ISO/IEC 10373-6:2001/Amd 7:2010

Identification cards — Test methods — Part 6: Proximity cards — Amendment 7: Test methods for ePassport

Cartes d'identification — Méthodes d'essai — Partie 6: Cartes de proximité — Amendement 7: Méthodes d'essai pour passeport électronique

General Information

• Status: Withdrawn
• Publication Date: 09-Mar-2010
• Withdrawal Date: 09-Mar-2010
• ICS: 35.240.15 - Identification cards. Chip cards. Biometrics
• Technical Committee: ISO/IEC JTC 1/SC 17 - Cards and security devices for personal identification
• Drafting Committee: ISO/IEC JTC 1/SC 17/WG 8 - Integrated circuit cards without contacts
• Current Stage: 9599 - Withdrawal of International Standard
• Completion Date: 07-Jan-2011

Relations

• Amends: ISO/IEC 10373-6:2001 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 06-Jun-2022
• Child: ISO/IEC 10373-6:2001 - Identification cards — Test methods — Part 6: Proximity cards
• Effective Date: 20-Jun-2008

Standards Content (Sample)

INTERNATIONAL ISO/IEC
STANDARD 10373-6
First edition
2001-05-15
AMENDMENT 7
2010-03-15

Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 7: Test methods for
ePassport
Cartes d'identification — Méthodes d'essai —
Partie 6: Cartes de proximité
AMENDEMENT 7: Méthodes d'essai pour passeport électronique




Reference number
ISO/IEC 10373-6:2001/Amd.7:2010(E)
©
ISO/IEC 2010

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ISO/IEC 10373-6:2001/Amd.7:2010(E)
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Foreword
ISO (the International Organization for Standardization) and IEC (the International Electrotechnical
Commission) form the specialized system for worldwide standardization. National bodies that are members of
ISO or IEC participate in the development of International Standards through technical committees
established by the respective organization to deal with particular fields of technical activity. ISO and IEC
technical committees collaborate in fields of mutual interest. Other international organizations, governmental
and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information
technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of the joint technical committee is to prepare International Standards. Draft International
Standards adopted by the joint technical committee are circulated to national bodies for voting. Publication as
an International Standard requires approval by at least 75 % of the national bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 7 to ISO/IEC 10373-6:2001 was prepared by Joint Technical Committee ISO/IEC JTC 1,
Information technology, Subcommittee SC 17, Cards and personal identification.

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ISO/IEC 10373-6:2001/Amd.7:2010(E)

Identification cards — Test methods —
Part 6:
Proximity cards
AMENDMENT 7: Test methods for ePassport
Page 2, 3.1
Add the following definitions and reorder alphabetically:
3.1.12
sample
one piece of the total number of PICCs required and presented for testing
3.1.13
room temperature
RT
convenient temperature within the range of 23 °C ± 3 °C (73 °F ± 5 °F)
3.1.14
threshold field strength
minimum field strength to operate the PICC as intended (operational mode)
3.1.15
AA
active authentication as defined in ISO/IEC 7501-1
Page 3, 3.2
Add the following abbreviations and symbols in alphabetical order:

BAC Basic Access Control
EAC Extended Access Control
LDS Logical Data Structure

After Annex K
Add the following new annexes:

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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Annex L
(informative)

