ISO/IEC 10373-2:2015
(Main)Identification cards — Test methods — Part 2: Cards with magnetic stripes
Identification cards — Test methods — Part 2: Cards with magnetic stripes
ISO/IEC 10373-2:2015 defines test methods for characteristics of identification cards according to the definition given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, for example ISO/IEC 7810, or one or more of the supplementary standards that define the information storage technologies employed in identification card applications. ISO/IEC 10373-2:2015 defines test methods which are specific to magnetic stripe technology.
Cartes d'identification — Méthodes d'essai — Partie 2: Cartes à bandeaux magnétiques
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Standards Content (Sample)
INTERNATIONAL ISO/IEC
STANDARD 10373-2
Third edition
2015-01-15
Identification cards — Test methods —
Part 2:
Cards with magnetic stripes
Cartes d’identification — Méthodes d’essai —
Partie 2: Cartes à bandeaux magnétiques
Reference number
ISO/IEC 10373-2:2015(E)
©
ISO/IEC 2015
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ISO/IEC 10373-2:2015(E)
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ISO/IEC 10373-2:2015(E)
Contents Page
Foreword .v
1 Scope .1
2 Normative references .1
3 Terms and definitions .2
4 Default items applicable to the test methods .4
4.1 Test environment . 4
4.2 Pre-conditioning . 4
4.3 Selection of test methods . 4
4.4 Default tolerance . 4
4.5 Total measurement uncertainty . 4
5 Test methods . 5
5.1 Magnetic stripe area warpage. 5
5.1.1 Apparatus . 5
5.1.2 Procedure . 5
5.1.3 Test report . 6
5.2 Height and surface profile of the magnetic stripe . 6
5.2.1 Apparatus . 6
5.2.2 Procedure . 7
5.2.3 Expression of results . 8
5.2.4 Test report .10
5.3 Surface roughness of the magnetic stripe .10
5.3.1 Procedure .11
5.3.2 Test report .11
5.4 Wear test for magnetic stripe .11
5.4.1 Apparatus .11
5.4.2 Procedure .11
5.4.3 Test report .12
5.5 Amplitude measurements .13
5.5.1 Calibration reference . .13
5.5.2 Apparatus .13
5.5.3 Procedure .18
5.5.4 Test report .20
5.6 Flux transition spacing variation .20
5.6.1 Apparatus .20
5.6.2 Procedure .21
5.6.3 Test report .21
5.7 Magnetic stripe adhesion .21
5.7.1 Apparatus .21
5.7.2 Procedure .21
5.7.3 Test report .22
5.8 Static magnetic characteristics .22
5.8.1 Apparatus .22
5.8.2 Procedure .23
5.8.3 Test report .24
5.9 Waveform U .
i6 24
5.9.1 Apparatus .24
5.9.2 Procedure .24
5.9.3 Test report .25
5.10 High coercivity, high density over-write .25
5.10.1 Apparatus .25
5.10.2 Test method .25
5.10.3 Test report .25
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ISO/IEC 10373-2:2015(E)
Annex A (informative) Effects of wear on test heads and the use of wear resistant test heads .26
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ISO/IEC 10373-2:2015(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are
members of ISO or IEC participate in the development of International Standards through technical
committees established by the respective organization to deal with particular fields of technical
activity. ISO and IEC technical committees collaborate in fields of mutual interest. Other international
organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the
work. In the field of information technology, ISO and IEC have established a joint technical committee,
ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting.
Publication as an International Standard requires approval by at least 75 % of the national bodies
casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
ISO/IEC 10373-2 was prepared by Joint Technical Committee ISO/IEC JTC 1, Information technology,
Subcommittee SC 17, Cards and personal identification.
This third edition cancels and replaces the second edition (ISO/IEC 10373-2:2006), which has been
technically revised. It also incorporates the Technical Corrigendum ISO/IEC 10373-2:2006/Cor1:2010.
The user is encouraged to review the entire standard for revisions and updates. The major changes
made during this revision are listed below.
— References to ISO/IEC 7811-8 and ISO/IEC 8484 were added.
— Calibration of reference current for ISO/IEC 7811-2 has been added. This will result in a small
offset in requirements from the existing 2006 edition but will be equivalent to the requirements as
written originally.
— Test densities of 500 ftpi have been changed to 508 ftpi to more closely agree with actual values used.
— Requirements that are different for different base standards have been moved into tables in most cases.
— In 5.5.2.3, Note 2 contained a normative requirement so it was moved out of note.
— The 2 cases of Figure 14 have been combined and a table was given. Conflicting symmetry
requirements were resolved by taking T1 = T2 ± 0,02 T1.
