SIST EN 61000-4-20:2011

Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides (IEC 61000-4-20:2010)

This part of IEC 61000 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe
-  TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations;
-  TEM waveguide validation methods for EMC tests;
-  the EUT (i.e. EUT cabinet and cabling) definition;
-  test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and
-  test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. NOTE Test methods are defined in this standard for measuring the effects of electromagnetic radiation on equipment and the electromagnetic emissions from equipment concerned. The simulation and measurement of electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use installations. The test methods defined are structured for a primary objective of establishing adequate repeatability of results at various test facilities for qualitative analysis of effects. This standard does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this standard is to provide a general basic reference for all interested product committees of the IEC. For radiated emissions testing, product committees should select emission limits and test methods in consultation with CISPR standards. For radiated immunity testing, product committees remain responsible for the appropriate choice
of immunity tests and immunity test limits to be applied to equipment within their scope. This standard describes test methods that are separate from those of IEC 61000-4-3.1

Elektromagnetische Verträglichkeit (EMV) - Teil 4-20: Prüf- und Messverfahren - Messung der Störaussendung und Störfestigkeit in transversal-elektromagnetischen (TEM-)Wellenleitern (IEC 61000-4-20:2010)

Compatibilité électromagnétique (CEM) - Partie 4-20: Techniques d'essai et de mesure - Essais d'émission et d'immunité dans les guides d'onde TEM (CEI 61000-4-20:2010)

La CEI 61000-4-20:2010 concerne les méthodes d'essai d'émission et d'immunité pour les matériels électriques et électroniques utilisant différents types de guides d'onde transverses électromagnétiques (TEM). Ces types comprennent des structures ouvertes (par exemple, des lignes ouvertes et des simulateurs d'impulsion électromagnétique), et des structures fermées (par exemple des cellules TEM), qui peuvent être elles-mêmes classées en guides d'onde TEM à un accès, à deux accès, ou à accès multiples. La gamme de fréquences dépend des exigences d'essai spécifiques et du type spécifique de guide d'onde TEM. L'objet de cette norme est de décrire:
- les caractéristiques des guides d'onde TEM, y compris les gammes de fréquences types et les limites de tailles des matériels en essai (EST);
- les méthodes de validation des guides d'onde TEM pour les essais CEM;
- la définition de l'EST (c'est-à-dire l'armoire et le câblage de l'EST);
- les montages d'essai, les procédures et les exigences pour les essais d'émissions rayonnées dans les guides d'onde TEM, et
- les montages d'essai, les procédures et les exigences pour les essais d'immunité rayonnée dans les guides d'onde TEM.
La CEI 61000-4-20:2010 ne vise pas à spécifier les essais devant s'appliquer à des appareils ou systèmes particuliers. Le but principal de cette norme est de donner une référence de base d'ordre général à tous les comités de produits CEI concernés. Pour les essais d'émission rayonnée, il convient que les comités de produits sélectionnent des limites d'émission et des méthodes d'essai en consultation avec le CISPR. Pour les essais d'immunité rayonnée, les comités de produits restent responsables du choix approprié des essais d'immunité et des limites à appliquer aux matériels relevant de leur domaine d'application. Cette norme décrit des méthodes d'essai qui sont indépendantes de celles de la CEI 61000-4-3. Cette deuxième édition annule et remplace la première édition parue en 2003 et son amendement 1 (2006) et constitue une révision technique. Elle a le statut de publication fondamentale en CEM conformément au Guide 107 de la CEI. Les principaux changements par rapport à la première édition de la présente norme et à son amendement sont les suivants:
- amélioration de la cohérence des termes (par exemple essai, mesure, etc.);
- addition d'articles couvrant les considérations d'essai, les évaluations et le rapport d'essai;
- suppression des références aux guides d'onde TEM de grande taille:
- addition d'une nouvelle annexe informative dédiée à l'étalonnage des sondes de champ électrique.

