SIST EN IEC 62604-1:2022
(Main)Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2022)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2022)
IEC 62604-1:2022 is available as IEC 62604-1:2022 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 62604-1:2022 specifies the methods of test and general requirements for SAW and BAW duplexers of assessed quality using either capability approval or qualification approval procedures. This edition includes the following significant technical changes with respect to the previous edition:
- the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in the same manner especially in mobile phones and have the same requirements of characteristics, test method and so on.
Oberflächenwellen-(OFW-) und Volumenwellen-(BAW-)Duplexer mit bewerteter Qualität – Teil 1: Fachgrundspezifikation (IEC 62604-1:2022)
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1: Spécification générique (IEC 62604-1:2022)
IEC 62604-1:2022 est disponible sous forme de IEC 62604-1:2022 RLV qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.
L’IEC 62604-1:2022 spécifie les méthodes d’essai et les exigences générales pour les duplexeurs à OAS et à OAV dont la qualité est assurée par les procédures d’agrément de savoir-faire ou par les procédures d’homologation. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’édition précédente:
- ajout du terme "multiplexeur" à l’Article 3.
NOTE Dans le présent document, les duplexeurs à OAS et à OAV sont traités simultanément, car ces deux duplexeurs sont utilisés de la même manière, en particulier dans les téléphones mobiles; ils ont en outre les mêmes exigences de caractéristiques, de méthode d’essai, etc.
Radiofrekvenčni (SAW) in visokofrekvenčni (BAW) duplekserji ocenjene kakovosti - 1. del: Splošna specifikacija (IEC 62604-1:2022)
Ta del standarda IEC 62604 določa preskusne metode in splošne zahteve za radiofrekvenčne (SAW) in visokofrekvenčne (BAW) duplekserje ocenjene kakovosti, ki vključujejo postopke za odobritev zmogljivosti ali kvalifikacije.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-november-2022
Nadomešča:
SIST EN 62604-1:2015
Radiofrekvenčni (SAW) in visokofrekvenčni (BAW) duplekserji ocenjene kakovosti
- 1. del: Splošna specifikacija (IEC 62604-1:2022)
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed
quality - Part 1: Generic specification (IEC 62604-1:2022)
Oberflächenwellen-(OFW-) und Volumenwellen-(BAW-)Duplexer mit bewerteter Qualität
– Teil 1: Fachgrundspezifikation (IEC 62604-1:2022)
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume
(OAV) sous assurance de la qualité - Partie 1: Spécification générique (IEC 62604-
1:2022)
Ta slovenski standard je istoveten z: EN IEC 62604-1:2022
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 62604-1
NORME EUROPÉENNE
EUROPÄISCHE NORM September 2022
ICS 31.140 Supersedes EN 62604-1:2015
English Version
Surface acoustic wave (SAW) and bulk acoustic wave (BAW)
duplexers of assessed quality - Part 1: Generic specification
(IEC 62604-1:2022)
Duplexeurs à ondes acoustiques de surface (OAS) et à Oberflächenwellen-(OFW-) und Volumenwellen-(BAW-
ondes acoustiques de volume (OAV) sous assurance de la )Duplexer mit bewerteter Qualität - Teil 1:
qualité - Partie 1: Spécification générique Fachgrundspezifikation
(IEC 62604-1:2022) (IEC 62604-1:2022)
This European Standard was approved by CENELEC on 2022-08-15. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Türkiye and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62604-1:2022 E
European foreword
The text of document 49/1360/CDV, future edition 2 of IEC 62604-1, prepared by IEC/TC 49
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 62604-1:2022.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2023-05-15
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2025-08-15
document have to be withdrawn