ePassport PICC test methods
L.1 Scope
This annex defines a test plan for the PICC contactless part of the ePassport oriented PICC. These tests are
divided into tests of the physical and electrical parameters according to ISO/IEC 14443-1:2000 and
ISO/IEC 14443-2:2001, and tests of the initialization & anticollision and the transport protocol according to
ISO/IEC 14443-3:2001 and ISO/IEC 14443-4:2008.
In order for the PICCs to operate correctly, many functional layers of technology should work together. The
purpose of this annex is to define in depth the tests to be performed to minimize the probability that an error or
fault remain undetected before the design is approved.
For ePassport compliance testing, this annex is normative.
L.2 General test requirements
The following subclauses specify the different test setups, the nominal values used for the tests, and a
recommendation for the format of the test report.
Tests for bit rates of fc/128 and fc/32 are mandatory and shall be applied. Other bit rates, when indicated in
the ATS/ATQB shall also be tested.
Depending on the implementation statement of the applicant, Type A or Type B tests shall be performed.
All tests are mandatory unless specified as "optional" or "conditional". Conditional tests shall be performed if
they are applicable.
For tests of layers 1 and 2, the minimum number of samples provided for testing is three, unless explicitly
defined otherwise. The applicant may request that a larger number of samples are tested. The samples
provided by the applicant should be personalized.
L.2.1 Test setup
The test PCD assembly (test apparatus) that is defined in this standard is the basis for the physical and
electrical tests. When testing at higher bit rates, the matching network in ISO/IEC 10373-6:2001/Amd.5:2007,
A.2.2 "Impedance matching network for bit rates of fc/64, fc/32 and fc/16", is used together with the test PCD
assembly.
For layer 2 tests (communication stability and operating field strength), the existing test PCD assembly shall
be adapted to carry a PICC with the additional ability to center an ID-1 sized antenna of a PICC in the test
PCD assembly.
The test PCD in the test setup is intended to be active in duration-limited measurements in order to avoid any
overheating of the individual components (e.g. PICC). For all functional tests, the chip’s self-heating effect
should not exceed 25 °C over ambient temperature.
NOTE Some of the following tests are based on "Class 1" sized antenna as defined herein (see L.3.1 ""Class 1"
verification test (conditional)"). If the antenna does not comply with the "Class 1" specification, those tests might not
generate accurate results.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.2 Equipment
Most of the tests need some additional equipment, such as an arbitrary waveform generator and an RF
amplifier. The oscilloscope probes shall have an input capacitance C < 12 pF.
L.2.3 Nominal values
Unless otherwise specified, the following environmental parameters and nominal values shall be used:
Table L.1 — Nominal values
Parameter Value To be applied to
Environment temperature RT Type A and Type B
a
Relative humidity Type A and Type B
25 % to 75 %
Bit rate fc/128 Type A and Type B
Modulation 100 % Type A
Modulation index m 12 % Type B
t 3 µs Type A
1
t 0,5 µs Type A
2
t ≤ 1,5 µs Type A
3
t 400 ns Type A
4
Overshoot 0 % Type A and Type B
Rise time t , fall time t
r f ≤ 1 µs Type B
Start Of Frame timing (SOF) 10,5 etu "0" followed by 2,5 etu "1" Type B
End Of Frame timing (EOF) 10,5 etu "0" Type B
Extra Guard Time (EGT) 1 etu Type B
a
Any convenient relative humidity within the specified range.

Nominal values define the parameters in accordance with ISO/IEC 14443-2:2001.
L.2.4 Test report
The test report shall include the number of successful evaluations versus the total number of evaluations for
each sample and for each test. A description of each test, the information whether the result was a pass or a
fail, and the date of the tests shall be included.
For all functionality check tests, the report shall state what tools and methods have been used to verify the
functionality of the PICC.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.5 Implementation conformance statement
In order to set up the tests properly, an applicant shall provide the information specified in Table L.2 — Test
precondition table "Information on the product" below.
Table L.2 — Test precondition table "Information on the product"
Information for test setup Applicant declaration
Location of antenna in PICC
• which page
• which area in the page
Size of antenna
• dimensions
• compliance to "Class 1" definition of
ISO/IEC 14443-1:2008
Electrical parameters of antenna
• resonance frequency range (if optional test is performed)
Modulation type
• Type A or Type B
PICC shielded or not and how
Bit rates supported as claimed by the ATS/ATQB
• from PCD to PICC
o 106 kbit/s
o 212 kbit/s
o 424 kbit/s
o 848 kbit/s
• from PICC to PCD
o 106 kbit/s
o 212 kbit/s
o 424 kbit/s
o 848 kbit/s
• Receive/Transmit bit rates identical
Random or fixed UID (Type A) or random or fixed PUPI (Type B)
Access control applied
• Plaintext
• Basic Access Control
• Extended Access Control
Authentication supported
• Passive Authentication
• Active Authentication
Commands supporting WTX

