ISO/IEC 10373-6:2001/Amd 7:2010

Identification cards - Test methods - Part 6: Proximity cards - Amendment 7: Test methods for ePassport

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 7: Méthodes d'essai pour passeport électronique

General Information

• Status: Withdrawn
• Publication Date: 09-Mar-2010
• Withdrawal Date: 09-Mar-2010
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Start Date: 07-Jan-2011
• Completion Date: 30-Oct-2025

Relations

• Amends: ISO/IEC 10373-6:2001 - Identification cards - Test methods - Part 6: Proximity cards
• Effective Date: 06-Jun-2022
• Revised: ISO/IEC 10373-6:2011 - Identification cards - Test methods - Part 6: Proximity cards
• Effective Date: 16-Oct-2025
• Child: ISO/IEC 10373-6:2001 - Identification cards - Test methods - Part 6: Proximity cards
• Effective Date: 20-Jun-2008

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-6
First edition
2001-05-15
AMENDMENT 7
2010-03-15
Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 7: Test methods for
ePassport
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité
AMENDEMENT 7: Méthodes d'essai pour passeport électronique

Reference number
ISO/IEC 10373-6:2001/Amd.7:2010(E)
©
ISO/IEC 2010
ISO/IEC 10373-6:2001/Amd.7:2010(E)
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ii © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 7 to ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.

© ISO/IEC 2010 – All rights reserved iii

ISO/IEC 10373-6:2001/Amd.7:2010(E)

Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 7: Test methods for ePassport
Page 2, 3.1
Add the following definitions and reorder alphabetically:
3.1.12
sample
one piece of the total number of PICCs required and presented for testing
3.1.13
room temperature
RT
convenient temperature within the range of 23 °C ± 3 °C (73 °F ± 5 °F)
3.1.14
threshold field strength
minimum field strength to operate the PICC as intended (operational mode)
3.1.15
AA
active authentication as defined in ISO/IEC 7501-1
Page 3, 3.2
Add the following abbreviations and symbols in alphabetical order:

BAC Basic Access Control
EAC Extended Access Control
LDS Logical Data Structure
After Annex K
Add the following new annexes:

© ISO/IEC 2010 – All rights reserved 1

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Annex L
(informative)
ePassport PICC test methods
L.1 Scope
This annex defines a test plan for the PICC contactless part of the ePassport oriented PICC. These tests are
divided into tests of the physical and electrical parameters according to ISO/IEC 14443-1:2000 and
ISO/IEC 14443-2:2001, and tests of the initialization & anticollision and the transport protocol according to
ISO/IEC 14443-3:2001 and ISO/IEC 14443-4:2008.
In order for the PICCs to operate correctly, many functional layers of technology should work together. The
purpose of this annex is to define in depth the tests to be performed to minimize the probability that an error or
fault remain undetected before the design is approved.
For ePassport compliance testing, this annex is normative.
L.2 General test requirements
The following subclauses specify the different test setups, the nominal values used for the tests, and a
recommendation for the format of the test report.
Tests for bit rates of fc/128 and fc/32 are mandatory and shall be applied. Other bit rates, when indicated in
the ATS/ATQB shall also be tested.
Depending on the implementation statement of the applicant, Type A or Type B tests shall be performed.
All tests are mandatory unless specified as "optional" or "conditional". Conditional tests shall be performed if
they are applicable.
For tests of layers 1 and 2, the minimum number of samples provided for testing is three, unless explicitly
defined otherwise. The applicant may request that a larger number of samples are tested. The samples
provided by the applicant should be personalized.
L.2.1 Test setup
The test PCD assembly (test apparatus) that is defined in this standard is the basis for the physical and
electrical tests. When testing at higher bit rates, the matching network in ISO/IEC 10373-6:2001/Amd.5:2007,
A.2.2 "Impedance matching network for bit rates of fc/64, fc/32 and fc/16", is used together with the test PCD
assembly.
For layer 2 tests (communication stability and operating field strength), the existing test PCD assembly shall
be adapted to carry a PICC with the additional ability to center an ID-1 sized antenna of a PICC in the test
PCD assembly.
The test PCD in the test setup is intended to be active in duration-limited measurements in order to avoid any
overheating of the individual components (e.g. PICC). For all functional tests, the chip’s self-heating effect
should not exceed 25 °C over ambient temperature.
NOTE Some of the following tests are based on "Class 1" sized antenna as defined herein (see L.3.1 ""Class 1"
verification test (conditional)"). If the antenna does not comply with the "Class 1" specification, those tests might not
generate accurate results.
2 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.2 Equipment
Most of the tests need some additional equipment, such as an arbitrary waveform generator and an RF
amplifier. The oscilloscope probes shall have an input capacitance C < 12 pF.
L.2.3 Nominal values
Unless otherwise specified, the following environmental parameters and nominal values shall be used:
Table L.1 — Nominal values
Parameter Value To be applied to
Environment temperature RT Type A and Type B
a
Relative humidity Type A and Type B
25 % to 75 %
Bit rate fc/128 Type A and Type B
Modulation 100 % Type A
Modulation index m 12 % Type B
t 3 µs Type A
t 0,5 µs Type A
t ≤ 1,5 µs Type A
t 400 ns Type A
Overshoot 0 % Type A and Type B
Rise time t , fall time t
r f ≤ 1 µs Type B
Start Of Frame timing (SOF) 10,5 etu "0" followed by 2,5 etu "1" Type B
End Of Frame timing (EOF) 10,5 etu "0" Type B
Extra Guard Time (EGT) 1 etu Type B
a
Any convenient relative humidity within the specified range.

