ISO 19683:2017
(Main)Space systems — Design qualification and acceptance tests of small spacecraft and units
Space systems — Design qualification and acceptance tests of small spacecraft and units
ISO 19683:2017 provides test methods and test requirements for design qualification and/or acceptance of small spacecraft or units. It provides the minimum test requirements and test methods to qualify the design and manufacturing methods of commercial small spacecraft and their units and to accept the final products. ISO 19683:2017 places emphasis on achieving reliability against infant mortality after satellite launch to orbit while maintaining low cost and fast delivery. ISO 19683:2017 is applied to satellites whose development methods are different from the ones used for traditional satellites that have little room for risk tolerance, as shown in Figure 1. The scope of this document encompasses different categories of small spacecraft, so-called mini-, micro, nano-, pico- and femto-, as well as CubeSat, spacecraft. Therefore, for the sake of convenience, the term "small spacecraft" is used throughout this document as a generic term. ISO 19683:2017 includes CubeSat, as long as it is developed with the untraditional processes.
Systèmes spatiaux — Qualification de la conception et essais de réception des petits véhicules spatiaux
General Information
Standards Content (Sample)
INTERNATIONAL ISO
STANDARD 19683
First edition
2017-07
Space systems — Design qualification
and acceptance tests of small
spacecraft and units
Systèmes spatiaux — Qualification de la conception et essais de
réception des petits véhicules spatiaux
Reference number
ISO 19683:2017(E)
©
ISO 2017
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ISO 19683:2017(E)
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© ISO 2017, Published in Switzerland
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ii © ISO 2017 – All rights reserved
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ISO 19683:2017(E)
Contents Page
Foreword .vii
Introduction .viii
1 Scope . 1
2 Normative references . 2
3 Terms and definitions . 2
4 Abbreviated terms . 3
5 General requirements . 4
5.1 Tailoring . 4
5.2 Qualification test . 4
5.3 Acceptance test . 4
5.4 Proto-flight test . 4
5.5 Retest . 4
5.6 Test documentation . 4
5.6.1 Test plan, specification and procedure . 5
5.6.2 Test report . 5
5.6.3 Datasheet for unit test results . 6
5.7 Test conditions, tolerances and accuracies. 6
5.8 Functional test . 6
5.9 Design, verification and testing philosophy . 6
6 Satellite system tests . 7
6.1 Test items . 7
6.2 Test level and duration . 8
7 Unit tests . 8
7.1 Test items . 8
7.2 Test levels and duration .14
8 Test requirements .17
8.1 Electrical interface .17
8.1.1 Purpose of test .17
8.1.2 Test facilities and setup as basic requirements .18
8.1.3 Test article configuration .18
8.1.4 Monitoring during test . .18
8.1.5 Test levels and duration .18
8.1.6 Test conditions and guidelines .18
8.2 Functional test .18
8.2.1 Purpose of test .18
8.2.2 Test facilities and setup as basic requirements .18
8.2.3 Test article configuration .18
8.2.4 Monitoring during test . .18
8.2.5 Test levels and duration .18
8.2.6 Test conditions and guidelines .19
8.3 Mission test .19
8.3.1 Purpose of test .19
8.3.2 Test facilities and setup as basic requirements .19
8.3.3 Test article configuration .19
8.3.4 Monitoring during test . .19
8.3.5 Test levels and duration .19
8.3.6 Test conditions and guidelines .19
8.4 Total Ionization Dose (TID) test .19
8.4.1 Purpose of test .19
8.4.2 Test facilities and setup as basic requirements .20
8.4.3 Test article configuration .20
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ISO 19683:2017(E)
8.4.4 Monitoring during test . .20
8.4.5 Test levels and duration .20
8.4.6 Test conditions and guidelines .20
8.5 Single Event Effect (SEE) test .20
8.5.1 Purpose of test .20
8.5.2 Test facilities and setup as basic requirements .20
8.5.3 Test article configuration .20
8.5.4 Monitoring during test . .21
8.5.5 Test levels and duration .21
