Instruments and software used for measurement in high-voltage impulse tests -- Part 1: Requirements for instruments

Applies to digital recorders and digital oscilloscopes used for measurements during tests with high impulse voltages and high impulse currents. Specifies the measuring characteristics and calibrations required to meet the measuring accuracies and procedures given in EN 60-1.

Messgeräte und Software bei Stoßspannungs- und Stoßstromprüfungen -- Teil 1: Anforderungen an Messgeräte

Appareils et logiciels utilisés pour les mesures pendant les essais de choc à haute tension -- Partie 1: Prescriptions pour les appareils

Applies to digital recorders and digital oscilloscopes used for measurements during tests with high impulse voltages and high impulse currents. Specifies the measuring characteristics and calibrations required to meet the measuring accuracies and procedures given in EN 60-1.

Instruments and software used for measurement in high-voltage impulse tests - Part 1: Requirements for instruments (IEC 61083-1:2001)

General Information

Status
Published
Publication Date
30-Sep-2002
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Oct-2002
Due Date
01-Oct-2002
Completion Date
01-Oct-2002

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SLOVENSKI SIST EN 61083-1:2002
 izdaja
STANDARD
oktober 2002
Instruments and software used for measurement in high-voltage impulse tests - Part
1: Requirements for instruments (IEC 61083-1:2001)
ICS 17.220.20 Referenčna številka
SIST EN 61083-1:2002(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 61083-1
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2001
ICS 17.220.20; 19.080 Supersedes EN 61083-1:1993 and HD 479 S1:1986
English version
Instruments and software used for measurement
in high-voltage impulse tests
Part 1: Requirements for instruments
(IEC 61083-1:2001)
Appareils et logiciels utilisés pour les Messgeräte und Software bei
mesures pendant les essais de choc Stoßspannungs- und Stoßstromprüfungen
à haute tension Teil 1: Anforderungen an Messgeräte
Partie 1: Prescriptions pour les appareils (IEC 61083-1:2001)
(CEI 61083-1:2001)
This European Standard was approved by CENELEC on 2001-03-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway,
Portugal, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2001 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61083-1:2001 E

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EN 61083-1:2001 - 2 -
Foreword
The text of document 42/164/FDIS, future edition 2 of IEC 61083-1, prepared by IEC TC 42, High-
voltage testing techniques, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 61083-1 on 2001-03-01.
This European Standard supersedes EN 61083-1:1993 and HD 479 S1:1986.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2002-03-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2004-03-01
Annexes designated "normative" are part of the body of the standard.
Annexes designated "informative" are given for information only.
In this standard, annexes A, B, C and ZA are normative and annex D is informative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61083-1:2001 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 61083-1:2001
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60060-1 1989 High-voltage test techniques HD 588.1 S1 1991
+ corr. Mar. 1990 Part 1: General definitions and test
requirements
IEC 60060-2 1994 Part 2: Measuring systems EN 60060-2 1994
A1 1996 - -
- - A11 1998
IEC 61000-4-4 1995 Electromagnetic compatibility (EMC) EN 61000-4-4 1995
Part 4-4: Testing and measurement
techniques - Electrical fast
transient/burst immunity test