Nominal values define the parameters in accordance with ISO/IEC 14443-2:2001.
L.2.4 Test report
The test report shall include the number of successful evaluations versus the total number of evaluations for
each sample and for each test. A description of each test, the information whether the result was a pass or a
fail, and the date of the tests shall be included.
For all functionality check tests, the report shall state what tools and methods have been used to verify the
functionality of the PICC.
© ISO/IEC 2010 – All rights reserved 3

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.5 Implementation conformance statement
In order to set up the tests properly, an applicant shall provide the information specified in Table L.2 — Test
precondition table "Information on the product" below.
Table L.2 — Test precondition table "Information on the product"
Information for test setup Applicant declaration
Location of antenna in PICC
• which page
• which area in the page
Size of antenna
• dimensions
• compliance to "Class 1" definition of
ISO/IEC 14443-1:2008
Electrical parameters of antenna
• resonance frequency range (if optional test is performed)
Modulation type
• Type A or Type B
PICC shielded or not and how
Bit rates supported as claimed by the ATS/ATQB
• from PCD to PICC
o 106 kbit/s
o 212 kbit/s
o 424 kbit/s
o 848 kbit/s
• from PICC to PCD
o 106 kbit/s
o 212 kbit/s
o 424 kbit/s
o 848 kbit/s
• Receive/Transmit bit rates identical
Random or fixed UID (Type A) or random or fixed PUPI (Type B)
Access control applied
• Plaintext
• Basic Access Control
• Extended Access Control
Authentication supported
• Passive Authentication
• Active Authentication
Commands supporting WTX
4 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.6 Test sequence
In order to minimize efforts, it is recommended to perform the tests with all samples in the same order as
mentioned in this test specification. If the tests for each layer are carried out separately or are carried out with
different samples, additional tests will be necessary. For destructive tests such as mechanical and electrical
(layer 1) stress tests, it is often required to check if the PICC "operates as intended". ISO standards do not
define these tests further, and thus this specification leaves them to the responsibility of the test laboratories.
Section L.8 "Functionality check test (informative)" specifies optional tests to verify the PICC’s functionality on
the electrical and on the application level.
L.3 Layer 1 tests
L.3.1 "Class 1" verification test (conditional)
L.3.1.1 Purpose
The purpose of this test is to check if the physical coil dimensions meet the requirements according to
ISO/IEC 14443-1:2008.
This optional test shall be applied if the applicant claims compliance with "Class 1" in Table L.2 — Test
precondition table "Information on the product".
A minimum of three samples shall be used.
L.3.1.2 Test procedure
Determine whether the PICC antenna coil is contained in the Inlay Coil Area as described in ISO/IEC
14443-1:2008.
L.3.1.3 Test report
The test report shall state whether the coil geometry of the antenna is in accordance with "Class 1" definition.
L.3.2 Static electricity (ESD) test
L.3.2.1 Purpose
The purpose of this test is to check the behavior of the PICC after an electrostatic discharge (ESD) on the test
sample in accordance with this standard. The device under test is exposed to a simulated electrostatic
discharge (ESD, human body model). Its basic operation is checked after the exposure.
The test shall be performed according to the procedures defined in ISO/IEC 10373-6:2001/Amd.4:2006, 5.3
"Static Electricity Test".
L.3.2.2 Test procedure
Apply this test on a minimum of three samples.
In case the physical size of the PICC is different than "Figure 2 — Test zones on PICC for ESD test" of 5.3
"Static electricity test", the test procedure shall be applied at the centers of a two-dimensional 1 cm by 1 cm
mesh placed over the DUT.
© ISO/IEC 2010 – All rights reserved 5

