SIST EN 62670-3:2017

Photovoltaic concentrators (CPV) - Performance testing - Part 3: Performance measurements and power rating

This part of IEC 62670 defines measurement procedures and instrumentation for determining
concentrator photovoltaic performance at concentrator standard operating conditions (CSOC)
and concentrator standard test conditions (CSTC), defined in IEC 62670-1, including power
ratings.

Konzentrator-Photovoltaik (CPV) - Leistungsmessung - Teil 3: Leistungsmessungen und Leistungsbemessung

Concentrateurs photovoltaïques (CPV) - Essai de performances - Partie 3: Mesurages de performances et rapport de puissance

L'IEC 62670-3:2017 spécifie des procédures de mesure et des instruments permettant d'établir les performances des concentrateurs photovoltaïques dans des conditions de fonctionnement normales du concentrateur (CSOC) et des conditions d’essais normales du concentrateur (CSTC) définies dans l'IEC 62670-1, y compris les rapports de puissance.

Fotonapetostni koncentratorji (CPV) - Preskušanje zmogljivosti - 3. del: Meritve zmogljivosti in energijske učinkovitosti

Ta del standarda IEC 62670 določa merilne postopke in instrumente za določevanje zmogljivosti fotonapetostnih koncentratorjev v standardnih pogojih delovanja koncentratorjev (CSOC) in standardnih preskusnih pogojih za koncentratorje (CSTC), ki so opredeljeni v standardu IEC 62670-1, vključno z nazivnimi močmi.

General Information

• Status: Published
• Publication Date: 08-Jun-2017
• ICS: 27.160 - Solar energy engineering
• Technical Committee: PVS - Solar photovoltaic energy systems
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 31-May-2017
• Due Date: 05-Aug-2017
• Completion Date: 09-Jun-2017
• Ref Project: EN 62670-3:2017 - Photovoltaic concentrators (CPV) - Performance testing - Part 3: Performance measurements and power rating

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62670-3:2017
01-julij-2017
)RWRQDSHWRVWQLNRQFHQWUDWRUML&393UHVNXãDQMH]PRJOMLYRVWLGHO0HULWYH
]PRJOMLYRVWLLQHQHUJLMVNHXþLQNRYLWRVWL
Photovoltaic concentrators (CPV) - Performance testing - Part 3: Performance
measurements and power rating
Ta slovenski standard je istoveten z: EN 62670-3:2017
ICS:
27.160 6RQþQDHQHUJLMD Solar energy engineering
SIST EN 62670-3:2017 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62670-3:2017

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SIST EN 62670-3:2017


EUROPEAN STANDARD EN 62670-3

NORME EUROPÉENNE

EUROPÄISCHE NORM
May 2017
ICS 27.160

English Version
Photovoltaic concentrators (CPV) - Performance testing - Part 3:
Performance measurements and power rating
(IEC 62670-3:2017)
Concentrateurs photovoltaïques (CPV) - Essai de Konzentrator-Photovoltaik (CPV) - Leistungsmessung - Teil
performances - Partie 3: Mesurages de performances et 3: Leistungsmessungen und Leistungsbemessung
rapport de puissance (IEC 62670-3:2017)
(IEC 62670-3:2017)
This European Standard was approved by CENELEC on 2017-03-14. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 62670-3:2017 E

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SIST EN 62670-3:2017
EN 62670-3:2017
European foreword
The text of document 82/1204/FDIS, future edition 1 of IEC 62670-3, prepared by IEC/TC 82 “Solar
photovoltaic energy systems" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 62670-3:2017.

The following dates are fixed:
(dop) 2017-12-14
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2020-03-14
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice
The text of the International Standard IEC 62670-3:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following note has to be added for the standards indicated:
IEC 60904-5 NOTE Harmonized as EN 60904-5.

