SIST EN ISO 12179:2022
(Main)Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)
This document specifies the calibration and adjustment of the metrological characteristics of contact
(stylus) instruments for the measurement of surface texture by the profile method as defined in
ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement
standards.
Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator
contact (stylus) instruments which do not conform with ISO 3274.
Geometrische Produktspezifikation (GPS) - Oberflächenbeschaffenheit: Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2021)
Dieses Dokument legt die Kalibrierung und Justierung von messtechnischen Merkmalen von Tastschnittgeräten zur Messung der Oberflächenbeschaffenheit entsprechend den Festlegungen in ISO 3274 fest. Die Kalibrierung und Justierung ist mit Hilfe von Normalen durchzuführen.
Anhang B legt die Kalibrierung und Justierung von messtechnischen Merkmalen von Sekundärmessgeräten (Tastschnittgeräten mit vereinfachten Operatoren) fest, die mit der ISO 3274 nicht übereinstimmen.
Spécification géométrique des produits (GPS) - Etats de surface : Méthode du profil - Etalonnage des instruments à contact (palpeur) (ISO 12179:2021)
Le présent document spécifie l'étalonnage et l’ajustage des caractéristiques métrologiques des instruments à contact (stylet) pour le mesurage de l'état de surface par la méthode du profil comme défini dans l'ISO 3274. L'étalonnage et et l’ajustage s’effectuent à l'aide d'étalons de mesure.
L'Annexe B spécifie l'étalonnage et le réglage des caractéristiques métrologiques des instruments à contact (stylet) à utilisation simplifiée qui ne sont pas conformes à l'ISO 3274.
Specifikacija geometrijskih veličin izdelka (GPS) - Tekstura površine: profilna metoda - Umerjanje kontaktnih (s tipalom) instrumentov (ISO 12179:2021)
Ta dokument določa umerjanje in prilagajanje meroslovnih značilnosti kontaktnih (s tipalom) instrumentov, ki se uporabljajo za merjenje teksture površine s profilno metodo, kot je opredeljeno v standardu ISO 3274. Umerjanje in prilagajanje naj bi se izvedlo s pomočjo standardov merjenja.
Dodatek B določa umerjanje in prilagajanje meroslovnih značilnosti poenostavljenih
kontaktnih (s tipalom) instrumentov, ki niso skladni s standardom ISO 3274.
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN ISO 12179:2022
01-marec-2022
Nadomešča:
SIST EN ISO 12179:2000
SIST EN ISO 12179:2000/AC:2008
Specifikacija geometrijskih veličin izdelka (GPS) - Tekstura površine: profilna
metoda - Umerjanje kontaktnih (s tipalom) instrumentov (ISO 12179:2021)
Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration
of contact (stylus) instruments (ISO 12179:2021)Geometrische Produktspezifikation (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO 12179:2021)
Spécification géométrique des produits (GPS) - Etats de surface : Méthode du profil -
Etalonnage des instruments à contact (palpeur) (ISO 12179:2021)Ta slovenski standard je istoveten z: EN ISO 12179:2022
ICS:
17.040.30 Merila Measuring instruments
17.040.40 Specifikacija geometrijskih Geometrical Product
veličin izdelka (GPS) Specification (GPS)
SIST EN ISO 12179:2022 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN ISO 12179:2022
EN ISO 12179
EUROPEAN STANDARD
NORME EUROPÉENNE
January 2022
EUROPÄISCHE NORM
ICS 17.040.30 Supersedes EN ISO 12179:2000, EN ISO
12179:2000/AC:2008
English Version
Geometrical product specifications (GPS) - Surface texture:
Profile method - Calibration of contact (stylus)
instruments (ISO 12179:2021)
Spécification géométrique des produits (GPS) - Etats de Geometrische Produktspezifikation (GPS) -
surface : Méthode du profil - Etalonnage des Oberflächenbeschaffenheit: Tastschnittverfahren -
instruments à contact (palpeur) (ISO 12179:2021) Kalibrierung von Tastschnittgeräten (ISO 12179:2021)
This European Standard was approved by CEN on 27 November 2021.CEN members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this
European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references
concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN
member.This European Standard exists in three official versions (English, French, German). A version in any other language made by
translation under the responsibility of a CEN member into its own language and notified to the CEN-CENELEC Management
Centre has the same status as the official versions.CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway,
Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and
United Kingdom.EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION
EUROPÄISCHES KOMITEE FÜR NORMUNG
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2022 CEN All rights of exploitation in any form and by any means reserved Ref. No. EN ISO 12179:2022 E
worldwide for CEN national Members.---------------------- Page: 3 ----------------------
SIST EN ISO 12179:2022
EN ISO 12179:2022 (E)
Contents Page
European foreword ....................................................................................................................................................... 3
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EN ISO 12179:2022 (E)
European foreword
This document (EN ISO 12179:2022) has been prepared by Technical Committee ISO/TC 213
"Dimensional and geometrical product specifications and verification" in collaboration with Technical
Committee CEN/TC 290 “Dimensional and geometrical product specification and verification” the
secretariat of which is held by AFNOR.This European Standard shall be given the status of a national standard, either by publication of an
identical text or by endorsement, at the latest by July 2022, and conflicting national standards shall be
withdrawn at the latest by July 2022.Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN shall not be held responsible for identifying any or all such patent rights.