This document supersedes EN 62604-1:2015 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62604-1:2022 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 62047-7:2011 NOTE Harmonized as EN 62047-7:2011 (not modified)
IEC 60068-2-10:2005 NOTE Harmonized as EN 60068-2-10:2005 (not modified)
IEC 62604-2:2017 NOTE Harmonized as EN IEC 62604-2:2018 (not modified)
IEC 60862-1:2015 NOTE Harmonized as EN 60862-1:2015 (not modified)
IEC 61019-1:2004 NOTE Harmonized as EN 61019-1:2005 (not modified)
IEC 60862-2:2012 NOTE Harmonized as EN 60862-2:2012 (not modified)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60027 series Letter symbols to be used in electrical EN 60027 series
technology
IEC 60050-561 - International Electrotechnical Vocabulary - - -
Part 561: Piezoelectric, dielectric and
electrostatic devices and associated
materials for frequency control, selection
and detection
IEC 60068-1 2013 Environmental testing - Part 1: General EN 60068-1 2014
and guidance
IEC 60068-2-1 - Environmental testing - Part 2-1: Tests - EN 60068-2-1 -
Test A: Cold
IEC 60068-2-2 - Environmental testing - Part 2-2: Tests - EN 60068-2-2 -
Test B: Dry heat
IEC 60068-2-6 - Environmental testing - Part 2-6: Tests - EN 60068-2-6 -
Test Fc: Vibration (sinusoidal)
IEC 60068-2-7 - Basic environmental testing procedures - EN 60068-2-7 -
Part 2-7: Tests - Test Ga and guidance:
Acceleration, steady state
IEC 60068-2-13 - Environmental testing - Part 2-13: Tests - EN IEC 60068-2-13 -
Test M: Low air pressure
IEC 60068-2-14 - Environmental testing - Part 2-14: Tests - EN 60068-2-14 -
Test N: Change of temperature
IEC 60068-2-17 1994 Basic environmental testing procedures - EN 60068-2-17 1994
Part 2-17: Tests - Test Q: Sealing
IEC 60068-2-27 - Environmental testing - Part 2-27: Tests - EN 60068-2-27 -
Test Ea and guidance: Shock
IEC 60068-2-30 - Environmental testing - Part 2-30: Tests - EN 60068-2-30 -
Test Db: Damp heat, cyclic (12 h + 12 h
cycle)
IEC 60068-2-31 - Environmental testing - Part 2-31: Tests - EN 60068-2-31 -
Test Ec: Rough handling shocks, primarily
for equipment-type specimens
IEC 60068-2-45 - Basic environmental testing procedures - EN 60068-2-45 -
Part 2-45: Tests - Test XA and guidance:
Immersion in cleaning solvents
IEC 60068-2-52 - Environmental testing - Part 2-52: Tests - EN IEC 60068-2-52 -
Test Kb: Salt mist, cyclic (sodium chloride
solution)
IEC 60068-2-58 - Environmental testing - Part 2-58: Tests - EN 60068-2-58 -
Test Td: Test methods for solderability,
resistance to dissolution of metallization
and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-64 - Environmental testing - Part 2-64: Tests - EN 60068-2-64 -
Test Fh: Vibration, broadband random
and guidance
IEC 60068-2-78 - Environmental testing - Part 2-78: Tests - EN 60068-2-78 -
Test Cab: Damp heat, steady state
IEC 60122-1 - Quartz crystal units of assessed quality - EN 60122-1 -
Part 1: Generic specification
IEC 60617 - Graphical symbols for diagrams - -
IEC 60642 - Piezoelectric ceramic resonators and - -
resonator units for frequency control and
selection - Chapter I: Standard values and
conditions - Chapter II: Measuring and
test conditions
IEC 60695-11-5 - Fire hazard testing - Part 11-5: Test EN 60695-11-5 -
flames - Needle-flame test method -
Apparatus, confirmatory test arrangement
and guidance
IEC 60749-28 - Semiconductor devices - Mechanical and EN IEC 60749-28 -
climatic test methods - Part 28:
Electrostatic discharge (ESD) sensitivity
testing - Charged device model (CDM) -
device level
IEC 61000-4-2 - Electromagnetic compatibility (EMC) - EN 61000-4-2 -
Part 4-2: Testing and measurement
techniques - Electrostatic discharge
immunity test
IEC 61340-3-1 - Electrostatics - Part 3-1: Methods for EN 61340-3-1 -
simulation of electrostatic effects - Human
body model (HBM) electrostatic discharge
test waveforms
IEC 61340-3-2 - Electrostatics - Part 3-2: Methods for EN 61340-3-2 -
simulation of electrostatic effects -
Machine model (MM) electrostatic
