHz to 930 MHz
are within ±2,9 % of one of the test frequencies. All practically used frequencies in the frequency bands 860 MHz to
870 MHz, 900 MHz to 930 MHz are within ±1,7 % of the test frequencies.
5.1.2 Sense antenna
Where applicable, tests shall be carried out using a sense antenna, which shall be a substantially non-
reactive, non-radiating load of 50 Ω equipped with an antenna connector. The voltage standing wave ratio
(VSWR) at the 50 Ω connector shall not be greater than 2:1 over the frequency range of the measurement.
5.1.3 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/IEC 18000-
64 interrogator
5.1.3.1 Interrogator modulation test setup
For this test, the sense antenna shall always be placed and orientated for optimum field strength reception
in the direction of the major power radiation of the DUT interrogator antenna in accordance with Figure 1
at a distance, d , of 0,8 m to 1,1 m (see ISO/IEC 18000-61 and ISO/IEC 18000-62) or 3 λ and 10 λ (see
s
ISO/IEC 18000-64).
© ISO/IEC 2025 – All rights reserved
Key
1 DUT interrogator antenna
2 scope
3 sense antenna
Figure 1 — Interrogator modulation test setup
5.1.3.2 Interrogator demodulation and turn-around time test setup
For this test, the tag emulator as defined in Annex D shall be placed and orientated for optimum field strength
reception in the direction of the major power radiation of the DUT interrogator antenna in accordance with
Figure 2 at a distance, d , of 0,8 m to 1,1 m (see ISO/IEC 18000-61 and ISO/IEC 18000-62) or 10 λ (see
TE
ISO/IEC 18000-64).
Key
1 DUT interrogator antenna
2 tag emulator
Figure 2 — Interrogator demodulation and turn-around test setup
5.2 Setup of test equipment for tag tests
5.2.1 General
The DUT shall be a tag including all means in order to be capable to communicate with an interrogator.
When tests require the use of an interrogator, this shall be a measurement equipment that fulfils the
requirements in order to act as interrogator and in particular, it shall support the minimum tag response to
interrogator command turn-around time.
All conformance measurements and setups shall be done in an anechoic chamber as defined in Annex A.
All measurements shall be done at one of the test frequencies in Table 1.
© ISO/IEC 2025 – All rights reserved
5.2.2 Test apparatus and test circuits for ISO/IEC 18000-61, ISO/IEC 18000-62 and ISO/
IEC 18000-64 tags
5.2.2.1 Tag demodulation and turn-around time test setup
For this test, the tag shall be placed and oriented for optimum field strength reception in the direction of the
major power radiation of the interrogator.
a) Bistatic setup b) Monostatic setup
Key
1 test interrogator
2 spectrum analyser
3 scope
4 tag
5 circulator
6 test interrogator and measurement antenna
7 test interrogator antenna
8 measurement antenna
Figure 3 — Tag demodulation test setup
5.2.2.2 Tag backscatter test setup
For this test, two different setups may be used.
In one setup (see Figure 3), the test interrogator antenna setup (the interrogator may alternately also be
realized with a signal generator according to Annex C) shall consist of a set of two mechanically assembled
antennas specifically designed to reduce the signal coupling between each other. One shall be used as the
interrogator antenna while the second shall be used as the measurement antenna and shall be connected
either to a spectrum analyser or to an oscilloscope as specified in Annex C. The tag under test shall be placed
at this focal point and oriented for optimum field strength reception. The distances between the tag and the
antennas are d and d , respectively (see Figure 3).
T,IA T,MA
The tag backscatter test setup parameters are defined in Table 2.
© ISO/IEC 2025 – All rights reserved
Table 2 — Tag backscatter setup parameters
Symbol Name Description
d Interrogator antenna to tag distance 0,8 m to 1,1 m (see ISO/IEC 18000-61 and ISO/IEC 18000-62) or
T,IA
3 λ (see ISO/IEC 18000-64)
d Measurement antenna to tag distance 0,8 m to 1,1 m (see ISO/IEC 18000-61 and ISO/IEC 18000-62) or
T,MA
3 λ (see ISO/IEC 18000-64)
G Gain of interrogator antenna The maximum 3 dB beam width shall be ±35°.
