WG 2 - TC 82/WG 2

IEC TS 63126:2025 defines additional testing requirements for photovoltaic (PV) modules deployed under conditions leading to higher module temperature which are beyond the scope of IEC 61215-1 and IEC 61730‑1 and the relevant component standards, IEC 62788‑1‑7, IEC 62788‑2‑1, IEC 62790 and IEC 62852. The testing conditions specified in IEC 61215-2 and IEC 61730-2 (and the relevant component standards IEC 62788‑1‑7, IEC 62788‑2‑1, IEC 62790 and IEC 62852) assumed that these standards are applicable for module deployment where the 98th percentile temperature (T98), that is the temperature that a module would be expected to exceed for 175,2 h per year, is less than 70 °C. This document defines two temperature regimes, temperature Level 1 and temperature Level 2, which were designed considering deployment in environments with mounting configurations such that the T98 is less than or equal to 80 °C for temperature Level 1, and less than or equal to 90 °C for temperature Level 2. This document provides recommended additional testing conditions within the IEC 61215 series, IEC 61730 series, IEC 62788‑1‑7, IEC 62788‑2‑1, IEC 62790 and IEC 62852 for module operation in temperature Levels 1 and 2. Successfully passing a higher Level for a test, sequence of tests, or complete testing for a higher Level is an implied passing of the relevant lower‑Level testing. For example, passing 200 thermal cycles for Level 2 is considered passing Level 0 and Level 1 for 200 thermal cycles.

IEC TS 62804-1:2025 defines procedures to evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress, primarily potential-induced degradation (PID). Three test methods are given. The first type, which has two variations, is conducted in the dark and is primarily designed for assessing PID-shunting. The second type, which also has two variations, incorporates the factor of ultraviolet light and is intended for assessing PID-polarization. A separate test for the recovery of PID polarization under ultraviolet light is also included.
The testing in this document is designed for crystalline silicon PV modules with silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor or electronically interacting with the silicon semiconductor. This document is not intended for evaluating modules with thin-film technologies, tandem, or heterojunction devices but can be used for guidance. The actual durability of modules to system voltage stress depends on the environmental conditions under which they are operated and the voltage potential in the module relative to earth (ground). These tests are intended to assess PV module sensitivity to PID irrespective of actual stresses under operation in different climates and systems.

IEC TS 60904-1-2:2024 describes procedures for the measurement of the current-voltage (I-V) characteristics of single junction bifacial photovoltaic devices in natural or simulated sunlight. It is applicable to encapsulated solar cells, sub-assemblies of such cells or entire PV modules. For measurements of I-V characteristics of non-encapsulated solar cells, IEC TS 63202-3 applies.
The requirements for measurement of I-V characteristics of standard (monofacial) PV devices are covered by IEC 60904-1, whereas this document describes the additional requirements for the measurement of I-V characteristics of bifacial PV devices.
This second edition cancels and replaces the first edition published in 2019. This edition includes the following significant technical changes with respect to the previous edition:
a) The scope has been updated and refers to IEC TS 63202-3 for the measurement of non‑encapsulated solar cells.
b) The requirements for the non-uniformity of irradiance have been updated and now refer to classifications introduced in IEC 60904-9.
c) The requirement for non-irradiated background has been revised.
d) Spectral mismatch corrections are no longer mandatory, unless required by another standard. Spectral mismatch would have to be considered in the measurement uncertainty.
e) The requirement regarding the calculation of bifaciality has been modified: Equivalent irradiance shall not be calculated based on the minimum bifaciality value between ISC and Pmax, but on the bifaciality of ISC.

IEC 62788-1-1:2024 defines test methods and reporting requirements for characteristics (optical, mechanical, electrical, thermal, and chemical) of non-rigid polymeric materials (e.g., poly(ethylene-co-vinyl acetate), EVA) intended for use in terrestrial photovoltaic (PV) modules as polymeric encapsulants.
The test methods in this document define how to characterize encapsulant materials in a manner representative of how they will be used in the module, which includes combination with other components such as frontsheets, backsheets, adhesives, edge seals, or glass.The methods described in this document support and supplement the safety- and performance-related tests defined on the PV module level, as defined in IEC 61730-2 and IEC 61215-1. This document also defines test methods for general assessment of material characteristics of polymeric encapsulants.
The test methods described in this document may be used for the purposes of: datasheet reporting (aiding module design or material research and development); process and manufacturing control (e.g., incoming or outgoing inspection); application in module safety and design type qualification protocols; or reliability and durability study/standards development

IEC 62788-7-3:2022 defines the test methods that can be used for evaluating the abrasion of materials and coatings in photovoltaic modules or other solar devices. This document may be applied to components on the incident surface (including coatings, frontsheet, and glass) as well as the back surface (including backsheets or back glass). This document is intended to address abrasion of PV module surfaces and any coatings present using representative specimens (e.g. which can be centimetres in size); the methods and apparatus used here can also be used on PV module specimens (e.g. meters in size).