discharge test waveforms
IEC 62761 - Guidelines for the measurement method EN 62761 -
of nonlinearity for surface acoustic wave
(SAW) and bulk acoustic wave (BAW)
devices in radio frequency (RF)
IEC 80000 series Quantities and units EN 80000 series
ISO 80000 series Quantities and units EN ISO 80000 series
IEC 62604-1 ®
Edition 2.0 2022-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of
assessed quality –
Part 1: Generic specification
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de
volume (OAV) sous assurance de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-3965-0
– 2 – IEC 62604-1:2022 © IEC 2022
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions, units and graphical symbols . 8
3.1 Terms and definitions . 8
3.1.1 General terms . 9
3.1.2 Response characteristics related terms . 11
3.1.3 SAW and BAW duplexers related terms . 15
3.2 Units and graphical symbols . 16
4 Order of precedence of documents . 16
5 Preferred values for ratings and characteristics . 17
5.1 General . 17
5.2 Nominal frequency bands . 17
5.3 Operating temperature ranges, in degrees Celsius (°C) . 17
5.4 Climatic category . 17
5.5 Bump severity . 17
5.6 Vibration severity . 18
5.7 Shock severity . 18
5.8 Fine leak rate . 18
6 Marking . 19
6.1 Duplexer marking . 19
6.2 Package marking . 19
7 Quality assessment procedures . 19
7.1 General . 19
7.2 Primary stage of manufacture . 19
7.3 Structurally similar components . 19
7.4 Subcontracting . 19
7.5 Incorporated components . 20
7.6 Manufacturer’s approval . 20
7.7 Approval procedures . 20
7.7.1 General . 20
7.7.2 Capability approval . 20
7.7.3 Qualification approval . 20
7.8 Procedures for capability approval . 20
7.8.1 General . 20
7.8.2 Eligibility for capability approval . 21
7.8.3 Application for capability approval . 21
7.8.4 Granting of capability approval . 21
7.8.5 Capability manual . 21
7.9 Procedures for qualification approval . 21
7.9.1 General . 21
7.9.2 Eligibility for qualification approval . 21
7.9.3 Application for qualification approval . 21
7.9.4 Granting of qualification approval . 21
7.9.5 Quality conformance inspection . 21
7.10 Test procedures . 21
IEC 62604-1:2022 © IEC 2022 – 3 –
7.11 Screening requirements . 21
7.12 Rework and repair work . 22
7.12.1 Rework . 22
7.12.2 Repair work . 22
7.13 Certified records of released lots . 22
7.14 Validity of release . 22
7.15 Release for delivery . 22
7.16 Unchecked parameters . 22
8 Test and measurement procedures . 22
8.1 General . 22
8.2 Test and measurement conditions . 22
8.2.1 Standard conditions for testing . 22
8.2.2 Precision of measurement . 23
8.2.3 Precautions . 23
8.2.4 Alternative test methods . 23
8.3 Visual inspection . 23
8.3.1 General . 23
8.3.2 Visual test A . 23
8.3.3 Visual test B . 24
8.4 Dimensions test . 24
8.5 Electrical test procedures . 24
8.5.1 S-parameters measurement . 24
8.5.2 Intermodulation distortion measurement . 26
8.5.3 Insulation resistance . 26
8.5.4 Voltage proof . 26
8.6 Mechanical and environmental test procedures . 26
8.6.1 Sealing tests (non-destructive) . 26
8.6.2 Soldering (solderability and resistance to soldering heat) (destructive) . 27
8.6.3 Rapid change of temperature: severe shock by liquid immersion (non-
destructive). 27
8.6.4 Rapid change of temperature with prescribed time of transition (non-
destructive). 27
8.6.5 Bump (destructive) . 27
8.6.6 Vibration (destructive). 28
8.6.7 Shock (destructive) . 28
8.6.8 Free fall (destructive) . 28
8.6.9 Acceleration, steady state (non-destructive) . 29
8.6.10 Low air pressure (non-destructive) . 29
8.6.11 Dry heat (non-destructive) . 29
8.6.12 Damp heat, cyclic (destructive) . 29
8.6.13 Cold (non-destructive) . 29
8.6.14 Climatic sequence (destructive) . 29
8.6.15 Damp heat, steady state (destructive) . 30
8.6.16 Salt mist cyclic (destructive) . 30
8.6.17 Immersion in cleaning solvents (non-destructive) . 30
8.6.18 Flammability test (destructive) . 30
