Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty requirements (IEC 62586-2:2017/AMD1:2021)

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Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2: Funktionsprüfungen und Anforderungen an die Messunsicherheit (IEC 62586-2:2017/AMD1:2021)

Mesure de la qualité de l'alimentation dans les réseaux d'alimentation - Partie 2: Essais fonctionnels et exigences d'incertitude (IEC 62586-2:2017/AMD1:2021)

Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za funkcionalne preskuse in negotovost - Dopolnilo A1 (IEC 62586-2:2017/AMD1:2021)

General Information

Status
Published
Public Enquiry End Date
30-Jul-2020
Publication Date
12-Dec-2021
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
26-Oct-2021
Due Date
31-Dec-2021
Completion Date
13-Dec-2021

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SLOVENSKI STANDARD
SIST EN 62586-2:2017/A1:2022
01-februar-2022

Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za

funkcionalne preskuse in negotovost - Dopolnilo A1 (IEC 62586-
2:2017/AMD1:2021)
Power quality measurement in power supply systems - Part 2: Functional tests and
uncertainty requirements (IEC 62586-2:2017/AMD1:2021)
Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2:
Funktionsprüfungen und Anforderungen an die Messunsicherheit (IEC 62586-
2:2017/AMD1:2021)

Mesure de la qualité de l'alimentation dans les réseaux d'alimentation - Partie 2: Essais

fonctionnels et exigences d'incertitude (IEC 62586-2:2017/AMD1:2021)
Ta slovenski standard je istoveten z: EN 62586-2:2017/A1:2021
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
SIST EN 62586-2:2017/A1:2022 en,fr,de

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 62586-2:2017/A1:2022
---------------------- Page: 2 ----------------------
SIST EN 62586-2:2017/A1:2022
EUROPEAN STANDARD EN 62586-2:2017/A1
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2021
ICS 17.220.20
English Version
Power quality measurement in power supply systems - Part 2:
Functional tests and uncertainty requirements
(IEC 62586-2:2017/AMD1:2021)

Mesure de la qualité de l'alimentation dans les réseaux Messung der Spannungsqualität in

d'alimentation - Partie 2: Essais fonctionnels et exigences Energieversorgungssystemen - Teil 2: Funktionsprüfungen

d'incertitude und Anforderungen an die Messunsicherheit
(IEC 62586-2:2017/AMD1:2021) (IEC 62586-2:2017/AMD1:2021)

This amendment A1 modifies the European Standard EN 62586-2:2017; it was approved by CENELEC on 2021-10-20. CENELEC

members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the

status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the

responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as

the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the

Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 62586-2:2017/A1:2021 E
---------------------- Page: 3 ----------------------
SIST EN 62586-2:2017/A1:2022
EN 62586-2:2017/A1:2021 (E)
European foreword

The text of document 85/770/FDIS, future IEC 62586-2/AMD1, prepared by IEC/TC 85 “Measuring

equipment for electrical and electromagnetic quantities” was submitted to the IEC-CENELEC parallel

vote and approved by CENELEC as EN 62586-2:2017/A1:2021.
The following dates are fixed:

• latest date by which the document has to be implemented at national (dop) 2022–07–20

level by publication of an identical national standard or by endorsement

• latest date by which the national standards conflicting with the (dow) 2024–10–20

document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

This document has been prepared under a Standardization Request given to CENELEC by the

European Commission and the European Free Trade Association.

Any feedback and questions on this document should be directed to the users’ national committee. A

complete listing of these bodies can be found on the CENELEC website.
Endorsement notice

The text of the International Standard IEC 62586-2:2017/AMD1:2021 was approved by CENELEC as

a European Standard without any modification.
---------------------- Page: 4 ----------------------
SIST EN 62586-2:2017/A1:2022
IEC 62586-2
Edition 2.0 2021-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AM ENDMENT 1
AM ENDEMENT 1
Power quality measurement in power supply systems –
Part 2: Functional tests and uncertainty requirements
Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –
Partie 2: Essais fonctionnels et exigences d'incertitude
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-9930-2

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 5 ----------------------
SIST EN 62586-2:2017/A1:2022
– 2 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –
Part 2: Functional tests and uncertainty requirements
AMENDMENT 1
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international

co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and

in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,

Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their

preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with

may participate in this preparatory work. International, governmental and non-governmental organizations liaising

with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for

Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence between

any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this document may be the subject of patent

rights. IEC shall not be held responsible for identifying any or all such patent rights.