IEC TS 62788-2:2024 defines test methods and datasheet reporting requirements for safety and performance-related properties (mechanical, electrical, thermal, optical, chemical) of non‑rigid polymeric materials intended for use in terrestrial photovoltaic modules as polymeric front- and backsheets. The test methods in this document define how to characterize front- and backsheet materials and their components in a manner representative of how they will be used in the module, which eventually includes combination with other matched components such as encapsulants or adhesives. Results of testing described in this document are called by IEC 62788-2-1 for safety qualification of polymeric front- and backsheets on component level and support the safety and performance-related tests defined on the PV module level as defined in the series IEC 61730 (for safety) and IEC 61215 (for performance). This document also defines test methods for assessing inherent material characteristics of polymeric front- and backsheets or their components, which can be required in datasheet reporting or can be useful in the context of product development or design of PV modules.
This second edition cancels and replaces the first edition published in 2017. This edition includes the following significant technical changes with respect to the previous edition:
a) With revision of IEC 61730-1 the requirements for the polymeric front- and backsheet have been moved from IEC 61730-1 into IEC 62788-2-1. This is reflected accordingly.
b) The tensile testing method has been refined based on findings of round robin tests, including updated drawings.
c) A thermal pre-exposure method has been introduced to be equivalent to the thermal effects of a "lamination" cycle. This pre-exposure defines the "fresh" state of the front- or backsheet in final application for evaluation of changes in ageing tests. For practical reasons, an oven exposure has been defined as an equivalent test.
d) The multiple functions of the lamination protrusion test (previously DTI test) have been clarified, to identify and measure RUI layer thickness as well as to identify layers for which the comparative tracking index (CTI) needs to be determined. Also the content of IEC 62788-2-1 has been updated, by which the lamination protrusion test and MST 04 are additionally set in perspective to each other via engineering judgement.
e) The DC breakdown voltage test method has been updated and the option to perform a withstand voltage test has been added (to reduce the required measurement voltage). The correction of DC breakdown voltage ( ) measurements, needed in the presence of non‑RUI layers and after the lamination protrusion test, has been defined more precisely.
f) Details for thickness measurement have been added (engineered surface roughness due to embossing).
g) The adhesion test methods have been reviewed and updated. The single cantilevered beam test has been added. Figures have been updated to align with IEC 62788-1-1.
h) The thermal failsafe test has been added as a test method based on discussion in the parallel project for IEC 62788-2-1. The test method offers a single temperature-point evaluation to include elongation at break to the thermal endurance evaluation.
I) A sequential UV/TC test ("solder bump test") has been added.

IEC TS 62788-8-1:2024 defines test methods and datasheet reporting requirements for key characteristics of ECA used in photovoltaic modules, involving mechanical characteristics, adhesive characteristics, electrical characteristics, thermal characteristics, etc.
The object of this document is to offer a standard test procedure to ECA manufacturers for product design, production and quality control, and to PV module manufacturers for the purpose of material screening, material inspection, process control, and failure analysis.
This document is intended to be applied to ECA used in solar PV modules. For non-conductive adhesives or tapes used in PV modules, the applicable test methods except for electrical characteristics in this document may be used.