8.6.19 Electrostatic discharge (ESD) sensitivity test (destructive) . 30
8.7 Endurance test procedure . 31
Bibliography . 32
– 4 – IEC 62604-1:2022 © IEC 2022
Figure 1 – FBAR configuration . 10
Figure 2 – SMR configuration . 11
Figure 3 – Frequency response of SAW and BAW duplexers . 16
Figure 4 – S-parameters measurement . 25
Table 1 – Frequency allocation of typical UMTS bands . 17
IEC 62604-1:2022 © IEC 2022 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SURFACE ACOUSTIC WAVE (SAW) AND
BULK ACOUSTIC WAVE (BAW) DUPLEXERS
OF ASSESSED QUALITY –
Part 1: Generic specification
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
IEC 62604-1 has been prepared by IEC technical committee 49: Piezoelectric, dielectric and
electrostatic devices and associated materials for frequency control, selection and detection. It
is an International Standard.
This second edition cancels and replaces the first edition published in 2015. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
• the term "multiplexer" has been added to Clause 3.
NOTE In this document, SAW and BAW duplexers are treated simultaneously because both duplexers are used in
the same manner especially in mobile phones and have the same requirements of characteristics, test method and
so on.
– 6 – IEC 62604-1:2022 © IEC 2022
The text of this International Standard is based on the following documents:
Draft Report on voting
49/1360/CDV 49/1375/RVC
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62604 series, published under the general title Surface acoustic
wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality, can be found on the
IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.
IEC 62604-1:2022 © IEC 2022 – 7 –
SURFACE ACOUSTIC WAVE (SAW) AND
BULK ACOUSTIC WAVE (BAW) DUPLEXERS
OF ASSESSED QUALITY –
Part 1: Generic specification
1 Scope
This part of IEC 62604 specifies the methods of test and general requirements for SAW and
BAW duplexers of assessed quality using either capability approval or qualification approval
procedures.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050-561, International electrotechnical vocabulary – Part 561: Piezoelectric, dielectric
and electrostatic devices and associated materials for frequency control, selection and
detection
IEC 60068-1:2013, Environmental testing – Part 1: General and guidance
IEC 60068-2-1, Environmental testing – Part 2-1: Tests – Test A: Cold
IEC 60068-2-2, Environmental testing – Part 2-2: Tests – Test B: Dry heat
IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7, Basic environmental testing procedures – Part 2-7: Tests – Test Ga and
guidance: Acceleration, steady state
IEC 60068-2-13, Basic environmental testing procedures – Part 2-13: Tests – Test M: Low air
pressure
IEC 60068-2-14, Environmental testing – Part 2-14: Tests – Test N: Change of temperature
IEC 60068-2-17:1994, Basic environmental testing procedures – Part 2-17: Tests – Test Q:
Sealing
IEC 60068-2-27, Environmental testing – Part 2-27: Tests – Test Ea and guidance: Shock
IEC 60068-2-30, Environmental testing – Part 2-30: Tests – Test Db: Damp heat, cyclic
(12 h + 12 h cycle)
IEC 60068-2-31, Environmental testing – Part 2-31: Tests – Test Ec: Rough handling shocks,
primarily for equipment-type specimens
– 8 – IEC 62604-1:2022 © IEC 2022
IEC 60068-2-45, Basic environmental testing procedures – Part 2-45: Tests – Test XA and
guidance: Immersion in cleaning solvents
IEC 60068-2-52, Environmental testing – Part 2-52: Tests – Test Kb: Salt mist, cyclic (sodium
chloride solution)
IEC 60068-2-58, Environmental testing – Part 2-58: Tests – Test Td: Test methods for
solderability, resistance to dissolution of metallization and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-64, Environmental testing – Part 2-64: Tests – Test Fh: Vibration, broadband
random and guidance
IEC 60068-2-78, Environmental testing – Part 2-78: Tests – Test Cab: Damp heat, steady state