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NORME
CEI
INTERNATIONALE IEC
61083-1
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
2001-06
Appareils et logiciels utilisés pour les mesures
pendant les essais de choc à haute tension –
Partie 1:
Prescriptions pour les appareils
Instruments and software used for measurement
in high-voltage impulse tests –
Part 1:
Requirements for instruments
© IEC 2001 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun procédé, any form or by any means, electronic or mechanical,
électronique ou mécanique, y compris la photocopie et les including photocopying and microfilm, without permission in
microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
V
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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61083-1 © IEC:2001 – 3 –
CONTENTS
FOREWORD . 7
1 General . 11
1.1 Scope . 11
1.2 Normative references. 11
1.3 Terms and definitions . 13
1.3.1 General definitions. 13
1.3.2 Definitions specific for digital recorders and analogue oscilloscopes . 15
1.3.3 Definitions specific for digital recorders. 15
1.4 Operating conditions. 19
1.5 Calibration and test methods . 19
1.5.1 Impulse calibration. 19
1.5.2 Step calibration. 21
1.5.3 Constancy of scale factor within time interval. 23
1.5.4 Time base. 23
1.5.5 Rise time . 23
1.5.6 Voltage deflection characteristic of analogue oscilloscopes. 23
1.5.7 Determination of static differential and integral non-linearities. 25
1.5.8 Differential non-linearity under dynamic conditions. 25
1.5.9 Internal noise level. 25
1.5.10 Interference . 25
1.6 Input impedance . 27
2 Digital recorders for impulse tests . 27
2.1 Requirements for impulse measurements . 27
2.1.1 Requirements for digital recorders used in approved measuring
systems . 27
2.1.2 Individual requirements . 27
2.1.3 Requirements for digital recorders used in reference measuring
systems . 31
2.1.4 Tests. 31
2.1.5 Record of performance. 35
3 Analogue oscilloscopes for impulse tests. 37
3.1 Requirements for impulse measurements . 37
3.1.1 Requirements for analogue oscilloscopes used in approved
measuring systems . 37
3.1.2 Individual requirements . 37
3.1.3 Tests. 39
3.1.4 Record of performance. 41
4 Peak voltmeters for impulse tests . 43
4.1 Requirements for impulse measurements . 43
4.1.1 General requirements for peak voltmeters. 43
4.1.2 Individual requirements . 43
4.1.3 Tests. 45
4.1.4 Record of performance. 47

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61083-1 © IEC:2001 – 5 –
Annex A (normative) Procedure for determination of non-linearities of a digital
recorder . 55
Annex B (normative) Electromagnetic interference in high-voltage laboratories . 61
Annex C (normative) Calibration method for analogue oscilloscopes – Separate
calibration of voltage and time. 67
Annex D (informative) Analysis of impulse waveform. 69
Figure 1 – Integral non-linearity s(k) at code k. 49
Figure 2 – Differential non-linearity d(k) and code bin width w(k) under d.c. conditions. 49
Figure 3 – Calibration by comparison . 51
Figure 4 – Separate calibration of voltage and time. 51
Figure 5 – Step calibration . 53
Figure A.1 – Determination of non-linearities. 59
Figure B.1 – Current injection into the shield of the cable. 65
Figure B.2 – Application of electric and magnetic fields . 65
Table 1 – Operating conditions. 19
Table 2 – Requirements for reference impulse generators. 21
Table 3 – Tests required for digital recorders . 33
Table 4 – Tests required for analogue oscilloscopes . 39
Table 5 – Tests required for peak voltmeters. 45

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61083-1 © IEC:2001 – 7 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
––––––––––––––
INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT
IN HIGH-VOLTAGE IMPULSE TESTS –
Part 1: Requirements for instruments
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International
Organization for Standardization (ISO) in accordance with conditions determined by agreement between the
two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical specifications, technical reports or guides and they are accepted by the National
Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61083-1 has been prepared by IEC technical committee 42: High-
voltage testing techniques.
This second edition cancels and replaces the first edition published in 1991 of which it
constitutes a technical revision. This edition also replaces the first edition of IEC 60790
published in 1984.
Future standards in this series will carry the new general title as cited above. Titles of existing
standards in this series will be updated at the time of the next edition.
The text of this standard is based on the following documents:
FDIS Report on voting
42/164/FDIS 42/166/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.

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61083-1 © IEC:2001 – 9 –
This publication has been drafted in accordance with the ISO/IEC Directives, Part 3.
Words in bold are defined in 1.3.
Annexes A, B and C form an integral part of this standard.
Annex D is for information only.
The committee has decided that the contents of this publication will remain unchanged until
2008. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.

