Non-destructive testing - Characterization and verification of ultrasonic test equipment - Part 2: Probes (ISO 22232-2:2020)

This International Standard covers probes used for ultrasonic testing in the following categories with centre frequencies in the range 0,5 MHz to 15 MHz, focusing and without focusing means:
a) single or dual-transducer contact probes generating longitudinal or transverse waves;
b) single-transducer immersion probes generating longitudinal waves.

Zerstörungsfreie Prüfung - Charakterisierung und Verifizierung der Ultraschall-Prüfausrüstung - Teil 2: Prüfköpfe (ISO 22232-2:2020)

Dieses Dokument legt die Merkmale von Prüfköpfen für die zerstörungsfreie Ultraschallprüfung mit Mittenfrequenzen im Bereich von 0,5 MHz bis 15 MHz, fokussierend oder ohne fokussierende Vorrichtungen in den folgenden Kategorien fest:
a)   Einschwinger- oder SE-Prüfköpfe für den direkten Kontakt, die Longitudinal- und/oder Transversal¬wellen erzeugen;
b)   Tauchtechnik-Prüfköpfe mit einem Schwinger.
Wenn werkstoffabhängige Ultraschallwerte in diesem Dokument festgelegt werden, beruhen sie auf Stahl mit einer Schallgeschwindigkeit von (5 920 ± 50) m/s für Longitudinalwellen und von (3 255 ± 30) m/s für Transversalwellen.
Dieses Dokument enthält keine wiederkehrenden Überprüfungen für Prüfköpfe. Routinemäßige Kontrollen zur Verifizierung von Prüfköpfen mit Verfahren, die am Prüfort angewendet werden, sind in ISO 22232 3 aufgeführt.
Wenn mit Zustimmung der Vertragspartner außer den in ISO 22232 3 aufgeführten Parametern auch noch zusätzliche Parameter während der Lebensdauer des Prüfkopfes verifiziert werden müssen, so können die Verfahren zur Verifizierung für diese zusätzlichen Parameter aus den in diesem Dokument aufgeführten Verfahren ausgewählt werden.
Dieses Dokument enthält keine Ultraschallgeräte mit phasengesteuerten Arrays, siehe dazu ISO 18563 2.

Essais non destructifs - Caractérisation et vérification de l'appareillage de contrôle par ultrasons - Partie 2: Traducteurs (ISO 22232-2:2020)

Le présent document spécifie les caractéristiques des traducteurs utilisés pour les contrôles non destructifs par ultrasons appartenant aux catégories suivantes, de fréquence centrale comprise entre 0,5 MHz et 15 MHz, avec ou sans focalisation:
a) traducteurs à contact à transducteur simple ou à émetteur et récepteur séparés, générant des ondes longitudinales et/ou transversales;
b) traducteurs pour contrôle en immersion à transducteur simple.
Lorsque des valeurs ultrasonores dépendantes du matériau sont spécifiées dans le présent document, elles sont basées sur des aciers dont la vitesse de l'onde ultrasonore est de (5 920 ± 50) m/s pour les ondes longitudinales, et de (3 255 ± 30) m/s pour les ondes transversales.
Le présent document exclut les essais périodiques pour les traducteurs. Les essais de routine pour la vérification des traducteurs à l'aide de modes opératoires sur site sont décrits dans l'ISO 22232-3.
Si d'autres paramètres que ceux spécifiés dans l'ISO 22232-3 doivent être vérifiés pendant la durée de vie du traducteur, suivant ce qui a été convenu entre les parties contractantes, les modes opératoires de vérification de ces paramètres supplémentaires peuvent être sélectionnés parmi celles décrites dans le présent document.
Le présent document exclut également les traducteurs par ultrasons en multiéléments; par conséquent, voir l'ISO 18563-2.