IEC 60122-1, Quartz crystal units of assessed quality – Part 1: Generic specification
IEC 60617, Graphical symbols for diagrams (available at http://std.iec.ch/iec60617)
IEC 60642, Piezoelectric ceramic resonators and resonator units for frequency control and
selection – Chapter I: Standard values and conditions – Chapter II: Measuring and test
conditions
IEC 60695-11-5, Fire hazard testing – Part 11-5: Test flames – Needle-flame test method –
Apparatus, confirmatory test arrangement and guidance
IEC 60749-28, Semiconductor devices – Mechanical and climatic test methods – Part 28:
Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
IEC 61000-4-2, Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement
techniques – Electrostatic discharge immunity test
IEC 61340-3-1 , Electrostatics – Part 3-1: Methods for simulation of electrostatic effects –
Human body model (HBM) electrostatic discharge test waveforms
IEC 61340-3-2 , Electrostatics – Part 3-2: Methods for simulation of electrostatic effects –
Machine model (MM) electrostatic discharge test waveforms
IEC 62761, Guidelines for the measurement method of nonlinearity for surface acoustic wave
(SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
IEC 80000 (all parts), Quantities and units
ISO 80000 (all parts), Quantities and units
3 Terms, definitions, units and graphical symbols
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
___________
Withdrawn
IEC 62604-1:2022 © IEC 2022 – 9 –
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1 General terms
3.1.1.1
surface acoustic wave
SAW
acoustic wave, propagating along a surface of an elastic material, whose amplitude decays
exponentially with the depth
[SOURCE: IEC 60862-1:2015, 3.1.1.1]
3.1.1.2
surface acoustic wave filter
SAW filter
filter characterized by one or more surface acoustic wave transmission line or resonant
elements, where the surface acoustic wave is usually generated by an interdigital transducer
and propagates along a material surface
[SOURCE: IEC 60862-1:2015, 3.1.1.2]
3.1.1.3
bulk acoustic wave
BAW
acoustic wave, propagating inside an elastic material and then traversing the entire thickness
of the bulk
Note 1 to entry: The wave is excited by metal electrodes attached to both sides of the piezoelectric layer.
3.1.1.4
bulk acoustic wave filter
BAW filter
filter characterized by a bulk acoustic wave which is usually generated by a pair of electrodes
and propagates along a thickness direction
3.1.1.5
film bulk acoustic resonator
FBAR
thin film BAW resonator consisting of a piezoelectric layer sandwiched between two electrode
layers with stress-free top and bottom surface supported mechanically at the edge on a
substrate with cavity structure as shown in Figure 1 or membrane structure as an example
Note 1 to entry: This note applies to the French language only.
– 10 – IEC 62604-1:2022 © IEC 2022
a) – Back-side etched
b) – Front-side etched
c) – Sacrificial-layer etched
Figure 1 – FBAR configuration
3.1.1.6
solidly mounted resonator
SMR
BAW resonator, supporting the electrode/piezoelectric layer/electrode structure by a sequence
of additional thin films of alternately low and high acoustic impedance Za with quarter
wavelength layer, and these layers act as acoustic reflectors and decouple the resonator
acoustically from the substrate, as shown in Figure 2 as an example
IEC 62604-1:2022 © IEC 2022 – 11 –
Figure 2 – SMR configuration
3.1.2 Response characteristics related terms
3.1.2.1
reference frequency
frequency defined by the specification to which other frequencies may be referred
[SOURCE: IEC 60862-1:2015, 3.1.2.3]
3.1.2.2
insertion attenuation
logarithmic ratio of the power delivered directly to the load impedance before insertion of the
duplexer to the power delivered to the load impedance after insertion of the duplexer
[SOURCE: IEC 60862-1:2015, 3.1.2.6, modified – In the definition, "filter" has been replaced
with "duplexer".]