Amendment 1 to IEC 62586-2:2017 has been prepared by IEC technical committee 85:
Measuring equipment for electrical and electromagnetic quantities.
The text of this amendment is based on the following documents:
FDIS Report on voting
85/770/FDIS 85/795/RVD

Full information on the voting for its approval can be found in the report on voting indicated in

the above table.
The language used for the development of this Amendment is English.
---------------------- Page: 6 ----------------------
SIST EN 62586-2:2017/A1:2022
IEC 62586-2:2017/AMD1:2021 – 3 –
© IEC 2021

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in

accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available

at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are

described in greater detail at www.iec.ch/standardsdev/publications/.

The committee has decided that the contents of this document will remain unchanged until the

stability date indicated on the IEC website under webstore.iec.ch in the data related to the

specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct understanding

of its contents. Users should therefore print this document using a colour printer.

_____________
5.1.4 Single "power-system influence quantities"
c d
Replace in Table 4 the footnotes and with:
This signal represents a crest factor of 2 and applies to voltage signals.
This signal represents a crest factor of 3 and applies to current signals.
6.2.2.2 Variations due to single influence quantities
Replace Subclause 6.2.2.2 by the following:
Each test shall last at least 1 s.
No. Target of the test Testing points Complementary test Test criterion (if
according to Table 3 conditions according test is applicable)
to Table 4
A2.3.1 Measure influence of P3 for voltage S1 for frequency TC10/12(unc)
frequency on measurement magnitude
S3 for frequency
uncertainty (for further
calculations as required in
A2.3.2 Measure influence of P3 for voltage S1 for harmonics TC10/12(unc) on
harmonics on measurement magnitude ch1 compared to a
uncertainty (for further reference voltage
calculations as required in
6.4.1 General
Clarification about units of y axis; replace Figure 1 by the following:
---------------------- Page: 7 ----------------------
SIST EN 62586-2:2017/A1:2022
– 4 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
Figure 1 – Overview of test for dips according to test A4.1.1
---------------------- Page: 8 ----------------------
SIST EN 62586-2:2017/A1:2022
IEC 62586-2:2017/AMD1:2021 – 5 –
© IEC 2021
Clarification about units of y axis; replace Figure 2 by the following:
Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
Replace Figure 3 by the following (clarification about hysteresis):
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
---------------------- Page: 9 ----------------------
SIST EN 62586-2:2017/A1:2022
– 6 – IEC 62586-2:2017/AMD1:2021
© IEC 2021

In Figure 4, correction of values, by expressing them in % of U and by adding a significant

din
digit. Replace Figure 4 by the following:
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N N + 1 N + 2 N + 3 N + 4 N + 5 N + 6 N + 7
100 % U 70,7 % U 0 % U 0 % U 0 % U 63,6 % U 90 % U 90 % U
din din din din din din din din
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 8 N + 9 N + 10 N + 11 N + 12 N + 13 N + 14 N + 15
90 % U 92 % U 94 % U 94 % U 94 % U 94 % U 94 % U 94 % U
din din din din din din din din
Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1

In Figure 5, correction of signal level to match test point P3 for dips/interruptions, and correction

of scale now expressed in % of U . Replace Figure 5 by the following:
din
Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
---------------------- Page: 10 ----------------------
SIST EN 62586-2:2017/A1:2022
IEC 62586-2:2017/AMD1:2021 – 7 –
© IEC 2021

In Figure 6, correction of signal level to match test point P3 for dips/interruptions, and correction

of scale now expressed in % of U . Replace Figure 6 by the following:
din
Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2

In Figure 7, correction of the scale, now expressed in % of U . Replace Figure 7 by the

din
following:
Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
---------------------- Page: 11 ----------------------
SIST EN 62586-2:2017/A1:2022
– 8 – IEC 62586-2:2017/AMD1:2021
© IEC 2021

In Figure 8, correction of the scale, now expressed in % of U . Replace Figure 8 by the

din
following:
Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
Update of the scale in Figure 9 as follows:
Figure 9 – Sliding reference voltage test
6.13 Rapid voltage changes (RVC)
Replace the entire Subclause 6.13 by the following:
---------------------- Page: 12 ----------------------
SIST EN 62586-2:2017/A1:2022
IEC 62586-2:2017/AMD1:2021 – 9 –
© IEC 2021
6.13 Rapid voltage changes (RVC)
6.13.1 RVC parameters and evaluation
An RVC event is characterized by four parameters:
• start time,
• duration,
• ∆U
max
• ∆U .