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.3.2.3 Test report
In accordance with L.2.4 "Test report", the test report, passed/tested, shall combine L.8 "Functionality check
test (informative)" results of all tested samples.
L.3.3 Alternating magnetic field test
L.3.3.1 Purpose
The purpose of this test is to check the behavior of the PICC in relation to alternating magnetic field exposure
in accordance with this standard.
Alternating magnetic field test shall be carried out at 13,56 MHz. No tests are required at other frequencies.
L.3.3.2 Test procedure
The test PCD assembly according to this standard shall be used.
Perform the test according to the test procedure defined in 5.1.2 "Alternating magnetic field; 12,0 A/m test".
Apply the procedure of 5.1 "Alternating magnetic field test" on a minimum of three samples.
The test shall be conducted with a field alternating between 0,0 A/m (rms), 10,0 A/m (rms) and 12,0 A/m (rms)
as required in Clause 5.1.
L.3.3.3 Test report
In accordance with L.2.4 "Test report", the test report, passed/tested, shall combine clause L.8 "Functionality
check test (informative)" results of all tested samples.
L.4 Layer 2 tests
Combinations of the following layer 2 and 3 tests are possible, provided that the test coverage is not affected;
e.g. combining the frame delay time test with the operating field strength test or the operating field strength
test with testing the load modulation amplitude is possible.
L.4.1 Load modulation amplitude test
L.4.1.1 Purpose
The purpose of this test is to determine conformance of the load modulation amplitude of the PICC to
ISO/IEC 14443-2:2001 by performing the procedure set in 7.1 "PICC load modulation amplitude" of this
standard.
L.4.1.2 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with a REQA or a REQB command according to the used type. The nominal 13,56 MHz
carrier shall continue without modulation following the command for a recommended one second.
It is recommended to switch off the carrier for sufficient time before continuing at the next field level.
Perform the test according to Figure L.1 — Test procedure for the load modulation amplitude test below.
Perform 7.1 "PICC load modulation amplitude" test on a minimum of three samples at all three temperatures.
6 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
At temperatures −10 °C and RT:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
⎯ optional : 2,5 A/m (rms), 3,5 A/m (rms), 5,5 A/m (rms), 6,5 A/m (rms)
At temperature 50 °C:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
⎯ optional : 2,5 A/m (rms), 3,5 A/m (rms), 5,5 A/m (rms)
In case any of the mandatory tests fail to meet ISO/IEC 14443-2:2001, the tests with the optional field
strengths should be carried out.

Figure L.1 — Test procedure for the load modulation amplitude test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
© ISO/IEC 2010 – All rights reserved 7

ISO/IEC 10373-6:2001/Amd.7:2010(E)
NOTE 2 When any test fails, repeat the whole sequence for all temperatures with the optional field strengths if skipped.
L.4.1.3 Test report
The test report shall include the load modulation amplitudes, the number of passed tests versus the total
number of tests, a test description and the number of samples and the date.
L.4.2 Operating field strength test
The operating field strength test for Type A and/or Type B may be combined with the following L.4.3
"Communication stability test". Since the operating field strength may be used as an isolated functionality
check test, it is specified in a separate clause of this document.
L.4.2.1 Purpose
The purpose of this test is to check if the PICC meets the energy performance requirements according to
ISO/IEC 14443-2:2001. The PICC shall operate as intended within H and H , e.g. 1,5 A/m (rms) and
min max
7,5 A/m (rms).
L.4.2.2 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with the command sequences below. The nominal 13,56 MHz carrier shall continue
without modulation following the final response of each sequence for a recommended one second.
It is recommended to switch off the carrier for sufficient time before continuing at the next field level and / or bit
rate.
The following command sequence shall be executed at least five times for each combination of parameters
and each sample:
For Type A the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQA command (see ISO/IEC 14443-3:2001)
b) ANTICOLLISION command (see ISO/IEC 14443-3:2001)
c) SELECT command (see ISO/IEC 14443-3:2001)
d) RATS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
e) PPS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
f) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
For Type B the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQB command (see ISO/IEC 14443-3:2001)
b) ATTRIB command (see ISO/IEC 14443-3:2001)
c) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
See clause L.7 "List of test command sequences (informative)" for a list of possible test command sequences
depending on the operation mode, e.g. plain text, BAC, AA, EAC.
8 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Perform the test, according to Figure L.2 — Test procedure for the operating field strength test below, on a
minimum of three samples at all three temperatures for each combination of parameters from Table L.3 —
Specific environment parameters. For PICCs supporting both Type A and Type B repeat the procedure for
both types on each sample.
Repeat the test each at temperature and field strength for every supported bit rates of fc/128, fc/64, fc/32,
fc/16 and at least for both fc/128 and fc/32.
Table L.3 — Specific environment parameters for operating field strength test
Parameter Value
Field strength (Mandatory) 1,5 A/m (rms), 2,5 A/m (rms), 3,5 A/m (rms), 4,5 A/m (rms),
At temperatures −10 °C and RT 5,5 A/m (rms), 6,5 A/m (rms), 7,5 A/m (rms)
Field strength (Mandatory) 1,5 A/m (rms), 2,5 A/m (rms), 3,5 A/m (rms), 4,5 A/m (rms),
At temperatures 50 °C 5,5 A/m (rms), 6,0 A/m (rms)
a
Bit rate
fc/128, fc/64, fc/32, fc/16
Signal waveform For Type A:
See Table L.4 — Fix Parameter Table for a bit rate of fc/128
and Table L.5 — Fix Parameter Table for bit rates of fc/64,
fc/32, fc/16
For Type B:
See Table L.6 — Fix parameter table for bit rates of fc/128 and
fc/64 and Table L.7 — Fix parameter table for bit rates of fc/32
and fc/16
Temperature −10 °C, RT, 50 °C
a
As a minimum, all supported PICC bit rates with corresponding PCD bit rates shall be tested.