Elektromagnetna združljivost (EMC) - 4-20. del: Preskusne in merilne tehnike - Preskušanje oddajanja in odpornosti v prečnih elektromagnetnih (TEM) valovodih (IEC 61000-4-20:2010)

Ta del IEC 61000 se nanaša na metode preskušanja oddajanja in odpornosti za električno in elektronsko opremo z uporabo različnih tipov prečnih elektromagnetnih (TEM) valovodov. Ti tipi vključujejo odprte strukture (na primer trakaste valovode in simulatorje elektromagnetnih pulzov) ter zaprte strukture (na primer TEM celice). Te strukture se lahko dalje klasificirajo kot eno-, dvo- ali več-kanalni TEM valovodi. Frekvenčni razpon je odvisen od določenih zahtev za preskušanje in določenega TEM tipa valovoda. Namen tega standarda je opisati:
- značilnosti TEM valovoda, vključno z tipičnimi frekvenčnimi razponi in omejitvami velikosti EUT;
- validacijske metode za preskuse EMC;
- definicija EUT (tj. EUT ohišja in okabljenja);
- preskusne postavitve, postopke in zahteve za preskušanje emisij sevanja v TEM valovodih ter
- preskusne postavitve, postopke in zahteve za preskušanje odpornosti proti sevanju v TEM valovodih. OPOMBA: Preskusne metode temu standardu so opredeljene za merjenja učinkov elektromagnetnega sevanja na opremo in elektromagnetnih emisij iz zadevne opreme. Simulacija in merjenje elektromagnetnega sevanja nista zadosti natančna za kvantitativno določevanje učinkov za vse končne uporabe inštalacij. Opredeljene preskusne metode so strukturirane za primarni cilj ugotavljanja zadostne ponovljivosti rezultatov v različnih preskuševalnih laboratorijih za kvalitativno analizo učinkov. Ta standard ni namenjen za določevanje preskusov, namenjenih za uporabo na kateri koli določeni opremi ali sistemih. Glavni namen tega standarda je zagotoviti splošno in osnovno referenco za vse zainteresirane odbore za izdelke IEC. Za preskušanje emisij sevanja morajo odbori za izdelke izbrati meje emisij in preskusne metode ob upoštevanju napotkov CISPR standardov. Odbori ostajajo odgovorni za primerno izbiro preskusov odpornosti in meja preskusov pri preskušanju odpornosti proti sevanju, namenjeni za opremo znotraj njihovega delovnega področja. Ta standard opisuje preskusne metode, ki so ločene od tistih iz 61000-4-3.1.

General Information

• Status: Published
• Publication Date: 15-Nov-2010
• ICS: 33.100.10 - Emission
• ICS: 33.100.20 - Immunity
• Technical Committee: EMC - Electromagnetic compatibility
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 22-Oct-2010
• Due Date: 27-Dec-2010
• Completion Date: 16-Nov-2010
• Directive: 2004/108/EU - DIRECTIVE 2004/108/EC OF THE EUROPEAN PARLIAMENT AND OF THE COUNCIL of 15 December 2004 on the approximation of the laws of the Member States relating to electromagnetic compatibility and repealing Directive 89/336/EEC
• Ref Project: EN 61000-4-20:2010 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Relations

• Replaced By: SIST EN IEC 61000-4-20:2022 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 01-Jul-2022
• Replaces: SIST EN 61000-4-20:2005 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 01-Jan-2011
• Replaces: SIST EN 61000-4-20:2005/A1:2008 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 01-Jan-2011
• Replaces: SIST EN 61000-4-20:2005/A1:2008 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 28-Jan-2023
• Replaces: SIST EN 61000-4-20:2005 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 28-Jan-2023
• Replaces: SIST EN 61000-4-20:2005/A1:2008 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 07-Jun-2022
• Replaces: SIST EN 61000-4-20:2005 - Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• Effective Date: 07-Jun-2022

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61000-4-20:2011
01-januar-2011
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Ta slovenski standard je istoveten z: EN 61000-4-20:2010
ICS:
33.100.10 Emisija Emission
33.100.20 Imunost Immunity
SIST EN 61000-4-20:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61000-4-20:2011

