SIST-TP CEN/CLC/TR 17603-10-12:2021
(Main)Space engineering - Calculation of radiation and its effects and margin policy handbook
Space engineering - Calculation of radiation and its effects and margin policy handbook
This handbook is a part of the System Engineering branch and covers the methods for the calculation of radiation received and its effects, and a policy for design margins. Both natural and man-made sources of radiation (e.g.
radioisotope thermoelectric generators, or RTGs) are considered in the handbook.
This handbook can be applied to the evaluation of radiation effects on all space systems.
This handbook can be applied to all product types w hich exist or operate in space, as w ell as to crew s of on manned space missions.
This handbook complements to EN 16603-10-12 "Methods for the calculation of radiation received and its effects and a policy for the design margin".
Raumfahrttechnik - Handbuch zur Berechnung von Strahlung, Strahlungseffekten und Marginregeln
Ingénierie spatiale - Manuel de calcul du transport des radiations et de leurs effets, et politique des marges
Vesoljska tehnika - Priročnik za izračun sevanja in njegovih učinkov ter za politiko pri načrtovanju mejnih vrednosti
General Information
Buy Standard
Standards Content (Sample)
SLOVENSKI STANDARD
SIST-TP CEN/CLC/TR 17603-10-12:2021
01-november-2021
Vesoljska tehnika - Priročnik za izračun sevanja in njegovih učinkov ter za politiko
pri načrtovanju mejnih vrednosti
Space engineering - Calculation of radiation and its effects and margin policy handbook
Raumfahrttechnik - Handbuch zur Berechnung von Strahlung, Strahlungseffekten und
Marginregeln
Ingénierie spatiale - Manuel de calcul du transport des radiations et de leurs effets, et
politique des marges
Ta slovenski standard je istoveten z: CEN/CLC/TR 17603-10-12:2021
ICS:
49.140 Vesoljski sistemi in operacije Space systems and
operations
SIST-TP CEN/CLC/TR 17603-10-12:2021 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST-TP CEN/CLC/TR 17603-10-12:2021
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SIST-TP CEN/CLC/TR 17603-10-12:2021
TECHNICAL REPORT
CEN/CLC/TR 17603-10-
12
RAPPORT TECHNIQUE
TECHNISCHER BERICHT
September 2021
ICS 49.140
English version
Space engineering - Calculation of radiation and its effects
and margin policy handbook
Ingénierie spatiale - Manuel de calcul du transport des Raumfahrttechnik - Handbuch zur Berechnung von
radiations et de leurs effets, et politique des marges Strahlung, Strahlungseffekten und Marginregeln
This Technical Report was approved by CEN on 19 March 2021. It has been drawn up by the Technical Committee CEN/CLC/JTC
5.
CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium,
Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.
CEN-CENELEC Management Centre:
Rue de la Science 23, B-1040 Brussels
© 2021 CEN/CENELEC All rights of exploitation in any form and by any means Ref. No. CEN/CLC/TR 17603-10-12:2021 E
reserved worldwide for CEN national Members and for
CENELEC Members.
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CEN/CLC/TR 17603-10-12:2021 (E)
Table of contents
European Foreword . 9
1 Scope . 10
2 Terms, definitions and abbreviated terms . 11
2.1 Terms from other documents . 11
2.2 Terms specific to the present handbook . 11
2.3 Abbreviated terms. 11
3 Compendium of radiation effects . 12
3.1 Purpose . 12
3.2 Effects on electronic and electrical systems . 14
3.2.1 Total ionising dose . 14
3.2.2 Displacement damage . 14
3.2.3 Single event effects . 15
3.3 Effects on materials . 16
3.4 Payload-specific radiation effects . 16
3.5 Biological effects . 17
3.6 Spacecraft charging . 17
3.7 References . 17
4 Margin . 19
4.1 Introduction . 19
4.1.1 Application of margins . 19
4.2 Environment uncertainty . 20
4.3 Effects parameters’ uncertainty. 21
4.3.1 Overview . 21
4.3.2 Shielding . 21
4.3.3 Ionising dose calculation . 22
4.3.4 Non-ionising dose (NIEL, displacement damage) . 22
4.3.5 Single event effects . 22
4.3.6 Effects on sensors. 23
4.4 Testing-related uncertainties . 23
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4.4.1 Overview . 23
4.4.2 Beam characteristics . 23
4.4.3 Radioactive sources . 23
4.4.4 Packaging . 24
4.4.5 Penetration . 24
4.4.6 Representativeness . 24
4.5 Procurement processes and device reproducibility . 24
4.6 Project management decisions . 25
4.7 Relationship with derating . 25
4.8 Typical design margins . 25
4.9 References . 25
5 Radiation shielding . 26
5.1 Introduction . 26
