SIST EN 61000-4-15:2011

Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications

IEC 61000-4-15:2010 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with this standard. The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a correction factor can be applied for those other voltages. Some of these correction factors are provided in the Annex B. Detailed specifications for voltages and frequencies other than those given above, remain under consideration. The object of this part of IEC 61000 is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit values of flicker severity. This second edition cancels and replaces the first edition published in 1997 and its Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds or clarifies the definition of several directly measured parameters, so that diverging interpretations are avoided. It has the status of a basic EMC publication in accordance with IEC Guide 107.  NEW! IEC 61000-4-15:2010 is also available as IEC Standards+ 61000-4-15:2010 which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

Elektromagnetische Verträglichkeit (EMV) - Teil 4-15: Prüf- und Messverfahren - Flickermeter - Funktionsbeschreibung und Auslegungsspezifikation

Compatibilité électromagnétique (CEM) - Partie 4-15: Techniques d'essai et de mesure - Flickermètre - Spécifications fonctionnelles et de conception

La CEI 61000-4-15:2010 traite des spécifications fonctionnelles et de conception d'un appareil mesurant le flicker, destiné à indiquer le niveau correct de perception du flicker du flux lumineux (le flicker) pour toutes les formes d'ondes de fluctuation de la tension rencontrées dans la pratique. On y présente des informations permettant de construire un tel instrument. Une méthode d'évaluation de la sévérité du flicker est fournie à partir des résultats obtenus avec des flickermètres en conformité avec cette norme. Les spécifications du flickermètre dans cette partie concernent uniquement les mesures des entrées de 120 V et 230 V, 50 Hz et 60 Hz. Les caractéristiques de certaines lampes à incandescence pour d'autres tensions sont suffisamment similaires aux valeurs des Tableaux 1 et 2 pour que l'utilisation d'un facteur de correction puisse être appliquée à ces autres tensions. Certains de ces facteurs de correction sont fournis à l'Annexe B. Des spécifications détaillées pour des tensions et des fréquences autres que celles données ci-dessus sont à l'étude. L'objet de la présente partie de la CEI 61000 est de fournir les informations nécessaires à la conception et à la réalisation d'un flickermètre analogique ou numérique. Elle ne spécifie pas les valeurs limites tolérables du flicker. Cette deuxième édition annule et remplace la première édition publiée en 1997 et son amendement 1 (2003), et constitue une révision technique. Cette nouvelle édition, en particulier, ajoute ou clarifie la définition de plusieurs paramètres mesurés directement, de telle façon que l'on évite des interprétations divergentes. Elle a le statut de publication fondamentale en CEM en accord avec le Guide 107 de la CEI.  NEW! La CEI 61000-4-15:2010 est également disponible sous forme de IEC Standards+ 61000-4-15:2010 qui contient la Norme internationale et sa version Redline, illustrant les modifications du contenu technique depuis l'édition précédente.

Elektromagnetna združljivost (EMC) - 4-15. del: Preskusne in merilne tehnike - Flikermeter - Specifikacije funkcij in zasnove (IEC 61000-4-15:2010 (EQV))

Ta del IEC 61000 podaja specifikacije funkcij in zasnove za aparat za merjenje flikerja, ki kaže pravilno raven zaznavanja flikerja pri vseh praktičnih valovnih oblikah nihanja napetosti. Informacije so navedene zato, da se omogoči izdelava takega instrumenta. Podana je metoda za vrednotenje intenzitete flikerja na osnovi izhodnih signalov flikermetrov, ki so v skladu s tem standardom. Specifikacije flikermetrov v tem delu IEC 61000 se nanašajo samo na meritve pri vhodnih napetostih 120 V in 230 V ter frekvencah 50 Hz in 60 Hz. Značilnosti nekaterih svetilk z žarilno nitko za druge napetosti so dovolj podobne vrednostim v preglednici 1 in 2, tako da se lahko pri teh napetostih uporabi korekcijski faktor. Nekateri od teh korekcijskih faktorjev so navedeni v dodatku B. Podrobne specifikacije za napetosti in frekvence, ki niso navedene zgoraj, se še obravnavajo. Namen tega dela IEC 61000 je zagotoviti osnovne informacije za načrtovanje, izdelavo in uporabo analognih ali digitalnih aparatov za merjenje flikerja. Ne navaja tolerančnih mejnih vrednosti za intenzivnost flikerja.

