SIST EN 61124:2012
Reliability testing - Compliance tests for constant failure rate and constant failure intensity
Reliability testing - Compliance tests for constant failure rate and constant failure intensity
This International Standard gives a number of optimized test plans, the corresponding operating characteristic curves and expected test times. In addition the algorithms for designing test plans using a spreadsheet program are also given, together with guidance on how to choose test plans. This standard specifies procedures to test whether an observed value of - failure rate, - failure intensity, - mean time to failure (MTTF), - mean operating time between failures (MTBF), conforms to a given requirement. It is assumed, except where otherwise stated, that during the accumulated test time, the times to failure or the operating times between failures are independent and identically exponentially distributed. This assumption implies that the failure rate or failure intensity is constant. Four types of test plans are described as follows: - truncated sequential tests; - time/failure terminated tests; - fixed calendar time terminated tests without replacement; - combined test plans. This standard does not cover guidance on how to plan, perform, analyse and report a test. This information can be found in IEC 60300-3-5.
Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante Ausfalldichte
Essais de fiabilité - Plans d'essais de conformité d'un taux de défaillance constant et d'une intensité de défaillance constante
La CEI 61124:2012 fournit un certain nombre de plans d'essais optimisés, les courbes OC associées et les valeurs moyennes des temps d'essais. De plus, les algorithmes pour la conception de plans d'essais à l'aide d'un tableur électronique sont également fournis avec des lignes directrices sur la manière de choisir les plans d'essais. La présente norme spécifie les méthodes utilisées pour vérifier qu'une valeur observée: d'un taux de défaillance, d'une intensité de défaillance, d'une durée moyenne de fonctionnement avant défaillance (MTTF), moyenne des temps de bon fonctionnement (MTBF). Les modifications techniques majeures par rapport à l'édition précédente sont les suivantes: - de nouveaux plans d'essais sont ajoutés, basés sur la Norme russe GOST R 27.402 [1], et son objectif est d'être cohérent avec la nouvelle édition de MIL-HDBK-781 [2]. Elle comprend les algorithmes pour l'optimisation des plans d'essais en utilisant un tableur électronique, ainsi qu'une liste de plan d'essais. En outre l'accent est mis sur le fait qu'il convient de réitérer l'essai à la suite des modifications de conception; - Les écarts dans les plans d'essais A, B et les Annexes A et B qui provenaient de la CEI 60605-7 [3], (retirée) ont été corrigés et ces plans sont donc différents de ceux donnés dans les précedentes éditions de la CEI 61124. Comme demandé par les Comités nationaux, les informations concernant la base mathématique et le tableur électronique ont été déplacées aux annexes informatives. De plus, les listes de symboles ont été divisées, pour obtenir des listes de symboles séparées dans certaines annexes. - Des lignes directrices sur la manière de choisir les plans d'essais ont été ajoutées de même que sur la manière d'utiliser les tableurs électroniques pour les créer. Les plans d'essais A.1 à A.9 et B.1 à B.13 ont été corrigés; - Les paragraphes 8.1, 8.2, 8.3, l'Article 9 et l'Annexe C, les Articles G.2, I.2, I.3 et l'Annexe J ne changent pas, sauf pour la terminologie et les références mises à jour.