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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.2.6 Test sequence
In order to minimize efforts, it is recommended to perform the tests with all samples in the same order as
mentioned in this test specification. If the tests for each layer are carried out separately or are carried out with
different samples, additional tests will be necessary. For destructive tests such as mechanical and electrical
(layer 1) stress tests, it is often required to check if the PICC "operates as intended". ISO standards do not
define these tests further, and thus this specification leaves them to the responsibility of the test laboratories.
Section L.8 "Functionality check test (informative)" specifies optional tests to verify the PICC’s functionality on
the electrical and on the application level.
L.3 Layer 1 tests
L.3.1 "Class 1" verification test (conditional)
L.3.1.1 Purpose
The purpose of this test is to check if the physical coil dimensions meet the requirements according to
ISO/IEC 14443-1:2008.
This optional test shall be applied if the applicant claims compliance with "Class 1" in Table L.2 — Test
precondition table "Information on the product".
A minimum of three samples shall be used.
L.3.1.2 Test procedure
Determine whether the PICC antenna coil is contained in the Inlay Coil Area as described in ISO/IEC
14443-1:2008.
L.3.1.3 Test report
The test report shall state whether the coil geometry of the antenna is in accordance with "Class 1" definition.
L.3.2 Static electricity (ESD) test
L.3.2.1 Purpose
The purpose of this test is to check the behavior of the PICC after an electrostatic discharge (ESD) on the test
sample in accordance with this standard. The device under test is exposed to a simulated electrostatic
discharge (ESD, human body model). Its basic operation is checked after the exposure.
The test shall be performed according to the procedures defined in ISO/IEC 10373-6:2001/Amd.4:2006, 5.3
"Static Electricity Test".
L.3.2.2 Test procedure
Apply this test on a minimum of three samples.
In case the physical size of the PICC is different than "Figure 2 — Test zones on PICC for ESD test" of 5.3
"Static electricity test", the test procedure shall be applied at the centers of a two-dimensional 1 cm by 1 cm
mesh placed over the DUT.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.3.2.3 Test report
In accordance with L.2.4 "Test report", the test report, passed/tested, shall combine L.8 "Functionality check
test (informative)" results of all tested samples.
L.3.3 Alternating magnetic field test
L.3.3.1 Purpose
The purpose of this test is to check the behavior of the PICC in relation to alternating magnetic field exposure
in accordance with this standard.
Alternating magnetic field test shall be carried out at 13,56 MHz. No tests are required at other frequencies.
L.3.3.2 Test procedure
The test PCD assembly according to this standard shall be used.
Perform the test according to the test procedure defined in 5.1.2 "Alternating magnetic field; 12,0 A/m test".
Apply the procedure of 5.1 "Alternating magnetic field test" on a minimum of three samples.
The test shall be conducted with a field alternating between 0,0 A/m (rms), 10,0 A/m (rms) and 12,0 A/m (rms)
as required in Clause 5.1.
L.3.3.3 Test report
In accordance with L.2.4 "Test report", the test report, passed/tested, shall combine clause L.8 "Functionality
check test (informative)" results of all tested samples.
L.4 Layer 2 tests
Combinations of the following layer 2 and 3 tests are possible, provided that the test coverage is not affected;
e.g. combining the frame delay time test with the operating field strength test or the operating field strength
test with testing the load modulation amplitude is possible.
L.4.1 Load modulation amplitude test
L.4.1.1 Purpose
The purpose of this test is to determine conformance of the load modulation amplitude of the PICC to
ISO/IEC 14443-2:2001 by performing the procedure set in 7.1 "PICC load modulation amplitude" of this
standard.
L.4.1.2 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with a REQA or a REQB command according to the used type. The nominal 13,56 MHz
carrier shall continue without modulation following the command for a recommended one second.
It is recommended to switch off the carrier for sufficient time before continuing at the next field level.
Perform the test according to Figure L.1 — Test procedure for the load modulation amplitude test below.
Perform 7.1 "PICC load modulation amplitude" test on a minimum of three samples at all three temperatures.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
At temperatures −10 °C and RT:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
⎯ optional : 2,5 A/m (rms), 3,5 A/m (rms), 5,5 A/m (rms), 6,5 A/m (rms)
At temperature 50 °C:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
⎯ optional : 2,5 A/m (rms), 3,5 A/m (rms), 5,5 A/m (rms)
In case any of the mandatory tests fail to meet ISO/IEC 14443-2:2001, the tests with the optional field
strengths should be carried out.