2

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SIST EN 62670-3:2017
EN 62670-3:2017

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60891 -  Photovoltaic devices - Procedures for EN 60891 -
temperature and irradiance corrections to
measured I-V characteristics
IEC 60904-2 -  Photovoltaic devices - Part 2: EN 60904-2 -
Requirements for photovoltaic reference
devices
IEC 60904-3 -  Photovoltaic devices - Part 3: EN 60904-3 -
Measurement principles for terrestrial
photovoltaic (PV) solar devices with
reference spectral irradiance data
IEC 60904-4 2009 Photovoltaic devices - Part 4: Reference EN 60904-4 2009
solar devices - Procedures for establishing
calibration traceability
IEC 60904-10 -  Photovoltaic devices - Part 10: Methods of EN 60904-10 -
linearity measurement
IEC 62670-1 -  Photovoltaic concentrators (CPV) - EN 62670-1 -
Performance testing - Part 1: Standard
conditions
IEC 62817 2014 Solar trackers for photovoltaic systems - EN 62817 2015
Design qualification
ISO 2859-1 -  Sampling procedures for inspection by - -
attributes - Part 1: Sampling schemes
indexed by acceptance quality limit (AQL)
for lot-by-lot inspection
ISO 9060 1990 Solar energy; specification and - -
classification of instruments for measuring
hemispherical solar and direct solar
radiation
ISO/IEC 17025 -  General requirements for the competence EN ISO/IEC 17025 -
of testing and calibration laboratories

3

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SIST EN 62670-3:2017




IEC 62670-3

®


Edition 1.0 2017-02




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Photovoltaic concentrators (CPV) – Performance testing –

Part 3: Performance measurements and power rating




Concentrateurs photovoltaïques (CPV) – Essai de performances –

Partie 3: Mesurages de performances et rapport de puissance
















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 27.160 ISBN 978-2-8322-3859-2



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 62670-3:2017
– 2 – IEC 62670-3:2017 © IEC 2017
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Concepts . 7
4 Sampling . 11
5 DUT marking and information . 11
5.1 Indelible marking . 11
5.2 Preliminary information indicated by manufacturer . 11
6 Testing . 11
7 Report . 12
8 Standard apparatus requirements . 13
8.1 Irradiance measurement equipment . 13
8.1.1 Normal incidence pyrheliometer (NIP) . 13
8.1.2 Global normal irradiance pyranometer . 13
8.1.3 Spectral measurement device . 13
8.1.4 Component reference cells . 14
8.1.5 Indoor reference irradiance sensor . 14
8.1.6 Auxiliary irradiance sensor . 15
8.2 Solar simulator . 15
8.2.1 General requirements . 15
8.2.2 Continuous light simulator . 15
8.2.3 Single-flash pulse simulator . 16
8.2.4 Multi-flash pulse simulator . 16
8.3 Solar tracker or DUT mounting system . 16
8.3.1 General . 16
8.3.2 Pointing error sensor . 16
8.4 Temperature measurement and control . 16
8.4.1 DUT temperature sensor . 16
8.4.2 Ambient temperature sensor . 16
8.4.3 Lens or optics temperature sensor . 16
8.4.4 Temperature control system . 17
8.5 Current-voltage measurement . 17
8.6 Anemometer . 17
8.7 Electrical load . 17
9 Test procedures . 18
9.1 Measurement of DUT temperature coefficients . 18
9.1.1 Purpose . 18
9.1.2 Apparatus . 18
9.1.3 Data collection procedure and data requirements . 18
9.1.4 Temperature coefficient determination . 21
2
9.2 DUT reference V at (900 W/m and 25 °C cell temperature) . 22
oc
9.2.1 General . 22
9.2.2 Reference V dark I-V procedure . 22
oc
9.2.3 Reference V using a solar simulator . 23
oc
9.3 Calculating the average DUT cell temperature . 23
9.3.1 Purpose . 23