— Description of correcting reference values was clarified and terms were deleted since these were
not used. Reference to older editions of base standards was deleted.
— Contents of the technical corrigendum have been incorporated.
ISO/IEC 10373 consists of the following parts, under the general title Identification cards — Test methods:
— Part 1: General characteristics
— Part 2: Cards with magnetic stripes
— Part 3: Integrated circuit cards with contacts and related interface devices
— Part 5: Optical memory cards
— Part 6: Proximity cards
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ISO/IEC 10373-2:2015(E)
— Part 7: Vicinity cards
— Part 8: USB-ICC
— Part 9: Optical memory cards — Holographic recording method
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INTERNATIONAL STANDARD ISO/IEC 10373-2:2015(E)
Identification cards — Test methods —
Part 2:
Cards with magnetic stripes
1 Scope
ISO/IEC 10373 defines test methods for characteristics of identification cards according to the definition
given in ISO/IEC 7810. Each test method is cross-referenced to one or more base standards, for example
ISO/IEC 7810, or one or more of the supplementary standards that define the information storage
technologies employed in identification card applications.
This part of ISO/IEC 10373 defines test methods which are specific to magnetic stripe technology.
NOTE 1 Criteria for acceptability do not form part of this part of ISO/IEC 10373 but will be found in the
International Standards mentioned above.
NOTE 2 Test methods described in this part of ISO/IEC 10373 are intended to be performed separately. A given
card is not required to pass through all the tests sequentially.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
ISO 1302, Geometrical Product Specifications (GPS) — Indication of surface texture in technical product
documentation
ISO 2409, Paints and varnishes — Cross-cut test
ISO 3274, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instruments
ISO 4288, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and
procedures for the assessment of surface texture
ISO/IEC 7810, Identification cards — Physical characteristics
ISO/IEC 7811-2, Identification cards — Recording technique — Part 2: Magnetic stripe — Low coercivity
ISO/IEC 7811-6, Identification cards — Recording technique — Part 6: Magnetic stripe — High coercivity
ISO/IEC 7811-7, Identification cards — Recording technique — Part 7: Magnetic stripe — High
coercivity, high density
ISO/IEC 7811-8, Identification cards — Recording technique — Part 8: Magnetic stripe — Coercivity of 51,7
kA/m (650 Oe)
ISO/IEC 8484, Information technology — Magnetic stripes on savingsbooks
IEC 60454-2, Pressure-sensitive adhesive tapes for electrical purposes — Part 2: Methods of test
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ISO/IEC 10373-2:2015(E)
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
NOTE Static magnetic characteristics definitions were originally derived from IEC 50–221 (which has been
replaced by IEC 60050–221) and ISO 31-5:1992 (which has been replaced by IEC 80000–6).
3.1
test method
method for testing characteristics of identification cards for the purpose of confirming their compliance
with International Standards
3.2
testably functional
has survived the action of some potentially destructive influence to the extent that
a) any magnetic stripe present on the card shows a relationship between signal amplitudes before and
after exposure that is in accordance with the base standard
1)
b) any integrated circuit(s) present in the card continue to show an Answer to Reset response which
conforms to the base standard
c) any contacts associated with any integrated circuit(s) present in the card continue to show electrical
resistance and impedance which conform to the base standard
d) any optical memory present in the card continues to show optical characteristics which conform to
the base standard
e) any contactless integrated circuit(s) in the card continue to operate as intended
3.3
warpage
deviation from flatness
3.4
flux transitions per millimetre
ft/mm
linear recording density applied to a track on a magnetic stripe
3.5
recording
creating a track of flux reversals according to a test method given in this part of ISO/IEC 10373, with the
values of all applicable test parameters specified
3.6
encoding
creating a track of flux reversals whose spacing is modified, according to a coding scheme, to represent data
3.7
surface roughness
surface topology of an area of surface, qualified in the International Standards by reference to various
resolution determinants and methods of calculation
3.8
amplitude measurements
〈magnetic stripe〉 measurement of read-back signal amplitude according to a test method given in this
part of ISO/IEC 10373, with the values of all applicable test parameters specified
1) This part of ISO/IEC 10373 does not define any test to establish the complete functioning of integrated circuit(s)
cards. The test methods require only that the minimum functionality (testably functional) be verified. This can, in
appropriate circumstances, be supplemented by further application-specific functionality criteria which are not
available in the general case.
