Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods (IEC 62884-4:2019)

This part of IEC 62884 describes the methods for the measurement and evaluation of the
short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its
purpose is to unify the test and evaluation methods for short-term frequency stability.

Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren – Teil 4: Prüfverfahren für die Kurzzeit-Frequenzstabilität (IEC 62884-4:2019)

Techniques de mesure des oscillateurs piézoélectriques, diélectriques et électrostatiques - Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence (IEC 62884-4:2019)

L'IEC 62884-4:2019 décrit les méthodes de mesure et d'évaluation des essais de stabilité à court terme de la fréquence des oscillateurs piézoélectriques, diélectriques et électrostatiques. Son but est d'unifier les méthodes d'essai et d'évaluation de la stabilité à court terme de la fréquence.

Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 4. del: Preskusne metode kratkotrajne frekvenčne stabilnosti (IEC 62884-4:2019)

Ta del standarda IEC 62884 opisuje metode za merjenje in vrednotenje preskusov kratkotrajne frekvenčne stabilnosti za piezoelektrične, dielektrične in elektrostatične oscilatorje. Namen standarda je poenotenje preskusnih metod in metod vrednotenja za kratkoročno frekvenčno stabilnost.

General Information

Status
Published
Publication Date
18-Aug-2019
Technical Committee
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
25-Jul-2019
Due Date
29-Sep-2019
Completion Date
19-Aug-2019

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SLOVENSKI STANDARD
SIST EN IEC 62884-4:2019
01-oktober-2019

Merilne tehnike za piezoelektrične, dielektrične in elektrostatične oscilatorje - 4.

del: Preskusne metode kratkotrajne frekvenčne stabilnosti (IEC 62884-4:2019)

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 :

Short-term frequency stability test methods (IEC 62884-4:2019)

Messverfahren für piezoelektrische, dielektrische und elektrostatische Oszillatoren – Teil

4: Prüfverfahren für die Kurzzeit-Frequenzstabilität (IEC 62884-4:2019)
Techniques de mesure des oscillateurs piézoélectriques, diélectriques et

électrostatiques - Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence

(IEC 62884-4:2019)
Ta slovenski standard je istoveten z: EN IEC 62884-4:2019
ICS:
31.140 Piezoelektrične naprave Piezoelectric devices
SIST EN IEC 62884-4:2019 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 62884-4:2019
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SIST EN IEC 62884-4:2019
EUROPEAN STANDARD EN IEC 62884-4
NORME EUROPÉENNE
EUROPÄISCHE NORM
July 2019
ICS 31.140
English Version
Measurement techniques of piezoelectric, dielectric and
electrostatic oscillators - Part 4 : Short-term frequency stability
test methods
(IEC 62884-4:2019)

Techniques de mesure des oscillateurs piézoélectriques, Messverfahren für piezoelektrische, dielektrische und

diélectriques et électrostatiques - Partie 4: Méthodes elektrostatische Oszillatoren - Teil 4: Prüfverfahren für die

d'essai de stabilité à court-terme de la fréquence Kurzzeit-Frequenzstabilität
(IEC 62884-4:2019) (IEC 62884-4:2019)

This European Standard was approved by CENELEC on 2019-06-10. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 62884-4:2019 E
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SIST EN IEC 62884-4:2019
EN IEC 62884-4:2019 (E)
European foreword

The text of document 49/1277/CDV, future edition 1 of IEC 62884-4, prepared by IEC/TC 49 "Piezoelectric,

dielectric and electrostatic devices and associated materials for frequency control, selection and detection" was

submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN IEC 62884-4:2019.

The following dates are fixed:

• latest date by which the document has to be implemented at national level by (dop) 2020-03-10

publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2022-06-10

document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 62884-4:2019 was approved by CENELEC as a European Standard

without any modification.

In the official version, for Bibliography, the following note has to be added for the standard indicated:

IEC 60068-1 NOTE Harmonized as EN 60068-1
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SIST EN IEC 62884-4:2019
EN IEC 62884-4:2019 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents are referred to in the text in such a way that some or all of their content constitutes

requirements of this document. For dated references, only the edition cited applies. For undated references, the

latest edition of the referenced document (including any amendments) applies.

NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here: www.cenelec.eu.

Publication Year Title EN/HD Year
IEC 60027 series Letters symbols to be used in electrical - series
technology - Part 1: General
IEC 60050-561 - International Electrotechnical Vocabulary - Part - -
561: Piezoelectric, dielectric and electrostatic
devices and associated materials for frequency
control, selection and detection
IEC 60469 - Transitions, pulses and related waveforms - EN 60469 -
Terms, definitions and algorithms
IEC 60617 - Standard data element types with associated - -
classification scheme for electric components --
Part 4: IEC reference collection fo standard data
element types and component classes
IEC 60679-1 - Piezoelectric, dielectric and electrostatic EN 60679-1 -
oscillators of assessed quality - Part 1 : Generic
specification
IEC 62884-1 - Measurement techniques of piezoelectric, EN 62884-1 -
dielectric and electrostatic oscillators - Part 1:
Basic methods for the measurement
ISO 80000-1 - Quantities and units -- Part 1: General EN ISO 80000-1 -
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SIST EN IEC 62884-4:2019
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SIST EN IEC 62884-4:2019
IEC 62884-4
Edition 1.0 2019-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators –

Part 4: Short-term frequency stability test methods
Techniques de mesure des oscillateurs piézoélectriques, diélectriques
et électrostatiques –
Partie 4: Méthodes d'essai de stabilité à court-terme de la fréquence
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.140 ISBN 978-2-8322-6876-6

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 62884-4:2019
– 2 – IEC 62884-4:2019 © IEC 2019
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions, units and symbols ........................................................................ 5

3.1 Terms and definitions .............................................................................................. 5

3.2 Units and symbols................................................................................................... 5

4 Short-term frequency stability .......................................................................................... 6

5 Allan variance (AVAR) ..................................................................................................... 9

6 Allan deviation (ADEV), RMS fractional frequency fluctuations ...................................... 10

7 Overlapping Allan variance (OAVAR) and overlapping Allan deviation (OADEV) ............ 11

8 Modified Allan variance (MVAR) and modified Allan deviation (MDEV) .......................... 11

9 Hadamard Variance (HVAR) .......................................................................................... 12

10 Time interval error (e ) ................................................................................................ 12

(n)

11 Maximum time interval error (e ) ............................................................................... 13

m(n)

12 Measurement of short-term frequency stability ............................................................... 13

12.1 General ................................................................................................................. 13

12.2 Method 1: The two oscillators having exactly the same mean frequency ............... 14

12.3 Method 2: frequency offset measurement .............................................................. 15

12.4 Method 3: time interval counter ............................................................................. 15

12.5 Method 4: direct frequency counter method ........................................................... 16

12.6 Method 5: short-term stability computed by integration of phase noise data .......... 16

12.7 Test conditions and precautions ............................................................................ 17

12.7.1 Considerations for the test setup ................................................................... 17

12.7.2 Stabilization time ........................................................................................... 17

12.7.3 Supply voltage and control voltage ................................................................ 18

12.7.4 Impact of ambient conditions ......................................................................... 19

Bibliography .......................................................................................................................... 20

Figure 1 – Phasor diagram of carrier and non-correlated amplitude and phase noise .............. 6

Figure 2 – Phasor diagram after suppression of amplitude noise ............................................. 7

Figure 3 – Various noise mechanisms over time ..................................................................... 8

Figure 4 – Chart of Allan deviation (ADEV) as a function of τ ................................................ 11

Figure 5 – Test circuit for method 1 ...................................................................................... 14

Figure 6 – Test circuit for method 2 ...................................................................................... 15

Figure 7 – Time interval counter measurement method ......................................................... 16

Figure 8 – Impact of a frequency drift to the measured Allan deviation .................................. 18

Table 1 – Relation between the areas of different slopes of phase noise and Allan

deviation ............................................................................................................................... 17

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SIST EN IEC 62884-4:2019
IEC 62884-4:2019 © IEC 2019 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC OSCILLATORS –
Part 4: Short-term frequency stability test methods
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 62884-4 has been prepared by IEC technical committee 49:

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency

control, selection and detection.
The text of this International Standard is based on the following documents:
CDV Report on voting
49/1277/CDV 49/1292/RVC

Full information on the voting for the approval of this International Standard can be found in

the report on voting indicated in the above table.