IEC TS 62915:2023 sets forth a uniform approach to maintain type approval, design and safety qualification of terrestrial PV modules that have undergone or will undergo modification from their originally assessed design. This document addresses two types of PV module technologies, wafer-based technologies (WBT) and monolithically-integrated (MLI) thin-film based technologies.
This document lists typical modifications and the resulting requirements for retesting based on the different test standards. It provides assistance; at some level, engineering judgement may be needed.
This publication contains attached files in the form of xls document. These files are intended to be used as a complement and do not form an integral part of the publication.
This second edition cancels and replaces the first edition published in 2018. This edition includes the following significant technical changes with respect to the previous edition:
- Prior references to specific process-related changes to PV modules have been removed in this edition and replaced with a general requirement to ensure that a consistent quality management system is in place per IEC 62941
- References to IEC 61215 and IEC 61730 have been updated to the latest editions (2021 and 2023 respectively)
- Retest requirements with respect to new added tests such as cyclic (dynamic) mechanical load (MQT 20) and potential-induced degradation (MQT 21) are addressed in this edition
- Retest requirements for IEC 61215 and IEC 61730 have been separated for the sake of clarity
- A comprehensive matrix table summarizing all the retest requirements for each possible change in material(s) or design modification is provided in this edition
- References to component level standards, namely IEC 62788-1 series and IEC 62788-2 series, are included in this edition to address changes that could be made to the critical sub-components going into new PV module constructions
- Crystalline silicon and thin film references have been updated to be consistent with nomenclature in the updated IEC 61215 and IEC 61730 standards; namely, wafer-based technology (WBT) and monolithically integrated (MLI) thin film PV modules
- In this edition, 4.3 which addresses retest requirements for MLI thin film PV modules has been truncated and simplified by removing redundant sections that are identical with the subclauses in 4.2
Guidance for retesting modules according to IEC TS 63126, “Guidelines for qualifying PV modules, components and materials for operation at high temperatures” has been added to this edition.
- In this edition, requirements have been added for changes affecting system compatibility with variants of the same model
The contents of the corrigendum 1 of July 2024 have been included in this copy.

IEC 61730-1:2023 specifies and describes the fundamental construction requirements for photovoltaic (PV) modules in order to provide safe electrical and mechanical operation. Specific topics are provided to assess the prevention of electrical shock, fire hazards, and personal injury due to mechanical and environmental stresses. This document pertains to the particular requirements of construction. IEC 61730-2 defines the requirements for testing. Modules with modified construction are qualified as described in IEC TS 62915.
This document lays down requirements for terrestrial PV modules suitable for long-term operation in open-air climates with 98th percentile module operating temperatures of 70 °C or less. Guidelines for modules to be used at higher operating temperatures are described in IEC TS 63126.
This document is intended to apply to all terrestrial flat plate module materials, such as crystalline silicon module types as well as thin-film modules.
This document defines the basic requirements for various applications of PV modules, but it cannot be considered to encompass all national or regional codes.

IEC 61730-2:2023 lists the tests a PV module is required to fulfil for safety qualification. This document applies for safety qualification only in conjunction with IEC 61730-1. The objective of this document is to provide the testing sequence intended to verify the safety of PV modules whose construction has been assessed by IEC 61730-1. The test sequence and pass criteria are designed to detect the potential breakdown of internal and external components of PV modules that would result in fire, electric shock, and/or personal injury. This document defines the basic safety test requirements and additional tests that are a function of the PV module end-use applications. The additional testing requirements outlined in relevant ISO documents, or the national or local codes which govern the installation and use of these PV modules in their intended locations, are considered in addition to the requirements contained within this document.
The content of the corrigendum 1 (2024-10) has been included in this copy.

IEC 62788-2-1:2023 specifies the safety requirements for flexible polymeric front- and backsheet constructions, which are intended for use as relied-upon insulation in photovoltaic (PV) modules. The specifications in this document define the specific requirements of polymeric front- or backsheet constructions on the component level and cover mechanical, electrical, visual and thermal characterization in an unexposed state and/or after ageing.
This document covers class II and class 0 modules, as defined in IEC 61730-1. Class III modules are out of scope. This document provides the requirements for qualification of front- and backsheets to be used in module safety qualification according to IEC 61730-1. Test method descriptions are provided in IEC TS 62788-2, along with additional characterization methods useful for performance or quality assurance.

IEC 60904-2:2023 gives requirements for the classification, selection, packaging, marking, calibration and care of photovoltaic reference devices. This document applies to photovoltaic (PV) reference devices that are used to measure the irradiance of natural or simulated sunlight for the purpose of quantifying the electrical performance of photovoltaic devices (cells, modules and arrays). It does not cover photovoltaic reference devices for use under concentrated sunlight. This fourth edition cancels and replaces the third edition published in 2015. This edition includes the following significant technical changes with respect to the previous edition:
a) added calibration procedures for calibrating PV devices at maximum power by extending the respective Clauses 12 and 13;
b) revised requirements for mandatory measurement of spectral responsivity, temperature coefficients and linearity, depending on usage and allowing some measurements on equivalent devices;
c) revised requirements for built-in shunt resistor;
d) added requirements for traceability of calibration explicitly.