Figure L.1 — Test procedure for the load modulation amplitude test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
NOTE 2 When any test fails, repeat the whole sequence for all temperatures with the optional field strengths if skipped.
L.4.1.3 Test report
The test report shall include the load modulation amplitudes, the number of passed tests versus the total
number of tests, a test description and the number of samples and the date.
L.4.2 Operating field strength test
The operating field strength test for Type A and/or Type B may be combined with the following L.4.3
"Communication stability test". Since the operating field strength may be used as an isolated functionality
check test, it is specified in a separate clause of this document.
L.4.2.1 Purpose
The purpose of this test is to check if the PICC meets the energy performance requirements according to
ISO/IEC 14443-2:2001. The PICC shall operate as intended within H and H , e.g. 1,5 A/m (rms) and
min max
7,5 A/m (rms).
L.4.2.2 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with the command sequences below. The nominal 13,56 MHz carrier shall continue
without modulation following the final response of each sequence for a recommended one second.
It is recommended to switch off the carrier for sufficient time before continuing at the next field level and / or bit
rate.
The following command sequence shall be executed at least five times for each combination of parameters
and each sample:
For Type A the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQA command (see ISO/IEC 14443-3:2001)
b) ANTICOLLISION command (see ISO/IEC 14443-3:2001)
c) SELECT command (see ISO/IEC 14443-3:2001)
d) RATS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
e) PPS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
f) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
For Type B the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQB command (see ISO/IEC 14443-3:2001)
b) ATTRIB command (see ISO/IEC 14443-3:2001)
c) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
See clause L.7 "List of test command sequences (informative)" for a list of possible test command sequences
depending on the operation mode, e.g. plain text, BAC, AA, EAC.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Perform the test, according to Figure L.2 — Test procedure for the operating field strength test below, on a
minimum of three samples at all three temperatures for each combination of parameters from Table L.3 —
Specific environment parameters. For PICCs supporting both Type A and Type B repeat the procedure for
both types on each sample.
Repeat the test each at temperature and field strength for every supported bit rates of fc/128, fc/64, fc/32,
fc/16 and at least for both fc/128 and fc/32.
Table L.3 — Specific environment parameters for operating field strength test
Parameter Value
Field strength (Mandatory) 1,5 A/m (rms), 2,5 A/m (rms), 3,5 A/m (rms), 4,5 A/m (rms),
At temperatures −10 °C and RT 5,5 A/m (rms), 6,5 A/m (rms), 7,5 A/m (rms)
Field strength (Mandatory) 1,5 A/m (rms), 2,5 A/m (rms), 3,5 A/m (rms), 4,5 A/m (rms),
At temperatures 50 °C 5,5 A/m (rms), 6,0 A/m (rms)
a
Bit rate
fc/128, fc/64, fc/32, fc/16
Signal waveform For Type A:
See Table L.4 — Fix Parameter Table for a bit rate of fc/128
and Table L.5 — Fix Parameter Table for bit rates of fc/64,
fc/32, fc/16
For Type B:
See Table L.6 — Fix parameter table for bit rates of fc/128 and
fc/64 and Table L.7 — Fix parameter table for bit rates of fc/32
and fc/16
Temperature −10 °C, RT, 50 °C

a
As a minimum, all supported PICC bit rates with corresponding PCD bit rates shall be tested.


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ISO/IEC 10373-6:2001/Amd.7:2010(E)

Figure L.2 — Test procedure for the operating field strength test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.2.3 Signal waveforms for Type A
Table L.4 — Fix Parameter Table for a bit rate of fc/128
Parameter Value
Modulation 100 %
Bit rate fc/128
t 3 µs
1
t 0,5 µs
2
t ≤ 1,5 µs
3
t 400 ns
4
Overshoot 0

Table L.5 — Fix Parameter Table for bit rates of fc/64, fc/32, fc/16
Parameter Values
Bit rate fc/64 fc/32 fc/16
a 0,15 0,30 0,55
t 20/fc 10/fc 5/fc
1
t 14/fc 6/fc 3/fc
2
t 6/fc 6/fc 6/fc
3
Overshoot 0 0 0

NOTE 1 For each bit rate, the corresponding table should be taken into account.
NOTE 2 For all bit rates, the sequence of test commands defined above should be executed at the different magnetic
field strengths and temperatures.
L.4.2.3.1 Signal waveforms for Type B
Table L.6 — Fix parameter table for bit rates of fc/128 and fc/64
Parameter Value
Modulation index m 12 %
t , t ≤ 1 µs
r f
h , h 0
r f
Table L.7 — Fix parameter table for bit rates of fc/32 and fc/16
Parameter Value
Modulation index m
12 %
t , t
r f ≤ 0,8 µs
h , h 0
r f