This document has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN IEC 62884-4:2019
– 4 – IEC 62884-4:2019 © IEC 2019

A list of all parts in the IEC 62884 series, published under the general title Measurement

techniques of piezoelectric, dielectric and electrostatic oscillators, can be found on the IEC

website.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to

the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
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SIST EN IEC 62884-4:2019
IEC 62884-4:2019 © IEC 2019 – 5 –
MEASUREMENT TECHNIQUES OF PIEZOELECTRIC, DIELECTRIC AND
ELECTROSTATIC OSCILLATORS –
Part 4: Short-term frequency stability test methods
1 Scope

This part of IEC 62884 describes the methods for the measurement and evaluation of the

short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its

purpose is to unify the test and evaluation methods for short-term frequency stability.

2 Normative references

The following documents are referred to in the text in such a way that some or all of their

content constitutes requirements of this document. For dated references, only the edition

cited applies. For undated references, the latest edition of the referenced document (including

any amendments) applies.
IEC 60027 (all parts), Letter symbols to be used in electrical technology

IEC 60050-561, International electrotechnical vocabulary – Part 561: Piezoelectric, dielectric

and electrostatic devices and associated materials for frequency control, selection and

detection. Available at www.electropedia.org

IEC 60469, Transitions, pulses and related waveforms – Terms, definitions and algorithms

IEC 60617, Graphical symbols for diagrams, available at http://std.iec.ch/iec60617

IEC 60679-1, Piezoelectric, dielectric and electrostatic oscillators of assessed qualify – Part 1:

Generic specification

IEC 62884-1, Measurement techniques of piezoelectric, dielectric and electrostatic oscillators

– Part 1: Basic methods for the measurement
ISO 80000-1, Quantities and units – Part 1: General
3 Terms and definitions, units and symbols
3.1 Terms and definitions

For the purposes of this document, the terms and definitions given in IEC 60679-1 apply.

ISO and IEC maintain terminological databases for use in standardization at the following

addresses.
• IEC Electropedia: available at http://www.electropedia.org
• ISO Online browsing platform: available at http://www.iso.org/obp
3.2 Units and symbols

Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken

from the following standards:
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SIST EN IEC 62884-4:2019
– 6 – IEC 62884-4:2019 © IEC 2019
• IEC 60027;
• IEC 60050-561;
• IEC 60469;
• IEC 60617;
• ISO 80000-1.
4 Short-term frequency stability

The random fluctuations of the frequency of an oscillator over short periods of time

[IEV 561-03-16]. In general, the output voltage of the oscillator is expressed by the following

equation:
vt( )=U+⋅ε t cosφ t=U+⋅ε t cos 2π⋅F⋅t+φt 
( ) ( ) ( ) ( )
00  0 
where
is the nominal output voltage;
ε (t) is the amplitude noise;
F is the average oscillator frequency;
ϕ t is the phase fluctuation.
( )

For the measurement of the short-term frequency stability, the amplitude noise ε(t) is

supressed by a limiter, thus the output voltage of oscillator simplifies as follows:

jtφ( )
vt( ) U⋅cosφ (t) U⋅cos 2π⋅F⋅+t φ(t) Re(U⋅e )
0 00 0
where
Re X means the real part of the complex number X .
( )
This can be presented in a phasor diagram (see Figure 1 below).

Figure 1 – Phasor diagram of carrier and non-correlated amplitude and phase noise

For the measurement of short-term stability, the amplitude noise ε(t) is suppressed by a limiter,

thus the phasor diagram simplifies as shown in Figure 2.
= = =
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SIST EN IEC 62884-4:2019
IEC 62884-
...

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