SIST EN IEC 61000-4-20:2022
(Main)Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
This part of IEC 61000 focuses on emission and immunity test methods for electrical and
electronic equipment using various types of transverse electromagnetic (TEM) waveguides.
These types include open structures (for example striplines and electromagnetic pulse
simulators) and closed structures (for example TEM cells). These structures can be further
classified as one-port, two-port, or multi-port TEM waveguides. The frequency range depends
on the specific testing requirements and the specific TEM waveguide type.
The object of this document is to describe
– TEM waveguide characteristics, including typical frequency ranges and equipment-undertest (EUT) size limitations;
– TEM waveguide validation methods for electromagnetic compatibility (EMC) tests;
– the EUT (i.e. EUT cabinet and cabling) definition;
– test set-ups, procedures, and requirements for radiated emission measurements in TEM
waveguides; and
– test set-ups, procedures, and requirements for radiated immunity testing in TEM
waveguides.
NOTE Test methods are defined in this document to measure the effects of electromagnetic radiation on equipment
and the electromagnetic emissions from the equipment concerned. The simulation and measurement of
electromagnetic radiation is not adequately exact for the quantitative determination of effects for all end-use
installations. The test methods defined are structured for a primary objective of establishing adequate reproducibility
of results at various test facilities for qualitative analysis of effects.
This document does not intend to specify the tests to be applied to any particular apparatus or
system(s). The main intention of this document is to provide a general basic reference for all
interested product committees of the IEC. For radiated emission measurements, product
committees select emission limits and measurement methods in consultation with CISPR
standards. For radiated immunity testing, product committees remain responsible for the
appropriate choice of immunity tests and immunity test limits to be applied to equipment within
their scope. This document describes test methods that are separate from those of
IEC 61000‑4‑3 [34].1
Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren - Messung der Störaussendung und Prüfung der Störfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern
Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure - Essais d'émission et d'immunité dans les guides d'onde TEM
IEC 61000-4-20:2022 concerne les méthodes d’essai d’émission et d’immunité pour les matériels électriques et électroniques qui utilisent différents types de guides d’onde transverses électromagnétiques (TEM). Ces types comprennent des structures ouvertes (par exemple, des lignes ouvertes et des simulateurs d’impulsion électromagnétique), et des structures fermées (par exemple, des cellules TEM), qui peuvent être elles-mêmes classées en guides d’onde TEM à un accès, à deux accès, ou à accès multiples. La plage de fréquences dépend des exigences d’essai spécifiques et du type spécifique de guide d’onde TEM.
L’objet du présent document est de décrire
- les caractéristiques des guides d’onde TEM, y compris les plages de fréquences types et les limites de tailles des équipements en essai (EUT);
- les méthodes de validation des guides d’onde TEM pour les essais de compatibilité électromagnétique CEM;
- la définition de l'EUT (c’est-à-dire l’armoire et le câblage de l'EUT);
- les montages d’essai, les procédures et les exigences relatives aux mesurages d’émissions rayonnées dans les guides d’onde TEM; et
- les montages d'essai, les procédures et les exigences pour les essais d’immunité rayonnée dans les guides d’onde TEM.
NOTE Dans le présent document, les méthodes d’essai sont définies afin de mesurer les effets des rayonnements électromagnétiques sur les matériels et les émissions électromagnétiques des matériels concernés. La simulation et le mesurage des rayonnements électromagnétiques ne sont pas suffisamment exacts pour une détermination quantitative des effets sur toutes les installations d'utilisation finale. Les méthodes d’essai définies sont structurées avec l’objectif premier d'établir une reproductibilité adéquate des résultats dans différentes installations d’essai pour des analyses qualitatives des effets.
Le présent document ne vise pas à spécifier les essais à appliquer à des appareils ou à un ou des systèmes particuliers. Le but principal présent document est de donner une référence de base d'ordre général à tous les comités de produits IEC concernés. Pour les mesurages d’émission rayonnée, les comités de produits sélectionnent des limites d’émission et des méthodes de mesure en consultation avec les normes CISPR. Pour les essais d’immunité rayonnée, les comités de produits restent responsables du choix approprié des essais d’immunité et des limites qui y sont associées, à appliquer aux matériels qui relèvent de leur domaine d’application. Le présent document décrit des méthodes d'essai qui sont indépendantes de celles de l'IEC 61000-4-3 [34].
