SIST EN 61338-1-3:2002

Waveguide type dielectric resonators -- Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

Describes the measurement methods of the complex relative permittivity of dielectric resonator materials at microwave frequencies by means of the dielectric rod resonator method short-circuited at both ends by parallel conducting plates.

Dielektrische Resonatoren vom Wellenleitertyp -- Teil 1-3: Allgemeine Informationen und Prüfbedingungen - Meßverfahren für die relative Dielektrizitätskonstante von dielektrischen Resonatorwerkstoffen im Mikrowellen-Frequenzbereich

Résonateurs diélectriques à modes guidés -- Partie 1-3: Informations générales et conditions d'essais - Méthode de mesure de la permittivité relative complexe des matériaux diélectriques pour les résonateurs diélectriques fonctionnant aux hyperfréquences

Décrit les méthodes de mesure de la permittivité relative complexe des matériaux pour résonateurs diélectriques fonctionnant aux hyperfréquences par la méthode du résonateur diélectrique ayant la forme d'un barreau court-circuité aux deux extrémités par les lames conductrices parallèles.

Waveguide type dielectric resonators - Part 1-3: General information and test conditions (IEC 61338-1-3:1999)

General Information

• Status: Published
• Publication Date: 31-Aug-2002
• ICS: 31.140 - Piezoelectric devices
• ICS: 33.120.10 - Coaxial cables. Waveguides
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Sep-2002
• Due Date: 01-Sep-2002
• Completion Date: 01-Sep-2002
• Ref Project: EN 61338-1-3:2000 - Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

Overview

EN 61338-1-3:2000 (CLC) specifies a standardized measurement method for the complex relative permittivity of dielectric resonator materials at microwave frequencies. The method uses a dielectric rod resonator short‑circuited at both ends by parallel conducting plates (waveguide‑type dielectric resonator). It defines test conditions, measurement parameters, theoretical equations and practical apparatus to determine the real permittivity, loss factor and temperature behavior of dielectric materials used in microwave components.

Key topics and requirements

• Measured parameters
  • ε' (real part of complex relative permittivity)
  • tan δ (loss factor)
  • TCF (temperature coefficient of resonance frequency)
  • Temperature dependence of tan δ
• Measurement method
  • Dielectric rod resonator method using TE mode resonance short‑circuited by parallel conducting plates.
  • Determination of ε' from resonance frequency and specimen dimensions using waveguide/ resonator theory (guiding wavelength, Bessel functions).
  • Extraction of tan δ from the measured unloaded quality factor (Qu) and plate conductivity correction.
• Apparatus & specimen
  • Specification of standard dielectric rods, test specimen preparation, conducting plate dimensions/materials, and temperature control fixtures.
  • Measurement equipment includes network analyzer or resonant‑cavity setup, coupling probes, and temperature chamber.
• Performance and ranges
  • Applicable frequency range: ~2 GHz to 20 GHz
  • Relative permittivity: 5 < ε' < 500
  • Loss factor sensitivity suitable for very low tan δ values (typical microwave dielectric ranges)
  • Emphasis on accuracy, repeatability and error estimation (including plate conductivity, air gaps and size effects).
• Theory & calculations
  • Full analytical treatment linking measured resonance frequency and Qu to material properties, with guidance on numerical solution and software implementation.

Applications and users

• Material manufacturers developing high‑ε, low‑loss microwave ceramics and dielectric powders.
• RF/microwave component designers specifying dielectric resonators, filters, oscillators and antennas.
• Test laboratories and R&D groups performing material characterization and quality control.
• Standards bodies and certification labs needing reproducible, traceable permittivity and loss measurements for component qualification.

Practical value

• Provides a reproducible, well‑documented route to characterize dielectric resonator materials for microwave circuit design.
• Integrates theoretical equations with measurement procedures and error estimation for reliable material data used in EM simulation and component design.

Related standards

• IEC/EN 61338 series (waveguide type dielectric resonators): Part 1‑1 and Part 1‑2 cover general information and test conditions; Parts 2 and 3 are referenced as further guidance or outlines.

Keywords: EN 61338-1-3, IEC 61338, dielectric rod resonator, complex relative permittivity, microwave frequency, dielectric resonator materials, TE mode, tan δ, temperature coefficient of resonance frequency.