© ISO/IEC 2010 – All rights reserved 9

ISO/IEC 10373-6:2001/Amd.7:2010(E)

Figure L.2 — Test procedure for the operating field strength test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
10 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.2.3 Signal waveforms for Type A
Table L.4 — Fix Parameter Table for a bit rate of fc/128
Parameter Value
Modulation 100 %
Bit rate fc/128
t 3 µs
t 0,5 µs
t ≤ 1,5 µs
t 400 ns
Overshoot 0
Table L.5 — Fix Parameter Table for bit rates of fc/64, fc/32, fc/16
Parameter Values
Bit rate fc/64 fc/32 fc/16
a 0,15 0,30 0,55
t 20/fc 10/fc 5/fc
t 14/fc 6/fc 3/fc
t 6/fc 6/fc 6/fc
Overshoot 0 0 0
NOTE 1 For each bit rate, the corresponding table should be taken into account.
NOTE 2 For all bit rates, the sequence of test commands defined above should be executed at the different magnetic
field strengths and temperatures.
L.4.2.3.1 Signal waveforms for Type B
Table L.6 — Fix parameter table for bit rates of fc/128 and fc/64
Parameter Value
Modulation index m 12 %
t , t ≤ 1 µs
r f
h , h 0
r f
Table L.7 — Fix parameter table for bit rates of fc/32 and fc/16
Parameter Value
Modulation index m
12 %
t , t
r f ≤ 0,8 µs
h , h 0
r f
© ISO/IEC 2010 – All rights reserved 11

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.2.4 Test report
The test report shall include the number of passed tests versus the total number of tests, a test description
and the number of samples and the date.
L.4.3 Communication stability test
L.4.3.1 Purpose
The purpose of this test is to determine the communication stability of Type A and/or Type B versus field
strength and rise and fall times according to ISO/IEC 14443-2:2001, ISO/IEC 14443-2:2001/Amd.1:2005,
ISO/IEC 10373-6:2001/Amd.4:2006 and ISO/IEC 10373-6:2001/Amd.5:2007.
L.4.3.2 Test setup
For this procedure, the Test PCD assembly shall be used as a PCD antenna. The calibration of the field
strength shall be done in advance. Then, the PICC shall be placed at the DUT position. Afterwards, the field
strength shall be readjusted.
The matching network as defined in ISO/IEC 10373-6:2001/AM5:2007 clause A.2.2, shall be used for testing
together with the test PCD assembly.
The test PCD assembly (test apparatus) when used with a power amplifier necessary to establish the higher
field levels does not have the possibility to test more than a request command. The test apparatus shall be
augmented to provide a signal path for the responses to be routed to the controlling apparatus to enable
two-way communication. The method used shall be documented in the test report.
Modifications done according:
⎯ Reference ISO/IEC 10373-6:2001/Amd.2:2003
⎯ Reference ISO/IEC 10373-6:2001/Amd.4:2006 - PICC reception - Conditions for Type B
⎯ Reference ISO/IEC 10373-6:2001/Amd.5:2007
⎯ Reference ISO/IEC 14443-2:2001
⎯ Reference ISO/IEC 14443-2:2001/Amd.1:2005
L.4.3.3 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with the command sequences below. The nominal 13,56 MHz carrier shall continue
without modulation following the final response of each sequence for a recommended one second.
It is recommended to switch off the carrier for at least 5 ms before continuing at the next field level and / or bit
rate.
For Type A the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQA command (see ISO/IEC 14443-3:2001)
b) ANTICOLLISION command (see ISO/IEC 14443-3:2001)
c) SELECT command (see ISO/IEC 14443-3:2001)
12 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
d) RATS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
e) PPS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
f) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
For Type B the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQB command (see ISO/IEC 14443-3:2001)
b) ATTRIB command (see ISO/IEC 14443-3:2001)
c) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
See for clause L.7 for a list of possible test command sequences depending on the operation mode, e.g. plain
text, BAC, AA, EAC.
Perform the test, according to Figure L.3 — Test procedure for the communication stability test below on a
minimum of three samples at all three temperatures. For PICCs supporting both Type A and Type B repeat
the procedure for both types on each sample.
At temperatures −10 °C and RT:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
At temperature 50 °C:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
Repeat the test at each temperature and field strength for the bit rates of fc/128, fc/64, fc/32, fc/16. For each
bit rate apply the corresponding signal waveform as defined in the corresponding tables below. All PICC
supported bit rates should be tested at least for fc/128 and fc/32.
© ISO/IEC 2010 – All rights reserved 13

