SIST EN 60512-25-6:2005

Connectors for electronic equipment - Tests and measurements -- Part 25-6: Test 25f: Eye pattern and jitter

Describes methods for measuring an eye pattern response and jitter in the time domain.

Steckverbinder für elektronische Einrichtungen - Mess- und Prüfverfahren -- Teil 25-6: Prüfung 25f - Augendiagramm und Jitter

Connecteurs pour équipements électroniques - Essais et mesures -- Partie 25-6: Essai 25f: Diagramme de l'oeil et gigue

Décrit les méthodes pour mesurer la réponse en diagramme de l'oeil et la gigue dans le domaine temporel.

Konektorji za elektronsko opremo – Preskusi in meritve – 25-6. del: Preskus 25f: očesni diagram in trepetanje (IEC 60512-25-6:2004)

General Information

• Status: Published
• Publication Date: 28-Feb-2005
• ICS: 31.220.10 - Plug-and-socket devices. Connectors
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Mar-2005
• Due Date: 01-Mar-2005
• Completion Date: 01-Mar-2005
• Ref Project: EN 60512-25-6:2004 - Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Standards Content (Sample)

SLOVENSKI SIST EN 60512-25-6:2005

STANDARD
marec 2005
Konektorji za elektronsko opremo – Preskusi in meritve – 25-6. del: Preskus
25f: očesni diagram in trepetanje (IEC 60512-25-6:2004)
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test
25f: Eye pattern and jitter (IEC 60512-25-6:2004)
ICS 31.220.10 Referenčna številka
SIST EN 60512-25-6:2005(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60512-25-6
NORME EUROPÉENNE
EUROPÄISCHE NORM July 2004

ICS 31.220.10


English version


Connectors for electronic equipment -
Tests and measurements
Part 25-6:
Test 25f: Eye pattern and jitter
(IEC 60512-25-6:2004)


Connecteurs pour équipements Steckverbinder für elektronische
électroniques - Einrichtungen -
Essais et mesures Mess- und Prüfverfahren
Partie 25-6: Teil 25-6:
Essai 25f: Diagramme de l'oeil et gigue Prüfung 25f - Augendiagramm und Jitter
(CEI 60512-25-6:2004) (IEC 60512-25-6:2004)





This European Standard was approved by CENELEC on 2004-07-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech
Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden,
Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60512-25-6:2004 E

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EN 60512-25-6:2004 - 2 -
Foreword
The text of document 48B/1429/FDIS, future edition 1 of IEC 60512-25-6, prepared by SC 48B,
Connectors, of IEC TC 48, Electromechanical components and mechanical structures for electronic
equipment, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as
EN 60512-25-6 on 2004-07-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2005-04-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2007-07-01
__________
Endorsement notice
The text of the International Standard IEC 60512-25-6:2004 was approved by CENELEC as a
European Standard without any modification.
__________

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NORME CEI
INTERNATIONALE
IEC



60512-25-6
INTERNATIONAL


Première édition
STANDARD

First edition

2004-05


Connecteurs pour équipements électroniques –
Essais et mesures –
Partie 25-6:
Essai 25f: Diagramme de l'oeil et gigue

Connectors for electronic equipment –
Tests and measurements –
Part 25-6:
Test 25f: Eye pattern and jitter
 IEC 2004 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail] Web: www.iec.ch
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МеждународнаяЭлектротехническаяКомиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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60512-25-6  IEC:2004 – 3 –
CONTENTS
FOREWORD.5

1 Introduction.9
1.1 Scope.9
1.2 Terms and definitions .9
2 Test resources.9
2.1 Equipment.9
2.2 Fixture.11
3 Test specimen.11
3.1 Description.11
4 Test procedure.11
4.1 General.11
4.2 Eye pattern.13
4.3 Jitter.15
5 Details to be specified.17
6 Test documentation.17

Annex A (normative) Schematics of sample termination.19

Annex B (informative) Eye pattern interpretation – Practical guidance .23

Figure A.1 – Single-ended terminations .19
Figure A.2 – Differential (balanced) terminations .21
Figure B.1 – Typical eye pattern response .23
Figure B.2 – Eye pattern response showing eye height and eye width .25
Figure B.3 – Eye pattern response with mask (no hits).27
Figure B.4 – Eye pattern response showing hits inside mask .29
Figure B.5 – DSO automatic method, showing vertical limits approximately 20 mV apart,
referenced in 4.3.1.3.2 .31
Figure B.6 – DSO Manual method, showing two vertical cursors one on each side of the
eye, referenced in 4.3.1.4.1.33
Figure B.7 – Method D, pulse test single pattern, showing the pulse width, referenced in
4.3.2.4 .35

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60512-25-6  IEC:2004 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________

CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –

Part 25-6: Test 25f: Eye pattern and jitter


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
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agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
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members of its technical committees and IEC National Committees for any personal injury, property damage or
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60512-25-6 has been prepared by subcommittee 48B: Connectors,
of IEC technical committee 48: Electromechanical components and mechanical structures for
electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
48B/1429/FDIS 48B/1444/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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60512-25-6  IEC:2004 – 7 –
The committee has decided that the contents of this publication will remain unchanged until
2008. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended

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60512-25-6  IEC:2004 – 9 –
CONNECTORS FOR ELECTRONIC EQUIPMENT –
TESTS AND MEASUREMENTS –

Part 25-6: Test 25f: Eye pattern and jitter



1 Introduction
1.1 Scope and object
This part of IEC 60512 is applicable to electrical connectors, cable assemblies, or
interconnection systems within the scope of IEC TC 48.
This standard describes methods for measuring an eye pattern response and jitter in the time
domain.
1.2 Terms and definitions
For the purpose of this part of IEC 60512, the following terms and definitions apply.
1.2.1
eye pattern
oscilloscope display of synchronized pseudo-random digital data (signal amplitude versus
time), showing the superposition of accumulated output waveforms
1.2.2
jitter
difference between the earliest and latest times at which a signal crosses a specified reference
voltage level
1.2.3
bit period
time interval between the successive like edges (rise to rise or fall to fall) of the clock signal.
This is the reciprocal of the clock frequency
1.2.4
skew
difference in propagation delay between two signal paths
1.2.5
measurement system rise time
rise time measured with fixture in place, without the specimen, and with filtering (or
normalization). The rise time is typically measured from 10 % to 90 % levels
2 Test resources
2.1 Equipment
2.1.1 High speed pattern generator with clock output capable of producing a signal with
specified rise and fall times and data pattern.

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60512-25-6  IEC:2004 – 11 –
2.1.2 Signal analyzer with external clock input capable of infinite persistence display. This is
typically a digital sampling oscilloscope (DSO) with sampling head. It is preferred that the DSO
have a masking capability.
NOTE Make sure not to exceed the maximum allowable input ratings of the oscilloscope input ports. This will
prevent costly damage and provide reliable measurements. Even signal excursions that are within the maximum
allowable signal levels of the oscilloscope can result in unstable eye pattern responses.
2.2 Fixture
2.2.1 The test fixtures shall provide for proper signal(s) and ground pattern(s) and, if required,
proper termination of adjacent signal lines.
2.2.2 When measuring a differential response, make sure that the test fixtures and test
cables are delay matched to minimize the skew. It i
...