CEM conformément au Guide IEC 107.
Cette troisième édition annule et remplace la deuxième édition parue en 2010. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) fournir des informations relatives aux essais d'EUT volumineux (y compris les câbles);
b) appliquer les travaux sur les incertitudes de mesure par adaptation des travaux réalisés par le CISPR et le CE 77 (pour les émissions et l'immunité);
c) mettre à jour la procédure de validation pour le volume d'essai en ce qui concerne la vérification de l'uniformité du champ et du mode TEM;
d) fournir des informations relatives aux guides d'onde TEM à deux accès et à quatre accès;
e) ajouter une nouvelle annexe informative (Annex I) qui traite de la caractérisation d
Elektromagnetna združljivost (EMC) - 4-20. del: Preskusne in merilne tehnike - Preskušanje oddajanja in odpornosti v prečnih elektromagnetnih (TEM) valovodih
Ta del standarda IEC 61000 se osredotoča na preskusne metode glede oddajanja in odpornosti za električno in elektronsko opremo z uporabo različnih tipov prečnih elektromagnetnih (TEM) valovodov. Ti tipi vključujejo odprte strukture (na primer ploščate valovode in simulatorje elektromagnetnih pulzov) ter zaprte strukture (na primer TEM-celice). Te strukture se lahko nadalje klasificirajo kot eno-, dvo- ali več-kanalni TEM-valovodi. Frekvenčni razpon je odvisen od določenih zahtev za preskušanje in določenega TEM-valovoda. Namen tega standarda je opisati: – značilnosti TEM-valovoda, vključno z tipičnimi frekvenčnimi razponi in omejitvami velikosti preskušane opreme (EUT); – validacijske metode za preskuse elektromagnetne združljivosti (EMC) TEM-valovodov; – opredelitev preskušane opreme (preskušanega ohišja in okabljenja); – preskusne postavitve, postopke in zahteve za meritve emisij sevanja pri TEM-valovodih; ter – preskusne postavitve, postopke in zahteve za preskušanje TEM-valovodov glede odpornosti proti sevanju. OPOMBA: Preskusne metode so v tem dokumentu opredeljene za merjenje učinkov elektromagnetnega sevanja na opremo in elektromagnetnih emisij iz zadevne opreme. Simulacija in merjenje elektromagnetnega sevanja nista dovolj natančna za kvantitativno določevanje učinkov za vse končne uporabe inštalacij. Opredeljene preskusne metode so strukturirane za primarni cilj ugotavljanja zadostne ponovljivosti rezultatov v različnih preskuševalnih laboratorijih za kvalitativno analizo učinkov. Ta dokument ni namenjen določevanju preskusov, predvidenih za uporabo pri kateri koli določeni napravi ali sistemu oziroma sistemih. Glavni namen tega dokumenta je zagotoviti splošno in osnovno referenco za vse zainteresirane odbore za izdelke v okviru Mednarodne elektrotehniške komisije (IEC). Za meritve emisij sevanja morajo odbori za izdelke izbrati meje emisij in merilne metode ob upoštevanju napotkov standardov CISPR. Odbori ostajajo odgovorni za primerno izbiro preskusov odpornosti in meja preskusov pri preskušanju odpornosti proti sevanju, ki se uporabijo za opremo v okviru njihovega področja uporabe. Ta dokument opisuje preskusne metode, ki so ločene od tistih iz standarda IEC 61000 4 3 [34].1
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN IEC 61000-4-20:2022
01-julij-2022
Nadomešča:
SIST EN 61000-4-20:2011
Elektromagnetna združljivost (EMC) - 4-20. del: Preskusne in merilne tehnike -
Preskušanje oddajanja in odpornosti v prečnih elektromagnetnih (TEM) valovodih
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques -
Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren -
Messung der Störaussendung und Prüfung der Störfestigkeit in transversal-
elektromagnetischen (TEM-)Wellenleitern
Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure -
Essais d'émission et d'immunité dans les guides d'onde TEM
Ta slovenski standard je istoveten z: EN IEC 61000-4-20:2022
ICS:
33.100.10 Emisija Emission
33.100.20 Imunost Immunity
SIST EN IEC 61000-4-20:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN IEC 61000-4-20:2022