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Table L.8 — Specific environment parameters for communication stability test
Parameter Value
Field strength (Mandatory) 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
At temperatures −10 °C and RT
Field strength (Mandatory) 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
At temperatures 50 °C
a
Bit rate
fc/128, fc/64, fc/32, fc/16
Signal waveform For Type A see tables:
L.9 — Test conditions for a bit rate of fc/128 (Type A),
L.10 — Test conditions for a bit rate of fc/64 (Type A),
L.11 — Test conditions for a bit rate of fc/32 (Type A),
L.12 — Test conditions for a bit rate of fc/16 (Type A)
For Type B see tables:
L.13 — Test conditions for bit rates of fc/128 and fc/64 (Type B)
L.14 — Test conditions for bit rates of fc/32 and fc/16 (Type B)
Temperature −10 °C, RT, 50 °C
a
As a minimum, all supported PICC bit rates with corresponding PCD bit rates shall be tested.

Table L.9 — Test conditions for a bit rate of fc/128 (Type A)
H t t t t modulation
1 2 3 4
Condition
µs µs µs µs %
A/m (rms)
0,4 95
1 1,5 3 0,5 ≤1,5
2 1,5 3 0,5 0,8 0,4 100
0,4 95
3 4,5 3 0,5 ≤1,5
4 4,5 3 0,5 0,8 0,4 100
0,4 95
5 7,5 3 0,5 ≤1,5
6 7,5 3 0,5 0,8 0,4 100
14 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Table L.10 — Test conditions for a bit rate of fc/64 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
1 1,5 20/fc 14/fc 6/fc 0,2
2 1,5 20/fc 16/fc 7/fc ≤ 0,05
3 4,5 20/fc 14/fc 6/fc 0,2
4 4,5 20/fc 16/fc 7/fc ≤ 0,05
5 7,5 20/fc 14/fc 6/fc 0,2
6 7,5 20/fc 16/fc 7/fc ≤ 0,05
Table L.11 — Test conditions for a bit rate of fc/32 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
1 1,5 10/fc 6/fc 6/fc 0,35
2 1,5 10/fc 7/fc 7/fc ≤ 0,15
3 4,5 10/fc 6/fc 6/fc 0,35
4 4,5 10/fc 7/fc 7/fc ≤ 0,15
5 7,5 10/fc 6/fc 6/fc 0,35
6 7,5 10/fc 7/fc 7/fc ≤ 0,15
Table L.12 — Test conditions for a bit rate of fc/16 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
5/fc 3/fc 6/fc
1 1,5 0,6
2 1,5 5/fc 3/fc 7/fc ≤ 0,3
3 4,5 5/fc 3/fc 6/fc 0,6
4 4,5 5/fc 3/fc 7/fc ≤ 0,3
5 7,5 5/fc 3/fc 6/fc 0,6
6 7,5 5/fc 3/fc 7/fc ≤ 0,3
NOTE 1 For each bit rate, the corresponding table should be taken into account.
© ISO/IEC 2010 – All rights reserved 15

ISO/IEC 10373-6:2001/Amd.7:2010(E)
NOTE 2 For all bit rates the sequence of test commands defined above should be executed at the different magnetic
field strengths, temperatures and waveforms.
Table L.13 — Test conditions for bit rates of fc/128 and fc/64 (Type B)
H m t t
r, f
Condition
A/m (rms) % µs
1 1,5 8 1
2 1,5 14 1
3 4,5 8 1
4 4,5 14 1
5 7,5 8 1
6 7,5 14 1
Table L.14 — Test conditions for bit rates of fc/32 and fc/16 (Type B)
H m t t
r, f
Condition
A/m (rms) % µs
7 1,5 8 0,8
8 1,5 14 0,8
9 4,5 8 0,8
10 4,5 14 0,8
11 7,5 8 0,8
12 7,5 14 0,8
16 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Communication stability test
Place the sample into the DUT position
Calibrate the test PCD assembly
strength to
1,5 A/m (rms) as described in
ISO/IEC 10373-6:2001
Set PCD parameters and start the test
PICC responds
NO
as intended?
YES
Increase field strength by
Test passed Test failed
3,0 A/m (rms)
H<7,5 A/m(rms)
YES or H < 6,5 A/m (rms) at 50
°C
NO
Report tests passed
versus total no. tests
Figure L.3 — Test procedure for the communication stability test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
© ISO/IEC 2010 – All rights reserved 17

