Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (IEC 62228-5:2021)

This part of IEC 62228 specifies test and measurement methods for EMC evaluation of Ethernet
transceiver ICs under network condition. It defines test configurations, test conditions, test
signals, failure criteria, test procedures, test setups and test boards. It is applicable for
transceiver of the Ethernet systems
• 100BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD1;
• 100BASE-TX according to ISO/IEC/IEEE 8802-3;
• 1000BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD4
and covers
• the emission of RF disturbances;
• the immunity against RF disturbances;
• the immunity against impulses;
• the immunity against electrostatic discharges (ESD).

Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-Empfangsgeräten - Teil 5: Ethernet-Sende-Empfangsgerät (IEC 62228-5:2021)

Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 5 : Émetteurs-récepteurs (IEC 62228-5:2021)

Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-sprejemnikov - 5. del: Ethernet oddajniki-sprejemniki (IEC 62228-5:2021)

General Information

Status
Published
Publication Date
17-Jun-2021
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
11-Jun-2021
Due Date
16-Aug-2021
Completion Date
18-Jun-2021

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SLOVENSKI STANDARD
SIST EN IEC 62228-5:2021
01-september-2021
Integrirana vezja - Vrednotenje elektromagnetne združljivosti (EMC) oddajnikov-
sprejemnikov - 5. del: Ethernet oddajniki-sprejemniki (IEC 62228-5:2021)

Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (IEC

62228-5:2021)

Integrierte Schaltungen - Bewertung der elektromagnetischen Verträglichkeit von Sende-

Empfangsgeräten - Teil 5: Ethernet-Sende-Empfangsgerät (IEC 62228-5:2021)
Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 5 :
Émetteurs-récepteurs (IEC 62228-5:2021)
Ta slovenski standard je istoveten z: EN IEC 62228-5:2021
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
33.100.01 Elektromagnetna združljivost Electromagnetic compatibility
na splošno in general
SIST EN IEC 62228-5:2021 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN IEC 62228-5:2021
---------------------- Page: 2 ----------------------
SIST EN IEC 62228-5:2021
EUROPEAN STANDARD EN IEC 62228-5
NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2021
ICS 31.200
English Version
Integrated circuits - EMC evaluation of transceivers - Part 5:
Ethernet transceivers
(IEC 62228-5:2021)

Circuits intégrés - Évaluation de la CEM des émetteurs- Integrierte Schaltungen - Bewertung der

récepteurs - Partie 5 : Émetteurs-récepteurs elektromagnetischen Verträglichkeit von Sende-

(IEC 62228-5:2021) Empfangsgeräten - Teil 5: Ethernet-Sende-Empfangsgerät
(IEC 62228-5:2021)

This European Standard was approved by CENELEC on 2021-05-31. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 62228-5:2021 E
---------------------- Page: 3 ----------------------
SIST EN IEC 62228-5:2021
EN IEC 62228-5:2021 (E)
European foreword

The text of document 47A/1115/FDIS, future edition 1 of IEC 62228-5, prepared by SC 47A

"Integrated circuits" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC

parallel vote and approved by CENELEC as EN IEC 62228-5:2021.
The following dates are fixed:

• latest date by which the document has to be implemented at national (dop) 2022-02-28

level by publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2024-05-31

document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 62228-5:2021 was approved by CENELEC as a European

Standard without any modification.

In the official version, for Bibliography, the following notes have to be added for the standards

indicated:
CISPR 16-1-1 NOTE Harmonized as EN IEC 55016-1-1
IEC 61000-4-2 NOTE Harmonized as EN 61000-4-2
IEC 61000-4-4 NOTE Harmonized as EN 61000-4-4
IEC 61000-4-5 NOTE Harmonized as EN 61000-4-5
IEC 61967-2 NOTE Harmonized as EN 61967-2
IEC 61967-8 NOTE Harmonized as EN 61967-8
IEC 62132-2 NOTE Harmonized as EN 62132-2
IEC 62132-8 NOTE Harmonized as EN 62132-8
---------------------- Page: 4 ----------------------
SIST EN IEC 62228-5:2021
EN IEC 62228-5:2021 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments)

applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the

relevant EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available

here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 61967-1 - Integrated circuits - Measurement of EN IEC 61967-1 -
electromagnetic emissions - Part 1:
General conditions and definitions
IEC 61967-4 - Integrated circuits - Measurement of EN IEC 61967-4 -
electromagnetic emissions - Part 4:
Measurement of conducted emissions - 1
ohm/150 ohm direct coupling method
IEC 62132-1 - Integrated circuits - Measurement of EN 62132-1 -
electromagnetic immunity - Part 1: General
conditions and definitions
IEC 62132-4 - Integrated circuits - Measurement of EN 62132-4 -
electromagnetic immunity 150 kHz to 1
GHz - Part 4: Direct RF power injection
method
IEC 62215-3 - Integrated circuits - Measurement of EN 62215-3 -
impulse immunity - Part 3: Non-
synchronous transient injection method
IEC 62228-1 - Integrated circuits – EMC evaluation of EN IEC 62228-1 -
transceivers – Part 1: General conditions
and definitions
ISO 10605 - Road vehicles - Test methods for electrical - -
disturbances from electrostatic discharge
ISO 21111-2 - Road vehicles - In-vehicle Ethernet - Part - -
2: Common physical entity requirements
ISO 7637-2 - Road vehicles - Electrical disturbances - -
from conduction and coupling – Part 2:
Electrical transient conduction along supply
lines only
---------------------- Page: 5 ----------------------
SIST EN IEC 62228-5:2021
EN IEC 62228-5:2021 (E)
Publication Year Title EN/HD Year
ISO/IEC/IEEE 8802-3 2017 Information technology - - -
Telecommunications and information
exchange between systems - Local and
metropolitan area networks - Specific
requirements - Part 3: Standard for
Ethernet
+A1 2017 - -
+A4 2017 - -
EIA-198-1 - Electronic Components Industry - -
Association - Ceramic Dielectric Capacitors
Classes I, II, III and IV
---------------------- Page: 6 ----------------------
SIST EN IEC 62228-5:2021
IEC 62228-5
Edition 1.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 5: Ethernet transceivers
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-9697-4

Warning! Make sure that you obtained this publication from an authorized distributor.

® Registered trademark of the International Electrotechnical Commission
---------------------- Page: 7 ----------------------
SIST EN IEC 62228-5:2021
– 2 – IEC 62228-5:2021 © IEC 2021
CONTENTS

FOREWORD ........................................................................................................................... 8

1 Scope ............................................................................................................................ 10

2 Normative references .................................................................................................... 10

3 Terms, definitions and abbreviated terms ...................................................................... 11

3.1 Terms and definitions ............................................................................................ 11

3.2 Abbreviated terms ................................................................................................. 12

4 General ......................................................................................................................... 13

5 Test and operating conditions ........................................................................................ 14

5.1 Supply and ambient conditions.............................................................................. 14

5.2 Test operation modes ........................................................................................... 14

5.2.1 General ......................................................................................................... 14

5.2.2 Transceiver configuration for normal operation mode ..................................... 15

5.2.3 Transceiver configuration for low power mode ............................................... 15

5.3 Definition of BIN .................................................................................................... 15

5.4 Test configuration ................................................................................................. 16

5.4.1 General configuration for transceiver network ................................................ 16

5.4.2 General configuration for single transceiver ................................................... 18

5.4.3 Transceiver network tests – coupling ports and networks for conducted

tests .............................................................................................................. 18

5.4.4 Single transceiver tests – coupling ports and networks .................................. 21

5.5 Test communication and signals ........................................................................... 22

5.5.1 General ......................................................................................................... 22

5.5.2 Test signals for normal operation mode ......................................................... 22

5.5.3 Test signals for low power mode .................................................................... 23

5.6 Evaluation criteria ................................................................................................. 23