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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.2.4 Test report
The test report shall include the number of passed tests versus the total number of tests, a test description
and the number of samples and the date.
L.4.3 Communication stability test
L.4.3.1 Purpose
The purpose of this test is to determine the communication stability of Type A and/or Type B versus field
strength and rise and fall times according to ISO/IEC 14443-2:2001, ISO/IEC 14443-2:2001/Amd.1:2005,
ISO/IEC 10373-6:2001/Amd.4:2006 and ISO/IEC 10373-6:2001/Amd.5:2007.
L.4.3.2 Test setup
For this procedure, the Test PCD assembly shall be used as a PCD antenna. The calibration of the field
strength shall be done in advance. Then, the PICC shall be placed at the DUT position. Afterwards, the field
strength shall be readjusted.
The matching network as defined in ISO/IEC 10373-6:2001/AM5:2007 clause A.2.2, shall be used for testing
together with the test PCD assembly.
The test PCD assembly (test apparatus) when used with a power amplifier necessary to establish the higher
field levels does not have the possibility to test more than a request command. The test apparatus shall be
augmented to provide a signal path for the responses to be routed to the controlling apparatus to enable
two-way communication. The method used shall be documented in the test report.
Modifications done according:
⎯ Reference ISO/IEC 10373-6:2001/Amd.2:2003
⎯ Reference ISO/IEC 10373-6:2001/Amd.4:2006 - PICC reception - Conditions for Type B
⎯ Reference ISO/IEC 10373-6:2001/Amd.5:2007
⎯ Reference ISO/IEC 14443-2:2001
⎯ Reference ISO/IEC 14443-2:2001/Amd.1:2005
L.4.3.3 Test procedure
For this test, it is recommended to have signal patterns that start with the RF off, and then produce an
unmodulated field with nominal 13,56 MHz carrier at the field level required by the test for 5 ms prior to
modulating this field with the command sequences below. The nominal 13,56 MHz carrier shall continue
without modulation following the final response of each sequence for a recommended one second.
It is recommended to switch off the carrier for at least 5 ms before continuing at the next field level and / or bit
rate.
For Type A the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQA command (see ISO/IEC 14443-3:2001)
b) ANTICOLLISION command (see ISO/IEC 14443-3:2001)
c) SELECT command (see ISO/IEC 14443-3:2001)
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
d) RATS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
e) PPS command (see ISO/IEC 14443-4:2001/Amd.1:2006)
f) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
For Type B the following command sequence shall be executed at least five times for each combination of
parameters and each sample:
a) REQB command (see ISO/IEC 14443-3:2001)
b) ATTRIB command (see ISO/IEC 14443-3:2001)
c) TEST_COMMAND_SEQUENCE1 (see clause L.7 "List of test command sequences (informative)")
See for clause L.7 for a list of possible test command sequences depending on the operation mode, e.g. plain
text, BAC, AA, EAC.
Perform the test, according to Figure L.3 — Test procedure for the communication stability test below on a
minimum of three samples at all three temperatures. For PICCs supporting both Type A and Type B repeat
the procedure for both types on each sample.
At temperatures −10 °C and RT:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
At temperature 50 °C:
⎯ mandatory: 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
Repeat the test at each temperature and field strength for the bit rates of fc/128, fc/64, fc/32, fc/16. For each
bit rate apply the corresponding signal waveform as defined in the corresponding tables below. All PICC
supported bit rates should be tested at least for fc/128 and fc/32.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Table L.8 — Specific environment parameters for communication stability test
Parameter Value
Field strength (Mandatory) 1,5 A/m (rms), 4,5 A/m (rms), 7,5 A/m (rms)
At temperatures −10 °C and RT
Field strength (Mandatory) 1,5 A/m (rms), 4,5 A/m (rms), 6,0 A/m (rms)
At temperatures 50 °C
a
Bit rate
fc/128, fc/64, fc/32, fc/16
Signal waveform For Type A see tables:
L.9 — Test conditions for a bit rate of fc/128 (Type A),
L.10 — Test conditions for a bit rate of fc/64 (Type A),
L.11 — Test conditions for a bit rate of fc/32 (Type A),
L.12 — Test conditions for a bit rate of fc/16 (Type A)
For Type B see tables:
L.13 — Test conditions for bit rates of fc/128 and fc/64 (Type B)
L.14 — Test conditions for bit rates of fc/32 and fc/16 (Type B)
Temperature −10 °C, RT, 50 °C

a
As a minimum, all supported PICC bit rates with corresponding PCD bit rates shall be tested.