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SIST EN IEC 61000-4-20:2022
EUROPEAN STANDARD EN IEC 61000-4-20
NORME EUROPÉENNE
EUROPÄISCHE NORM April 2022
ICS 33.100.10; 33.100.20 Supersedes EN 61000-4-20:2010 and all of its
amendments and corrigenda (if any)
English Version
Electromagnetic compatibility (EMC) - Part 4-20: Testing and
measurement techniques - Emission and immunity testing in
transverse electromagnetic (TEM) waveguides
(IEC 61000-4-20:2022)
Compatibilité électromagnétique (CEM) - Partie 4-20: Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf-
Techniques d'essai et de mesure - Essais d'émission et und Messverfahren - Messung der Störaussendung und
d'immunité dans les guides d'onde TEM Prüfung der Störfestigkeit in transversal-
(IEC 61000-4-20:2022) elektromagnetischen (TEM-)Wellenleitern
(IEC 61000-4-20:2022)
This European Standard was approved by CENELEC on 2022-03-25. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 61000-4-20:2022 E
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SIST EN IEC 61000-4-20:2022
EN IEC 61000-4-20:2022 (E)
European foreword
The text of document 77B/853/FDIS, future edition 3 of IEC 61000-4-20, prepared by SC 77B "High
frequency phenomena" of IEC/TC 77 "Electromagnetic compatibility" was submitted to the IEC-
CENELEC parallel vote and approved by CENELEC as EN IEC 61000-4-20:2022.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022-12-25
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2025-03-25
document have to be withdrawn
This document supersedes EN 61000-4-20:2010 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
This document has been prepared under a Standardization Request given to CENELEC by the
European Commission and the European Free Trade Association.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 61000-4-20:2022 was approved by CENELEC as a
European Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60068-1 NOTE Harmonized as EN 60068-1
IEC 60118-13 NOTE Harmonized as EN IEC 60118-13
IEC 61967-2 NOTE Harmonized as EN 61967-2
IEC 62132-2 NOTE Harmonized as EN 62132-2
CISPR 25 NOTE Harmonized as EN IEC 55025
CISPR 14 (series) NOTE Harmonized as EN IEC 55014-2 (series)
CISPR 16-4-2 NOTE Harmonized as EN 55016-4-2
IEC 61000-2-9 NOTE Harmonized as EN 61000-2-9
IEC 61000-4-3 NOTE Harmonized as EN IEC 61000-4-3
CISPR 16-2-3:2016 NOTE Harmonized as EN 55016-2-3:2017 (not modified)
CISPR 32 NOTE Harmonized as EN 55032
CISPR 20:2006 NOTE Harmonized as EN 55020:2007 (not modified) +A11:2011
2
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SIST EN IEC 61000-4-20:2022
EN IEC 61000-4-20:2022 (E)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) - Part 161: Electromagnetic
compatibility
CISPR 16-1-1 - Specification for radio disturbance and EN IEC 55016-1-1 -
immunity measuring apparatus and
methods - Part 1-1: Radio disturbance and
immunity measuring apparatus -
Measuring apparatus
CISPR 16-1-4 - Specification for radio disturbance and EN IEC 55016-1-4 -
immunity measuring apparatus and
methods - Part 1-4: Radio disturbance and
immunity measuring apparatus - Antennas
and test sites for radiated disturbance
measurements
3
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SIST EN IEC 61000-4-20:2022
IEC 61000-4-20
®
Edition 3.0 2022-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-20: Testing and measurement techniques – Emission and immunity
testing in transverse electromagnetic (TEM) waveguides
Compatibilité électromagnétique (CEM) –
Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité
dans les guides d’onde TEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10; 33.100.20 ISBN 978-2-8322-1083-0
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 61000-4-20:2022
– 2 – IEC 61000-4-20:2022 © IEC 2022
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 11
3 Terms, definitions and abbreviated terms . 11
3.1 Terms and definitions . 11
3.2 Abbreviated terms . 14
4 General . 15
