SIST EN 61000-4-11:2005
(Main)Electromagnetic compatibility (EMC) -- Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
Electromagnetic compatibility (EMC) -- Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks.
Tests for these networks will be covered by future IEC standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As
also stated in Guide 107, the IEC product committees are responsible for determining whether
this immunity test standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-committees are
prepared to co-operate with product committees in the evaluation of the value of particular
immunity tests for their products.
Elektromagnetische Verträglichkeit (EMV) -- Teil 4-11: Prüf- und Messverfahren - Prüfungen der Störfestigkeit gegen Spannungseinbrüche, Kurzzeitunterbrechungen und Spannungsschwankungen
Compatibilité électromagnétique (CEM) -- Partie 4-11: Techniques d'essai et de mesure - Essais d'immunité aux creux de tension, coupures brèves et variations de tension
La présente partie de la EN 61000 définit les méthodes d'essai d'immunité ainsi que la gamme des niveaux d'essais préférés pour les matériels électriques et électroniques connectés à des réseaux d'alimentation basse tension pour les creux de tension, les coupures brèves et les variations de tension. La présente norme s'applique aux matériels électriques et électroniques dont le courant nominal d'entrée ne dépasse pas 16 A par phase et destinés à être reliés à des réseaux électriques alternatifs de 50 Hz ou 60 Hz. Elle ne s'applique pas aux matériels électriques et électroniques destinés à être reliés à des réseaux électriques à courant alternatif de 400 Hz. Les essais pour ces réseaux seront traités dans des normes CEI à venir. Le but de cette norme est d'établir une référence commune pour l'évaluation de l'immunité fonctionnelle des matériels électriques et électroniques soumis à des creux de tension, à des coupures brèves et à des variations de tension. Cette deuxième édition annule et remplace la première édition parue en 1994 et son amendement 1 (2000). Cette deuxième édition constitue une révision technique dans laquelle 1) des durées et niveaux d'essai préférés pour les différentes classes d'environnement ont été ajoutées ; 2) les essais pour les systèmes triphasés ont été précisés. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI.
Elektromagnetna združljivost (EMC) – 4-11. del: Preskusne in merilne tehnike – Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in napetostnim kolebanjem (IEC 61000-4-11:2004)
Ta del standarda IEC 61000 določa metode preskušanja odpornosti in obseg najprimernejših preskusnih nivojev za električno in elektronsko opremo, ki je priključena na nizkonapetostna električna omrežja za upade napetosti, kratke stike in spremembe napetosti.
Ta standard velja za električno in elektronsko opremo z nazivnim vhodnim tokom, ki ne presega 16 A na fazo, za priključitev na omrežja z izmeničnim napajanjem 50 Hz ali 60 Hz.
Ne uporablja se za električno in elektronsko opremo, za priključitev na omrežja z izmeničnim tokom 400 Hz.
Preskusi za ta omrežja bodo zajeti v prihodnjih standardih Mednarodne elektrotehniške komisije (IEC).
Namen tega standarda je določiti skupno referenco za vrednotenje odpornosti električne in elektronske opreme na upade napetosti, kratke stike in spremembe napetosti.
OPOMBA Preskusi odpornosti pri spremembi napetosti so zajeti v standardu IEC 61000-4-14.
Preskusna metoda, dokumentirana v tem delu standarda IEC 61000, opisuje skladno metodo za oceno odpornosti opreme ali sistema proti opredeljenemu pojavu. To je osnovna objava o elektromagnetni združljivosti, ki jo uporabljajo tehnični odbori v okviru Mednarodne elektrotehniške komisije, kot je opisano v vodilu 107 Mednarodne elektrotehniške komisije. Poleg tega je v vodilu 107 navedeno, da so tehnični odbori v okviru Mednarodne elektrotehniške komisije odgovorni za določitev morebitne uporabe tega standarda s preskusom odpornosti, v primeru uporabe pa so odgovorni za določitev ustreznih preskusnih ravni. Tehnični odbor 77 in njegovi pododbori so pripravljeni za sodelovanje s tehničnimi odbori pri vrednotenju posameznih preskusov odpornosti za ustrezne izdelke.