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.3.4 Test report
The test report shall include the number of passed tests versus the total number of tests, a test description
and the number of samples and the date.
L.4.4 Resonance frequency test (optional)
L.4.4.1 Purpose
The purpose of this test is to determine the resonance frequency of the PICC. The resonance frequency shall
be within the range that has been specified in the implementation conformance specification.
L.4.4.2 Test setup
An LCR meter may be used: a coil that is connected to the device’s output generates the magnetic field. The
setup shall be calibrated in advance. The PICC coil shall be positioned in a close distance concentrically
above the field-generating coil.
The resonance frequency is defined as the frequency where the real part of the field generating coil
impedance reaches its maximum under threshold conditions of the PICC.
L.4.4.3 Test procedure
Apply the procedure of 7.3 "PICC resonance frequency (informative)" on a minimum of three samples at RT.
L.4.4.4 Test report
The test report shall include all individual test reports of 7.3 "PICC resonance frequency (informative)" and
shall state whether the resonance frequencies measured are within the specified range of resonance
frequencies.
L.5 Layer 3 timing and framing tests
L.5.1 Test setup
The test setup defined below in this subclause shall be used for all tests in this section.
The setup as defined for the electrical tests can be used also for timing and framing tests. However, the test
laboratory can select an alternative setup for the timing and framing related tests, as long as the setup meets
the specified parameters of the test signal. Independently of the selected test setup, the setup is called "test
apparatus" in this subclause.
The test apparatus shall be able to emulate the protocol, to measure and monitor the timing of the logical
Input/Receive line relative to the carrier frequency, and to be able to analyze the I/O-bit stream in accordance
with the protocol.
All tests shall be performed at one specific field strength between 1,5 A/m (rms) and 7,5 A/m (rms) if not
further specified. All tests shall be performed at RT if not further specified.
18 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.5.2 Start-up time – Polling
L.5.2.1 Type A
L.5.2.1.1 Purpose
The purpose of this test is to check the correct behavior after switching the RF field on and during alternatly
reception of REQB and REQA (polling).
L.5.2.1.2 Test procedure
Perform test as defined in Annex G.3.2 "Scenario 1: Polling", on at least three samples, at a bit rate of fc/128
and change the time parameters in steps 4, 8 and 9 to 10ms.
The PICC shall respond to a REQA 10 ms after switching on the RF field and it shall respond to a REQA 10
ms after a REQB.
L.5.2.1.3 Test report
The test report shall state whether the PICC meets the start-up timing requirements for all samples.
L.5.2.2 Type B
L.5.2.2.1 Purpose
The purpose of this test is to check the correct behavior after switching the RF field on and during alternate
receiving of REQB and REQA (polling).
L.5.2.2.2 Test procedure
Perform test as defined in Annex G.4.2 "Scenario 21: Polling", on at least three samples, at a bit rate of fc/128,
but change the time parameter in steps 4, 8 and 9 to 10 ms.
The PICC shall respond to a REQB 10 ms after switching on the RF field and it shall respond to a REQB 10
ms after a REQA.
L.5.2.2.3 Test report
The test report shall state whether the PICC meets the start-up timing requirements for all samples.
L.5.3 Frame delay time (Type A only)
L.5.3.1 Purpose
The purpose of this test is to determine the frame delay time (FDT) of the PICC and to check that the Frame
Delay Time of the PICC conforms to the value indicated in the FDT column of Table L.15 —FDT values.
L.5.3.2 Test setup
Modifications done according:
⎯ Reference ISO/IEC 14443-3:2001 Frame delay time PCD to PICC
⎯ Reference ISO/IEC 14443-3:2001/Amd.1:2005
© ISO/IEC 2010 – All rights reserved 19