Neporušitvene preiskave - Ugotavljanje značilnosti in overjanje naprav za ultrazvočno preskušanje - 2. del: Preskuševalne glave (ISO 22232-2:2020)

General Information

Status
Published
Public Enquiry End Date
07-Oct-2018
Publication Date
09-Nov-2020
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
12-Oct-2020
Due Date
17-Dec-2020
Completion Date
10-Nov-2020

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SLOVENSKI STANDARD
SIST EN ISO 22232-2:2020
01-december-2020
Nadomešča:
SIST EN 12668-2:2011
Neporušitvene preiskave - Ugotavljanje značilnosti in overjanje naprav za
ultrazvočno preskušanje - 2. del: Preskuševalne glave (ISO 22232-2:2020)

Non-destructive testing - Characterization and verification of ultrasonic test equipment -

Part 2: Probes (ISO 22232-2:2020)
Zerstörungsfreie Prüfung - Charakterisierung und Verifizierung der Ultraschall-
Prüfausrüstung - Teil 2: Prüfköpfe (ISO 22232-2:2020)

Essais non destructifs - Caractérisation et vérification de l'appareillage de contrôle par

ultrasons - Partie 2: Traducteurs (ISO 22232-2:2020)
Ta slovenski standard je istoveten z: EN ISO 22232-2:2020
ICS:
19.100 Neporušitveno preskušanje Non-destructive testing
SIST EN ISO 22232-2:2020 en,fr,de

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 22232-2:2020
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SIST EN ISO 22232-2:2020
EN ISO 22232-2
EUROPEAN STANDARD
NORME EUROPÉENNE
September 2020
EUROPÄISCHE NORM
ICS 19.100 Supersedes EN 12668-2:2010
English Version
Non-destructive testing - Characterization and verification
of ultrasonic test equipment - Part 2: Probes (ISO 22232-
2:2020)

Essais non destructifs - Caractérisation et vérification Zerstörungsfreie Prüfung - Charakterisierung und

de l'appareillage de contrôle par ultrasons - Partie 2: Verifizierung der Ultraschall-Prüfausrüstung - Teil 2:

Traducteurs (ISO 22232-2:2020) Prüfköpfe (ISO 22232-2:2020)
This European Standard was approved by CEN on 21 September 2020.

CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this

European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references

concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN

member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by

translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management

Centre has the same status as the official versions.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,

Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,

Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and

United Kingdom.
EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2020 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 22232-2:2020 E

worldwide for CEN national Members.
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SIST EN ISO 22232-2:2020
EN ISO 22232-2:2020 (E)
Contents Page

European foreword ....................................................................................................................................................... 3

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SIST EN ISO 22232-2:2020
EN ISO 22232-2:2020 (E)
European foreword

This document (EN ISO 22232-2:2020) has been prepared by Technical Committee ISO/TC 135 "Non-

destructive testing" in collaboration with Technical Committee CEN/TC 138 “Non-destructive testing”

the secretariat of which is held by AFNOR.

This European Standard shall be given the status of a national standard, either by publication of an

identical text or by endorsement, at the latest by March 2021, and conflicting national standards shall

be withdrawn at the latest by March 2021.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CEN shall not be held responsible for identifying any or all such patent rights.

This document supersedes EN 12668-2:2010.

According to the CEN-CENELEC Internal Regulations, the national standards organizations of the

following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,

Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,

Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of

North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the

United Kingdom.
Endorsement notice

The text of ISO 22232-2:2020 has been approved by CEN as EN ISO 22232-2:2020 without any

modification.
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SIST EN ISO 22232-2:2020
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SIST EN ISO 22232-2:2020
INTERNATIONAL ISO
STANDARD 22232-2
First edition
2020-09
Non-destructive testing —
Characterization and verification of
ultrasonic test equipment —
Part 2:
Probes
Essais non destructifs — Caractérisation et vérification de
l'appareillage de contrôle par ultrasons —
Partie 2: Traducteurs
Reference number
ISO 22232-2:2020(E)
ISO 2020
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2020

All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may

be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting

on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address

below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
Contents Page

Foreword ..........................................................................................................................................................................................................................................v

1 Scope ................................................................................................................................................................................................................................. 1

2 Normative references ...................................................................................................................................................................................... 1

3 Terms and definitions ..................................................................................................................................................................................... 1

4 Symbols .......................................................................................................................................................................................................................... 3

5 General requirements of conformity .............................................................................................................................................. 4

6 Technical information for probes ....................................................................................................................................................... 5

6.1 General ........................................................................................................................................................................................................... 5

6.2 Probe data sheet .................................................................................................................................................................................... 5

6.3 Probe test report ................................................................................................................................................................................... 5

7 Test equipment....................................................................................................................................................................................................... 7

7.1 Electronic equipment ........................................................................................................................................................................ 7

7.2 Test blocks and other equipment ............................................................................................................................................ 7