Standards Content (Sample)

SLOVENSKI STANDARD
01-september-2002
Waveguide type dielectric resonators - Part 1-3: General information and test
conditions (IEC 61338-1-3:1999)
Waveguide type dielectric resonators -- Part 1-3: General information and test conditions
- Measurement method of complex relative permittivity for dielectric resonator materials
at microwave frequency
Dielektrische Resonatoren vom Wellenleitertyp -- Teil 1-3: Allgemeine Informationen und
Prüfbedingungen - Meßverfahren für die relative Dielektrizitätskonstante von
dielektrischen Resonatorwerkstoffen im Mikrowellen-Frequenzbereich
Résonateurs diélectriques à modes guidés -- Partie 1-3: Informations générales et
conditions d'essais - Méthode de mesure de la permittivité relative complexe des
matériaux diélectriques pour les résonateurs diélectriques fonctionnant aux
hyperfréquences
Ta slovenski standard je istoveten z: EN 61338-1-3:2000
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
33.120.10 Koaksialni kabli. Valovodi Coaxial cables. Waveguides
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
61338-1-3
INTERNATIONAL
Première édition
STANDARD
First edition
1999-11
Résonateurs diélectriques à modes guidés –
Partie 1-3:
Informations générales et conditions d'essais –
Méthode de mesure de la permittivité relative
complexe des matériaux diélectriques pour les
résonateurs diélectriques fonctionnant aux
hyperfréquences
Waveguide type dielectric resonators –
Part 1-3:
General information and test conditions –
Measurement method of complex relative
permittivity for dielectric resonator materials at
microwave frequency
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61338-1-3 © IEC:1999 – 3 –
CONTENTS
Page
FOREWORD . 7
INTRODUCTION . 11
Clause
1 Scope and object . 13
2 Measuring parameters . 13
3 Theory and calculation equations. 15
3.1 Relative permittivity and loss factor. 15
3.2 Determination of the relative conductivity of conducting plates. 21
3.3 Temperature coefficient of resonance frequency. 23
3.4 Temperature dependence of tan δ. 27
4 Preparation of dielectric specimen . 27
4.1 Preparation of standard dielectric rods. 27
4.2 Preparation of test specimen . 29
5 Measurement equipment and apparatus. 29
5.1 Measurement equipment. 29
5.2 Measurement apparatus for complex permittivity. 31
5.3 Measurement apparatus for temperature coefficient. 35
6 Measurement procedure . 35
6.1 Measurement procedure for complex permittivity . 35
6.2 Measurement procedure for temperature coefficient. 41
7 Accuracy and error estimation. 41
7.1 Measurement error due to the size of conducting plates. 41
7.2 Measurement error of relative conductivity. 43
7.3 Errors due to the airgap between dielectric rod and conducting plates or
to field disturbance . 45
7.4 Result of round robin test (RRT) . 45
Annex A – Bibliography . 47
Figures
Figure 1 – Configuration of a cylindrical dielectric rod resonator short-circuited at both
ends by two parallel conducting plates . 15
Figure 2 – Chart for relative permittivity calculation using TE mode. 17
"01
Figure 3 – Confirmation of standard dielectric rod resonators for measurement
of conductivity of conducting plates . 21
Figure 4 – Temperature dependence of f (figure 4a) and tan δ (figure 4b) for
five kinds of dielectrics (ε' = 21, 25, 30, 38 and 90) . 25
Figure 5 – Mode chart of a dielectric rod resonator short-circuited at both ends
by parallel conducting plates . 31
Figure 6 – Schematic diagram of measurement equipment. 33
Figure 7 – Measurement apparatus for complex permittivity . 33

61338-1-3 © IEC:1999 – 5 –
Figure 8 – Measurement apparatus for temperature coefficient . 35
Figure 9 – Frequency response for TE mode resonator having ε' = 37,5, d = 8,00 mm
and h = 3,3 mm . 39
Figure 10 – Insertion attenuation IA , resonance frequency f and
0 0
half-power bandwidth Δf . 39
Figure 11 – Measurement error on ε' and tan δ by the size ratio d'/d. 43
Tables
Table 1 – Examples of dimensions for standard dielectric rods. 27
Table 2 – Example of TE mode resonance frequency for various ε′ and
dimensions of a dielectric specimen . 29
Table 3 – Recommended dimensions and materials for conducting plate . 35

61338-1-3 © IEC:1999 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
––––––––––––
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 1-3: General information and test conditions –
Measurement method of complex relative permittivity for
dielectric resonator materials at microwave frequency
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61338-1-3 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
The text of this standard is based on the following documents:
FDIS Report on voting
49/444/FDIS 49/449/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
Annex A is for information only.
This standard forms part 1-3 of IEC 61338.

