SIST EN ISO 4288:2000
(Main)Geometrical product specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (ISO 4288:1996)
Geometrical product specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (ISO 4288:1996)
Specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in ISO 4287, ISO 12085, ISO 13565-2 and ISO 13565-3. It also gives rules for measuring roughness profile parameters by using stylus instruments according to ISO 3274. Replaces the first edition.
Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit: Tastschnittverfahren - Regeln und Verfahren für die Beurteilung der Oberflächenbeschaffenheit (ISO 4288:1996)
Diese Internationale Norm beschreibt Regeln für den Vergleich zwischen den gemessenen Werten und den Toleranzgrenzen für Oberflächenkenngrößen, die in ISO 4287, ISO 12085, ISO 13565-2 und ISO 13565-3 definiert sind. Sie legt außerdem die Auswahl der Grenzwellenlängen lc für die Messung von Kenngrößen am Rauheitsprofil nach ISO 4287 bei der Anwendung von Tastschnittgeräten nach ISO 3276 fest.
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil - Regles et procédures pour l'évaluation de l'état de surface (ISO 4288:1996)
La présente Norme internationale prescrit les règles et les procédures pour la comparaison aux limites de tolérances des valeurs mesurées des paramètres d'état de surface définis dans l'ISO 4287, l'ISO 12085, l'ISO 13565-2 et l'ISO 13565-3. Elle prescrit également les conventions à retenir pour le choix de la longueur d'onde de coupure, λc, lors de la mesure des paramètres de rugosité conformément à l'ISO 4887 à l'aide d'appareils à contact (palpeur) conformément à l'ISO 3274.
Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda - Pravila in postopki za ocenitev teksture površine (ISO 4288:1996)
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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit: Tastschnittverfahren - Regeln und Verfahren für die Beurteilung der Oberflächenbeschaffenheit (ISO 4288:1996)Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil - Regles et procédures pour l'évaluation de l'état de surface (ISO 4288:1996)Geometrical product specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture (ISO 4288:1996)17.040.20Lastnosti površinProperties of surfacesICS:Ta slovenski standard je istoveten z:EN ISO 4288:1997SIST EN ISO 4288:2000en01-december-2000SIST EN ISO 4288:2000SLOVENSKI
STANDARD
SIST EN ISO 4288:2000
SIST EN ISO 4288:2000
SIST EN ISO 4288:2000
SIST EN ISO 4288:2000
SIST EN ISO 4288:2000
INTERNATIONAL STANDARD IS0 4288 Second edition 1996-08-01 Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture Spkifica tion g6om&rique des produits (GPS) - ita t de surface: M&hode du profil- Regles et pro&dures pour I’baluation de Y&tat de surface Reference Number IS0 4288:1996(E) SIST EN ISO 4288:2000
IS0 4288:1996(E) Contents 1 2 3 4 4.1 4.2 4.3 4.4 5 5.1 5.2 5.3 5.4 6 6.1 6.2 7 7.1 7.2 Scope . Normative references . Definitions . Parameter estimation . Parameters defined over the sampling length . Parameters defined over the evaluation length . Curves and related parameters . Default evaluation lengths . Rules for comparison of the measured values with the tolerance limits . Areas on the feature to be inspected . The 16 % rule . The max.-rule . Uncertainty of measurement . Parameter evaluation . . General . Roughness profile parameters . Rules and procedures for inspection using stylus instruments . . Basic rules for the determination of cut-off wavelength for the measurement of roughness profile parameters . Measurement of roughness profile parameters . Page 1 1 1 2 2 2 2 2 2 2 2 3 3 3 3 3 4 4 4 0 IS0 1996 All rights reserved. Unless otherwise specified, no part of this publication may be repro- duced or utilized in any form or by any means, electronic or mechanical, including photo- copying and microfilm, without permission in writing from the publisher. International Organization for Standardization Case Postale 56 l CH-1211 Get-We 20 l Switzerland Printed in Switzerland SIST EN ISO 4288:2000
Q IS0 IS0 4288:1996(E) Annexes A Simplified procedure roughness inspection . 6 B Relation to GPS matrix model . 7 C Bibliography . 8 SIST EN ISO 4288:2000
IS0 4288: 1996(E) @ IS0 Foreword IS0 (the International Organization for Standardization) is a worldwide fed- eration of national standards bodies (IS0 member bodies). The work of preparing International Standards is normally carried out through IS0 technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. IS0 collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. International Standard IS0 4288 was prepared jointly by Technical Com- mittees lSO/TC 57, Metrology and properties of surfaces, Subcommittee SC 1, Geometrical parameters - Instruments and procedures for measurement of surface roughness and waviness, ISO/TC 3, Limits and fits and lSO/TC 10, Technical drawings, product definition and related documentation, Subcommittee SC 5, Dimensioning and tolerancing. This second edition cancels and replaces the first edition (IS0 4288:1985) which has been technically revised. It differs from the previous edition in that filter cut-off values are chosen based on the workpiece texture rather than the drawing indication. Fur- thermore, this International Standard includes rules for the determination of parameters other than Ra and Rz. This second edition covers roughness profile parameters, primary profile parameters and comparison of measured motif parameter values with given specification. It is envisaged that an amendment will be prepared covering M-system waviness profile parameters, for which there are currently no standardized rules. Annexes A, B and C of this International Standard are for information only. SIST EN ISO 4288:2000
@ IS0 IS0 4288: 1996(E) Introduction This International Standard is a geometrical product specification (GPS) standard and is to be regarded as a general GSP standard (see lSO/TR 14638). It influences the chain links 3 and 4 of the chains of stan- dards for roughness profile and primary profile. For more detailed information of the relation of this International Standard to other standards and the GPS matrix model see annex B. The discrimination between periodic and non-periodic profiles is subjective and left to the discretion of the user. SIST EN ISO 4288:2000
