SIST EN 1071-10:2009
(Main)Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning
Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning
This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice.
Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 10: Bestimmung der Schichtdicke mittels Querschliff
Dieses Dokument legt ein Messverfahren für die Schichtdicke keramischer Beschichtungen fest, bei dem ein metallographisch angefertigter Querschliff der Beschichtung mit einem kalibrierten Licht- oder Rasterelektro-nenmikroskop untersucht wird. Es lehnt sich eng an EN ISO 9220 [8] an, jedoch wurden alle erforderlichen Anpassungen und Aktualisierungen vorgenommen, um keramischen Beschichtungen und der derzeitig besten Praxis zu entsprechen.
Céramiques techniques avancées - Méthodes d'essai pour les revêtements céramiques - Partie 10: Détermination de l'épaisseur du revêtement par découpage transverse
Le présent document définit une méthode de mesurage de l’épaisseur des revêtements céramiques qui
comprend l’examen au microscope optique ou électronique à balayage étalonné d’une section transversale du
revêtement ayant fait l’objet d’une préparation métallographique. Il est largement inspiré du document
EN ISO 9220 [8], mais a été modifié et mis à jour conformément aux exigences pour être adapté aux
revêtements céramiques et aux bonnes pratiques actuelles.
Sodobna tehnična keramika - Metode za preskušanje keramičnih prevlek - 10. del: Ugotavljanje debeline prevleke s prečnim prerezom
General Information
- Status
- Published
- Public Enquiry End Date
- 05-Apr-2009
- Publication Date
- 22-Sep-2009
- Technical Committee
- I13 - Imaginarni 13
- Current Stage
- 6060 - National Implementation/Publication (Adopted Project)
- Start Date
- 18-Sep-2009
- Due Date
- 23-Nov-2009
- Completion Date
- 23-Sep-2009
Relations
- Effective Date
- 01-Nov-2009
Overview
EN 1071-10:2009 (CEN) defines a destructive, metallographic method for determining the thickness of ceramic coatings by examination of a prepared cross‑section in a calibrated optical or scanning electron microscope (SEM). The standard adapts and updates EN ISO 9220 practices specifically for advanced technical ceramics and sets out requirements for sample preparation, instrumentation, calibration, measurement and reporting to assure accurate, traceable thickness results.
Key topics and requirements
- Scope & principle: Measurement of coating thickness from a metallographically prepared cross‑section viewed normal to the microscope axis. The method is direct but destructive.
- Apparatus:
- SEM with spatial resolution ≤ 50 nm.
- Optical microscope with spatial resolution ≤ 500 nm.
- Sample preparation: Emphasises perpendicular cross‑sections, flat surfaces, removal of cut damage, and clearly defined coating/substrate boundaries. Annex A gives guidance on cutting, mounting, grinding and polishing.
- Common artefacts to avoid:
- Taper or tilt of the cross‑section (example: 10° tilt → ~1.5% thickness error).
- Edge rounding, smearing from polishing, overplating effects, and poor etching contrast.
- Calibration:
- Calibrate instruments with a stage micrometer/graticule under the same imaging conditions as test specimens.
- Photograph calibration scale, measure average spacing and calculate effective magnification for thickness conversion.
- Measurement procedure:
- Produce images with sufficient contrast and signal‑to‑noise (SEM: min. S/N ~2:1).
- Measure perpendicular edge‑to‑edge distances at specified locations and compute local thickness averages.
- Uncertainty & reporting: Requires evaluation of measurement uncertainty (referencing ENV 13005 and laboratory competence per EN ISO/IEC 17025) and a formal test report with details of preparation, calibration, instrument settings and results.
Applications and users
- Quality control and specification verification for ceramic coatings (thermal barrier coatings, wear‑resistant layers, functional thin films).
- Users: coating manufacturers, materials and process engineers, metallographic laboratories, R&D and failure‑analysis teams, and certification bodies requiring traceable thickness data.
- Useful where precise, localized thickness determination is needed and destructive analysis is acceptable.
Related standards
- EN ISO 9220 (basis for method adaptations)
- ENV 13005 (expression of uncertainty in measurement)
- EN ISO/IEC 17025 (laboratory competence)
- ISO 16700 (SEM reference)
- Other parts of EN 1071 series (e.g., Parts 1–13 cover alternative thickness methods, adhesion, composition, wear and mechanical tests)
Keywords: EN 1071-10:2009, ceramic coatings, coating thickness, cross‑sectioning, metallographic preparation, SEM, optical microscope, calibration, measurement uncertainty.