IEC TS 63397:2022 defines additional testing requirements for modules deployed under applications or in environments where PV modules are likely to be exposed to the impact of hailstones leading to higher stress beyond the scope of the IEC 61215 series. This document aims to assist in the selection of modules for deployment in specific regions that have a higher risk of hail damage and to provide tools for improving module design.
The contents of the corrigendum of July 2023 have been included in this copy.

IEC 60904-5:2011 describes the preferred method for determining the equivalent cell temperature (ECT) of PV devices (cells, modules and arrays of one type of module), for the purposes of comparing their thermal characteristics, determining NOCT (nominal operating cell temperature) and translating measured I-V characteristics to other temperatures. The main technical changes with regard to the previous edition are as follows:
- added method on how to extract the input parameters;
- rewritten method on how to calculate ECT;
- reworked formulae to be in line with IEC 60891.

IEC TS 62788-6-3:2022 describes the single cantilevered beam (SCB) test, useful for characterizing adhesion in photovoltaic (PV) modules. This document offers a generalized method for performing the test, with the expectation that best practices for utilizing this test method will be developed for specific applications.
This document provides a method for measuring the adhesion energy of most interfaces within the photovoltaic (PV) module laminate. This method provides a measure of adhesive energy, via the critical energy release rate, and so is more useful for comparing adhesion of different specimen types; e.g. different materials, module or coupon samples, or materials before and after stress exposure.

IEC TS 63209-2:2022 includes a menu of tests to use for evaluation of the long-term reliability of materials used as backsheets and encapsulants in PV modules. It is intended to provide information to supplement the baseline testing defined in IEC 61215 and IEC 61730, which are qualification tests with pass-fail criteria. used for reliability analysis and is not intended to be used as a pass-fail test procedure. This document addresses polymeric materials in the crystalline silicon module laminates, specifically backsheets and encapsulants in Glass/Glass or Glass/Backsheet modules. The included environmental stress tests are intended to cause degradation that is most relevant to field experience, but these may not capture all failure modes which may be observed in various locations.

IEC TS 63342:2022 is designed to assess the effect of light induced degradation at elevated temperatures (LETID) by application of electrical current at higher temperatures. In this document, only the current injection approach for the detection of LETID is addressed.
This document does not address the B-O and Iron Boron (Fe-B) related degradation phenomena, which already occur at room temperatures under the presence of light and on much faster time scales. The proposed test procedure can reveal sample sensitivity to LETID degradation mechanisms, but it does not provide an exact measure of field observable degradation.

IEC 62759-1:2022 describes methods for the simulation of transportation of complete package units of modules and combined subsequent environmental impacts.
This second edition cancels and replaces the first edition published in 2015. This edition includes the following significant technical changes with respect to the previous edition:
a. Cancellation of tests and references to relevant standards for CPV.
b. Deletion of different classes for PV modules.
c. Deletion of requirement for minimum 10 modules per shipping unit.
d. Implementation of stabilization as intermediate measurement.
e. Addition of pass/fail criteria.
f. Change of requirements for retesting.
g. Change of number of cycles in dynamic mechanical load test.

IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.

IEC 61215-1-2:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film CdTe based terrestrial flat plate modules. As such, it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This document defines PV technology dependent modifications to the testing procedures and requirements per IEC 61215-1:2021 and IEC 61215-2:2021. This second edition cancels and replaces the first edition of IEC 61215-1-2, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. A cyclic (dynamic) mechanical load test (MQT 20) added.
b. A test for detection of potential-induced degradation (MQT 21) added.
c. A bending test (MQT 22) for flexible modules added.

IEC 61215-1-4:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film Cu(In,Ga)(S,Se)2 based terrestrial flat plate modules. As such it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This second edition cancels and replaces the first edition of IEC 61215-1-4, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. A cyclic (dynamic) mechanical load test (MQT 20) added.
b. A test for detection of potential-induced degradation (MQT 21) added.
c. A bending test (MQT 22) for flexible modules added.
This standard is to be read in conjunction with IEC 61215-1:2021 and IEC 61215-2:2021.

