SIST EN 62475:2011
High-current test techniques - Definitions and requirements for test currents and measuring systems (IEC 62475:2010)
High-current test techniques - Definitions and requirements for test currents and measuring systems (IEC 62475:2010)
This International Standard is applicable to high-current testing and measurements on both high-voltage and low-voltage equipment. It deals with steady-state and short-time direct current (as e.g. encountered in high-power d.c. testing), steady-state and short-time alternating current (as e.g. encountered in high-power a.c. testing), and impulse-current. In general, currents above 100 A are considered in this International Standard, although currents less than this can occur in tests. This standard: - defines the terms used; - defines parameters and their tolerances; - describes methods to estimate uncertainties of high-current measurements; - states the requirements which a complete measuring system shall meet; - describes the methods for approving a measuring system and checking its components; - describes the procedure by which the user shall show that a measuring system meets the requirements of this standard, including limits set for uncertainty of measurement.
Hochstrom-Prüftechnik - Begriffe und Anforderungen für Hochstrom-Messungen (IEC 62475:2010)
Techniques des essais à haute intensité - Définitions et exigences relatives aux courants d'essai et systèmes de mesure (CEI 62475:2010)
La CEI 62475:2010 s'applique aux essais et mesures à haute intensité sur des matériels haute et basse tensions. Elle couvre les essais à haute intensité en courant continu et courant alternatif en régime établi et de courte durée ainsi que des essais de courant de choc. De manière générale, la présente Norme internationale prend en compte des courants de plus de 100 A, même si des intensités moindres peuvent apparaître dans les essais. La présente norme couvre également la détection de défauts, comme par exemple dans le cadre d'essais aux chocs de foudre.
Visokotokovne preskusne tehnike - Definicije in zahteve za preskusne toke in merilne sisteme (IEC 62475:2010)
Ta mednarodni standard velja za visokotokovno preskušanja in merjenja za visokonapetostno in nizkonapetostno opremo. Obravnava ustaljeni in kratkotrajni enosmerni tok (kot je npr. pri preskušanju visokonapetostnega enosmernega toka), ustaljeni in kratkotrajni izmenični tok (kot je npr. pri preskušanju visokonapetostnega izmeničnega toka) ter impulzni tok. Na splošno se v tem mednarodnem standardu obravnavajo tokovi nad 100 A, čeprav se lahko v preskusih pojavijo manjši tokovi. Ta standard: - opredeljuje uporabljene izraze; - opredeljuje parametre in njihova odstopanja; - opisuje metode za ocenjevanje negotovosti meritev visokega toka; navaja zahteve, ki jih mora izpolnjevati celotni merilni sistem; - opisuje metode za odobritev merilnega sistema in preverjanje njegovih komponent; - opisuje postopke, s katerim uporabnik prikaže, da merilni sistem izpolnjuje zahteve tega standarda, vključno z mejnimi vrednostmi, postavljenimi za negotovost meritve.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 62475:2011
01-februar-2011
Visokotokovne preskusne tehnike - Definicije in zahteve za preskusne toke in
merilne sisteme (IEC 62475:2010)
High-current test techniques - Definitions and requirements for test currents and
measuring systems (IEC 62475:2010)
Hochstrom-Prüftechnik - Begriffe und Anforderungen für Hochstrom-Messungen (IEC
62475:2010)
Techniques des essais à haute intensité - Définitions et exigences relatives aux courants
d'essai et systèmes de mesure (CEI 62475:2010)
Ta slovenski standard je istoveten z: EN 62475:2010
ICS:
19.080 (OHNWULþQRLQHOHNWURQVNR Electrical and electronic
SUHVNXãDQMH testing
SIST EN 62475:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62475:2011
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SIST EN 62475:2011
EUROPEAN STANDARD
EN 62475
NORME EUROPÉENNE
December 2010
EUROPÄISCHE NORM
ICS 19.080
English version
High-current test techniques -
Definitions and requirements for test currents and measuring systems
(IEC 62475:2010)
Techniques des essais à haute intensité - Hochstrom-Prüftechnik -
Définitions et exigences relatives aux Begriffe und Anforderungen für
courants d'essai et systèmes de mesure Hochstrom-Messungen
(CEI 62475:2010) (IEC 62475:2010)
This European Standard was approved by CENELEC on 2010-12-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62475:2010 E
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SIST EN 62475:2011
EN 62475:2010 - 2 -
Foreword
The text of document 42/278/FDIS, future edition 1 of IEC 62475, prepared by IEC TC 42, High-voltage
testing techniques, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 62475 on 2010-12-01.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2011-09-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2013-12-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62475:2010 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60076-5:2000 NOTE Harmonized as EN 60076-5:2000 (not modified).
