ISO/FDIS 20171

Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electron microscopy(TIFF/SEM)

Titre manque

General Information

• Status: Withdrawn
• ICS: 35.240.70 - IT applications in science
• ICS: 37.020 - Optical equipment
• Technical Committee: ISO/TC 202/SC 4 - Scanning electron microscopy
• Drafting Committee: ISO/TC 202/SC 4 - Scanning electron microscopy
• Current Stage: 5098 - Project deleted
• Completion Date: 21-May-2019

Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 20171
First edition
Microbeam analysis — Scanning
electron microscopy — Tagged image
file format for scanning electron
microscopy(TIFF/SEM)
PROOF/ÉPREUVE
Reference number
ISO 20171:2019(E)
©
ISO 2019

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ISO 20171:2019(E)

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© ISO 2019
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Published in Switzerland
ii PROOF/ÉPREUVE © ISO 2019 – All rights reserved

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ISO 20171:2019(E)

Contents Page
Foreword .vi
Introduction .vii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Image data features . 1
4.1 TIFF file encoding structure . 1
4.2 TIFF/SEM file encoding structure . 2
5 TIFF/SEM tag definitions . 3
5.1 Basic tags in TIFF 6.0 . 3
5.2 Usable tags in TIFF 6.0 . 4
5.3 Usable tags in EXIF format . 4
5.4 Offset pointers defined as TIFF/SEM tags . 4
5.4.1 General. 4
5.4.2 ToSEMStdIFD . 4
5.4.3 ToSEMMakerNotesIFD . 5
5.4.4 ToProcessedImageIFD . 5
5.5 System marker tag . 5
5.5.1 General. 5
5.5.2 SystemMarker .
...