ISO 15864:2021

Space systems — General test methods for spacecraft, subsystems and units

This document provides the baseline standard on the subject of testing at the system, subsystem and unit levels for applicable unmanned spacecraft programmes. It also provides the requirements for documentation associated with testing activities. This document contains provisions for qualification and acceptance testing, or proto-flight testing (PFT). It assumes that hardware development is complete.

Systèmes spatiaux — Méthodes d'essai générales pour véhicules spatiaux, sous-systèmes et équipements

General Information

• Status: Published
• Publication Date: 30-Jun-2021
• ICS: 49.140 - Space systems and operations
• Technical Committee: ISO/TC 20/SC 14 - Space systems and operations
• Drafting Committee: ISO/TC 20/SC 14/WG 2 - System requirements, verification and validation, interfaces, integration, and test
• Current Stage: 6060 - International Standard published
• Start Date: 01-Jul-2021
• Due Date: 08-Jul-2021
• Completion Date: 01-Jul-2021

Relations

• Revises: ISO 15864:2004 - Space systems — General test methods for space craft, subsystems and units
• Effective Date: 23-Apr-2020

Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 15864
Second edition
2021-07
Space systems — General test methods
for spacecraft, subsystems and units
Systèmes spatiaux — Méthodes d'essai générales pour véhicules
spatiaux, sous-systèmes et équipements
Reference number
ISO 15864:2021(E)
©
ISO 2021

---------------------- Page: 1 ----------------------
ISO 15864:2021(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2021
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO 2021 – All rights reserved

---------------------- Page: 2 ----------------------
ISO 15864:2021(E)

Contents Page
Foreword .vii
Introduction .viii
1 Scope . 1
2 Normative references . 1
3 Terms, definitions and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Abbreviated terms . 3
4 General requirements . 3
4.1 Testing philosophy . 3
4.2 Tailoring of requirements . 3
4.3 Development tests . 4
4.4 Qualification tests . 4
4.5 Acceptance tests . 4
4.6 Proto-flight tests . 4
4.7 Prelaunch validation tests . 4
4.8 Retest . 5
4.8.1 General. 5
4.8.2 Retest due to design modification after completion of qualification. 5
4.8.3 Retest due to non-conformance . 5
4.8.4 Retest after refurbishment . 5
4.8.5 Retest during and after long-term storage . 5
4.9 Test documentation . 5
4.9.1 General. 5
4.9.2 Test plans . 5
4.9.3 Test specifications . . . 6
4.9.4 Test procedures. 6
4.9.5 Test data . 6
4.9.6 Test reports. 7
4.9.7 Test log . 7
4.10 Tests facilities and other requirements . 7
4.10.1 General. 7
4.10.2 Test condition tolerances . 7
4.10.3 Instrumentation . 7
5 Spacecraft system tests . 7
5.1 Test items and sequence . 7
5.2 Test levels and duration . 8
6 Subsystem/unit tests . 8
6.1 Test items and sequence . 8
6.2 Test levels and duration . 8
7 Test requirements .16
7.1 General .16
7.2 Functional test .16
7.2.1 Purpose of test .16
7.2.2 Test facilities and set-up as basic requirements .16
7.2.3 Test article configuration .16
7.2.4 Monitoring during test . .16
7.2.5 Test levels and duration .16
7.2.6 Test condition and guidelines .16
7.2.7 Tailoring guide .17
7.3 Electromagnetic compatibility (EMC) test .17
7.3.1 Purpose of test .17
7.3.2 Test facilities and set-up as basic requirements .17
© ISO 2021 – All rights reserved iii

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ISO 15864:2021(E)