8 Performance requirements for probes ......................................................................................................................................15

8.1 Physical aspects ...................................................................................................................................................................................15

8.1.1 Procedure ............................................................................................................................................................................15

8.1.2 Acceptance criterion ..................................................................................................................................................15

8.2 Pulse shape, amplitude and duration ...............................................................................................................................15

8.2.1 Procedure ............................................................................................................................................................................15

8.2.2 Acceptance criterion ..................................................................................................................................................16

8.3 Frequency spectrum and bandwidth ................................................................................................................................17

8.3.1 Procedure ............................................................................................................................................................................17

8.3.2 Acceptance criteria .....................................................................................................................................................17

8.4 Pulse-echo sensitivity ....................................................................................................................................................................17

8.4.1 Procedure ............................................................................................................................................................................17

8.4.2 Acceptance criterion ..................................................................................................................................................18

8.5 Distance-amplitude curve ..........................................................................................................................................................18

8.5.1 General...................................................................................................................................................................................18

8.5.2 Procedure ............................................................................................................................................................................18

8.5.3 Acceptance criterion ..................................................................................................................................................20

8.6 Beam parameters for immersion probes ......................................................................................................................20

8.6.1 General...................................................................................................................................................................................20

8.6.2 Beam profile — Measurements performed directly on the beam......................................21

8.6.3 Beam profile — Measurements made using an automated scanning system ..........28

8.7 Beam parameters for straight-beam single-transducer contact probes ............................................30

8.7.1 General...................................................................................................................................................................................30

8.7.2 Beam divergence and side lobes .....................................................................................................................31

8.7.3 Squint angle and offset for straight-beam probes ............................................................................32

8.7.4 Focal distance (near field length) ...................................................................................................................33

8.7.5 Focal width .........................................................................................................................................................................33

8.7.6 Length of the focal zone ..........................................................................................................................................34

8.8 Beam parameters for angle-beam single-transducer contact probes ..................................................34

8.8.1 General...................................................................................................................................................................................34

8.8.2 Index point .........................................................................................................................................................................34

8.8.3 Beam angle and beam divergence..................................................................................................................35

8.8.4 Squint angle and offset for angle-beam probes ..................................................................................38

8.8.5 Focal distance (near field length) ...................................................................................................................41

8.8.6 Focal width .........................................................................................................................................................................42

8.8.7 Length of the focal zone ..........................................................................................................................................42

8.9 Beam parameters for straight-beam dual-transducer contact probes ................................................43

8.9.1 General...................................................................................................................................................................................43

8.9.2 Delay line delay path .................................................................................................................................................43

© ISO 2020 – All rights reserved iii
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)

8.9.3 Focal distance ..................................................................................................................................................................43

8.9.4 Axial sensitivity range (focal zone) ...............................................................................................................43

8.9.5 Lateral sensitivity range (focal width) .......................................................................................................44

8.10 Beam parameters for angle-beam dual-transducer contact probes ......................................................45

8.10.1 General...................................................................................................................................................................................45

8.10.2 Index point .........................................................................................................................................................................45

8.10.3 Beam angle and profiles .........................................................................................................................................45

8.10.4 Wedge delay path .........................................................................................................................................................46

8.10.5 Distance to sensitivity maximum (focal distance) ...........................................................................46

8.10.6 Axial sensitivity range (length of the focal zone)..............................................................................46

8.10.7 Lateral sensitivity range (focal width) .......................................................................................................46

8.11 Crosstalk ....................................................................................................................................................................................................47

8.11.1 Procedure ............................................................................................................................................................................47

8.11.2 Acceptance criterion ..................................................................................................................................................47

Annex A (normative) Calculation of the near field length of non-focusing probes ...........................................48

Annex B (informative) Calibration block for angle-beam probes .......................................................................................51

Annex C (informative) Determination of delay line and wedge delays ..........................................................................55

Bibliography .............................................................................................................................................................................................................................56

iv © ISO 2020 – All rights reserved
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
Foreword

ISO (the International Organization for Standardization) is a worldwide federation of national standards

bodies (ISO member bodies). The work of preparing International Standards is normally carried out

through ISO technical committees. Each member body interested in a subject for which a technical

committee has been established has the right to be represented on that committee. International

organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.

ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of

electrotechnical standardization.