General Information

• Status: Published
• Publication Date: 03-Aug-2011
• ICS: 33.100.01 - Electromagnetic compatibility in general
• Technical Committee: EMC - Electromagnetic compatibility
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 07-Jul-2011
• Due Date: 11-Sep-2011
• Completion Date: 04-Aug-2011
• Directive: 2004/108/EC - Directive 2004/108/EC of the European Parliament and of the Council of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Directive: 2014/30/EU - Directive 2014/30/EU of the European Parliament and of the Council of 26 February 2014 on the harmonisation of the laws of the Member States relating to electromagnetic compatibility (recast)
• Mandate: M/490 - Standardisation mandate to the European Standardisation Organisations (ESOs) to support European Smart Grid deployment
• Ref Project: EN 61000-4-15:2011 - Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications

Relations

• Replaces: SIST EN 61000-4-15:2001/A1:2003 - Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications
• Effective Date: 29-Jan-2023
• Replaces: SIST EN 61000-4-15:2001 - Electromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications
• Effective Date: 07-Jun-2022

Overview

EN 61000-4-15:2011 (equivalent to IEC 61000-4-15:2010) is the CLC/CENELEC European adoption that defines the functional and design specifications for flickermeters - instruments used to quantify the perceptibility of light flicker caused by voltage fluctuations. This standard specifies how to measure and evaluate flicker severity for practical voltage fluctuation waveforms, and provides guidance to construct analogue or digital flickermeters. It is a basic EMC publication and clarifies directly measured parameters to avoid divergent interpretations.

Key topics and technical requirements

• Scope and reference voltages: Measurement methodology is specified for 120 V and 230 V inputs at 50 Hz and 60 Hz. Correction factors for other voltages are given (Annex B); wider voltage/frequency coverage is under consideration.
• Instrument functional blocks: Defines essential components such as the input voltage adaptor, squaring multiplier, weighting filters, squaring & smoothing, and on-line statistical analysis.
• Weighting and filters: Detailed weighting filter responses and filter characteristics that model human flicker perception.
• Signal processing elements: Includes requirement descriptions for squaring multipliers, sliding mean filters, and the algorithmic steps used before statistical evaluation.
• Outputs and metrics: Specifies flickermeter outputs and indicators including Plin, Pinst, Pst (short-term flicker indicator), Plt (long-term flicker indicator) and d-meter outputs.
• Statistical evaluation: Procedures for short-term and long-term flicker evaluation based on on-line statistical analysis of processed signals.
• Type testing and performance tests: Test suites for sinusoidal and rectangular voltage changes, combined frequency/voltage changes, distorted voltages with multiple zero crossings, harmonic sideband modulation, phase jumps, and other specific performance cases (Class F1 requirements where applicable).
• Environmental and compliance: Requirements for insulation, climatic, EMC and other environmental tests; normative and informative annexes include accuracy techniques, lamp parameter tables, and sample type-test protocols.
• Limitation note: The standard provides measurement and design specifications; it does not define tolerance limit values for flicker severity (those are in related limits standards).

Applications

• Design and manufacture of flickermeters and flicker-measurement systems.
• EMC and electrical testing laboratories performing flicker measurement and type testing.
• Power utilities and network operators assessing voltage fluctuations and customer perceptibility complaints.
• Electrical equipment manufacturers validating how devices affect supply flicker.
• Research in human visual perception of flicker and lighting compatibility.

Who should use this standard

• EMC engineers, test lab managers, device designers, utility engineers, standards compliance officers, and manufacturers of measurement instruments.

Related standards (brief)

• EN/IEC 61000-3-3 and EN/IEC 61000-3-11 (limits for voltage changes, fluctuations and flicker in public low-voltage systems)
• IEC 61000-4-30 (see Bibliography note for harmonization on measurement methods)

Keywords: EN 61000-4-15, IEC 61000-4-15, flickermeter, flicker measurement, EMC, voltage fluctuations, Pst, Plt, flicker severity.

Standards Content (Sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Elektromagnetna združljivost (EMC) - 4-15. del: Preskusne in merilne tehnike - Flikermeter - Specifikacije funkcij in zasnove (IEC 61000-4-15:2010 (EQV))Compatibilité électromagnétique (CEM) - Partie 4-15: Techniques d'essai et de mesure - Flickermètre - Spécifications fonctionnelles et de conceptionElectromagnetic compatibility (EMC) - Part 4-15: Testing and measurement techniques - Flickermeter - Functional and design specifications33.100.01Elektromagnetna združljivost na splošnoElectromagnetic compatibility in generalICS:Ta slovenski standard je istoveten z:EN 61000-4-15:2011SIST EN 61000-4-15:2011en01-september-2011SIST EN 61000-4-15:2011SLOVENSKI
STANDARDSIST EN 61000-4-15:2001/A1:2003SIST EN 61000-4-15:20011DGRPHãþD