5.2 Radiation transport processes . 26
5.2.1 Overview . 26
5.2.2 Electrons . 26
5.2.3 Protons and other heavy particles . 28
5.2.4 Electromagnetic radiation – bremsstrahlung. 32
5.3 Ionising dose enhancement . 33
5.4 Material selection . 33
5.5 Equipment design practice . 33
5.5.1 Overview . 33
5.5.2 The importance of layout . 34
5.5.3 Add-on shielding . 34
5.6 Shielding calculation methods and tools – Decision on using deterministic
radiation calculations, detailed Monte Carlo simulations, or sector shielding
analysis . 36
5.7 Example detailed radiation transport and shielding codes . 45
5.8 Uncertainties . 45
5.9 References . 46
6 Total ionising dose . 48
6.1 Introduction . 48
6.2 Definition . 48
6.3 Technologies sensitive to total ionising dose . 48
6.4 Total ionising dose calculation . 50
6.5 Uncertainties . 50
3
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7 Displacement damage . 51
7.1 Introduction . 51
7.2 Definition . 51
7.3 Physical processes and modelling . 51
7.4 Technologies susceptible to displacement damage . 55
7.4.1 Overview . 55
7.4.2 Bipolar . 56
7.4.3 Charge-coupled devices (CCD). 57
7.4.4 Active pixel sensors (APS) . 57
7.4.5 Photodiodes . 58
7.4.6 Laser diodes . 58
7.4.7 Light emitting diode (LED) . 58
7.4.8 Optocouplers . 58
7.4.9 Solar cells . 59
7.4.10 Germanium detectors . 59
7.4.11 Glasses and optical components . 60
7.5 Radiation damage assessment . 60
7.5.1 Equivalent fluence calculation . 60
7.5.2 Calculation approach . 60
7.5.3 3-D Monte Carlo analysis . 60
7.5.4 Displacement damage testing . 60
7.6 NIEL rates for different particles and materials . 61
7.7 Uncertainties . 68
7.8 References . 68
8 Single event effects . 70
8.1 Introduction . 70
8.2 Modelling . 71
8.2.1 Overview . 71
8.2.2 Notion of LET (for heavy ions) . 71
8.2.3 Concept of cross section . 71
8.2.4 Concept of sensitive volume, critical charge and effective LET . 72
8.3 Technologies susceptible to single event effects . 73
8.4 Test methods . 73
8.4.1 Overview . 73
8.4.2 Heavy ion beam testing . 73
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8.4.3 Proton and neutron beam testing . 74
8.4.4 Experimental measurement of SEE sensitivity . 74
8.4.5 Influence of testing conditions . 75
8.5 Hardness assurance . 77
8.5.1 Rate prediction . 77
8.5.2 Prediction of SEE rates for ions. 77
8.5.3 Improvements . 79
8.5.4 Method synthesis . 80
8.5.5 Prediction of SEE rates of protons and neutrons . 80
8.5.6 Method synthesis . 82
8.5.7 Calculation toolkit . 82
8.5.8 Applicable derating and mitigating techniques . 82
8.5.9 Analysis at system level . 82
8.6 Destructive SEE . 83
8.6.1 Single event latch-up (SEL) and single event snapback (SESB) . 83
8.6.2 Single event gate rupture (SEGR) and single event dielectric rupture
(SEDR) . 85
8.6.3 Single event burnout (SEB) . 86
8.7 Non-destructive SEE . 87
8.7.1 Single event upset (SEU) . 87
8.7.2 Multiple-cell upset (MCU) and single word multiple-bit upset (SMU). 87
8.7.3 Single event functional interrupt (SEFI) . 89
8.7.4 Single event hard error (SEHE) . 90
8.7.5 Single event transient (SET) and single event disturb (SED) . 91
8.8 References . 92
9 Radiation-induced sensor backgrounds . 96
9.1 Introduction . 96
9.2 Background in ultraviolet, optical and infrared imaging sensors . 96
9.3 Background in charged particle detectors . 100
9.4 Background in X-ray CCDs . 100
9.5 Radiation background in gamma-ray instruments . 101
9.6 Photomultipliers tubes and microchannel plates . 104
9.7 Radiation-induced noise in gravity-wave detectors . 105
9.8 Other problems common to detectors . 105
9.9 References . 106
10 Effects in biological material . 108
10.1 Introduction . 108
5
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10.2 Quantities used in radiation protection work. 108
10.2.1 Overview . 108
10.2.2 Protection quantities . 109
10.2.3 Operational quantities . 111
10.3 Radiation effects in biological systems . 113
10.3.1 Overview . 113
10.3.2 Source of data . 114
10.3.3 Early effects . 114
10.3.4 Late effects . 115
10.4 Radiation protection limits in space . 117
10.4.1 Overview . 117
10.4.2 International agreements. 117
10.4.3 Other considerations in calculating crew exposure . 118
10.4.4 Radiation limits used by the space agencies of the partners of the
International Space Station (ISS) . 118
10.5 Uncertainties . 122
10.5.1 Overview . 122
10.5.2 Spacecraft shielding interactions . 122
10.5.3 The unique effects of heavy ions . 122
10.5.4 Extrapolation from high-dose effects to low-dose effects . 123
