SIST EN IEC 62884-4:2019

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (IEC 62884-4:2019)

IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren – Teil 4: Prüfverfahren für die Kurzzeit-Frequenzstabilität (IEC 62884-4:2019)

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence (IEC 62884-4:2019)

L'IEC 62884-4:2019 décrit les méthodes de mesure et d'évaluation des essais de stabilité à court terme de la fréquence des oscillateurs piézoélectriques, diélectriques et électrostatiques. Son but est d'unifier les méthodes d'essai et d'évaluation de la stabilité à court terme de la fréquence.

Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 4. del: Preskusne metode kratkotrajne frekvenčne stabilnosti (IEC 62884-4:2019)

Ta del standarda IEC 62884 opisuje metode za merjenje in vrednotenje preskusov kratkotrajne frekvenčne stabilnosti za piezoelektrične, dielektrične in elektrostatične oscilatorje. Namen standarda je poenotenje preskusnih metod in metod vrednotenja za kratkoročno frekvenčno stabilnost.

General Information

• Status: Published
• Publication Date: 18-Aug-2019
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 25-Jul-2019
• Due Date: 29-Sep-2019
• Completion Date: 19-Aug-2019
• Ref Project: EN IEC 62884-4:2019 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

Overview

EN IEC 62884-4:2019 (IEC 62884-4:2019) defines standardized short-term frequency stability test methods for piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify measurement and evaluation procedures so manufacturers, test laboratories and designers can produce comparable, repeatable short-term stability data for oscillators used in frequency control and timing applications.

Key topics

• Short-term frequency stability: Definitions and mathematical representation of oscillator output, including amplitude and phase noise contributions.
• Statistical measures: Procedures for computing Allan variance (AVAR), Allan deviation (ADEV), overlapping Allan deviation (OADEV), modified Allan deviation (MDEV) and Hadamard variance (HVAR) as primary metrics for short-term stability and noise characterization.
• Phase noise and integration: Relationship between phase-noise spectra and short-term stability; method to compute stability by integrating phase-noise data.
• Time-domain errors: Measurement and reporting of time interval error and maximum time interval error for timing-critical oscillators.
• Measurement methods: Five validated approaches are described:
  • Method 1: Two oscillators with the same mean frequency (beat measurement).
  • Method 2: Frequency-offset measurement.
  • Method 3: Time interval counter method.
  • Method 4: Direct frequency counter method.
  • Method 5: Calculating short-term stability via integration of phase-noise data.
• Test conditions and precautions: Guidance on test setup, required stabilization time, supply/control voltage considerations and the impact of ambient conditions on short-term frequency stability.

Applications

EN IEC 62884-4:2019 is intended for practical use in:

• Product verification and quality assurance for oscillator manufacturers.
• Characterization of piezoelectric oscillators (e.g., quartz resonators), dielectric and electrostatic devices in R&D and production.
• Compliance testing for datasheet specifications and for components used in telecommunications, instrumentation, timing systems and navigation.
• Laboratory and metrology measurements where consistent reporting of Allan deviation, phase noise-derived stability, and time interval error is required.

Who should use this standard

• Oscillator and frequency-control device manufacturers
• Test labs and calibration/metrology facilities
• Design engineers and systems integrators specifying timing performance
• Quality managers and regulatory compliance teams

Related standards

• IEC 62884-1 (Basic measurement methods)
• IEC 60679-1 (Oscillators of assessed quality)
• IEC 60050-561, IEC 60027 series (terms and symbols)
• ISO 80000-1 (quantities and units)

By following EN IEC 62884-4:2019, organizations can ensure consistent, reproducible short-term frequency stability measurements and clear communication of oscillator performance metrics such as Allan deviation and time interval error.