EUROPEAN STANDARD EN 61000-4-15 NORME EUROPÉENNE
EUROPÄISCHE NORM June 2011
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-15:2011 E
ICS 33.100.20 Supersedes EN 61000-4-15:1998 + A1:2003
English version
Electromagnetic compatibility (EMC) -
Part 4-15: Testing and measurement techniques -
Flickermeter -
Functional and design specifications (IEC 61000-4-15:2010)
Compatibilité électromagnétique (CEM) - Partie 4-15: Techniques d'essai et de mesure -
Flickermètre -
Spécifications fonctionnelles et de conception (CEI 61000-4-15:2010)
Elektromagnetische Verträglichkeit (EMV) -
Teil 4-15: Prüf- und Messverfahren -
Flickermeter -
Funktionsbeschreibung und Auslegungsspezifikation (IEC 61000-4-15:2010)
This European Standard was approved by CENELEC on 2011-01-02. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
at national level by publication of an identical
national standard or by endorsement
(dop)
2011-10-02 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow)
2014-01-02 Annex ZA has been added by CENELEC. __________ Endorsement notice The text of the International Standard IEC 61000-4-15:2010 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: IEC 61000-4-30 NOTE
Harmonized as EN 61000-4-30. __________ SIST EN 61000-4-15:2011

- 3 - EN 61000-4-15:2011 Annex ZA
(normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 60068 Series Environmental testing EN 60068 Series
IEC 61000-3-3 - Electromagnetic compatibility (EMC) – Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection EN61000-3-3 -
IEC 61000-3-1 - Electromagnetic compatibility (EMC) -
Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - Equipment with rated current ≤ 75 A and subject to conditional connection EN 61000-3-11 -
IEC 61010-1 - Safety requirements for electrical equipment for measurement, control and laboratory use - Part 1: General requirements EN 61010-1 -
IEC 61326-1 - Electrical equipment for measurement, control and laboratory use - EMC requirements -
Part 1: General requirements EN 61326-1 -
IEC 61000-4-15Edition 2.0 2010-08INTERNATIONAL STANDARD NORME INTERNATIONALEElectromagnetic compatibility (EMC) –
Part 4-15: Testing and measurement techniques – Flickermeter – Functional
and design specifications
Compatibilité électromagnétique (CEM) –
Partie 4-15: Techniques d’essai et de mesure – Flickermètre – Spécifications fonctionnelles et de conception
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE XICS 33.100.20 PRICE CODECODE PRIXISBN 978-2-88912-076-5BASIC EMC PUBLICATION PUBLICATION FONDAMENTALE EN CEM® Registered trademark of the International Electrotechnical Commission
– 2 – 61000-4-15 © IEC:2010 CONTENTS FOREWORD.4 INTRODUCTION.6 1 Scope and object.7 2 Normative references.7 3 Parameters and symbols.8 3.1 Directly measured parameters and characteristics.8 3.1.1 General.8 3.1.2 Half period rms value of the voltage.8 3.1.3 Half period rms value characteristics.8 3.1.4 Relative half period rms value characteristics.8 3.1.5 Steady state voltage and voltage change characteristics.8 3.1.6 Steady state voltage change.9 3.1.7 Maximum voltage change during a voltage change characteristic.9 3.1.8 Maximum steady state voltage change during an observation period.9 3.1.9 Maximum absolute voltage change during an observation period.10 3.1.10 Voltage deviation.10 3.1.11 Centre voltage.10 3.2 Symbols.10 4 Description of the instrument.11 4.1 General.11 4.2 Block 1 – Input voltage adaptor.11 4.3 Block 2 – Squaring multiplier.11 4.4 Block 3 – Weighting filters.12 4.5 Block 4 – Squaring and smoothing.12 4.6 Block 5 – On-line statistical analysis.12 4.7 Outputs.13 4.7.1 General.13 4.7.2 Plin output.13 4.7.3 Pinst output.13 4.7.4 Pst output.13 4.7.5 Plt output.13 4.7.6 d-meter outputs.13 5 Specification.13 5.1 Response and accuracy.13 5.2 Input voltage ranges.18 5.3 Voltage adaptor.18 5.4 Weighting filters.18 5.5 Weighting filter response in block 3.18 5.6 Squaring multiplier and sliding mean filter.19 5.7 General statistical analysis procedure.19 5.7.1 General.19 5.7.2 Short-term flicker evaluation.19 5.7.3 Long-term flicker evaluation.20 6 Flickermeter tests.20 6.1 General.20 6.2 Sinusoidal/rectangular voltage changes.21 SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 3 – 6.3 Rectangular voltage changes and performance testing.21 6.4 Combined frequency and voltage changes – Class F1 flickermeters.22 6.5 Distorted voltage with multiple zero crossings – Class F1 flickermeters.23 6.6 Bandwidth test using harmonic and inter-harmonic side band modulation.23 6.7 Phase jumps – Class F1 flickermeters.24 6.8 Rectangular voltage changes with 20 % duty cycle.24 6.9 d
parameter test, dc, dmax, and d(t) > 3,3%.25 7 Environmental and other requirements.27 7.1 General.27 7.2 Insulation, climatic, electromagnetic compatibility, and other tests.27 Annex A (normative)
Techniques to improve accuracy of flicker evaluation.30 Annex B (informative)
Meaning of ΔU/U and number of voltage changes, dc, d(t), dmax examples.32 Annex C (informative)
Sample protocols for type testing.36 Bibliography.40
Figure 1 – Illustration of 28 Hz modulated test voltage with 20 % duty cycle.25 Figure 2 – Functional diagram of IEC flickermeter.28 Figure 3 – Basic illustration of the time-at-level method for Pst = 2,000.29 Figure B.1 – Rectangular voltage change ΔU/U = 40 %, 8,8 Hz, 17,6 changes/second.33 Figure B.2 – Illustration of “d” parameter definitions.35
Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for sinusoidal voltage fluctuations.14 Table 1b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for sinusoidal voltage fluctuations.15 Table 2a – Normalized flickermeter response 120 V / 50 Hz
and 120 V / 60 Hz for rectangular voltage fluctuations.16 Table 2b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for rectangular voltage fluctuations.17 Table 3 – Indicative values for the parameters of lamps.19 Table 4 – Test specifications for flickermeter.21 Table 5 – Test specification for flickermeter classifier.22 Table 6 – Test specification for combined frequency and voltage changes – Class F1 flickermeters.23 Table 7 – Test specification for distorted voltage with multiple zero crossings – Class F1 flickermeters.23 Table 8 – 8,8 Hz modulation depth for distorted voltage test – Class F 1 flickermeters.23 Table 9 – Test specification for Harmonics with side band – Class F1 flickermeters.24 Table 10 – Test specification for phase jumps – Class F1 flickermeters.24 Table 11 – Test specification for rectangular voltage changes with duty ratio.24 Table 12 – Test specification for dc, dmax, t(d(t)) > 3,3 %.25 Table 13 – Test specification for dc, dmax, t(d(t)) > 3,3 %.26 Table B.1 – Correction factor for other voltage/frequency combinations.33 SIST EN 61000-4-15:2011