This document supersedes EN ISO 12179:2000.Any feedback and questions on this document should be directed to the users’ national standards
body/national committee. A complete listing of these bodies can be found on the CEN website.
According to the CEN-CENELEC Internal Regulations, the national standards organizations of the
following countries are bound to implement this European Standard: Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland,
Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of
North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the
United Kingdom.Endorsement notice
The text of ISO 12179:2021 has been approved by CEN as EN ISO 12179:2022 without any modification.
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SIST EN ISO 12179:2022
INTERNATIONAL ISO
STANDARD 12179
Second edition
2021-12
Geometrical product specifications
(GPS) — Surface texture: Profile
method — Calibration of contact
(stylus) instruments
Spécification géométrique des produits (GPS) — État de surface:
Méthode du profil — Étalonnage des instruments à contact (palpeur)
Reference number
ISO 12179:2021(E)
© ISO 2021
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2021
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on
the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below
or ISO’s member body in the country of the requester.ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
Contents Page
Foreword ..........................................................................................................................................................................................................................................v
Introduction .............................................................................................................................................................................................................................. vi
1 Scope ................................................................................................................................................................................................................................. 1
2 Normative references ..................................................................................................................................................................................... 1
3 Terms and definitions .................................................................................................................................................................................... 1
4 Conditions of use ..................................................................................................................................................................................................3
4.1 Components and configurations of the contact (stylus) instrument ..................................................... 3
4.2 Calibration of a configuration ................................................................................................................................................... 3
4.3 Place of calibration .............................................................................................................................................................................. 3
4.4 Defects ........................................................................................................................................................................................................... 3
5 Measurement standards ........................................................................................................................................... ...................................3
6 Contact (stylus) instrument metrological characteristics ..................................................................................... 6
6.1 General ........................................................................................................................................................................................................... 6
6.2 Residual profile calibration ......................................................................................................................................................... 6
6.3 Vertical profile component calibration ............................................................................................................................. 6
6.4 Horizontal profile component calibration ..................................................................................................................... 6
6.5 Profile coordinate system calibration ............................................................................................................................... 6
6.6 Total contact (stylus) instrument calibration ............................................................................................................. 6
7 Calibration ..................................................................................................................................................................................................................7
7.1 Preparation for calibration .......................................................................................................................................................... 7
7.2 E valuation of the residual profile .......................................................................................................................................... 7
7.3 Calibration of the vertical profile component ............................................................................................................. 7
7.3.1 Overall objective ................................................................................................................................................................. 7
7.3.2 Procedure ................................................................................................................................................................................. 7
7.4 Calibration of the horizontal profile component ......... ............................................................................................. 8
7.4.1 Overall objective ................................................................................................................................................................. 8
7.4.2 Procedure ................................................................................................................................................................................. 8
7.5 Calibration of the profile coordinate system ............................................................................................................... 8
7.5.1 Overall objective ................................................................................................................................................................. 8
7.5.2 Procedure ................................................................................................................................................................................. 8
7.6 Calibration of the total contact (stylus) instrument ............................................................................................. 8
7.6.1 Overall objective ................................................................................................................................................................. 8
7.6.2 Procedure ................................................................................................................................................................................. 9
7.7 Other calibrations ................................................................................................................................................................................ 9
8 Measurement uncertainty .........................................................................................................................................................................9
8.1 Information from the calibration certificate for a measurement standard .................................... 9
8.2 The uncertainty of the values measured during calibration of a measuringinstrument using a measurement standard................................................................................................................. 9
9 Contact (stylus) instrument calibration certificate ....................................................................................................10
10 General information ......................................................................................................................................................................................10
Annex A (normative) Calibration of instruments measuring parameters of the motifs
method .........................................................................................................................................................................................................................11
Annex B (normative) Calibration of simplified operator instruments for the measurements
of surface texture .............................................................................................................................................................................................13
Annex C (informative) Example: roughness measurement standard parameter Ra ....................................14
Annex D (informative) Concept diagram .....................................................................................................................................................17
Annex E (informative) Overview of profile and areal standards in the GPS matrix model ...................18
iii© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
Annex F (informative) Relation to the GPS matrix model ..........................................................................................................19
Bibliography .............................................................................................................................................................................................................................20
© ISO 2021 – All rights reserved---------------------- Page: 10 ----------------------
SIST EN ISO 12179:2022
ISO 12179:2021(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www.iso.org/iso/foreword.html.This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product
specifications and verification, in collaboration with the European Committee for Standardization (CEN)
Technical Committee CEN/TC 290, Dimensional and geometrical product specification and verification, in
accordance with the Agreement on technical cooperation between ISO and CEN (Vienna Agreement).