General Information
Relations
Standards Content (Sample)
SLOVENSKI SIST EN 61000-4-11:2005
STANDARD
junij 2005
Elektromagnetna združljivost (EMC) – 4-11. del: Preskusne in merilne tehnike –
Preskusi odpornosti proti upadom napetosti, kratkotrajnim prekinitvam in
napetostnim kolebanjem (IEC 61000-4-11:2004)
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement
techniques - Voltage dips, short interruptions and voltage variations immunity tests
(IEC 61000-4-11:2004)
ICS 33.100.20 Referenčna številka
SIST EN 61000-4-11:2005(en)
© Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno
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EUROPEAN STANDARD EN 61000-4-11
NORME EUROPÉENNE
EUROPÄISCHE NORM August 2004
ICS 33.100.20 Supersedes EN 61000-4-11:1994 + A1:2001
English version
Electromagnetic compatibility (EMC)
Part 4-11: Testing and measurement techniques -
Voltage dips, short interruptions and voltage variations immunity tests
(IEC 61000-4-11:2004)
Compatibilité électromagnétique (CEM) Elektromagnetische Verträglichkeit (EMV)
Partie 4-11: Techniques d'essai Teil 4-11: Prüf- und Messverfahren -
et de mesure - Prüfungen der Störfestigkeit
Essais d'immunité aux creux de tension, gegen Spannungseinbrüche,
coupures brèves et variations de tension Kurzzeitunterbrechungen
(CEI 61000-4-11:2004) und Spannungsschwankungen
(IEC 61000-4-11:2004)
This European Standard was approved by CENELEC on 2004-06-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-11:2004 E
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EN 61000-4-11:2004 - 2 -
Foreword
The text of document 77A/452/FDIS, future edition 2 of IEC 61000-4-11, prepared by SC 77A, Low
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the
IEC-CENELEC parallel vote and was approved by CENELEC as EN 61000-4-11 on 2004-06-01.
This European Standard replaces EN 61000-4-11:1994 + A1:2001.
It constitutes a technical revision in which
1) preferred test values and durations have been added for the different environment classes;
2) the tests for the three-phase systems have been specified.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2005-03-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2007-06-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-11:2004 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 61000-2-4 NOTE Harmonized as EN 61000-2-4:2002 (not modified).
IEC 61000-4-14 NOTE Harmonized as EN 61000-4-14:1999 (not modified).
__________
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- 3 - EN 61000-4-11:2004
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE Where an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
1)
IEC/TR 61000-2-8 - Electromagnetic compatibility (EMC) - -
Part 2-8: Environment - Voltage dips and
short interruptions on public electric
power supply systems with statistical
measurement results
1)
Undated reference.
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INTERNATIONAL IEC
STANDARD 61000-4-11
Second edition
2004-03
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-11:
Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests
IEC 2004 Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical,
including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
U
Commission Electrotechnique Internationale
International Electrotechnical Commission
Международная Электротехническая Комиссия
For price, see current catalogue
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61000-4-11 IEC:2004 – 3 –
CONTENTS
FOREWORD.5
INTRODUCTION.9
1 Scope.11
2 Normative references.11
3 Terms and definitions .11
4 General.15
5 Test levels.15
6 Test instrumentation.23
7 Test set-up.27
8 Test procedures.29
9 Evaluation of test results.33
10 Test report.35
Annex A (normative) Test circuit details.37
Annex B (informative) Electromagnetic environment classes.43
Annex C (informative) Test instrumentation .45
Bibliography .51
Figure 1 – Voltage dip - Examples .21
Figure 2 – Short interruption.21
Figure 3 – Voltage variation.23
Figure 4 – Phase-to-neutral and phase-to-phase testing on three-phase systems.33
Figure A.1 – Circuit for determining the inrush current drive capability of the short
interruptions generator .39
Figure A.2 – Circuit for determining the peak inrush current requirement of an EUT .41
Figure C.1 – Schematics of test instrumentation for voltage dips, short interruptions
and voltage variations .47
Figure C.2 – Schematic of test instrumentation for three-phase voltage dips, short
interruptions and voltage variations using power amplifier.49
Table 1 – Preferred test level and durations for voltage dips .17
Table 2 – Preferred test level and durations for short interruptions.17
Table 3 – Timing of short-term supply voltage variations.19
Table 4 – Generator specifications .25
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61000-4-11 IEC:2004 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-11 has been prepared by subcommittee 77A: Low
frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility.