The procedures used to develop this document and those intended for its further maintenance are

described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the

different types of ISO documents should be noted. This document was drafted in accordance with the

editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of

any patent rights identified during the development of the document will be in the Introduction and/or

on the ISO list of patent declarations received (see www .iso .org/ patents).

Any trade name used in this document is information given for the convenience of users and does not

constitute an endorsement.

For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and

expressions related to conformity assessment, as well as information about ISO's adherence to the

World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see www .iso .org/

iso/ foreword .html.

This document was prepared by Technical Committee ISO/TC 135, Non-destructive testing, Subcommittee

SC 3, Ultrasonic testing, in collaboration with the European Committee for Standardization (CEN)

Technical Committee CEN/TC 138, Non-destructive testing, in accordance with the Agreement on

technical cooperation between ISO and CEN (Vienna Agreement).
A list of all parts in the ISO 22232 series can be found on the ISO website.

Any feedback or questions on this document should be directed to the user’s national standards body. A

complete listing of these bodies can be found at www .iso .org/ members .html.
© ISO 2020 – All rights reserved v
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SIST EN ISO 22232-2:2020
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SIST EN ISO 22232-2:2020
INTERNATIONAL STANDARD ISO 22232-2:2020(E)
Non-destructive testing — Characterization and
verification of ultrasonic test equipment —
Part 2:
Probes
1 Scope

This document specifies the characteristics of probes used for non-destructive ultrasonic testing in the

following categories with centre frequencies in the range of 0,5 MHz to 15 MHz, focusing or without

focusing means:

a) single- or dual-transducer contact probes generating longitudinal and/or transverse waves;

b) single-transducer immersion probes.

Where material-dependent ultrasonic values are specified in this document they are based on

steels having a sound velocity of (5 920 ± 50) m/s for longitudinal waves, and (3 255 ± 30) m/s for

transverse waves.

This document excludes periodic tests for probes. Routine tests for the verification of probes using on-

site procedures are given in ISO 22232-3.

If parameters in addition to those specified in ISO 22232-3 are to be verified during the probe’s life

time, as agreed upon by the contracting parties, the procedures of verification for these additional

parameters can be selected from those given in this document.

This document also excludes ultrasonic phased array probes, therefore see ISO 18563-2.

2 Normative references

The following documents are referred to in the text in such a way that some or all of their content

constitutes requirements of this document. For dated references, only the edition cited applies. For

undated references, the latest edition of the referenced document (including any amendments) applies.

ISO 5577, Non-destructive testing — Ultrasonic testing — Vocabulary

ISO 7963, Non-destructive testing — Ultrasonic testing — Specification for calibration block No. 2

ISO 22232-1, Non-destructive testing — Characterization and verification of ultrasonic test equipment —

Part 1: Instruments

ISO/IEC 17050-1, Conformity assessment — Supplier's declaration of conformity — Part 1: General

requirements
3 Terms and definitions

For the purposes of this document, the terms and definitions given in ISO 5577 and the following apply.

ISO and IEC maintain terminological databases for use in standardization at the following addresses:

— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
© ISO 2020 – All rights reserved 1
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
3.1
horizontal plane

plane perpendicular to the vertical plane (3.7) of the sound beam including the

beam axis in the material
3.2
peak-to-peak amplitude

difference between the highest positive and the lowest negative amplitude in a pulse

Note 1 to entry: See Figure 1.
Key
h peak-to-peak amplitude
L pulse duration
Figure 1 — Typical ultrasonic pulse
3.3
probe data sheet

document giving manufacturer's technical specifications of the same type of probes, i.e. probes

manufactured in series

Note 1 to entry: The data sheet does not necessarily need to be a test certificate of performance.

Note 2 to entry: For individually designed or manufactured probes, some parameters may not be accurately

known before manufacturing.
3.4
probe test report

document showing compliance with this document giving the measured values of the required

parameters of one specific probe, including test equipment and conditions
3.5
reference side

right side of an angle-beam probe looking in the direction of the beam, unless otherwise specified by

the manufacturer
3.6
squint angle for straight-beam probes

deviation between the beam axis and the line perpendicular to the coupling surface at the point of

incidence
Note 1 to entry: See Figure 2.
2 © ISO 2020 – All rights reserved
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
Key
1 ultrasonic straight-beam probe e offset
2 EMA receiver δ squint angle for straight-beam probes
3 echo point X , Y coordinates of the centre of the probe
c c
4 hemicylindrical test block X coordinate of EMA receiver
Y coordinate of the centre of the block
Figure 2 — Squint angle and offset for a straight-beam probe
3.7
vertical plane

plane through the beam axis of a sound beam in the probe wedge and the beam

axis in the test object
3.8
wear allowance

maximum wear of the probe contact surface which does not affect the performance of the probe

