Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2

Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 22: Rahmenspezifikation - Oberflächenmontierbare Vielschichtkeramik-Festkondensatoren, Klasse 2

Condensateurs fixes utilisés dans les équipements électroniques - Partie 22: Spécification intermédiaire - Condensateurs multicouches fixes à diélectriques en céramique pour montage en surface, de classe 2

Fiksni kondenzatorji za uporabo v elektronski opremi - 22. del: Področna specifikacija - Fiksni večplastni kondenzatorji za površinsko namestitev s keramičnim dielektrikom, razred 2

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Public Enquiry End Date
14-Sep-2023
Technical Committee
Current Stage
4020 - Public enquire (PE) (Adopted Project)
Start Date
03-Jul-2023
Due Date
20-Nov-2023

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SLOVENSKI STANDARD
oSIST prEN IEC 60384-22:2023
01-september-2023
Fiksni kondenzatorji za uporabo v elektronski opremi - 22. del: Področna
specifikacija - Fiksni večplastni kondenzatorji za površinsko namestitev s
keramičnim dielektrikom, razred 2
Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed
surface mount multilayer capacitors of ceramic dielectric, Class 2
Festkondensatoren zur Verwendung in Geräten der Elektronik - Teil 22:
Rahmenspezifikation - Oberflächenmontierbare Vielschichtkeramik-Festkondensatoren,
Klasse 2
Condensateurs fixes utilisés dans les équipements électroniques - Partie 22:
Spécification intermédiaire - Condensateurs multicouches fixes à diélectriques en
céramique pour montage en surface, de classe 2
Ta slovenski standard je istoveten z: prEN IEC 60384-22:2023
ICS:
31.060.10 Fiksni kondenzatorji Fixed capacitors
oSIST prEN IEC 60384-22:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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40/3056/CDV

COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60384-22 ED4
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-06-23 2023-09-15
SUPERSEDES DOCUMENTS:
40/2987/CD, 40/3044/CC

IEC TC 40 : CAPACITORS AND RESISTORS FOR ELECTRONIC EQUIPMENT
SECRETARIAT: SECRETARY:
Netherlands Mr Ronald Drenthen
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:


Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In Some Countries”
clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the final stage for
submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).

TITLE:
Fixed capacitors for use in electronic equipment - Part 22: Sectional specification - Fixed surface
mount multilayer capacitors of ceramic dielectric, Class 2

PROPOSED STABILITY DATE: 2032

NOTE FROM TC/SC OFFICERS:

Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.

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1
2 CONTENTS
3
4 FOREWORD . 7
5 1 Scope . 9
6 2 Normative references . 9
7 3 Terms and definitions . 9
8 4 Preferred ratings and characteristics . 10
9 4.1 Preferred characteristics . 10
10 4.2 Preferred values of ratings . 11
11 4.2.1 Rated temperature (T ) . 11
R
12 4.2.2 Rated voltage (U ) . 11
R
13 4.2.3 Category voltage (U ) . 11
C
14 4.2.4 Preferred values of nominal capacitance and associated tolerance values . 11
15 4.2.5 Temperature characteristic of capacitance . 12
16 4.2.6 Dimensions . 12
17 5 Test and measurement procedures . 12
18 5.1 General . 12
19 5.2 Special preconditioning . 13
20 5.3 Measuring conditions . 13
21 5.4 Mounting . 13
22 5.5 Visual examination and check of dimensions . 13
23 5.5.1 General . 13
24 5.5.2 Visual examination . 13
25 5.5.3 Requirements . 13
26 5.6 Electrical tests. 15
27 5.6.1 Capacitance . 15
28 5.6.2 Tangent of loss angle (tan δ) . 15
29 5.6.3 Insulation resistance . 16
30 5.6.4 Voltage proof . 17
31 5.6.5 Impedance (if required by the detail specification) . 18
32 5.6.6 Equivalent series resistance [ESR] (if required by the detail specification) . 18
33 5.7 Temperature characteristic of capacitance (reference temperature 20°C) . 18
34 5.7.1 Special preconditioning . 18
35 5.7.2 Measuring conditions . 18
36 5.7.3 Requirements . 19
37 5.8 Shear test . 19
38 5.9 Substrate bending test . 19
39 5.9.1 General . 19
40 5.9.2 Initial measurement . 20
41 5.9.3 Final inspection . 20
42 5.10 Resistance to soldering heat . 20
43 5.10.1 General . 20

