Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electron microscopy(TIFF/SEM)

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ISO/FDIS 20171 - Microbeam analysis -- Scanning electron microscopy -- Tagged image file format for scanning electron microscopy(TIFF/SEM)
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INTERNATIONAL ISO
STANDARD 20171
First edition
Microbeam analysis — Scanning
electron microscopy — Tagged image
file format for scanning electron
microscopy(TIFF/SEM)
PROOF/ÉPREUVE
Reference number
ISO 20171:2019(E)
©
ISO 2019

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ISO 20171:2019(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2019
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
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Published in Switzerland
ii PROOF/ÉPREUVE © ISO 2019 – All rights reserved

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ISO 20171:2019(E)

Contents Page
Foreword .vi
Introduction .vii
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Image data features . 1
4.1 TIFF file encoding structure . 1
4.2 TIFF/SEM file encoding structure . 2
5 TIFF/SEM tag definitions . 3
5.1 Basic tags in TIFF 6.0 . 3
5.2 Usable tags in TIFF 6.0 . 4
5.3 Usable tags in EXIF format . 4
5.4 Offset pointers defined as TIFF/SEM tags . 4
5.4.1 General. 4
5.4.2 ToSEMStdIFD . 4
5.4.3 ToSEMMakerNotesIFD . 5
5.4.4 ToProcessedImageIFD . 5
5.5 System marker tag . 5
5.5.1 General. 5
5.5.2 SystemMarker .
...

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