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NORME INTERNATIONALE 0 IS0 IS0 4288: 1996(E) Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and procedures for the assessment of surface texture 1 Scope This International Standard specifies the rules for comparison of the measured values with the tolerance limits for surface texture parameters defined in IS0 4287, IS0 12085, IS0 13565-2 and IS0 13565-3. It also specifies the default rules for selection of cut- off wavelength, ilc, for measuring roughness profile parameters according to IS0 4287 by using stylus instruments according to IS0 3274. 2 Normative references The following standards contain provisions which, through reference in this text, constitute provisions of this International Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on this International Standard are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of currently valid International Standards. IS0 1302:1992, Technical drawings - Method of indi- cating surface texture. IS0 3274: 1996, Geometrical Product Specifications W’S) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments. IS0 4287: 1996, Geometrical Product Specifications GW - Surface texture: Profile method - Terms, definitions and parameters of surface texture. IS0 12085:1996, Geometrical Product Specifications WV - Surface texture: Profile method - Motif par- ame ters. IS0 13565-I :I 996, Geometrical Product Specifi- cations (G PS) - Surface texture: Profile method; sur- faces having stratified functional properties - Part I: Filtering and general measurement conditions. IS0 13565-2:1996, Geometrical Product Specifi- cations (G PS) - Surface texture: Profile method; sur- faces having stratified functional properties - Part 2: Height characterization using the linear material ratio curve. IS0 13565-3:- 1 1, Geometrical Product Specifications (GPS) - Surface texture: Profile method; surfaces having stratified functional properties - Part 3: Height characterization using the material probability curve. IS0 14253-1: - 11, Geometrical Product Specifications (GPS) - Inspection by measurement of workpieces and measuring instruments - Part 7: Decision rules for proving conformance or non-conformance with specifications. 3 Definitions For the purposes of this International Standard, the definitions given in IS0 3274, IS0 4287, IS0 12085, IS0 13565-2 and IS0 13565-3 apply. 1) To be published. SIST EN ISO 4288:2000
IS0 4288: 1996(E) 4 Parameter estimation 4.1 Parameters defined over the sampling length 4.1 .I Parameter estimate An estimate of the parameter’s value is calculated using the measured data from only one sampling length. 4.12. Average parameter estimate An average parameter estimate is calculated by taking the arithmetic mean of the parameter estimates from all the individual sampling lengths. When the standard number of five sampling lengths is used for roughness profile parameters, no suffix needs to be added to the symbol. For a parameter evaluated over a number of sampling lengths other than five, that number shall be added as a suffix to the parameter symbol (eg. &I, &3). 4.2 Parameters defined over the evaluation length For parameters defined over the evaluation length (Pt, Rt and wt), an estimate of a parameter’s value is calculated by using measurement data from an evaluation length equal to the standardized number of sampling lengths. 4.3 Curves and related parameters For curves and parameter’s val related parameters, an ue is calculated by using estimate of a measurement data from one curve, wh on the evaluati on length. ich 4.4 Default evaluation engths If not otherwise indicated C In the d rawing or in the technical product length is as follows: las been computed based documentation, the evaluation - R-parameters: the evaluation length is defined in clause 7; - P-parameters: the evaluation length is equal to the length of the feature being measured; - motif-parameters: the evaluation length is defined in clause 5 of IS0 12085:1996; - parameters defined in IS0 13565-Z and IS0 13565-3: the evaluation length is defined in clause 7 of IS0 13565-1 :I 996. @ IS0 5 Rules for comparison of the measured values with the tolerance limits 5.1 Areas on the feature to be inspected The surface texture of the workpiece under inspection can appear homogeneous or be quite different over various areas. This can be seen by visual examination of the surface. In cases where the surface texture appears homogeneous, parameter values determined over the entire surface shall be used for comparison with the requirements specified on the drawings or in the technical product documentation. If there are separate areas with obviously different surface texture, the parameter values which are de- termined on each area shall be used separately for comparison with the requirements specified on the drawings or in the technical product documentation. For requirements specified by the upper limit of the parameter, those separate areas of the surface shall be used which appear to have the maximum par- ameter value. 5.2 The 16 %-rule For requirements specified by the upper limit (see IS0 1302:1992, 6.2.3) of a parameter, the surface is considered acceptable if not more than 16 % of all the measured values (see notes 1 and 2) of the selected parameter, based upon an evaluation length, exceed the value specified on the drawings or in the technical product documentation. For requirements specified by the lower limit of the surface parameter, the surface is considered accept- able if not more than 16 % of all the measured values (see notes 1 and 2) of the selected parameter, based upon an evaluation length, are less than the value specified on the drawings or in the technical product documentation. To designate the upper and the lower limits of the par- ameter, the symbol of the parameter shall be used without the “max.” index. NOTES 1 Annex A provides simplified practical guidance for com- paring measured values with upper and lower limits. 2 In cases where the values of the roughness profile par- ameter of the surface being inspected follow a normal dis- tribution, the determination of the upper limit as a limit which may be exceeded by 16 % of the measured values of the roughness profile parameter conforms with the limit determined by the value p + a, where p is the arithmetic mean value of the roughness profile parameter and c is the standard deviation of the values. The greater the value of o, the further from the specified limit (the upper value) the mean value of the roughness profile parameter needs to be. (See figure 1.) 2 SIST EN ISO 4288:2000
@ IS0 IS0 4288: 1996(E) Figure 1 5.3
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