10.5.5 Variability in composition, space and time . 123
10.5.6 Effects of depth-dose distribution . 123
10.5.7 Influence of spaceflight environment . 123
10.5.8 Uncertainties summary . 125
10.6 References . 125
Figures
Figure 1: CSDA range of electrons in example low- and high-Z materials as a function
of electron energy . 27
Figure 2: Total stopping powers for electrons in example low- and high-Z materials . 28
Figure 3: Intensity of mono-energetic protons in a beam as a function of integral
pathlength, . 29
Figure 4: Projected range of protons in example low- and high-Z materials as a function
of proton energy. . 30
Figure 5: Total stopping powers for protons in example low- and high-Z materials. . 30
Figure 6: Stopping power for electrons from collisions with atomic electrons and
bremsstrahlung production, and from bremsstrahlung production alone. . 32
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Figure 12: Five electric effects due to defects in the semiconductor band gap [RDE.4] . 56
Figure 13: SEE initial mechanisms by direct ionisation (for heavy ions) and nuclear
interactions (for protons and neutrons). . 70
Figure 22: ISOCAM images for quiet conditions (top) and during solar flare event of
November 1997. . 98
Figure 23: Predicted and measured background spectra observed in OSSE instrument
on Compton Gamma-Ray Observatory 419 days after launch [RDG.10]. . 102
Figure 25: Relationship of quantities for radiological protection. . 113
Tables
Table 1: Summary of radiation effects parameters, units and examples. . 12
Table 2: Summary of radiation effects and cross-references to other chapters (part 1 of
2) . 13
Table 2: Summary of radiation effects and cross-references to other chapters (part 2 of
2) . 14
Table 3: Description of physics models (part 1 of 4) . 37
Table 3: Description of physics models (part 2 of 4) . 38
Table 3: Description of physics models (part 3 of 4) . 39
Table 3: Description of physics models (part 4 of 4) . 40
Table 4: Example radiation transport simulation programs which are applicable to
shielding and effects analysis. . 44
Table 5: NIEL rates for electrons incident on Si (from Summers et al based on Si
threshold of 21 eV [RDE.11]) . 61
Table 6: NIEL rates for protons incident on Si (part 1 of 2). This is a subset of NIEL
data from Huhtinen and Aarnio [RDE.12]. . 62
Table 6: NIEL rates for protons incident on Si (part 2 of 2). This is a subset of NIEL
data from Huhtinen and Aarnio [RDE.12]. . 63
Table 7: NIEL rates for neutrons incident on Si (part 1 of 2). This is a subset of NIEL
from Griffin et al [RDE.13]. . 64
Table 7: NIEL rates for neutrons incident on Si (part 2 of 3). These data are from
Konobeyev et al [RDE.14]. . 65
Table 7: NIEL rates for neutrons incident on Si (part 3 of 3). This is a subset of NIEL
from Huhtinen and Aarnio [RDE.12]. . 66
Table 8: NIEL rates for electrons in Si and GaAs (Akkerman et al [RDE.15]) . 67
Table 9: NIEL rates for protons in Si . 67
Table 10: NIEL rates for protons in GaAs. . 68
Table 11: Typical materials for UV, visible and IR sensors, with band-gap and electron-
hole production energies (e-h production energy for MCT is based on Klein
semi-empirical formula. . 97
Table 12: Lifetime mortality in a population of all ages from specific cancer after
exposure to low doses. . 116
Table 13: Estimates of the thresholds for deterministic effects in the adult human
testes, ovaries, lens and bone marrow. . 116
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Table 14: CSA career ionising radiation exposure limits. . 119
Table 15: ESA ionising radiation exposure limits. . 119
Table 16: NCRP-132 recommended RBEs. . 119
Table 17: NCRP-132 Deterministic dose limits for all ages and genders (Gy-Eq.). . 120
Table 18: NCRP-132 career ionising radiation exposure limits. . 120
Table 19: NCRP-132 career effective dose limits for age and gender specific ionising
radiation exposure for 10-year careers. . 120
Table 20: JAXA short-term ionising exposure limits . 120
Table 21: JAXA career ionising radiation exposure limits (Sv). . 121
Table 22: JAXA current career exposure limits by age and gender . 121
Table 23: RSA short-term ionising exposure limits. . 121
Table 24: Russian career ionising radiation exposure limits . 122
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European Foreword
This document (CEN/CLC/TR 17603-10-12:2021) has been prepared by Technical
Committee CEN/CLC/JTC 5 “Space”, the secretariat of which is held by DIN.