5 TEM waveguide requirements . 15
5.1 General . 15
5.2 General requirements for the use of TEM waveguides . 16
5.2.1 Test volume and maximum EUT size . 16
5.2.2 Validation of usable test volume . 16
5.3 Special requirements and recommendations for certain types of TEM
waveguides . 23
5.3.1 Set-up of open TEM waveguides . 23
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide . 23
5.3.3 TEM mode generation for a four-port TEM waveguide . 23
5.4 Figures for Clause 5 . 24
6 Overview of EUT types . 26
6.1 General . 26
6.2 Small EUT . 26
6.3 Large EUT . 26
7 Laboratory test conditions. 26
7.1 General . 26
7.2 Climatic conditions . 26
7.3 Electromagnetic conditions . 26
8 Evaluation and reporting of test results . 27
Annex A (normative) Emission measurements in TEM waveguides . 28
A.1 Overview. 28
A.2 Test equipment . 28
A.3 Correlating TEM waveguide voltages to electric field strength data . 28
A.3.1 General . 28
A.3.2 Correlation algorithms . 29
A.4 Emission measurement correction factors . 33
A.4.1 Reference emission sources . 33
A.4.2 Arrangement of small EUTs . 34
A.4.3 Calculation of the small EUT correction factor . 34
A.5 Emission measurement procedures in TEM waveguides . 37
A.5.1 EUT types. 37
A.5.2 EUT arrangement . 37
A.6 Test report . 38
A.7 Figures for Annex A . 39
Annex B (normative) Immunity testing in TEM waveguides . 44
B.1 Overview. 44
B.2 Test equipment . 44
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B.2.1 General . 44
B.2.2 Description of the test facility . 44
B.3 Field uniformity area calibration . 45
B.4 Test levels . 45
B.5 Test set-up . 45
B.5.1 Arrangement of table-top equipment . 45
B.5.2 Arrangement of floor-standing equipment . 46
B.5.3 Arrangement of wiring . 46
B.6 Test procedures . 46
B.7 Test results and test report . 46
B.8 Figures for Annex B . 47
Annex C (normative) HEMP transient testing in TEM waveguides . 49
C.1 Overview. 49
C.2 Immunity tests . 49
C.2.1 General . 49
C.2.2 Radiated test facilities . 50
C.2.3 Frequency domain spectrum requirements . 51
C.3 Test equipment . 51
C.4 Test set-up . 52
C.5 Test procedure . 52
C.5.1 General . 52
C.5.2 Severity level and test exposures . 53
C.5.3 Test procedure . 53
C.5.4 Test execution . 54
C.5.5 Execution of the radiated immunity test . 54
C.6 Figure for Annex C . 55
Annex D (informative) TEM waveguide characterization . 56
D.1 Overview. 56
D.2 Distinction between wave impedance and characteristic impedance. 56
D.3 TEM wave . 57
D.3.1 General . 57
D.3.2 Free-space TEM mode . 57
D.3.3 Waveguides . 57
D.4 Wave propagation . 58
D.4.1 General . 58
D.4.2 Spherical propagation . 58
D.4.3 Plane wave propagation in free space . 58
D.4.4 Velocity of propagation . 58
D.5 Polarization . 58
D.6 Types of TEM waveguides . 59
D.6.1 General . 59
D.6.2 Open TEM waveguides (striplines, etc.) . 60
D.6.3 Closed TEM waveguides (TEM cells) . 60
D.7 Frequency limitations . 60
D.8 Figures for Annex D . 61
Annex E (informative) Calibration method for E-field probes in TEM waveguides . 69
E.1 Overview. 69
E.2 Probe calibration requirements . 69
E.2.1 General . 69
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E.2.2 Calibration frequency range . 69
E.2.3 Calibration volume . 70
E.2.4 Probe dimensions . 70
E.2.5 Perturbations of TEM waveguide fields due to the probe . 70
E.2.6 Frequency steps . 71
E.2.7 Field strength . 71
E.3 Requirements for calibration instrumentation . 71
E.3.1 Specifications of TEM waveguide . 71
E.3.2 Harmonics and spurious signals . 72
E.3.3 Probe fixture . 72
E.3.4 Measuring net power to a transmitting device using directional couplers . 72
E.4 E-field probe calibration . 73
E.4.1 Calibration methods . 73
E.4.2 Calibration procedure using a two-port TEM waveguide . 73
E.4.3 Calibration procedure using one-port TEM waveguide . 74
E.5 Figures for Annex E . 77
Annex F (informative) Instrumentation uncertainty of emission measurement results . 79
F.1 Radiated disturbance measurements using a TEM waveguide . 79