7.3.3 Test article configuration .17
7.3.4 Monitoring during test . .17
7.3.5 Test levels and duration .17
7.3.6 Test condition and guidelines .17
7.3.7 Tailoring guide .17
7.4 Magnetic test .18
7.4.1 Purpose of test .18
7.4.2 Test facilities and set-up as basic requirements .18
7.4.3 Test article configuration .18
7.4.4 Monitoring during test . .18
7.4.5 Test levels and duration .18
7.4.6 Test condition and guidelines .18
7.4.7 Tailoring guide .18
7.5 Antenna pattern test .18
7.5.1 Purpose of test .18
7.5.2 Test facilities and set-up as basic requirements .18
7.5.3 Test article configuration .18
7.5.4 Monitoring during test . .19
7.5.5 Test levels and duration .19
7.5.6 Test condition and guidelines .19
7.5.7 Tailoring guide .19
7.6 Optical alignment measurement .19
7.6.1 Purpose of test .19
7.6.2 Test facilities and set-up as basic requirements .19
7.6.3 Test article configuration .19
7.6.4 Monitoring during test . .19
7.6.5 Test levels and duration .19
7.6.6 Test condition and guidelines .19
7.6.7 Tailoring guide .19
7.7 Physical property measurement.20
7.7.1 Purpose of test .20
7.7.2 Test facilities and set-up as basic requirements .20
7.7.3 Test article configuration .20
7.7.4 Monitoring during test . .20
7.7.5 Test levels and duration .20
7.7.6 Test condition and guidelines .20
7.7.7 Tailoring guide .20
7.8 Dynamic balance .20
7.8.1 Purpose of test .20
7.8.2 Test facilities and set-up as basic requirements .20
7.8.3 Test article configuration .20
7.8.4 Monitoring during test . .21
7.8.5 Test levels and duration .21
7.8.6 Test condition and guidelines .21
7.8.7 Tailoring guide .21
7.9 Launcher/spacecraft interface test .21
7.9.1 Purpose of test .21
7.9.2 Test facilities and set-up as basic requirements .21
7.9.3 Test article configuration .21
7.9.4 Monitoring during test . .21
7.9.5 Test levels and duration .21
7.9.6 Test condition and guidelines .21
7.9.7 Tailoring guide .22
7.10 Static load test .22
7.10.1 Purpose of test .22
7.10.2 Test facilities and set-up as basic requirements .22
7.10.3 Test article configuration .22
7.10.4 Monitoring during test . .22
iv © ISO 2021 – All rights reserved

---------------------- Page: 4 ----------------------
ISO 15864:2021(E)

7.10.5 Test levels and duration .22
7.10.6 Test condition and guidelines .22
7.10.7 Tailoring guide .22
7.11 Acceleration test .22
7.11.1 Purpose of test .22
7.11.2 Test facilities and set-up as basic requirements .23
7.11.3 Test article configuration .23
7.11.4 Monitoring during test . .23
7.11.5 Test levels and duration .23
7.11.6 Test condition and guidelines .23
7.11.7 Tailoring guide .23
7.12 Modal survey .23
7.12.1 Purpose of test .23
7.12.2 Test facilities and set-up as basic requirements .23
7.12.3 Test article configuration .23
7.12.4 Monitoring during test . .24
7.12.5 Test levels and duration .24
7.12.6 Test condition and guidelines .24
7.12.7 Tailoring guide .24
7.13 Sinusoidal vibration test .24
7.13.1 Purpose of test .24
7.13.2 Test facilities and set-up as basic requirements .24
7.13.3 Test article configuration .24
7.13.4 Monitoring during test . .24
7.13.5 Test levels and duration .25
7.13.6 Test condition and guidelines .25
7.13.7 Tailoring guide .25
7.14 Random vibration test .25
7.14.1 Purpose of test .25
7.14.2 Test facilities and set-up as basic requirements .25
7.14.3 Test article configuration .25
7.14.4 Monitoring during test . .25
7.14.5 Test levels and duration .26
7.14.6 Test condition and guidelines .26
7.14.7 Tailoring guide .26
7.15 Acoustic test .26
7.15.1 Purpose of test .26
7.15.2 Test facilities and set-up as basic requirements .26
7.15.3 Test article configuration .26
7.15.4 Monitoring during test . .26
7.15.5 Test levels and duration .26
7.15.6 Test condition and guidelines .27
7.15.7 Tailoring guide .27
7.16 Shock test .27
7.16.1 Purpose of test .27
7.16.2 Test facilities and set-up as basic requirements .27
7.16.3 Test article configuration .27
7.16.4 Monitoring during test . .27
7.16.5 Test levels and duration .27
7.16.6 Test condition and guidelines .27
7.16.7 Tailoring guide .
...

