SIST EN 62522:2015
(Main)Calibration of tuneable laser sources (IEC 62522:2014)
Calibration of tuneable laser sources (IEC 62522:2014)
This International Standard provides a stable and reproducible procedure to calibrate the
wavelength and power output of a tuneable laser against reference instrumentation such as
optical power meters and optical wavelength meters (including optical frequency meters) that
have been previously traceably calibrated.
Kalibrierung von abstimmbaren Laserquellen (IEC 62522:2014)
Étalonnage des sources laser accordables (CEI 62522:2014)
L'IEC 62522:2014 fournit une procédure stable et reproductible pour étalonner la longueur d'onde et la puissance de sortie d'un laser accordable en fonction des instruments de référence tels que des appareils de mesure de la puissance optique et des appareils de mesure de longueur d'onde optique (y compris des fréquencemètres optiques) dont la traçabilité a été préalablement étalonnée. Mots clés: étalonner la longueur d'onde et la puissance de sortie d'un laser accordable
Umerjanje nastavljivih laserskih virov (IEC 62522:2014)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 62522:2015
01-julij-2015
Umerjanje nastavljivih laserskih virov (IEC 62522:2014)
Calibration of tuneable laser sources (IEC 62522:2014)
Kalibrierung von abstimmbaren Laserquellen (IEC 62522:2014)
Étalonnage des sources laser accordables (CEI 62522:2014)
Ta slovenski standard je istoveten z: EN 62522:2014
ICS:
17.180.01 2SWLNDLQRSWLþQDPHUMHQMDQD Optics and optical
VSORãQR measurements in general
31.260 Optoelektronika, laserska Optoelectronics. Laser
oprema equipment
SIST EN 62522:2015 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62522:2015
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SIST EN 62522:2015
EUROPEAN STANDARD EN 62522
NORME EUROPÉENNE
EUROPÄISCHE NORM
July 2014
ICS 31.260; 33.180.01
English Version
Calibration of tuneable laser sources
(IEC 62522:2014)
Étalonnage des sources laser accordables Kalibrierung von abstimmbaren Laserquellen
(CEI 62522:2014) (IEC 62522:2014)
This European Standard was approved by CENELEC on 2014-03-21. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2014 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62522:2014 E
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SIST EN 62522:2015
EN 62522:2014 - 2 -
Foreword
The text of document 86/443/CDV, future edition 1 of IEC 62522, prepared by IEC TC 86 "Fibre
optics" was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as
EN 62522:2014.
The following dates are fixed:
– latest date by which the document has to be implemented at (dop) 2014-10-18
national level by publication of an identical national
standard or by endorsement
– latest date by which the national standards conflicting with (dow) 2017-03-21
the document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62522:2014 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60027-3 NOTE Harmonised as EN 60027-3.
IEC 60359 NOTE Harmonised as EN 60359.
IEC 60793-1 (Series) NOTE Harmonised in EN 60793-1 (Series)
IEC 60793-2 (Series) NOTE Harmonised in EN 60793-2 (Series)
IEC 61280-1-3:2010 NOTE Harmonised as EN 61280-1-3:2010.
IEC 61300-3-2 NOTE Harmonised as EN 61300-3-2
IEC 61315 NOTE Harmonised as EN 61315
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Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu
Publication Year Title EN/HD Year
IEC 60793-2-50 - Optical fibres -- Part 2-50: Product EN 60793-2-50 -
specifications - Sectional specification for
class B single-mode fibres
IEC 60825-1 - Safety of laser products -- Part 1: EN 60825-1 -
Equipment classification and requirements
IEC 60825-2 - Safety of laser products -- Part 2: Safety of EN 60825-2 -
optical fibre communication systems
(OFCS)
IEC 62129-2 - Calibration of wavelength/optical frequency EN 62129-2 -
measurement instruments -- Part 2:
Michelson interferometer single
wavelength meters
ISO/IEC 17025 - General requirements for the competence EN ISO/IEC 17025 -
of testing and calibration laboratories
ISO/IEC Guide 98-3 2008 Uncertainty of measurement -- Part 3: - -
Guide to the expression of uncertainty in
measurement (GUM:1995)
ISO/IEC Guide 99 2007 International vocabulary of metrology - - -
Basic and general concepts and
associated terms (VIM)
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SIST EN 62522:2015
IEC 62522
®
Edition 1.0 2014-02
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Calibration of tuneable laser sources
Étalonnage des sources laser accordables
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX W
ICS 31.260; 33.180.01 ISBN 978-2-8322-1411-4
Warning! Make sure that you obtained this publication from an authorized distributor.
Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviations . 7
3.1 Terms and definitions . 7
3.2 Abbreviations . 10
4 Preparation for calibration . 10
4.1 Organization. 10
4.2 Traceability . 10
4.3 Preparation . 10
4.4 Reference calibration conditions . 11
5 Wavelength calibration . 11
5.1 Overview . 11
5.2 Wavelength calibration at reference conditions . 11
5.2.1 Set-up . 11
5.2.2 Calibration equipment . 11
5.2.3 Procedure for wavelength calibration . 12
5.2.4 Dependence on conditions . 12
5.2.5 Uncertainty at reference conditions . 14
5.3 Wavelength calibration at operating conditions . 15
5.3.1 General . 15
5.3.2 Optical power dependence . 15
5.3.3 Uncertainty at operating conditions . 16
6 Optical power calibration . 16
6.1 Overview . 16
6.2 Optical power calibration at reference conditions . 17
6.2.1 Set-up . 17
6.2.2 Calibration equipment . 17
6.2.3 Procedure for power calibration at reference conditions . 17
6.2.4 Dependence on conditions . 18
6.2.5 Uncertainty at reference conditions . 21
6.3 Optical power calibration at operating conditions . 22
6.3.1 General . 22
6.3.2 Wavelength dependence . 22
6.3.3 Uncertainty at operating conditions . 23
7 Documentation . 23
7.1 Calibration data and uncertainty . 23
7.2 Calibration conditions . 23
Annex A (normative) Mathematical basis . 25
A.1 General . 25
A.2 Type A evaluation of uncertainty . 25
A.3 Type B evaluation of uncertainty . 26
A.4 Determining the combined standard uncertainty . 26
A.5 Reporting . 27
Annex B (informative) Averaged wavelength (or power) deviation over a certain range . 28
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Annex C (informative) Other testing . 30
C.1 General . 30
C.2 Wavelength resolution . 30
C.2.1 Set-up . 30
C.2.2 Testing equipment . 30
C.2.3 Testing procedure for determining wavelength resolution . 30
C.3 Optical power resolution . 31
C.3.1 Set-up . 31
C.3.2 Testing equipment . 31
C.3.3 Testing procedure for optical power resolution . 31
C.4 Signal to source spontaneous emission ratio . 32
C.4.1 Set-up . 32
C.4.2 Testing equipment . 32
C.4.3 Testing procedure for determining signal to source spontaneous
emission ratio . 32
C.5 Side mode suppression ratio . 33
C.5.1 General . 33
C.5.2 Set-up . 33
C.5.3 Testing equipment . 34
C.5.4 Testing procedure . 34
Bibliography . 37
Figure 1 – Measurement set-up for wavelength calibration . 11
Figure 2 – Measurement set-up for temperature dependence . 13
Figure 3 – Measurement set-up for wavelength stability . 14
Figure 4 – Measurement set-up for optical power dependence . 15
Figure 5 – Measurement set-up for intrinsic optical power calibration . 17
Figure 6 – Measurement set-up for temperature dependence . 18
Figure 7 – Measurement set-up for optical power stability . 20
Figure 8 – Measurement set-up for connection repeatability/reproducibility . 21
Figure 9 – Measurement set-up for wavelength dependence . 22
Figure C.1 – Measurement set-up for wavelength resolution . 30
Figure C.2 – Measurement set-up for optical power resolution setting test . 31
Figure C.3 – Measurement set-up for signal to total source spontaneous emission ratio . 32
Figure C.4 – Measurement of the signal to spontaneous emission ratio . 33
Figure C.5 – Measurement set-up for the side mode suppression ratio test . 33
Figure C.6 – Optical spectrum of tuneable laser source . 35
Figure C.7 – Measurement set-up for SMSR . 35
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
CALIBRATION OF TUNEABLE LASER SOURCES
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62522 has been prepared by IEC technical committee 86: Fibre
optics.