The start time of an RVC event shall be time-stamped with the time that the "voltage-is-steady-

state" logic signal became false and initiated the RVC event.

The event duration of an RVC event is 100/120 half cycles shorter than the duration that the

"voltage-is-steady-state" logic signal is false.
The ∆U of one RVC event is the maximum absolute difference between any of the U
max rms(½)

values during the RVC event, and the final arithmetic mean 100/120 U value just prior to

rms(½)
the RVC event. For polyphase systems, the ∆U is the largest ∆U on any channel.
max max

The ∆U of one RVC event is the absolute difference between the final arithmetic mean

100/120 U
...

SLOVENSKI STANDARD
SIST EN 62586-2:2017/kprA1:2020
01-julij-2020

Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za

funkcionalne preskuse in negotovost
Power quality measurement in power supply systems - Part 2: Functional tests and
uncertainty requirements
Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2:
Funktionsprüfungen und Anforderungen an die Messunsicherheit

Mesure de la qualité de l'alimention dans les réseaux d'alimentation - Partie 2: Essais

fonctionnels et exigences d'incertitude
Ta slovenski standard je istoveten z: EN 62586-2:2017/prA1:2020
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
SIST EN 62586-2:2017/kprA1:2020 en,fr,de

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 62586-2:2017/kprA1:2020
---------------------- Page: 2 ----------------------
SIST EN 62586-2:2017/kprA1:2020
85/721/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 62586-2/AMD1 ED2
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2020-05-29 2020-08-21
SUPERSEDES DOCUMENTS:
85/700/CD, 85/711A/CC
IEC TC 85 : MEASURING EQUIPMENT FOR ELECTRICAL AND ELECTROMAGNETIC QUANTITIES
SECRETARIAT: SECRETARY:
China Ms Guiju HAN
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
SC 77A
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY

SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING

Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.

This document is still under study and subject to change. It should not be used for reference purposes.

Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they

are aware and to provide supporting documentation.
TITLE:

Power quality measurement in power supply systems - Part 2: Functional tests and uncertainty

requirements
PROPOSED STABILITY DATE: 2025
NOTE FROM TC/SC OFFICERS:

Copyright © 2020 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this

electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.

You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without

permission in writing from IEC.
---------------------- Page: 3 ----------------------
SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 2 - 85/721/CDV
1 CONTENTS

2 CONTENTS........................................................................................................................ - 2 -

3 FOREWORD ...................................................................................................................... - 3 -

4 5.1.4 Single "power-system influence quantities" ................................................. - 5 -

5 6.4.1 General ....................................................................................................... - 5 -

6 6.13 Rapid voltage changes (RVC) .......................................................................... - 10 -

7 6.13.1 RVC parameters and evaluation ................................................................ - 10 -

8 6.13.2 General ..................................................................................................... - 10 -

9 6.13.3 “No RVC” tests .......................................................................................... - 12 -

10 6.13.4 “RVC threshold and setup”test ................................................................... - 16 -

11 6.13.5 “RVC parameters” test .............................................................................. - 18 -

12 6.13.6 “RVC polyphase” tests .............................................................................. - 20 -

13 6.13.7 “Voltage is in steady-state condition” tests ................................................ - 22 -

14 Annex G (informative) Gapless measurements of voltage amplitude and harmonics ........ - 25 -

16 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1 ............................. - 6 -

17 Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1 .................................. - 6 -

18 Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1 ........................... - 7 -

19 Figure 18 – RVC event (new figure) ................................................................................. - 10 -

20 Figure 19 – Test A13.1.1 waveform .................................................................................. - 12 -