– 4 – 61000-4-15 © IEC:2010 INTERNATIONAL ELECTROTECHNICAL COMMISSION ____________
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61000-4-15 has been prepared by subcommittee 77A: Low frequency phenomena, of IEC technical committee 77: Electromagnetic compatibility. IEC 61000-4-15 is based on work by the “Disturbances” Working Group of the International Union for Electroheat (UIE), on work of the IEEE, and on work within IEC itself. It forms part 4-15 of the IEC 61000 series. It has the status of a basic EMC publication in accordance with IEC Guide 107. This second edition cancels and replaces the first edition published in 1997 and its Amendment 1 (2003) and constitutes a technical revision. This new edition, in particular, adds or clarifies the definition of several directly measured parameters, so that diverging interpretations are avoided. SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 5 – The text of this standard is based on the following documents: FDIS Report on voting 77A/722/FDIS 77A/730/RVD
Full information on the voting for the approval of this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61000 series, under the general title Electromagnetic compatibility (EMC) can be found on the IEC website. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be
• reconfirmed, • withdrawn, • replaced by a revised edition, or • amended.
– 6 – 61000-4-15 © IEC:2010 INTRODUCTION IEC 61000-4 is a part of the IEC 61000 series, according to the following structure: Part 1: General
General consideration (introduction, fundamental principles)
Definitions, terminology Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product committees) Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices Part 6: Generic standards Part 9: Miscellaneous Each part is further subdivided into several parts, published either as international standards, as technical specifications or technical reports, some of which have already been published as sections. Others are and will be published with the part number followed by a dash and completed by a second number identifying the subdivision (example: IEC 61000-6-1). SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –
Part 4-15: Testing and measurement techniques –
Flickermeter – Functional and design specifications
1 Scope and object This part of IEC 61000 gives a functional and design specification for flicker measuring apparatus intended to indicate the correct flicker perception level for all practical voltage fluctuation waveforms. Information is presented to enable such an instrument to be constructed. A method is given for the evaluation of flicker severity on the basis of the output of flickermeters complying with this standard. The flickermeter specifications in this part of IEC 61000 relate only to measurements of 120 V and 230 V, 50 Hz and 60 Hz inputs. Characteristics of some incandescent lamps for other voltages are sufficiently similar to the values in Table 1 and Table 2, that the use of a correction factor can be applied for those other voltages. Some of these correction factors are provided in the Annex B. Detailed specifications for voltages and frequencies other than those given above, remain under consideration. The object of this part of IEC 61000 is to provide basic information for the design and the instrumentation of an analogue or digital flicker measuring apparatus. It does not give tolerance limit values of flicker severity. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60068 (all parts), Environmental testing IEC 61000-3-3, Electromagnetic compatibility (EMC) – Part 3-3: Limits – Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection IEC 61000-3-11, Electromagnetic compatibility (EMC) – Part 3-11: Limits – Limitation of voltage changes, voltage
fluctuations and flicker in public low-voltage supply systems – Equipment with rated current ≤75 A and subject to conditional connection IEC 61010-1, Safety requirements for electrical equipment for measurement, control, and lab- oratory use – Part 1: General requirements IEC 61326-1, Electrical equipment for measurement, control and laboratory use – EMC requirements – Part 1: General requirements SIST EN 61000-4-15:2011