5.6.1 General ......................................................................................................... 23

5.6.2 Evaluation criteria for functional operation modes .......................................... 23

5.6.3 Evaluation criteria in unpowered condition after exposure to

disturbances .................................................................................................. 24

5.6.4 Status classes ............................................................................................... 25

5.7 DUT specific information ....................................................................................... 26

6 Test and measurement .................................................................................................. 26

6.1 Emission of conducted RF disturbances ................................................................ 26

6.1.1 Test method .................................................................................................. 26

6.1.2 Test setup ..................................................................................................... 26

6.1.3 Test procedure and parameters ..................................................................... 27

6.2 Immunity to conducted RF disturbances ................................................................ 28

6.2.1 Test method .................................................................................................. 28

6.2.2 Test setup ..................................................................................................... 28

6.2.3 Test procedure and parameters ..................................................................... 29

6.3 Immunity to impulses ............................................................................................ 33

6.3.1 Test method .................................................................................................. 33

6.3.2 Test setup ..................................................................................................... 33

6.3.3 Test procedure and parameters ..................................................................... 34

6.4 Electrostatic Discharge (ESD) ............................................................................... 36

6.4.1 Test method .................................................................................................. 36

6.4.2 Test setup ..................................................................................................... 36

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SIST EN IEC 62228-5:2021
IEC 62228-5:2021 © IEC 2021 – 3 –

6.4.3 Test procedure and parameters ..................................................................... 41

7 Test report ..................................................................................................................... 43

Annex A (normative) Ethernet test circuits ........................................................................... 44

A.1 General ................................................................................................................. 44

A.2 Test circuit for Ethernet transceivers for functional tests ....................................... 44

A.3 Test circuit for Ethernet transceivers for ESD test ................................................. 46

Annex B (normative) Test circuit boards............................................................................... 49

B.1 Test circuit board for transceiver network configuration ......................................... 49

B.2 Test circuit board for single transceiver configuration ............................................ 51

Annex C (informative) Test of Ethernet transceiver for radiated RF emission and RF

immunity ............................................................................................................................... 53

C.1 General ................................................................................................................. 53

C.2 General configuration for transceiver network ....................................................... 53

C.3 Tests .................................................................................................................... 54

C.3.1 General ......................................................................................................... 54

C.3.2 Emission of radiated RF disturbances ............................................................ 58

C.3.3 Immunity to radiated RF disturbances ............................................................ 59

Annex D (informative) Examples for test limits for Ethernet transceiver in automotive

application ............................................................................................................................ 63

D.1 General ................................................................................................................. 63

D.2 Emission of conducted RF disturbances ................................................................ 63

D.3 Immunity to conducted RF disturbances ................................................................ 64

D.4 Immunity to impulses ............................................................................................ 68

D.5 Electrostatic discharge (ESD) ............................................................................... 68

D.6 Emission of radiated RF disturbances ................................................................... 69

D.7 Immunity to radiated RF disturbances ................................................................... 70

Annex E (informative) Characterization of common mode chokes for EMC evaluation

of Ethernet transceivers ........................................................................................................ 72

E.1 General ................................................................................................................. 72

E.2 Test ...................................................................................................................... 72

E.2.1 General ......................................................................................................... 72

E.2.2 S-parameter measurement mixed mode ......................................................... 73

E.2.3 ESD damage ................................................................................................. 80

E.2.4 Saturation test at RF disturbances ................................................................. 82

E.2.5 Saturation test at ESD ................................................................................... 85

E.2.6 TDR measurement of differential mode impedance ........................................ 87

Annex F (informative) Characterization of ESD suppression devices for EMC

evaluation of Ethernet transceivers ....................................................................................... 89

F.1 General ................................................................................................................. 89

F.2 Test ...................................................................................................................... 90

F.2.1 General ......................................................................................................... 90

F.2.2 S-parameter measurement mixed mode ......................................................... 91

F.2.3 ESD damage ................................................................................................. 97

F.2.4 ESD discharge current measurement ........................................................... 100