FINAL
INTERNATIONAL ISO/FDIS
DRAFT
STANDARD 15864
ISO/TC 20/SC 14
Space systems — General test methods
Secretariat: ANSI
for space craft, subsystems and units
Voting begins on:
2021­03­25
Systèmes spatiaux — Méthodes d'essai générales pour véhicules
spatiaux, sous-systèmes et équipements
Voting terminates on:
2021­05­20
RECIPIENTS OF THIS DRAFT ARE INVITED TO
SUBMIT, WITH THEIR COMMENTS, NOTIFICATION
OF ANY RELEVANT PATENT RIGHTS OF WHICH
THEY ARE AWARE AND TO PROVIDE SUPPOR TING
DOCUMENTATION.
IN ADDITION TO THEIR EVALUATION AS
Reference number
BEING ACCEPTABLE FOR INDUSTRIAL, TECHNO­
ISO/FDIS 15864:2021(E)
LOGICAL, COMMERCIAL AND USER PURPOSES,
DRAFT INTERNATIONAL STANDARDS MAY ON
OCCASION HAVE TO BE CONSIDERED IN THE
LIGHT OF THEIR POTENTIAL TO BECOME STAN­
DARDS TO WHICH REFERENCE MAY BE MADE IN
©
NATIONAL REGULATIONS. ISO 2021

---------------------- Page: 1 ----------------------
ISO/FDIS 15864:2021(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2021
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH­1214 Vernier, Geneva
Phone: [phone]
Email: [e-mail]
Website: www.iso.org
Published in Switzerland
ii © ISO 2021 – All rights reserved

---------------------- Page: 2 ----------------------
ISO/FDIS 15864:2021(E)

Contents Page
Foreword .vii
Introduction .viii
1 Scope . 1
2 Normative references . 1
3 Terms, definitions and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Abbreviated terms . 3
4 General requirements . 3
4.1 Testing philosophy . 3
4.2 Tailoring of requirements . 3
4.3 Development tests . 4
4.4 Qualification tests . 4
4.5 Acceptance tests . 4
4.6 Proto-flight tests . 4
4.7 Prelaunch validation tests . 4
4.8 Retest . 5
4.8.1 General. 5
4.8.2 Retest due to design modification after completion of qualification. 5
4.8.3 Retest due to non­conformance . 5
4.8.4 Retest after refurbishment . 5
4.8.5 Retest during and after long­term storage . 5
4.9 Test documentation . 5
4.9.1 General. 5
4.9.2 Test plans . 5
4.9.3 Test specifications . . . 6
4.9.4 Test procedures. 6
4.9.5 Test data . 6
4.9.6 Test reports. 7
4.9.7 Test log . 7
4.10 Tests facilities and other requirements . 7
4.10.1 General. 7
4.10.2 Test condition tolerances . 7
4.10.3 Instrumentation . 7
5 Spacecraft system tests . 7
5.1 Test items and sequence . 7
5.2 Test levels and duration . 8
6 Subsystem/unit tests . 8
6.1 Test items and sequence . 8
6.2 Test levels and duration . 8
7 Test requirements .16
7.1 General .16
7.2 Functional test .16
7.2.1 Purpose of test .16
7.2.2 Test facilities and set-up as basic requirements .16
7.2.3 Test article configuration .16
7.2.4 Monitoring during test . .16
7.2.5 Test levels and duration .16
7.2.6 Test condition and guidelines .16
7.2.7 Tailoring guide .17
7.3 Electromagnetic compatibility (EMC) test .17
7.3.1 Purpose of test .17
7.3.2 Test facilities and set-up as basic requirements .17
© ISO 2021 – All rights reserved iii

---------------------- Page: 3 ----------------------
ISO/FDIS 15864:2021(E)