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61083-1 © IEC:2001 – 11 –
INSTRUMENTS AND SOFTWARE USED FOR MEASUREMENT
IN HIGH-VOLTAGE IMPULSE TESTS –
Part 1: Requirements for instruments
1 General
1.1 Scope
This part of IEC 61083 is applicable to digital recorders, including digital oscilloscopes,
analogue oscilloscopes and peak voltmeters used for measurements during tests with high
impulse voltages and high impulse currents. It specifies the measuring characteristics and
calibrations required to meet the measuring uncertainties and procedures specified in
IEC 60060-2.
This part
• defines the terms specifically related to digital recorders, analogue oscilloscopes and
peak voltmeters,
• specifies the necessary requirements for such instruments to ensure their compliance with
the requirements for high-voltage and for high-current impulse tests, and
• establishes the tests and procedures necessary to demonstrate their compliance.
Only digital recorders that permit access to raw data from permanent or temporary storage
are covered by this standard. The raw data, with relevant scaling information, may be
• printed graphically, or
• stored in digital format.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61083. For dated references, subsequent
amendments to, or revisions of, any of these publications do not apply. However, parties to
agreements based on this part of IEC 61083 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. For undated
references, the latest edition of the normative document referred to applies. Members of IEC
and ISO maintain registers of currently valid International Standards.
IEC 60060-1:1989, High-voltage test techniques – Part 1: General definitions and test
requirements
IEC 60060-2:1994, High-voltage test techniques – Part 2: Measuring systems
Amendment 1 (1996)
IEC 61000-4-4:1995, Electromagnetic compatibility (EMC) – Part 4: Testing and measurement
techniques – Section 4: Electrical fast transient/burst immunity test. Basic EMC Publication

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61083-1 © IEC:2001 – 13 –
1.3 Terms and definitions
For the purposes of this part of IEC 61083, the following terms and definitions apply.
1.3.1 General definitions
1.3.1.1
digital recorder
instrument, including a digital oscilloscope, which can make a temporary digital record of a
high-voltage or high-current impulse, that can be converted into a permanent record. The
digital record can be displayed in the form of an analogue graph
NOTE The waveform may be displayed on a screen, plotted or printed. This process may change the appearance
of the waveform due to the processing involved.
1.3.1.2
analogue oscilloscope
instrument, which can make a temporary analogue record of a scaled high-voltage or high-
current impulse, that can be converted into a permanent record. The permanent record can be
displayed in the form of a graph or photograph of the screen of the oscilloscope
1.3.1.3
peak voltmeter
instrument, which can measure the peak value of a scaled high-voltage or high-current
impulse without short-duration overshoot or high-frequency oscillation (see clause 4)
1.3.1.4
warm-up time
time interval from when the instrument is first switched on to when the instrument meets
operational requirements
1.3.1.5
operating range
range of input voltage for which the instrument can be used within the uncertainty limits given
in this standard
1.3.1.6
output of an instrument
1.3.1.6.1
output of a digital recorder
numerical value recorded by a digital recorder at a specific instant
1.3.1.6.2
output of an analogue oscilloscope
deflection of the trace of an analogue oscilloscope at a specific instant
1.3.1.6.3
output of a peak voltmeter
display of a peak voltmeter
1.3.1.7
offset
output of an instrument for zero input