Preskušanje zanesljivosti - Ustreznostni preskusi za konstantno pogostost odpovedi in konstantno intenzivnost odpovedi
Ta mednarodni standard navaja optimizirane preskusne načrte, ustrezne značilne krivulje delovanja in pričakovana trajanja preskusov. Poleg tega navaja algoritme za projektiranje preskusnih načrtov s programom s preglednicami in smernice za izbiro preskusnih načrtov. Ta standard določa postopke za preskušanje, ali je meritev – pogostosti odpovedi, – intenzivnosti odpovedi, – povprečnega trajanja odpovedi (MTTF), – povprečnega trajanja delovanja med odpovedmi (MTBF) v skladu z danimi zahtevami. Če ni navedeno drugače, se predpostavlja, da so trajanja odpovedi ali povprečna trajanja delovanja med odpovedmi med skupnim trajanjem preskusov ločena in enakomerno eksponentno razporejena. Ta predpostavka pomeni, da je pogostost odpovedi ali intenzivnost odpovedi konstantna. Opisane so štiri vrste preskusnih načrtov: – prekinjeni(okrnjeni?) sekvenčni preskusi; – časovno/z odpovedjo zaključeni preskusi; – preskusi, zaključeni brez nadomestil z določenim koledarskim časom; – kombinirani preskusni načrti. Ta standard ne zajema smernic za načrtovanje, izvajanje in analizo preskusa ter poročanje o njem. Te informacije so navedene v standardu IEC 60300-3-5.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 61124:2012
01-oktober-2012
Preskušanje zanesljivosti - Ustreznostni preskusi za konstantno pogostost
odpovedi in konstantno intenzivnost odpovedi
Reliability testing - Compliance tests for constant failure rate and constant failure
intensity
Prüfungen der Funktionsfähigkeit - Prüfpläne für konstante Ausfallrate und konstante
Ausfalldichte
Essais de fiabilité - Plans d'essais de conformité d'un taux de défaillance constant et
d'une intensité de défaillance constante
Ta slovenski standard je istoveten z: EN 61124:2012
ICS:
19.020 Preskuševalni pogoji in Test conditions and
postopki na splošno procedures in general
21.020 =QDþLOQRVWLLQQDþUWRYDQMH Characteristics and design of
VWURMHYDSDUDWRYRSUHPH machines, apparatus,
equipment
SIST EN 61124:2012 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 61124:2012
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SIST EN 61124:2012
EUROPEAN STANDARD
EN 61124
NORME EUROPÉENNE
August 2012
EUROPÄISCHE NORM
ICS 03.120.30; 19.020; 21.020 Supersedes EN 61124:2006
English version
Reliability testing -
Compliance tests for constant failure rate
and constant failure intensity
(IEC 61124:2012)
Essais de fiabilité - Prüfungen der Funktionsfähigkeit -
Plan d'essais de conformité d'un taux Prüfpläne für konstante Ausfallrate
de défaillance constant et d'une intensité und konstante Ausfalldichte
de défaillance constante (IEC 61124:2012)
(CEI 61124:2012)
This European Standard was approved by CENELEC on 2012-06-27. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2012 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61124:2012 E
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SIST EN 61124:2012
EN 61124:2012 - 2 -
Foreword
The text of document 56/1461/FDIS, future edition 3 of IEC 61124, prepared by IEC/TC 56
"Dependablility" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN 61124:2012.
The following dates are fixed:
(dop) 2013-03-27
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2015-06-27
• latest date by which the national
standards conflicting with the
document have to be withdrawn
This document supersedes EN 61124:2006.
EN 61124:2012 includes the following significant technical changes with respect to EN 61124:2006:
- a number of new test plans have been added based on the Russian standard GOST R 27.402, and
it is intended to align the new edition of MIL-HDBK-781 with this edition. Algorithms for optimizing
test plans using a spreadsheet program are given and a number of optimized test plans are listed.
Furthermore, emphasis is laid on the fact that the test should be repeated following design
changes;
- discrepancies in test plans A, B as well as Annexes A and B that originated in IEC 60605-7, now
withdrawn, have been corrected so these test plans differ from those given in previous edition of
EN 61124. As requested by the National committees, mathematical background material and
spreadsheet program information has been moved to informative annexes. In addition, the symbol
lists have been divided, so that some annexes have separate lists of symbols;
- guidance on how to choose test plans has been added as well as guidance on how to use
spreadsheet programs to create them. Test plans A.1 to A.9 and B.1 to B.13 have been corrected;
- Subclauses 8.1, 8.2, 8.3, Clause 9, Annex C, Clauses G.2, I.2, I.3 and Annex J are unchanged,
except for updated terminology and references;
- corrections to the second edition proposed by National Committees have been implemented.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61124:2012 was approved by CENELEC as a European
Standard without any modification.