F.2.5 Test of unwanted clamping effect at RF immunity tests ................................ 104

Bibliography ........................................................................................................................ 108

Figure 1 – Minimum MDI interface test network (Min-BIN) ..................................................... 16

Figure 2 – Standard MDI interface test network (Std-BIN) ..................................................... 16

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SIST EN IEC 62228-5:2021
– 4 – IEC 62228-5:2021 © IEC 2021

Figure 3 – Optimized MDI interface test network (Opt-BIN) ................................................... 16

Figure 4 – General test configuration for tests in transceiver network for conducted

tests ..................................................................................................................................... 17

Figure 5 – General test configuration for unpowered ESD test .............................................. 18

Figure 6 – Transceiver network tests – coupling ports and networks ..................................... 19

Figure 7 – Coupling ports and networks for unpowered ESD tests ........................................ 22

Figure 8 – Principle drawing of the maximum deviation on an I-V characteristic .................... 25

Figure 9 – Test setup for measurement of conducted RF disturbances ................................. 27

Figure 10 – Test setup for DPI tests ...................................................................................... 29

Figure 11 – Test setup for impulse immunity tests................................................................. 33

Figure 12 – Test setup for powered ESD tests – principle arrangement................................. 36

Figure 13 – Test setup for powered ESD tests – stimulation and monitoring ......................... 37

Figure 14 – Test setup for unpowered ESD tests – principle arrangement ............................. 38

Figure 15 – Test setup for unpowered ESD tests – stimulation and monitoring for

function validation pre and post ESD test .............................................................................. 40

Figure A.1 – General drawing of the circuit diagram of test network for 100BASE-T1

and 1000BASE-T1 Ethernet transceivers for functional test using conducted test

methods ................................................................................................................................ 45

Figure A.2 – General drawing of the circuit diagram of test network for 100BASE-TX

Ethernet transceivers for functional test using conducted test methods ................................. 46

Figure A.3 – General drawing of the circuit diagram for ESD tests of Ethernet

transceivers in powered mode .............................................................................................. 47

Figure A.4 – General drawing of the circuit diagram for ESD tests of Ethernet

transceivers in unpowered mode ........................................................................................... 48

Figure B.1 – Example of functional conducted test board for Ethernet transceiver ICs

(100BASE-T1) ...................................................................................................................... 49

Figure B.2 – Example of powered ESD test board for Ethernet transceivers ICs

(100BASE-T1) ...................................................................................................................... 50

Figure B.3 – Example of unpowered ESD test board for Ethernet transceivers ICs

(100BASE-T1), top layer ....................................................................................................... 51

Figure B.4 – Example of unpowered ESD test board for Ethernet transceivers ICs

(100BASE-T1), bottom layer ................................................................................................. 51

Figure C.1 – General test configuration for tests in transceiver network used for

radiated tests ........................................................................................................................ 53

Figure C.2 – General drawing of the circuit diagram of test network for 100BASE-T1

and 1000BASE-T1 Ethernet transceivers for functional test using radiated RF test

methods ................................................................................................................................ 55

Figure C.3 – Example of functional radiated test board for Ethernet transceiver ICs

(100BASE-T1), top layer (DUT side) ..................................................................................... 56

Figure C.4 – Example of functional radiated test board for Ethernet transceiver ICs

(100BASE-T1), bottom layer (external circuitry side) ............................................................. 57

Figure C.5 – Test setup for measurement of radiated RF emission ....................................... 58

Figure C.6 – Test setup for radiated RF immunity tests ......................................................... 60

Figure D.1 – Example of limits for conducted RF emission – MDI Opt-BIN, V and
BAT

WAKE ................................................................................................................................... 63

Figure D.2 – Example of limits for conducted RF emission – local supplies ........................... 64

Figure D.3 – Example of limits for conducted RF immunity for functional status

class A – MDI Opt-BIN ...................................................................................................... 65