Frequently Asked Questions
SIST EN 1071-10:2009 is a standard published by the Slovenian Institute for Standardization (SIST). Its full title is "Advanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning". This standard covers: This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice.
This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice.
SIST EN 1071-10:2009 is classified under the following ICS (International Classification for Standards) categories: 25.220.99 - Other treatments and coatings; 81.060.30 - Advanced ceramics. The ICS classification helps identify the subject area and facilitates finding related standards.
SIST EN 1071-10:2009 has the following relationships with other standards: It is inter standard links to SIST-TS CEN/TS 1071-10:2005. Understanding these relationships helps ensure you are using the most current and applicable version of the standard.
You can purchase SIST EN 1071-10:2009 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of SIST standards.
Standards Content (Sample)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 10: Bestimmung der Schichtdicke mittels QuerschliffCéramiques techniques avancées - Méthodes d'essai pour les revêtements céramiques - Partie 10: Détermination de l'épaisseur du revêtement par découpage transverseAdvanced technical ceramics - Methods of test for ceramic coatings - Part 10: Determination of coating thickness by cross sectioning81.060.30Sodobna keramikaAdvanced ceramics25.220.99Druge obdelave in prevlekeOther treatments and coatingsICS:Ta slovenski standard je istoveten z:EN 1071-10:2009SIST EN 1071-10:2009en,fr,de01-november-2009SIST EN 1071-10:2009SLOVENSKI
STANDARDSIST-TS CEN/TS 1071-10:20051DGRPHãþD
EUROPEAN STANDARDNORME EUROPÉENNEEUROPÄISCHE NORMEN 1071-10July 2009ICS 81.060.30Supersedes CEN/TS 1071-10:2004
English VersionAdvanced technical ceramics - Methods of test for ceramiccoatings - Part 10: Determination of coating thickness by crosssectioningCéramiques techniques avancées - Méthodes d'essai pourles revêtements céramiques - Partie 10: Détermination del'épaisseur du revêtement par découpage transverseHochleistungskeramik - Verfahren zur Prüfung keramischerSchichten - Teil 10: Bestimmung der Schichtdicke mittelsQuerschliffThis European Standard was approved by CEN on 19 June 2009.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this EuropeanStandard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such nationalstandards may be obtained on application to the CEN Management Centre or to any CEN member.This European Standard exists in three official versions (English, French, German). A version in any other language made by translationunder the responsibility of a CEN member into its own language and notified to the CEN Management Centre has the same status as theofficial versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Cyprus, Czech Republic, Denmark, Estonia, Finland,France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal,Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATIONCOMITÉ EUROPÉEN DE NORMALISATIONEUROPÄISCHES KOMITEE FÜR NORMUNGManagement Centre:
Avenue Marnix 17,
B-1000 Brussels© 2009 CENAll rights of exploitation in any form and by any means reservedworldwide for CEN national Members.Ref. No. EN 1071-10:2009: ESIST EN 1071-10:2009
General guidance on the preparation and measurement of cross-sections . 13 A.1 Introduction . 13 A.2 Cutting . 13 A.3 Mounting . 13 A.4 Grinding and polishing . 14 A.5 Use of the scanning electron microscope. 14 Bibliography . 15 SIST EN 1071-10:2009
1) In preparation at the time of publication of this European Standard. SIST EN 1071-10:2009
5.1 Scanning electron microscope (SEM) The SEM shall have a spatial resolution of 50 nm or better. Suitable instruments are available commercially. 5.2 Optical microscope The optical microscope shall have a spatial resolution of 500 nm or better. Suitable instruments are available commercially.
NOTE 1 Microscopes that incorporate a system to automatically record the XY coordinates are available and, if the stage movement has been calibrated, can be used directly to measure coating thickness without the need SIST EN 1071-10:2009
NOTE It is recommended that a cross-section of a reference sample of known thickness be prepared using the same procedures as the test sample as a check on the accuracy of cutting, mounting and polishing procedures. 6.4 Specimen tilt Any tilt of the specimen (plane of cross-section) with respect to the electron beam or optical axis will result in an inaccurate measurement. This error is compounded if the test specimen tilt is different from that used during calibration. 6.5 Coating damage Ceramic coatings are generally brittle, and hence easily damaged during preparation of the metallographic cross-section. 6.6 Rounding of edges of the coating If the edge of the coating cross-section is rounded, i.e. if the coating cross-section is not completely flat up to its edges, the observed thickness may differ from the true thickness. Edge rounding can be caused by improper mounting, grinding, polishing or etching (see 6.8 and Annex A). SIST EN 1071-10:2009
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