IA
G Gain of measurement antenna The maximum 3 dB beam width shall be ±35°.
MA
I Isolation of the circulator The minimum isolation of the circulator shall be 20 dB.
CIR
In another setup (see Figure 3), the test interrogator antenna setup (the interrogator may alternatively
also be realized with a signal generator according to Annex C) shall consist of a single antenna specifically
designed to transmit the signal from the interrogator and to receive the signal backscattered from the tag
under test. This antenna shall be connected to the interrogator and to either a spectrum analyser or an
oscilloscope as specified in Annex C via a circulator. The tag under test shall be oriented for optimum field
strength reception. The distance between the tag and the antenna is d (see Figure 3).
T,IA
The tag backscatter test setup parameters are defined in Table 2.
5.2.2.3 Tag response time
The setup for this test shall be as described in 5.2.2.1.
5.2.2.4 Tag bit rate accuracy test setup
The setup for this test shall be as described in 5.2.2.1.
5.2.2.5 Tag state storage time test setup
The setup for this test shall be as described in 5.2.2.1.
6 Conformance tests for ISO/IEC 18000-61
6.1 Functional tests of interrogator
6.1.1 Interrogator modulation test
6.1.1.1 Test objective
The objective of this test is to verify that the interrogator provides the appropriate modulation waveform
required for operation of tags.
6.1.1.2 Test procedure
The interrogator shall transmit an Init_round_all command (see B.1.1) at the maximum power of the selected
carrier frequency for testing.
In case the interrogator is intended for operation of non-overlapping RF bands, then this test shall be done
for each RF band.
A digital oscilloscope as specified in Annex C and the sense antenna shall be used to record the waveform
provided by the interrogator.
© ISO/IEC 2025 – All rights reserved
6.1.1.3 Test report
The test report shall give the measured values of the parameters in accordance with Table 3. The pass/
fail condition is determined whether the measured values are within the requirements as specified in
ISO/IEC 18000-61. Furthermore, the DUT and the sense antenna orientation and position, as well as the
used interrogator output power, and the used operation frequency shall be recorded. In addition, the test
report shall provide information on at least the following aspects of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
Table 3 — Measurements to be made
Parameter Condition
D Default modulation operation mode
T Default modulation operation mode
apr
T Default modulation operation mode
apf
6.1.2 Interrogator demodulation and turn-around time
6.1.2.1 Test objective
The objectives of this test are to verify whether the interrogator is capable of:
— demodulating signals from the tags, and
— receiving the data transmitted by the tag emulator after the minimum specified turn-around time.
6.1.2.2 Test procedure
The interrogator shall transmit an Init_round_all command (see B.1.1) at the maximum power of the selected
carrier frequency for testing.
After the command provided by the interrogator has been sent and after the minimum turn-around time,
a tag emulator as specified in Annex D shall transmit a typical response to the Init_round_all command at
a minimum Δ specified in ISO/IEC 18000-61. It is not necessary for the tag emulator to demodulate the
RCS
command but shall only detect its end to respond after the minimum turn-around time.
When the interrogator is intended for operation of non-overlapping RF bands, this test shall be done for each
RF band.
Measurements shall be done for both the minimum and maximum tag response data rate, i.e. the turn-
around time from interrogator command to tag response.
In case the interrogator is designed for shorter communication distances, then the distance d may be
TE
decreased and the actual used value shall be mentioned in the test report.
The interrogator (digital) demodulator shall accept the tag response including verification of the CRC.