– 8 – 61000-4-15 © IEC:2010 3 Parameters and symbols 3.1 Directly measured parameters and characteristics 3.1.1 General The examples in Figure B.2a, Figure B.2b, Figure B.2c and Figure B.2d are intended to assist flickermeter manufacturers with the correct implementation for the determination of the parameters specified in this clause. 3.1.2 Half period rms value of the voltage Uhp Is the rms voltage of the mains supply voltage, determined over a half period, between consecutive zero crossings of the fundamental frequency voltage. 3.1.3 Half period rms value characteristics Uhp(t) Are the characteristics versus time of the half period rms value, determined from successive Uhp values, see also the examples in Annex B. 3.1.4 Relative half period rms value characteristics dhp(t) The characteristics versus time of the half period rms values expressed as a ratio of the nominal voltage Un. dhp(t) = Uhp(t)/Un 3.1.5 Steady state voltage and voltage change characteristics This subclause defines the evaluation of half cycle rms voltage values over time. Two basic conditions are recognized, being periods where the voltage remains in steady state and periods where voltage changes occur. A steady state condition exists when the voltage Uhp remains within the specified tolerance band of ±0,2 % for a minimum of 100/120 half cycles (50 Hz/60 Hz) of the fundamental frequency. At the beginning of the test, the average rms voltage, as measured during the last second preceding the test observation period, shall be used as the starting reference value for dc, and dhp(t) calculations, as well as for the purpose of dmax, and d(t) measurements. In the event that no steady state condition during given tests is established, the parameter dc shall be reported to be zero. As the measurement during a test progresses, and a steady state condition remains present, the sliding 1 s average value Uhp_avg of Uhp is determined, i.e. the last 100 (120 for 60 Hz) values of Uhp are used to compute Uhp_avg. This value Uhp_avg is subsequently used to determine whether or not the steady state condition continues, and it is also the reference for dc and dmax determination in the event that a voltage change occurs. For the determination of a new steady state condition “icd” after a voltage change has occurred, a first value dstart_i = dhp(t = tstart) is used. Around this value a tolerance band of ±0,002 Un (±0,2 % of Un) is determined. The steady state condition is considered to be present if Uhp(t) does not leave the tolerance band for 100 half consecutive periods (120 for 60 Hz) of the fundamental frequency. SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 9 – NOTE The use of this Uhp-avg parameter prevents that very slowly changing line voltages trigger a dc or dmax evaluation, while minimizing deviations of up to 0,4 % of Un ( + and – 0,2 %) between two measuring instruments. The steady state condition ends when a subsequent value Uhp(t = tx) exceeds the tolerance band: dhp(t = tx) > dhp_avg +0,002 or dhp(t = tx) < dhp_avg –0,002. The last value within the tolerance band, is denoted as)(1hpend−==xttddi. The value )(hpxttd= is used as the starting value for the determination of the next steady state condition )(11start++=iiddc. If any value dhp(t > tx) fails the tolerance band prior to the required 100/120 half periods for establishing steady state, this new Uhp is used as the starting value for the determination of the next steady state condition 1+icd. Thus, a new steady state condition is present the instant Uhp_avg can be determined. 3.1.6 Steady state voltage change dci Is the value of the difference between two successive steady state values, normally expressed as a percent of Un, i.e. dendi−1 − dstart. The polarity of change(s) in steady state condition(s) shall be indicated. As follows from the above formula, if the voltage decreases during a change characteristic, the resulting dc value will be positive. If the voltage increases during a change characteristic the resulting dc value will be negative. 3.1.7 Maximum voltage change during a voltage change characteristic idmax The absolute value of the maximum difference between the last steady state condition 1end−id and following dhp(t) values, observed during a voltage change characteristic, normally expressed as a percent of Un. dmaxi = max (dend i-1 – dhp(t)) The idmax evaluation ends as soon as a new steady state condition is established, or at the end of the observation period. The polarity of change(s) shall be indicated. As follows from the above formula, if the maximum voltage deviation is observed during a reduction in voltage versus 1end−idthe resulting idmax value will be positive. If the maximum voltage deviation is observed during a voltage increase with respect to the previous 1end−id
the resulting idmax value will be negative. 3.1.8 Maximum steady state voltage change during an observation period dc The highest absolute value of all icdvalues, observed during an observation period, is called dc. )(maxicicdd= SIST EN 61000-4-15:2011