It is highlighted that this technical report does not contain any requirement but only
collection of data or descriptions and guidelines about how to organize and perform the
work in support of EN 16603-10-12.
This Technical report (CEN/CLC/TR 17603-10-12:2021) originates from ECSS-E-HB-
10-12A.
Attention is drawn to the possibility that some of the elements of this document may be
the subject of patent rights. CEN [and/or CENELEC] shall not be held responsible for
identifying any or all such patent rights.
This document has been prepared under a mandate given to CEN by the European
Commission and the European Free Trade Association.
This document has been developed to cover specifically space systems and has
therefore precedence over any TR covering the same scope but with a wider domain of
applicability (e.g.: aerospace).
9
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1
Scope
This handbook is a part of the System Engineering branch and covers the methods for
the calculation of radiation received and its effects, and a policy for design margins.
Both natural and man-made sources of radiation (e.g. radioisotope thermoelectric
generators, or RTGs) are considered in the handbook.
T
...
SLOVENSKI STANDARD
kSIST-TP FprCEN/CLC/TR 17603-10-12:2021
01-februar-2021
Vesoljska tehnika - Priročnik za izračun sevanja in njegovih učinkov ter za politiko
pri načrtovanju mejnih vrednosti
Space engineering - Calculation of radiation and its effects and margin policy handbook
Raumfahrttechnik - Berechnung der Strahlung und ihrer Auswirkungen sowie Handbuch
zur Margenpolitik
Ingénierie spatiale - Manuel de calcul du rayonnement et de ses effets, et politique de
marge
Ta slovenski standard je istoveten z: FprCEN/CLC/TR 17603-10-12
ICS:
49.140 Vesoljski sistemi in operacije Space systems and
operations
kSIST-TP FprCEN/CLC/TR 17603-10- en,fr,de
12:2021
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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kSIST-TP FprCEN/CLC/TR 17603-10-12:2021
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kSIST-TP FprCEN/CLC/TR 17603-10-12:2021
TECHNICAL REPORT
FINAL DRAFT
FprCEN/CLC/TR 17603-
RAPPORT TECHNIQUE
10-12
TECHNISCHER BERICHT
November 2020
ICS
English version
Space engineering - Calculation of radiation and its effects
and margin policy handbook
Ingénierie spatiale - Manuel de calcul du rayonnement Raumfahrttechnik - Berechnung der Strahlung und
et de ses effets, et politique de marge ihrer Auswirkungen sowie Handbuch zur
Margenpolitik
This draft Technical Report is submitted to CEN members for Vote. It has been drawn up by the Technical Committee
CEN/CLC/JTC 5.
CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium,
Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.
Recipients of this draft are invited to submit, with their comments, notification of any relevant patent rights of which they are
aware and to provide supporting documentation.
Warning : This document is not a Technical Report. It is distributed for review and comments. It is subject to change without
notice and shall not be referred to as a Technical Report.
CEN-CENELEC Management Centre:
Rue de la Science 23, B-1040 Brussels
© 2020 CEN/CENELEC All rights of exploitation in any form and by any means Ref. No. FprCEN/CLC/TR 17603-10-12:2020 E
reserved worldwide for CEN national Members and for
CENELEC Members.