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SIST EN IEC 62228-5:2021
IEC 62228-5:2021 © IEC 2021 – 5 –
Figure D.4 – Example of limits for conducted RF immunity for functional status

class A – V and WAKE ................................................................................................ 65

IC BAT
Figure D.5 – Example of limits for conducted RF immunity for functional status

class C or D – MDI Opt-BIN ........................................................................................... 67

IC IC
Figure D.6 – Example of limits for conducted RF immunity for functional status

class C or D – V and WAKE .................................................................................... 67

IC IC BAT

Figure D.7 – Example of limits for radiated RF emission for IC stripline with 6,7 mm

active conductor height ......................................................................................................... 69

Figure D.8 – Example of limits for radiated RF immunity ....................................................... 70

Figure E.1 – General electrical drawing of a CMC ................................................................. 72

Figure E.2 – Test setup for S-parameter measurements at CMC ........................................... 73

Figure E.3 – Example of test board 4-port S-parameter measurement at CMC – mixed

mode, top layer ..................................................................................................................... 74

Figure E.4 – Example of test board 3-port S-parameter measurement at CMC – single

ended, top layer .................................................................................................................... 74

Figure E.5 – Recommended characteristics for S , S (RL) for CMC .......................... 77

dd11 dd22

Figure E.6 – Recommended characteristics for S (IL) for CMC....................................... 78

dd21

Figure E.7 – Recommended characteristics for S (CMR) for CMC .................................. 78

cc21

Figure E.8 – Recommended characteristics for S , S (LCL) for CMC ........................ 79

dc11 dc22
Figure E.9 – Recommended characteristics for S , S (DCMR) and S ,
sd21 sd12 ds21

S (CDMR) for CMC ........................................................................................................ 79

ds12

Figure E.10 – Test setup for ESD damage tests at CMC ....................................................... 80

Figure E.11 – Example of ESD test board for CMC, top layer ................................................ 81

Figure E.12 – Test setup for RF saturation measurements at CMC ....................................... 83

Figure E.13 – Example of RF saturation / S-parameter test board for CMC, top layer............ 83

Figure E.14 – Test setup for ESD saturation measurements at CMC ..................................... 85

Figure E.15 – Example of ESD saturation test board for CMC, top layer ............................... 85

Figure E.16 – Example of ESD saturation tests results for CMC ............................................ 87

Figure E.17 – Test setup for TDR measurement at CMC ....................................................... 87

Figure E.18 – Example of TDR test board for CMC, top layer ................................................ 88

Figure F.1 – Arrangement of ESD suppression device within the 100BASE-T1 and

1000BASE-T1 MDI interface ................................................................................................. 90

Figure F.2 – Test setup for S-parameter measurements at ESD suppression device ............. 91

Figure F.3 – Example of test board 4-port S-parameter measurement for ESD

suppression device – mixed mode, top layer ......................................................................... 92

Figure F.4 – Example of test board 3-port S-parameter measurement for ESD

suppression device – single ended, top layer ........................................................................ 92

Figure F.5 – Recommended characteristics for S (RL) for ESD suppression device ....... 95

dd11

Figure F.6 – Recommended characteristics for S (IL) for ESD suppression device ......... 95

dd21
Figure F.7 – Recommended characteristics for S (DCMR) for ESD suppression
sd21

device ................................................................................................................................... 96

Figure F.8 – Test setup for ESD damage tests at ESD suppression device ........................... 97

Figure F.9 – Example of ESD test board for ESD suppression device, top layer .................... 98

Figure F.10 – Test setup for ESD discharge current measurement at ESD suppression

device ................................................................................................................................. 100

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SIST EN IEC 62228-5:2021
– 6 – IEC 62228-5:2021 © IEC 2021
Figure F.11 – Example of ESD discharge current test board for ESD suppression

device, top and bottom layer ............................................................................................... 101

Figure F.12 – Example of test results and recommended limits for remaining ESD

discharge current after the MDI test network for ESD suppression device ........................... 103

Figure F.13 – Test setup for RF clamping te
...

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