This second edition cancels and replaces the first edition (ISO 12179:2000), which has been technically
revised. It also incorporates Technical Corrigendum ISO 12179:2000/Cor. 1:2003.The main changes to the previous edition are as follows:
— Annex C has been amended.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www.iso.org/members.html.© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
Introduction
This document is a geometrical product specification (GPS) standard and is to be regarded as a general
GPS standard (see ISO 14638). It influences chain link G of the chain of standards on profile surface
texture.The ISO GPS matrix model is given in ISO 14638, For more detailed information on the relationship of
this document to the GPS matrix model, see Annex F. An overview of standards on profiles and areal
surface texture is given in Annex E.This document introduces calibration of contact (stylus) instruments as defined in ISO 3274. The
calibration is carried out with the aid of measurement standards.© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
INTERNATIONAL STANDARD ISO 12179:2021(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Calibration of contact (stylus)
instruments
1 Scope
This document specifies the calibration and adjustment of the metrological characteristics of contact
(stylus) instruments for the measurement of surface texture by the profile method as defined in
ISO 3274. The calibration and adjustment is intended to be carried out with the aid of measurement
standards.Annex B specifies the calibration and adjustment of metrological characteristics of simplified operator
contact (stylus) instruments which do not conform with ISO 3274.2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 3274, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instrumentsISO 5436-1:2000, Geometrical Product Specifications (GPS) — Surface texture: Profile method;
Measurement standards — Part 1: Material measuresISO 10012, Measurement management systems — Requirements for measurement processes and measuring
equipmentISO 14253-1, Geometrical product specifications (GPS) — Inspection by measurement of workpieces and
measuring equipment — Part 1: Decision rules for verifying conformity or nonconformity with specifications
ISO 14253-2, Geometrical product specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 2: Guidance for the estimation of uncertainty in GPS measurement, in
calibration of measuring equipment and in product verificationISO 21920-2, Geometrical product specifications (GPS) — Surface texture: Profile — Part 2: Terms,
definitions and surface texture parametersISO 25178-73, Geometrical product specifications (GPS) — Surface texture: Areal — Part 73: Terms and
definitions for surface defects on material measuresISO/IEC Guide 98-3, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in
measurement (GUM: 1995)ISO/IEC Guide 99, International vocabulary of metrology — Basic and general concepts and associated
terms (VIM)3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 3274, ISO 14253-1, ISO 21920-2,
GUM and VIM and the following apply.© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp— IEC Electropedia: available at http:// www .electropedia .org/
3.1
calibration
operation that, under specified conditions:
a) in a first step, establishes a relation between the quantity values with measurement uncertainties
provided by measurement standards and corresponding indications with associated measurement
uncertainties; andb) in a second step, uses this information to establish a relation for obtaining a measurement result
from an indication[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.39, modified — Notes to entry removed.]
3.2
task-related calibration
set of operations which establish, under specified conditions, the relationship between values of
quantities indicated by a measuring instrument and the corresponding known values of a limited
family of precisely defined measurands which constitute a subset of the measuring capabilities of the
measuring instrument3.3
adjustment
adjustment of a measuring system
set of operations carried out on a measuring system so that it provides prescribed indications
corresponding to given values of a quantity to be measured[SOURCE: ISO/IEC Guide 99:2007 (VIM), 3.11, modified — Notes to entry removed.]
3.4
measurement standard
etalon
realization of the definition of a given quantity, with stated quantity value and associated measurement
uncertainty, used as a referenceNote 1 to entry: Measurement standards are also referred to as “calibration specimens”.
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 5.1, modified — Examples and Notes to entry removed.]
3.5measurement uncertainty
uncertainty of measurement
uncertainty
non-negative parameter characterizing the dispersion of the quantity values being attributed to a
measurand, based on the information used[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.26, modified — Notes to entry removed.]