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FprCEN/CLC/TR 17603-10-12:2020 (E)
Table of contents
European Foreword . 9
1 Scope . 10
2 Terms, definitions and abbreviated terms . 11
2.1 Terms from other documents . 11
2.2 Terms specific to the present handbook . 11
2.3 Abbreviated terms. 11
3 Compendium of radiation effects . 12
3.1 Purpose . 12
3.2 Effects on electronic and electrical systems . 14
3.2.1 Total ionising dose . 14
3.2.2 Displacement damage . 14
3.2.3 Single event effects . 15
3.3 Effects on materials . 16
3.4 Payload-specific radiation effects . 16
3.5 Biological effects . 16
3.6 Spacecraft charging . 17
3.7 References . 17
4 Margin . 19
4.1 Introduction . 19
4.1.1 Application of margins . 19
4.2 Environment uncertainty . 20
4.3 Effects parameters’ uncertainty. 21
4.3.1 Overview . 21
4.3.2 Shielding . 21
4.3.3 Ionising dose calculation . 22
4.3.4 Non-ionising dose (NIEL, displacement damage) . 22
4.3.5 Single event effects . 22
4.3.6 Effects on sensors. 23
4.4 Testing-related uncertainties . 23
4.4.1 Overview . 23
4.4.2 Beam characteristics . 23
2
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4.4.3 Radioactive sources . 23
4.4.4 Packaging . 24
4.4.5 Penetration . 24
4.4.6 Representativeness . 24
4.5 Procurement processes and device reproducibility . 24
4.6 Project management decisions . 24
4.7 Relationship with derating . 25
4.8 Typical design margins . 25
4.9 References . 25
5 Radiation shielding . 26
5.1 Introduction . 26
5.2 Radiation transport processes . 26
5.2.1 Overview . 26
5.2.2 Electrons . 26
5.2.3 Protons and other heavy particles . 28
5.2.4 Electromagnetic radiation – bremsstrahlung. 31
5.3 Ionising dose enhancement . 32
5.4 Material selection . 32
5.5 Equipment design practice . 33
5.5.1 Overview . 33
5.5.2 The importance of layout . 33
5.5.3 Add-on shielding . 34
5.6 Shielding calculation methods and tools – Decision on using deterministic
radiation calculations, detailed Monte Carlo simulations, or sector shielding
analysis . 35
5.7 Example detailed radiation transport and shielding codes . 44
5.8 Uncertainties . 44
5.9 References . 44
6 Total ionising dose . 47
6.1 Introduction . 47
6.2 Definition . 47
6.3 Technologies sensitive to total ionising dose . 47
6.4 Total ionising dose calculation . 48
6.5 Uncertainties . 49
7 Displacement damage . 50
7.1 Introduction . 50
7.2 Definition . 50
3
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7.3 Physical processes and modelling . 50
7.4 Technologies susceptible to displacement damage . 54
7.4.1 Overview . 54
7.4.2 Bipolar . 55
7.4.3 Charge-coupled devices (CCD). 55
7.4.4 Active pixel sensors (APS) . 56
7.4.5 Photodiodes . 56
7.4.6 Laser diodes . 57
7.4.7 Light emitting diode (LED) . 57
7.4.8 Optocouplers . 57
7.4.9 Solar cells . 57
7.4.10 Germanium detectors . 58
7.4.11 Glasses and optical components . 58
7.5 Radiation damage assessment . 58
7.5.1 Equivalent fluence calculation . 58
7.5.2 Calculation approach . 59
7.5.3 3-D Monte Carlo analysis . 59
7.5.4 Displacement damage testing . 59
7.6 NIEL rates for different particles and materials . 59
7.7 Uncertainties . 67
7.8 References . 67
8 Single event effects . 69
8.1 Introduction . 69
8.2 Modelling . 70
8.2.1 Overview . 70
8.2.2 Notion of LET (for heavy ions) . 70
8.2.3 Concept of cross section . 70
8.2.4 Concept of sensitive volume, critical charge and effective LET . 71
8.3 Technologies susceptible to single event effects . 71
8.4 Test methods . 72
8.4.1 Overview . 72
8.4.2 Heavy ion beam testing . 72
8.4.3 Proton and neutron beam testing . 73
8.4.4 Experimental measurement of SEE sensitivity . 73
8.4.5 Influence of testing conditions . 74
8.5 Hardness assurance . 75
8.5.1 Rate prediction . 75
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8.5.2 Prediction of SEE rates for ions. 75
8.5.3 Improvements . 78
8.5.4 Method synthesis . 79
8.5.5 Prediction of SEE rates of protons and neutrons . 79
8.5.6 Method synthesis . 80
8.5.7 Calculation toolkit . 81
8.5.8 Applicable derating and mitigating techniques . 81
8.5.9 Analysis at system level . 81
8.6 Destructive SEE . 82
8.6.1 Single event latch-up (SEL) and single event snapback (SESB) . 82