21 Figure 20 – Test A13.1.1 waveform with RVC limits and arithmetic mean ......................... - 13 -

22 Figure 21 – Test A13.1.2 waveform .................................................................................. - 14 -

23 Figure 22 – Test A13.1.2 waveform with RVC limits and arithmetic mean ......................... - 14 -

24 Figure 23 – Test A13.1.3 waveform .................................................................................. - 15 -

25 Figure 24 – Test A13.1.3 waveform with RVC limits and arithmetic mean ......................... - 16 -

26 Figure 25 – Test A13.2.1 waveform .................................................................................. - 17 -

27 Figure 26 – Test A13.2.1 waveform with RVC limits and arithmetic mean ......................... - 17 -

28 Figure 27 – Test A13.3.1 waveform .................................................................................. - 19 -

29 Figure 28 – Test A13.3.1 waveform with RVC limits and arithmetic mean ......................... - 19 -

30 Figure 29 – Test A13.4.1 waveform .................................................................................. - 21 -

31 Figure 47 – Test A13.4.1 waveform with RVC limits and VSS ........................................... - 21 -

32 Figure 30 – Test A13.5.1 waveform .................................................................................. - 22 -

33 Figure 32 – Test A13.5.2 waveform .................................................................................. - 24 -

34 Figure 33 – Test A13.5.2 waveform with RVC limits and arithmetic mean ......................... - 24 -

35 Figure G.4 – Spectral leakage effects for a missing sample.............................................. - 25 -

37 Table 8 – Specification of test A13.1.1 ............................................................................. - 12 -

38 Table 9 – Specification of test A13.1.2 ............................................................................. - 13 -

39 Table 10 – Specification of test A13.1.3 ........................................................................... - 15 -

40 Table 11 – Specification of test A13.2.1 ........................................................................... - 16 -

41 Table 12 – Specification of test A13.3.1 ........................................................................... - 18 -

42 Table 13 – Specification of test A13.4.1 ........................................................................... - 20 -

43 Table 14 – Specification of test A13.5.1 ........................................................................... - 22 -

44 Table 15 – Specification of test A13.5.2 ........................................................................... - 23 -

---------------------- Page: 4 ----------------------
SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 3 - 85/721/CDV
46 INTERNATIONAL ELECTROTECHNICAL COMMISSION
47 ____________
49 POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –
51 Part 2: Functional tests and uncertainty requirements
53 FOREWORD

54 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all

55 national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-

56 operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to

57 other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available

58 Specifications (PAS) and Guides (hereafter referred to as "IEC Publication(s)"). Their preparation is entrusted to technical

59 committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work.

60 International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation.

61 IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions

62 determined by agreement between the two organizations.

63 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

64 consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC

65 National Committees.

66 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees

67 in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate,

68 IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user.

69 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently

70 to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication

71 and the corresponding national or regional publication shall be clearly indicated in the latter.

72 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment

73 services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by

74 independent certification bodies.

75 6) All users should ensure that they have the latest edition of this publication.

76 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of

77 its technical committees and IEC National Committees for any personal injury, property damage or other damage of any

78 nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the

79 publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.

80 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

81 indispensable for the correct application of this publication.

82 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights.

83 IEC shall not be held responsible for identifying any or all such patent rights.

84 International Standard IEC 62586-2 has been prepared by IEC technical committee 85: Measuring

85 equipment for electrical and electromagnetic quantities.

86 This second edition cancels and replaces the first edition published in 2013. This edition constitutes a

87 technical revision.

88 This edition includes the following significant technical changes with respect to the previous edition:

89 a) test procedures for RVC and current have been added;
90 b) mistakes have been fixed.

91 This bilingual version (2017-11) corresponds to the monolingual English version, published in 2017-03.

92 The text of this standard is based on the following documents:
CDV Report on voting
85/525/CDV 85/571/RVC

94 Full information on the voting for the approval of this standard can be found in the report on voting

95 indicated in the above table.
96 The French version of this standard has not been voted upon.

97 This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

---------------------- Page: 5 ----------------------
SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 4 - 85/721/CDV

98 A list of all parts of the IEC 62586 series, published under the general title Power quality

99 measurement in power supply systems, can be found on the IEC website.