Standards Content (Sample)

SLOVENSKI STANDARD
01-oktober-2019
Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 4.
del: Preskusne metode kratkotrajne frekvenčne stabilnosti (IEC 62884-4:2019)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 :
Short-term frequency stability test methods (IEC 62884-4:2019)
Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren – Teil
4: Prüfverfahren für die Kurzzeit-Frequenzstabilität (IEC 62884-4:2019)
Techniques de mesure des oscillateurs piézoélectriques, diélectriques et
électrostatiques - Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence
(IEC 62884-4:2019)
Ta slovenski standard je istoveten z: EN IEC 62884-4:2019
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN IEC 62884-4

NORME EUROPÉENNE
EUROPÄISCHE NORM
July 2019
ICS 31.140
English Version
Measurement techniques of piezoelectric, dielectric and
electrostatic oscillators - Part 4 : Short-term frequency stability
test methods
(IEC 62884-4:2019)
Techniques de mesure des oscillateurs piézoélectriques, Messverfahren für piezoelektrische, dielektrische und
diélectriques et électrostatiques - Partie 4: Méthodes elektrostatische Oszillatoren - Teil 4: Prüfverfahren für die
d'essai de stabilité à court-terme de la fréquence Kurzzeit-Frequenzstabilität
(IEC 62884-4:2019) (IEC 62884-4:2019)
This European Standard was approved by CENELEC on 2019-06-10. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62884-4:2019 E

European foreword
The text of document 49/1277/CDV, future edition 1 of IEC 62884-4, prepared by IEC/TC 49 "Piezoelectric,
dielectric and electrostatic devices and associated materials for frequency control, selection and detection" was
submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 62884-4:2019.
The following dates are fixed:
• latest date by which the document has to be implemented at national level by (dop) 2020-03-10
publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2022-06-10
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice
The text of the International Standard IEC 62884-4:2019 was approved by CENELEC as a European Standard
without any modification.
In the official version, for Bibliography, the following note has to be added for the standard indicated:
IEC 60068-1 NOTE Harmonized as EN 60068-1

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content constitutes
requirements of this document. For dated references, only the edition cited applies. For undated references, the
latest edition of the referenced document (including any amendments) applies.
NOTE 1  Where an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
NOTE 2  Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu.

Publication Year Title EN/HD Year
IEC 60027 series Letters symbols to be used in electrical - series
technology - Part 1: General
IEC 60050-561 -  International Electrotechnical Vocabulary - Part - -
561: Piezoelectric, dielectric and electrostatic
devices and associated materials for frequency
control, selection and detection
IEC 60469 -  Transitions, pulses and related waveforms - EN 60469 -
Terms, definitions and algorithms
IEC 60617 -  Standard data element types with associated - -
classification scheme for electric components --
Part 4: IEC reference collection fo standard data
element types and component classes
IEC 60679-1 -  Piezoelectric, dielectric and electrostatic EN 60679-1 -
oscillators of assessed quality - Part 1 : Generic
specification
IEC 62884-1 -  Measurement techniques of piezoelectric, EN 62884-1 -
dielectric and electrostatic oscillators - Part 1:
Basic methods for the measurement
ISO 80000-1 -  Quantities and units -- Part 1: General EN ISO 80000-1 -

IEC 62884-4 ®
Edition 1.0 2019-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators –

Part 4: Short-term frequency stability test methods

Techniques de mesure des oscillateurs piézoélectriques, diélectriques

et électrostatiques –
Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-6876-6

– 2 – IEC 62884-4:2019 © IEC 2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions, units and symbols . 5
3.1 Terms and definitions . 5
3.2 Units and symbols. 5
4 Short-term frequency stability . 6
5 Allan variance (AVAR) . 9
6 Allan deviation (ADEV), RMS fractional frequency fluctuations . 10
7 Overlapping Allan variance (OAVAR) and overlapping Allan deviation (OADEV) . 11
8 Modified Allan variance (MVAR) and modified Allan deviation (MDEV) . 11
9 Hadamard Variance (HVAR) . 12
10 Time interval error (e ) . 12
(n)
11 Maximum time interval error (e ) . 13
m(n)
12 Measurement of short-term frequency stability . 13
12.1 General . 13
12.2 Method 1: The two oscillators having exactly the same mean frequency . 14
12.3 Method 2: frequency offset measurement . 15
12.4 Method 3: time interval counter . 15
12.5 Method 4: direct frequency counter method . 16
12.6 Method 5: short-term stability computed by integration of phase noise data . 16
12.7 Test conditions and precautions . 17
12.7.1 Considerations for the test setup . 17
12.7.2 Stabilization time . 17
12.7.3 Supply voltage and control voltage . 18
12.7.4 Impact of ambient conditions . 19
Bibliography . 20