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44 5.10.2 Special preconditioning . 20
45 5.10.3 Initial measurement . 20
46 5.10.4 Test conditions . 20
47 5.10.5 Recovery . 21
48 5.10.6 Final inspection, measurements and requirements . 21
49 5.11 Solderability . 22
50 5.11.1 General . 22
51 5.11.2 Test conditions . 22
52 5.11.3 Recovery . 23
53 5.11.4 Final inspection, measurements and requirements . 23
54 5.12 Rapid change of temperature . 23
55 5.12.1 General . 23
56 5.12.2 Special preconditioning . 23
57 5.12.3 Initial measurement . 23
58 5.12.4 Number of cycles . 23
59 5.12.5 Recovery . 23
60 5.12.6 Final inspection, measurements and requirements . 24
61 5.13 Climatic sequence . 24
62 5.13.1 General . 24
63 5.13.2 Special preconditioning . 24
64 5.13.3 Initial measurement . 24
65 5.13.4 Dry heat . 24
66 5.13.5 Damp heat, cyclic, Test Db, first cycle . 24
67 5.13.6 Cold . 24
68 5.13.7 Damp heat, cyclic, Test Db, remaining cycles . 25
69 5.13.8 Final inspection, measurements and requirements . 25
70 5.14 Damp heat, steady state . 26
71 5.14.1 General . 26
72 5.14.2 Special preconditioning . 26
73 5.14.3 Initial measurement . 26
74 5.14.4 Test conditions . 26
75 5.14.5 Recovery . 27
76 5.14.6 Final inspection, measurements and requirements . 27
77 5.15 Endurance . 27
78 5.15.1 General . 27
79 5.15.2 Special preconditioning . 27
80 5.15.3 Initial measurement . 27
81 5.15.4 Test conditions . 28
82 5.15.5 Recovery . 29
83 5.15.6 Final inspection, measurements and requirements . 29
84 5.16 Robustness of terminations (only for capacitors with strip termination) . 30
85 5.16.1 General . 30
86 5.16.2 Test conditions . 30
87 5.16.3 Final inspection and requirements . 30
88 5.17 Component solvent resistance (if required) . 30
89 5.18 Solvent resistance of the marking (if required) . 30

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90 5.19 Accelerated damp heat, steady state (if required) . 30
91 5.19.1 General . 30
92 5.19.2 Initial measurement . 30
93 5.19.3 Conditioning . 31
94 5.19.4 Recovery . 31
95 5.19.5 Final measurements . 31
96 6 Marking . 31
97 6.1 General . 31
98 6.2 Information for marking . 31
99 6.3 Marking on the body . 32
100 6.4 Requirements for marking . 32
101 6.5 Marking of the packaging . 32
102 6.6 Additional marking . 32
103 7 Information to be given in a detail specification . 32
104 7.1 General . 32
105 7.2 Outline drawing and dimensions . 32
106 7.3 Mounting . 32
107 7.4 Rating and characteristics . 33
108 7.4.1 General . 33
109 7.4.2 Nominal capacitance range . 33
110 7.4.3 Particular characteristics . 33
111 7.4.4 Soldering . 33
112 7.5 Marking . 33
113 8 Quality assessment procedures . 33
114 8.1 Primary stage of manufacture . 33
115 8.2 Structurally similar components . 33
116 8.3 Certified records of released lots . 33
117 8.4 Qualification approval . 33
118 8.4.1 General . 33
119 8.4.2 Qualification approval on the basis of the fixed sample size procedures . 33
120 8.4.3 Tests. 34
121 Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface
122 mount multilayer capacitors of ceramic dielectric, Class 2 . 41
123 Annex B (normative) Capacitance ageing of fixed capacitors of ceramic dielectric, Class 2 . 42
124 B.1 General . 42
125 B.2 Law of capacitance ageing . 42
126 B.3 Capacitance measurements and capacitance tolerance . 43
127 B.4 Special preconditioning (see 5.2) . 43
128 Annex C (normative) Temperature characteristics of capacitance of 25°C . 44
129 Annex D (normative) Quality conformance inspection . 46
130 D.1 Formation of inspection lots . 46
131 D.1.1 Groups A and B inspection . 46
132 D.1.2 Group C inspection . 46
133 D.2 Test schedule . 46
134 D.3 Delayed delivery. 46