IEC 61215-1-3:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all thin-film amorphous silicon (a-Si; a-Si/µc-Si) based terrestrial flat plate modules. As such, it addresses special requirements for testing of this technology supplementing IEC 61215-1:2021 and IEC 61215-2:2021 requirements for testing. This second edition cancels and replaces the first edition of IEC 61215-1-3, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. A cyclic (dynamic) mechanical load test (MQT 20) added.
b. A test for detection of potential-induced degradation (MQT 21) added.
c. A bending test (MQT 22) for flexible modules.

IEC TS 63109:2022 specifies a method to measure the diode ideality factor of photovoltaic cells and modules by quantitative analysis of electroluminescence (EL) images. This document provides a definition of the term diode ideality factor n, as the inverse of increment ratio of natural logarithm of current as a function of applied voltage, which is related to the fill factor FF, and is useful as an effective indicator to represent the output efficiency of photovoltaic cells and modules with the other key parameters open circuit voltage Voc and short circuit current Isc.

IEC 60891:2021 defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics (also known as I-V curves) of photovoltaic (PV) devices. It also defines the procedures used to determine factors relevant to these corrections. Requirements for I-V measurement of PV devices are laid down in IEC 60904-1 and its relevant subparts.
This third edition cancels and replaces the second edition published in 2009. This edition includes the following significant technical changes with respect to the previous edition:
- adds guidance on which correction procedure shall be used depending on application;
- introduces translation procedure 4 applicable to c-Si technologies with unknown temperature coefficients;
- introduces various clarifications in existing procedures to improve measurement accuracy and reduce measurement uncertainty;
- adds an informative annex for supplementary methods that can be used for series resistance determination.
The content of the corrigendum 1 (2024-10) has been included in this copy.

IEC TS 63163:2021 is intended to apply to terrestrial modules for consumer applications for outdoor operation shorter than those qualified to IEC 61215. The useful service life of modules so qualified depends on their design, their environment and the conditions under which they are operated. This document classes those PV modules into Category 1, Category 2, and Category 3 with respectively low, medium and high expected outdoor exposure. This specification is intended to qualify the PV portion of these devices. It may, however, be used as a basis for testing such PV modules, but does not qualify the electronic portion. The purpose of the test sequence is to determine the electrical, thermal, and mechanical durability characteristics of the module, and to show that the module is capable of withstanding outdoor exposure for different outdoor durations designated as “low”, “medium”, and “high”. Mobile and attached applications are considered to require lower mechanical durability than portable applications, which are more prone to mechanical damage.

IEC TS 63140:2021 provides test methods for quantifying the permanent change in a monolithically integrated PV module’s power output that may result from some potential partial shade conditions. Three tests are available, representing conditions of use, misuse, and most severe misuse. This document is applicable to monolithically integrated PV modules with one series-connected cell group or with multiple series-connected cell groups that are in turn connected in parallel. This document is not applicable to PV modules formed by the interconnection of separate cells.

IEC TS 63209-1:2021 is intended to provide information to supplement the baseline testing defined in IEC 61215, which is a qualification test with pass-fail criteria. This document provides a standardized method for evaluating longer term reliability of photovoltaic (PV) modules and for different bills of materials (BOMs) that may be used when manufacturing those modules. The included test sequences in this specification are intended to provide information for comparative qualitative analysis using stresses relevant to application exposures to target known failure modes.

IEC 61215-2:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. This document is intended to apply to all terrestrial flat plate module materials such as crystalline silicon module types as well as thin-film modules. The objective of this test sequence is to determine the electrical characteristics of the module and to show, as far as possible within reasonable constraints of cost and time, that the module is capable of withstanding prolonged exposure outdoors. This second edition of IEC 61215-2 cancels and replaces the first edition of IEC 61215-2 issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. Addition of cyclic (dynamic) mechanical load testing (MQT 20).
b. Addition of a test for detection of potential-induced degradation (MQT 21).
c. Addition of test methods required for bifacial PV modules.
d. Addition of test methods required for flexible modules. This includes the addition of the bending test (MQT 22).
e. Revision of simulator requirements to ensure uncertainty is both well-defined and minimized.
f. Correction to the hot spot endurance test, where the procedure for monolithically integrated (MLI) thin film technologies (MQT 09.2) previously included two sections describing a procedure only appropriate for silicon modules.
g. Selection of three diodes, rather than all, for testing in the bypass diode thermal test (MQT 18).
h. Removal of the nominal module operating test (NMOT), and associated test of performance at NMOT, from the IEC 61215 series.