Figure 1 – Phasor diagram of carrier and non-correlated amplitude and phase noise . 6
Figure 2 – Phasor diagram after suppression of amplitude noise . 7
Figure 3 – Various noise mechanisms over time . 8
Figure 4 – Chart of Allan deviation (ADEV) as a function of τ . 11
Figure 5 – Test circuit for method 1 . 14
Figure 6 – Test circuit for method 2 . 15
Figure 7 – Time interval counter measurement method . 16
Figure 8 – Impact of a frequency drift to the measured Allan deviation . 18

Table 1 – Relation between the areas of different slopes of phase noise and Allan
deviation . 17

IEC 62884-4:2019 © IEC 2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC OSCILLATORS –
Part 4: Short-term frequency stability test methods

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62884-4 has been prepared by IEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
The text of this International Standard is based on the following documents:
CDV Report on voting
49/1277/CDV 49/1292/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

– 4 – IEC 62884-4:2019 © IEC 2019
A list of all parts in the IEC 62884 series, published under the general title Measurement
techniques of piezoelectric, dielectric and electrostatic oscillators, can be found on the IEC
website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.
IEC 62884-4:2019 © IEC 2019 – 5 –
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC OSCILLATORS –
Part 4: Short-term frequency stability test methods

1 Scope
This part of IEC 62884 describes the methods for the measurement and evaluation of the
short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its
purpose is to unify the test and evaluation methods for short-term frequency stability.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology
IEC 60050-561, International electrotechnical vocabulary – Part 561: Piezoelectric, dielectric
and electrostatic devices and associated materials for frequency control, selection and
detection. Available at www.electropedia.org
IEC 60469, Transitions, pulses and related waveforms – Terms, definitions and algorithms
IEC 60617, Graphical symbols for diagrams, available at http://std.iec.ch/iec60617
IEC 60679-1, Piezoelectric, dielectric and electrostatic oscillators of assessed qualify – Part 1:
Generic specification
IEC 62884-1, Measurement techniques of piezoelectric, dielectric and electrostatic oscillators
– Part 1: Basic methods for the measurement
ISO 80000-1, Quantities and units – Part 1: General
3 Terms and definitions, units and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60679-1 apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses.
• IEC Electropedia: available at http://www.electropedia.org
• ISO Online browsing platform: available at http://www.iso.org/obp
3.2 Units and symbols
Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken
from the following standards:
– 6 – IEC 62884-4:2019 © IEC 2019
• IEC 60027;
• IEC 60050-561;
• IEC 60469;
• IEC 60617;
• ISO 80000-1.
4 Short-term frequency stability
The random fluctuations of the frequency of an oscillator over short periods of time
[IEV 561-03-16]. In general, the output voltage of the oscillator is expressed by the following
equation:
vt( )=U+⋅ε t cosφ t=U+⋅ε t cos 2π⋅F⋅t+φt 
( ) ( ) ( ) ( )
00  0 
where
is the nominal output voltage;
U
ε (t) is the amplitude noise;
F  is the average oscillator frequency;
ϕ t is the phase fluctuation.
( )
For the measurement of the short-term frequency stability, the amplitude noise ε(t) is
supressed by a limiter, thus the output voltage of oscillator simplifies as follows:
jtφ( )
vt( ) U⋅cosφ (t) U⋅cos 2π⋅F⋅+t φ(t) Re(U⋅e )
0 00 0

where
Re X means the real part of the complex number X .
( )
This can be presented in a phasor diagram (see Figure 1 below).

Figure 1 – Phasor diagram of carrier and non-correlated amplitude and phase noise
For the measurement of short-term stability, the amplitude noise ε(t) is suppressed by a limiter,
thus the phasor diagram simplifies as shown in Figure 2.
= = =
IEC 62884-
...