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SIST EN 61000-4-20:2011

EUROPEAN STANDARD
EN 61000-4-20

NORME EUROPÉENNE
November 2010
EUROPÄISCHE NORM

ICS 33.100.10; 33.100.20 Supersedes EN 61000-4-20:2003 + A1:2007


English version


Electromagnetic compatibility (EMC) -
Part 4-20: Testing and measurement techniques -
Emission and immunity testing in transverse electromagnetic (TEM)
waveguides
(IEC 61000-4-20:2010)


Compatibilité électromagnétique (CEM) -  Elektromagnetische
Partie 4-20: Techniques d'essai et de Verträglichkeit (EMV) -
mesure - Teil 4-20: Prüf- und Messverfahren -
Essais d'émission et d'immunité dans les Messung der Störaussendung und
guides d'onde TEM Störfestigkeit in transversal-
(CEI 61000-4-20:2010) elektromagnetischen (TEM-)Wellenleitern
(IEC 61000-4-20:2010)




This European Standard was approved by CENELEC on 2010-10-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,
Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61000-4-20:2010 E

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SIST EN 61000-4-20:2011
EN 61000-4-20:2010 - 2 -
Foreword
The text of document 77B/637/FDIS, future edition 2 of IEC 61000-4-20, prepared by SC 77B, High
frequency phenomena, of IEC TC 77, Electromagnetic compatibility, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 61000-4-20 on 2010-10-01.
This European Standard supersedes EN 61000-4-20:2003 + A1:2007.
The main changes with respect to EN 61000-4-20:2003 + A1:2007 are the following:
– consistency of terms (e.g. test, measurement, etc.) has been improved;
– clauses covering test considerations, evaluations and the test report have been added;
– references to large TEM waveguides have been eliminated;
– a new informative annex has been added to deal with calibration of E-field probes.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2011-07-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2013-10-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61000-4-20:2010 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
CISPR 20 NOTE  Harmonized as EN 55020.
CISPR 25 NOTE  Harmonized as EN 55025.
IEC 60068-1 NOTE  Harmonized as EN 60068-1.
IEC 60118-13 NOTE  Harmonized as EN 60118-13.
IEC 61967-2 NOTE  Harmonized as EN 61967-2.
IEC 62132-2 NOTE  Harmonized as EN 62132-2.
[11] CISPR 14 series NOTE  Harmonized in EN 55014 series (not modified).
[23] IEC 61000-2-9 NOTE  Harmonized as EN 61000-2-9.
[42] IEC 61000-4-3 NOTE  Harmonized as EN 61000-4-3.
[44] CISPR 16-4-2 NOTE  Harmonized as EN 55016-4-2.
__________

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SIST EN 61000-4-20:2011
- 3 - EN 61000-4-20:2010
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

IEC 60050-161 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 161: Electromagnetic compatibility


IEC 61000-2-11 1999 Electromagnetic compatibility (EMC) - - -
Part 2-11: Environment - Classification of
HEMP environments


IEC 61000-4-23 - Electromagnetic compatibility (EMC) - EN 61000-4-23 -
Part 4-23: Testing and measurement
techniques - Test methods for protective
devices for HEMP and other radiated
disturbances


IEC/TR 61000-4-32 - Electromagnetic compatibility (EMC) - - -
Part 4-32: Testing and measurement
techniques - High-altitude electromagnetic
pulse (HEMP) simulator compendium


IEC/TR 61000-5-3 - Electromagnetic compatibility (EMC) - - -
Part 5: Installation and mitigation guidelines -
Section 3: HEMP protection concepts


CISPR 16-1-1 - Specification for radio disturbance and EN 55016-1-1 -
immunity measuring apparatus and methods -
Part 1-1: Radio disturbance and immunity
measuring apparatus - Measuring apparatus


CISPR 16-1-4 - Specification for radio disturbance and EN 55016-1-4 -
immunity measuring apparatus and methods -
Part 1-4: Radio disturbance and immunity
measuring apparatus - Antennas and test
sites for radiated disturbance measurements


1)
CISPR 16-2-3 2006 Specification for radio disturbance and EN 55016-2-3 2006
immunity measuring apparatus and methods -
Part 2-3: Methods of measurement of
disturbances and immunity - Radiated
disturbance measurements


CISPR 22 (mod) - Information technology equipment - Radio EN 55022 -
disturbance characteristics - Limits and
methods of measurement




1)
EN 55016-2-3 is superseded by EN 55016-2-3:2010, which is based on CISPR 16-2-3:2010.