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SIST EN 61124:2012
- 3 - EN 61124:2012
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60050-191 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 191: Dependability and quality
of service
IEC 60300-3-5 2001 Dependability management - - -
Part 3-5: Application guide - Reliability test
conditions and statistical test principles
IEC 60605-2 - Equipment reliability testing - - -
Part 2: Design of test cycles
IEC 60605-4 2001 Equipment reliability testing - - -
Part 4: Statistical procedures for exponential
distribution - Point estimates, confidence
intervals, prediction intervals and tolerance
intervals
IEC 60605-6 - Equipment reliability testing - - -
Part 6: Tests for the validity and estimation
of the constant failure rate and constant
failure intensity
IEC 61123 1991 Reliability testing - Compliance test plans for - -
success ratio
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SIST EN 61124:2012
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SIST EN 61124:2012
IEC 61124
®
Edition 3.0 2012-05
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Reliability testing – Compliance tests for constant failure rate and constant
failure intensity
Essais de fiabilité – Plan d’essais de conformité d’un taux de défaillance
constant et d’une intensité de défaillance constante
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XF
ICS 03.120.30; 19.020; 21.020 ISBN 978-2-88912-061-1
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 61124:2012
– 2 – 61124 © IEC:2012
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms, definitions, abbreviations and symbols . 11
3.1 Terms and definitions . 11
3.2 Abbreviations and symbols . 11
3.2.1 Abbreviations . 11
3.2.2 Symbols . 11
4 General requirements and area of application . 13
4.1 Requirements . 13
4.2 Applicability to replaced and repaired items . 13
4.3 Types of test plans . 13
4.3.1 General . 13
4.3.2 Advantages and disadvantages of the different test plan types . 14
5 General test procedure . 14
5.1 Test conditions . 14
5.2 General characteristics of the test plans . 15
5.3 Data to be recorded . 15
*
5.4 Calculation of accumulated test time, T . 15
5.5 Number of failures . 16
6 Sequential test plans . 17
6.1 General . 17
6.2 Common test procedure . 17
6.3 Decision criteria . 17
6.4 Overview of test plans . 17
7 Fixed time/failure terminated test plans – Fixed duration test plans . 18
7.1 General . 18
7.2 Common test procedure . 18
7.3 Decision criteria . 19
7.4 Test plans . 19
8 Design of alternative time/failure terminated test plans . 20
8.1 General . 20
8.2 Design procedures . 20
8.3 Common test procedure . 20
8.4 Decision criteria . 21
9 Calendar time/failure terminated test plans for non-replaced items . 21
9.1 General . 21
9.2 Common test procedure . 21
9.3 Decision criteria . 21
9.4 Use of Table 2 of IEC 61123:1991 for fixed calendar time tests . 22
9.4.1 General . 22
9.4.2 Procedure when the test time is given . 22
9.4.3 Procedure when the number of items is given . 22
10 Combined test plans . 23
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SIST EN 61124:2012
61124 © IEC:2012 – 3 –
10.1 General . 23
10.2 Common test procedure . 23
10.3 Decision criteria . 23
10.4 Test plans . 24
11 Performing the test . 24
12 Presentation of results . 24
Annex A (normative) Tables and graphs for sequential test plans . 25
Annex B (normative) Graphs for fixed time/failure terminated test plans . 44
Annex C (normative) Graphs for alternative time/failure terminated test plans . 53
Annex D (normative) Tables and graphs for combined test plans and additional
sequential test plans . 60
Annex E (informative) Examples and mathematical references for sequential test
plans . 78
Annex F (informative) Design of sequential test plans using a common spreadsheet
program . 86
Annex G (informative) Examples and mathematical references for fixed time/failure
terminated test plans – Fixed duration test plans . 97