100 The committee has decided that the contents of this publication will remain unchanged until the

101 stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to the

102 specific publication. At this date, the publication will be
103 • reconfirmed,
104 • withdrawn,
105 • replaced by a revised edition, or
106 • amended.
107

108 The contents of the corrigendum of June 2018 have been included in this copy.

109

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful for the correct

understanding of its contents. Users should therefore print this document using a

colour printer.
110
---------------------- Page: 6 ----------------------
SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 5 - 85/721/CDV
111
112 5.1.4 Single "power-system influence quantities"
c d
113 Replace in Table 4 the footnotes and by the following:
114 This signal represents a crest factor of 2 and applies to voltage signals.
115 This signal represents a crest factor of 3 and applies to current signals.
116
117 6.2.2.2 Variations due to single influence quantities
118 Replace the complete clause by the following:
119 Each test shall last at least 1 s.
No. Target of the test Testing points Complementary test Test criterion (if
according Table 3 conditions according test is applicable)
to Table 4
A2.3.1 Measure influence of P3 for voltage S1 for frequency TC10/12(unc)
frequency on measurement magnitude
uncertainty (for further
calculations as required in
S3 for frequency
Clause8).
A2.3.2 Measure influence of P3 for voltage S1 for harmonics TC10/12(unc) on
harmonics on measurement magnitude ch1 compared to a
uncertainty (for further reference voltage
calculations as requiredin
Clause8).
120
121 6.4.1 General
122 Replace Figure 1 by the following:
% Udin Test signal phase 1
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1
% Udin
Test signal phase 2
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1 + 10 cycles
% Udin
Test signal phase 3
150
100
-50
-100
-150
0 5 10 15 20 25 30
Number of cycles
Zero crossing at T1 + 20 cycles
123
124 Figure 1 – Overview of test for dips according to test A4.1.1
125
126
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IEC CDV 62586-2 © IEC 2020 - 6 - 85/721/CDV
127 Replace Figure 2 by the following:
% Udin
1/2 cycle RMS phase 1
100
0 05,1 100,2 10,53 200,4 205,5 300,6
Number of cycles
% Udin
1/2 cycle RMS phase 2
100
5 10 15 20 25 30
Number of cycles
% Udin
1/2 cycle RMS phase 3
100
5 10 15 20 25 30
Number of cycles
IEC
128 Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
129 Replace Figure 3 by the following:
din
90 % U
din
2 % U hysteresis
din
0 % U
din
Vdip duration
Vdip start Vdip end
IEC
130 Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
131 Replace Figure 4 by the following:
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SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 7 - 85/721/CDV
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 1 N + 2 N + 3 N + 4 N + 5 N + 6 N + 7
100 % U 70,7% U 0 % U 0 % U 0 % U 63,6% U 90 % U 90 % U
din din din din din din din din
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 8 N + 9 N + 10 N + 11 N + 12 N + 13 N + 14 N + 15
90 % U 92 % U 94 % U 94 % U 94 % U 94 % U 94 % U 94 % U
din din din din din din din din
IEC
132 Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
133
134 Replace Figure 5 by the following:
135
136 Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
137 Replace Figure 6 by the following:
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SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 8 - 85/721/CDV
138
139 Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
140
141 Replace Figure 7 by the following:
Test signal: swell 200 %, 2,5 cycles
% Udin
300
200
100
–100
–200
–300
0 1 2 3 4 5 6 Cycles
IEC
142
143 Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
144
145
146
147
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SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 9 - 85/721/CDV
148 Replace Figure 8 by the following:
149
1/2 cycle RMS
% Udin
200
180
160
140
120
100
0 1 2 3 4 5 6 Cycles
IEC
150
151 Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
152
153 Replace Figure 9 by the following:
% U
din
100
Time
IEC
154 Figure 9 – Sliding reference voltage test
155
156
157
158
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SIST EN 62586-2:2017/kprA1:2020
IEC CDV 62586-2 © IEC 2020 - 10 - 85/721/CDV
159 6.13 Rapid voltage changes (RVC)
160 Replace the entire clause by the following:
161 6.13.1 RVC parameters and evaluation
162 An RVC event is characterized by four parameters:
163 • start time,
164 • duration,
165 ∆U
• max
...

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