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61083-1 © IEC:2001 – 15 –
1.3.1.8
full-scale deflection
minimum input voltage, which produces the nominal maximum output of the instrument in the
specified range
1.3.1.9
non-linearity of amplitude
deviation of the actual output of an instrument from the nominal value, which is determined
by dividing the input voltage by the scale factor
NOTE The static non-linearity for a d.c. input voltage may be different from the non-linearity under dynamic
condition.
1.3.1.10
scale factor
factor by which the output corrected for offset is multiplied in order to determine the
measured value of the input quantity. The scale factor includes the ratio of any built-in or
external attenuator and is determined by calibration
1.3.1.10.1
static scale factor
scale factor for a direct voltage input
1.3.1.10.2
impulse scale factor
scale factor for an input representing the shape of the relevant impulse
1.3.2 Definitions specific for digital recorders and analogue oscilloscopes
1.3.2.1
rise time
time interval within which the response to an applied step passes from 10 % to 90 % of its
steady-state amplitude
1.3.2.2
time-scale factor
factor by which the interval measured from the record is multiplied in order to determine the
value of that time interval
1.3.2.3
non-linearity of time base
variation of the time-scale factors measured in different parts of the trace or digital record
from their mean value
1.3.3 Definitions specific for digital recorders
1.3.3.1
rated resolution r
rated resolution is expressed by the reciprocal of two to the power of the rated number of
–N
bits N of the A/D converter, namely r = 2
1.3.3.2
sampling rate
number of samples taken per unit of time
NOTE The sampling time interval is the reciprocal of the sampling rate.

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61083-1 © IEC:2001 – 17 –
1.3.3.3
record length
duration of the record expressed either in a time unit or as the total number of samples
1.3.3.4
raw data
original record of sampled and quantized information obtained when a digital recorder
converts an analogue signal into a digital form
The correction of the output for offset to give a zero-based record is permitted, as is
multiplying the record by a constant scale factor. Records processed in this way are still
considered as raw data
NOTE 1 This information may be made available in binary, octal, hexadecimal or decimal form.
NOTE 2 The scaling information relevant to the digital record should also be stored.
1.3.3.5
processed data
data obtained by any processing (other than correction for offset and/or multiplying by a
constant scale factor) of the raw data
NOTE Digital recorders, which do not allow access to the raw data, are not covered by this standard.
1.3.3.6
base line
value of the output of the recorder during the initial flat part of the record of the impulse. It is
the mean of at least 20 samples in the initial flat part of the record
1.3.3.7
quantization characteristic
characteristic showing the relationship between the output of the digital recorder and the
direct voltage on the input which produces this output (see figure 1)
NOTE The average slope of the quantization characteristic is equal to the reciprocal of the static scale factor.
1.3.3.8
code k
integer used to identify a digital level
1.3.3.9
code bin width w(k)
range of input voltage allocated to code k (see figure 2)
1.3.3.10
average code bin width w
0
product of the full-scale deflection and the rated resolution (see figure 2)
NOTE The average code bin width is approximately equal to the static scale factor.
1.3.3.11
integral non-linearity s(k)
difference between corresponding points on the measured quantization characteristic and
on the ideal quantization characteristic that is based on the static scale factor (see figure 1)

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61083-1 © IEC:2001 – 19 –
1.3.3.12
differential non-linearity d(k)
difference between a measured code bin width and the average code bin width divided by
the average code bin width (see figure 2):
w()k − w
0
d()k =
w
0
1.4 Operating conditions
The range of operating conditions given in table 1 are those under which the instrument shall
operate and meet the accuracy requirements specified for the instrument.
Table 1 – Operating conditions
Condition Range
Environment
Ambient temperature 5 °C to 40 °C
Ambient relative humidity (non-condensing) 10 % to 90 %
Mains supply
Supply voltage Rated voltage ±10 % (r.m.s.)
Rated voltage ±12 % (a.c. peak)
Supply frequency Rated frequency ±5 %
Any exceptions to the values given in table 1 shall be explicitly and clearly stated in the
record of performance with an indication that they are exceptions.
1.5 Calibration and test methods
1.5.1 Impulse calibration
Impulse calibration is the reference method to establish the impulse scale factor of approved
digital recorders, analogue oscilloscopes and peak voltmeters. It is also the reference
method to check the time parameter determination from the records of digital recorders and
analogue oscilloscopes. Requirements on reference calibration impulses for calibrating
instruments used in approved measuring systems are given in table 2. The waveshapes are
chosen from table 2 according to the type and polarity of the high voltage or current impulses
to be measured. The peak value and time parameters of the applied calibration impulses shall
be within the limits given in table 2, and the actual values shall be entered in the record of
performance.
The polarity of the calibration impulses shall be that of the impulse to be measured. The
output corresponding to the calibration impulse shall be evaluated for at least 10 impulses.
The maximum deviation of the output peak values from their mean value shall be less than
1 % of the mean value. The impulse scale factor is the quotient of the input peak value and
the mean peak value of the outputs.
The time parameters of at least 10 impulses shall be evaluated. The maximum deviation of
each time parameter shall be less than 2 % of the mean value.