IEC 60099-4:2004 NOTE Harmonized as EN 60099-4:2004 (modified).
IEC 60265-1:1998 NOTE Harmonized as EN 60265-1:1998 (not modified).
IEC 60282-1:2009 NOTE Harmonized as EN 60282-1:2009 (not modified).
IEC 60947-1:2007 NOTE Harmonized as EN 60947-1:2007 (not modified).
IEC 60947-2:2006 NOTE Harmonized as EN 60947-2:2006 (not modified).
IEC 60947-3:2008 NOTE Harmonized as EN 60947-3:2009 (not modified).
IEC 61000-4-5 NOTE Harmonized as EN 61000-4-5.
IEC 61083-1:2001 NOTE Harmonized as EN 61083-1:2001 (not modified).
IEC 61083-2:1996 NOTE Harmonized as EN 61083-2:1997 (not modified).
IEC 61180-2:1994 NOTE Harmonized as EN 61180-2:1994 (not modified).
IEC 61230:2008 NOTE Harmonized as EN 61230:2008 (not modified).
IEC 61643-11 NOTE Harmonized as EN 61643-11.
IEC 61643-21 NOTE Harmonized as EN 61643-21.
IEC 62271-1 NOTE Harmonized as EN 62271-1.
IEC 62271-100:2008 NOTE Harmonized as EN 62271-100:2009 (not modified).
IEC 62271-101 NOTE Harmonized as EN 62271-101.
IEC 62271-102:2001 NOTE Harmonized as EN 62271-102:2002 (not modified).
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SIST EN 62475:2011
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IEC 62271-103 NOTE Harmonized as EN 62271-103.
IEC 62271-104 NOTE Harmonized as EN 62271-104.
IEC 62271-105 NOTE Harmonized as EN 62271-105.
IEC 62271-110:2009 NOTE Harmonized as EN 62271-110:2009 (not modified).
IEC 62305-1 NOTE Harmonized as EN 62305-1.
ISO/IEC 17025:2005 NOTE Harmonized as EN ISO/IEC 17025:2005 (not modified).
__________
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SIST EN 62475:2011
EN 62475:2010 - 4 -
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60051-2 1984 Direct acting indicating analogue electrical EN 60051-2 1989
measuring instruments and their accessories -
Part 2: Special requirements for ammeters
and voltmeters
IEC 60060-1 2010 High-voltage test techniques - EN 60060-1 2010
Part 1: General definitions and test
requirements
IEC 61180-1 - High-voltage test techniques for low-voltage EN 61180-1 -
equipment -
Part 1: Definitions, test and procedure
requirements
ISO/IEC Guide 98-3 2008 Uncertainty of measurement - - -
Part 3: Guide to the expression of uncertainty
in measurement (GUM:1995)
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SIST EN 62475:2011
IEC 62475
®
Edition 1.0 2010-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-current test techniques – Definitions and requirements for test currents
and measuring systems
Techniques des essais à haute intensité – Définitions et exigences relatives
aux courants d'essai et systèmes de mesure
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XE
CODE PRIX
ICS 19.080 ISBN 978-2-88912-184-7
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 62475:2011
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CONTENTS
FOREWORD.8
1 Scope.10
2 Normative references .10
3 Terms and definitions .10
3.1 Measuring systems.11
3.2 Components of a measuring system .11
3.3 Scale factors .12
3.4 Rated values .13
3.5 Definitions related to the dynamic behaviour .13
3.6 Definitions related to uncertainty .14
3.7 Definitions related to tests on measuring systems .16
4 Procedures for qualification and use of a measuring system.17
4.1 General principles .17
4.2 Schedule of performance tests .17
4.3 Schedule of performance checks.17
4.4 Requirements for the record of performance.18
4.4.1 Contents of the record of performance.18
4.4.2 Exceptions.18
4.5 Operating conditions .18
4.6 Uncertainty.19
5 Tests and test requirements for an approved measuring system.20
5.1 General requirements.20
5.2 Calibration – Determination of the scale factor .20
5.2.1 Calibration of a measuring system by comparison with a reference
measuring system (preferred method) .20
5.2.2 Determination of the scale factor of a measuring system from those