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SIST EN 61000-4-20:2011

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SIST EN 61000-4-20:2011
IEC 61000-4-20
Edition 2.0 2010-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
BASIC EMC PUBLICATION
PUBLICATION FONDAMENTALE EN CEM
Electromagnetic compatibility (EMC) –
Part 4-20: Testing and measurement techniques – Emission and immunity
testing in transverse electromagnetic (TEM) waveguides

Compatibilité électromagnétique (CEM) –
Partie 4-20: Techniques d’essai et de mesure – Essais d’émission et d’immunité
dans les guides d’onde TEM
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
XC
CODE PRIX
ICS 33.100.10; 33.100.20 ISBN 978-2-88912-149-6
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 61000-4-20:2011
– 2 – 61000-4-20 © IEC:2010
CONTENTS
FOREWORD.4
INTRODUCTION.6
1 Scope and object.7
2 Normative references .7
3 Terms, definitions and abbreviations .8
3.1 Terms and definitions .8
3.2 Abbreviations .11
4 General .11
5 TEM waveguide requirements.12
5.1 General .12
5.2 General requirements for the use of TEM waveguides .12
5.2.1 TEM mode verification .12
5.2.2 Test volume and maximum EUT size .12
5.2.3 Validation of usable test volume .13
5.3 Special requirements and recommendations for certain types of TEM
waveguides .15
5.3.1 Set-up of open TEM waveguides .15
5.3.2 Alternative TEM mode verification for a two-port TEM waveguide .16
6 Overview of EUT types .16
6.1 General .16
6.2 Small EUT .16
6.3 Large EUT.16
7 Laboratory test conditions .17
7.1 General .17
7.2 Climatic conditions .17
7.3 Electromagnetic conditions.17
8 Evaluation and reporting of test results.17
Annex A (normative) Emission testing in TEM waveguides.19
Annex B (normative) Immunity testing in TEM waveguides.40
Annex C (normative) HEMP transient testing in TEM waveguides .46
Annex D (informative) TEM waveguide characterization.53
Annex E (informative) Calibration method for E-field probes in TEM waveguides .61
Bibliography.71

Figure A.1 – Routing the exit cable to the corner at the ortho-angle and the lower edge
of the test volume .30
Figure A.2 – Basic ortho-axis positioner or manipulator .31
Figure A.3 – Three orthogonal axis-rotation positions for emission measurements.32
Figure A.4 – Twelve-face (surface) and axis orientations for a typical EUT .33
Figure A.5 – Open-area test site (OATS) geometry .34
Figure A.6 – Two-port TEM cell (symmetric septum) .35
Figure A.7 – One-port TEM cell (asymmetric septum) .36
Figure A.8 – Stripline (two plates) .38
Figure A.9 – Stripline (four plates, balanced feeding).39

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SIST EN 61000-4-20:2011
61000-4-20 © IEC:2010 – 3 –
Figure B.1 – Example of test set-up for single-polarization TEM waveguides .44
Figure B.2 – Uniform area calibration points in TEM waveguide .45
Figure C.1 – Frequency domain spectral magnitude between 100 kHz and 300 MHz .52
Figure D.1 – Simple waveguide (no TEM mode).59
Figure D.2 – Example waveguides for TEM-mode propagation.59
Figure D.3 – Polarization vector.59
Figure D.4 – Transmission line model for TEM propagation .59
Figure D.5 – One- and two-port TEM waveguides .60
Figure E.1 – An example of the measurement points for the validation.62
Figure E.2 – Setup for validation of perturbation .63
Figure E.3 – Setup for measuring net power to a transmitting device .66
Figure E.4 – Example of setup for calibration of E-field probe .67
Figure E.5 – Setup for calibration of E-field probe by another method.69
Figure E.6 – Equivalent circuit of antenna and measurement apparatus.70