61338-1-3 © IEC:1999 – 9 –
IEC 61338, Waveguide type dielectric resonators, consists of the following parts:
Part 1-1: General information and test conditions – General information (IEC 61338-1-1)
Part 1-2: General information and test conditions – Test conditions (IEC 61338-1-2)
Part 1-3: General information and test conditions – Measurement method of complex relative
permittivity for dielectric resonator materials at microwave frequency (IEC 61338-1-3)
Part 2: Guide to the use of waveguide type dielectric resonators (IEC 61338-2) (under
consideration)
Part 3: Standard outlines (IEC 61338-3) (under consideration)
The committee has decided that this publication remains valid until 2003. At this date, in
accordance with the committee's decision, the publication will be
• reconfirmed;
 withdrawn;
 replaced by a revised edition, or
 amended.
61338-1-3 © IEC:1999 – 11 –
INTRODUCTION
Dielectric materials for microwave resonators and filters have high relative permittivity, a low
loss factor and superior temperature stability of resonance frequencies. Knowledge of these
parameters is of primary importance for the development of new materials on the supplier side
and for the design of dielectric microwave components on the customer side.
The parameters of dielectric resonator materials needed for the design of microwave
components are:
– the real component ε' of the complex relative permittivity;
– the loss factor tan δ;
– the temperature coefficient of resonance frequency (TCF);
– the temperature dependence of tan δ.
Several measurement methods are proposed to determine the complex permittivity at
microwave frequencies:
– the dielectric rod resonator method using TE resonance mode;
– the cylindrical cavity method using TE resonance mode;
01δ
– the perturbation method using a cylindrical cavity;
– the S-parameter method using a coaxial line.

61338-1-3 © IEC:1999 – 13 –
WAVEGUIDE TYPE DIELECTRIC RESONATORS –
Part 1-3: General information and test conditions –
Measurement method of complex relative permittivity for
dielectric resonator materials at microwave frequency
1 Scope and object
This part of IEC 61338 describes the dielectric rod resonator measurement method for a wide
range of microwave dielectric properties in practical applications. This method has the
following characteristics:
– a complete and exact mathematical solution of complex relative permittivity is given by
easy computer software;
–4
– the measurement error is less than 0,3 % for ε′ and less than 0,05 × 10 for tan δ;

– the TCF is directly measured without any compensation with a measurement error less
–6
than 1 × 10 /K.
The object of this standard is to describe the measurement methods of the complex relative
permittivity of dielectric resonator materials at microwave frequencies by means of the
dielectric rod resonator method short-circuited at both ends by parallel conducting plates. The
measuring parameters are ε′, tan δ, TCF and the temperature dependence of tan δ at the
resonance frequency. The dielectric materials are assumed to be isotropic and homogeneous.
2 Measuring parameters
The terms of the measuring parameters are defined as follows:
ε = ε' – jε'' = D/(ε E)(1)
r 0
tan δ = ε''/ε' (2)
TCF = − TC ε − α (3)
where
D is the electric flux density;
E is the electric field strength;
ε is the electric constant;
ε ε ε
' and '' are the real and imaginary components of the complex relative permittivity .
r
It should be noted that the TCF is defined by equation (3) as the material constant, TCε being
the temperature coefficient of relative permittivity and α the coefficient of thermal expansion
of the dielectric specimen. Each of the temperature coefficients is given as follows:

61338-1-3 © IEC:1999 – 15 –
f − f
T ref
–6
TCF =   × (1 × 10 /K) (4)
T − T
f
ref
ref
ε − ε
T ref
–6
TCε =   ×  (1 × 10 /K) (5)
ε T − T
ref ref
1 h − h
T ref
–6
α =  × 10 (1 × 10 /K) (6)
h T − T
ref ref
where
f and f are the resonance frequencies at temperature T and reference temperature T
T ref ref
(T = 20 °C to 25 °C);
ref
ε and ε are the real parts of the complex relative permittivity at temperatures T and T ;
T ref ref
h and h are the lengths of the dielectric specimen which is assumed to be isotropic at

T ref
temperatures T and T .
ref
The applicable measuring ranges of dielectric properties for this method are the following:
– frequency: 2 GHz < f < 20 GHz;
– relative permittivity: 5 < ε′ < 500;
–5 –2
– loss factor: 10 < tan δ < 10 .
3 Theory and calculation equations
3.1 Relative permittivity and loss factor
Figure 1 shows the configuration of the TE mode resonator. A cylindrical dielectric rod is
"0m
short-circuited at both ends by the two parallel conducting plates, thus constituting a
resonator. The values ε′ and tan δ of this resonator are calculated from the measured
resonance frequency (f ) and unloaded quality factor (Q ) of the TE mode resonance:
0 u "0m
TE , TE and TE modes are commonly used.
011 012 013
IEC  1574/99
Figure 1 – Configuration of a cylindrical dielectric rod resonator short-circuited at both ends
by two parallel conducting plates