Annex H (informative) Design of fixed duration time/failure terminated test plans using
a spreadsheet program . 99
Annex I (informative) Examples and mathematical references for the design of
alternative time/failure terminated test plans . 105
Annex J (informative) Examples and mathematical references for the calendar time
terminated test plans . 112
Annex K (informative) Derivation and mathematical reference for the optimized test
plans of GOST R 27 402 . 114
Bibliography . 122
Figure A.1 – Accept and reject lines for test plan A.1 . 25
Figure A.2 – Test plan A.1 – Operating characteristic curve . 26
Figure A.3 – Test plan A.1 – Expected accumulated test time to decision . 27
Figure A.4 – Accept and reject lines for test plan A.2 . 27
Figure A.5 – Test plan A.2 – Operating characteristic curve . 28
Figure A.6 – Test plan A.2 – Expected accumulated test time to decision . 29
Figure A.7 – Accept and reject lines for test plan A.3 . 29
Figure A.8 – Test plan A.3 – Operating characteristic curve . 30
Figure A.9 – Test plan A.3 – Expected accumulated test time to decision . 31
Figure A.10 – Accept and reject lines for test plan A.4 . 31
Figure A.11 – Test plan A.4 – Operating characteristic curve . 32
Figure A.12 – Test plan A.4 – Expected accumulated test time to decision . 33
Figure A.13 – Accept and reject lines for test plan A.5 . 33
Figure A.14 – Test plan A.5 – Operating characteristic curve . 34
Figure A.15 – Test plan A.5 – Expected accumulated test time to decision . 35
Figure A.16 – Accept and reject lines for test plan A.6 . 35
Figure A.17 – Test plan A.6 − Operating characteristic curve . 36
Figure A.18 – Test plan A.6 – Expected accumulated test time to decision . 37
Figure A.19 – Accept and reject lines for test plan A.7 . 37
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SIST EN 61124:2012
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Figure A.20 – Test plan A.7 – Operating characteristic curve . 38
Figure A.21 – Test plan A.7 – Expected accumulated test time to decision . 39
Figure A.22 – Accept and reject lines for test plan A.8 . 40
Figure A.23 – Test plan A.8 – Operating characteristic curve . 41
Figure A.24 – Test plan A.8 – Expected accumulated test time to decision . 41
Figure A.25 – Accept and reject lines for test plan A.9 . 42
Figure A.26 – Test plan A.9 – Operating characteristic curve . 43
Figure A.27 – Test plan A.9 – Expected accumulated test time to decision . 43
Figure B.1 – Operating characteristic curves for test plans B.1, B.2, B.3 and B.4 . 44
Figure B.2 – Test plan B.1 – Expected test time to decision . 45
Figure B.3 – Test plan B.2 – Expected test time to decision . 45
Figure B.4 – Test plan B.3 – Expected test time to decision . 46
Figure B.5 – Test plan B.4 – Expected test time to decision . 46
Figure B.6 – Operating characteristic curves for test plans B.5, B.6, B.7 and B.8 . 47
Figure B.7 – Test plan B.5 – Expected test time to decision . 47
Figure B.8 – Test plan B.6 – Expected test time to decision . 48
Figure B.9 – Test plan B.7 – Expected test time to decision . 48
Figure B.10 – Test plan B.8 – Expected test time to decision . 49
Figure B.11 – Operating characteristic curves for test plans B.9, B.10 and B.11 . 49
Figure B.12 – Test plan B.9 – Expected test time to decision . 50
Figure B.13 – Test plan B.10 – Expected test time to decision . 50
Figure B.14 – Test plan B.11– Expected test time to decision . 51
Figure B.15 – Operating characteristic curves for test plans B.12 and B.13. 51
Figure B.16 – Test plan B.12 – Expected test time to decision . 52
Figure B.17 – Test plan B.13 – Expected test time to decision . 52
Figure C.1 – Discrimination ratio, D, and the acceptable number of failures, c = 0 to 8,
as a function of the expected number of failures, µ , for recommended values, 2,5 %,
0
5 %, 10 %, 20 %, and 30 % of α = β. 56
Figure C.2 – Operation characteristic curves for c = 0 to 8; probability of acceptance