of its components .24
5.3 Linearity test .25
5.3.1 Application .25
5.3.2 Alternative methods in order of suitability .26
5.4 Dynamic behaviour.26
5.5 Short-term stability .27
5.5.1 Method .27
5.5.2 Steady-state current .27
5.5.3 Impulse current and short-time current .28
5.5.4 Periodic impulse current and periodic short-time current.28
5.6 Long-term stability.29
5.7 Ambient temperature effect .29
5.8 Effect of nearby current paths .30
5.9 Software effect .32
5.10 Uncertainty calculation .32
5.10.1 General .32
5.10.2 Uncertainty of calibration .32
5.10.3 Uncertainty of measurement using an approved measuring system .33
5.11 Uncertainty calculation of time-parameter measurements (impulse currents
only).34
5.11.1 General .34
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5.11.2 Uncertainty of the time-parameter calibration.34
5.11.3 Uncertainty of a time-parameter measurement using an approved
measuring system .35
5.12 Interference test .36
5.12.1 Application .36
5.12.2 Current-converting shunts and current transformers with iron .37
5.12.3 Inductive measuring systems without iron (Rogowski coils) .38
5.13 Withstand tests .38
5.13.1 Voltage withstand tests.38
5.13.2 Current withstand tests.39
6 Steady-state direct current .39
6.1 Application .39
6.2 Terms and definitions .39
6.3 Test current.39
6.3.1 Requirements .39
6.3.2 Tolerances .39
6.4 Measurement of the test current .40
6.4.1 Requirements for an approved measuring system.40
6.4.2 Uncertainty contributions .40
6.4.3 Dynamic behaviour .40
6.4.4 Calibrations and tests on an approved measuring system.40
6.4.5 Performance check.41
6.5 Measurement of ripple amplitude.41
6.5.1 Requirements for an approved measuring system.41
6.5.2 Uncertainty contributions .41
6.5.3 Dynamic behaviour for ripple .41
6.5.4 Calibrations and tests on an approved ripple-current measuring
system.42
6.5.5 Measurement of the scale factor at the ripple frequency .42
6.5.6 Performance check for ripple current measuring system .42
6.6 Test procedures .43
7 Steady-state alternating current.43
7.1 Application .43
7.2 Terms and definitions .43
7.3 Test current.43
7.3.1 Requirements .43
7.3.2 Tolerances .44
7.4 Measurement of the test current .44
7.4.1 Requirements for an approved measuring system.44
7.4.2 Uncertainty contributions .44
7.4.3 Dynamic behaviour .44
7.4.4 Calibrations and tests on an approved measuring system.46
7.4.5 Performance check.47
7.5 Test procedures .47
8 Short-time direct current.47
8.1 Application .47
8.2 Terms and definitions .48
8.3 Test currents .49
8.3.1 Requirements for the test current .49
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8.3.2 Tolerances .49
8.4 Measurement of the test current .49
8.4.1 Requirements for an approved measuring system.49
8.4.2 Uncertainty contributions .49
8.4.3 Dynamic behaviour .49
8.4.4 Calibrations and tests on an approved measuring system.50
8.4.5 Performance check.51
8.4.6 Linearity test.51
8.5 Test procedures .51
9 Short-time alternating current .51
9.1 Application .51
9.2 Terms and definitions .52
9.3 Test current.53
9.3.1 Requirements for the test current .53
9.3.2 Tolerances .53
9.4 Measurement of the test current .54
9.4.1 Requirements for an approved measuring system.54
9.4.2 Uncertainty contributions .54
9.4.3 Dynamic behaviour .54
9.4.4 Calibrations and tests on an approved measuring system.55
9.4.5 Performance check.56
9.4.6 Linearity test.56
9.4.7 Interference test .57
9.5 Test procedures .57
10 Impulse currents.57
10.1 Application .57
10.2 Terms and definitions .57
10.3 Test current.61
10.3.1 General .61
10.3.2 Tolerances .61
10.4 Measurement of the test current .62
10.4.1 Requirements for an approved measuring system.62
10.4.2 Uncertainty contributions .62
10.4.3 Dynamic behaviour .62