© ISO/IEC 2025 – All rights reserved
6.1.2.3 Test report
The test report shall contain the tag emulator distance to the interrogator and the Δ value setup in the tag
RCS
emulator. Furthermore, the set-up turn-around time from the tag emulator, the DUT and the tag emulator
orientation and position as well as the used interrogator output power and the used operation frequency
shall also be recorded. In addition, the test report shall provide information on at least the following aspects
of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
6.2 Functional tests of tag
6.2.1 Tag demodulation and turn-around time
6.2.1.1 Test objective
The objectives of this test are to verify whether the tag is capable of:
— demodulating signals from the interrogator, and
— receiving the data transmitted by the interrogator after the minimum specified response to command
turn-around time.
6.2.1.2 Test procedure
The test interrogator shall transmit an Init_round_all (see B.1.1) command.
The tag (DUT) shall receive the command provided by the interrogator and shall provide an appropriate
response. After complete reception of the tag response, the interrogator shall generate a Next_slot command
within the minimum specified turn-around time between tag response and interrogator command.
Measurements shall be done by verifying that the tag detects the command appropriately by means of
evaluation of its response. Measurements shall be done at P = 1,2 P .
I I,min
In case the interrogator is designed for shorter communication distances, then the distance d may be
TE
decreased and the actual used value shall be mentioned in the test report.
The test shall be seen as successful when it can be shown that the tag sent the correct response for both
commands including verification of the CRC.
The interrogator waveform shall contain the setup of the waveform for the respective types in accordance
with Table 4.
© ISO/IEC 2025 – All rights reserved
Table 4 — Setup of waveforms
Setup number Setup description Parameter setting
A-1 Minimum modulation depth D = D
min
A-2 Medium modulation depth D = (D + D )/2
max min
A-3 Maximum modulation depth D = D
max
6.2.1.3 Test report
The test result shall be recorded as successful or unsuccessful. The test report shall contain the tag distance
to the interrogator. Furthermore, also the setup turn-around time from the tag response to interrogator
command, the DUT and the interrogator orientation and position, as well as the used interrogator output
power and the used operation frequency shall be recorded. In addition, the test report shall provide
information on at least the following aspects of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
6.2.2 Tag backscatter
6.2.2.1 Test objective
The objective of this test is to verify that the tag provides the appropriate modulation waveform and
backscatter strength required to be successfully detected and received by the interrogator.
Measurements are carried out in an anechoic chamber either in bistatic antennas configuration as shown
in Figure 3 with the tag positioned in the far field of the transmit antenna or in monostatic antenna
configuration (see Figure 3).
6.2.2.2 Test procedure
Measurements shall be done with power P , where P is the minimum power allowing the DUT tag
I,min I,min
activation.
A vector signal analyser as specified in Annex C shall be used to record the quadrature baseband voltages I
and Q versus time.
Test setup shall be calibrated to determine antennas gain and mismatch, circulator isolation and insertion
loss and also cables loss, to be taken into account for all power measurements.
The delta radar cross-section measurement procedure is as follows.
a) The signal generator shall be set to the required test frequency.
b) The signal generator amplitude shall be set to a value that allows the DUT tag activation.
c) Using the power meter, determine the power at the entrance of the transmit antenna, P , which is defined
e
as the average power measured over at least 100 µs period during the continuous wave signal following
the signal generator command.
© ISO/IEC 2025 – All rights reserved
d) The signal analyser shall be set to measure the quadrature baseband I and Q power versus time with a
sampling rate of at least 5 Msps.
e) With the tag placed in the anechoic chamber, the analyser shall be set to capture the complex IQ power
for at least during 10 symbols of tag reply.
f) Calculate the difference of power from the DUT tag backscattering in accordance with Formula (1):
1 22
ΔP ()rms =−. ()II +−()QQ (1)
( )
tagr,1 r,0r,1 r,0
2Z
where Z is the wave resistance of the measurement equipment and is usually 50 Ω.
g) Calculate the Δ of the DUT tag by bistatic setup using Formula (2):
RCS
ΔP
4π.dd
tag 4π
T,IA T,MA
Δ = (2)
RCS
P GG. λ
e IA MA
6.2.2.3 Test report
The test report shall give the measured values of Δ . The pass/fail condition is determined whether the
RCS
measured values are within the requirements as specified in ISO/IEC 18000-61 and the evaluated Δ is at
RCS
least above the value from ISO/IEC 18000-61. Furthermore, the DUT and the interrogator orientation and
position as well as the used interrogator output power and the used operation frequency shall be recorded.
