ISO 11452-3:1995
(Main)Road vehicles — Electrical disturbances by narrowband radiated electromagnetic energy — Component test methods — Part 3: Transverse electromagnetic mode (TEM) cell
Road vehicles — Electrical disturbances by narrowband radiated electromagnetic energy — Component test methods — Part 3: Transverse electromagnetic mode (TEM) cell
Véhicules routiers — Perturbations électriques par rayonnement d'énergie électromagnétique en bande étroite — Méthodes d'essai d'un composant — Partie 3: Cellule TEM
General Information
Relations
Standards Content (Sample)
INTERNATIONAL
ISO
STANDARD 11452-3
First edition
1995-12-01
Corrected and reprinted
1996-06-15
Road vehicles - Electrical disturbances
by narrowband radiated electromagnetic
energy - Component test methods -
Part 3:
Transverse electromagnetic mode (TEM) cell
lkhicules routjers - Perturba tions klectriques par ra yonnemen t d’energie
klectromagn&ique en bande &roite - Mkthodes d’essai d’un
composan t -
Partie 3: Cellule TEM
Reference number
ISO 11452-3:1995(E)
---------------------- Page: 1 ----------------------
ISO 11452=3:1995(E)
Contents
Page
1
1 Scope . . . . . . . . . . . . .*.*.*.
1
2 Normative references . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
3 Test conditions . .
2
....................................
3.1 Test temperature and supply voltage
2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.2 Frequency range
2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.3 Modulation
2
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
3.4 Dweil time
2
..............................................................
3.5 Frequency step sizes
2
........ .........................................................
3.6 Test severity levels
........................ 2
4 Test instrument description and specifications
2
.........................................................
4.1 TEM cell .
3
................................. .....................................
4.2 I nstrumentation
3
..............................................................................
4.3 Test set-up
6
5 Test procedure .
6
5.1 Test plan .
6
5.2 Test methods .
7
........ ......................................................................
5.3 Test report
Annexes
. . . . . . . . . . . . . . . . . . . . . . . . . . . 8
. . . .
A Field probe System calibration procedure
IO
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .~.
B TEM cell dimensions
12
. . . . . . . . . . . . . . .
C Function Performance Status classification (FPSC)
0 ISO 1995
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced
or utilized in any form or by any means, electronie or mechanical, including photocopying and
microfilm, without Permission in writing from the publisher.
International Organization for Standardization
Case Postale 56 l CH-I 211 Geneve 20 l Switzerland
Printed in Switzerland
---------------------- Page: 2 ----------------------
0 ISO ISO 11452=3:1995(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide
federation of national Standards bodies (ISO member bodies). The work
of preparing International Standards is normally carried out through ISO
technical committees. Esch member body interested in a subject for
which a technical committee has been established has the right to be
represented on that committee. International organizations, governmental
and non-governmental, in liaison with ISO, also take patt in the work. ISO
collaborates closely with the International Electrotechnical Commission
(IEC) on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are
circulated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard ISO 11452-3 was prepared by Technical Committee
ISO/TC 22, ßoad vehicles, Subcommittee SC 3, ElectricaI and electronie
equipmen t.
ISO 11452 consists of the following Parts, under the general title ßoad
vehicles - Electrical disturbances by narrowband radiated electro-
magnetic energy - Component test methods:
- Part 7: General and definitions
- Part 2: Absorber-lined chamber
- Part 3: Transverse electromagnetic mode (TEM) cell
- Part 4: Bulk current injection (BC/)
- Part 5: Stripline
- Part 6: Parallel plate antenna
- Part 7: Direct radio frequency (RF) power injection
Annex A forms an integral patt of this part of ISO 11452. Annexes B and
C are for information only.
. . .
Ill
---------------------- Page: 3 ----------------------
This page intentionally left blank
---------------------- Page: 4 ----------------------
ISO 1145203:1995(E)
INTERNATIONAL STANDARD 0 ISO
Road vehicles - Electrical disturbances
by narrowband radiated electromagnetic energy -
Component test methods -
Part 3:
Transverse electromagnetic mode (TEM) cell
1 Scope 2 Normative references
This part of ISO 11452 specifies transverse electro-
The following Standards contain provisions which,
magnetic mode (TEM) cell test methods and pro-
through reference in this text, constitute provisions
cedures for testing electromagnetic immunity of
of this part of ISO 11452. At the time of publication,
electronie components for passenger cars and com-
the editions indicated were valid. All Standards are
mercial vehicles regardless of the propulsion System
subject to revision, and Parties to agreements based
(e.g. spark-ignition engine, diese1 engine, electric mo-
on this part of ISO 11452 are encouraged to investi-
tor). The electromagnetic disturbances considered in
gate the possibility of applying the most recent edi-
this part of ISO 11452 are limited to continuous
tions of the Standards indicated below. Members of
narrowband electromagnetic fields.