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ISO/IEC 10373-2:2015(E)
3.9
flux transition spacing variation
deviation from nominal of measured values of the distance between adjacent flux transitions along a
line parallel to the centreline of the encoded track
3.10
magnetic stripe adhesion
strength of the bond between the magnetic stripe and the card
3.11
normal use
use as an identification card according to ISO/IEC 7810, involving equipment processes appropriate to
the card technology and storage as a personal document between equipment processes
3.12
static saturation M(H) loop
normal hysteresis loop for which the magnetic field strength is cycled between the extremes −H to
max
+H at such a low rate of change that the loop is not influenced by the rate of change
max
3.13
coercivity
H’ = H’
cM cJ
continuously applied magnetic field which reduces the magnetization to zero from a previously saturated
state in the opposite direction, measured parallel to the longitudinal axis of the stripe
3.14
remanent coercivity
H
r
applied magnetic field which when removed returns the material to a zero magnetization state from a
previously saturated state in the opposite direction, measured parallel to the longitudinal axis of the stripe
3.15
Oersted
Oe
Gaussian CGS unit of magnetic field strength which is commonly used in the magnetic recording industry,
equal to approximately 79,578 A/m
3.16
static demagnetization
S
160
reduction in magnetization under the influence of an opposing magnetic field; characterised by
+
[M − M (−160)] ÷ M ; the average slope of the “demagnetization” quadrant of the static saturation M(H)
r r
loop between magnetic field strength values of H = 0 and H = −160 kA/m
3.17
squareness
SQ
ratio of M , the value of magnetization (M) at zero magnetic field strength (H = 0), to M(H ), the value
r max
of magnetization at H obtained from the static saturation M(H) loop
max
3.18
longitudinal squareness
SQ
||
squareness of the medium measured parallel to the longitudinal axis of the magnetic stripe
3.19
perpendicular squareness
SQ
⊥⊥
squareness of the medium measured perpendicular to the plane of the magnetic stripe
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ISO/IEC 10373-2:2015(E)
3.20
switching field by derivative
SF
D
width at half height of the differentiated static magnetization curve M(H) divided by the coercivity from
the same curve
3.21
switching field by slope
SF
S
difference between the field values at the intercept of the static magnetization M(H) loop, M(H) of 0,5M
r
and M(H) of −0,5M , divided by the coercivity
r
3.22
angle of maximum squareness
Θ(SQ )
max
angle between the direction at which the maximum value of squareness is found and the longitudinal
axis of the magnetic stripe
3.23
resolution
average signal amplitude at some specified higher recording density divided by the average signal
amplitude at some specified lower recording density, multiplied by 100 and expressed as a percentage
3.24
U
Fi
magnitude of the individual element at specified frequency of the Fourier spectrum of the entire
waveform of the stripe
4 Default items applicable to the test methods
4.1 Test environment
Unless otherwise specified, testing shall take place in an environment of temperature 23°C ± 3°C
(73°F ± 5°F) and of relative humidity 40 % to 60 %.
4.2 Pre-conditioning
Where pre-conditioning is required by the test method, the identification cards to be tested shall be
conditioned to the test environment for a period of 24 h before testing.
4.3 Selection of test methods
Tests shall be applied as required to test the attributes of the card defined by the relevant base standard.
4.4 Default tolerance
Unless otherwise specified, a default tolerence of ± 5 % shall be applied to the quantity values given to
specify the characteristics of the test equipment (e.g. linear dimensions) and the test method procedures
(e.g. test equipment adjustments).
4.5 Total measurement uncertainty
The total measurement uncertainty for each quantity determined by these test methods shall be stated
in the test report.
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ISO/IEC 10373-2:2015(E)
5 Test methods
5.1 Magnetic stripe area warpage
The purpose of this test is to measure the degree of warpage of a card test sample in the area of the
magnetic stripe (see ISO/IEC 7811-2, ISO/IEC 7811-6, ISO/IEC 7811-7, ISO/IEC 7811-8, ISO/IEC 8484).
The method is applicable to both embossed and unembossed cards.
5.1.1 Apparatus
The apparatus is shown in Figure 1. It comprises:
a) a level rigid plate whose surface roughness is not greater than 3,2 μm (130 μin) in accordance with
ISO 1302. The plate shall contain an aperture to allow access for a micrometer probe;
b) a dial indicator accurate to within 2,5 μm (98 μin) with a probe whose contact area is a hemisphere
with a diameter in the range of 3 mm to 8 mm (0.1 in to 0.3 in). The force exerted by the probe shall
be f = 0,6 N ± 0,3 N (0.13 lbf ± 0.07 lbf);
c) a means of applying a force, F = 2,2 N (0.49 lbf), evenly distributed on the front face of the card
opposite the magnetic stripe area.