This second edition cancels and replaces the first edition published in 1994 and its amendment
1 (2000). This second edition constitutes a technical revision in which
1) preferred test values and durations have been added for the different environment classes;
2) the tests for the three-phase systems have been specified.
It forms part 4-11 of IEC 61000. It has the status of a Basic EMC Publication in accordance
with IEC Guide 107.
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61000-4-11 IEC:2004 – 7 –
The text of this standard is based on the following documents:
FDIS Report on voting
77A/452/FDIS 77A/455/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
2008. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
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61000-4-11 IEC:2004 – 9 –
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards
or as technical specifications or technical reports, some of which have already been published
as sections. Others will be published with the part number followed by a dash and a second
number identifying the subdivision (example: 61000-6-1).
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61000-4-11 IEC:2004 – 11 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-11: Testing and measurement techniques –
Voltage dips, short interruptions and
voltage variations immunity tests
1 Scope
This part of IEC 61000 defines the immunity test methods and range of preferred test levels
for electrical and electronic equipment connected to low-voltage power supply networks for
voltage dips, short interruptions, and voltage variations.
This standard applies to electrical and electronic equipment having a rated input current not
exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks.
It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks.
Tests for these networks will be covered by future IEC standards.
The object of this standard is to establish a common reference for evaluating the immunity of
electrical and electronic equipment when subjected to voltage dips, short interruptions and
voltage variations.
NOTE Voltage fluctuation immunity tests are covered by IEC 61000-4-14.
The test method documented in this part of IEC 61000 describes a consistent method to
assess the immunity of equipment or a system against a defined phenomenon. As described in
IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As
also stated in Guide 107, the IEC product committees are responsible for determining whether
this immunity test standard should be applied or not, and, if applied, they are responsible for
defining the appropriate test levels. Technical committee 77 and its sub-committees are
prepared to co-operate with product committees in the evaluation of the value of particular
immunity tests for their products.
2 Normative references
The following referenced documents are indispensable for the application of this document. For
dated references, only the edition cited applies. For undated references, the latest edition of
the referenced document (including any amendments) applies.
IEC 61000-2-8, Electromagnetic compatibility (EMC) − Part 2-8: Environment − Voltage dips
and short interruptions on public electric power supply systems with statistical measurement
results
3 Terms and definitions
For the purpose of this document, the following terms and definitions apply:
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61000-4-11 IEC:2004 – 13 –
3.1
basic EMC standard
standard giving general and fundamental conditions or rules for the achievement of EMC,
which are related or applicable to all products and systems and serve as reference documents
for product committees
NOTE As determined by the Advisory Committee on Electromagnetic Compatibility (ACEC) – see IEC Guide 107.
3.2
immunity (to a disturbance)
the ability of a device, equipment or system to perform without degradation in the presence of
an electromagnetic disturbance
[IEV 161-01-20]
3.3
voltage dip
a sudden reduction of the voltage at a particular point of an electricity supply system below a
specified dip threshold followed by its recovery after a brief interval
NOTE 1 Typically, a dip is associated with the occurrence and termination of a short circuit or other extreme
current increase on the system or installations connected to it.
NOTE 2 A voltage dip is a two-dimensional electromagnetic disturbance, the level of which is determined by both
voltage and time (duration).
3.4
short interruption
a sudden reduction of the voltage on all phases at a particular point of an electric supply
system below a specified interruption threshold followed by its restoration after a brief interval
NOTE Short interruptions are typically associated with switchgear operations related to the occurrence and
termination of short circuits on the system or on installations connected to it.
3.5
residual voltage (of voltage dip)
the minimum value of r.m.s. voltage recorded during a voltage dip or short interruption
NOTE The residual voltage may be expressed as a value in volts or as a percentage or per unit value relative to
the reference voltage.