3.1.2.3
nominal insertion attenuation
insertion attenuation at a specified reference frequency
[SOURCE: IEC 60862-1:2015, 3.1.2.7]
3.1.2.4
relative attenuation
difference between the attenuation at a given frequency and the attenuation at the reference
frequency
[SOURCE: IEC 60862-1:2015, 3.1.2.8]
3.1.2.5
pass band
band of frequencies in which the relative attenuation is equal to or less than a specified value
[SOURCE: IEC 60862-1:2015, 3.1.2.9]
– 12 – IEC 62604-1:2022 © IEC 2022
3.1.2.6
pass bandwidth
separation of frequencies between which the relative attenuation is equal to or less than a
specified value
[SOURCE: IEC 60862-1:2015, 3.1.2.10]
3.1.2.7
pass band ripple
maximum variation in attenuation characteristics within a specified pass band
[SOURCE: IEC 60862-1:2015, 3.1.2.11]
3.1.2.8
minimum insertion attenuation
minimum value of insertion attenuation in the pass band
[SOURCE: IEC 60862-1:2015, 3.1.2.13]
3.1.2.9
maximum insertion attenuation
maximum value of insertion attenuation in the pass band
[SOURCE: IEC 60862-1:2015, 3.1.2.14]
3.1.2.10
stop band
band of frequencies in which the relative attenuation is equal to or greater than a specified
value
[SOURCE: IEC 60862-1:2015, 3.1.2.15]
3.1.2.11
stop bandwidth
separation of frequencies between which the relative attenuation is equal to or greater than a
specified value
[SOURCE: IEC 60862-1:2015, 3.1.2.16]
3.1.2.12
stop band rejection
minimum relative attenuation at a specified stop band
[SOURCE: IEC 60862-1:2015, 3.1.2.17]
3.1.2.13
group delay
time equal to the first derivative of the phase shift, in radians, with respect to the angular
frequency
[SOURCE: IEC 60862-1:2015, 3.1.2.19]
3.1.2.14
trap frequency
specified frequency at which the relative attenuation is equal to or greater than a specified value
IEC 62604-1:2022 © IEC 2022 – 13 –
[SOURCE: IEC 60862-1:2015, 3.1.2.22]
3.1.2.15
trap attenuation
relative attenuation at a specified trap frequency
[SOURCE: IEC 60862-1:2015, 3.1.2.23]
3.1.2.16
transition band
band of frequencies between the cut-off frequency and the nearest point of the adjacent stop
band
[SOURCE: IEC 60862-1:2015, 3.1.2.24]
3.1.2.17
reflectivity
dimensionless measure of the degree of mismatch between two impedances Z and Z :
a b
Z − Z
a b
,
Z + Z
a b
where Z and Z represent, respectively, the input and source impedance or the output and load
a b
impedance
Note 1 to entry: The absolute value of reflectivity is called the reflection coefficient.
[SOURCE: IEC 60862-1:2015, 3.1.2.25]
3.1.2.18
return attenuation
value of the reflection coefficient given by the sign changed expression in decibels:
Z − Z
a b
−20 log dB
Z + Z
a b
[SOURCE: IEC 60862-1:2015, 3.1.2.26]
3.1.2.19
input level
power, voltage or current value applied to the input port of a duplexer/diplexer/multiplexer
[SOURCE: IEC 60862-1:2015, 3.1.2.30, modified – In the definition, "input terminal of a filter"
has been replaced with "input port of a duplexer/diplexer/multiplexer".]
3.1.2.20
output level
power, voltage or current value delivered to the load circuit
[SOURCE: IEC 60862-1:2015, 3.1.2.31]
3.1.2.21
nominal level
power, voltage or current value at which the performance measurement is specified
– 14 – IEC 62604-1:2022 © IEC 2022
[SOURCE: IEC 60862-1:2015, 3.1.2.32]
3.1.2.22
input impedance
impedance presented by the duplexer/diplexer/multiplexer to the signal source when the other
ports are terminated by a specified impedance
[SOURCE: IEC 60862-1:2015, 3.1.2.33, modified – In the definition, "filter" has been replaced
with "duplexer/diplexer/multiplexer", "the output is terminated" with "the other ports are
terminated", and "a specified load impedance" with "a specified impedance".]