8.6.2 Single event gate rupture (SEGR) and single event dielectric rupture
(SEDR) . 84
8.6.3 Single event burnout (SEB) . 85
8.7 Non-destructive SEE . 85
8.7.1 Single event upset (SEU) . 85
8.7.2 Multiple-cell upset (MCU) and single word multiple-bit upset (SMU). 86
8.7.3 Single event functional interrupt (SEFI) . 88
8.7.4 Single event hard error (SEHE) . 88
8.7.5 Single event transient (SET) and single event disturb (SED) . 89
8.8 References . 91
9 Radiation-induced sensor backgrounds . 95
9.1 Introduction . 95
9.2 Background in ultraviolet, optical and infrared imaging sensors . 95
9.3 Background in charged particle detectors . 99
9.4 Background in X-ray CCDs . 99
9.5 Radiation background in gamma-ray instruments . 100
9.6 Photomultipliers tubes and microchannel plates . 103
9.7 Radiation-induced noise in gravity-wave detectors . 104
9.8 Other problems common to detectors . 104
9.9 References . 104
10 Effects in biological material . 106
10.1 Introduction . 106
10.2 Quantities used in radiation protection work. 106
10.2.1 Overview . 106
10.2.2 Protection quantities . 107
10.2.3 Operational quantities . 109
10.3 Radiation effects in biological systems . 111
5
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10.3.1 Overview . 111
10.3.2 Source of data . 112
10.3.3 Early effects . 112
10.3.4 Late effects . 112
10.4 Radiation protection limits in space . 114
10.4.1 Overview . 114
10.4.2 International agreements. 115
10.4.3 Other considerations in calculating crew exposure . 115
10.4.4 Radiation limits used by the space agencies of the partners of the
International Space Station (ISS) . 116
10.5 Uncertainties . 119
10.5.1 Overview . 119
10.5.2 Spacecraft shielding interactions . 119
10.5.3 The unique effects of heavy ions . 119
10.5.4 Extrapolation from high-dose effects to low-dose effects . 120
10.5.5 Variability in composition, space and time . 120
10.5.6 Effects of depth-dose distribution . 120
10.5.7 Influence of spaceflight environment . 121
10.5.8 Uncertainties summary . 122
10.6 References . 122
Figures
Figure 1: CSDA range of electrons in example low- and high-Z materials as a function
of electron energy . 27
Figure 2: Total stopping powers for electrons in example low- and high-Z materials . 27
Figure 3: Intensity of mono-energetic protons in a beam as a function of integral
pathlength, . 29
Figure 4: Projected range of protons in example low- and high-Z materials as a function
of proton energy. . 29
Figure 5: Total stopping powers for protons in example low- and high-Z materials. . 30
Figure 6: Stopping power for electrons from collisions with atomic electrons and
bremsstrahlung production, and from bremsstrahlung production alone. . 31
Figure 12: Five electric effects due to defects in the semiconductor band gap
[RDE.4] . 55
Figure 13: SEE initial mechanisms by direct ionisation (for heavy ions) and nuclear
interactions (for protons and neutrons). . 69
Figure 22: ISOCAM images for quiet conditions (top) and during solar flare event of
November 1997. . 97
Figure 23: Predicted and measured background spectra observed in OSSE instrument
on Compton Gamma-Ray Observatory 419 days after launch [RDG.10]. 101
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Figure 25: Relationship of quantities for radiological protection. . 111
Tables
Table 1: Summary of radiation effects parameters, units and examples. . 12
Table 2: Summary of radiation effects and cross-references to other chapters (part 1 of
2) . 13
Table 2: Summary of radiation effects and cross-references to other chapters (part 2 of
2) . 14
Table 3: Description of physics models (part 1 of 4) . 37
Table 3: Description of physics models (part 2 of 4) . 38
Table 3: Description of physics models (part 3 of 4) . 39
Table 3: Description of physics models (part 4 of 4) . 40
Table 4: Example radiation transport simulation programs which are applicable to
shielding and effects analysis. . 43
Table 5: NIEL rates for electrons incident on Si (from Summers et al based on Si
threshold of 21 eV [RDE.11]) . 60
Table 6: NIEL rates for protons incident on Si (part 1 of 2). This is a subset of NIEL
data from Huhtinen and Aarnio [RDE.12]. . 61