IEC and ISO maintain registers of currently valid
This test tan be used for two purposes:
International Standards.
- testing the immunity of the component with the
ISO 7637-1:1990, ßoad vehicles - Electr-ical disturb-
field coupling to the wiring harness;
ante by conduction and coupling - Part 7: Passenger
cars and light commercial vehicles with nominal 72 V
- testing the immunity of the component by itself
supply voltage - Electrical transien t conduction along
with minimum exposure to the wiring harness.
supply lines only.
Immunity measurements of complete vehicles are
ISO 7637-2:1990, ßoad vehicles - Electrical disturb-
generally only possible by the vehicle manufacturer.
ante by conduction and coupling - Part 2: Commer-
The reasons, for example, are the high costs of an
cial vehicles with nominal 24 V supply voltage -
absorber-lined chamber, preserving the secrecy of
Electrical transient conduction along supply lines
prototypes or the large number of different vehicle
only.
models. Therefore, for research, development and
quality control a laboratory measuring method is used
ISO 11452-1 :1995, ßoad vehicles - Electrical dis-
by the manufacturer.
turbances by narrowband radia ted electromagnetic
- Component test methods - Part 7: Gen-
energy
Part 1 of ISO 11452 gives general information, defi-
eral and definitions.
nitions, practical use and basic principles of the test
procedure.
---------------------- Page: 5 ----------------------
0 ISO
ISO 11452=3:1995(E)
by the users of this part of ISO 11452 shall be docu-
3 Test conditions
mented in the test report.
3.1 Test temperature and supply voltage
If it appears that the susceptibility thresholds of the
device under test are vety near the Chosen test level,
The ambient temperature during the test shall be
these frequency step sizes should be reduced in the
(23 + 5) “C.
frequency range concerned in Order to find the mini-
mum susceptibility thresholds.
The supply voltage during the test shall be
(13,5 + 0,s) V for 12 V electrical Systems and
(27 +T) V for 24 V electrical Systems. Table 1 - Frequency step sizes
-
Maximum
If other values are agreed by the users of this patt of
Frequency band
frequency step size
ISO 11452, the values shall be documented in the
test report. MHz MHz
>O,Ol to
3.2 Frequency range
>O,l to GI
Oll
I I
The upper frequency range of the TEM cell is a direct
>1to
function of the TEM cell dimensions.
I
AO to <200 2
For testing automotive electronie Systems it is rec-
I
I
ommended to use a TEM cell from 0,Ol MHz to
200 MHz.
3.6 Test severity levels
NOTE 1 The dimensions for the suggested TEM cells at-e
The user should specify the test severity level(s) over
given in table B-1 in annex B.
the frequency range. Suggested test severity levels
are given in annex C.
3.3 Modulation
These test severity levels are expressed in terms of
The device under test determines the type and fre-
the equivalent root-mean-Square value of the un-
quency of modulation. If no values are agreed be-
modulated wave.
tween the users of this part of ISO 11452, the
following shall be used:
4 Test instrument description and
specifications
- no modulation (CW);
- 1 kHz sine-wave amplitude modulation (AM) of
4.1 TEM cell
80 %.
The TEM cell used in this test method is a rectangular
coaxial line with a 50 a characteristic impedance as
3.4 Dweil time
shown in figure 1. The device under test is exposed
to a uniform TEM field.
At each frequency, the device under test shall be ex-
posed to the test level for the minimum response
The TEM cell is a laboratory measurement System. lt
time needed to control it. In all cases, this minimum
tan be used to generate test fields within 2 dB of the
time of exposure shall not be less than 2 s.
theoretical value if the device under test does not
occupy an excessive Portion of the test volume (see
3.5 Frequency step sizes
. .
4 3)
All tests in this part of ISO 11452 shall be conducted The TEM cell test method cannot be used to deter-
with frequency step sizes not greater than those mine absolute test field levels, polarization and fre-
quency for device immunity. Only comparative
specified in table 1.
measurements tan be performed.
Alternatively, logarithmic frequency Steps, with the
Same minimum number of frequency Steps in each The TEM cell method has the major advantage of not
frequency band, may be used. The values, as agreed radiating energy into the surrounding space.
---------------------- Page: 6 ----------------------
ISO 11452=3:1995(E)
I
3
4 9 8
w
1 Outer shield 5 Coaxial connectors
2 Septum (inner conductor) 6, 8 Dielectric supports
3 Access door 7 Device under test
4 Connector Panel (optional 9 Input/output power leads
Figu re 1 - TEM cell
4.3.1 Exposure of device under test and wiring
4.2 Instrumentation
harness
Figure2 Shows an example of a TEM cell test set-up.
The
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.