3.6
metrological traceability
property of a measurement result whereby the result can be related to a reference through a
documented unbroken chain of calibrations, each contributing to the measurement uncertainty
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.41, modified — Notes to entry removed.]© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
3.7
defect
part of the measurement standard’s geometrical feature (non-ideal surface) on
which the geometrical shape and geometrical dimensions deviate from those on the nominal feature
(ideal surface) either by an amount greater than some agreed or stated maximum value, or, in the
absence of any such agreed or stated maximum value, by an amount greater than what is typical or
characteristic for the processes used in manufacturing the measurement standard[SOURCE: ISO 25178-73:2019, 3.1.2, modified — Notes to entry removed.]
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument comprises the basic equipment, a drive unit, a probe and a profile
recorder (see ISO 3274). If the basic equipment is used with several drive units and probes, each of
these instrumental combinations (configurations) shall be calibrated separately.4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the
system which intentionally or unintentionally modifies the measured profile or measuring result. Each
configuration of the contact (stylus) instrument shall be calibrated separately. For example, with a
change of probe, the contact (stylus) instrument is calibrated.4.3 Place of calibration
The contact (stylus) instrument should be calibrated at the place of use with environmental conditions
similar to those present when in use for measurement to take into account external influence factors.
EXAMPLES Noise, temperature, vibration, air movement.4.4 Defects
Geometrical defects that can be present on the surfaces of material measures and calibration specimens
shall be taken into consideration according to ISO 25178-73.5 Measurement standards
The following measurement standards are applicable to the calibrations given in Clause 6:
— optical flat;— depth measurement standard (see Figure 1): type A according to ISO 5436-1:2000;
— spacing measurement standard (see Figure 2): type C according to ISO 5436-1:2000;
— inclined optical flat (see Figure 3);— profile coordinate measurement standard (consisting of a sphere or prism): type E according to
ISO 5436-1:2000;— roughness measurement standard (see Figure 4): type D according to ISO 5436-1:2000.
It is recommended that a profile coordinate measurement standard be used on contact (stylus)
instruments where the stylus rotates at least plus and minus one half of a degree when moving through
its full range.NOTE A type C periodic measurement standard is also useful for checking Ra as well as for checking Rsm.
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
Dimensions in millimetres
Figure 1 — Example of a depth measurement standard (type A)
Dimensions in millimetres
Figure 2 — Example of a spacing measurement standard (type C)
© ISO 2021 – All rights reserved
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SIST EN ISO 12179:2022
ISO 12179:2021(E)
Dimensions in millimetres
Figure 3 — Example of an inclined optical flat and a measuring plan
Dimensions in millimetres
Figure 4 — Example of a roughness measurement standard (type D) and measuring plan
© ISO 2021 – All rights reserved---------------------- Page: 17 ----------------------
SIST EN ISO 12179:2022
ISO 12179:2021(E)
6 Contact (stylus) instrument metrological characteristics
6.1 General
Only those task-related contact (stylus) instrument metrological characteristics which are relevant
for the intended measurements should be selected for calibration and adjustment. For example, for the
measurement of spacing parameters, the vertical profile component need not be calibrated. Adjustment
(if required) of the metrological characteristic shall be carried out after calibration of the metrological
characteristic according to the instrument manufacturer’s procedures.6.2 Residual profile calibration
The scratch-free optical flat reproduces the residual profile. For task-related calibrations use the
appropriate profile and parameters (e.g. the roughness profile with Ra, Rq or Rt; the waviness profile
with Wa, Wq or Wt, see ISO 21920-2).NOTE By using this approach the effects of external guide straightness, environmental conditions and
instrument noise can be established.6.3 Vertical profile component calibration
The depth measurement standard establishes a profile depth in order to measure the error of indication
of the vertical profile component of an instrument.If no depth measurement standards are available, gauge blocks steps may be used. Care should be taken
concerning the uncertainty of the height difference when using gauge blocks steps.
6.4 Horizontal profile component calibrationThe spacing measurement standard reproduces the mean width of profile element, PSm, in order to
measure the error of indication of the horizontal profile component.6.5 Profile coordinate system calibration
The inclined optical flat reproduces:
— the least-squares-best-fit angle in degrees;
— the total height of the primary profile, Pt, see ISO 21920-2, after removal of the least-squares-best-
fit straight line,thus establishing the error of the linked horizontal and vertical coordinates (e.g. variation in traverse
speed, nonlinearities in scal...