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SIST EN 62670-3:2017
IEC 62670-3:2017 © IEC 2017 – 3 –
9.3.2 Procedure . 24
9.4 Reference irradiance sensor calibration and reference I determination . 24
sc
9.4.1 Purpose . 24
9.4.2 Data requirements . 24
9.4.3 Determination of the calibrated and reference I , (I and I ) . 24
sc sc, cal scr
9.4.4 Calibration requirement . 26
9.5 Indoor I-V measurements of a CPV DUT . 26
9.5.1 Purpose . 26
9.5.2 General measurement requirements . 26
9.5.3 DUT indoor alignment procedure . 28
9.5.4 Procedure for single-flash pulsed solar simulators . 28
9.5.5 Procedure for multi-flash pulsed solar simulators . 28
9.6 Outdoor I-V measurements of a CPV DUT . 28
9.6.1 Purpose . 28
9.6.2 Apparatus . 28
9.6.3 Procedure . 29
9.6.4 Report . 29
9.7 CSOC and CSTC power ratings . 30
9.7.1 Data filtering requirements for CSOC or CSTC translation . 30
9.7.2 CSOC power determination . 31
9.7.3 CSTC power determination . 31
9.8 DUT alignment procedure and measurement of misalignment sensitivity . 32
9.8.1 Purpose . 32
9.8.2 Apparatus . 32
9.8.3 Recommendations for initial DUT mounting . 33
9.8.4 General requirements . 33
9.8.5 Individual off-axis sweeps and final DUT alignment . 33
9.8.6 Alternate ellipse plot procedure for reporting misalignment sensitivity . 34
9.8.7 Reporting . 34
9.9 Mounting and aligning the pointing error sensor and other alignment
sensitive equipment . 35
9.9.1 Purpose . 35
9.9.2 Procedure . 35
9.10 Outdoor lens temperature performance test . 35
9.10.1 General guidance . 35
9.10.2 Procedure . 36
9.10.3 Reporting . 37
9.11 Indoor lens temperature performance test . 38
9.11.1 General guidance . 38
9.11.2 Procedure . 38
9.11.3 Reporting . 39
Bibliography . 40

Figure 1 – Collimating tube geometry . 9
Figure 2 – Solar tracker pointing error . 10
Figure 3 – Example of acceptance angle data for a CPV DUT . 10
Figure 4 – Flow chart of performance testing for the DUT . 12
Figure 5 – V data after an uncover event . 20
oc

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SIST EN 62670-3:2017
– 4 – IEC 62670-3:2017 © IEC 2017
Figure 6 – Figure 5 repeated after removing one data point . 21
Figure 7 – The derivative of dark I-V data plotted to determine R . 23
s
Figure 8 – Iterative approach to determine I and V . 26
sc oc
Figure 9 – Raw data for extracting the impact of lens temperature . 37
Figure 10 – Filtered data for extracting impact of lens temperature . 37

Table 1 – SMR requirements for indoor measurements . 27

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SIST EN 62670-3:2017
IEC 62670-3:2017 © IEC 2017 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

PHOTOVOLTAIC CONCENTRATORS (CPV) –
PERFORMANCE TESTING –

Part 3: Performance measurements and power rating

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62670-3 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
The text of this standard is based on the following documents:
FDIS Report on voting
82/1204/FDIS 82/1233/RVD

Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 62670 series, published under the general title Photovoltaic
concentrators (CPV) – Performance testing, can be found on the IEC website.

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SIST EN 62670-3:2017
– 6 – IEC 62670-3:2017 © IEC 2017
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

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SIST EN 62670-3:2017
IEC 62670-3:2017 © IEC 2017 – 7 –
PHOTOVOLTAIC CONCENTRATORS (CPV) –
PERFORMANCE TESTING –

Part 3: Performance measurements and power rating



1 Scope
This part of IEC 62670 defines measurement procedures and instrumentation for determining
concentrator photovoltaic performance at concentrator standard operating conditions (CSOC)
and concentrator standard test conditions (CSTC), defined in IEC 62670-1, including power
ratings.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60891, Photovoltaic devices – Procedures for temperature and irradiance corrections to
measured I-V characteristics
IEC 60904-2, Photovoltaic devices – Part 2: Requirements for photovoltaic reference devices
IEC 60904-3, Photovoltaic devices – Part 3: Measurement principles for terrestrial
photovoltaic (PV) solar devices with reference spectral irradiance data
IEC 60904-4:2009, Photovoltaic devices – Part 4: Reference solar devices – Procedures for
establishing calibration traceability
IEC 60904-10, Photovoltaic devices – Part 10 Methods of linearity measurement
IEC 62670-1, Photovoltaic concentrators (CPV) – Performance testing – Part 1: Standard
conditions
IEC 62817:2014, Photovoltaic systems – Design qualification of solar trackers
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories
ISO 2859-1, Sampling procedures for inspection by attributes – Part 1:Sampling schemes
indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 9060:1990, Solar energy – Specification and classification of instruments for measuring
hemispherical solar and direct solar radiation
3 Concepts
The following concepts are used through this document.