7.3.3 Test article configuration .17
7.3.4 Monitoring during test . .17
7.3.5 Test levels and duration .17
7.3.6 Test condition and guidelines .17
7.3.7 Tailoring guide .17
7.4 Magnetic test .18
7.4.1 Purpose of test .18
7.4.2 Test facilities and set-up as basic requirements .18
7.4.3 Test article configuration .18
7.4.4 Monitoring during test . .18
7.4.5 Test levels and duration .18
7.4.6 Test condition and guidelines .18
7.4.7 Tailoring guide .18
7.5 Antenna pattern test .18
7.5.1 Purpose of test .18
7.5.2 Test facilities and set-up as basic requirements .18
7.5.3 Test article configuration .18
7.5.4 Monitoring during test . .19
7.5.5 Test levels and duration .19
7.5.6 Test condition and guidelines .19
7.5.7 Tailoring guide .19
7.6 Optical alignment measurement .19
7.6.1 Purpose of test .19
7.6.2 Test facilities and set-up as basic requirements .19
7.6.3 Test article configuration .19
7.6.4 Monitoring during test . .19
7.6.5 Test levels and duration .19
7.6.6 Test condition and guidelines .19
7.6.7 Tailoring guide .19
7.7 Physical property measurement.20
7.7.1 Purpose of test .20
7.7.2 Test facilities and set-up as basic requirements .20
7.7.3 Test article configuration .20
7.7.4 Monitoring during test . .20
7.7.5 Test levels and duration .20
7.7.6 Test condition and guidelines .20
7.7.7 Tailoring guide .20
7.8 Dynamic balance .20
7.8.1 Purpose of test .20
7.8.2 Test facilities and set-up as basic requirements .20
7.8.3 Test article configuration .20
7.8.4 Monitoring during test . .21
7.8.5 Test levels and duration .21
7.8.6 Test condition and guidelines .21
7.8.7 Tailoring guide .21
7.9 Launcher/spacecraft interface test .21
7.9.1 Purpose of test .21
7.9.2 Test facilities and set-up as basic requirements .21
7.9.3 Test article configuration .21
7.9.4 Monitoring during test . .21
7.9.5 Test levels and duration .21
7.9.6 Test condition and guidelines .21
7.9.7 Tailoring guide .22
7.10 Static load test .22
7.10.1 Purpose of test .22
7.10.2 Test facilities and set-up as basic requirements .22
7.10.3 Test article configuration .22
7.10.4 Monitoring during test . .22
iv © ISO 2021 – All rights reserved

---------------------- Page: 4 ----------------------
ISO/FDIS 15864:2021(E)

7.10.5 Test levels and duration .22
7.10.6 Test condition and guidelines .22
7.10.7 Tailoring guide .22
7.11 Acceleration test .22
7.11.1 Purpose of test .22
7.11.2 Test facilities and set-up as basic requirements .23
7.11.3 Test article configuration .23
7.11.4 Monitoring during test . .23
7.11.5 Test levels and duration .23
7.11.6 Test condition and guidelines .23
7.11.7 Tailoring guide .23
7.12 Modal survey .23
7.12.1 Purpose of test .23
7.12.2 Test facilities and set-up as basic requirements .23
7.12.3 Test article configuration .23
7.12.4 Monitoring during test . .24
7.12.5 Test levels and duration .24
7.12.6 Test condition and guidelines .24
7.12.7 Tailoring guide .24
7.13 Sinusoidal vibration test .24
7.13.1 Purpose of test .24
7.13.2 Test facilities and set-up as basic requirements .24
7.13.3 Test article configuration .24
7.13.4 Monitoring during test . .24
7.13.5 Test levels and duration .25
7.13.6 Test condition and guidelines .25
7.13.7 Tailoring guide .25
7.14 Random vibration test .25
7.14.1 Purpose of test .25
7.14.2 Test facilities and set-up as basic requirements .25
7.14.3 Test article configuration .25
7.14.4 Monitoring during test . .25
7.14.5 Test levels and duration .26
7.14.6 Test condition and guidelines .26
7.14.7 Tailoring guide .26
7.15 Acoustic test .26
7.15.1 Purpose of test .26
7.15.2 Test facilities and set-up as basic requirements .26
7.15.3 Test article configuration .26
7.15.4 Monitoring during test . .26
7.15.5 Test levels and duration .26
7.15.6 Test condition and guidelines .27
7.15.7 Tailoring guide .27
7.16 Shock test .27
7.16.1 Purpose of test .27
7.16.2 Test facilities and set-up as basic requirements .27
7.16.3 Test article configuration .
...