IEC 61215-1:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. This document is intended to apply to all terrestrial flat plate module materials such as crystalline silicon module types as well as thin-film modules. It does not apply to systems that are not long-term applications, such as flexible modules installed in awnings or tenting. This second edition of IEC 61215-1 cancels and replaces the first edition of IEC 61215-1, published in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. Addition of a test taken from IEC TS 62782.
b. Addition of a test taken from IEC TS 62804-1.
c. Addition of test methods required for flexible modules. This includes the addition of the bending test (MQT 22).
d. Addition of definitions, references and instructions on how to perform the IEC 61215 design qualification and type approval on bifacial PV modules.
e. Clarification of the requirements related to power output measurements.
f. Addition of weights to junction box during 200 thermal cycles.
g. Requirement that retesting be performed according to IEC TS 62915.
h. Removal of the nominal module operating test (NMOT), and associated test of performance at NMOT, from the IEC 61215 series.
The contents of the corrigendum of May 2021 have been included in this copy.

IEC 61215-1-1:2021 lays down requirements for the design qualification of terrestrial photovoltaic modules suitable for long-term operation in open-air climates. The useful service life of modules so qualified will depend on their design, their environment and the conditions under which they are operated. Test results are not construed as a quantitative prediction of module lifetime. In climates where 98th percentile operating temperatures exceed 70 °C, users are recommended to consider testing to higher temperature test conditions as described in IEC TS 63126. This document is intended to apply to all crystalline silicon terrestrial flat plate modules. This second edition cancels and replaces the first edition of IEC 61215-1-1, issued in 2016. This edition includes the following significant technical changes with respect to the previous edition:
a. A cyclic (dynamic) mechanical load test (MQT 20) added.
b. A test for detection of potential-induced degradation (MQT 21) added.
c. A bending test (MQT 22) for flexible modules added.
d. A procedure for stress specific stabilization – BO LID (MQT 19.3) added.
e. A final stabilization procedure for modules undergoing PID testing added

IEC 62788-1-4:2016 provides a method for measurement of the optical transmittance of encapsulation materials used in photovoltaic (PV) modules. The standardized measurements in this procedure quantify the expected transmittance of the encapsulation to the PV cell. Subsequent calculation of solar-weighted transmittance allows for comparison between different materials. The results for unweathered material may be used in an encapsulation manufacturer's datasheets, in manufacturer's material or process development, in manufacturing quality control (material acceptance), or applied in the analysis of module performance. This measurement method can also be used to monitor the performance of encapsulation materials after weathering, to help assess their durability.

IEC 60904-1:2020 describes procedures for the measurement of current-voltage characteristics (I-V curves) of photovoltaic (PV) devices in natural or simulated sunlight. These procedures are applicable to a single PV solar cell, a sub-assembly of PV solar cells, or a PV module. This document is applicable to non-concentrating PV devices for use in terrestrial environments, with reference to (usually but not exclusively) the global reference spectral irradiance AM1.5 defined in IEC 60904-3.
This third edition cancels and replaces the second edition published in 2006. The main changes with respect to the previous edition are as follows:
- Updated scope to include all conditions.
- Added terms and definitions.
- Reorganised document to avoid unnecessary duplication.
- Added data analysis clause.
- Added informative annexes (area measurement, PV devices with capacitance, dark I-V curves and effect of spatial non-uniformity of irradiance).

IEC 60904-9:2020 is applicable for solar simulators used in PV test and calibration laboratories and in manufacturing lines of solar cells and PV modules. This document define classifications of solar simulators for use in indoor measurements of terrestrial photovoltaic devices. Solar simulators are classified as A+, A, B or C based on criteria of spectral distribution match, irradiance non-uniformity in the test plane and temporal instability of irradiance. This document provides the required methodologies for determining the classification of solar simulators in each of the categories. A solar simulator which does not meet the minimum requirements of class C cannot be classified according to this document. This document is used in combination with IEC TR 60904-14, which deals with best practice recommendations for production line measurements of single-junction PV module maximum power output and reporting at standard test conditions.
This third edition cancels and replaces the second edition issued in 2007. This edition includes the following significant technical changes with respect to the previous edition:
- Changed title;
- Added spectral match classification in an extended wavelength range;
- Introduction of new A+ class;
- Definition of additional parameters for spectral irradiance evaluation;
- Added apparatus sections for spectral irradiance measurement and spatial uniformity measurement;
- Revised procedure for spectral match classification (minimum 4 measurement locations);
- Revised measurement procedure for spatial uniformity of irradiance;
- Added informative Annex for sensitivity analysis of spectral mismatch error related to solar simulator spectral irradiance.