In addition, the test report shall provide information on at least the following aspects of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
6.2.3 Tag response time
6.2.3.1 Test purpose
The objective of this test is to verify the tag response time, T , referencing the parameters in
rs
ISO/IEC 18000-61.
6.2.3.2 Test procedure
The interrogator shall transmit a Init_round_all command (see B.1.1) at the maximum power of the selected
carrier frequency for testing.
The measurements shall be done using the tag backscatter test setup.
The response time shall be measured by an oscilloscope as specified in Annex C.
NOTE An example for the measurements is given in Clause E.1.
© ISO/IEC 2025 – All rights reserved
6.2.3.3 Test report
The test report shall give the measured values of turn-around time. The pass/fail condition is determined
whether the measured values are within the requirements for the response time as specified in
ISO/IEC 18000-61. In addition, the test report shall provide information on at least the following aspects of
the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
6.2.4 Tag bit rate
6.2.4.1 Test objective
The objective of this test is to verify the bit rate accuracy and data rate of the return link by verification of
the T parameter.
rlb
6.2.4.2 Test procedure
The interrogator shall transmit a Init_round_all command (see B.1.1) at the maximum power of the selected
carrier frequency for testing.
The tag response waveform shall be recorded by an oscilloscope as specified in Annex C using the tag
backscatter test setup.
The bit rate accuracy shall be measured on the preamble of the tag response.
The average on the first seven bits of preamble shall be used to measure the bite rate accuracy.
NOTE An example for the measurements is given in Clause E.2.
6.2.4.3 Test report
The test report shall give the measured values of bit rate calculated in accordance with Formula (3) and
Formula (4):
TT=×7 (3)
B7 rlb
R = (4)
rlb
T
B7
The pass/fail condition is determined whether the measured values are within the requirements as specified
in ISO/IEC 18000-61. In addition, the test report shall provide information on at least the following aspects
of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
© ISO/IEC 2025 – All rights reserved
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
6.2.5 Tag state storage time
6.2.5.1 Test objective
The objective of this test is to verify the state storage time of the tag if the energizing field is absent or
insufficient.
6.2.5.2 Test procedure
The interrogator shall transmit a Init_round_all command (see B.1.1) at the maximum power of the selected
carrier frequency for testing.
After the end of mandatory command sent by the interrogator, the field shall be shut down for a specified
time during two tag states and the following shall be done:
a) Quiet state: The test shall be executed for shutoff time equal to the lower limit value of time defined in
ISO/IEC 18000-61 on which the tag has to keep the Quiet state.
b) Other states: The test shall be executed for shutoff time equal to the lower limit value of time defined in
ISO/IEC 18000-61 during which the tag has to retain its state.
6.2.5.3 Test report
The test report shall give the tested values of limit storage state time. The pass/fail condition is determined
whether the measured values are within the requirements in ISO/IEC 18000-61:2012, 6.5.2. In addition, the
test report shall provide information on at least the following aspects of the test:
— the sample;
— the International Standard used (including its year of publication);
— the method used;
— the result(s), including a reference to the clause which explains how the results were calculated;
— any deviations from the procedure;
— any unusual features observed;
— the date of the test.
7 Conformance tests for ISO/IEC 18000-62
7.1 Functional tests of interrogator
7.1.1 Interrogator modulation test
7.1.1.1 Test objective
The objective of this test is to verify that the interrogator provides the appropriate modulation waveform
required for operation of tags.
© ISO/IEC 2025 – All rights reserved
...








Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.
Loading comments...