3.1.2.23
output impedance
impedance presented by the duplexer/diplexer/multiplexer to the load when the other ports are
terminated by a specified impedance
[SOURCE: IEC 60862-1:2015, 3.1.2.34, modified – In the definition, "filter" has been replaced
with "duplexer/diplexer/multiplexer", "the input is terminated" with "the other ports are
terminated", and "a specified source impedance" with "a specified impedance"]
3.1.2.24
terminating impedance
impedance presented to the duplexer/diplexer/multiplexer by the source or by the load
[SOURCE: IEC 60862-1:2015, 3.1.2.35, modified – In the definition, "filter" has been replaced
with "duplexer/diplexer/multiplexer".]
3.1.2.25
balanced RX port
RX port between two terminals having equal amplitudes and 180 degree different phases
3.1.2.26
operating temperature range
range of temperatures, over which the SAW or BAW duplexers will function while maintaining
its specified characteristics within specified tolerances
[SOURCE: IEC 60862-1:2015, 3.1.2.38, modified – In the definition, "SAW filter" has been
replaced with "SAW or BAW duplexers".]
3.1.2.27
intermodulation distortion
IMD
non-linear distortion of a device response characterized by the appearance of frequencies at
the output which is equal to the differences (or sums) of integral multiples of the two or more
component frequencies present at the input
Note 1 to entry: This note applies to the French language only.
[SOURCE: IEC 60862-1:2015, 3.1.2.42]
3.1.2.28
isolation
isolation from TX port to RX port
leakage power ratio from the TX port to the RX port in a duplexer
Note 1 to entry: Figure 3 c) gives an example of isolation response.
IEC 62604-1:2022 © IEC 2022 – 15 –
3.1.3 SAW and BAW duplexers related terms
3.1.3.1
duplexer
device used in the frequency division duplex system, which enables signals to be received and
transmitted through a common antenna simultaneously
3.1.3.2
diplexer
device which separates composite signals into two parts of two frequency domains
Note 1 to entry: This can be used to combine signals in two frequency domains into composite signals, in reverse.
3.1.3.3
multiplexer
device in which some duplexers or filters are combined to one duplexer, which enables signals
to be received and transmitted through a common antenna simultaneously
3.1.3.4
TX filter
filter used in a transmitter part to eliminate unnecessary signals
Note 1 to entry: This is a basic part of a duplexer.
Note 2 to entry: Figure 3 a) gives an example of TX filter response.
3.1.3.5
RX filter
filter used in a receiver part to eliminate unnecessary signals
Note 1 to entry: This is a basic part of a duplexer.
Note 2 to entry: Figure 3 b) gives an example of RX filter response.
3.1.3.6
stress migration
phenomenon of electrode defect caused by stress corresponding to distortion positively
correlated with the input power in the resonator
3.1.3.7
breakdown
phenomenon of failure by insulation breakdown when applying high power
a) Basic TX filter response example of SAW and BAW duplexers
– 16 – IEC 62604-1:2022 © IEC 2022
b) Basic RX filter response example of SAW and BAW duplexers
c) Basic isolation response example of SAW and BAW duplexers
Figure 3 – Frequency response of SAW and BAW duplexers
3.2 Units and graphical symbols
Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken
from the following International Standards:
– IEC 60027 (all parts);
– IEC 60050-561;
– IEC 60617;
– IEC 60642;
– IEC 60122-1;
– IEC 80000;
– ISO 80000.
4 Order of precedence of documents
Where any discrepancies occur for any reason, documents shall rank in the following order of
precedence:
– the detail specification;
– the sectional specification;
IEC 62604-1:2022 © IEC 2022 – 17 –
– the generic specification;
– any other international documents (for example, of the IEC) to which reference is made.
The same order of precedence shall apply to equivalent national documents.
5 Preferred values for
...
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