Table L.9 — Test conditions for a bit rate of fc/128 (Type A)
H t t t t modulation
1 2 3 4
Condition
µs µs µs µs %
A/m (rms)
0,4 95
1 1,5 3 0,5 ≤1,5
2 1,5 3 0,5 0,8 0,4 100
0,4 95
3 4,5 3 0,5 ≤1,5
4 4,5 3 0,5 0,8 0,4 100
0,4 95
5 7,5 3 0,5 ≤1,5
6 7,5 3 0,5 0,8 0,4 100

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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Table L.10 — Test conditions for a bit rate of fc/64 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
1 1,5 20/fc 14/fc 6/fc 0,2
2 1,5 20/fc 16/fc 7/fc ≤ 0,05
3 4,5 20/fc 14/fc 6/fc 0,2
4 4,5 20/fc 16/fc 7/fc ≤ 0,05
5 7,5 20/fc 14/fc 6/fc 0,2
6 7,5 20/fc 16/fc 7/fc ≤ 0,05

Table L.11 — Test conditions for a bit rate of fc/32 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
1 1,5 10/fc 6/fc 6/fc 0,35
2 1,5 10/fc 7/fc 7/fc ≤ 0,15
3 4,5 10/fc 6/fc 6/fc 0,35
4 4,5 10/fc 7/fc 7/fc ≤ 0,15
5 7,5 10/fc 6/fc 6/fc 0,35
6 7,5 10/fc 7/fc 7/fc ≤ 0,15
Table L.12 — Test conditions for a bit rate of fc/16 (Type A)
H t t t
1 2 3
Condition a
A/m (rms) µs µs µs
5/fc 3/fc 6/fc
1 1,5 0,6
2 1,5 5/fc 3/fc 7/fc ≤ 0,3
3 4,5 5/fc 3/fc 6/fc 0,6
4 4,5 5/fc 3/fc 7/fc ≤ 0,3
5 7,5 5/fc 3/fc 6/fc 0,6
6 7,5 5/fc 3/fc 7/fc ≤ 0,3

NOTE 1 For each bit rate, the corresponding table should be taken into account.
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
NOTE 2 For all bit rates the sequence of test commands defined above should be executed at the different magnetic
field strengths, temperatures and waveforms.
Table L.13 — Test conditions for bit rates of fc/128 and fc/64 (Type B)
H m t t
r, f
Condition
A/m (rms) % µs
1 1,5 8 1
2 1,5 14 1
3 4,5 8 1
4 4,5 14 1
5 7,5 8 1
6 7,5 14 1
Table L.14 — Test conditions for bit rates of fc/32 and fc/16 (Type B)
H m t t
r, f
Condition
A/m (rms) % µs
7 1,5 8 0,8
8 1,5 14 0,8
9 4,5 8 0,8
10 4,5 14 0,8
11 7,5 8 0,8
12 7,5 14 0,8


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ISO/IEC 10373-6:2001/Amd.7:2010(E)
Communication stability test
Place the sample into the DUT position
Calibrate the test PCD assembly
strength to
1,5 A/m (rms) as described in
ISO/IEC 10373-6:2001
Set PCD parameters and start the test
PICC responds
NO
as intended?
YES
Increase field strength by
Test passed Test failed
3,0 A/m (rms)
H<7,5 A/m(rms)
YES or H < 6,5 A/m (rms) at 50
°C
NO
Report tests passed
versus total no. tests

Figure L.3 — Test procedure for the communication stability test
NOTE 1 When executing the test at 50 °C replace the condition "H < 7,5 A/m (rms)" with "H < 6,0 A/m (rms)", and the
last step should be 6,0 A/m (rms).
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ISO/IEC 10373-6:2001/Amd.7:2010(E)
L.4.3.4 Test report
The test report shall include the number of passed tests versus the total number of tests, a test description
and the number of samples and the date.
...