IEC 60904-10:2020 describes the procedures used to measure the dependence of any electrical parameter (Y) of a photovoltaic (PV) device with respect to a test parameter (X) and to determine the degree at which this dependence is close to an ideal linear (straight-line) function. It also gives guidance on how to consider deviations from the ideal linear dependence and in general on how to deal with non-linearities of PV device electrical parameters.
This third edition cancels and replaces the second edition published in 2009. This edition includes the following significant technical changes with respect to the previous edition:
a. Modification of title.
b. Inclusion of an Introduction explanatory of the changes and the reasoning behind them.
c. Inclusion of a new Clause Terms and Definitions (Clause 3), with distinction between generic linear dependence and linear dependence of short-circuit current versus irradiance (linearity).
d. Explicit definition of equivalent sample (Clause 4).
e. Technical revision of the apparatus (Clause 5), of the measurement procedures (Clause 6 to Clause 8) and of the data analysis (Clause 9), with separation of the data analysis for a generic linear dependence from the data analysis specific to linearity (i.e. short-circuit current dependence on irradiance) assessment. Additionally, inclusion of impact of spectral effects on both linearity and linear dependence assessment.
f. Introduction of specific data analysis for two-lamp method, making it fully quantitative. Addition of extended version called N-lamp method.
g. Modification of the linearity assessment criterion with inclusion of a formula that can be used to correct the irradiance reading of a PV reference device for non-linearity of its short-circuit current versus irradiance. A linearity factor is specifically newly defined for this purpose.
h. Revision of the requirements for the report (Clause 10) in order to improve clearness about what information is always necessary and what is dependent on the procedure actually followed to measure the linear dependence, including the type of dependence measured (generic or linearity).

IEC 62790:2020 describes safety requirements, constructional requirements and tests for junction boxes up to 1 500 V DC for use on photovoltaic modules in accordance with class II of IEC 61140:2016.
This document applies also to enclosures mounted on PV-modules containing electronic circuits for converting, controlling, monitoring or similar operations. Additional requirements concerning the relevant operations are applied under consideration of the environmental conditions of the PV-modules. This document does not apply to the electronic circuits of these devices, for which other IEC standards apply. This second edition cancels and replaces the first edition published in 2014. This edition includes the following significant technical changes with respect to the previous edition:
- Modifications in normative references and terms and definitions;
- Improvement of declaration of categories for junction boxes in 4.1;
- Clarification for ambient temperature in 4.1;
- Addition of requirement to provide information concerning RTE/RTI or TI in 4.2;
- Reference to IEC 62930 instead of EN 50618 in 4.6;
- Addition of "Functional insulation" in Table 1;
- Addition of "Distance through cemented joints" in Table 3;
- Correction of procedure of process to categorize material groups (deletion of PTI) in 4.15.2.3;
- Requirement for approval of RTE/RTI or TI for insulation parts in 4.16.1 and 4.16.2;
- Change of requirements concerning electrochemical potential in 4.17.2;
- Clarification for IP-test in 5.3.4.2;
- Addition of test voltage for cemented joints in 5.3.6 and 5.3.16;
- Addition of detailled description on how to prepare the test sample for the thermal cycle test in 5.3.9.1;
- New test procedure for bypass diode thermal test (5.3.18) in accordance with MQT 18.1 of IEC 61215-2:2016;
- New test procedure for reverse overload current test in 5.3.23;
- New Figure 1 for thermal cycle test.

IEC TS 63126:2020 defines additional testing requirements for modules deployed under conditions leading to higher module temperature which are beyond the scope of IEC 61215-1 and IEC 61730-1 and the relevant component standards, IEC 62790 and IEC 62852. The testing conditions specified in IEC 61215-2 and IEC 61730-2 (and the relevant component standards IEC 62790 and IEC 62852) assumed that these standards are applicable for module deployment where the 98th percentile temperature (T98th), that is the temperature that a module would be expected to equal or exceed for 175,2 h per year, is less than 70 °C. This document defines two temperature regimes, temperature level 1 and temperature level 2, which were designed considering deployment in environments with mounting configurations such that the T98th is less than or equal to 80 °C for temperature level 1, and less than or equal to 90 °C for temperature level 2.
The contents of the corrigendum 1 (2022-09) have been included in this copy.