8.5.6 Test conditions and guidelines .21
8.5.7 Test conditions and guidelines .21
8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test .21
8.6.1 Purpose of test .21
8.6.2 Test facilities and setup as basic requirements .21
8.6.3 Test article configuration .22
8.6.4 Monitoring during test . .22
8.6.5 Test levels and duration .22
8.6.6 Test conditions and guidelines .22
8.7 Electromagnetic Compatibility (EMC) test .22
8.7.1 Purpose of test .22
8.7.2 Test facilities and setup as basic requirements .22
8.7.3 Test article configuration .22
8.7.4 Monitoring during test . .22
8.7.5 Test levels and duration .23
8.7.6 Test conditions and guidelines .23
8.8 Deployment test .23
8.8.1 Purpose of test .23
8.8.2 Test facilities and setup as basic requirements .23
8.8.3 Test article configuration .23
8.8.4 Monitoring during test . .23
8.8.5 Test levels and duration .23
8.8.6 Test conditions and guidelines .23
8.9 Magnetic field test .24
8.10 Antenna pattern test .24
8.11 Alignment measurement .24
8.12 Physical property measurement.24
8.13 Launcher/Spacecraft interface test .24
8.14 Quasi-static load test.24
8.14.1 Purpose of test .24
8.14.2 Test facilities and setup as basic requirements .24
8.14.3 Test article configuration .24
8.14.4 Monitoring during test . .24
8.14.5 Test levels and duration .24
8.14.6 Test conditions and guidelines .25
8.15 Modal survey .25
8.15.1 Purpose of test .25
8.15.2 Test facilities and setup as basic requirements .25
8.15.3 Test article configuration .25
8.15.4 Monitoring during test . .25
8.15.5 Test levels and duration .25
8.15.6 Test conditions and guidelines .25
8.16 Sinusoidal vibration test .25
8.16.1 Purpose of test .25
8.16.2 Test facilities and setup as basic requirements .25
8.16.3 Test article configuration .25
8.16.4 Monitoring during test . .26
8.16.5 Test levels and duration .26
8.16.6 Test conditions and guidelines .26
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ISO 19683:2017(E)
8.17 Random vibration test .26
8.17.1 Purpose of test .26
8.17.2 Test facilities and setup as basic requirements .26
8.17.3 Test article configuration .26
8.17.4 Monitoring during test . .26
8.17.5 Test levels and duration .26
8.17.6 Test conditions and guidelines .26
8.18 Acoustic test .27
8.18.1 Purpose of test .27
8.18.2 Test facilities and setup as basic requirements .27
8.18.3 Test article configuration .27
8.18.4 Monitoring during test . .27
8.18.5 Test levels and duration .27
8.18.6 Test conditions and guidelines .27
8.19 Shock test .27
8.19.1 Purpose of test .27
8.19.2 Test facilities and setup as basic requirements .27
8.19.3 Test article configuration .27
8.19.4 Monitoring during test . .27
8.19.5 Test levels and duration .28
8.19.6 Test conditions and guidelines .28
8.20 Thermal balance test .28
8.20.1 Purpose of test .28
8.20.2 Test facilities and setup as basic requirements .28
8.20.3 Test article configuration .28
8.20.4 Monitoring during test . .28
8.20.5 Test levels and duration .28
8.20.6 Test conditions and guidelines .28
8.21 Thermal vacuum test .29
8.21.1 Purpose of test .29
8.21.2 Test facilities and setup as basic requirements .29
8.21.3 Test article configuration .29
8.21.4 Monitoring during test . .29
8.21.5 Test levels and duration .29
8.21.6 Test conditions and guidelines .29
8.22 Functional test in vacuum .30
8.22.1 Purpose of test .30
8.22.2 Test facilities and setup as basic requirements .30
8.22.3 Test article configuration .30
8.22.4 Monitoring during test . .30
8.22.5 Test levels and duration .30
8.22.6 Test conditions and guidelines .30
8.23 Cold/Hot start test .30
8.23.1 Purpose of test .30
8.23.2 Test facilities and setup as basic requirements .30
8.23.3 Test article configuration .31
8.23.4 Monitoring during test . .31
8.23.5 Test levels and duration .31
8.23.6 Test conditions and guidelines .31
8.24 Thermal cycle functional test .31
8.24.1 Purpose of test .31
8.24.2 Test facilities and setup as basic requirements .31
8.24.3 Test article configuration .
...
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