– 10 – 61000-4-15 © IEC:2010 3.1.9 Maximum absolute voltage change during an observation period dmax The highest absolute value of all idmaxvalues, observed during an observation period, is called dmax. )(maxmaxmaxiddi=|
3.1.10 Voltage deviation d(t) The deviation of actual dhp(t) from the previous 1end−idinside a voltage change characteristic is called d(t), and is expressed as a percentage of Un. )()(hpend1tddtdi−=− Polarity is optional. If polarity is shown, a voltage drop is considered to be a positive value. NOTE The d(t) limit evaluation in IEC 61000-3-3 with the maximum permitted limit of 3,3 % for up to 500 ms is generally intended to evaluate the inrush current pattern of the equipment under test. Thus, as soon as a new Uhp_avg is established, the d(t) evaluation is ended. When a new voltage change occurs, a new d(t) evaluation is started. The maximum duration that d(t) exceeds the 3,3 % limit value for any of the individual d(t) evaluations during the observation period, is used for the comparison against the 500 ms limit, and is reported for the test.
3.1.11 Centre voltage Uc The voltage around which the modulation pattern is centered, such as required for the classifier test method, or periodic calibration tests in 6.3, Table 5. 3.2 Symbols Tshort short term interval for the Pst evaluation NOTE Unless otherwise specified, the short-term interval Tshort is 10 min. Pst short-term flicker severity NOTE Unless otherwise specified, the Pst evaluation time is 10 min. For the purpose of power quality surveys and studies, other time intervals may be used, and should be defined in the index. For example a 1 min interval should be written as Pst,1m. Tlong long-term time interval for the Plt evaluation, which is always an integer multiple of the short term flicker severity evaluation Pst. NOTE Unless otherwise specified, the long-term interval Tlong is 12 × 10 min, i.e. 2 h. For the purpose of power quality surveys and studies other time intervals may be used. Plt long-term flicker severity 313ltstNPPNii∑== where Psti (i = 1, 2, 3, .) are consecutive readings of the short-term severity Pst. NOTE Unless otherwise specified, Plt is calculated over discrete Tlong periods. Each time a Tlong period has expired, a new Plt calculation is started. SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 11 – Pinst instantaneous flicker sensation NOTE In previous editions of this standard this output was called "Output 5". Pinst,max peak value of the instantaneous flicker sensation Pinst measured during the observation period Plin demodulated voltage change signal, after passing through block 3 of the flickermeter Uhp half period rms value of the voltage Uhp-avg sliding 1 s average of Uhp Uc centre voltage dhp ralative half period rms value of the voltage dc maximum steady state voltage change during an observation period d(t) voltage deviation dmax maximum absolute voltage change during the observation period
4 Description of the instrument 4.1 General The description below is based on a digital implementation of the flickermeter. Analogue implementations are allowed provided they deliver the same results. For the purpose of compliance testing and power quality surveys the results obtained with a digital instrument, complying with this standard, are definitive. The flickermeter architecture is described by the block diagram of Figure 2. It can be divided into two parts, each performing one of the following tasks: – simulation of the response of the lamp-eye-brain chain; – on-line statistical analysis of the flicker signal and presentation of the results. The first task is performed by blocks 2, 3 and 4 as illustrated in Figure 2, while the second task is accomplished by block 5. 4.2 Block 1 – Input voltage adaptor This block contains a voltage adapting circuit that scales the input mains frequency voltage to an internal reference level as defined in 5.3. This method permits flicker measurements to be made, independently of the actual input carrier voltage level and may be expressed as a per cent ratio. 4.3 Block 2 – Squaring multiplier The purpose of this block is to recover the voltage fluctuation by squaring the input voltage scaled to the reference level, thus simulating the behavior of a lamp. NOTE This multiplier, together with the Butterworth filter in block 3, operates as a demodulator. SIST EN 61000-4-15:2011