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.5.3.3 Test procedure
Perform test as defined in scenario 2 of Annex G.3.4 "Testing of the PICC type A state transitions" on a
minimum of three samples at a bit rate of fc/128. Check the FDT of the PICC response frame.
Depending on the last bit of the command the FDT shall be as follows:
Table L.15 —FDT values
Last Bit FDT
1172/fc
1 1236/fc
L.5.3.4 Test report
The test report shall state whether the PICC meets the start-up timing requirements for all samples.
L.5.4 Start-Of-Frame and End-Of-Frame timing (Type B only)
L.5.4.1 Purpose
The purpose of this test is to check whether the PICC meets the SOF and EOF timing requirements according
to Annex G.
L.5.4.2 Test procedure
⎯ Perform test for each condition as defined in Tables L.16 and L.17 on three samples at a bit rate of fc/128.
Table L.16 — SOF test conditions
SOF "0" SOF "1"
Condition
etu etu
1 10 2
2 11 3
Table L.17 — EOF test conditions
EOF
Condition
etu
1 10
2 11
Check the values SOF and EOF of the PICC response frame.
The values of SOF and EOF shall conform to the following:
20 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
⎯ SOF logic 0 timing shall be between 10 and 11 etu.
⎯ SOF logic 1 timing shall be between 2 and 3 etu.
⎯ EOF logic 0 timing shall be between 10 and 11 etu.
L.5.4.3 Test report
The test report shall state whether the PICC meets the SOF and EOF timing requirements for all samples.
L.5.5 Extra guard time (Type B only)
L.5.5.1 Purpose
The purpose of this test is to check whether the PICC meets the EGT timing requirements according to
ISO/IEC 14443-3:2001.
L.5.5.2 Test procedure
Perform test for each condition as defined in Table L.18 on three samples at a bit rate of fc/128.
Table L.18 — EGT test conditions
EGT
Condition
etu
1 1
2 3,4
3 6
Check, that the values of the EGT of the PICC response frame are equal or greater than 0 etu and less or
equal than 2 etu.
L.5.5.3 Test reports
The test report shall state whether the PICC meets the requirements concerning EGT timing for all samples.
L.5.6 Timing before PICC SOF (TR0 and TR1) (Type B only)
L.5.6.1 Purpose
The purpose of this test is to check whether the PICC meets the TR0 and TR1 requirements according to
ISO/IEC 14443-3:2001.
L.5.6.2 Test procedure
Perform test as defined in Annex G.4.3 "Scenario 22: PICC Reception" on three samples at a bit rate of fc/128.
Check the values of TR0 and TR1 before PICC SOF.
TR0 and TR1 shall be between the minimum and maximum values defined in Table L.19 — TR0 and TR1
boundaries.
© ISO/IEC 2010 – All rights reserved 21