61338-1-3 © IEC:1999 – 17 –
The relative permittivity ε′ is calculated using the measured resonance frequency, the
*
diameter d and the height h of the dielectric specimen .
The free space resonance wavelength λ and the guiding wavelength in the dielectric
transmission line λ are given by the following equations:
g
c 2 h
λ = , λ = , � = 1, 2 . . . (7)
0 g
f"0
where c is the velocity of light in a vacuum (c = 2,9979 × 10 m/s).
The value ν is calculated next from λ and λ :
0 g
 
 
 
πd λ
2 0
 
 
ν =   − 1 (8)
 
 
 
λ λ
 0  g
 
 
 
2 2
Using the value ν , the value u is given by the following transcendental equation:
J (u) K (ν )
0 0
u = −ν (9)
J (u) K (ν )
l l
where J (u) is the Bessel function of the first kind and K (v) is the modified Bessel function
n n
of the second kind. For any value of v, the mth solution u exists between u and u ,
0m 1m
where J (u ) = 0 and J (u ) = 0. The first solution (m = 1) is shown in figure 2 by curve A.
0 0m 1 1m
IEC  1575/99
Figure 2 – Chart for relative permittivity calculation using TE mode
"01
––––––––-
*
In the following text of this standard, the height is identical with the length, because the bar to be measured is
placed vertically in the measuring fixture.

61338-1-3 © IEC:1999 – 19 –
2 2
The relative permittivity is calculated from v and u :
 
λ
2 2
 
ε ′ = ()+ +1 (10)
u v
 
πd
 
In the following, tan δ is given from the measured unloaded Q:
A A B′
tan δ =  − =  − (11)
BR
s
Q Q
σ
u u r
where
π f μ π f μ f
−2
0 0 0
R = = = 0,825 × 10 (12)
s
σ σ σ σ
0 r r
R being expressed in ohms (Ω) and f in gigahertz (GHz)
s 0
 
σ
=   (13)
σ
r
 
σ
 
W
A = 1 + (14)
ε ′
 
λ 1 + W π f μ
0 0
 
B = , B′ = B (15)
 
λ σ
30 π ε ′" 0
g
 
2 2
J (u) K (v) k (v) − K (v)
l 0 2 l
W = (16)
2 2
K (v) J (u) − J (u) J (u)
l l 0 2
In equation (12), R and σ are the surface resistance and the conductivity of conducting
s
plates, respectively. The relative conductivity σ , defined in equation (13), is the ratio of
r
the measured conductivity to the conductivity of the international standard annealed copper
σ (σ = 5,8 × 10 S/m at 20 °C). σ is used instead of R because σ is independent of
0 0 r s r
frequency.
–2 7
The constant (0,825 × 10 ) in equation (12) is calculated from the value σ = 5,8 × 10 S/m
–7
and the magnetic constant μ = 4 π × 10 H/m since μ equals μ in a non-magnetic dielectric
0 0
specimen.
The function W/ε′ equals the ratio of the electric-field energy stored outside to that inside the
dielectric rod. If all of the electric field energy is concentrated inside the dielectric rod, the
value W equals zero. The computed result of the W – v relation for m = 1 of the TE mode
"0m
resonance is shown in figure 2 by curve B.

61338-1-3 © IEC:1999 – 21 –
3.2 Determination of the relative conductivity of conducting plates
As equation (11) shows, the effective value of R or σ of the conducting plates, which are
s r
commonly made of silver or copper, shall be determined in advance of the calculation of tan δ.
The accuracy of measured σ has vital importance in the determination of tan δ because the
r
terms (A/Q ) and (B'/ σ ) have the same order of magnitude for a low-loss dielectric
u r
–4
specimen with tan δ in the order of 10 .
The effective value of σ of the conducting plates shall be measured not at direct current but
r
at microwave frequencies due to the skin effect on conductivity. In order to measure σ , two
r
dielectric rod samples which are called standard dielectric rod resonators are used. As
figure 3 shows, these two rods have the same diameter but different heights. The rod heights
are such that one rod is " times the height of the other; " is commonly set equal to three.
The rod heights are cut from one cylindrical dielectric rod and have the same values of ε′ and
tan δ.
Figure 3 shows the configuration of the standard dielectric rod resonators in the case of " = 3.
The resonance frequency and unloaded Q of the TE mode are measured using the shorter
rod, and those of the TE mode are measured using the higher rod. We denote the f and
0 "01
Q for each resonator by using the subscripts 1 and ", respectively: f and Q for the
u 01 u1
shorter rod, and f and Q for the higher rod.
0""u
When the higher rod is precisely " times higher than the shorter rod, f coincides with f .
0"
But Q is higher than Q according to the different magnitude of conductor loss on the
u1 "u
conducting plates.
IEC  1576/99 IEC  1577/99
Figure 3a – TE mode resonance Figure 3b – TE mode resonance
011 013
Figure 3 – Configuratio
...