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SIST EN 62670-3:2017
– 8 – IEC 62670-3:2017 © IEC 2017
a) CSOC – concentrator standard operating conditions per IEC 62670-1 (direct normal
2
irradiance (DNI) 900 W/m , 20 °C ambient temperature, 2 m/s wind speed, AM1.5D
spectrum per IEC 60904-3).
2
b) CSTC – concentrator standard test conditions per IEC 62670-1 (DNI 1 000 W/m , 25 °C
cell temperature, AM1.5D spectrum per IEC 60904-3).
I I
i j
c) SMR – spectral matching ratio, where I and I are the short-circuit
SMR(i, j)=
i j
I I
i,ref j,ref
current or short-circuit current densities under prevailing spectral conditions per the i and j
distinct subcells in the multi-junction solar cell. I and I are the associated short-
i,ref j,ref
circuit currents/current densities under the AM 1.5 direct spectrum as defined by
IEC 60904-3. The subcell is assigned a number in the ordering of their band gap energy
(Eg) starting with 1 for the highest Eg and up to n for the lowest Eg. In this manner a multi-
junction solar cell with n distinct sub cells has (n²–n)/2 unique SMR values. For example,
for n = 3 (three-junction device) there is SMR(1,2), SMR(1,3) and SMR(2,3). For a lattice
matched triple junction cell: GaInP is junction 1, GaInAs is junction 2, and Ge is junction 3.
SMR as applied to outdoor I-V curves does NOT imply that the outputs from subcells will
match the DUT but to a more generic set of subcells used by the test laboratory to
characterize deviations in the prevailing outdoor spectrum from the reference AM1.5D
spectrum. A specific DUT match is not required as precipitable water vapor, aerosols, and
airmass are the dominant variables which drive changes in the outdoor spectrum. It has
been shown that filtering based on measurements in three sub-bands of the spectrum is
sufficient to minimize CPV DUT performance variation. Component reference cells (8.1.4)
can be used to determine SMR values or the SMR can be calculated under the prevailing
spectrum. In this case I , I and I are generally defined as the direct normal spectral
1 2 3
irradiance in sub-bands from 370 nm to 650 nm, 650 nm to 870 nm and 870 nm to
1 650 nm respectively. This is equivalent to assuming a set of component reference cells
which have external quantum efficiencies (EQE) of 100 % in the defined bands.
SMR as applied to indoor I-V curves DOES refer to outputs from the subcells that match
the DUT. The indoor measurements specifically refer to matching subcells as the spectrum
under simulated sunlight is known to deviate from the characteristic shape of the outdoor
spectrum. Therefore three sub-bands are not always sufficient to minimize variation in
CPV DUT performance. SMR can be determined from device specific component
reference cells or can be calculated from the measured spectrum and the spectral
responses of device specific component reference cells.
d) Separate SMR crossing – event in outdoor data measurements where the given SMR
value is within the defined boundaries around unity and the event is separated by at least
an hour from other events where the SMR value is within the defined boundaries around
unity.
e) MPP – global maximum power point of an I-V curve.
f) V – the voltage at MPP.
mp
g) I – the current at MPP.
mp
h) DNI– direct normal irradiance.
i) GNI– global normal irradiance.
j) η – efficiency of the DUT at MPP for an individual I-V curve.
k) DUT – device under test.
l) Aperture – aperture area of the DUT, measured from inside edge to inside edge of the
DUT frame. If no clear transition from lens to frame is present an opaque tape can be
used to mask off the edge of lens area and define the edge of the aperture area. This shall
be completed prior to the collection of I-V curves. If this method is not applicable to the
DUT, alternate methods can be considered. The test report shall document the procedure
used for determining aperture area.
m) Opening half-angle – half-an
...