– 12 – 61000-4-15 © IEC:2010 4.4 Block 3 – Weighting filters Block 3 is composed of a cascade of two filters, which can precede or follow the selective filter circuit. The first low-pass filter eliminates the double mains frequency ripple components of the demodulator output. The high pass filter (first order, −3 dB at 0,05 Hz) can be used to eliminate any d.c. voltage component. The values in the calibration Tables 1a and 1b and Tables 2a and 2b, and the performance test Table 5, include the effect of this HP filter with the 0,05 Hz corner frequency. The second filter is a weighting filter block that simulates the frequency response of the human visual system to sinusoidal voltage fluctuations of a coiled filament gas-filled lamp (60 W / 230 V and/or 60 W / 120 V). NOTE 1 The response function is based on the perceptibility threshold found at each frequency by 50 % of the persons tested. NOTE 2 A reference filament lamp for 100 V systems would have a different frequency response and would require a corresponding adjustment of the weighting filter. The characteristics of discharge and LED lamps are totally different, and substantial modifications to the calibration tables in this standard would be necessary if they were taken into account. Correction factors for several common voltage/frequency combinations are given in Clause B.2. NOTE 3 Block 3 alone is based on the borderline perceptibility curve for sinusoidal voltage fluctuations; the correct weighting of non-sinusoidal and arbitrary voltage fluctuations is achieved by an appropriate choice of the complex transfer function for blocks 3 and 4. Accordingly, the correct performance of the model has also been checked with periodic rectangular signals as well as with transient signals. Some of these signals are illustrated in the Annex B. 4.5 Block 4 – Squaring and smoothing Block 4 is composed of a squaring multiplier and a first order low-pass filter. The human flicker perception, by the eye and brain combination, of voltage fluctuations applied to the reference lamp, is simulated by the combined non-linear response of blocks 2, 3 and 4. The output of block 4 represents the instantaneous flicker sensation Pinst. 4.6 Block 5 – On-line statistical analysis Block 5 performs an on-line analysis of the flicker level, thus allowing direct calculation of significant evaluation parameters. A suitable interface, either with analog signals or digital data transfer, allows data presentation and recording. The purpose of this block is to derive flicker severity indications by means of statistical analysis. This statistical analysis, performed on-line through block 5, shall be made by sampling the instantaneous flicker signal level and subdividing these samples into a suitable number of classes. Every time that the applicable value occurs, the counter of the corresponding class is incremented by one. In this way, the frequency distribution function of the Pinst values is obtained. By choosing a sufficiently high sampling frequency, the final result at the end of the measuring interval represents the distribution of flicker level duration in each class. Adding the content of the counters of all classes and expressing the count of each class relative to the total gives the probability density function of the flicker levels. From this function the cumulative probability function is obtained, which in turn is used in the time-at-level statistical method. Figure 3 schematically represents the statistical analysis method, limited for simplicity to only 15 classes in the Pst calculation for a performance test using the modulation setting of 1,788 % (i.e. factor k = 2 ) at 39 CPM (0,325 Hz), for a target Pstvalue of 2,000 as defined in 6.2 and Table 5 for 230 V/50 Hz. SIST EN 61000-4-15:2011

61000-4-15 © IEC:2010 – 13 – From the cumulative probability function, significant statistical values can be obtained such as mean, standard deviation, flicker level being exceeded for a given percentage of time or, alternatively, the percentage of time that an assigned flicker level has been exceeded. For on-line processing, immediately after the conclusion of each short time interval, the statistical analysis of the next interval is started and the results for the just completed interval are made available for output. In this way, n short time analyses will be available for a given observation period Tlong together with the results for the total interval. 4.7 Outputs 4.7.1 General The flickermeter diagram in Figure 2 shows a number of mandatory outputs. The outputs marked with an asterisk are optional, and allow full exploitation of the instrument’s potential for the investigation of voltage fluctuations. Further optional outputs may be considered. 4.7.2 Plin output Plin output is optional and mainly intended for flicker minimization purposes. This output is proportional to the input voltage changes. 4.7.3 Pinst output This output, formerly called output 5, is mandatory. It represents the instantaneous flicker sensation and can be recorded for later processing. It shall be provided as an analogue signal or via a digital interface. For tests of Tables 1 and 2, the maximum value of Pinst is observed. 4.7.4 Pst output The Pst output in block 5 is mandatory. 4.7.5 Plt output The Plt output is mandatory. 4.7.6 d-meter outputs For compliance tests according to IEC 61000-3-3 or IEC 61000-3-11, it is necessary that the directly measured parameters dc, dmax, and d(t) are available. These dc, dmax, and d(t) parameters are not mandatory for the purpose of short term or long term flicker evaluation. The parameter Uhp is not required for any compliance testing or flicker evaluation, but might be necessary for calibration purposes. Outputs – either in analog signal or digital data format – shall be provided for dc, dmax, and d(t), and it is recommended that an output for Uhp is also available. 5 Specification 5.1 Response and accuracy The overall response from the instrument input to the output of block 4 is given in Tables 1 and 2 for sinusoidal and rectangular voltage fluctuations at 50 Hz, respectively 60 Hz. One unit output from block 4 corresponds to the reference human flicker perceptibility threshold. The response is centered at 8,8 Hz for sinusoidal modulation. Tables 1 and 2 give values for 120 V and 230 V, and 50 Hz and 60 Hz systems. The required accuracy for the instrument from input to output of Block 4 is achieved if the measured Pinst values for the specified sine and square-wave modulations, with a modulation SIST EN 61000-4-15:2011