3.6
malfunction
the termination of the ability of equipment to carry out intended functions or the execution of
unintended functions by the equipment
3.7
calibration
method to prove that the measurement equipment is in compliance with its specifications
NOTE For the purposes of this standard, calibration is applied to the test generator.
3.8
verification
set of operations which is used to check the test equipment system (e.g. the test generator
and the interconnecting cables) to demonstrate that the test system is functioning within the
specifications given in Clause 6
NOTE 1 The methods used for verification may be different from those used for calibration.
NOTE 2 The verification procedure of 6.1.2 is meant as a guide to insure the correct operation of the test
generator, and other items making up the test set-up that the intended waveform is delivered to the EUT.
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61000-4-11 IEC:2004 – 15 –
4 General
Electrical and electronic equipment may be affected by voltage dips, short interruptions or
voltage variations of power supply.
Voltage dips and short interruptions are caused by faults in the network, primarily short circuits
(see also IEC 61000-2-8), in installations or by sudden large changes of load. In certain cases,
two or more consecutive dips or interruptions may occur. Voltage variations are caused by
continuously varying loads connected to the network.
These phenomena are random in nature and can be minimally characterized for the purpose of
laboratory simulation in terms of the deviation from the rated voltage and duration.
Consequently, different types of tests are specified in this standard to simulate the effects of
abrupt voltage change. These tests are to be used only for particular and justified cases,
under the responsibility of product specification or product committees.
It is the responsibility of the product committees to establish which phenomena among the
ones considered in this standard are relevant and to decide on the applicability of the test.
5 Test levels
The voltages in this standard use the rated voltage for the equipment (U ) as a basis for
T
voltage test level specification.
Where the equipment has a rated voltage range the following shall apply:
− if the voltage range does not exceed 20 % of the lower voltage specified for the rated
voltage range, a single voltage within that range may be specified as a basis for test level
specification (U );
T
− in all other cases, the test procedure shall be applied for both the lowest and highest
voltages declared in the voltage range;
− guidance for the selection of test levels and durations is given in IEC 61000-2-8.
5.1 Voltage dips and short interruptions
The change between U and the changed voltage is abrupt. The step can start and stop at any
T
phase angle on the mains voltage. The following test voltage levels (in % U ) are used: 0 %,
T
40 %, 70 % and 80 %, corresponding to dips with residual voltages of 0 %, 40 %, 70 % and
80 %.
For voltage dips, the preferred test levels and durations are given in Table 1, and an example
is shown in Figure 1a) and Figure 1b).
For short interruptions, the preferred test levels and durations are given in Table 2, and an
example is shown in Figure 2.
The preferred test levels and durations given in Tables 1 and 2 take into account the
information given in IEC 61000-2-8.
The preferred test levels in Table 1 are reasonably severe, and are representative of many real
world dips, but are not intended to guarantee immunity to all voltage dips. More severe dips, for
example 0 % for 1 s and balanced three-phase dips, may be considered by product
committees.
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61000-4-11 IEC:2004 – 17 –
The voltage rise time, t , and voltage fall time, t , during abrupt changes are indicated in
r f
Table 4.
The levels and durations shall be given in the product specification. A test level of 0 %
corresponds to a total supply voltage interruption. In practice, a test voltage level from 0 % to
20 % of the rated voltage may be considered as a total interruption.
Shorter durations in the table, in particular the half-cycle, should be tested to be sure that the
equipment under test (EUT) operates within the performance limits specified for it.
When setting performance criteria for disturbances of 0,5 period duration for products with a
mains transformer, product committees should pay particular attention to effects which may
result from inrush currents. For such products, these may reach 10 to 40 times the rated
current because of magnetic flux saturation of the transformer core after the voltage dip.
Table 1 – Preferred test level and durations for voltage dips
a
Class Test level and durations for voltage dips (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 0 % during 70 % during 25/30 cycles
½ cycle 1 cycle
Class 3 0 % during 0 % during 40 % during 70 % during 80 % during
c c c
½ cycle 1 cycle 10/12 cycles 25/30 cycles 250/300 cycles
b
Class X X X X X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".