ISO/IEC 10373-6:2001/Amd.7:2010(E)
Table L.19 — TR0 and TR1 boundaries
Min Max
TR0 64/fs 256/fs
TR1 80/fs 200/fs
L.5.6.3 Test reports
The test report shall state whether the PICC meets the requirements concerning TR0 and TR1 timing for all
samples.
L.5.7 Timing after PICC EOF (subcarrier turn-off time) (Type B only)
L.5.7.1 Purpose
The purpose of this test is to check whether the PICC meets the subcarrier turn-off time after PICC EOF.
L.5.7.2 Test procedure
Perform test as defined in Annex G.4.3 "Scenario 22: PICC Reception" on three samples at a bit rate of fc/128.
Check the subcarrier turn-off time.
The PICC shall turn off the subcarrier between 0 and 2 etu after PICC EOF.
L.5.7.3 Test reports
The test report shall state whether the PICC meets the requirements concerning subcarrier turn-off time after
PICC EOF timing for all samples.
L.5.8 Timing after PICC EOF (TR2) (Type B only)
L.5.8.1 Purpose
The purpose of this test is to check whether the PICC meets the minimum TR2 timing requirement as defined
in the protocol byte of the PICC’s ATQB, see ISO/IEC 14443-3:2001 [6], its amendment 1 [9] and the
corresponding defect report [11].
L.5.8.2 Test procedure
Perform the test as follows on three samples at a bit rate of fc/128:
a) Place the PICC into the field.
b) Set the frame parameters of the test apparatus according to Table G.31 — Type B specific timing table
and Table L.1 — Nominal values.
c) Send REQB(0).
d) After the ATQB do a delay of minimum TR2 as defined in [11].
e) Send ATTRIB(0,0) command.
f) Record the presence, contents and timings of the PICC responses.
The PICC’s response to the ATTRIB command shall be a valid Answer to ATTRIB.
22 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.5.8.3 Test reports
The test report shall state whether the PICC meets the minimum TR2 timing requirement for all samples.
L.6 Layer 3 and 4 protocol tests
These tests provide a basic set of tests to be performed to check the compliance to ISO/IEC 14443 protocol
layers 3 and 4 ([6] ISO/IEC 14443-3:2001, ISO/IEC 14443-3:2001/Amd.1:2005 and ISO/IEC 14443-4:2008).
All tests are based on and shall be evaluated according to the referenced versions of standards.
L.6.1 Test setup
The setup as defined for the electrical tests can be used also for protocol tests. However, the test laboratory
can select an alternative setup for the protocol related tests, as long as the setup meets the specified
parameters of the test signal. Independent of the selected test setup, the setup is called "test apparatus" in
this subclause.
The test apparatus shall be able to emulate the protocol, to measure and monitor the timing of the logical
Input/Receive line relative to the carrier frequency, and to be able to analyze the I/O-bit stream in accordance
with the protocol.
All tests shall be performed with one specific field strength between 1,5 A/m (rms) and 7,5 A/m (rms) if not
further specified. All tests shall be performed at RT if not further specified.
For the test, commands that are typical for an application should be used. Therefore, refer to clause L.7 "List
of test command sequences (informative)" for a list of TEST COMMANDS that should be used for testing the
PICC.
RFU fields should be constantly monitored during the testing and should always be verified to contain the
assigned default value in accordance with Annex G.1.5 "RFU fields".
The tests in this clause should be performed on one sample.
L.6.2 Type A activation
These tests shall ensure that the start-up and the activation of a Type A PICC are in accordance with
ISO/IEC 14443-3:2001. These tests are split up to state transitions and the handling of RATS and PPS.
L.6.2.1 State transitions
L.6.2.1.1 Purpose
The purpose of this test is to check the correct behavior during state transitions as defined in
ISO/IEC 14443-3:2001. Additionally possible proprietary paths of the "Select sequence flow chart" specified in
ISO/IEC 14443-3:2001 shall not negatively affect the test.
L.6.2.1.2 Test procedure
Perform test as defined in Annex G.3.4 "Testing of the PICC type A state transitions". The tests specified in
the subclause "Testing of the PICC Type A state transitions" of ISO/IEC 10373-6:2001/Amd.1:2007 shall be
used. The detailed test procedure is not specified further herein.
L.6.2.1.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.6.2.2 Handling of Type A anticollision
L.6.2.2.1 Purpose
The purpose of this test is to check the correct behavior during anticollision as defined in
ISO/IEC 10373-6:2001/Amd.1:2007.
L.6.2.2.2 Test procedure
Perform test as defined in Annex G.3.5 "Handling of type A anticollision". The tests specified in the subclause
"Handling of type A anticollision" of ISO/IEC 10373-6:2001/Amd.1:2007 shall be used. The detailed test
procedure is not specified further herein.
L.6.2.2.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
L.6.2.3 Handling of RATS
L.6.2.3.1 Purpose
The purpose of this test is to check the correct behavior of RATS as defined in ISO/IEC 14443-4:2008.
L.6.2.3.2 Test procedure
Perform test as defined in ISO/IEC 10373-6:2001/Amd.1:2007, Annex G.3.6 "Handling of RATS". The tests
specified in the subclause "Handling of RATS" shall be used. The detailed test procedure is not specified
further herein.
In addition, it shall be verified if the bit rates as defined in the interface byte TA(1) of the ATS are equal to the
bit rates claimed in the implementation conformance statement.
L.6.2.3.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures. It shall state if the ATS
correctly encodes the bit rates.
L.6.2.4 Handling of PPS
L.6.2.4.1 Purpose
The purpose of this test is to check the correct behavior of RATS as defined in ISO/IEC 14443-4:2008.
L.6.2.4.2 Test procedure
Perform test as defined in Annex G.3.7 "Handling of PPS request". The tests specified in the subclause
"Handling of PPS request" shall be used. The detailed test procedure is not specified further herein.
Test Scenario 17: PPS without PPS1 as defined in ISO/IEC 10373-6:2001/Amd.1:2007 shall not be performed.
L.6.2.4.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
24 © ISO/IEC 2010 – All rights reserved

ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.6.2.5 Handling of FSD
L.6.2.5.1 Purpose
The purpose of this test is to check if the PICC correctly handles FSD negotiated by the RATS as defined in
ISO/IEC 14443-4:2008.
L.6.2.5.2 Test procedure
Perform test as defined in Annex G.3.8 "Handling of FSD". The tests specified in the subclause "Handling of
FSD" shall be used. The detailed test procedure is not specified further herein.
L.6.2.5.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
L.6.3 Type B activation
These tests shall ensure that the start-up and the activation of a Type B PICC are in accordance with
ISO/IEC 14443-3:2001.
L.6.3.1 State transitions
L.6.3.1.1 Purpose
The purpose of this test is to verify the correct implementation of a Type B PICC’s state machine.
L.6.3.1.2 Test procedure
Perform test as defined in Annex G.4.4 "Testing of the PICC Type B State Transition".
L.6.3.1.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
L.6.3.2 Handling of Type B anticollision
L.6.3.2.1 Purpose
The purpose of this test is to verify the handling of a PICC Type B anticollision.
L.6.3.2.2 Test procedure
Perform test as defined in Annex G.4.5 "Handling of Type B Anticollision".
L.6.3.2.3 Test report
The test report shall state whether the PICC responds as indicated in the procedures.
L.6.3.3 Handling of ATTRIB
L.6.3.3.1 Purpose
The purpose of this test is to verify the behavio
...