F.1.1 Measurand for radiated disturbance measurements using a TEM
waveguide . 79
F.1.2 Symbols of input quantities common to all disturbance measurements . 79
F.1.3 Symbols of input quantities specific to TEM waveguide measurements . 79
F.2 Input quantities to be considered for radiated disturbance measurements
using a TEM waveguide . 79
F.3 Uncertainty budget and rationale for the input quantities for radiated
disturbance measurements using a TEM waveguide . 80
F.3.1 Uncertainty budget for radiated disturbance measurements using a TEM
waveguide . 80
F.3.2 Rationale for the estimates of input quantities for radiated disturbance
measurements using a TEM waveguide . 81
F.4 Figures for Annex F . 87
Annex G (informative) Measurement uncertainty of immunity testing due to test
instrumentation . 89
G.1 General symbols . 89
G.2 Symbol and definition of the measurand . 89
G.3 Symbols for input quantities . 89
G.4 Example: Uncertainty budget for immunity test . 89
G.5 Rationale for the estimates of input quantities . 90
Annex H (informative) Correlation of emission and immunity limits between EMC test
facilities . 93
H.1 Overview. 93
H.2 Dipole in free space (representing FAR set-up) . 93
H.3 Dipole in half space (representing OATS or SAC set-up). 95
H.4 Dipole in a TEM-mode transmission line . 96
H.5 Dipole in a reverberation chamber . 97
H.6 Correlation . 98
H.7 Example of emission limits . 99
H.8 Figures for Annex H . 100
Annex I (informative) TEM waveguide transient characterization . 103
I.1 Overview. 103
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I.2 Test equipment . 103
I.3 Test set-up . 103
I.4 TEM waveguide characterization by correlation . 104
I.5 Quantification of the Pcc . 105
I.6 Performable transient test signals . 105
I.7 Figures for Annex I . 106
Bibliography . 108
Figure 1 – Flowchart of TEM mode and field uniformity verification procedure with the
“constant forward power” method (see 5.2.2.4.1) . 24
Figure 2 – Flowchart of TEM mode and field uniformity verification procedure with the
“constant field strength” method (see 5.2.2.4.2) . 25
Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume in a TEM waveguide (see A.5.2) . 39
Figure A.2 – Basic ortho-axis EUT positioner or manipulator (see 3.1.13, A.4.2,
A.5.1.2, A.5.2) . 40
Figure A.3 – Die pattern and axis alignment for an EUT [26] (see A.3.2.3.2) . 41
Figure A.4 – Non-redundant twelve-face and axis orientations for a typical EUT [26]
(see A.3.2.3.2) . 42
Figure A.5 – Open-area test site (OATS) emission measurements geometry (see
A.3.2.4) . 43
Figure B.1 – Example of test set-up for single-polarization TEM waveguide
(see Clause B.5) . 47
Figure B.2 – Uniform area calibration points in a TEM waveguide (see Clause B.3) . 48
Figure C.1 – Pulse waveform frequency domain spectral magnitude between 100 kHz
and 300 MHz (see C.2.1) . 55
Figure D.1 – Simple waveguide (no TEM mode) (see D.3.3) . 61
Figure D.2 – Example of waveguides supporting TEM-mode propagation (see D.3.3) . 61
Figure D.3 – E-field polarization vector (see Clause D.5) . 61
Figure D.4 – Simple transmission line model for TEM mode propagation (see D.6.1) . 62
Figure D.5 – One- and two-port TEM waveguide concepts (see D.6.1) . 62
Figure D.6 – Operation of four-port TEM waveguides (see D.6.1) . 62
Figure D.7 – Two-port TEM cell (symmetric septum) (see D.6.1 and D.6.3) . 63
Figure D.8 – One-port TEM cell (asymmetric septum) (see D.6.1 and D.6.3) . 64
Figure D.9 – Stripline (two plates) (see D.6.1 and D.6.2) . 66
Figure D.10 – Stripline (four plates, balanced feed) (see D.6.1) . 67
Figure D.11 – Four-port TEM waveguide (symmetric parallel septa) (see D.6.1 and
D.6.3) . 68
Figure E.1 – Example of test points for calibration volume validation (see E.2.3) . 77
Figure E.2 – Set-up for validation of probe perturbation (see E.2.5) . 77
Figure E.3 – Set-up for measuring net power to a transmitting device (not to scale)
(see E.3.4
...
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