P as a function of the (unknown) true expected number of failures, µ . 57
a 0
Figure C.3 – Discrimination ratio, D, as a function of the expected number of failures,
µ , for recommended values, 2,5 %, 5 %, 10 %, 15 %, 20 % and 30 % of α = β . 58
0
Figure C.4 – Acceptable number of failures, c, minus expected number of failures, µ
0
(Δµ = c – µ ) as a function of the expected number of failures µ for recommended
0 0 0
values 2,5 %, 5 %, 10 %, 20 %, and 30 % of α = β . 59
Figure D.1 – Accept and reject lines . 61
∗
Figure D.2 – Expected test time to decision T . 62
e
∗
Figure D.3 – Expected test time to decision of acceptance T (+) . 62
e
Figure D.4 – Operating characteristic P . 62
a
Figure D.5 – Accept and reject lines . 63
∗
T
Figure D.6 – Expected test time to decision . 64
e
∗
Figure D.7 – Expected test time to decision of acceptance T (+) . 64
e
Figure D.8 – Operating characteristic P . 64
a
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SIST EN 61124:2012
61124 © IEC:2012 – 5 –
Figure D.9 – Accept and reject lines . 65
∗
Figure D.10 – Expected test time to decision T . 66
e
∗
Figure D.11 – Expected test time to decision of acceptance T (+) . 66
e
Figure D.12 – Operating characteristic P . 67
a
Figure D.13 – Accept and reject lines . 68
∗
Figure D.14 – Expected test time to decision T . 69
e
∗
Figure D.15 – Expected test time to decision of acceptance T (+) . 69
e
Figure D.16 – Operating characteristic P . 69
a
Figure D.17 – Accept and reject lines . 70
∗
Figure D.18 – Expected test time to decision T . 71
e
∗
T (+)
Figure D.19 – Expected test time to decision of acceptance . 71
e
Figure D.20 – Operating characteristic P . 71
a
Figure D.21 – Accept and reject lines . 72
∗
Figure D.22 – Expected test time to decision T . 73
e
∗
Figure D.23 – Expected test time to decision of acceptance T (+) . 73
e
Figure D.24 – Operating characteristic P . 73
a
Figure D.25 – Accept and reject lines . 74
∗
Figure D.26 – Expected test time to decision . 74
T
e
∗
Figure D.27 – Expected test time to decision of acceptance . 74
T (+)
e
Figure D.28 – Operating characteristic P . 75
a
Figure D.29 – Accept and reject lines . 75
*
Figure D.30 – Expected test time to decision T . 76
e
∗
Figure D.31 – Expected test time to decision of acceptance T (+) . 76
e
Figure D.32 – Operating characteristic P . 76
a
Figure E.1 – Example of a sequential test using test plan A.3 – α = β = 10 %, D = 3,
T *
6
= 1,11×10 h; r versus . 80
m
0
mo
Figure F.1 – SPRT spreadsheet graphing example . 92
Figure F.2 – OC curve for probability of acceptance, P . 95
a
Figure F.3 – Expected test time for making a decision . 95
Figure H.1 – OC curve plotted from the spreadsheet calculations . 104
Figure K.1 – Test plan types and terminology . 115
Figure K.2 – Principle of test plans . 117
Figure K.3 – Partitioning of the test plan graph . 117
Figure K.4 – Interior nodes and border nodes . 118
Figure K.5 – Paths to the accept line . 118
Figure K.6 – Paths to the reject line . 118
Figure K.7 – Probabilities of paths transfer between nodes . 119
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SIST EN 61124:2012
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Figure K.8 – The recurrent element – Two cases . 121
Table 1 – Advantages and disadvantages for the different test plan types . 14
Table 2 – Overview of the sequential test plans given in Annex A and D . 18
Table 3 – Fixed time/failure terminated test plans . 19
Table 4 – Combined test plans in Annex D . 24
Table A.1 – Accept and reject lines for test plan A.1 . 26
Table A.2 – Accept and reject lines for test plan A.2 . 28
Table A.3 – Accept and reject lines for test plan A.3 . 30
Table A.4 – Accept and reject lines for test plan A.4 . 32
Table A.5 – Accept and reject lines for test plan A.5 . 34
Table A.6 – Accept and reject lines for test plan A.6 . 36
Table A.7 – Accept and reject lines for test plan A.7 . 38
Table A.8 – Accept and reject lines for test plan A.8 .
...
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