SLOVENSKI STANDARD
oSIST prEN ISO 12179:2020
01-april-2020
Specifikacija geometrijskih veličin izdelka - Tekstura površine: profilna metoda -
Umerjanje kontaktnih (s tipalom) instrumentov (ISO/DIS 12179:2020)Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration
of contact (stylus) instruments (ISO/DIS 12179:2020)Geometrische Produktspezifikation (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren - Kalibrierung von Tastschnittgeräten (ISO/DIS 12179:2020)
Spécification géométrique des produits (GPS) - Etats de surface : Méthode du profil -
Etalonnage des instruments à contact (palpeur) (ISO/DIS 12179:2020)Ta slovenski standard je istoveten z: prEN ISO 12179
ICS:
17.040.30 Merila Measuring instruments
17.040.40 Specifikacija geometrijskih Geometrical Product
veličin izdelka (GPS) Specification (GPS)
oSIST prEN ISO 12179:2020 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN ISO 12179:2020
DRAFT INTERNATIONAL STANDARD
ISO/DIS 12179
ISO/TC 213 Secretariat: BSI
Voting begins on: Voting terminates on:
2020-02-03 2020-04-27
Geometrical product specifications (GPS) — Surface
texture: Profile method — Calibration of contact (stylus)
instruments
Spécification géométrique des produits (GPS) — État de surface: Méthode du profil — Étalonnage des
instruments à contact (palpeur)ICS: 17.040.30
THIS DOCUMENT IS A DRAFT CIRCULATED
This document is circulated as received from the committee secretariat.
FOR COMMENT AND APPROVAL. IT IS
THEREFORE SUBJECT TO CHANGE AND MAY
NOT BE REFERRED TO AS AN INTERNATIONAL
STANDARD UNTIL PUBLISHED AS SUCH.
IN ADDITION TO THEIR EVALUATION AS
ISO/CEN PARALLEL PROCESSING
BEING ACCEPTABLE FOR INDUSTRIAL,
TECHNOLOGICAL, COMMERCIAL AND
USER PURPOSES, DRAFT INTERNATIONAL
STANDARDS MAY ON OCCASION HAVE TO
BE CONSIDERED IN THE LIGHT OF THEIR
POTENTIAL TO BECOME STANDARDS TO
WHICH REFERENCE MAY BE MADE IN
Reference number
NATIONAL REGULATIONS.
ISO/DIS 12179:2020(E)
RECIPIENTS OF THIS DRAFT ARE INVITED
TO SUBMIT, WITH THEIR COMMENTS,
NOTIFICATION OF ANY RELEVANT PATENT
RIGHTS OF WHICH THEY ARE AWARE AND TO
PROVIDE SUPPORTING DOCUMENTATION. ISO 2020
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oSIST prEN ISO 12179:2020
ISO/DIS 12179:2020(E)
COPYRIGHT PROTECTED DOCUMENT
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
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oSIST prEN ISO 12179:2020
ISO/DIS 12179:2020(E)
Contents Page
Foreword ........................................................................................................................................................................................................................................iv
Introduction ..................................................................................................................................................................................................................................v
1 Scope .................................................................................................................................................................................................................................. 1
2 Normative references .......................................................................................................................................................................................... 1
3 Terms and definitions .......................................................................................................................................................................................... 2
4 Conditions of use ..................................................................................................................................................................................................... 3
4.1 Components and configurations of the contact (stylus) instrument ....................................................... 3
4.2 Calibration of a configuration .................................................................................................................................................... 3
4.3 Place of calibration .............................................................................................................................................................................. 3
4.4 Defects ............................................................................................................................................................................................................ 3
5 Measurement standards.................................................................................................................................................................................... 3
6 Contact (stylus) instrument metrological characteristics ................................................................................................... 4
6.1 Residual profile calibration .......................................................................................................................................................... 4
6.2 Vertical profile component calibration .............................................................................................................................. 5
6.3 Horizontal profile component calibration ...................................................................................................................... 6
6.4 Profile co-ordinate system calibration ............................................................................................................................... 6
6.5 Calibration of the total contact (stylus) instrument ............................................................................................... 6
7 Calibration ..................................................................................................................................................................................................................... 6
7.1 Preparation for calibration ........................................................................................................................................................... 6
7.2 Evaluation of the residual profile ............................................................................................................................................ 7
7.3 Calibration of the vertical profile component profile ............................................................................................ 7
7.3.1 Overall objective ............................................................................................................................................................... 7
7.3.2 Procedure ............................................................................................................................................................................... 7
7.4 Calibration of the horizontal profile component ....................................................................................................... 8
7.4.1 Overall objective ............................................................................................................................................................... 8
7.4.2 Procedure ............................................................................................................................................................................... 8
7.5 Calibration of the profile co-ordinate system ............................................................................................................... 8
7.5.1 Overall objective ............................................................................................................................................................... 8