Table 1 – Values K for expanded uncertainty with normal distribution .15
Table B.1 – Uniform area calibration points.42
Table B.2 – Test levels .42
Table C.1 – Radiated immunity test levels defined in the present standard .52
Table E.1 – Calibration frequencies .63
Table E.2 – Calibration field strength level.64

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SIST EN 61000-4-20:2011
– 4 – 61000-4-20 © IEC:2010
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-20: Testing and measurement techniques –
Emission and immunity testing in
transverse electromagnetic (TEM) waveguides


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61000-4-20 has been prepared by 77B: High-frequency
phenomena, of IEC technical committee 77: Electromagnetic compatibility, in cooperation with
CISPR (International Special Committee on Radio Interference) subcommittee A: Radio
interference measurements and statistical methods.
This second edition cancels and replaces the first edition published in 2003 and its
amendment 1 (2006), and constitutes a technical revision.
It forms Part 4-20 of IEC 61000. It has the status of a basic EMC publication in accordance
with IEC Guide 107.
The main changes with respect to the first edition of this standard and its amendment are the
following:
• consistency of terms (e.g. test, measurement, etc.) has been improved;

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SIST EN 61000-4-20:2011
61000-4-20 © IEC:2010 – 5 –
• clauses covering test considerations, evaluations and the test report have been added;
• references to large TEM waveguides have been eliminated;
• a new informative annex has been added to deal with calibration of E-field probes.
The text of this standard is based on the following documents:
FDIS Report on voting
77B/637/FDIS 77B/641/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of the IEC 61000 series, published under the general title Electromagnetic
compatibility (EMC), can be found on the IEC website.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until the stability result date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date,
the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

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SIST EN 61000-4-20:2011
– 6 – 61000-4-20 © IEC:2010
INTRODUCTION
IEC 61000 is published in separate parts according to the following structure:
Part 1: General
General considerations (introduction, fundamental principles)
Definitions, terminology
Part 2: Environment
Description of the environment
Classification of the environment
Compatibility levels
Part 3: Limits
Emission limits
Immunity limits (in so far as they do not fall under the responsibility of the product
committees)
Part 4: Testing and measurement techniques
Measurement techniques
Testing techniques
Part 5: Installation and mitigation guidelines
Installation guidelines
Mitigation methods and devices
Part 6: Generic Standards
Part 9: Miscellaneous
Each part is further subdivided into several parts, published either as International Standards,
Technical Specifications or Technical Reports, some of which have already been published as
sections. Others are and will be published with the part number followed by a dash and a
second number identifying the subdivision (example: IEC 61000-6-1).
This part of IEC 61000 is an International Standard which gives emission, immunity and
HEMP transient testing requirements.

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SIST EN 61000-4-20:2011
61000-4-20 © IEC:2010 – 7 –
ELECTROMAGNETIC COMPATIBILITY (EMC) –

Part 4-20: Testing and measurement techniques –
Emission and immunity testing in
transverse electromagnetic (TEM) waveguides



