SIST EN 61189-2-721:2015

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-721: Test methods for materials for interconnection structures - Measurement of Relative Permittivity and Loss Tangent for Copper Clad Laminate at Microwave Frequency Using Split Post Dielectric Resonator

IEC 61189-2-721:2015 outlines a way to determine the relative permittivity and loss tangent (also called dielectric constant and dissipation factor) of copper clad laminates at microwave frequencies (from 1,1 GHz to 20 GHz) using a split post dielectric resonator (SPDR). IEC 61189-2-721:2015 is applicable to copper clad laminates and dielectric base materials.

Prüfverfahren für Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen und Baugruppen - Teil 2-721: Prüfverfahren für Materialien für Verbindungsstrukturen - Messung der relativen Permittivität und des Verlustfaktors von kupferkaschiertem Laminat im Mikrowellen-Frequenzbereich unter Verwendung eines Split Post dielektrischen Resonators

Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres structures d'interconnexion et ensembles - Partie 2-721: Méthodes d'essai des matériaux pour structures d'interconnexion - Mesure de la permittivité relative et de la tangente de perte pour les stratifiés recouverts de cuivre en hyperfréquences à l'aide d'un résonateur diélectrique en anneaux fendus

L'IEC 61189-2-721:2015 présente un moyen de déterminer la permittivité relative et la tangente de perte, également appelées constante diélectrique et facteur de dissipation des stratifiés recouverts de cuivre en hyperfréquences (de 1,1 GHz à 20 GHz) à l'aide d'un résonateur diélectrique en anneaux fendus (SPDR). l'IEC 61189-2-721:2015 s'applique aux stratifiés recouverts de cuivre et aux matériaux de base diélectriques.

Preskusne metode za električne materiale, tiskane plošče ter druge povezovalne strukture in sestave - 2-721. del: Preskusne metode za materiale, namenjene uporabi v povezovalnih strukturah - Merjenje relativne permitivnosti in izgubnega tangensa pobakrenega laminata pri mikrovalovni frekvenci z uporabo resonatorja z ločenima dielektrikoma

Ta del standarda IEC 61189 opisuje način za določanje relativne permitivnosti (εr) in izgubnega tangensa (tanδ) (imenovana tudi dielektrična konstanta (Dk) in faktor disipacije (Df)) pobakrenega laminata pri mikrovalovni frekvenci (od 1,1 GHz do 20 GHz) z uporabo resonatorja z ločenima dielektrikoma. Ta del standarda IEC 61189 se uporablja za pobakrene laminate in dieletrične materiale.

General Information

• Status: Published
• Publication Date: 13-Aug-2015
• ICS: 31.180 - Printed circuits and boards
• ICS: 31.190 - Electronic component assemblies
• Technical Committee: ITIV - Electronics assembly technology and Environmental standardization
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 27-Jul-2015
• Due Date: 01-Oct-2015
• Completion Date: 14-Aug-2015
• Ref Project: EN 61189-2-721:2015 - Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 2-721: Test methods for materials for interconnection structures - Measurement of relative permittivity and loss tangent for copper clad laminate at microwave frequency using split post dielectric resonator

Standards Content (Sample)

SLOVENSKI STANDARD
01-september-2015
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VWUXNWXUHLQVHVWDYHGHO3UHVNXVQHPHWRGH]DPDWHULDOHQDPHQMHQH
XSRUDELYSRYH]RYDOQLKVWUXNWXUDK0HUMHQMHUHODWLYQHSHUPLWLYQRVWLLQL]JXEQHJD
WDQJHQVDSREDNUHQHJDODPLQDWDSULPLNURYDORYQLIUHNYHQFL]XSRUDERUHVRQDWRUMD
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Test methods for electrical materials, printed boards and other interconnection structures
and assemblies - Part 2-721: Test methods for materials for interconnection structures -
Measurement of Relative Permittivity and Loss Tangent for Copper Clad Laminate at
Microwave Frequency Using Split Post Dielectric Resonator
Prüfverfahren für Elektromaterialien, Leiterplatten und andere Verbindungsstrukturen
und Baugruppen - Teil 2-721: Prüfverfahren für Materialien für Verbindungsstrukturen -
Messung der relativen Permittivität und des Verlustfaktors von kupferkaschiertem
Laminat im Mikrowellen-Frequenzbereich unter Verwendung eines Split Post
dielektrischen Resonators
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres
structures d'interconnexion et ensembles - Partie 2-721: Méthodes d'essai des matériaux
pour structures d'interconnexion - Mesure de la permittivité relative et de la tangente de
perte pour les stratifiés recouverts de cuivre en hyperfréquences à l'aide d'un résonateur
diélectrique en anneaux fendus
Ta slovenski standard je istoveten z: EN 61189-2-721:2015
ICS:
31.180 7LVNDQDYH]MD7,9LQWLVNDQH Printed circuits and boards
SORãþH
31.190 Sestavljeni elektronski Electronic component
elementi assemblies
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 61189-2-721