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61083-1 © IEC:2001 – 21 –
This impulse calibration shall be made on each range of use for tests. Care should be taken
to avoid overloading the devices with low input impedance.
NOTE A digital recorder can be calibrated for an exponential current impulse using the full lightning impulse of a
reference impulse generator, and switching impulse for 10/350 impulse current (the 10/350 µs impulse current is
under consideration for inclusion in the future revision of the IEC 60060 series).
Table 2 – Requirements for reference impulse generators
1)
Impulse type Parameter being Value Uncertainty Short-term
2)
measured stability
%
%
Full and standard Time-to-half value 55 µs to 65 µs ≤ 2 ≤ 0,2
chopped lightning
impulse
Front time 0,8 µs to 0,9 µs
≤ 2 ≤ 0,5
Peak voltage Within operating range
≤ 0,7 ≤ 0,2
Front chopped Time-to-chopping 0,45 µs to 0,55 µs ≤ 2 ≤ 1
lightning impulse
Peak voltage Within operating range
≤ 1 ≤ 0,2
Switching impulse Time-to-peak 15 µs to 300 µs ≤ 2 ≤ 0,2
Time-to-half value 2 600 µs to 4 200 µs
≤ 2 ≤ 0,2
Peak voltage Within operating range
≤ 0,7 ≤ 0,2
Rectangular impulse Duration 0,5 ms to 3,5 ms ≤ 2 ≤ 0,5
Within operating range
Peak value ≤ 2 ≤ 1
1)
The uncertainty is determined in accordance with annex H of IEC 60060-2 by a traceable calibration where
the mean of a sequence of at least 10 impulses is evaluated.
2)
The short-term stability is the standard deviation of a sequence of at least 10 impulses.
1.5.2 Step calibration
A direct voltage V , which is known to within 0,1 % and within the operating range of the
CAL
instrument, is applied to the input and then short-circuited to ground by an appropriate
switching device, preferably based on a mercury-wetted relay. The resultant transition to zero
level is recorded as the output O(t) (an example is shown in figure 5) and evaluated within the
time interval specified in 1.5.3. Several records of the response may be averaged to reduce
the random noise. The deviation of the sample values O(t) from their mean O shall be within
s
the limits specified for the scale factor when t ranges within the time interval given in 1.5.3.
At least 10 records of steps shall be evaluated in this manner. The deviation of each of the 10
O values from their overall mean, O , shall also be within the limits specified for the scale
s sm
factor. The impulse scale factor is the quotient of the input voltage V and O . The rise
CAL sm
time of the step shall be less than 10 % of the lower limit of the time interval specified
in 1.5.3.
This voltage calibration shall be made in each range of use for tests. Care should be taken to
avoid overloading of recorders with low input impedance.
This test shall be done using both polarities. If the scale factors determined agree to within
±1 %, then this method is valid. If not, impulse calibration according to 1.5.1 of appropriate
polarity shall be used.

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61083-1 © IEC:2001 – 23 –
1.5.3 Constancy of scale factor within time interval
A direct voltage within the operating range of the digital recorder or analogue
oscilloscope is applied to the input and the
...

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