7.5.2 Procedure ............................................................................................................................................................................... 8
7.6 Calibration of the total contact (stylus) instrument ............................................................................................... 8
7.6.1 Overall objective ............................................................................................................................................................... 8
7.6.2 Procedure ............................................................................................................................................................................... 8
8 Measurement uncertainty ............................................................................................................................................................................... 9
8.1 Information from the calibration certificate for a measurement standard ........................................ 9
8.2 The uncertainty of the values measured during calibration of a measuringinstrument using a measurement standard .................................................................................................................. 9
9 Contact (stylus) instrument calibration certificate ................................................................................................................... 9
Annex A (normative) .......................................................11Calibration of instruments measuring parameters of the motifs method
Annex B (normative) Calibration of simplified operator instruments for the measurements
of surface texture ..............................................................................................................................................................................................13
Annex C (informative) Example: roughness measurement standard parameter Ra .......................................14
Annex D (informative) Relation to the GPS matrix model ...........................................................................................................17
Bibliography .............................................................................................................................................................................................................................18
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Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.For an explanation on the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see the following
URL: www .iso .org/ iso/ foreword .html.This document was prepared by Technical Committee ISO/TC 213, Dimensional and geometrical product
specifications and verificationThis second edition cancels and replaces the first edition (ISO 12179:2000), which has been technically
revised.The main changes compared to the previous edition are as follows:
— Annex C has been amended.
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Introduction
This document is a geometrical product specification (GPS) standard and is to be regarded as a general
GPS standard (see ISO 14638). It influences the chain link 6 of the chain of standards on roughness,
waviness and primary profile.For more detailed information on the relationship of this standard to the GPS matrix model, see annex D.
This document introduces calibration of contact (stylus) instruments as defined in ISO 3274. The
calibration is to be carried out with the aid of measurement standards.© ISO 2020 – All rights reserved v
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DRAFT INTERNATIONAL STANDARD ISO/DIS 12179:2020(E)
Geometrical product specifications (GPS) — Surface
texture: Profile method — Calibration of contact (stylus)
instruments
1 Scope
This document applies to the calibration of the metrological characteristics of contact (stylus)
instruments for the measurement of surface texture by the profile method as defined in
ISO 3274. The calibration is to be carried out with the aid of measurement standards.
Annex B applies to the calibration of metrological characteristics of simplified operator contact (stylus)
instruments which do not conform with ISO 3274.2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments) applies.
ISO 3274:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal
characteristics of contact (stylus) instrumentsISO 4287:1997, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms,
definitions and surface texture parametersISO 5436-1:2000, Geometrical Product Specifications (GPS) — Surface texture: Profile method;
Measurement standards — Part 1: Material measuresISO 10012:2003, Measurement management systems — Requirements for measurement processes and
measuring equipmentISO 12085:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif
parametersISO 14253-1:2017, Geometrical product specifications (GPS) — Inspection by measurement of workpieces
and measuring equipment — Part 1: Decision rules for verifying conformity or nonconformity with
specificationsISO/TS 14253-2:2011, Geometrical product specifications (GPS) - Inspection by measurement of
workpieces and measuring equipment- Part 2: Guide to the estimation of uncer tainty of measurement in
GPS measurement, in calibration of measuring equipment and in product verification
ISO 25178-73:2019, Geometrical product specifications (GPS) — Surface texture: Areal — Part 73: Terms
and definitions for surface defects on material measuresISO/IEC Guide 98-3:2008, Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in
measurement (GUM: 1995)ISO/IEC Guide 99:2007, International vocabulary of metrology — Basic and general concepts and
associated terms (VIM)© ISO 2020 – All rights reserved 1
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3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 3274, ISO 4287,
) for convenience], GUMISO 14253-1, VIM [some of which are reproduced below (without their notes and term
and definition 3.2 and the following apply.ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— IEC Electropedia: available at http:// www .electropedia .org/— ISO Online browsing platform: available at https:// www .iso .org/ obp
3.1
calibration
operation that, under specified conditions, in a first step, establishes a relation between the quantity
values with measurement uncertainties provided by measurement standards and corresponding
indications with associated measurement uncertainties and, in a second step, uses this information to
establish a relation for obtaining a measurement result from an indication[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.39]
3.2
task related calibration
set of operations which establish, under specified conditions, the relationship between values of
quantities indicated by a measuring instrument and the corresponding known values of a limited
family of precisely defined measurands which constitute a subset of the measuring capabilities of the
measuring instrument3.3
adjustment of a measuring system
adjustment
set of operations carried out on a measuring system so that it provides prescribed
indicationscorresponding to given values of a quantity to be measured[SOURCE: ISO/IEC Guide 99:2007 (VIM), 3.11]
3.4
(measurement) standard
etalon
realization of the definition of a given quantity, with stated quantity value and associated
measurement uncertainty, used as a reference[SOURCE: ISO/IEC Guide 99:2007 (VIM), 5.1]
Note 1 to entry: In ISO 5436:1985, "measurement standards" were referred to as "calibration specimens".