NORME EUROPÉENNE
EUROPÄISCHE NORM
June 2015
ICS 31.180
English Version
Test methods for electrical materials, printed boards and other
interconnection structures and assemblies - Part 2-721: Test
methods for materials for interconnection structures -
Measurement of relative permittivity and loss tangent for copper
clad laminate at microwave frequency using split post dielectric
resonator
(IEC 61189-2-721:2015)
Méthodes d'essai pour les matériaux électriques, les cartes Prüfverfahren für Elektromaterialien, Leiterplatten und
imprimées et autres structures d'interconnexion et andere Verbindungsstrukturen und Baugruppen - Teil 2-
ensembles - Partie 2-721: Méthodes d'essai des matériaux 721: Prüfverfahren für Verbindungsstrukturen (Leiterplatten)
pour structures d'interconnexion - Mesure de la permittivité - Messung der relativen Permittivität und des Verlustfaktors
relative et de la tangente de perte pour les stratifiés von kupferkaschiertem Laminat im Mikrowellen-
recouverts de cuivre en hyperfréquences à l'aide d'un Frequenzbereich unter Verwendung eines Split Post
résonateur diélectrique en anneaux fendus dielektrischen Resonators
(IEC 61189-2-721:2015) (IEC 61189-2-721:2015)
This European Standard was approved by CENELEC on 2015-06-03. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 61189-2-721:2015 E

European foreword
The text of document 91/1246/FDIS, future edition 1 of IEC 61189-2-721, prepared by
IEC/TC 91 "Electronics assembly technology" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 61189-2-721:2015.

The following dates are fixed:
(dop) 2016-03-03
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2018-06-03
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 61189-2-721:2015 was approved by CENELEC as a
European Standard without any modification.
IEC 61189-2-721 ®
Edition 1.0 2015-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Test methods for electrical materials, printed boards and other interconnection

structures and assemblies –
Part 2-721: Test methods for materials for interconnection structures –

Measurement of relative permittivity and loss tangent for copper clad laminate

at microwave frequency using split post dielectric resonator

Méthodes d'essai pour les matériaux électriques, les cartes imprimées et autres

structures d'interconnexion et ensembles –

Partie 2-721: Méthodes d'essai des matériaux pour structures d'interconnexion –

Mesure de la permittivité relative et de la tangente de perte pour les stratifiés

recouverts de cuivre en hyperfréquences à l'aide d'un résonateur diélectrique

en anneaux fendus
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.180 ISBN 978-2-8322-2648-3

– 2 – IEC 61189-2-721:2015 © IEC 2015
CONTENTS
FOREWORD . 4
1 Scope . 6
2 Test specimens . 6
2.1 Specimen size . 6
2.2 Preparation . 7
2.3 Marking . 7
2.4 Thickness . 7
3 Equipment/apparatus . 7
3.1 General . 7
3.2 Vector network analyzer (VNA) . 8
3.3 SPDR test fixture . 8
3.3.1 General . 8
3.3.2 Parameters . 8
3.3.3 Frequency . 8
3.4 Verify unit . 9
3.5 Micrometer . 9
3.6 Circulating oven . 9
3.7 Test chamber . 9
4 Procedure . 9
4.1 Preconditioning . 9
4.2 Testing of relative permittivity and loss tangent at room temperature . 9
4.2.1 Test conditions . 9
4.2.2 Preparation . 9
4.2.3 Fixture . 10
4.2.4 Connection to VNA . 10
4.2.5 VNA parameter . 10
4.2.6 Frequency and Q-factor without specimen . 10
4.2.7 Micrometer . 10
4.2.8 Setting the specimen . 10
4.2.9 Frequency and Q-factor with specimen . 10
4.2.10 Comparison . 10
4.2.11 Calculation . 11
4.2.12 Change the specimen . 12
4.2.13 Change in test frequency . 12
4.3 Testing of relative permittivity and loss tangent at variable temperatures . 12
4.3.1 Test conditions . 12
4.3.2 Preparation . 12
4.3.3 Fixture . 12
4.3.4 Connection to VNA . 12
4.3.5 VNA parameter . 12
4.3.6 Temperature in the chamber . 12
4.3.7 Frequency and Q-factor without specimen . 12
4.3.8 Micrometer . 12
4.3.9 Setting of the specimen . 13
4.3.10 Frequency and Q-factor with specimen . 13
4.3.11 Calculation . 13

IEC 61189-2-721:2015 © IEC 2015 – 3 –
4.3.12 Options . 13
4.3.13 Thermal coefficient . 13
4.3.14 Change in test frequency . 14
5 Report . 14
5.1 At room temperature . 14
5.2 At variable temperature . 14
6 Additional information . 14
6.1 Accuracy . 14
6.2 Maintenance . 14
6.3 Matters to be attended . 15
6.4 Additional information concerning fixtures and results . 15
6.5 Additional information on K (ε ,h) and p . 15
ε r es
Annex A (informative) Example of test fixture and test result . 16
A.1 Example
...