IEC TS 62788-5-2:2020 provides guidelines to assess the ability of an edge seal to prevent moisture ingress from the edges of PV modules. This document does not cover frame adhesives (sometimes colloquially referred to as edge seals) which by design do not serve to prevent moisture ingress to a meaningful degree. Edge seals should keep moisture out, remain adhered, and maintain electrically insulation from the environment. Much of the testing can be done on the material level, but given the fact that there are multiple surfaces, materials interactions, and mechanical stresses, testing on mini modules or modules is necessary. To accomplish this, this document contains three types of test sample types, materials, mini-modules, and full-size modules. It is intended that a quick evaluation and comparison can be made using materials only. This would be followed up by more rigorous tests using mini-modules where all the interfaces are correctly represented. And finally, full-size module tests are used to evaluate the actual construction process to allow unanticipated concerns to be addressed.

IEC 61701:2020 describes test sequences useful to determine the resistance of different PV modules to corrosion from salt mist containing Cl (NaCl, MgCl2, etc.). All tests included in the sequences are fully described in IEC 61215‑2, IEC 62108, IEC 61730‑2 and IEC 60068‑2‑52. The bypass diode functionality test in this document is modified from its description in IEC 61215‑2. They are combined in this document to provide means to evaluate possible faults caused in PV modules when operating under wet atmospheres having high concentration of dissolved salt (NaCl). Depending on the specific nature of the surrounding atmosphere to which the module is exposed in real operation several testing methods can be applied, as defined in IEC 60068‑2‑52. Guidance for determining the applicability of this document and selecting an appropriate method is provided in Annex A.
This third edition cancels and replaces the second edition issued in 2011. The main technical changes with respect to the previous edition are as follows:
- The scope has been updated to better reflect the applicability of the Standard
- Test methods and requirements have been condensed and aligned with the new editions of IEC 61215-1, IEC 61215-2, and IEC 61730-2. References to crystalline silicon versus thin film technologies have been eliminated. The old Figure 2 on the thin film test sequence has been eliminated.
- The salt mist test references have been updated to harmonize with changes to IEC 60068‑2‑52.
- A normative annex has been added to provide guidance on which of the test methods in IEC 60068-2-52 are applicable to different applications. This includes references to new test methods in the latest edition of IEC 60068-2-52.

IEC 62788-1-6:2017 defines the terminology, test equipment, test environment, specimen preparation, test procedures, and test report for measuring the degree of cure of Ethylene-Vinyl Acetate (EVA) encapsulation sheet used in photovoltaic (PV) modules. The differential scanning calorimetry (both residual enthalpy and melt/freeze protocols) and gel content methods are included herein. This procedure can be used by material- or module-manufacturers to verify that the cross-linking additive is present and is active. The procedure can also be used to verify the module manufacturing (lamination) process for the purposes of quality- and process-control. The procedure can also be used to assess the uniformity of the EVA formulation within a roll as well as to compare variation of the EVA formulation from roll to roll.

IEC 62938:2020 provides a method for determining how well a framed PV module performs mechanically under the influence of inclined non-uniform snow loads. This document is applicable for framed modules with frames protruding beyond the front glass surface on the lower edge after intended installation and as such creates an additional barrier to snow sliding down from modules. For modules with other frame constructions, such as backrails formed in frames, on the side edges, on the top edge and on the lower edge not creating an additional snow slide barrier, this document is not applicable. The test method determines the mechanical non-uniform-load limit of a framed PV module.

IEC 62788-1-7:2020 is designed as a more rigorous qualification test, using accelerated UV exposure at elevated temperature to determine whether polymeric encapsulants can suffer loss of optical transmittance. IEC 61215-2 already includes a UV preconditioning test (MQT 10), however, the parameters for that test only represent a limited level of exposure (~weeks of UV dose). This test procedure is intended for representative coupon specimens, applying stress at a greater intensity (designed relative to Phoenix, AZ), using a radiation spectrum that is more similar to the terrestrial solar spectrum, and using a duration of exposure that is more relevant to the PV application (i.e., equivalent to several years of outdoor exposure). This test quantifies the degradation rate of encapsulants so that the risk of the materials losing optical transmittance during operation in the terrestrial environments can be managed. The quantitative correlation between climate (or location of use), a specific application (utility installation, residential-installation, roof-mount, rack-mount, use of a tracker, the system electrical configuration and its operation), and the test can be established for each specific encapsulant material, but is beyond the scope of this document.