Table 6: NIEL rates for protons incident on Si (part 2 of 2). This is a subset of NIEL
data from Huhtinen and Aarnio [RDE.12]. . 62
Table 7: NIEL rates for neutrons incident on Si (part 1 of 2). This is a subset of NIEL
from Griffin et al [RDE.13]. . 63
Table 7: NIEL rates for neutrons incident on Si (part 2 of 3). These data are from
Konobeyev et al [RDE.14]. . 64
Table 7: NIEL rates for neutrons incident on Si (part 3 of 3). This is a subset of NIEL
from Huhtinen and Aarnio [RDE.12]. . 65
Table 8: NIEL rates for electrons in Si and GaAs (Akkerman et al [RDE.15]) . 66
Table 9: NIEL rates for protons in Si . 66
Table 10: NIEL rates for protons in GaAs. . 67
Table 11: Typical materials for UV, visible and IR sensors, with band-gap and electron-
hole production energies (e-h production energy for MCT is based on Klein
semi-empirical formula. . 96
Table 12: Lifetime mortality in a population of all ages from specific cancer after
exposure to low doses. . 113
Table 13: Estimates of the thresholds for deterministic effects in the adult human
testes, ovaries, lens and bone marrow. . 114
Table 14: CSA career ionising radiation exposure limits. . 116
Table 15: ESA ionising radiation exposure limits. . 116
Table 16: NCRP-132 recommended RBEs. . 117
Table 17: NCRP-132 Deterministic dose limits for all ages and genders (Gy-Eq.). . 117
Table 18: NCRP-132 career ionising radiation exposure limits. . 117
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Table 19: NCRP-132 career effective dose limits for age and gender specific ionising
radiation exposure for 10-year careers. . 117
Table 20: JAXA short-term ionising exposure limits . 118
Table 21: JAXA career ionising radiation exposure limits (Sv). . 118
Table 22: JAXA current career exposure limits by age and gender . 118
Table 23: RSA short-term ionising exposure limits. . 119
Table 24: Russian career ionising radiation exposure limits . 119
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European Foreword
This document (FprCEN/CLC/TR 17603-10-12:2020) has been prepared by Technical
Committee CEN/CLC/JTC 5 “Space”, the secretariat of which is held by DIN.
This document is currently submitted to the Vote on TR.
It is highlighted that this technical report does not contain any requirement but only
collection of data or descriptions and guidelines about how to organize and perform the
work in support of EN 16603-10-12.
This Technical report (FprCEN/CLC/TR 17603-10-12:2020) originates from ECSS-E-
HB-10-12A.
Attention is drawn to the possibility that some of the elements of this document may be
the subject of patent rights. CEN [and/or CENELEC] shall not be held responsible for
identifying any or all such patent rights.
This document has been prepared under a mandate given to CEN by the European
Commission and the European Free Trade Association.
This document has been developed to cover specifically space systems and has therefore
precedence over any TR covering the same scope but with a wider domain of applicability
(e.g.: aerospace).
This document is currently submitted to the CEN CONSULTATION.
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1
Scope
This handbook is a part of the System Engineering branch and covers the methods for the
calculation of radiation received and its effects, and a policy for design margins. Both
natural and man-made sources of radiation (e.g. radioisotope thermoelectric generators,
or RTGs) are considered in the handbook.
This handbook can be applied to the evaluation of radiation effects on all space systems.
This handbook can be applied to all product types which exist or operate in space, as well
as to crews of on manned space missions.
This handbook complements to EN 16603-10-12 “Methods for the calculation of
radiation received and its effects and a policy for the design margin”.
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2
Terms, definitions and abbreviated terms
2.1 Terms from other documents
For the purpose of this document, the terms and definitions from ECSS-S-ST-00-01 and
ECSS-E-ST-10-12C apply.
2.2 Terms specific to the present handbook
None.
2.3 Abbreviated terms
The abbrev
...
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