3.5measurement uncertainty
uncertainty of measurement
uncertainty
non-negative parameter characterizing the dispersion of the quantity values being attributed to a
measurand, based on the information used[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.26]
3.6
metrological traceability
property of a measurement result whereby the result can be related to a reference through a
documented unbroken chain of calibrations, each contributing to the measurement uncertainty
[SOURCE: ISO/IEC Guide 99:2007 (VIM), 2.4.1]2 © ISO 2020 – All rights reserved
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3.7
defect
part of the measurement standard’s geometrical feature (non-ideal surface) on which the geometrical
shape and geometrical dimensions deviate from those on the nominal feature (ideal surface) either by
an amount greater than some agreed or stated maximum value, or, in the absence of any such agreed
or stated maximum value, by an amount greater than what is typical or characteristic for the processes
used in manufacturing the measurement standard[SOURCE: ISO 25178-73:2019, 3.1.2]
4 Conditions of use
4.1 Components and configurations of the contact (stylus) instrument
The contact (stylus) instrument is comprised of the basic equipment, a drive unit, a probe and a profile
recorder (see ISO 3274). If the basic equipment is used with several drive units and probes, each of
these instrumental combinations (configurations) shall be calibrated separately.4.2 Calibration of a configuration
The contact (stylus) instrument shall be calibrated when a change is made to the basic elements of the
system which intentionally or unintentionally modifies the measured profile/measuring result. Each
configuration of the contact (stylus) instrument shall be calibrated separately.EXAMPLE With a change of probe the contact (stylus) instrument shall be calibrated.
4.3 Place of calibrationThe contact (stylus) instrument should be calibrated at the place of use with environmental conditions
similar to those present when in use for measurement to take into account external influence factors.
EXAMPLE Noise, temperature, vibration, air movement, etc.4.4 Defects
Geometrical defects that may be present on the surfaces of material measures and calibration specimens
shall be taken into consideration according to ISO 25178-73.5 Measurement standards
The following measuring standards are applicable to the calibrations given in Clause 6:
optical flat;depth measurement standard (Figure 1): type A according to ISO 5436-1; spacing measurement
standard (Figure 2): type C according to ISO 5436-1; inclined optical flat (Figure 3);
profile co-ordinate measurement standard (consisting of a sphere or prism): type E according to
ISO 5436-1;roughness measurement standard (Figure 4): type D according to ISO 5436-1.
NOTE It is recommended that a profile co-ordinate measurement standard be used on contact (stylus)
instruments where the stylus rotates at least plus and minus one half of a degree when moving through its
full range.© ISO 2020 – All rights reserved 3
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6 Contact (stylus) instrument metrological characteristics
Only those task-related contact (stylus) instrument metrological characteristics which are relevant for
the intended measurements should be selected for calibration. For example, for the measurement of
spacing parameters, the vertical profile component need not be calibrated.6.1 Residual profile calibration
The scratch-free optical flat reproduces the residual profile. For task-related calibrations use the
appropriate profile and parameters (for example: the roughness profile with Ra, Rq or Rt; the waviness
profile with Wq or Wt).NOTE By using this approach the effects of external guide straightness, environmental conditions and
instrument noise can be established.Dimensions in millimetres
Figure 1 — Example of a depth measurement standard (type A)
Figure 2 — Example of a spacing measurement standard (type C)
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Figure 3 — Example of an inclined optical flat and a measuring plan
Values in millimetres
Figure 4 — Example of a roughness measurement standard (type D) and measuring plan
6.2 Vertical profile component calibrationThe depth measurement standard establishes a profile depth in order to measure the error of indication
of the vertical profile component of an instrument.NOTE If no depth measurement standards are available gauge blocks may be used. Care must be taken
concerning the uncertainty of the height difference when using gauge blocks.© ISO 2020 – All rights reserved 5
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6.3 Horizontal profile component calibration
The spacing measurement standard reproduces the mean width of profile element, PSm, in order to
measure the error of indication of the horizontal profile component.6.4 Profile co-ordinate system calibration
The inclined optical flat reproduces:
— The least squares best fit angle in degrees
— The total height of the primary profile, Pt, after removal of the least squares best fit straight line
thus, establishing the error of the linked horizontal and vertical co-ordinates (i.e. variation in traverse
speed, non linearities in scales, etc.).The profile co-ordinate measurement standard provides calibration for the total height of the
primary profile, Pt, after removal of the least squares best fit nominal form, thus establishing the co-
ordinate system.6.5 Calibration of the total contact (stylus) instrument
The roughness measurement standard reproduce the:
— Arithmetical mean deviation, Ra;
— Maximum height of profile, Rz;
Thus establishing an overall check of the total contact (stylus) instrument
7 Calibration
7.1 Preparation for calibration
Before calibration, the contact (stylus) instrument shall be checked to determine if it operates correctly
as described in the manufacturer's operating instructions. The condition of the stylus tip shall also be
checked according to the manufacturer's instructions.For contact (stylus) instruments the following shall be complied with
— The residual profile is to be evaluated.