– 14 – 61000-4-15 © IEC:2010 phase relationship as shown in Annex B, are within ±8 % of one unit of perceptibility for the specified operating ranges and frequencies of the flickermeter. The bold printed entries in Tables 1 and 2 show mandatory test points. The manufacturer shall specify the voltage and frequency ranges for which the flickermeter is intended to be used. Table 1a – Normalized flickermeter response 120 V / 50 Hz and 120 V / 60 Hz for sinusoidal voltage fluctuations (input relative voltage fluctuation ΔU/U for one unit of perceptibility at Pinst output) Voltage fluctuation ΔU/U
% Voltage fluctuation ΔU/U
% Hz 120 V lamp 60 Hz system 120 V lamp 50 Hz system Hz 120 V lamp 60 Hz system 120 V lamp 50 Hz system 0,5 2,453 2,453 10,0 0,341 0,341 1,0 1,465 1,465 10,5 0,355 0,355 1,5 1,126 1,126 11,0 0,373 0,373 2,0 0,942 0,942 11,5 0,394 0,394 2,5 0,815 0,815 12,0 0,417 0,417 3,0 0,717 0,717 13,0 0,469 0,469 3,5 0,637 0,637 14,0 0,528 0,528 4,0 0,570 0,570 15,0 0,592 0,592 4,5 0,514 0,514 16,0 0,660 0,660 5,0 0,466 0,466 17,0 0,734 0,734 5,5 0,426 0,426 18,0 0,811 0,811 6,0 0,393 0,393 19,0 0,892 0,892 6,5 0,366 0,366 20,0 0,977 0,978 7,0 0,346 0,346 21,0 1,067 1,068 7,5 0,332 0,332 22,0 1,160 1,162 8,0 0,323 0,323 23,0 1,257 1,261 8,8 0,321 0,321 24,0 1,359 1,365 9,5 0,329 0,329 25,0 1,464 1,476
33 1/3 2,570 3,111
40,0 4,393
For the purpose of type testing, the bold printed entries in Table 1a are mandatory. The other points are optional. The bold printed points are selected to be at or close to the inflection points, and along important points on the normalized flicker response curve. Flicker meter manufacturers may test the product for all entries in Table 1a, but this is not mandatory for type testing or instrument verification.
NOTE Because of the different response of 50 Hz and 60 Hz systems, the mandatory verification point frequencies differ slightly. The modulation frequencies should be set to the specified frequencies with a tolerance of ±0,5 % or better. The modulation voltages should be set with a tolerance of ±0,5 % of the specified values as well. A ±0,5 % tolerance for both modulation amplitude and frequency can in fact result in Pinst errors of up to 3 %.
61000-4-15 © IEC:2010 – 15 – Table 1b – Normalized flickermeter response 230 V / 50 Hz and 230 V / 60 Hz for sinusoidal voltage fluctuations (input relative voltage fluctuation ΔU/U for one unit of perceptibility at Pinst output)
Voltage fluctuation ΔU/U
% Voltage fluctuation ΔU/U
% Hz 230 V lamp 50 Hz system 230 V lamp 60 Hz system Hz 230 V lamp 50 Hz system 230 V lamp 60 Hz system 0,5 2,325 2,325 10,0 0,261 0,261 1,0 1,397 1,397 10,5 0,271 0,271 1,5 1,067 1,067 11,0 0,283 0,283 2,0 0,879 0,879 11,5 0,298 0,298 2,5 0,747 0,747 12,0 0,314 0,314 3,0 0,645 0,645 13,0 0,351 0,351 3,5 0,564 0,564 14,0 0,393 0,393 4,0 0,497 0,497 15,0 0,438 0,438 4,5 0,442 0,442 16,0 0,486 0,486 5,0 0,396 0,396 17,0 0,537 0,537 5,5 0,357 0,357 18,0 0,590 0,590 6,0 0,325 0,325 19,0 0,646 0,645 6,5 0,300 0,300 20,0 0,704 0,703 7,0 0,280 0,280 21,0 0,764 0,764 7,5 0,265 0,265 22,0 0,828 0,826 8,0 0,256 0,256 23,0 0,894 0,892 8,8 0,250 0,250 24,0 0,964 0,959 9,5 0,254 0,254 25,0 1,037 1,029
33 1/3 2,128 1,758
40,0
2,963
For the purpose of type testing, the bold printed entries in the above Table 1b are mandatory. The other points are optional. The bold printed points are selected to be at or close to the inflection points, and along important points on the normalized flicker response curve. Flicker meter manufacturers may test the product for all entries in Table 1b, but this is not mandatory for type testing or instrument verification.
NOTE Because of the different response of 50 Hz and 60 Hz systems, the mandatory verificat
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