The text of this standard is based on the following documents:
CDV Report on voting
86/443/CDV 86/459/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
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IEC 62522:2014 © IEC 2014 – 5 –
The committee has decided that the contents of this publication will remain unchanged until the
stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to
the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
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INTRODUCTION
Wavelength-division multiplexing (WDM) transmission systems have been deployed in optical
trunk lines. ITU-T Recommendations in the G.694 series describe the frequency and
wavelength grids for WDM applications. For example, the frequency grid of G.694.1 supports a
variety of channel spacing ranging from 12,5 GHz to 100 GHz and wider. WDM devices, such
as arrayed waveguide grating (AWG), thin film filter or grating based multiplexers (MUX) and
demultiplexers (DMUX) with narrow channel spacing are incorporated in the WDM transmission
systems. When measuring the characteristics of such devices, wavelength tuneable laser
sources are commonly used and are required to have well-calibrated performances;
wavelength uncertainty, wavelength tuning repeatability, wavelength stability and output optical
power stability are important parameters.
The tuneable laser source (TLS) is generally equipped with the following features:
a) the output wavelength is continuously tuneable in a wavelength range starting at 1 260 nm
or higher and ending at less than 1 675 nm (the output should excite only the fundamental
LP01 fibre mode);
b) an output port for optical fibre connectors.
The envelope of the spectrum is a single longitudinal mode with a FWHM of at most 0,1 nm.
Any adjacent modes are at least 20 dB lower than the main spectral mode (for example, a
distributed feedback laser diode (DFB-LD), external cavity laser, etc.)
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IEC 62522:2014 © IEC 2014 – 7 –
CALIBRATION OF TUNEABLE LASER SOURCES
1 Scope
This International Standard provides a stable and reproducible procedure to calibrate the
wavelength and power output of a tuneable laser against reference instrumentation such as
optical power meters and optical wavelength meters (including optical frequency meters) that
have been previously traceably calibrated.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
IEC 60793-2-50, Optical fibres – Part 2-50: Product specifications – Sectional specification for
class B single-mode fibres
IEC 60825-1, Safety of laser products – Part 1: Equipment classification and requirements
IEC 60825-2, Safety of laser products – Part 2: Safety of optical fibre communication systems
(OFCS)
IEC 62129-2, Calibration of wavelength/optical frequency measurement instruments – Part 2:
Michelson interferometer single wavelength meters
ISO/IEC 17025, General requirements for the competence of testing and calibration
laboratories
ISO/IEC Guide 98-3:2008, Uncertainty of measurement – Part 3: Guide to the expression of
uncertainty in measurement (GUM:1995)
ISO/IEC Guide 99:2007, International vocabulary of metrology – Basic and general concepts
and associated terms (VIM)
3 Terms, definitions and abbreviations
For the purposes of this document, the following terms, definitions and abbreviations apply.
3.1 Terms and definitions
3.1.1
accredited calibration laboratory
calibration laboratory authorized by an appropriate national organization to issue calibration
certificates that demonstrates traceability to national standards
3.1.2
adjustment
set of operations carried out on an instrument in order that it provides given indications
corresponding to given values of the measurand
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[SOURCE: IEC 60050-300:2001, 311-03-16, modified – minor editorial change, omission of the
NOTE]
[See also ISO/IEC Guide 99:2007, 3.11, modified – 3 NOTES omitted].