— The plane of the depth measurement standard shall be aligned to the reference surface in the best
possible way.— All measurement standards shall be aligned properly, for example the plane of the roughness
measurement standard shall be aligned to within 10% of the measuring gauge range but not more
than 10 µm over the evaluation length.— In task related calibrations, roughness measurement standards shall be used with the appropriate
roughness, comparable to the roughness of the surface to be measured.— Measurements shall be taken in the middle of the vertical measuring range of the probe each time.
— A sufficient number of measurements shall be taken on each measurement standard for the required
measurement uncertainty, (see Clause 8). Repeated measurements are usually necessary due to the
inhomogeneity of the measurement standard, the variability of the measurement procedure, and
the repeatability of the contact (stylus) instrument.6 © ISO 2020 – All rights reserved
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— The conditions used to measure the measurement standard shall be compatible with those used to
calibrate the measurement standard.— The best fit procedure (i.e. least squares, minimum zone, etc.), used in the calibration of the
measurement standard, shall be used.7.2 Evaluation of the residual profile
Traverse the optical flat. Determine the residual profile and calculate the surface texture parameters
Pt and Pq.For task-related calibration, calibrate in accordance with the measuring conditions for each required
measurement. For example, when measuring a roughness measurement standard, a cut-off wavelength
λc = 0,8 mm and a cut-off ratio of 300:1, making a total evaluation length of 4 mm, are used. The
measured values of Ra and Rz shall be indicated in the calibration certificate for the instrument.
7.3 Calibration of the vertical profile component profile7.3.1 Overall objective
Traverse the groove(s) of the depth measurement standard. From the primary profile determine the
respective deviations from the value stated in the appropriate calibration certificate.
7.3.2 ProcedureMeasure the groove(s) in profile sections within the calibrated area of the measurement standard (see
Figure 1). Traverse the groove(s) individually and determine the depth of the groove(s) according to
the calibration procedure supplied with the depth measurement standard. State the deviation of the
(mean) value [obtained from the measured value(s)] from the figure given in the calibration certificate
of the depth measurement standard.Alternatively, if a depth measurement standard is not available, wring two gauge blocks, juxtaposed,
onto an optical flat. Traverse across both gauge blocks and determine the respective height difference
from the total profile. State the deviation in the measured height difference from the difference in
heights calculated from the values stated in the calibration certificates of the gauge blocks.
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7.4 Calibration of the horizontal profile component
7.4.1 Overall objective
Traverse the spacing measurement standard. Determine the respective deviations from the wavelength
parameters stated in the calibration certificate.7.4.2 Procedure
Perform measurements on the spacing measurement standard, distributed over the measurement
surface. An example of a measuring plan is given in Figure 2. Calculate the arithmetical mean for the
primary parameter PSm. Record the deviations from the values stated in the calibration certificate.
7.5 Calibration of the profile co-ordinate system7.5.1 Overall objective
Traverse the inclined optical flat, sphere or prism. Determine Pt of the respective deviations from the
least squares best fit of the form of the specimen7.5.2 Procedure
Perform measurements on each inclination measurement standard using the traverse length and
nominal angle of inclination as indicated in the calibration certificate. The measurements shall be
distributed over the measurement surface as shown in the measuring plan (see Figure 3). Calculate the
profile depth after removal of the leastsquares best fit line and the arithmetical mean of the least squares best fit angle.
and the mean angle of inclination.Record the largest profile depth
Traverse the profile co-ordinate measurement standard. After removal of the least squares best fit
nominal form, determine Pt.Perform measurements on each profile co-ordinate measur
...
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