1 Scope and object
This part of IEC 61000 relates to emission and immunity test methods for electrical and
electronic equipment using various types of transverse electromagnetic (TEM) waveguides.
These types include open structures (for example, striplines and electromagnetic pulse
simulators) and closed structures (for example, TEM cells). These structures can be further
classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the
specific testing requirements and the specific TEM waveguide type.
The object of this standard is to describe
• TEM waveguide characteristics, including typical frequency ranges and EUT-size
limitations;
• TEM waveguide validation methods for EMC tests;
• the EUT (i.e. EUT cabinet and cabling) definition;
• test set-ups, procedures, and requirements for radiated emission testing in TEM
waveguides and
• test set-ups, procedures, and requirements for radiated immunity testing in TEM
waveguides.
NOTE Test methods are defined in this standard for measuring the effects of electromagnetic radiation on
equipment and the electromagnetic emissions from equipment concerned. The simulation and measurement of
electromagnetic radiation is not adequately exact for quantitative determination of effects for all end-use
installations. The test methods defined are structured for a primary objective of establishing adequate repeatability
of results at various test facilities for qualitative analysis of effects.
This standard does not intend to specify the tests to be applied to any particular apparatus or
system(s). The main intention of this standard is to provide a general basic reference for all
interested product committees of the IEC. For radiated emissions testing, product committees
should select emission limits and test methods in consultation with CISPR standards. For
radiated immunity testing, product committees remain responsible for the appropriate choice
of immunity tests and immunity test limits to be applied to equipment within their scope. This
1
standard describes test methods that are separate from those of IEC 61000-4-3.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050(161), International Electrotechnical Vocabulary – Chapter 161: Electromagnetic
compatibility
IEC 61000-2-11:1999, Electromagnetic compatibility (EMC) – Part 2-11: Environment –
Classification of HEMP environments
___________
1
 These other distinct test methods may be used when so specified by product committees, in consultation with
CISPR and TC 77.

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SIST EN 61000-4-20:2011
– 8 – 61000-4-20 © IEC:2010
IEC 61000-4-23, Electromagnetic compatibility (EMC) – Part 4-23: Testing and measurement
techniques – Test methods for protective devices for HEMP and other radiated disturbances
IEC/TR 61000-4-32, Electromagnetic compatibility (EMC) – Part 4-32: Testing and measure-
ment techniques – High-altitude electromagnetic pulse (HEMP) simulator compendium
IEC/TR 61000-5-3, Electromagnetic compatibility (EMC) – Part 5-3: Installation and mitigation
guidelines – HEMP protection concepts
CISPR 16-1-1, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring
apparatus
CISPR 16-1-4, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 1-4: Radio disturbance and immunity measuring apparatus – Antennas and
test sites for radiated disturbance measurements
CISPR 16-2-3:2006, Specification for radio disturbance and immunity measuring apparatus
and methods – Part 2-3: Methods of measurement of disturbances and immunity – Radiated
disturbance measurements
CISPR 22, Information technology equipment – Radio disturbance characteristics – Limits and
methods of measurement
3 Terms, definitions and abbreviations
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60050(161), as well
as the following, apply.
3.1.1
transverse electromagnetic mode
TEM mode
waveguide mode in which the components of the electric and magnetic fields in the
propagation direction are much less than the primary field components across any transverse
cross-section
3.1.2
TEM waveguide
open or closed transmission line system, in which a wave is propagated in the transverse
electromagnetic mode to produce a specific field for testing purposes
3.1.3
TEM cell
closed TEM waveguide, often a rectangular coaxial transmission line, in which a wave is
propagated in the transverse electromagnetic mode to produce a specific field for testing
purposes and with an outer conductor completely enclosing an inner conductor
3.1.4
two-port TEM waveguide
TEM waveguide with input/output ports at both ends
3.1.5
one-port TEM waveguide
TEM waveguide with a single input/output port

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SIST EN 61000-4-20:2011
61000-4-20 © IEC:2010 – 9 –
NOTE Such TEM waveguides typically feature a broadband transmission-line termination at the non-port end.
3.1.6
stripline
terminated transmission line consisting of two or more parallel plates between which a wave
is propagated in the transverse electromagnetic mode to produce a specific field for testing
purposes
NOTE Striplines usually have open sides for EUT access and monitoring.
3.1.7
inner conductor or septum
inner conductor of a coaxial transmission-line system, often flat in the case of a rectangular
cross-section, and which may be positioned symmetrically or asymmetrically with respect to
the outer conductor
3.1.8
outer conductor or chassis
outer conductor of a coaxial transmission line system, often having a rectangular cross-
section
3.1.9
characteristic impedance
for any constant phase wave-front, the magnitude of the ratio of the voltage between the inner
conductor and the outer conductor to the current on either conductor
...