10.4.4 Calibrations and tests on an approved measuring system.64
10.4.5 Performance check.64
10.5 Test procedures .65
11 Current measurement in high-voltage dielectric testing.65
11.1 Application .65
11.2 Terms and definitions .65
11.3 Measurement of the test current .66
11.3.1 Requirements for an approved measuring system.66
11.3.2 Uncertainty contributions .66
11.3.3 Dynamic behaviour .66
11.3.4 Calibrations and tests on an approved measuring system.66
11.3.5 Performance check.67
11.3.6 Linearity test.67
11.3.7 Interference test .67
11.4 Test procedures .67
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12 Reference measuring systems.67
12.1 General .67
12.2 Interval between subsequent calibrations of reference measuring systems.67
Annex A (informative) Uncertainty of measurement.68
Annex B (informative) Examples of the uncertainty calculation in high-current
measurements .76
Annex C (informative) Step-response measurements.82
Annex D (informative) Convolution method for estimation of dynamic behaviour from
step-response measurements .85
Annex E (informative) Constraints for certain wave shapes.88
Annex F (informative) Temperature rise of measuring resistors.90
Annex G (informative) Determination of r.m.s. values of short-time a.c. current .91
Annex H (informative) Examples of IEC standards with high current tests .98
Bibliography.100
Figure 1 – Examples of amplitude frequency responses for limit frequencies (f ; f ). .14
1 2
Figure 2 – Calibration by comparison over full assigned measurement range.22
Figure 3 – Uncertainty contributions of the calibration (example with the minimum of 5
current levels).23
Figure 4 – Calibration by comparison over a limited current range with a linearity test
(see 5.3) providing extension up to the largest value in the assigned measurement
range .24
Figure 5 – Linearity test of the measuring system with a linear device in the extended
voltage range.26
Figure 6 – Short-term stability test for steady-state current. .28
Figure 7 – Short-term stability test for impulse current and short-time current.28
Figure 8 – Short-term stability test for periodic impulse-current and periodic short-time
current .29
Figure 9 – Test circuit for effect of nearby current path for current-converting shunts
and current transformers with iron. .31
Figure 10 – Test circuit for effect of nearby current path for inductive measuring
systems without iron (Rogowski coils).31
Figure 11 – Principle of interference test circuit. .37
Figure 12 – Interference test on the measuring system i (t) based on
1
current-converting shunt or current transformer with iron in a typical 3-phase
short-circuit set-up (example). .37
Figure 13 – Test circuit for interference test for inductive systems without iron. .38
Figure 14 – Acceptable normalized amplitude-frequency response of an a.c. measuring
system intended for a single fundamental frequency f .45
nom.
Figure 15 – Acceptable normalized amplitude-frequency response of an a.c. measuring
system intended for a range of fundamental frequencies f to f .46
nom1 nom2
Figure 16 – Example of short-time direct current.48
Figure 17 – Example of short-time alternating current. .52
Figure 18 – Exponential impulse current. .58
Figure 19 – Exponential impulse current – oscillating tail. .58
Figure 20 – Impulse current – Rectangular, smooth. .59
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Figure 21 – Impulse current – Rectangular with oscillations. .59
Figure A.1 – Normal probability distribution p(x) of a continuous random variable x.75
Figure A.2 – Rectangular symmetric probability distribution p(x) of the estimate x of an
input quantity X.75
Figure B.1 – Comparison between the system under calibration X and th
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