Table 2 – Preferred test level and durations for short interruptions
a
Class Test level and durations for short interruptions (t ) (50 Hz/60 Hz)
s
Class 1 Case-by-case according to the equipment requirements
c
Class 2 0 % during 250/300 cycles
c
Class 3 0 % during 250/300 cycles
b
Class X X
a
Classes as per IEC 61000-2-4; see Annex B.
b
To be defined by product committee. For equipment connected directly or indirectly to the public network, the
levels must not be less severe than Class 2.
c
"250/300 cycles" means "250 cycles for 50 Hz test" and "300 cycles for 60 Hz test".
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61000-4-11 IEC:2004 – 19 –
5.2 Voltage variations (optional)
This test considers a defined transition between rated voltage U and the changed voltage.
T
NOTE The voltage change takes place over a short period, and may occur due to change of load.
The preferred duration of the voltage changes and the time for which the reduced voltages are
to be maintained are given in Table 3. The rate of change should be constant; however, the
voltage may be stepped. The steps should be positioned at zero crossings, and should be no
larger than 10 % of U . Steps under 1 % of U are considered as constant rates of change of
T T
voltage.
Table 3 – Timing of short-term supply voltage variations
Voltage test level Time for decreasing Time at reduced Time for increasing
voltage (t ) voltage(t ) voltage (t ) (50 Hz/60 Hz)
d s i
b
70 % Abrupt 1 cycle 25/30 cycles
a a a a
X X X X
a
To be defined by product committee.
b
"25/30 cycles" means "25 cycles for 50 Hz test" and "30 cycles for 60 Hz test".
This shape is the typical shape of a motor starting.
Figure 3 shows the r.m.s. voltage as a function of time. Other values may be taken in justified
cases and shall be specified by the product committee.
U
t (periods)
05 25
IEC 270/04
NOTE The voltage decreases to 70 % for 25 periods. Step at zero crossing.
Figure 1a) – Voltage dip – 70 % voltage dip sine wave graph
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61000-4-11 IEC:2004 – 21 –
U (r.m.s.)
T
100 %
40 %
0 %
t
f t t
s r
IEC 271/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 1b) – Voltage dip – 40 % voltage dip r.m.s. graph
Figure 1 – Voltage dip - Examples
U
T (r.m.s.)
100 %
0 %
t
t
f t
s
r
IEC 272/04
Key
t Voltage rising time
r
t Voltage fall time
f
t Time at reduced voltage
s
Figure 2 – Short interruption
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61000-4-11 IEC:2004 – 23 –
U (r.m.s.)
T
100 %
70 %
0 %
t
d t
s t
i
IEC 273/04
Key
t Time for decreasing voltage
d
t Time for increasing voltage
i
t Time at reduced voltage
s
Figure 3 – Voltage variation
6 Test instrumentation
6.1 Test generator
The following features are common to the generator for voltage dips, short interruptions and
voltage variations, except as indicated.
Examples of generators are given in Annex C.
The generator shall have provision to prevent the emission of heavy disturbances, which, if
injected in the power supply network, may influence the test results.
Any generator creating a voltage dip of equal or more severe characteristics (amplitude and
duration) than that prescribed by the present standard is permitted.
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61000-4-11 IEC:2004 – 25 –
6.1.1 Characteristics and performance of the generator
Table 4 – Generator specifications
Output voltage at no load As required in Table 1, ± 5 % of residual voltage value
Voltage change with load at the output of the generator
100 % output, 0 A to 16 A less than 5 % of U
T
80 % output 0 A to 20 A less than 5 % of U
T
70 % output, 0 A to 23 A less than 5 % of U
T
40 % output, 0 A to 40 A
less than 5 % of U
T
Output current capability 16 A r.m.s. per phase at rated voltage. The generator
shall be capable of carrying 20 A at 80 % of rated value
for a duration of 5 s. It shall be capable of carrying 23 A
at 70 % of rated voltage and 40 A at 40 % of rated
voltage for a duration of 3 s. (This requirement may be
reduced according to the EUT rated steady-state supply
current, see Clause A.3).
Peak inrush current capability (no requirement for Not to be limited by the generator. However, the
voltage variation tests) maximum peak capability of the genera
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