F + f
Reference base
N8
f
Micrometer
(precision 2,5 μm)
Magnetic stripe area
Figure 1 — Measuring arrangement (not to scale)
5.1.2 Procedure
Place the sample card, front side up, on the level rigid plate. Position the magnetic stripe area to be
measured over the aperture.
The load of 2,2 N (0.49 lbf) should be increased by an amount f to compensate for the micrometer force
which is acting in the opposite direction to that force.
Apply the force F (+ f ) directly over the magnetic stripe area on the front side of the card. Wait 1 minute
before making any measurements.
Measure the card stripe area warpage at the nine positions along the stripe as shown in Figure 2. Additional
locations shall be measured if the magnetic stripe area warpage appears greater in those areas than in
the nine designated areas.
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ISO/IEC 10373-2:2015(E)
10,00
X
+ ++++ ++ ++
NOTE The value of X is given in Table 1.
Figure 2 — Measuring points on the card (dimensions in mm, not to scale)
Table 1 — Position of the line of measuring points
Magnetic stripe area Dimension X (mm)
Tracks 1 and 2 8,00
Tracks 1, 2 and 3 10,70
5.1.3 Test report
The test report shall give the maximum value obtained from the set of nine measurements.
5.2 Height and surface profile of the magnetic stripe
The purpose of this test is to determine the height and flatness of the magnetic stripe of a card test
sample (see ISO/IEC 7811-2, ISO/IEC 7811-6, ISO/IEC 7811-7, ISO/IEC 7811-8, and ISO/IEC 8484).
The height of the magnetic stripe is determined by reference to the card and the stripe surface profile.
5.2.1 Apparatus
The following items are required:
a) a profilometer (see Figure 3);
b) a notched rigid metal plate as shown in Figure 4. Any rigid metal can be used to construct the plate,
but its thickness shall be adjusted, according to the density of the material, to achieve a weight of
2,2 N ± 0,1 N (0.49 lbf ± 0.02 lbf). All dimensions of the plate shall be ± 0,5 mm (0.02 in) or better.
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ISO/IEC 10373-2:2015(E)
Figure 3 — Measuring device for height and profile of magnetic stripe (not to scale)
15,00
10,00 to 15,00
15,00
10,00 to 15,00
10,00 to 15,00
42,00
84,00
Figure 4 — Card holder plate-contact area (dimensions in mm, not to scale)
5.2.2 Procedure
Hold the card to be tested under the notched rigid metal plate shown in Figure 4.
Measure the height and the surface profile of the magnetic stripe and the surrounding card surface
using a measuring recording instrument.
Measure the profile at a maximum speed of 1 mm/s (0.04 in/s) using a probe having a radius of 0,38 mm
to 2,54 mm (0.015 in to 0.1 in) applied with a force of 0,5 mN to 6 mN (0.0001 lbf to 0.0013 lbf).
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22,00
22,00
22,00
27,00
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ISO/IEC 10373-2:2015(E)
Take three measurements on each specimen across the width of the stripe. The locations V and Y are
defined as the distance of 15 mm ± 2 mm (0.59 in ± 0.08 in) from each end of the card and location X is
the centreline of the card (see Figure 5).
Additional areas shall be measured if the height or surface profile deviations appear to be greater in
those areas than in the three designated areas.
The starting point for measurement along each line V,X,Y begins 1 mm minimum (0.04 in minimum)
above the top edge of the magnetic media and ends 1 mm minimum (0.04 in minimum) below the bottom
edge of the magnetic media.
NOTE In preparing the test card for the surface profile measurement, it is helpful to lightly scribe a line,
using a sharp knife, parallel to the top reference edge of the card for locating the minimum stripe width W on the
profile recording.
YX V
15 ±2 15 ±2
Figure 5 — Magnetic stripe profile measurement location (dimensions in mm, not to scale)
5.2.3 Expression of results
5.2.3.1 Surface profile of the magnetic stripe
For the measurements along V, X, and Y line (see Figure 5), form a first basic measurement line (see
Figure 6 and Figure 7) by connecting the top and bottom points that define the edges of the minimum
stripe width. The basic measurement line shall lie within 10° of the chart recording direction.
The maximum vertical deviation (a) is the distance between the basic measuring line and the point on
the magnetic media furthest away from the basic measurement line. The measurement shall be made
perpendicular to the chart recording direction.
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b = 1(min) W b = 1(min)
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ISO/IEC 10373-2:2015(E)
Key
a maximum vertical deviation
b 1 mm (minimum)
W Minimum stripe width as specified in the relevant base sta
...
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