Note 1 to entry: Wear allowance is typically expressed in millimetres.
4 Symbols
Symbol Unit Meaning
L us Pulse duration
h V Peak-to-peak amplitude
f Hz Centre frequency
f Hz Upper cut-off frequency
f Hz Lower cut-off frequency
Δf Hz Bandwidth
Δf % Relative bandwidth
rel
S dB Pulse-echo sensitivity
N mm Near field length
F mm Focal distance
F mm Length of focal zone at −6 dB using a reflector or −3 dB using a hydrophone
Z mm Focal point
W mm Focal width on X-axis
© ISO 2020 – All rights reserved 3
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
Symbol Unit Meaning
W mm Focal width on Y-axis
° Angle of beam divergence in X direction
° Angle of beam divergence in Y direction
X mm Probe index point
α ° Beam angle
δ ° Squint angle for straight-beam probes
5 General requirements of conformity

An ultrasonic probe complies with this document if it fulfils all of the following requirements:

a) the probe shall comply with Clause 8;
b) a declaration of conformity according to ISO/IEC 17050-1 shall be available;

c) the ultrasonic probe shall be clearly marked to identify the manufacturer, and carry a unique serial

number or show a permanent reference number from which information can be traced to the data

sheet and probe test report;

d) a probe data sheet corresponding to the ultrasonic probe shall be available, which defines the

performance criteria for the items given in Clause 6;

e) a probe test report shall be delivered together with the probe, which includes at least the test

results given in Clause 6.
Table 1 summarises the tests to be performed on ultrasonic probes.
Table 1 — List of tests for ultrasonic probes
Manufacturer’s tests
Title of test
Subclause
Physical aspects 8.1
Pulse shape, amplitude and duration 8.2
Frequency spectrum and bandwidth 8.3
Pulse-echo sensitivity 8.4
Distance-amplitude curve 8.5
Beam parameters for immersion probes 8.6
Axial profile – Focal distance and length of the focal zone 8.6.2.2
Transverse profile – Focal width 8.6.2.3
Transverse profile – Beam divergence 8.6.2.4
Beam profile by scanning means – Focal distance and focal length 8.6.3.2
Beam profile by scanning means – Focal width and beam divergence 8.6.3.3
4 © ISO 2020 – All rights reserved
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SIST EN ISO 22232-2:2020
ISO 22232-2:2020(E)
Table 1 (continued)
Manufacturer’s tests
Title of test
Subclause
Beam parameters for straight-beam single-transducer contact probes 8.7
Beam divergence and side lobes 8.7.2
Squint angle and offset for straight-beam probes 8.7.3
Focal distance (near field length) 8.7.4
Focal width 8.7.5
Length of the focal zone 8.7.6
Beam parameters for angle-beam single-transducer contact probes 8.8
Index point 8.8.2
Beam angle and beam divergence 8.8.3
Squint angle and offset 8.8.4
Focal distance (near field length) 8.8.5
Focal width 8.8.6
Length of the focal zone 8.8.7
Beam parameters for straight-beam dual-transducer contact probes 8.9
Delay line delay path 8.9.2
Focal distance 8.9.3
Axial sensitivity range (focal width) 8.9.4
Lateral sensitivity range (focal width) 8.9.5
Beam parameters for angle-beam dual-transducer contact probes 8.10
Index point 8.10.2
Beam angle and profiles 8.10.3
Wedge delay path 8.10.4
Distance to sensitivity maximum (focal distance) 8.10.5
Axial sensitivity range (length of the focal zone) 8.10.6
Lateral sensitivity range (focal width) 8.10.7
Crosstalk 8.11
6 Technical information for probes
6.1 General

The test conditions and the equipment used for the evaluation of the probe parameters shall be listed

(see Table 2).

For individually designed or manufactured probes some parameters may not be accurately known

prior to manufacturing. In that case the measured values shall be used as reference values.

6.2 Probe data sheet
The probe
...

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