3.1.3
calibration
set of operations that establish, under specified conditions, the relationship between the values
of quantities indicated by a measuring instrument and the corresponding values realized by
standards
Note 1 to entry: The results of a calibration permit either the assignment of measurand values to the indications or
the determination of corrections with respect to the indications.
Note 2 to entry: A calibration may also determine other metrological properties such as the effects of influence
quantities.
Note 3 to entry: The result of a calibration may be recorded in a document, called a calibration certificate or a
calibration report.
[SOURCE: ISO/IEC Guide 99:2007, 2.39, modified – shortened; the two NOTES replaced by 3
new NOTES].
3.1.4
calibration conditions
conditions of measurement in which the calibration is performed
3.1.5
calibration at reference conditions
calibration which includes the evaluation of the uncertainty at reference conditions of the light
source under calibration
3.1.6
calibration at operating conditions
calibration which includes the evaluation of the uncertainty at operating conditions of the light
source under calibration
3.1.7
level of confidence
estimated probability that the true value of a measured parameter lies in the given range
3.1.8
coverage factor
k
used to calculate the expanded uncertainty U from the standard uncertainty, u
3.1.9
decibels
dB, dBm
sub-multiple of the Bel, B, unit used to express values of optical power on a logarithmic scale
Note 1 to entry: The power level is always relative to a reference power P
0
P
L = 10× log
P / P 10
0
P
0
where P and P are expressed in the same linear units.
0
The unit symbol dBm is used to indicate power level relative to 1 mW:
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P
L = 10× log
P /1mW 10
1mW
The linear ratio, R , of two radiant powers, P and P , can alternatively be expressed as an power level difference
lin 1 2
in decibels (dB):
P
1
ΔL = 10×log (R )= 10×log = 10×log (P )−10×log (P )
P 10 lin 10 10 1 10 2
P
2
Similarly, relative uncertainties, U , or relative deviations, can be alternatively expressed in decibels:
lin
U = 10× log (1− U )
dB 10 lin
Note 2 to entry: For mathematical treatment all measurement results should be expressed in linear units (e.g.
watts) and all uncertainties should be expressed in linear form. This is recommended because the accumulation of
uncertainties in logarithmic units is mathematically difficult. The final statement of an uncertainty may be either in
the linear or in the dB form.
Note 3 to entry: ISO 80000-3 and IEC 60027-3 should be consulted for further details. The rules of IEC 60027-3
do not permit attachments to unit symbols. However the unit symbol dBm is accepted in this standard because it is
widely used and accepted by users of fibre optic instrumentation.
3.1.10
optical power deviation
D
P
, and the
difference between the set power of the light source under calibration, P
TLS
corresponding reference power P , measured by the reference power meter
meas
P − P
TLS meas
D =
P
P
meas
3.1.11
operating conditions
appropriate set of specified ranges of values with influence quantities usually wider than the
reference conditions for which the uncertainties of a measuring instrument are specified
Note 1 to entry: Operating conditions and the uncertainty at operating conditions are usually specified by the
manufacturer for the convenience of the user.
3.1.12
reference conditions
conditions used for testing the performance of a measuring instrument or for the
intercomparison of the measurement results
Note 1 to entry: Reference conditions generally include reference values or reference ranges for the quantities
influencing and affecting the measuring instrument.
3.1.13
side-mode suppression ratio
SMSR
peak power ratio between the main mode spectrum and the largest side mode spectrum in a
single-mode laser diode such as a DFB-LD
Note 1 to entry: Side-mode suppression ratio is usually expressed in dB.
3.1.14
wavelength
wavelength (in a vacuum) of a light source
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3.1.15
wavelength deviation
D
λ
difference between the target wavelength, set on the light source under calibration, λ , and
TLS
the measured wavelength, λ , in nm or μm
meas
D = λ – λ
λ TLS meas
3.2 Abbreviations
APC Angled physical contact
DFB-LD Distributed feedback laser diode
FWHM Full-width/half-maximum
OSA Optical spectrum analyser
SMSR Side-mode suppression ration
TLS Tuneable laser source
WDM Wavelength-division multiplexing
4
...
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