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135 D.4 Assessment levels. 46
136 D.5 test schedule for quality conformance inspection . 47
137 Annex X (informative) Cross-reference for reference to IEC 60384-22:2019 . 54
138 Bibliography . 55
139
140 Figure 1 – Fault: crack or fissure . 13
141 Figure 2 – Fault: crack or fissure . 14
142 Figure 3 – Separation or delamination . 14
143 Figure 4 – Exposed electrodes . 14
144 Figure 5 – Principal faces . 15
145 Figure 6 – Reflow temperature profile. 21
146 Figure A.1 – Dimensions . 41
147
148 Table 1 – Preferred values of category voltages . 11
149 Table 2 – Preferred tolerances . 12
150 Table 3 – Temperature characteristic of capacitance . 12
151 Table 4 – Measuring conditions . 15
152 Table 5 – Tangent of loss angle limits . 16
153 Table 6 – Test voltages . 17
154 Table 7 – Details of measuring conditions . 19
155 Table 8 – Reflow temperature profiles for Sn-Ag-Cu alloy . 21
156 Table 9 – Maximum capacitance change . 22
157 Table 11 – Number of damp heat cycles . 25
158 Table 12 – Final inspection, measurements and requirements . 25
159 Table 13 – Test conditions for damp heat, steady state . 26
160 Table 15 – Endurance test conditions (U = U ) . 28
C R
161 Table 16 – Endurance test conditions (U ≠ U ) . 29
C R
162 Table 17 – Final inspection, measurements and requirements of endurance test . 29
163 Table 18 – Initial requirements . 31
164 Table 19 – Conditioning . 31
165 Table 20 – Fixed sample size test plan for qualification approval – Assessment level EZ . 35
166 Table 21 – Test schedule for qualification approval . 36
167 Table A.1 – Dimensions . 41
168 Table C.1 – Temperature characteristics of capacitance . 44
169 Table C.2 – Preferred values of the temperature characteristic of capacitance with and without
170 a DC voltage applied . 45
171 Table C.3 – Measuring conditions of temperature characteristic of capacitance for the
172 reference temperature 25 °C . 45
173 Table D.1 – Lot-by-lot inspection . 47
174 Table D.2 – Periodic test . 47
175 Table D.3 – Test schedule for quality conformance inspection (lot by lot) . 48

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176 Table D.4 – Test schedule for quality conformance inspection (Periodic test) . 50
177 Table X.1 – Reference to IEC 60384-22 for clause/subclause . 54
178 Table X.2 – Reference to IEC 60384-22 for figure/table . 54
179
180
181
182
183

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184 INTERNATIONAL ELECTROTECHNICAL COMMISSION
185 ____________
186
187 FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT –
188
189 Part 22: Sectional specification –
190 Fixed surface mount multilayer capacitors of ceramic dielectric, Class 2
191
192
193 FOREWORD
194 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national
195 electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all
196 questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities,
197 IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS)
198 and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC
199 National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental
200 and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with
201 the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between
202 the two organizations.
203 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus
204 of opinion on the relevant subjects since each technical committee has representation from all interested IEC National
205 Committees.
206 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in
207 that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC
208 cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.
209 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to
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211 the corresponding national or regional publication shall be clearly indicated in the latter.
212 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment
213 services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by
214 independent certification bodies.
215 6) All users should ensure that they have the latest edition of this publication.
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219 use of, or reliance upon, this IEC Publication or any other IEC Publications.
220 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable
221 for the correct application of this publication.
222 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights.
223 IEC shall not be held responsible for identifying any or all such patent rights.
224 IEC 60384-22 has been prepared by IEC technical committee 40: Capacitors and resistors for electronic
225 equipment. It is an International Standard.
226 This fourth edition cancels and replaces the third edition published in 2019, This edition constitutes a
227 technical revision.
228 This edition includes the following significant technical changes with respect to the previous edition:
229 a) . The document has been completely restructured to comply with the ISO/IEC Directives, Part 2 and
230 to make it more useable; tables, figures and references have been revised accordingly.
231 b) The requirements of reference temperature 25°C has been added in Table 5, Table 9, Table 10,
232 Table 12, Table 14 and Table 17.
233 c) The table of temperature characteristics of capacitance for the reference temperature 25°C have
234 been added in Table C.1, Table C.2 and Table C.3.

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235 d) The r
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